A method for evaluating and analyzing test data of a PCBA circuit board

Abstract

The present invention discloses a method for evaluating and analyzing test data of a PCBA circuit board, which relates to the technical field of circuit board testing, and includes: obtaining and analyzing in a component library; using a multi-functional analysis method to obtain a multi-extreme test interval; obtaining an item to be evaluated; analyzing the functions in the circuit board based on the item to be evaluated, and evaluating the test data based on the analysis results. The present invention is used to solve the problem that in the existing evaluation and analysis of test data for circuit boards, when the test results are abnormal due to the influence of electronic components in the circuit board, the electronic components causing the abnormal test results cannot be obtained based on the analysis results of the test data, thereby causing the inability to timely correct the electronic components of the circuit board based on the test results, affecting the repair efficiency of the damaged circuit board.

Description

Technical Field

[0001] The present invention relates to the technical field of circuit board testing, and particularly to a method for evaluating and analyzing test data for a PCBA circuit board. Background Art

[0002] A PCBA circuit board refers to a circuit board on which electronic components are installed and a complete circuit system is formed through processes such as soldering; PCBA is an indispensable core component for electrical connection and signal transmission in electronic devices and is widely used in fields such as televisions, computers, mobile phones, automotive electronics, and medical devices; the test methods for PCBA circuit boards mainly include: ICT testing, FCT testing, aging testing, vibration testing, high and low temperature testing, drop testing, fatigue testing, and testing under harsh environments.

[0003] The existing methods for evaluating and analyzing test data for PCBA circuit boards usually involve separately inputting each item of test data of the circuit board into a trained network model, and obtaining the predicted test results of other test data of the circuit board through the network model. By comparing and analyzing the predicted test results with the actual test results, the test data of the circuit board is evaluated and analyzed. Although this improved method can compare and analyze the actual test data through the predicted test data, this improved method can only analyze the data of the test results of the test items and is limited to the comparison of the test results. There is a lack of an effective analysis method for the influence of electronic components on the test results of the test items in the test items of the circuit board. This will lead to the situation that when the test results are abnormal due to the influence of electronic components in the circuit board, the electronic components causing the abnormal test results cannot be obtained based on the analysis results of the test data, and thus the electronic components of the circuit board cannot be corrected in time based on the test results, affecting the repair efficiency of the damaged circuit board. For example, in the patent application with the publication number CN117872084A, a circuit board test data analysis system and method are disclosed. This solution comprehensively tests multiple test contents of the PCBA circuit board and predicts possible test results at the same time. Other methods for evaluating and analyzing test data for PCBA circuit boards are usually improvements in generating analysis reports and still cannot solve the problem that when the test results are abnormal due to the influence of electronic components in the circuit board, the electronic components causing the abnormal test results cannot be obtained based on the analysis results of the test data, and thus the electronic components of the circuit board cannot be corrected in time based on the test results, affecting the repair efficiency of the damaged circuit board. In view of this, it is necessary to improve the existing methods for evaluating and analyzing test data for circuit boards. Summary of the Invention

[0004] The present invention aims to solve at least one of the technical problems in the prior art to some extent. By proposing a method for evaluating and analyzing test data of a PCBA circuit board, it is used to solve the problem in the existing method for evaluating and analyzing test data of a PCBA circuit board that when the test results are abnormal due to the influence of electronic components in the circuit board, it is impossible to obtain the electronic components causing the abnormal test results based on the analysis results of the test data, thus making it impossible to timely correct the electronic components of the circuit board based on the test results and affecting the repair efficiency of the damaged circuit board.

[0005] To achieve the above object, the present application provides a method for evaluating and analyzing test data of a PCBA circuit board, including the following steps:

[0006] Obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use a multi-functional analysis method to analyze the electronic components in the analysis component library and respectively obtain the multi-extreme test intervals of the electronic components.

[0007] Obtain all the test data of the electronic components and screen the test data based on the multi-extreme test intervals, and obtain the items to be evaluated based on the screening results.

[0008] For any function that can be realized in the circuit board, record all the electronic components corresponding to the function as function components, perform full-component data analysis and partial-component data analysis on the functions in the circuit board based on the items to be evaluated of the function components, and evaluate the test data based on the analysis results.

