An insulator surface potential measuring device and method

By designing an insulator surface potential measurement device and using an electrostatic probe to scan the insulator surface, the problem of decreased accuracy caused by the geometric shape limitations of insulators and excessive measurement time in existing technologies has been solved, and efficient and accurate measurement of the surface potential of insulators with complex shapes has been achieved.

CN119574996BActive Publication Date: 2025-12-02GUANGDONG POWER GRID CO LTD +1
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Patent Information

Application Number
CN202411725340.0
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2024-11-28
Publication Date
2025-12-02
Estimated Expiration
2044-11-28

AI Technical Summary

Technical Problem

Existing insulator surface potential measurement techniques are limited by the geometry of the insulator, and the measurement accuracy is affected by the decay of the insulator surface potential due to the long measurement time.

Method used

An insulator surface potential measuring device was designed, including a housing, an electrostatic probe assembly, a central high-voltage conductor assembly, and a drive assembly. By simulating the electric field distribution under actual working conditions, the electrostatic probe scans the insulator surface to achieve accurate measurement.

Benefits of technology

It overcomes the limitations of measuring the surface potential of insulators with complex geometries, improves measurement efficiency and accuracy, and avoids measurement errors caused by the decay of the insulator surface potential.

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Abstract

This invention discloses an insulator surface potential measuring device and method, comprising a housing having a sealed cavity, an air inlet, and an exhaust outlet; a high-voltage wiring assembly installed in the housing, with one end of the high-voltage wiring assembly extending into the cavity and the other end connected to a high-voltage power supply; a vacuum pump assembly with one end extending through the housing into the cavity; an electrostatic probe assembly including an electrostatic probe and a driving structure, the electrostatic probe and the driving structure being installed in the cavity and connected; a first central high-voltage conductor assembly disposed in the cavity and connected to one end of the high-voltage wiring assembly; a second central high-voltage conductor assembly disposed in the cavity and opposite to the first central high-voltage conductor assembly; and a first driving assembly, with the second central high-voltage conductor mounted on the first driving assembly. This invention overcomes the limitations of existing technologies in measuring the surface potential of insulators with complex geometries and improves measurement efficiency through the aforementioned control.
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