Detection equipment, test method and device for metal oxide arrester, and medium

Abstract

The invention discloses detection equipment, a test method and device for a metal oxide arrester and a medium, and the test method is used for detecting whether the voltage impact resistance of the arrester is qualified or not, and comprises the steps: obtaining the initial DC reference voltage of each metal oxide arrester sample; performing an impact aging test on each metal oxide lightning arrester sample, and collecting a direct current reference voltage of each sample in the impact aging test process until each metal oxide lightning arrester is damaged; and determining whether the metal oxide lightning arrester is qualified or not according to the initial direct current reference voltage of each sample and the direct current reference voltage of each sample collected at the last time. According to the technical scheme of the invention, sample damage is taken as a standard for ending the test, so that the test procedure of the metal oxide arrester is optimized, the performance detection standard of the metal oxide arrester is improved, the rapid reduction of the electrical performance after the metal oxide arrester runs in a network is avoided, and the improvement of the running stability of a power grid is facilitated.

Description

Technical Field

[0001] The invention relates to the field of electric power technology, and in particular to a detection device and a test method, device and medium for a metal oxide lightning arrester. Background Art

[0002] Metal oxide arresters, such as zinc oxide arresters, have excellent nonlinear volt-ampere characteristics, can effectively suppress overvoltage, protect power equipment, and are widely used in power grids. At present, there are zinc oxide arresters of different quality from different manufacturers in the 10kV distribution network. The repeated transfer charge test in the type test of tin oxide arresters stipulates that each zinc oxide resistor sample should be subjected to 20 impulse current tolerances, divided into 10 groups, 2 times in each group, and the interval between the 2 impulse currents of each group is 50s to 60s. The interval between two adjacent groups should be enough to allow the test sample to cool to the ambient temperature. When the DC reference voltage of the test sample changes by more than ±5%, it is judged as failing the test.

[0003] However, in the repeated charge transfer test, the maximum number of impact groups that all zinc oxide resistor samples withstand is 10 groups. It is possible that zinc oxide resistors of poor quality can pass the test when leaving the factory, but are constantly subjected to impact during operation, resulting in a degradation of electrical performance and being damaged and returned before reaching the aging standard. This prevents distribution network operation and maintenance personnel from discovering safety hazards in advance and making corresponding warnings, which has a huge impact on the safe and stable operation of the power grid. Therefore, the current zinc oxide arrester detection test still has shortcomings, and the test procedures should be optimized and the detection standards should be improved. Summary of the invention

[0004] The present invention provides a detection device and a test method, device and medium for a metal oxide lightning arrester to solve the problems existing in the prior art. By taking sample damage as the standard for the end of the test, the test procedure for the metal oxide lightning arrester is optimized, and the performance detection standard of the metal oxide lightning arrester is improved, thereby avoiding a rapid decline in electrical performance of the metal oxide lightning arrester after the metal oxide lightning arrester is put into operation, which is beneficial to improving the operation stability of the power grid.

[0005] In a first aspect, the present invention provides a testing method for a metal oxide surge arrester, which is used to detect whether the surge withstand performance of the surge arrester is qualified, comprising:

[0006] Obtaining an initial DC reference voltage of each metal oxide arrester sample;

[0007] Performing an impact aging test on each of the metal oxide arrester samples, and collecting a DC reference voltage of each sample during the impact aging test until each of the metal oxide arresters is damaged;

[0008] Whether the metal oxide arrester is qualified is determined based on the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time.

[0009] Optionally, obtaining an initial DC reference voltage of each metal oxide arrester sample includes:

[0010] Applying a DC reference current to the metal oxide arrester sample and simultaneously collecting a voltage across the metal oxide arrester sample;

[0011] The voltage across the metal oxide arrester sample is recorded as the initial DC reference voltage.

[0012] Optionally, an impact aging test is performed on each of the metal oxide arrester samples, including:

[0013] A preset impulse current group is applied to each of the metal oxide arrester samples according to a preset rule.

[0014] Optionally, the preset rule is to apply a preset impulse current group to the sample, and then apply the preset impulse current group to the sample again after the temperature of the sample is less than or equal to the first temperature.

