A transistor high-temperature testing device and method

Abstract

The present invention belongs to the technical field of semiconductor packaging and testing, in particular to a transistor high-temperature testing device and method, which includes: a high-temperature forced-air drying oven; a surrounding heat conduction mechanism disposed inside the high-temperature forced-air drying oven for uniformly conducting heat to the transistor; a temperature sensing mechanism disposed inside the high-temperature forced-air drying oven for sensing the temperature at different heights; a door hinged to the high-temperature forced-air drying oven, a rotating column is rotatably connected to the door, one end of the rotating column is fixedly connected to a rotating handle, the other end of the rotating column is fixedly connected to an arc-shaped locking plate, a reserved hole is opened on one side of the door, and a wire inlet hole is opened at the bottom of the door. The structure of the present invention is simple, and the transistor can be heated by rotation and surrounding, so that it is uniformly heated, improving the heat conduction efficiency. At the same time, the temperature at different heights inside the box can be monitored in real time, avoiding the situation of inconsistent temperatures affecting the test accuracy, and facilitating people's use.

Description

Technical Field

[0001] The present invention relates to the technical field of semiconductor packaging and testing, and particularly relates to a transistor high-temperature testing device and method. Background Art

[0002] A transistor is a solid-state semiconductor device with various functions such as detection, rectification, amplification, switching, and voltage regulation. Transistors are the basic building blocks that regulate the operation of computers, mobile phones, and other electronic circuits. After a transistor is produced, its various performance aspects need to be tested before it can be sold and used externally. One of them is to detect its high-temperature resistance performance. Since the transistor is installed in a circuit, it will generate a certain amount of heat during operation. Therefore, it is necessary to conduct a high-temperature test on the transistor to ensure that the transistor has a certain high-temperature resistance.

[0003] In the Chinese patent (publication number: CN221993579U) document, a high-sealing transistor high-temperature testing device is disclosed, including: an outer box body placed on a horizontal operation platform by a lower base; an upper cover detachably arranged above the outer box body, and the upper cover can prevent the heat dissipation inside the outer box body; a control panel fixedly installed on the left outer surface of the outer box body, and the control panel is connected to internal components through wires; a heating device movably installed on the lower surface inside the outer box body, the heating device is integrally circular in structure, and a driven gear for driving it to rotate is arranged below the heating device; a groove for accommodating a sealing ring is provided on the upper end surface of the outer box body, and in a static state, the sealing ring is higher than the upper end surface of the outer box body, and extension grooves for accommodating the deformed part of the sealing ring extend from both sides of the bottom of the groove.

[0004] However, in the above patent, when conducting high-temperature heat conduction on the transistor, only the bottom of the transistor is heat-conducted, which easily leads to uneven heat conduction and affects the high-temperature test on it. At the same time, as the test time becomes longer, the temperature set inside the box becomes unstable, thereby affecting the accuracy of the high-temperature test. Therefore, we propose a transistor high-temperature testing device and method to solve the above problems. Summary of the Invention

[0005] The purpose of the present invention is to overcome the defects of the prior art and provide a transistor high-temperature testing device and method, which can conduct heat conduction on the transistor in a rotating and surrounding manner, making it evenly heated, improving the heat conduction efficiency, and at the same time can monitor the temperature at different heights inside the box in real time, avoiding the situation of uneven temperature affecting the test accuracy, and facilitating people's use.

[0006] To achieve the above purpose, the present invention adopts the following technical solutions:

[0007] A transistor high-temperature testing device includes:

[0008] High-temperature forced-air drying oven;

[0009] Surrounding heat conduction mechanism, which is arranged inside the high-temperature forced-air drying oven and is used for uniformly conducting heat to the transistors;

[0010] Temperature sensing mechanism, which is arranged inside the high-temperature forced-air drying oven and is used for sensing the temperature at different heights;

[0011] The box door is hinged to the high-temperature forced-air drying oven. A rotating column is rotatably connected to the box door. One end of the rotating column is fixedly connected to a rotating handle, and the other end of the rotating column is fixedly connected to an arc-shaped locking plate. A reserved hole is opened on one side of the box door, and a wire inlet hole is opened at the bottom of the box door. The arc-shaped locking plate is located in the reserved hole and can move and work in the reserved hole. A locking groove corresponding to the reserved hole is provided on the high-temperature forced-air drying oven. An observation window is provided on the box door, and the observation window is convenient for the staff to observe the test situation inside the high-temperature forced-air drying oven;

[0012] The beam sealing mechanism is arranged on the box door and is used for beam sealing the wire inlet hole and the wire harness to improve the sealing performance;

[0013] The wiping mechanism is arranged on the box door and is used for wiping the fog on the observation window.

