A method for detecting chip anomalies in bright environments

Abstract

The application discloses a kind of in bright environment detects the method for chip exception, comprising the following steps: setting test light source, and the camera to be measured is placed under test light source;Adjust the center brightness value of test light source;Obtain the middle area picture of camera to be measured under test light source shooting;The average value of the brightness of middle area picture is calculated;The average value of the brightness of middle area picture is judged and screened, and the present application detects whether there is exception in chip by placing camera to be measured in bright environment, to ensure the performance of chip out of factory.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of camera detection, in particular to a method for detecting chip abnormalities in bright environments. BACKGROUND

[0002] A camera module is composed of capacitors, chips and other components, connectors, flexible printed circuit boards, lenses and holders, etc. The chip is a particularly important component in the camera module, and the performance of the chip determines the performance of the camera module. Therefore, the performance of the chip needs to be detected before the camera module is shipped. Due to the characteristics of some chips, it is impossible to test whether the chip is abnormal in the conventional test, so the performance of the chip cannot be guaranteed. SUMMARY

[0003] The present application aims to overcome the shortcomings of the prior art and provide a method for detecting chip abnormalities in bright environments.

[0004] The present application is achieved by the following technical solutions:

[0005] A method for detecting chip abnormalities in bright environments, comprising the following steps:

[0006] Step 1, setting a test light source, placing the camera to be tested under the test light source;

[0007] Step 2, adjusting the center brightness value of the test light source;

[0008] Step 3, obtaining an intermediate area picture taken by the camera to be tested under the test light source;

[0009] Step 4, calculating the average brightness value of the intermediate area picture;

[0010] Step 5, judging the average brightness value of the intermediate area picture and performing screening.

[0011] In one embodiment, the test light source is a 5100k light source in step 1.

[0012] In one embodiment, a certain brightness value is set for the test light source in step 1.

[0013] In one embodiment, in step 2,

[0014] Step 2-1, adjusting the center brightness value of the test light source to a target value and setting automatic exposure time adjustment;

[0015] Step 2-2, setting the simulated gain value range for the camera to be tested.

[0016] In one implementation, in step 3, the size of the central region image is 100*100 pixels.

[0017] In one embodiment, in step 4, the average brightness of the intermediate region image is calculated by calculating the average brightness of the R, GR, GB, and B channels in the intermediate region image, respectively.

[0018] In one implementation, the step of calculating the average brightness of the R, GR, GB, and B channels in the intermediate region image is to calculate the sum / count of the brightness of each pixel in each channel.

[0019] In one implementation, in step 4,

[0020] Step 4-1: Obtain images of the central region taken by the camera under test under the test light source and at different simulated gain values ​​within the simulated gain value range;

[0021] Step 4-2: Calculate the average brightness of the R, GR, GB, and B channels for each captured central area image.

[0022] In one implementation, in step 4-1, the simulated gain value range is 1x gain-15x gain. The camera under test takes 15 images of the central area in sequence within the simulated gain value range and calculates the average brightness.

[0023] In one implementation, in step 5,

[0024] Step 5-1: Set the standard linear fitting coefficient values;

[0025] Step 5-2: Obtain the linear fitting coefficients of the average brightness values ​​R, GR, GB, and B of the central region image captured by the camera under test within the simulated gain value range.

[0026] Step 5-3: Determine whether the linear fitting coefficients of the brightness of R, GR, GB, and B are greater than the standard linear fitting coefficient values.

[0027] Step 5-4: Select cameras with linear fitting coefficient values ​​lower than the standard and judge them as defective.

[0028] Compared with the prior art, the present invention has at least the following advantages:

[0029] A method for detecting chip anomalies in a bright environment according to the present invention involves placing the camera under test under a test light source, taking pictures sequentially within the simulated gain value range, and obtaining pictures of the central area. Calculate the average brightness values of the R, GR, GB, and B channels for the obtained central area pictures respectively, and generate a linear fitting coefficient to compare with the standard linear fitting coefficient. If it is greater than the standard linear fitting coefficient value, it is determined that the chip of the camera under test is qualified; if it is less than the standard linear fitting coefficient value, screening is performed and it is determined as defective, thereby determining the quality of the chip and ensuring the performance of the camera chips leaving the factory. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] To more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as limiting the scope. For those of ordinary skill in the art, other related drawings can be obtained based on these drawings without creative efforts.