[0009] Further, obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; using the multi-functional analysis method to analyze the electronic components in the analysis component library includes:

[0010] Obtain all the electronic components installed on the circuit board and record them as electronic component DY 1 to electronic component DY z , store all the electronic components DY in the analysis component library; obtain all the functions that the circuit board can realize and record the areas where all the functions are located in the circuit board as function areas GQ 1 to function area GQ m ;

[0011] The multi-functional analysis method includes: for any electronic component DY in the analysis component library c , record the function area GQ containing the electronic component DY c as the standard analysis area, where c is a positive integer less than or equal to z and greater than or equal to 1.

[0012] Further, the multi-functional analysis method also includes:

[0013] For any standard analysis region, obtain multiple test items in the test data; for any test item, record the parameter interval obtained when conducting the test item in the standard analysis region under standard conditions as the normal test interval; obtain all the normal test intervals corresponding to the standard analysis region, where the standard condition is the situation where all the electronic components in the standard analysis region are operating normally and not affected by the outside world when conducting the test item.

[0014] Establish a table with R rows × Y columns, denoted as the component standard screening table. Among them, except for the first cell in the top row of the component standard screening table, all the standard analysis regions are filled in sequence from left to right; except for the first cell in the leftmost column of the component standard screening table, all the test items corresponding to the standard analysis regions are filled in sequence from top to bottom; based on all the test items and their normal test intervals of each standard analysis region, fill the corresponding normal test intervals in the cells where the column where each standard analysis region is located intersects with the row where the corresponding test item is located.

[0015] Furthermore, obtaining the multi-extreme test intervals of the electronic component includes:

[0016] For any test item, mark all the normal test intervals in the row where the test item is located on the same number axis, and denote the number axis at this time as the standard screening axis; denote the parameter interval that exists in all the normal test intervals simultaneously in the standard screening axis as the multi-test interval.

[0017] Denote the largest multi-test interval as the multi-extreme test interval of the electronic component DY c ; obtain the multi-extreme test intervals of the electronic component DY c in all the test items, and denote the test items for which no multi-test interval is obtained as the conventional test items.

[0018] Obtain all the multi-extreme test intervals and conventional test items corresponding to all the electronic components DY.

[0019] Furthermore, obtain all the test data of the electronic component, and screen the test data based on the multi-extreme test interval. Based on the screening result, obtaining the items to be evaluated includes:

[0020] For any electronic component DY c , obtain all the test data of the electronic component DY c , and denote all the test items in all the test data as the items to be screened;

[0021] For any item to be screened, denote the functional region GQ for conducting the item to be screened as the region to be screened: when the item to be screened is a conventional test item, denote the parameter interval corresponding to the test result of the item to be screened as the conventional interval to be screened; for the electronic component DY cIn the component standard screening form, the normal test range in the cell where the column of the area to be screened intersects the row of the item to be screened is recorded as the conventional comparison range;

[0022] When the to-be-screened conventional range is not completely within the conventional comparison range, the item to be screened in the to-be-screened area is recorded as an item to be evaluated; when the to-be-screened conventional range is completely within the conventional comparison range, the item to be screened in the to-be-screened area is recorded as a normal item, where the number of to-be-screened areas may not be unique.

[0023] Furthermore, obtaining all test data of the electronic component and screening the test data based on the multi-extreme test range, and obtaining the items to be evaluated based on the screening results further includes:

[0024] When the item to be screened is not a conventional test item, the parameter range corresponding to the test result of the item to be screened is recorded as the to-be-screened extreme range; when the to-be-screened extreme range is completely within the multi-extreme test range of the electronic component DY c in the item to be screened, the electronic component DY c is recorded as a component in good condition. Among them, when the electronic component DY is recorded as a component in good condition during the analysis of any to-be-screened item α, the to-be-screened item α of the electronic component DY in all to-be-screened areas is recorded as a normal item, and the analysis of the to-be-screened item α of the electronic component DY is stopped;

[0025] When the to-be-screened extreme range is not completely within the multi-extreme test range of the electronic component DY c in the item to be screened; the electronic component DY c The normal test range in the cell where the column of the area to be screened intersects the row of the item to be screened in the component standard screening form of is recorded as the extreme comparison range; when the to-be-screened extreme range is not completely within the extreme comparison range, the item to be screened in the to-be-screened area is recorded as an item to be evaluated; when the to-be-screened extreme range is completely within the extreme comparison range, the item to be screened in the to-be-screened area is recorded as a normal item.