[0014] Further, connecting heads are fixedly connected to both the arc-shaped locking plate and one side wall of the box door, and a tension spring is hung between the two connecting heads. The tension spring can use the connecting heads to limit and reset the arc-shaped locking plate.

[0015] Further, the beam sealing mechanism includes a separating rotating rod rotatably connected to the inner wall of the box door. One-way transmission wheels are fixedly connected to both the rotating column and the separating rotating rod. A first transmission belt is connected between the two one-way transmission wheels. One end of the separating rotating rod is fixedly connected to a driving gear, and two separating racks are meshed with the driving gear. One ends of the two separating racks are fixedly connected to first L-shaped plates. When the driving gear rotates, when the two separating racks move away from each other, the two first L-shaped plates can be dragged to move away from each other.

[0016] Further, second L-shaped plates are fixedly connected to the bottom ends of the two first L-shaped plates. The two second L-shaped plates are both slidably connected to the bottom wall of the box door. One ends of the two second L-shaped plates are fixedly connected to beam sealing rubbers. The two beam sealing rubbers are both arc-shaped rings. When the two arc-shaped ring beam sealing rubbers are attached, a sealing ring can be formed. The diameter of the sealing ring is larger than the diameter of the wire inlet hole and is closely attached to the wire inlet hole to improve the sealing effect.

[0017] Further, the wiping mechanism includes a fixing plate fixedly installed on the cabinet door. One side of the fixing plate is fixedly connected with an extending plate. A rotating rod is rotatably connected to the extending plate. Second driving wheels are fixedly connected to both the separating rotating rod and the rotating rod. A second driving belt is connected between the two second driving wheels in a transmission manner. One end of the rotating rod is fixedly connected with a wiping plate which contacts the observation window. When the wiping plate rotates, it can wipe and remove the fog on the observation window.

[0018] Further, the surrounding heat conduction mechanism includes a driving motor fixedly installed at the rear side of the high-temperature air-blowing drying oven. A driving rod is rotatably connected inside the high-temperature air-blowing drying oven. The driving rod is fixedly connected with the output shaft of the driving motor. One end of the driving rod is fixedly connected with a disc. An arc-shaped heat conduction plate is fixedly connected to one side surface of the disc. When the arc-shaped heat conduction plate rotates, it can quickly and evenly conduct heat to the transistor.

[0019] Further, the temperature sensing mechanism includes a supporting rotating rod rotatably connected inside the high-temperature air-blowing drying oven. Third driving wheels are fixedly connected to both the supporting rotating rod and the driving rod. A third driving belt is connected between the two third driving wheels in a transmission manner. One end of the supporting rotating rod is fixedly connected with a sector gear.

[0020] Further, a limiting groove is provided on one inner wall of the high-temperature air-blowing drying oven. A limiting block is slidably connected in the limiting groove. A limiting spring is fixedly connected to the bottom of the limiting block. The bottom end of the limiting spring is fixedly connected to the bottom wall of the limiting groove. One end of the limiting block is fixedly connected with a frame body. When the limiting block vertically slides in the limiting groove, it can limit and support the frame body. Tooth teeth are fixedly connected to both inner side walls of the frame body. Both tooth teeth are engaged with the sector gear. A temperature sensor is provided on one side of the frame body.

[0021] Further, a plurality of air blowing ports are provided on the bottom wall of the high-temperature air-blowing drying oven. Two third L-shaped plates are symmetrically and fixedly installed on the bottom wall of the high-temperature air-blowing drying oven. Electric push rods are fixedly provided on both third L-shaped plates. One end of each of the two electric push rods is fixedly connected with a clamping plate. A transistor characteristic diagram instrument is provided on the top of the high-temperature air-blowing drying oven. A display screen is provided on the front side of the high-temperature air-blowing drying oven. A plurality of bottom feet are symmetrically and fixedly installed on the bottom of the high-temperature air-blowing drying oven. The plurality of bottom feet are used to stably support the high-temperature air-blowing drying oven and improve the stability of the high-temperature air-blowing drying oven during operation.

