Signal state transient analysis method and device based on histogram and medium

Abstract

The invention provides a histogram-based signal state transient analysis method and device, and a medium. The signal state transient analysis method comprises the following steps: S1, obtaining a demodulation signal parameter set and a demodulation signal tolerance set of all demodulation signals; s2, calculating histogram parameters; s3, calculating related parameters of each interval in the histogram; s4, relevant parameters of signal states are calculated, transient analysis is carried out on the relevant parameters of the demodulated signals, and therefore state analysis can be carried out on the demodulated signals according to the frequency modulation slope or frequency, implementation is easy, signal state division can be carried out in a self-adaptive mode, and the overall distribution characteristics and dispersion degree of the signals can be displayed.

Description

Technical Field

[0001] The present invention relates to the technical field of demodulation signal analysis, and in particular to a histogram-based signal state transient analysis method, device and medium. Background Art

[0002] Frequency hopping signals have strong anti-interference capabilities, a lower risk of interference at a certain frequency, and high security. The randomness of frequency hopping makes the signal more difficult to eavesdrop on. They are widely used in wireless communications such as Bluetooth, wireless LAN, and military communications.

[0003] The extended spectrum of the linear frequency modulation signal can also make the signal better resistant to interference. The linear change of its frequency makes the time-frequency characteristics very clear, and it is often used in radar and communication systems.

[0004] In summary, the frequency of the FH signal and the frequency modulation slope of the LFM signal are two very important parameters. When demodulating the frequency or frequency modulation slope when multiple signals are transmitted, some parameters are needed to describe their characteristic distribution in order to have a more comprehensive understanding of them. Summary of the invention

[0005] The purpose of the present invention is to provide a histogram-based signal state transient analysis method, device and medium, which can perform state division on the histogram according to the signal-related parameters obtained by demodulation, and the overall distribution characteristics and discreteness of the signal can be displayed through the divided signal states.

[0006] In order to solve the above technical problems, the present invention adopts the following solutions:

[0007] A histogram-based signal state transient analysis method, the signal state transient analysis method comprising the following steps:

[0008] S1. Obtain demodulation signal parameter set of all demodulation signals and the demodulated signal tolerance set

[0009] i sig =1,2,…,N sig ,

[0010] Wherein, the demodulated signal is a frequency hopping signal or a linear frequency modulation signal, then For the i sig The parameters of the demodulated signal refer to the frequency of the frequency hopping signal or the frequency modulation slope of the linear frequency modulation signal. For the i sig The tolerance of the demodulated signal, N sig is the number of demodulated signals;

[0011] S2. Obtain demodulation signal parameter set The maximum parameter f max and the minimum parameter f min and the demodulated signal tolerance set Minimum tolerance λ min , and according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals N bin and interval width δ;

[0012] S3, traverse all demodulated signals, according to the number of intervals N bin The interval i where each demodulated signal is located is calculated by using the interval width δ bin , and according to the interval i where the demodulated signal is located bin Calculate the interval parameters to obtain the signal number array num in the interval bin , parameter sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the demodulated signal is located bin ;

[0013] S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , according to the signal number array num bin , parameter sum array f bin and the tolerance sum array λ bin Calculate the signal status parameters and traverse the array iVld bin , get the corresponding demodulated signal histogram interval array sig bin , signal status parameter array f state and the signal state tolerance array λ state ;

[0014] S5. Find the histogram interval array sig where the demodulated signal is located bin In the array iVld bin The index in and calculate the demodulated signal i sig Status index sig id , state error sig dev And state parameter sig f .

[0015] Furthermore, the tolerance represents the starting point to the ending point of a demodulated signal. When searching from the middle point of the demodulated signal on the histogram, the first point exceeding the tolerance is recorded as the ending point; then searching from the middle point of the demodulated signal forward, the first point exceeding the tolerance is recorded as the starting point.