[0015] Optionally, collecting a DC reference voltage of each sample during the impact aging test includes:

[0016] After each application of the preset impulse current group, collecting the temperature of the sample;

[0017] When the temperature of the sample is less than or equal to the second temperature, the DC reference voltage of each sample is collected.

[0018] Optionally, determining whether the metal oxide arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time includes:

[0019] Determine the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected last time;

[0020] Whether the metal oxide arrester is qualified is determined based on the rate of change of the DC reference voltage of each sample.

[0021] Optionally, determining whether the metal oxide arrester is qualified according to the DC reference voltage change rate of each sample includes:

[0022] Determining whether the DC reference voltage change rate of each of the samples is less than a preset change rate;

[0023] If yes, it is determined that the corresponding sample is not fully aged;

[0024] Determining a ratio of the number of the samples that are not completely aged to the total number of the samples based on the number of the samples that are not completely aged and the total number of the samples;

[0025] When the ratio is less than or equal to a preset ratio, it is determined that the metal oxide arrester is qualified.

[0026] In a second aspect, the present invention provides a performance detection test device for a metal oxide lightning arrester, which is used to detect whether the voltage surge resistance performance of the lightning arrester is qualified, comprising:

[0027] An acquisition module, used for acquiring an initial DC reference voltage of each metal oxide arrester sample;

[0028] A test and collection module, used for performing an impact aging test on each metal oxide arrester sample, and collecting a DC reference voltage of each sample during the impact aging test, until each metal oxide arrester is damaged;

[0029] The determination module is used to determine whether the metal oxide surge arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time.

[0030] In a third aspect, the present invention provides a detection device, characterized in that it comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute any one of the above-mentioned test methods for metal oxide arresters.

[0031] In a fourth aspect, the present invention provides a computer-readable storage medium storing computer instructions, wherein the computer instructions are used to enable a processor to implement any of the above-mentioned methods for testing metal oxide arresters when executed.

[0032] The technical solution of the present invention obtains the initial DC reference voltage of each metal oxide lightning arrester sample, performs an impact aging test on each metal oxide lightning arrester sample, and collects the DC reference voltage of each sample during the impact aging test until each metal oxide lightning arrester is damaged, thereby determining whether the metal oxide lightning arrester is qualified based on the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time. In this way, it is possible to achieve the standard of using sample damage as the end of the test, optimize the test procedure for the metal oxide lightning arrester, and improve the performance detection standard of the metal oxide lightning arrester, thereby avoiding the rapid decline of electrical performance of the metal oxide lightning arrester after the metal oxide lightning arrester is put into operation, which is beneficial to improving the operation stability of the power grid.

[0033] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0035] Figure 1 A flow chart of a method for testing a metal oxide arrester provided in Embodiment 1 of the present invention;

[0036] Figure 2 A flow chart of a method for testing a metal oxide arrester provided in Embodiment 2 of the present invention;

[0037] Figure 3 A variation trend diagram of the DC reference voltage of a typical sample provided in an embodiment of the present invention;

[0038] Figure 4 A flow chart of a method for testing a metal oxide arrester provided in Embodiment 3 of the present invention;

[0039] Figure 5 A schematic structural diagram of a test device for a metal oxide surge arrester provided in Embodiment 4 of the present invention. DETAILED DESCRIPTION

[0040] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0041] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein.

[0042] Embodiment 1

[0043] Figure 1 This is a flow chart of a method for testing a metal oxide arrester provided in the first embodiment of the present invention. This embodiment can be applied to the case of detecting whether the arrester's withstand voltage shock performance is qualified. The method can be performed by a metal oxide arrester test device. The metal oxide arrester test device can be implemented in the form of hardware and / or software. The metal oxide arrester test device can be configured in the controller of the detection device. Figure 1 As shown, the method includes:

[0044] S110, obtaining an initial DC reference voltage of each metal oxide arrester sample.