[0026] Furthermore, obtaining all test data of the electronic component and screening the test data based on the multi-extreme test range, and obtaining the items to be evaluated based on the screening results further includes: obtaining all to-be-screened items corresponding to all test data of all electronic components DY, and obtaining the items to be evaluated and normal items corresponding to each to-be-screened area when all electronic components DY are analyzed.

[0027] Furthermore, based on the items to be evaluated of the functional components, performing full-component data analysis and partial-component data analysis on the functions in the circuit board, and evaluating the test data based on the analysis results includes:

[0028] For any function that can be implemented in a circuit board: obtain the function area GQ corresponding to the function, denoted as the data evaluation area, and denote all the electronic components DY in the data evaluation area as function components;

[0029] Denote the function components in the data evaluation area where all the items to be screened are normal items as area-pass components, and denote the function components in the data evaluation area where there are items to be screened as items to be evaluated as area-fail components.

[0030] Furthermore, based on the items to be evaluated of the function components, perform full-component data analysis and partial-component data analysis on the functions in the circuit board, and evaluating the test data based on the analysis results also includes:

[0031] Use the area analysis algorithm to obtain the evaluation parameters of the data evaluation area. The area analysis algorithm is: , where F is the evaluation parameter, f sum is the number of function components, f 1 is the number of function components recorded as item-intact components in the data evaluation area, f 2 is the number of area-pass components in the data evaluation area, P is the number of area-fail components in the data evaluation area, Q j is the number of items to be evaluated of the j-th area-fail component in the data evaluation area where the items to be screened are items to be evaluated;

[0032] When the evaluation parameter is greater than 0, perform partial-component data analysis on the data evaluation area; when the evaluation parameter is less than or equal to 0, perform full-component data analysis on the data evaluation area.

[0033] Furthermore, based on the items to be evaluated of the function components, perform full-component data analysis and partial-component data analysis on the functions in the circuit board, and evaluating the test data based on the analysis results also includes:

[0034] Partial-component data analysis is: retest the items to be evaluated of all the area-fail components in the data evaluation area, and analyze the test results; when, after analyzing the test results, any item to be evaluated of any area-fail component is still an item to be evaluated, denote the function corresponding to the data evaluation area as a faulty function; when all the items to be evaluated of all the area-fail components are normal items, denote the function corresponding to the data evaluation area as a normal function;

[0035] The full-component data analysis is as follows: Retest the normal items and the items to be evaluated for all functional components, and analyze the test results. When all the test items of all functional components are normal items after analyzing the test results, the function corresponding to the data evaluation area is recorded as a normal function. When any test item of any functional component is an item to be evaluated, the function corresponding to the data evaluation area is recorded as a faulty function.

[0036] Advantages of the present invention: The present application first obtains the types of all electronic components installed on the circuit board and stores them in the analysis component library. The multi-functional analysis method is used to analyze the electronic components in the analysis component library, and the multi-extreme test intervals of the electronic components are obtained respectively. The advantage of this is that by analyzing the electronic components and obtaining the multi-extreme test intervals corresponding to each electronic component, it is possible to obtain the parameter intervals in which the electronic components are in a normal state in all their corresponding functional areas during the test process, which helps to improve the analysis efficiency of the electronic components in subsequent analysis. At the same time, it helps to quickly obtain the electronic components that cause abnormal test results when the test results are abnormal, and then make timely corrections.

[0037] The present application also obtains all the test data of the electronic components, screens the test data based on the multi-extreme test intervals, and obtains the items to be evaluated based on the screening results. Finally, for any function that can be realized in the circuit board, all the electronic components corresponding to the function are recorded as functional components. The full-component data analysis and partial-component data analysis of the functions in the circuit board are carried out based on the items to be evaluated of the functional components, and the test data is evaluated based on the analysis results. The advantage of this is that by obtaining the items to be evaluated and carrying out the full-component data analysis and partial-component data analysis, it is possible to obtain the test items that need to be evaluated to achieve the screening of the test data and improve the data analysis efficiency. At the same time, dividing the analysis method into full-component data analysis and partial-component data analysis can distinguish the functional areas with more abnormal electronic components and the functional areas with fewer abnormal electronic components based on the tested data of the electronic components in each functional area, so as to ensure that the analysis method can effectively analyze the electronic components in the functional area while improving the screening and repair efficiency of the electronic components. Description of the Drawings

[0038] Figure 1 is the step flow chart of the method of the present invention;

[0039] Figure 2 is the schematic diagram for obtaining the multi-extreme test interval of the present invention;

[0040] Figure 3 is the structural schematic diagram of the electronic device of the present invention. Detailed Embodiments

[0041] Next, in combination with the accompanying drawings in the embodiments of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0042] Embodiment 1, in the first aspect, please refer to Figure 1 As shown, the present application provides a method for evaluating and analyzing test data for a PCBA circuit board, including the following steps:

[0043] Step S1, obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use a multi-functional analysis method to analyze the electronic components in the analysis component library, and respectively obtain the multi-extreme test intervals of the electronic components.