[0016] Furthermore, in S2, according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min The process of calculating the histogram parameters is:

[0017] Initialize the interval width δ to the minimum tolerance λ min ;

[0018] Calculate and get the maximum parameter f max With the minimum parameter f min The difference between interval ;

[0019] The difference f interval Divide by the interval width δ and round the result to get the number of intervals N bin ;

[0020] The difference f interval Divide by the number of intervals N bin The initialization interval width δ is updated based on the result.

[0021] Furthermore, in S3, according to the number of intervals N bin And the interval width δ is calculated to obtain each demodulated signal i sig The interval i bin , the calculation is specifically as follows:

[0022]

[0023] Among them, ceil(·) is a round-up operation and satisfies

[0024] Further, in S3, according to the interval i where the demodulated signal is located bin The interval parameters are calculated, and the calculation is specifically as follows:

[0025]

[0026] Among them, num bin (i bin ) is the interval i where the demodulated signal is located bin The signal number array num bin , f bin (i bin ) is the interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (i bin ) is the interval i where the demodulated signal is located bin The tolerance sum array λbin .

[0027] Furthermore, the step S4 includes the following steps:

[0028] S41, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , so that the array iVld bin The number of signal states N state The corresponding signal number array num bin The number of non-zero elements in ;

[0029] S42, calculate and obtain the signal state index array iD state , signal status parameter array f state , signal state tolerance array λ state , the calculation is specifically as follows:

[0030]

[0031] Among them, num bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The signal number array num bin , f bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The tolerance sum array λ bin ;

[0032] S43, obtain current state parameter f stateNow , according to the current state parameter f stateNow Traverse other signal states to determine whether there is a state parameter f that meets the range condition stateAnother According to the judgment result, the histogram interval array sig of the demodulated signal is bin , signal status parameter array f state , signal state tolerance array λ state And the number of signal states N state to update.

[0033] Further, in S43, the range condition refers to the state parameter f stateAnother With the current state parameter f stateNow The difference between them is 2*λ min within the scope;

[0034] When it is determined that there is a state parameter f that meets the range condition stateAnother When the state parameter f meets the range condition, stateAnother The histogram interval array sig of the demodulated signal bin , signal status parameter array f state , signal state tolerance array λ state And the number of signal states N state to update.

[0035] Further, in S5, the demodulated signal i is calculated sig Status index sig id , state error sig dev And state parameter sig f , the calculation process is:

[0036] Among them, idx refers to the histogram interval array sig where the demodulated signal is located bin (i) In array iVld bin The index in .

[0037] A histogram-based signal state transient analysis device, comprising:

[0038] a memory for non-transitory storage of computer readable instructions;

[0039] The processor is used to execute the computer-readable instructions, and the computer-readable instructions, when executed by the processor, implement the signal state transient analysis method based on histogram.

[0040] A non-transitory computer-readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by a processor, the method for transient analysis of signal states based on a histogram is implemented.

[0041] Beneficial effects of the present invention:

[0042] The present invention provides a histogram-based signal state transient analysis method, device and medium. The signal state transient analysis method mainly performs transient analysis on relevant parameters of the demodulated signal, so that the demodulated signal can be analyzed according to the frequency modulation slope (linear frequency modulation analysis mode) or the frequency (frequency hopping analysis mode). It is not only simple to implement, but also can adaptively divide the signal state and display the overall distribution characteristics and discreteness of the signal. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 Schematic diagram of the flow of the signal state transient analysis method in Example 1 of the present invention.

[0044] Figure 2 Schematic diagram of the histogram in Example 1 of the present invention. DETAILED DESCRIPTION

[0045] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0046] The relative arrangement of components and steps, the numerical expressions and numerical values ​​set forth in these embodiments do not limit the scope of the present invention unless specifically stated otherwise.

[0047] At the same time, it should be understood that for the convenience of description, the sizes of the various parts shown in the drawings are not drawn according to the actual proportional relationship.

[0048] Additionally, descriptions of well-known structures, functions, and configurations may be omitted for clarity and conciseness.One of ordinary skill in the art will recognize that various changes and modifications may be made to the examples described herein without departing from the spirit and scope of the present disclosure.