[0022] A method for high-temperature testing of a transistor, using the above-mentioned transistor high-temperature testing device, includes the following steps:

[0023] S1: First, open the box door. Pass multiple transistors through the inlet hole and place them between two clamping plates. Use two electric push rods to drive the two clamping plates to approach each other to clamp and fix the multiple transistors. Then, the staff holds the rotary handle and twists it. The rotary handle drives the rotary column to rotate. The rotary column drives the arc-shaped locking plate to perform an arc-shaped contraction movement in the reserved hole, pulls the tension spring, and pushes the box door to fit with the high-temperature forced-air drying oven. At the same time, release the rotary handle. Use the force of the contraction of the tension spring to drive the arc-shaped locking plate to reset and snap into the locking groove in the high-temperature forced-air drying oven, so as to ensure that the box door will not automatically pop open during the test process;

[0024] S2: At the same time, when the rotary column rotates, it can drive one of the first driving wheels to rotate. Since a first transmission belt is connected between the two first driving wheels, the separation rotating rod rotates synchronously with the rotary column. The separation rotating rod drives the driving gear to rotate. The driving gear drives the two separation racks to approach each other. The two separation racks drive the two second L-shaped plates to approach each other through the two first L-shaped plates. The two second L-shaped plates drive the two converging rubbers to approach each other and tighten the wire harness in the inlet hole. And the two converging rubbers can cover the inlet hole, thereby improving the sealing performance and reducing the leakage of hot air in the high-temperature forced-air drying oven. At the same time, when the separation rotating rod rotates, it can drive one of the second driving wheels to rotate. Since a second transmission belt is transmitted between the second driving wheels, the rotating rod rotates following the separation rotating rod. The rotating rod drives the wiping plate to rotate and wipe the fog generated on the observation window due to the large temperature difference between the high-temperature forced-air drying oven and the outside world during the previous test, so as to facilitate observing the internal situation of the high-temperature forced-air drying oven during this test;

[0025] S3: Then, connect the pins of multiple transistors with connecting wires and connect them to the transistor characteristic diagram instrument. Set the temperature in the high-temperature forced-air drying oven to 175°C. Turn on the transistor characteristic diagram instrument. After the high-temperature forced-air drying oven reaches the set temperature, use the transistor characteristic diagram instrument to conduct a test. At the same time, start the driving motor. The output shaft of the driving motor drives the driving rod to rotate. The driving rod drives the disc to rotate, and makes the arc-shaped heat conducting plate rotate and rotate around the multiple transistors evenly and comprehensively to conduct heat, improving the accuracy of the test;

[0026] S4: At the same time, when the driving rod rotates, it can drive one of the third driving wheels to rotate. Since a third transmission belt is transmitted between the two third driving wheels, the supporting rotating rod rotates. The supporting rotating rod drives the sector gear to rotate and reciprocally engage with one of the teeth, driving the frame to move up and down. The frame drives the limiting block to slide in the limiting groove. At the same time, the frame drives the temperature sensor to move up and down, so as to realize real-time detection of whether the temperatures at different heights in the high-temperature forced-air drying oven are consistent, thereby ensuring the accuracy of the test.

[0027] Compared with the prior art, the advantages of the present invention are as follows:

[0028] 1. In this solution, the driving rod drives the disc to rotate, causing the arc-shaped heat conducting plate to rotate and uniformly and comprehensively conduct heat around multiple transistors, improving the accuracy of the test.

[0029] 2. This solution uses the supporting rotating rod to drive the sector gear to rotate, reciprocally engage with one of the teeth, drive the frame to move up and down, the frame drives the limiting block to slide in the limiting groove, and at the same time the frame drives the temperature sensor to move up and down, so as to realize real-time detection of whether the temperatures at different heights in the high-temperature blast drying oven are consistent, thus ensuring the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can also be obtained based on these drawings.