[0044] Step S1 includes: Step S101, obtain all the electronic components installed on the circuit board, and respectively denote them as electronic component DY 1 to electronic component DY z , store all the electronic components DY in the analysis component library; obtain all the functions that the circuit board can achieve, and respectively denote the areas where all the functions are located on the circuit board as function areas GQ 1 to function area GQ m ;

[0045] In the specific implementation process, the electronic components can be resistors, capacitors, inductors, diodes, variable resistors, integrated circuits, relays, etc. that can be installed on the circuit board; the function areas can be: the area for signal transmission on the circuit board, the area for signal processing on the circuit board, and the area for data conversion on the circuit board, etc.; the electronic components DY and the function areas GQ can be marked according to the actual electronic components in the circuit board to be analyzed and the functions that the circuit board can achieve.

[0046] Step S102, the multi-functional analysis method includes: for any one electronic component DY c in the analysis component library, denote the function area GQ containing the electronic component DY c as the standard analysis area, where c is a positive integer less than or equal to z and greater than or equal to 1.

[0047] For any standard analysis region, obtain multiple test items in the test data; for any test item, record the parameter interval obtained when the standard analysis region undergoes the test item under standard conditions as the normal test interval; obtain all the normal test intervals corresponding to the standard analysis region, where the standard condition is the situation where all the electronic components in the standard analysis region are operating normally and not affected by the outside world when performing the test item.

[0048] In the specific implementation process, for example, during a data analysis, the electronic component DY c is an integrated circuit, and the function implemented by a corresponding standard analysis region is data conversion; at the same time, one of the test items in the test data for data conversion is power consumption test, and the parameter interval of the static power consumption obtained in the power consumption test under standard conditions is less than or equal to 100 mw, then the normal test interval for the power consumption test of data conversion can be set to less than or equal to [0, 100 mw];

[0049] Step S103, establish a table with R rows × Y columns, denoted as the component standard screening table. Among them, except for the first cell in the top row of the component standard screening table, fill in all the standard analysis regions from left to right in sequence; except for the first cell in the leftmost column of the component standard screening table, fill in all the test items corresponding to the standard analysis regions from top to bottom in sequence; based on all the test items and their normal test intervals of each standard analysis region, fill in the corresponding normal test intervals in the cells where the column where each standard analysis region is located intersects with the row where the corresponding test item is located.

[0050] In the specific implementation process, the value of R is the number of all standard analysis regions plus 1, and the value of Y is the number of all test items plus 1. For example, during a data processing, the obtained component standard screening table is as shown in Table 1: Component Standard Screening Table;

[0051] Table 1: Component Screening Standard Table

[0052]

[0053] Step S104, for any test item, mark all the normal test intervals in the row where the test item is located on the same number axis, and denote the number axis at this time as the standard screening axis; denote the parameter interval that exists in all the normal test intervals simultaneously in the standard screening axis as the multi-test interval.

[0054] In the specific implementation process, for example, during a data processing, it is analyzed that all the normal test intervals for the power consumption test are [0, 100 mw] and [20 mw, 80 mw] respectively, then through analysis, the multi-test interval for the power consumption test is [20 mw, 80 mw];

[0055] Denote the largest multi-test interval as the electronic component DYc Multi-extreme test intervals; obtain electronic component DY c Multi-extreme test intervals in all test items, and mark the test items without obtaining multi-test intervals as regular test items; in the specific implementation process, in this embodiment, the largest multi-test interval is the multi-test interval with the largest coverage range. For example, if two multi-test intervals are [0, 80mw] and [20mw, 100mw] respectively, then [20mw, 80mw] can be marked as the multi-extreme test interval; the standard screening axis obtained based on the above data can be referred to Figure 2 as shown, where the interval corresponding to DJ is the multi-extreme test interval;

[0056] Obtain all multi-extreme test intervals and regular test items corresponding to all electronic components DY.