[0045] Among them, the metal oxide arrester may include but is not limited to zinc oxide arrester. When selecting the metal oxide arrester, a number of metal oxide arresters are selected from the metal oxide arresters of the type to be selected as metal oxide arrester samples. In an exemplary embodiment, the number of metal oxide arrester samples is greater than or equal to 1% of the total number of metal oxide arresters of the type to be selected. In this embodiment, the number of metal oxide arrester samples needs to be greater than or equal to 10 to reduce the contingency of the test and improve the stability of the power grid operation.

[0046] The rate of change of the DC reference voltage can reflect the aging degree of the metal oxide arrester sample. The initial DC reference voltage can be understood as the DC reference voltage of each metal oxide sample before the impact aging test.

[0047] Optionally, obtaining an initial DC reference voltage of each metal oxide arrester sample includes: applying a DC reference current to the metal oxide arrester sample and simultaneously collecting the voltage across the metal oxide arrester sample; recording the voltage across the metal oxide arrester sample as the initial DC reference voltage.

[0048] The DC reference current is 1 mA DC current. In an exemplary embodiment, the side of the metal oxide arrester that bears current is defined as the front side, and the grounding side is defined as the back side. The metal oxide arrester is placed on the workbench of the DC parameter tester with the front side facing upward and the back side grounded. Then, a DC current is applied to the metal oxide arrester. When the DC current is 1 mA, the voltage across the metal oxide arrester is collected, and the voltage across the metal oxide arrester sample is recorded as the initial DC reference voltage.

[0049] S120, performing an impact aging test on each metal oxide arrester sample, and collecting a DC reference voltage of each sample during the impact aging test until each metal oxide arrester is damaged.

[0050] Among them, the impact aging test can be understood as a test of the process of simulating lightning strikes on metal oxide arresters. In an optional embodiment, the impact aging test on each metal oxide arrester sample may include, but is not limited to, applying multiple high-voltage pulse currents to the metal oxide arrester to simulate the process of lightning strikes. The DC reference voltage of each sample during the impact aging test can be understood as the DC reference voltage of the metal oxide arrester collected after each high-voltage impulse current ends during the impact aging test.

[0051] Damage to the metal oxide lightning arrester may include, but is not limited to, breakdown, flashover or cracking of the metal oxide lightning arrester.

[0052] S130. Determine whether the metal oxide arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time.

[0053] Among them, the DC reference voltage of each sample collected for the last time is the DC reference voltage of each metal oxide arrester sample when it is facing damage. According to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time, the change rate of the DC reference voltage of a brand new metal oxide arrester and a metal oxide arrester facing damage can be determined to know the aging degree of the metal oxide arrester when facing damage.

[0054] Specifically, at least 10 metal oxide arresters are selected as samples from the metal oxide arresters to be selected, and the initial DC reference voltage of each metal oxide arrester sample is first obtained. Then, an impact aging test is started on each metal oxide arrester. During the impact aging test, the DC reference voltage of each metal oxide arrester sample is collected until each metal oxide arrester shows damage such as breakdown, flashover or cracking. In this way, the aging degree of the metal oxide arrester sample when facing damage is determined based on the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time, and then it can be determined whether the metal oxide arrester is qualified.

[0055] In this embodiment, an initial DC reference voltage of each metal oxide arrester sample is obtained, an impact aging test is performed on each metal oxide arrester sample, and the DC reference voltage of each sample during the impact aging test is collected until each metal oxide arrester is damaged. Therefore, whether the metal oxide arrester is qualified is determined based on the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time. In this way, it is possible to achieve the standard of using sample damage as the end of the test, optimize the test procedure for metal oxide arresters, and improve the performance detection standard of metal oxide arresters, thereby avoiding a rapid decline in electrical performance after the metal oxide arrester is put into operation, which is beneficial to improving the operating stability of the power grid.

[0056] Embodiment 2

[0057] Figure 2 A flowchart of a test method for a metal oxide arrester provided in the second embodiment of the present invention. Based on the above embodiment, this embodiment further adds steps of how to perform an impact aging test on each metal oxide arrester sample, collect the DC reference voltage of each sample during the impact aging test, and how to determine whether the metal oxide arrester is qualified. Figure 2 As shown, the method specifically:

[0058] S210, obtaining an initial DC reference voltage of each metal oxide arrester sample.