[0031] Figure 1 It is a three-dimensional structure diagram of a transistor high-temperature testing device proposed by the present invention;

[0032] Figure 2 It is a three-dimensional structure diagram of the door part of a transistor high-temperature testing device proposed by the present invention;

[0033] Figure 3 It is a three-dimensional structure diagram of the inner side of the door of a transistor high-temperature testing device proposed by the present invention;

[0034] Figure 4 It is a transistor high-temperature testing device proposed by the present invention Figure 3 Structural schematic diagram of part A therein;

[0035] Figure 5 It is a transistor high-temperature testing device proposed by the present invention Figure 3 Structural schematic diagram of part B therein;

[0036] Figure 6 It is a rear three-dimensional structure diagram of a transistor high-temperature testing device proposed by the present invention;

[0037] Figure 7 It is a three-dimensional structure diagram of the internal cross-section of the high-temperature blast drying oven of a transistor high-temperature testing device proposed by the present invention;

[0038] Figure 8 It is a transistor high-temperature testing device proposed by the present invention Figure 7 Structural schematic diagram of part C therein;

[0039] Figure 9Schematic diagram of three-dimensional structures such as the driving rod, disc, and arc heat conduction plate of a transistor high-temperature testing device proposed by the present invention;

[0040] Figure 10 Schematic diagram of three-dimensional structure of the clamping state of the clamping plate of a transistor high-temperature testing device proposed by the present invention.

[0041] The corresponding relationship of the reference numerals in the drawings is as follows:

[0042] 1. High-temperature forced-air drying oven; 2. Oven door; 201. Rotating column; 202. Rotating handle; 203. Arc-shaped locking plate; 204. Reserved hole; 205. Connector; 206. Tension spring; 3. Observation window; 4. Separation rotating rod; 401. First transmission wheel; 402. First transmission belt; 403. Driving gear; 404. Separation rack; 405. First L-shaped plate; 406. Second L-shaped plate; 407. Converging rubber; 5. Fixed plate; 501. Extending plate; 502. Rotating rod; 503. Second transmission wheel; 504. Second transmission belt; 505. Wiping plate; 6. Driving motor; 601. Driving rod; 602. Disc; 603. Arc heat conduction plate; 604. Supporting rotating rod; 605. Third transmission wheel; 606. Third transmission belt; 607. Sector gear; 608. Frame; 609. Teeth; 610. Temperature sensor; 611. Limit groove; 612. Limit block; 613. Limit spring; 7. Air outlet; 701. Third L-shaped plate; 702. Electric push rod; 703. Clamping plate; 8. Transistor characteristic graph instrument; 9. Display screen; 10. Foot. Specific embodiments

[0043] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0044] Embodiment 1, referring to Figures 1 - 10 A transistor high-temperature testing device includes:

[0045] A high-temperature forced-air drying oven 1; the model of the high-temperature forced-air drying oven 1 is 101-00B:

[0046] The door 2 is hinged to the high-temperature forced-air drying oven 1. A rotating column 201 is rotatably connected to the door 2. One end of the rotating column 201 is fixedly connected to a rotating handle 202, and the other end of the rotating column 201 is fixedly connected to an arc-shaped locking plate 203. A reserved hole 204 is formed on one side of the door 2, and an inlet hole is formed at the bottom of the door 2. The arc-shaped locking plate 203 is located in the reserved hole 204, and the arc-shaped locking plate 203 can move and work in the reserved hole 204. A locking groove corresponding to the reserved hole 204 is provided on the high-temperature forced-air drying oven 1. An observation window 3 is provided on the door 2. The observation window 3 facilitates the staff to observe the test situation inside the high-temperature forced-air drying oven 1. Connecting heads 205 are fixedly connected to both the arc-shaped locking plate 203 and a side wall of the door 2. A tension spring 206 is hung between the two connecting heads 205. The tension spring 206 can use the connecting heads 205 to limit and reset the arc-shaped locking plate 203.

[0047] In this embodiment, a bundling and sealing mechanism is provided on the door 2 for bundling and sealing the inlet hole and the wire harness to improve the sealing performance. The bundling and sealing mechanism includes a separating rotating rod 4 rotatably connected to the inner wall of the door 2. One-way transmission wheels 401 are fixedly connected to both the rotating column 201 and the separating rotating rod 4. A first transmission belt 402 is connected for transmission between the two one-way transmission wheels 401. One end of the separating rotating rod 4 is fixedly connected to a driving gear 403. Two separating rack bars 404 are meshed with the driving gear 403. One ends of the two separating rack bars 404 are fixedly connected to first L-shaped plates 405. When the driving gear 403 rotates, when driving the two separating rack bars 404 to move away from each other, the two first L-shaped plates 405 can be dragged to move away from each other. Second L-shaped plates 406 are fixedly connected to the bottom ends of the two first L-shaped plates 405. The two second L-shaped plates 406 are both slidably connected to the bottom wall of the door 2. One ends of the two second L-shaped plates 406 are fixedly connected to bundling rubbers 407. The two bundling rubbers 407 are both arc-shaped rings. When the two arc-shaped ring bundling rubbers 407 are fitted together, a sealing ring can be formed. The diameter of the sealing ring is larger than the diameter of the inlet hole and is in close fit with the inlet hole, improving the sealing effect.