[0049] Technologies, methods, and apparatus known to ordinary technicians in the relevant field may not be discussed in detail, but where appropriate, such technologies, methods, and apparatus should be considered part of the authorization specification.

[0050] In all examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limiting. Therefore, other examples of the exemplary embodiments may have different values.

[0051] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments:

[0052] Example 1

[0053] In this embodiment, a histogram-based signal state transient analysis method is proposed. Figure 1 As shown, the signal state transient analysis method comprises the following steps:

[0054] S1. Obtain demodulation signal parameter set of all demodulation signals and the demodulated signal tolerance set

[0055] i sig =1,2,…,N sig ,

[0056] Wherein, the demodulated signal is a frequency hopping signal or a linear frequency modulation signal, then For the i sig The parameters of the demodulated signal refer to the frequency of the frequency hopping signal or the frequency modulation slope of the linear frequency modulation signal. For the i sig The tolerance of the demodulated signal, N sig is the number of demodulated signals;

[0057] S2. Obtain demodulation signal parameter set The maximum parameter f max and the minimum parameter f min and the demodulated signal tolerance set Minimum tolerance λ min , and according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals N bin and interval width δ;

[0058] S3, traverse all demodulated signals, according to the number of intervals N bin The interval i where each demodulated signal is located is calculated by using the interval width δ bin , and according to the interval i where the demodulated signal is located bin Calculate the interval parameters to obtain the signal number array num in the interval bin , parameter sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the demodulated signal is located bin ;

[0059] S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin, according to the signal number array num bin , parameter sum array f bin and the tolerance sum array λ bin Calculate the signal status parameters and traverse the array iVld bin , get the corresponding demodulated signal histogram interval array sig bin , signal status parameter array f state and the signal state tolerance array λ state ;

[0060] S5. Find the histogram interval array sig where the demodulated signal is located bin In the array iVld bin The index in and calculate the demodulated signal i sig Status index sig id , state error sig dev And state parameter sig f .

[0061] It can be seen that the present invention performs transient analysis on relevant parameters of the demodulated signal, thereby performing state analysis on the demodulated signal according to the frequency modulation slope (linear frequency modulation analysis mode) or frequency (frequency hopping analysis mode), and having a deeper understanding of the signal characteristics.

[0062] Based on the above principle, in this embodiment, the following description is made by taking a frequency hopping signal as an example:

[0063] The signal state transient analysis method comprises the following steps:

[0064] S1. Obtain the frequency hopping signal parameter set of all frequency hopping signals and frequency hopping signal tolerance set i sig =1,2,…,N sig ,in, For the i sig The frequency of the frequency hopping signal, For the i sig The tolerance of frequency hopping signals, N sig is the number of frequency hopping signals;

[0065] S2. Obtain frequency hopping signal parameter set Maximum frequency f max and minimum frequency f min and frequency hopping signal tolerance set Minimum tolerance λ min , and according to the maximum frequency f max , minimum frequency f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals Nbin and interval width δ;

[0066] S3, traverse all frequency hopping signals, according to the number of intervals N bin The interval i where each frequency hopping signal is located is calculated by using the interval width δ bin , and according to the interval i where the frequency hopping signal is located bin Calculate the interval parameters to obtain the signal number array num in the interval bin , frequency sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the frequency hopping signal is located bin ;

[0067] S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , according to the signal number array num bin , frequency sum array f bin and the tolerance sum array λ bin Calculate the signal status parameters and traverse the array iVld bin , get the corresponding frequency hopping signal histogram interval array sig bin , signal state frequency array f state and the signal state tolerance array λ state ;

[0068] S5. Find the histogram interval array sig where the frequency hopping signal is located bin In the array iVld bin The index in and calculate the frequency hopping signal i sig Status index sig id , state error sig dev and state frequency sig f .