[0057] Step S2, obtain all test data of the electronic component, and screen the test data based on the multi-extreme test interval, and obtain the item to be evaluated based on the screening result;

[0058] Step S2 includes: Step S201, for any electronic component DY c , obtain all test data of the electronic component DY c , and mark the test items in all test data as items to be screened;

[0059] For any item to be screened, mark the functional area GQ of the item to be screened as the area to be screened: when the item to be screened is a regular test item, mark the parameter interval corresponding to the test result of the item to be screened as the regular interval to be screened; mark the normal test interval in the cell where the column where the area to be screened is located in the component standard screening table of the electronic component DY c intersects with the row where the item to be screened is located as the regular comparison interval;

[0060] When the regular interval to be screened is not completely within the regular comparison interval, mark the item to be screened in the area to be screened as the item to be evaluated; when the regular interval to be screened is completely within the regular comparison interval, mark the item to be screened in the area to be screened as a normal item, where the number of areas to be screened may not be unique;

[0061] In the specific implementation process, for example, when the same item to be screened is tested in multiple functional areas CQ, there may be multiple areas to be screened corresponding to the item to be screened; such as power consumption testing is carried out both in data conversion and data processing, then the areas to be screened corresponding to power consumption testing can be the standard analysis area corresponding to data conversion and the standard analysis area corresponding to signal processing;

[0062] Step S202, when the item to be screened is not a regular test item, record the parameter interval corresponding to the test result of the item to be screened as the extreme interval to be screened; when the extreme interval to be screened is completely within the multi-extreme test interval of the electronic component DY c in the item to be screened, record the electronic component DY c as a component with intact item. Among them, when the electronic component DY is recorded as a component with intact item during the analysis of any item α to be screened, record all items α to be screened of the electronic component DY in all areas to be screened as normal items, and stop the analysis of the item α to be screened of the electronic component DY;

[0063] In the specific implementation process, for example, during the data processing of a power consumption test, the extreme interval to be screened obtained is [60mw, 79mw], and at the same time the electronic component DY c has a multi-extreme test interval of [20mw, 80mw], then the electronic component DY c can be recorded as a component with intact item; when the electronic component DY c is recorded as a component with intact item, it indicates that the test results of the electronic component DY c in all power consumption tests in all areas to be screened are within the normal test interval. Therefore, the power consumption test can be directly recorded as a normal item, and the subsequent analysis of the power consumption test can be stopped to improve the analysis efficiency;

[0064] When the extreme interval to be screened is not completely within the multi-extreme test interval of the electronic component DY c in the item to be screened; record the normal test interval in the cell where the column corresponding to the area to be screened intersects the row corresponding to the item to be screened in the standard screening table of the component of the electronic component DY c as the extreme comparison interval; when the extreme interval to be screened is not completely within the extreme comparison interval, record the item to be screened in the area to be screened as the item to be evaluated; when the extreme interval to be screened is completely within the extreme comparison interval, record the item to be screened in the area to be screened as a normal item;

[0065] Step S203, obtain all items to be screened corresponding to all test data of all electronic components DY, and obtain the items to be evaluated and normal items corresponding to each area to be screened when all electronic components DY are analyzed.

[0066] Step S3, for any function that can be realized in the circuit board, record all electronic components corresponding to the function as function components, perform full-component data analysis and partial-component data analysis on the functions in the circuit board based on the items to be evaluated of the function components, and evaluate the test data based on the analysis results; Step S3 includes:

[0067] Step S301: For any function that can be implemented on the circuit board, obtain the function area GQ corresponding to the function, denoted as the data evaluation area, and denote all the electronic components DY in the data evaluation area as function components;

[0068] Denote the function components in the data evaluation area where all the items to be screened are normal items as area-passed components, and denote the function components in the data evaluation area where there are items to be screened as items to be evaluated as area-failed components;

[0069] Step S302: Use the area analysis algorithm to obtain the evaluation parameters of the data evaluation area. The area analysis algorithm is: , where F is the evaluation parameter, f sum is the number of function components, f 1 is the number of function components recorded as item-intact components in the data evaluation area, f 2 is the number of area-passed components in the data evaluation area, P is the number of area-failed components in the data evaluation area, Q j is the number of items to be evaluated for the j-th area-failed component in the data evaluation area among the items to be screened in the data evaluation area;