[0048] In this embodiment, a wiping mechanism is provided on the door 2 for wiping the fog on the observation window 3. The wiping mechanism includes a fixing plate 5 fixedly installed on the door 2. An extending plate 501 is fixedly connected to one side of the fixing plate 5. A rotating rod 502 is rotatably connected to the extending plate 501. Two-way transmission wheels 503 are fixedly connected to both the separating rotating rod 4 and the rotating rod 502. A second transmission belt 504 is connected for transmission between the two two-way transmission wheels 503. A wiping plate 505 is fixedly connected to one end of the rotating rod 502. The wiping plate 505 contacts the observation window 3. When the wiping plate 505 rotates, the fog on the observation window 3 can be wiped off.

[0049] In this embodiment, the surrounding heat conduction mechanism is arranged inside the high-temperature forced-air drying oven 1 and is used for uniformly conducting heat to the transistors. The surrounding heat conduction mechanism includes a driving motor 6 fixedly installed on the rear side of the high-temperature forced-air drying oven 1. A driving rod 601 is rotatably connected inside the high-temperature forced-air drying oven 1, and the driving rod 601 is fixedly connected to the output shaft of the driving motor 6. One end of the driving rod 601 is fixedly connected with a disc 602, and an arc-shaped heat conduction plate 603 is fixedly connected to one side surface of the disc 602. When the arc-shaped heat conduction plate 603 rotates, it can quickly and uniformly conduct heat to the transistors.

[0050] In this embodiment, the temperature sensing mechanism is arranged inside the high-temperature forced-air drying oven 1 and is used for sensing the temperature at different heights. The temperature sensing mechanism includes a support rotating rod 604 rotatably connected inside the high-temperature forced-air drying oven 1. Third transmission wheels 605 are fixedly connected to both the support rotating rod 604 and the driving rod 601, and a third transmission belt 606 is connected in transmission between the two third transmission wheels 605. One end of the support rotating rod 604 is fixedly connected with a sector gear 607. A limit groove 611 is arranged on one inner wall of the high-temperature forced-air drying oven 1, and a limit block 612 is slidably connected inside the limit groove 611. A limit spring 613 is fixedly connected to the bottom of the limit block 612, and the bottom end of the limit spring 613 is fixedly connected to the bottom wall of the limit groove 611. One end of the limit block 612 is fixedly connected with a frame 608. When the limit block 612 vertically slides inside the limit groove 611, it can limit and support the frame 608. Tooth teeth 609 are fixedly connected to both inner walls of the frame 608, and both tooth teeth 609 are engaged with the sector gear 607. A temperature sensor 610 is arranged on one side of the frame 608. The support rotating rod 604 can drive the sector gear 607 to rotate and reciprocally engage with one of the tooth teeth 609, driving the frame 608 to move up and down, and at the same time driving the temperature sensor 610 to move up and down, so as to realize real-time detection of whether the temperatures at different heights inside the high-temperature forced-air drying oven 1 are consistent, thereby ensuring the accuracy of the test.

[0051] In this embodiment, a plurality of air blowing ports 7 are arranged on the bottom wall of the high-temperature forced-air drying oven 1. Two third L-shaped plates 701 are symmetrically and fixedly installed on the bottom wall of the high-temperature forced-air drying oven 1. Electric push rods 702 are fixedly arranged on both the two third L-shaped plates 701. One end of each of the two electric push rods 702 is fixedly connected with a clamping plate 703. The two electric push rods 702 are used to drive the two clamping plates 703 to approach each other to clamp and fix a plurality of transistors. A transistor characteristic diagram instrument 8 is arranged on the top of the high-temperature forced-air drying oven 1. The model of the transistor characteristic diagram instrument 8 is: WQ4832B. A display screen 9 is arranged on the front side of the high-temperature forced-air drying oven 1. A plurality of bottom feet 10 are symmetrically and fixedly installed on the bottom of the high-temperature forced-air drying oven 1. The plurality of bottom feet 10 are used to stably support the high-temperature forced-air drying oven 1 and improve the stability of the high-temperature forced-air drying oven 1 during operation.