[0069] Preferably, the tolerance represents the start point to the end point of a frequency hopping signal, such as Figure 2 As shown, on the histogram, search backward from the middle point of the frequency hopping signal, and the first point that exceeds the tolerance is recorded as the end point; then search forward from the middle point of the frequency hopping signal, and the first point that exceeds the tolerance is recorded as the start point.

[0070] When the corresponding frequency hopping signal parameter set is obtained based on the histogram and frequency hopping signal tolerance set After that, the frequency hopping signal parameter set and frequency hopping signal tolerance set Calculate the histogram parameters, and the process of calculating the histogram parameters is:

[0071] The first step is to find the frequency hopping signal parameter set Maximum frequency f max and minimum frequency f min ; and find the frequency hopping signal tolerance set Minimum tolerance λ min ;

[0072] And, the maximum frequency f max and minimum frequency f min Update, that is, at the maximum frequency f max and minimum frequency f min Add redundancy to get the updated maximum frequency f max and minimum frequency f min , calculated as follows: Among them, λ min For redundancy;

[0073] Step 2: Initialize the interval width δ and initialize it to the minimum tolerance λ min , then δ=λ min ;

[0074] Step 3: Calculate and obtain the maximum frequency f max With minimum frequency f min The difference between interval , that is, f interval =f max -f min ; Among them, if f interval =0, it can be assigned eps (precision of double-precision floating point number) in MATLAB;

[0075] Step 4: The difference f interval Divide by the interval width δ and round the result to get the number of intervals N bin , that is, N bin =round(f interval / δ), where round(·) is a rounding operation, and when N bin <1, let N bin =1;

[0076] Step 5: The difference f interval Divide by the number of intervals N bin The result of the initialization interval width δ is updated, that is, δ = f interval / N bin .

[0077] Then, based on the number of intervals N bin The interval width δ can be used to calculate the relevant parameters of each interval in the histogram, mainly by traversing all frequency hopping signals and for each frequency hopping signal isig ,i sig =1,2,…,N sig The following calculations are performed:

[0078] The first step is to initialize the signal number array num in the interval bin , frequency sum array f bin and the tolerance sum array λ bin , and each array size is N bin , all elements are 0;

[0079] Step 2: Initialize the histogram interval array sig where the frequency hopping signal is located bin , the array size is N sig ;

[0080] Step 3: Calculate the i-th sig The interval i where the frequency hopping signal is located bin , calculated as follows:

[0081] Among them, ceil(·) is a round-up operation. For the i sig The frequency of the frequency hopping signal, f min Frequency Hopping Signal Parameter Set The minimum frequency in , δ is the interval width, and satisfies

[0082] Step 4: According to the interval i where the frequency hopping signal is located bin Update the array num of the number of signals in the interval bin , frequency sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the frequency hopping signal is located bin , calculated as follows:

[0083]

[0084] Among them, i bin For the i sig The interval where the frequency hopping signal is located, For the i sig The frequency of the frequency hopping signal, For the i sig The tolerance of frequency hopping signals is num bin (i bin ) is the interval i where the frequency hopping signal is located bin The signal number array num bin , f bin (i bin ) is the interval i where the frequency hopping signal is located binThe frequency sum array f bin ,λ bin (i bin ) is the interval i where the frequency hopping signal is located bin The tolerance sum array λ bin .

[0085] Next, the signal state related parameters can be calculated based on the above interval parameters, and the specific process is as follows:

[0086] The first step is to set the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , so that the array iVld bin The number of signal states N state The corresponding signal number array num bin The number of non-zero elements in ;

[0087] Step 2: Calculate and obtain the signal state index array iD state , signal state frequency array f state , signal state tolerance array λ state , the calculation is specifically as follows:

[0088]

[0089] Where i = 1, 2, ..., N vldBin , then num bin (iVld bin (i)) is the array iVld bin The interval i where the frequency hopping signal is located bin The signal number array num bin , f bin (iVld bin (i)) is the array iVld bin The interval i where the frequency hopping signal is located bin The frequency sum array f bin ,λ bin (iVld bin (i)) is the array iVld bin The interval i where the frequency hopping signal is located bin The tolerance sum array λ bin ;