[0070] In the specific implementation process, for example, in a data analysis, the number of function components is 10, the number of function components recorded as item-intact components in the data evaluation area is 2, the number of area-passed components in the data evaluation area is 5, the number of area-failed components in the data evaluation area is 5, and the number of items to be evaluated for all the area-failed components in the data evaluation area among the items to be screened in the data evaluation area are 1, 2, 1, 2, and 3 respectively. Then, through calculation, the obtained evaluation parameter is -3.8, which indicates that there are relatively many test items corresponding to the electronic components in the data evaluation area that do not meet the standard data. Therefore, a full-component data analysis should be performed on the data evaluation area to verify the data authenticity and reconfirm the faulty electronic components at the same time;

[0071] When the evaluation parameter is greater than 0, perform a partial-component data analysis on the data evaluation area; when the evaluation parameter is less than or equal to 0, perform a full-component data analysis on the data evaluation area;

[0072] The partial-component data analysis is as follows: Retest the items to be evaluated of all the area-failed components in the data evaluation area, and analyze the test results; when, after analyzing the test results, any item to be evaluated of any area-failed component is still an item to be evaluated, denote the function corresponding to the data evaluation area as a faulty function; when all the items to be evaluated of all the area-failed components are normal items, denote the function corresponding to the data evaluation area as a normal function;

[0073] In the specific implementation process, when the function corresponding to the data evaluation area is recorded as a faulty function, the staff can be notified to screen the unqualified components in the data evaluation area, which helps to obtain faulty electronic components based on the test data and improve the screening and repair efficiency of electronic components.

[0074] The full-component data analysis is as follows: retest the normal items and items to be evaluated of all functional components and analyze the test results; when all the test items of all functional components are normal items after analyzing the test results, record the function corresponding to the data evaluation area as a normal function; when any test item of any functional component is an item to be evaluated, record the function corresponding to the data evaluation area as a faulty function.

[0075] Example 2, please refer to Figure 3 as shown Figure 3 illustrates a schematic structural diagram of an electronic device, which may include: a processor, a communication interface, a memory, and a communication bus. Among them, the processor, the communication interface, and the memory complete mutual communication through the communication bus. The memory stores computer-readable instructions, and the processor can call the instructions in the memory. When the computer-readable instructions are executed by the processor, the steps in a test data evaluation and analysis method for a PCBA circuit board are run to achieve the following functions: first, obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use the multi-functional analysis method to analyze the electronic components in the analysis component library, and respectively obtain the multi-extreme test intervals of the electronic components. Also, obtain all the test data of the electronic components, screen the test data based on the multi-extreme test intervals, and obtain the items to be evaluated based on the screening results; finally, for any function that can be realized in the circuit board, record all the electronic components corresponding to the function as functional components, perform full-component data analysis and partial-component data analysis on the functions in the circuit board based on the items to be evaluated of the functional components, and evaluate the test data based on the analysis results.

[0076] In addition, when the logic instructions in the above-mentioned memory are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, or a part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of this application. The aforementioned storage medium includes: various media such as USB flash drives, mobile hard disks, read-only memories (ROM, Read-Only Memory), random access memories (RAM, Random Access Memory), magnetic disks, or optical discs that can store program codes.

[0077] Embodiment 3, this application also provides a computer program product. The computer program product includes a computer program stored on a computer-readable storage medium. The computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute a method for evaluating and analyzing test data for a PCBA circuit board provided by the above-mentioned various methods. This method includes: first, obtaining the types of all electronic components installed on the circuit board and storing them in an analysis component library; using a multi-functional analysis method to analyze the electronic components in the analysis component library, and respectively obtaining the multi-extreme test intervals of the electronic components. Also, by obtaining all the test data of the electronic components and screening the test data based on the multi-extreme test intervals, obtaining items to be evaluated based on the screening results; finally, for any function that can be realized in the circuit board, marking all the electronic components corresponding to the function as functional components, performing full-component data analysis and partial-component data analysis on the functions in the circuit board based on the items to be evaluated of the functional components, and evaluating the test data based on the analysis results.

[0078] Example 4. The present application also provides a computer-readable storage medium. The present application provides a storage medium on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method for evaluating and analyzing test data for a PCBA circuit board are run to achieve the following functions: First, obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use a multi-functional analysis method to analyze the electronic components in the analysis component library, and respectively obtain the multi-extreme test intervals of the electronic components. Also, obtain all the test data of the electronic components, and screen the test data based on the multi-extreme test intervals. Based on the screening results, obtain the items to be evaluated; finally, for any function that can be achieved in the circuit board, mark all the electronic components corresponding to the function as functional components, perform full-component data analysis and partial-component data analysis on the functions in the circuit board based on the items to be evaluated of the functional components, and evaluate the test data based on the analysis results.