[0052] A high-temperature testing method for transistors, using the above-mentioned high-temperature testing device for transistors, includes the following steps:

[0053] S1: First, open the box door 2, pass multiple transistors through the inlet hole and place them between the two clamping plates 703. Use the two electric push rods 702 to drive the two clamping plates 703 to approach each other to clamp and fix the multiple transistors. Then, the staff holds the rotating handle 202 and rotates it. The rotating handle 202 drives the rotating column 201 to rotate. The rotating column 201 drives the arc-shaped locking plate 203 to perform an arc-shaped contraction movement in the reserved hole 204, pulls the tension spring 206, and pushes the box door 2 to fit with the high-temperature blast drying oven 1. At the same time, release the rotating handle 202, and use the contraction force of the tension spring 206 to drive the arc-shaped locking plate 203 to reset and snap into the locking groove in the high-temperature blast drying oven 1, so as to ensure that the box door 2 will not automatically pop open during the testing process;

[0054] S2: At the same time, when the rotating column 201 rotates, it can drive one of the first driving wheels 401 to rotate. Since the first driving belt 402 is connected between the two first driving wheels 401, the separating rod 4 rotates synchronously with the rotating column 201. The separating rod 4 drives the driving gear 403 to rotate. The driving gear 403 drives the two separating racks 404 to approach each other. The two separating racks 404 drive the two second L-shaped plates 406 to approach each other through the two first L-shaped plates 405. The two second L-shaped plates 406 drive the two converging rubbers 407 to approach each other and tighten the wire harness in the inlet hole. And the two converging rubbers 407 can cover the inlet hole, thereby improving the sealing performance and reducing the leakage of hot air in the high-temperature blast drying oven 1. At the same time, when the separating rod 4 rotates, it can drive one of the second driving wheels 503 to rotate. Since the second driving belt 504 is connected between the second driving wheels 503, the rotating rod 502 rotates following the separating rod 4. The rotating rod 502 drives the wiping plate 505 to rotate to wipe the fog generated on the observation window 3 due to the large temperature difference between the high-temperature blast drying oven 1 and the outside world during the previous test, so as to facilitate observing the internal situation of the high-temperature blast drying oven 1 during this test;

[0055] S3: Then, connect the pins of multiple transistors with connecting wires and connect them to the transistor characteristic diagram instrument 8. Continuously increase the temperature in the high-temperature blast drying oven 1 to 125 °C, 150 °C, and 175 °C. Open the transistor characteristic diagram instrument 8. After the high-temperature blast drying oven 1 reaches the set temperature, use the transistor characteristic diagram instrument 8 for testing. At the same time, start the driving motor 6. The output shaft of the driving motor 6 drives the driving rod 601 to rotate. The driving rod 601 drives the disc 602 to rotate, and makes the arc-shaped heat conducting plate 603 rotate and rotate around the multiple transistors to conduct heat evenly and comprehensively, improving the accuracy of the test;

[0056] S4: When the driving rod 601 rotates, it can drive one of the third driving wheels 605 to rotate. Since there is a third driving belt 606 driving between the two third driving wheels 605, the support rotating rod 604 is driven to rotate. The support rotating rod 604 drives the sector gear 607 to rotate and reciprocally engage with one of the teeth 609, driving the frame 608 to move up and down. The frame 608 drives the limit block 612 to slide in the limit groove 611. At the same time, the frame 608 drives the temperature sensor 610 to move up and down, so as to realize real-time detection of whether the temperatures at different heights in the high-temperature blast drying oven 1 are consistent, thus ensuring the accuracy of the test.

[0057] All the structures in this application can be selected for their materials and lengths according to the actual usage situation. The attached drawings are all schematic structural diagrams, and the specific actual dimensions can be adjusted appropriately.