[0090] The third step is to traverse the signal state and find the current state frequency f stateNow Is there a difference of 2*λ between them? min State frequency f in the range stateAnother , the specific process is as follows:

[0091] If there is a state frequency f stateAnother With the current state frequency f stateNow The difference is 2*λ min Within the range, take these state frequencies f stateAnother The mean of is taken as the new state frequency, and the corresponding new state tolerance can be obtained in the same way. The state frequency f stateAnother The corresponding signal interval is the current state frequency f stateNow The corresponding signal interval i bin ;

[0092] Then remove the repeated state frequencies and state tolerances to get the final histogram interval array sig of the frequency hopping signal. bin , signal state frequency array f state and the signal state tolerance array λ state ; And, remove the array iVld bin If the index is repeated in the state ;

[0093] If there is no such state frequency f stateAnother , then record the previously obtained arrays as the final arrays, and obtain the corresponding histogram interval array sig where the frequency hopping signal is located bin , signal state frequency array f state and the signal state tolerance array λ state .

[0094] Finally, the state-related parameters of the frequency hopping signal can be calculated based on the above signal state-related parameters, mainly by traversing all frequency hopping signals and calculating the state-related parameters of each frequency hopping signal i. sig ,i sig =1,2,…,N sig The following calculations are performed:

[0095] The first step is to find the histogram interval array sig where each frequency hopping signal is located bin (i) In array iVld bin Index idx in

[0096] Step 2: Calculate the i-th sig The state index sig of the frequency hopping signal id , state error sig dev and state frequency sig f , calculated as follows:

[0097]

[0098] Among them, idx refers to the histogram interval array sig where the frequency hopping signal is located bin (i) In array iVldbin The index in .

[0099] In summary, the above steps can output the corresponding signal state parameters, including: the number of states N state , each signal status index sig id , state error sig dev and state frequency sig f , and the signal state frequency array f state and the signal state tolerance array λ state It is not only simple to implement, but also can adaptively divide the signal state and display the overall distribution characteristics and discreteness of the signal.

[0100] Example 2

[0101] A histogram-based signal state transient analysis device, comprising:

[0102] a memory for non-transitory storage of computer readable instructions;

[0103] The processor is used to execute the computer-readable instructions, and the computer-readable instructions, when executed by the processor, implement the signal state transient analysis method based on histogram.

[0104] A non-transitory computer-readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by a processor, the method for transient analysis of signal states based on a histogram is implemented.

[0105] The above description is only a preferred embodiment of the present invention and does not limit the present invention in any form. According to the technical essence of the present invention, within the spirit and principles of the present invention, any simple modification, equivalent replacement and improvement made to the above embodiment still falls within the protection scope of the technical solution of the present invention.

Claims

1. A histogram-based signal state transient analysis method, characterized in that: The signal state transient analysis method comprises the following steps: S1. Obtain demodulation signal parameter set of all demodulation signals and the demodulated signal tolerance set i sig =1,2,…,N sig , Wherein, the demodulated signal is a frequency hopping signal or a linear frequency modulation signal, then For the i sig The parameters of the demodulated signal refer to the frequency of the frequency hopping signal or the frequency modulation slope of the linear frequency modulation signal. For the i sig The tolerance of the demodulated signal, N sig is the number of demodulated signals; S2. Obtain demodulation signal parameter set The maximum parameter f max and the minimum parameter f min and the demodulated signal tolerance set Minimum tolerance λ min , and according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min Calculate the histogram parameters and get the corresponding number of intervals N bin and interval width δ; S3, traverse all demodulated signals, according to the number of intervals N bin The interval i where each demodulated signal is located is calculated by using the interval width δ bin , and according to the interval i where the demodulated signal is located bin Calculate the interval parameters to obtain the signal number array num in the interval bin , parameter sum array f bin , tolerance sum array λ bin And the histogram interval array sig where the demodulated signal is located bin ; S4, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , according to the signal number array num bin , parameter sum array f bin and the tolerance sum array λ bin Calculate the signal status parameters and traverse the array iVld bin , get the corresponding demodulated signal histogram interval array sig bin , signal status parameter array f state and the signal state tolerance array λ state ; S5. Find the histogram interval array sig where the demodulated signal is located bin In the array iVld bin The index in and calculate the demodulated signal i sig Status index sig id , state error sig dev And state parameter sig f .

2. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: The tolerance represents the starting point to the ending point of a demodulated signal. When searching from the middle point of the demodulated signal on the histogram, the first point exceeding the tolerance is recorded as the ending point; then searching from the middle point of the demodulated signal forward, the first point exceeding the tolerance is recorded as the starting point.

3. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: In S2, according to the maximum parameter f max , minimum parameter f min and the minimum tolerance λ min The process of calculating the histogram parameters is: Initialize the interval width δ to the minimum tolerance λ min ; Calculate and get the maximum parameter f max With the minimum parameter f min The difference between interval ; The difference f interval Divide by the interval width δ and round the result to get the number of intervals N bin ; The difference f interval Divide by the number of intervals N bin The initialization interval width δ is updated based on the result.

4. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: In S3, according to the number of intervals N bin And the interval width δ is calculated to obtain each demodulated signal i sig The interval i bin , the calculation is specifically as follows: Among them, ceil(·) is a round-up operation and satisfies 5. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: In S3, according to the interval i where the demodulated signal is located bin The interval parameters are calculated, and the calculation is specifically as follows: Among them, num bin (i bin ) is the interval i where the demodulated signal is located bin The signal number array num bin , f bin (i bin ) is the interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (i bin ) is the interval i where the demodulated signal is located bin The tolerance sum array λ bin .

6. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: The step S4 includes the following steps: S41, the signal number array num bin The interval i where the non-zero elements are located bin The indexes are stored in the array iVld bin , so that the array iVld bin The number of signal states N state The corresponding signal number array num bin The number of non-zero elements in ; S42, calculate and obtain the signal state index array iD state , signal status parameter array f state , signal state tolerance array λ state , the calculation is specifically as follows: Among them, num bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The signal number array num bin , f bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The sum of the parameters of the array f bin ,λ bin (iVld bin (i)) is the array iVld bin The interval i where the demodulated signal is located bin The tolerance sum array λ bin ; S43, obtain current state parameter f stateNow , according to the current state parameter f stateNow Traverse other signal states to determine whether there is a state parameter f that meets the range condition stateAnother According to the judgment result, the histogram interval array sig of the demodulated signal is bin , signal status parameter array f state , signal state tolerance array λ state And the number of signal states N state to update.

7. The method for transient analysis of signal states based on histogram according to claim 6, characterized in that: In S43, the range condition refers to the state parameter f stateAnother With the current state parameter f stateNow The difference between them is 2*λ min within the scope; When it is determined that there is a state parameter f that meets the range condition stateAnother When the state parameter f meets the range condition, stateAnother The histogram interval array sig of the demodulated signal bin , signal status parameter array f state , signal state tolerance array λ state And the number of signal states N state to update.

8. The method for transient analysis of signal states based on histogram according to claim 1, characterized in that: In S5, the demodulated signal i is calculated sig Status index sig id , state error sig dev And state parameter sig f , the calculation process is: Among them, idx refers to the histogram interval array sig where the demodulated signal is located bin (i) In array iVld bin The index in .

9. A signal state transient analysis device based on histogram, characterized in that: include: a memory for non-transitory storage of computer readable instructions; A processor is used to execute the computer-readable instructions, wherein the computer-readable instructions, when executed by the processor, implement the histogram-based signal state transient analysis method according to any one of claims 1 to 8.

10. A non-transitory computer-readable storage medium, wherein: The non-transitory computer-readable storage medium stores computer-readable instructions, and when the computer-readable instructions are executed by a processor, the method for transient analysis of signal states based on a histogram according to any one of claims 1 to 8 is implemented.

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