[0079] Through the description of the above embodiments, the embodiments of the present invention can be provided as a method, a system or a computer program product. Based on such an understanding, the above technical solution, in essence, or the part that contributes to the prior art can be embodied in the form of a software product. This computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, magnetic disk, optical disc, etc., and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or some parts of the embodiments.

[0080] In the embodiments provided by the present application, it should be understood that the disclosed system or method can be implemented in other ways. The above-described embodiments are only illustrative. For example, the division of modules or units is only a logical function division. In actual implementation, there may be other division methods. For another example, multiple modules or units can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some communication interfaces. The indirect coupling or communication connection of the system, module and unit can be electrical, mechanical or other forms.

[0081] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments, or perform equivalent replacements on some of the technical features; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of each embodiment of the present application.

Claims

1. A test data evaluation and analysis method for PCBA circuit boards, characterized in that: The steps include: Obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; use the multi-functional analysis method to analyze the electronic components in the analysis component library, and obtain the multiple extreme test intervals of the electronic components respectively; for any test item, mark all normal test intervals in the row where the test item is located in the same number axis, and record the number axis at this time as the standard screening axis; record the parameter interval in the standard screening axis that exists in all normal test intervals at the same time as the multiple test interval; The largest multi-test interval is recorded as electronic component DY c Multiple extreme test intervals; Obtain all test data of electronic components, filter the test data based on multiple extreme test intervals, and obtain items to be evaluated based on the filtering results; For any function that can be realized in the circuit board, all electronic components corresponding to the function are recorded as functional components. Based on the items to be evaluated of the functional components, full component data analysis and partial component data analysis are performed on the functions in the circuit board, and the test data is evaluated based on the analysis results.

2. A test data evaluation and analysis method for PCBA circuit board according to claim 1, characterized in that: Obtain the types of all electronic components installed on the circuit board and store them in the analysis component library; Analyze electronic components in the component library using versatile analysis methods including: Get all the electronic components installed on the circuit board and record them as electronic component DY1 to electronic component DY z , store all electronic components DY in the analysis component library; obtain all functions that the circuit board can realize, and record the areas in the circuit board where all functions are located as functional areas GQ1 to GQ m ; Multifunctional analysis methods include: for any electronic component DY in the analysis component library c , will contain electronic components DY c The functional area GQ is recorded as the standard analysis area, where c is a positive integer less than or equal to z and greater than or equal to 1.

3. A test data evaluation and analysis method for PCBA circuit board according to claim 2, characterized in that: Multifunctional assays also include: For any standard analysis area, multiple test items in the test data are obtained; for any test item, the parameter interval obtained when the standard analysis area performs the test item under standard conditions is recorded as a normal test interval; all normal test intervals corresponding to the standard analysis area are obtained, wherein the standard condition is a condition in which all electronic components in the standard analysis area operate normally and are not affected by the outside world when the test item is performed; A table of R rows × Y columns is established, recorded as a component standard screening table, wherein the top row of the component standard screening table is filled with all standard analysis areas from left to right except the first cell; the leftmost column of the component standard screening table is filled with test items corresponding to all standard analysis areas from top to bottom except the first cell; based on all test items and normal test intervals of each standard analysis area, the corresponding normal test interval is filled in the cell where the column where each standard analysis area is located intersects with the row where the corresponding test item is located.

4. A test data evaluation and analysis method for PCBA circuit board according to claim 3, characterized in that: Get multiple extreme test intervals for electronic components including: Get electronic components DY c In all test items, multiple extreme test intervals are obtained, and test items that do not obtain multiple test intervals are recorded as regular test items; Obtain all multi-extreme test intervals and conventional test items corresponding to all electronic components DY.

5. A test data evaluation and analysis method for PCBA circuit board according to claim 4, characterized in that: Obtain all test data of electronic components, and filter the test data based on multiple extreme test intervals. Based on the screening results, obtain the items to be evaluated, including: For any electronic component DY c , get electronic components DY c All test data, and record the test items in all test data as items to be screened; For any item to be screened, the functional area GQ of the item to be screened is recorded as the area to be screened; when the item to be screened is a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the conventional interval to be screened; c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the regular comparison interval; When the conventional interval to be screened is not completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as items to be evaluated; when the conventional interval to be screened is completely within the conventional comparison interval, the items to be screened in the area to be screened are recorded as normal items, wherein the number of areas to be screened may not be unique.