[0058] Parts not involved in the present invention are the same as or can be implemented by using the prior art. Although the embodiments of the present invention have been shown and described, for those of ordinary skill in the art, it can be understood that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A transistor high temperature test device, characterized in that: include: High temperature blast drying oven (1); A surrounding heat conduction mechanism is arranged in the high-temperature blast drying oven (1) and is used to evenly conduct heat to the transistor; A temperature sensing mechanism is disposed in the high-temperature blast drying oven (1) and is used to sense temperatures at different heights; A box door (2) is hinged on the high-temperature blast drying box (1), a rotating column (201) is rotatably connected to the box door (2), one end of the rotating column (201) is fixedly connected to a rotating handle (202), and the other end of the rotating column (201) is fixedly connected to an arc-shaped locking plate (203), a reserved hole (204) is provided on one side of the box door (2), and a wire inlet hole is provided at the bottom of the box door (2), the arc-shaped locking plate (203) is located in the reserved hole (204), a locking groove is provided on the high-temperature blast drying box (1) corresponding to the reserved hole (204), and an observation window (3) is provided on the box door (2); A converging and sealing mechanism is provided on the box door (2) and is used to converging and seal the wire inlet hole and the wire harness to improve the sealing performance; A wiping mechanism, provided on the box door (2), for wiping the mist on the observation window (3); The converging sealing mechanism comprises a separation rotating rod (4) rotatably connected to the inner wall of the box door (2); a first transmission wheel (401) is fixedly connected to the rotating column (201) and the separation rotating rod (4); a first transmission belt (402) is transmission-connected between the two first transmission wheels (401); one end of the separation rotating rod (4) is fixedly connected to a driving gear (403); the driving gear (403) is meshingly connected to two separation racks (404); one end of the two separation racks (404) is fixedly connected to a first L-shaped plate (405); the bottom ends of the two first L-shaped plates (405) are fixedly connected to a second L-shaped plate (406); the two second L-shaped plates (406) are both fixedly connected to the bottom of the box door (2). The two second L-shaped plates (406) are connected by sliding connection, one end of each of the two second L-shaped plates (406) is fixedly connected to a contracting rubber (407), and the two contracting rubbers (407) are both in the shape of an arc ring. The wiping mechanism comprises a fixed plate (5) fixedly mounted on the box door (2), one side of the fixed plate (5) is fixedly connected to an extension plate (501), and the extension plate (501) is rotatably connected to a rotating rod (502), and a No. 2 transmission wheel (503) is fixedly connected to the separation rotating rod (4) and the rotating rod (502), and a No. 2 transmission belt (504) is transmission-connected between the two No. 2 transmission wheels (503), and one end of the rotating rod (502) is fixedly connected to a wiping plate (505), and the wiping plate (505) is in contact with the observation window (3).

2. A transistor high temperature testing device according to claim 1, characterized in that: The arc-shaped locking plate (203) and a side wall of the box door (2) are both fixedly connected with a connector (205), and a tension spring (206) is hung between the two connectors (205).

3. A transistor high temperature testing device according to claim 1, characterized in that: The wraparound heat conduction mechanism comprises a drive motor (6) fixedly mounted on the rear side of the high-temperature blast drying box (1); a drive rod (601) is rotatably connected inside the high-temperature blast drying box (1); the drive rod (601) is fixedly connected to an output shaft of the drive motor (6); a disk (602) is fixedly connected to one end of the drive rod (601); and an arc-shaped heat conduction plate (603) is fixedly connected to one side surface of the disk (602).

4. A transistor high temperature testing device according to claim 3, characterized in that: The temperature sensing mechanism comprises a supporting rotating rod (604) rotatably connected to the high-temperature blast drying box (1); a No. 3 transmission wheel (605) is fixedly connected to the supporting rotating rod (604) and the driving rod (601); a No. 3 transmission belt (606) is transmission-connected between the two No. 3 transmission wheels (605); and a sector gear (607) is fixedly connected to one end of the supporting rotating rod (604).

5. A transistor high temperature testing device according to claim 4, characterized in that: A limiting groove (611) is provided on an inner wall of one side of the high-temperature blast drying box (1); a limiting block (612) is slidably connected in the limiting groove (611); a limiting spring (613) is fixedly connected to the bottom of the limiting block (612); the bottom end of the limiting spring (613) is fixedly connected to the bottom wall of the limiting groove (611); one end of the limiting block (612) is fixedly connected to a frame (608); teeth (609) are fixedly connected to the inner walls of both sides of the frame (608); the two teeth (609) are meshed with the fan gear (607); and a temperature sensor (610) is provided on one side of the frame (608).