[0059] Optionally, obtaining an initial DC reference voltage of each metal oxide arrester sample includes: applying a DC reference current to the metal oxide arrester sample and simultaneously collecting the voltage across the metal oxide arrester sample; recording the voltage across the metal oxide arrester sample as the initial DC reference voltage.

[0060] S220, applying a preset impulse current group to each metal oxide surge arrester sample according to a preset rule, and collecting the temperature of the sample after each application of the preset impulse current group.

[0061] Among them, the preset rules can be, but are not limited to, determined according to the current standards for type testing of metal oxide arresters. Applying a preset impulse current group can be understood as applying two or more preset impulse currents to the metal oxide arrester at preset intervals. Among them, the preset time can be 50s to 60s. The waveform of the preset impulse current can be, but is not limited to, determined according to the current standards for type testing of metal oxide arresters. In an exemplary embodiment, the preset impulse current is an impulse current with a waveform of 8 / 20μs.

[0062] Optionally, the preset rule is that after a preset impulse current group is applied to the sample and the temperature of the sample is less than or equal to the first temperature, the preset impulse current group is applied to the sample again.

[0063] The first temperature may be determined, but is not limited to, according to the current standard for type testing of metal oxide arresters. In an exemplary embodiment, the first temperature is room temperature.

[0064] Specifically, a preset impulse current group is applied to each metal oxide arrester sample, and after the temperature of the sample is less than or equal to the first temperature, the preset impulse current group is applied to the sample again.

[0065] S230. When the temperature of the sample is less than or equal to the second temperature, collect the DC reference voltage of each sample.

[0066] The second temperature may be determined, but is not limited to, according to the current standard for type testing of metal oxide arresters. It should be noted that the second temperature may be equal to the first temperature or may not be equal to the first temperature, and this embodiment does not specifically limit this. In an exemplary embodiment, the second temperature is room temperature.

[0067] In an optional embodiment, collecting the DC reference voltage of each sample includes: applying a DC reference current to the metal oxide arrester sample and collecting the voltage across the metal oxide arrester sample; recording the voltage across the metal oxide arrester sample as the DC reference voltage.

[0068] Specifically, after obtaining the initial DC reference voltage of each metal oxide arrester sample, a preset impulse current group is applied to each metal oxide arrester sample according to a preset rule, and after each application of the preset impulse current group, the temperature of each sample is collected. When the temperature of the sample is less than or equal to the second temperature, the DC reference voltage of each sample is collected.

[0069] S240 , determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected last time.

[0070] The DC reference voltage change rate of the sample can be understood as the degree of change of the DC reference voltage of the corresponding sample collected last time compared with the initial DC reference voltage of the sample.

[0071] Figure 3 The DC reference voltage variation trend diagram of a typical sample provided in an embodiment of the present invention. In an exemplary embodiment, the reference voltage Figure 3 It can be seen that the sample can withstand 14 sets of preset impact current groups when it is damaged. When facing damage, the change rate of the DC reference voltage is -6.49%.

[0072] S250. Determine whether the metal oxide arrester is qualified based on the DC reference voltage change rate of each sample.

[0073] It can be understood that the smaller the DC reference voltage change rate of each sample, the higher the stability of the metal oxide arrester when subjected to impact current, and the better the quality of the product; conversely, the larger the DC reference voltage change rate of each sample, the worse the stability of the metal oxide arrester when subjected to impact current, and the worse the quality of the product.

[0074] Specifically, after obtaining the initial DC reference voltage of each metal oxide arrester sample and obtaining the DC reference voltage of each sample during the impact aging test, the DC reference voltage change rate of each sample is determined according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected for the last time, and finally, whether the metal oxide arrester is qualified is determined according to the DC reference voltage change rate of each sample.

[0075] In this embodiment, after obtaining the initial DC reference voltage of each metal oxide arrester sample, a preset impulse current group is applied to each metal oxide arrester sample according to a preset rule, and after each application of the preset impulse current group, the temperature of the sample is collected, and when the temperature of the sample is less than or equal to the second temperature, the DC reference voltage of each sample is collected, so that the collected DC reference voltage of each sample is more accurate, thereby further improving the reliability of the aging impulse test of the metal oxide arrester. In addition, by determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected for the last time, it is determined whether the metal oxide arrester is qualified according to the DC reference voltage change rate of each sample, so that the impulse aging test procedure of the metal oxide arrester is further optimized.