6. A test data evaluation and analysis method for PCBA circuit board according to claim 5, characterized in that: Obtain all test data of electronic components and filter the test data based on multiple extreme test intervals. Based on the screening results, obtain the items to be evaluated, including: When the item to be screened is not a conventional test item, the parameter interval corresponding to the test result of the item to be screened is recorded as the extreme interval to be screened; when the extreme interval to be screened is completely within the DY c When there are multiple extreme test intervals in the items to be screened, the electronic components DY c Recorded as a good component of the project, wherein, when the electronic component DY is recorded as a good component of the project in the analysis process of any one of the items to be screened α, the items to be screened α of the electronic component DY in all the areas to be screened are all recorded as normal items, and the analysis of the items to be screened α of the electronic component DY is stopped; When the extreme interval to be screened is not completely within the electronic component DY c When there are multiple extreme test intervals in the items to be screened; DY the electronic components c The normal test interval in the cell where the column where the to-be-screened area is located and the row where the to-be-screened item is located in the component standard screening table intersects is recorded as the extreme comparison interval; when the to-be-screened extreme interval is not completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as an item to be evaluated; when the to-be-screened extreme interval is completely within the extreme comparison interval, the to-be-screened item in the to-be-screened area is recorded as a normal item.

7. A test data evaluation and analysis method for PCBA circuit board according to claim 6, characterized in that: Acquire all test data of electronic components, and screen the test data based on multiple extreme test intervals, and acquire the items to be evaluated based on the screening results, further comprising: acquiring all items to be screened corresponding to all test data of all electronic components DY, and acquiring the items to be evaluated and normal items corresponding to each area to be screened when all electronic components DY are analyzed.

8. A test data evaluation and analysis method for PCBA circuit board according to claim 7, characterized in that: Based on the items to be evaluated of the functional components, the full component data analysis and partial component data analysis of the functions in the circuit board are performed, and the test data is evaluated based on the analysis results, including: For any function that can be realized in the circuit board: obtain the functional area GQ corresponding to the function, record it as the data evaluation area, and record all electronic components DY in the data evaluation area as functional components; The functional element in which all the items to be screened in the data evaluation area are normal items is recorded as the area passing element, and the functional element in which there are items to be screened in the data evaluation area as the items to be evaluated is recorded as the area not passing element.

9. A test data evaluation and analysis method for PCBA circuit board according to claim 8, characterized in that: Based on the items to be evaluated of the functional components, the full component data analysis and partial component data analysis of the functions in the circuit board are carried out, and the test data is evaluated based on the analysis results, which also includes: Use the regional analysis algorithm to obtain the evaluation parameters of the data evaluation area. The regional analysis algorithm is: , where F is the evaluation parameter, f sum is the number of functional elements, f1 is the number of functional elements recorded as good elements in the data evaluation area, f2 is the number of regional passing elements in the data evaluation area, P is the number of regional failing elements in the data evaluation area, Q j is the number of items to be evaluated that have not passed the elements in the jth area in the data evaluation area; When the evaluation parameter is greater than 0, partial component data analysis is performed on the data evaluation area; when the evaluation parameter is less than or equal to 0, full component data analysis is performed on the data evaluation area.

10. A test data evaluation and analysis method for PCBA circuit board according to claim 9, characterized in that: Based on the items to be evaluated of the functional components, the full component data analysis and partial component data analysis of the functions in the circuit board are carried out, and the test data is evaluated based on the analysis results, which also includes: The data analysis of some components is as follows: for all the components that failed in all regions, the items to be evaluated of the components that failed in all regions are retested in the data evaluation region, and the test results are analyzed; after the test results are analyzed, when any item to be evaluated of any component that failed in any region is still an item to be evaluated, the function corresponding to the data evaluation region is recorded as a faulty function; when all items to be evaluated of all the components that failed in all regions are normal items, the function corresponding to the data evaluation region is recorded as a normal function; The full component data analysis is as follows: retest the normal items and items to be evaluated of all functional components, and analyze the test results; when after analyzing the test results, if the test items of all functional components are normal items, the function corresponding to the data evaluation area is recorded as a normal function; when any test item of any functional component is an item to be evaluated, the function corresponding to the data evaluation area is recorded as a faulty function.

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