[0031] Figure 1 It is a schematic flowchart of a method for detecting chip anomalies in a bright environment provided by the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0032] To facilitate the understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings. The preferred embodiments of the present invention are shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided to make the disclosure of the present invention more thorough and comprehensive.

[0033] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly on the other element or there can also be an intermediate element. When an element is considered to be "connected" to another element, it can be directly connected to the other element or there may be an intermediate element at the same time. The terms "vertical", "horizontal", "left", "right" and similar expressions used herein are for illustrative purposes only and do not represent the only embodiments.

[0034] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present invention belongs. The terms used in the description of the present invention in this specification are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0035] A method for detecting chip anomalies in a bright environment, referring to Figure 1This includes the following steps:

[0036] Step 1: Set up the test light source and place the camera under the test light source;

[0037] Step 2: Adjust the center brightness value of the test light source;

[0038] Step 3: Obtain an image of the central area taken by the camera under test under the test light source;

[0039] Step 4: Calculate the average brightness of the central area of ​​the image;

[0040] Step 5: Determine the average brightness of the middle area of ​​the image and then filter it.

[0041] Reference Figure 1 In step 1, the test light source is a 5100k light source, and a certain brightness value is set for the test light source. Setting the test light source to 5100k is to allow the camera under test to take pictures in a bright environment, in order to detect any abnormalities in the chip.

[0042] Reference Figure 1 In step 2,

[0043] Step 2-1: Adjust the center brightness value of the test light source to the target value and set the automatic exposure time adjustment.

[0044] Step 2-2: Set the range of simulated gain values ​​for the camera under test.

[0045] The reason for adjusting the center brightness of the test light source to the target value is that it is difficult to ensure that the brightness value of each light source is consistent. Therefore, it is only required that the center brightness of the test light source be adjusted to the target value, and the camera under test is placed under the center area of ​​the test light source.

[0046] Reference Figure 1 In step 3, the size of the central region image is 100*100 pixels. The size of the central region image is set to facilitate the calculation of the average brightness of the central region image later. In this embodiment, other sizes of central region images can also be obtained as needed.

[0047] Reference Figure 1 In step 4, calculating the average brightness of the intermediate region image involves calculating the average brightness of the R, GR, GB, and B channels in the intermediate region image. The intermediate region image has multiple pixels, and each pixel has four photosensitive points (R, GR, GB, and B), which give the pixel different colors. The average brightness of the four photosensitive points in the intermediate region image is calculated to determine the quality of the pixels in the intermediate region image, thus serving as a basis for judging the performance of the chip within the camera under test.

[0048] Reference Figure 1 The average brightness of the R, GR, GB, and B channels in the middle region image is calculated by summing the brightness of each pixel in each channel and counting the number of pixels.

[0049] Furthermore, referring to Figure 1 In step 4,

[0050] Step 4-1: Obtain images of the central region taken by the camera under test under the test light source and at different simulated gain values ​​within the simulated gain value range; wherein, the simulated gain value range is 1x gain-15x gain, and the camera under test takes 15 images of the central region in sequence within the simulated gain value range and calculates the average brightness.

[0051] Step 4-2: Calculate the average brightness of the R, GR, GB, and B channels for each captured central area image.

[0052] Reference Figure 1 In this test, the gain value in the camera under test is the luminance. Simulated gain values ​​are set to allow the camera under test to capture images of the intermediate region at different gain values. For each acquired intermediate region image, the average brightness of the R, GR, GB, and B channels is calculated to test whether the brightness values ​​of the intermediate region images captured by the camera under test at different gain values ​​are acceptable.

[0053] Reference Figure 1 In step 5,

[0054] Step 5-1: Set the standard linear fitting coefficient values;

[0055] Step 5-2: Obtain the linear fitting coefficients of the average brightness values ​​R, GR, GB, and B of the central region image captured by the camera under test within the simulated gain value range.

[0056] Step 5-3: Determine whether the linear fitting coefficients of the brightness of R, GR, GB, and B are greater than the standard linear fitting coefficient values.

[0057] Step 5-4: Select cameras with linear fitting coefficient values ​​lower than the standard and judge them as defective.