[0076] Embodiment 3

[0077] Figure 4This is a flow chart of a method for testing a metal oxide lightning arrester provided in the third embodiment of the present invention. Based on the above embodiment, this embodiment further provides steps for determining whether the metal oxide lightning arrester is qualified according to the DC reference voltage change rate of each sample. Figure 4 As shown, the method specifically:

[0078] S310, obtaining an initial DC reference voltage of each metal oxide arrester sample.

[0079] S320, performing an impact aging test on each metal oxide arrester sample, and collecting a DC reference voltage of each sample during the impact aging test until each metal oxide arrester is damaged.

[0080] S330 , determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected last time.

[0081] S340, determining whether the DC reference voltage change rate of each sample is less than a preset change rate; if so, executing S350.

[0082] The preset change rate may be determined, but is not limited to, according to the current standard for type testing of metal oxide arresters. In an exemplary embodiment, the preset change rate is 5%.

[0083] S350: Determine that the corresponding sample is not completely aged.

[0084] Among them, incomplete aging can be understood as the corresponding sample not meeting the aging standard when it is damaged.

[0085] S360: Determine a ratio of the number of incompletely aged samples to the total number of samples based on the number of incompletely aged samples and the total number of samples.

[0086] S370. When the ratio is less than or equal to the preset ratio, it is determined that the metal oxide arrester is qualified.

[0087] Among them, the preset ratio can be determined according to the actual demand for the quality of the metal oxide arrester. When the quality requirement of the metal oxide arrester is low, the preset ratio can be set to a larger value; on the contrary, when the quality requirement of the metal oxide arrester is high, the preset ratio can be set to a smaller value. In an exemplary embodiment, the preset ratio is 5%, that is, when the ratio of the number of samples that are not fully aged to the total number of samples is less than or equal to 5%, the metal oxide arrester is determined to be qualified; and when the ratio of the number of samples that are not fully aged to the total number of samples is greater than 5%, the metal oxide arrester is determined to be unqualified.

[0088] In this embodiment, after obtaining the initial DC reference voltage of each metal oxide arrester sample and the DC reference voltage of each sample during the impact aging test, and determining the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected for the last time, it is judged whether the DC reference voltage change rate of each sample is less than the preset change rate. If the DC reference voltage change rate of each sample is less than the preset change rate, the corresponding sample is determined to be incompletely aged, and when the DC reference voltage change rate of each sample is greater than or equal to the preset change rate, the corresponding sample is determined to be completely aged, thereby determining the ratio of the number of incompletely aged samples to the total number of samples according to the number of incompletely aged samples and the total number of samples, and determining that the metal oxide arrester is qualified when the ratio is less than or equal to the preset ratio, and determining that the metal oxide arrester is unqualified when the ratio is greater than the preset ratio, so that the impact aging test procedure of the metal oxide arrester can be further optimized to further improve the operation stability of the power grid. .

[0089] Embodiment 4

[0090] This embodiment provides a performance detection test device for a metal oxide surge arrester, which can be implemented in the form of hardware and / or software. Figure 5 A schematic diagram of the structure of a test device for a metal oxide arrester provided in Embodiment 4 of the present invention, as shown in FIG. Figure 5 As shown, the device comprises:

[0091] An acquisition module 410 is used to acquire an initial DC reference voltage of each metal oxide arrester sample;

[0092] The test and collection module 420 is used to perform an impact aging test on each of the metal oxide arrester samples and collect a DC reference voltage of each sample during the impact aging test until each of the metal oxide arresters is damaged;

[0093] The determination module 430 is used to determine whether the metal oxide surge arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time.

[0094] The performance detection test device for a metal oxide arrester provided in an embodiment of the present invention can execute the performance detection test method for a metal oxide arrester provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method. The similarities can be referred to the above description.