6. A transistor high temperature testing device according to claim 1, characterized in that: The bottom wall of the high-temperature blast drying box (1) is provided with a plurality of blast openings (7); two third L-shaped plates (701) are symmetrically fixedly mounted on the bottom wall of the high-temperature blast drying box (1); electric push rods (702) are fixedly mounted on the two third L-shaped plates (701); one end of the two electric push rods (702) is fixedly connected to a clamping plate (703); a transistor characteristic diagram instrument (8) is provided on the top of the high-temperature blast drying box (1); a display screen (9) is provided on the front side of the high-temperature blast drying box (1); and a plurality of base feet (10) are symmetrically fixedly mounted on the bottom of the high-temperature blast drying box (1).

7. A transistor high temperature testing method, characterized in that: The transistor high temperature testing device according to any one of claims 1 to 6 comprises the following steps: S1: First, open the box door (2), pass a plurality of transistors through the wire entry hole and place them between the two clamping plates (703), use two electric push rods (702) to drive the two clamping plates (703) to approach each other to clamp and fix the plurality of transistors, then the staff member holds the rotating handle (202) and rotates and twists it, the rotating handle (202) drives the rotating column (201) to rotate, the rotating column (201) drives the arc-shaped locking plate (203) to perform an arc-shaped contraction movement in the reserved hole (204), and pulls the tension spring (206) to push the box door (2) to fit with the high-temperature blast drying box (1), and at the same time release the rotating handle (202), use the contraction force of the tension spring (206) to drive the arc-shaped locking plate (203) to reset and lock into the lock groove in the high-temperature blast drying box (1), so as to ensure that the box door (2) will not automatically pop open during the test; S2: When the rotating column (201) rotates, it can drive one of the No. 1 transmission wheels (401) to rotate. Since the two No. 1 transmission wheels (401) are connected to each other by a No. 1 transmission belt (402), the separation rotating rod (4) rotates synchronously with the rotating column (201). The separation rotating rod (4) drives the driving gear (403) to rotate. The driving gear (403) drives the two separation racks (404) to move closer to each other. The two separation racks (404) drive the two second L-shaped plates (406) to move closer to each other through the two first L-shaped plates (405). The two second L-shaped plates (406) drive the two bunching rubbers (407) to move closer to each other, and the wire harness in the wire entry hole is moved closer. The separation rod (4) is tightened, and the two contracting rubbers (407) can cover the wire inlet hole, thereby improving the sealing performance and reducing the leakage of hot air in the high-temperature blast drying box (1). At the same time, when the separation rotating rod (4) rotates, it can drive one of the second transmission wheels (503) to rotate. Since the second transmission belt (504) is transmitted between the second transmission wheels (503), the rotating rod (502) rotates along with the separation rotating rod (4). The rotating rod (502) drives the wiping plate (505) to rotate to wipe the mist generated on the observation window (3) due to the large temperature difference between the high-temperature blast drying box (1) and the outside world in the previous test, so as to facilitate the observation of the internal situation of the high-temperature blast drying box (1) during this test; S3: Then, multiple transistor pins are connected with connecting wires and connected to the transistor characteristic diagram instrument (8), the temperature in the high-temperature blast drying oven (1) is set to 175°C, the transistor characteristic diagram instrument (8) is turned on, and after the high-temperature blast drying oven (1) reaches the set temperature, the transistor characteristic diagram instrument (8) is used to perform a test, and at the same time, the drive motor (6) is started, the output shaft of the drive motor (6) drives the drive rod (601) to rotate, the drive rod (601) drives the disk (602) to rotate, and the arc-shaped heat conduction plate (603) rotates, and rotates around the multiple transistors to evenly and comprehensively conduct heat, thereby improving the accuracy of the test; S4: When the driving rod (601) rotates, one of the No. 3 transmission wheels (605) can be driven to rotate. Since a No. 3 transmission belt (606) is transmitted between the two No. 3 transmission wheels (605), the supporting rotating rod (604) rotates, and the supporting rotating rod (604) drives the fan-shaped gear (607) to rotate and reciprocately meshes with one of the teeth (609), driving the frame (608) to move up and down, and the frame (608) drives the limit block (612) to slide in the limit groove (611). At the same time, the frame (608) drives the temperature sensor (610) to move up and down, thereby realizing real-time detection of whether the temperatures at different heights in the high-temperature blast drying box (1) are consistent, thereby ensuring the accuracy of the test.

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