[0058] Reference Figure 1, wherein, within the simulated gain value range, the linear fitting coefficients of the average brightness values of the central region images R, GR, GB, and B captured by the camera under test are obtained. The camera under test captures 15 central region images within the simulated gain value range. After calculating the average brightness value of each central region image, the linear fitting coefficients of the average brightness values of the central region images R, GR, GB, and B are generated, and this linear fitting coefficient is compared with the standard linear fitting coefficient value. If it is greater than the standard linear fitting coefficient value, it is determined that the chip of the camera under test is qualified; if it is less than the standard linear fitting coefficient value, screening is performed and it is determined to be defective.

[0059] In summary, by placing the camera under test under the test light source and sequentially capturing images within the simulated gain value range to obtain the central region images, calculating the average brightness values of the R, GR, GB, and B channels for the obtained central region images respectively, and generating a linear fitting coefficient to compare with the standard linear fitting coefficient. If it is greater than the standard linear fitting coefficient value, it is determined that the chip of the camera under test is qualified; if it is less than the standard linear fitting coefficient value, screening is performed and it is determined to be defective, so as to determine the quality of the chip and ensure the performance of the camera chip leaving the factory.

[0060] The above-described embodiments merely represent several implementation manners of the present invention, and their descriptions are relatively specific and detailed, but should not be construed as limiting the scope of the invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the present invention patent shall be subject to the appended claims.

Claims

1. A method of detecting chip anomalies in bright environments, the method comprising: The method comprises the following steps: Step 1, setting a test light source, and placing a camera to be tested under the test light source; Step 2, adjusting the center brightness value of the test light source; Step 3, obtaining a middle region picture photographed by the camera to be tested under the test light source; Step 4, calculating the brightness average value of the middle region picture; Step 5, judging the brightness average value of the middle region picture and performing screening.

2. The method of claim 1, wherein the method further comprises: In step 1, the test light source is a 5100k light source.

3. The method for detecting chip anomalies in a bright environment according to claim 2, characterized in that, In step 1, a certain brightness value is set for the test light source.

4. The method for detecting chip anomalies in a bright environment according to claim 3, characterized in that, In step 2, Step 2-1, adjusting the center brightness value of the test light source to a target value, and setting automatic adjustment of exposure time; Step 2-2, setting a simulation gain value range for the camera to be tested.

5. The method of claim 4, wherein the step of detecting the abnormality of the chip in the bright environment comprises the steps of: detecting a first signal of the chip in the bright environment; and detecting a second signal of the chip in the dark environment. In step 3, the size of the middle region picture is 100*100 pixels.

6. The method for detecting chip anomalies in a bright environment according to claim 5, characterized in that, In step 4, the calculation of the brightness average value of the middle region picture is the calculation of the brightness average value of R, GR, GB and B channels in the middle region picture respectively.

7. The method of claim 6, wherein the step of detecting the abnormality of the chip in the bright environment comprises the steps of: detecting a first signal of the chip in the bright environment; and detecting a second signal of the chip in the dark environment. The calculation of the brightness average value of R, GR, GB and B channels in the middle region picture respectively is the calculation of the brightness accumulation / number of each pixel in each channel.

8. The method for detecting chip anomalies in a bright environment according to claim 7, characterized in that, In step 4, Step 4-1, obtaining center region pictures photographed by the camera to be tested under the test light source and under different simulation gain values in the simulation gain value range respectively; Step 4-2, calculating the brightness average value of R, GR, GB and B channels for each center region picture respectively.

9. The method for detecting chip anomalies in a bright environment according to claim 8, characterized in that, In step 4-1, the simulation gain value range is 1x gain-15x gain, and the camera to be tested photographs 15 center region pictures in the simulation gain value range in turn and calculates the brightness average value.

10. The method of claim 8, wherein the method further comprises: In step 5, Step 5-1, setting a standard linear fitting coefficient value; Step 5-2, obtaining the linear fitting coefficient of the brightness average value of R, GR, GB and B of the center region picture photographed by the camera to be tested in the simulation gain value range; Step 5-3, judging whether the linear fitting coefficient of R, GR, GB and B brightness is greater than the standard linear fitting coefficient value; Step 5-4, screening the camera to be tested with a linear fitting coefficient less than the standard linear fitting coefficient value, and judging it as defective.

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