[0095] Embodiment 5

[0096] An embodiment of the present invention provides a detection device, which includes at least one processor; and a memory connected to the at least one processor in communication; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the performance detection test method of the metal oxide arrester provided in any of the above embodiments. Since the detection device provided by the embodiment of the present invention includes the above processor and memory, and the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the performance detection test method of the metal oxide arrester provided in any of the above embodiments, it can have the corresponding structure and characteristics for executing the performance detection test method of the metal oxide arrester provided in the embodiment of the present invention, and can achieve the beneficial effects of the performance detection test method of the metal oxide arrester provided in the embodiment of the present invention. The similarities can be referred to the above description.

[0097] Embodiment 6

[0098] Based on the same concept, an embodiment of the present invention further provides a computer-readable storage medium, which stores computer instructions, and the computer instructions are used to enable a processor to implement the test method provided by any of the above embodiments when executed.

[0099] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0100] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A test method for a metal oxide lightning arrester, used to detect whether the voltage surge resistance performance of the lightning arrester is qualified, characterized in that: include: Obtaining an initial DC reference voltage of each metal oxide arrester sample; Performing an impact aging test on each of the metal oxide arrester samples, and collecting a DC reference voltage of each sample during the impact aging test until each of the metal oxide arresters is damaged; Whether the metal oxide arrester is qualified is determined based on the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time.

2. The method for testing a metal oxide surge arrester according to claim 1, characterized in that: Obtain the initial DC reference voltage of each metal oxide arrester sample, including: Applying a DC reference current to the metal oxide arrester sample and simultaneously collecting a voltage across the metal oxide arrester sample; The voltage across the metal oxide arrester sample is recorded as the initial DC reference voltage.

3. The method for testing a metal oxide surge arrester according to claim 1, characterized in that: The metal oxide arrester samples are subjected to an impact aging test, including: A preset impulse current group is applied to each of the metal oxide arrester samples according to a preset rule.

4. The method for testing a metal oxide arrester according to claim 3, characterized in that: The preset rule is that after a preset impulse current group is applied to the sample and the temperature of the sample is less than or equal to a first temperature, the preset impulse current group is applied to the sample again.

5. The method for testing a metal oxide arrester according to claim 3, characterized in that: The DC reference voltage of each sample during the impact aging test is collected, including: After each application of the preset impulse current group, collecting the temperature of the sample; When the temperature of the sample is less than or equal to the second temperature, the DC reference voltage of each sample is collected.

6. The method for testing a metal oxide arrester according to claim 1, characterized in that: Determining whether the metal oxide surge arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time, including: Determine the DC reference voltage change rate of each sample according to the initial DC reference voltage of each sample and the DC reference voltage of the corresponding sample collected last time; Whether the metal oxide arrester is qualified is determined based on the rate of change of the DC reference voltage of each sample.

7. The method for testing a metal oxide surge arrester according to claim 6, characterized in that: Determining whether the metal oxide arrester is qualified according to the DC reference voltage change rate of each sample includes: Determining whether the DC reference voltage change rate of each of the samples is less than a preset change rate; If yes, it is determined that the corresponding sample is not fully aged; Determining a ratio of the number of the samples that are not completely aged to the total number of the samples based on the number of the samples that are not completely aged and the total number of the samples; When the ratio is less than or equal to a preset ratio, it is determined that the metal oxide arrester is qualified.

8. A performance testing device for metal oxide lightning arrester, used to test whether the voltage impact resistance performance of the lightning arrester is qualified, characterized in that: include: An acquisition module, used for acquiring an initial DC reference voltage of each metal oxide arrester sample; A test and collection module, used for performing an impact aging test on each metal oxide arrester sample, and collecting a DC reference voltage of each sample during the impact aging test, until each metal oxide arrester is damaged; The determination module is used to determine whether the metal oxide surge arrester is qualified according to the initial DC reference voltage of each sample and the DC reference voltage of each sample collected for the last time.

9. A detection device, characterized in that: include: at least one processor; And, a memory communicatively connected to the at least one processor; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the test method for metal oxide surge arresters described in any one of claims 1-7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the test method for a metal oxide surge arrester according to any one of claims 1 to 7 when the computer instructions are executed.

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