Analysis method and device for semiconductive high polymer material

Abstract

The invention discloses a semi-conductive high polymer material analysis method and device, and relates to the technical field of high polymer material analys.The method specifically comprises the steps that a charging roller and an OPC simulation roller in functional components of an imaging system are coaxially clamped, and a rotating mechanism is arranged for driving; carrying out resistance detection on the charging roller, and carrying out halation detection on the charging roller and the OPC simulation roller; reading a resistance value, observing and recording halation rays, and judging the type and dispersion performance of the conducting medium by a halation color judgment method; according to the analysis method provided by the invention, materials of various parts made of high-molecular polymers can be rapidly analyzed by measuring and observing corona wires through a simple test method, the requirements of analysis test equipment are simple, the test process is convenient and easy to implement, and analysis results can visually feed back material characteristics; a new analysis solution thought is provided for analysis of the high polymer material, and the convenience of analysis and test of the high polymer material in digital printing equipment is greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of polymer material analysis, in particular to a method and a device for analyzing a semiconductive polymer material. Background Art

[0002] The production technology of digital imaging printing equipment has been monopolized by foreign countries. The technical barriers of functional components of imaging systems have always made domestic manufacturers stuck. The reason is that the design and application of functional core components, innovative processes and materials are not up to standard; how to design and manufacture high-quality components suitable for digital imaging systems, how to break through the technical barriers of functional components, in digital imaging systems, it is necessary to focus on the synthesis mechanism of polymer materials and conductive materials and the semi-conductive conductive mechanism, so that they meet the design requirements of controllable circuit components. The synthesis of polymer materials and different conductive media is a relatively complicated process, because the uniformity of synthetic materials and the control (adjustment and measurement) of electrical properties require reliable and simple methods and effective research and judgment.

[0003] The functional parts of the imaging system include PCR (charging roller), DR (developing roller), TR (transfer roller), SR (powder supply roller), STR (color secondary transfer roller), and CR (cleaning roller). All of its functional parts are made of high molecular polymer as the base material, and are all semiconductive polymers. According to the different control circuits of digital printing equipment, the conductive medium added to the semiconductive material is also different. The polymer itself does not have a charge carrier. Therefore, the necessary charge carriers are provided to the polymer through the "doping" theory, and the conjugated structure in the conjugated polymer chain provides molecular orbits for the free movement of these charge carriers. Due to the doping process, non-completely delocalized holes (cationic radicals) are generated. Therefore, its energy is between the layers, making the conjugated polymer conductive.

[0004] Therefore, based on this, we need a research and development device for semiconductive polymer materials for imaging system components, as well as a unique identification and judgment method developed in cooperation with the research and development institute. Summary of the invention

[0005] The object of the present invention is to provide a method for analyzing semiconductive polymer materials to solve the problems raised in the above-mentioned background technology.

[0006] To achieve the above object, the present invention provides the following technical solutions:

[0007] A method for analyzing semiconductive polymer materials comprises the following steps:

[0008] S1: The charging roller and the OPC simulation roller in the functional parts of the imaging system are coaxially clamped and equipped with a rotating mechanism drive;

[0009] S2: Conduct resistance test on the charging roller, and conduct halo test on the charging roller and the OPC simulation roller;

[0010] The halo detection includes applying a pressure of 750V, the gap between the charging roller and the OPC simulation roller is less than 0.02mm, starting to rotate the charging roller and the OPC simulation roller and observing through light whether the light between the charging roller and the OPC roller is a continuous light. After it is normal light, the halo test function is started, the test time is 15S, the resistance value is read, and the halo line is observed and recorded. The type of conductive medium and the dispersion performance are judged by the halo color judgment method.

[0011] The halo color judgment method comprises:

[0012] The halo is a dark gradient, indicating that the conductive medium is an ion conductive type of functional material;

[0013] The halo is a light gradient, indicating that the conductive medium is an electronic conductive type functional part;

[0014] The halo appears as a star-shaped halo, indicating that the conductive medium is dispersed unevenly in the polymer and the electric potential energy of the bright spots and dark spots is unbalanced.

[0015] As a further solution of the present invention: the step S1 includes a resistor meter, a current detection device and a positive and negative electrode electrostatic voltage test device for measurement.

[0016] As a further solution of the present invention: in the resistance detection step S2:

[0017] When the voltage changes but the resistance measurement data does not change, this functional component is used in digital printing equipment as a current control loop;

[0018] When the voltage changes, the resistance measurement data shows obvious changes. When the voltage is low, the resistance is high, and when the voltage is high, the resistance is low. This shows that this functional component is used in digital printing equipment. The current does not change with the change of voltage. It is a voltage control loop.

[0019] As a further solution of the present invention: in the halo test in step S2, the halo line is set to be observed in a dark environment for convenient observation.

[0020] As a further solution of the present invention: the light observation in step S2 includes using a prominent color light that can highlight the halo line.

[0021] Another object of the present invention is to protect a semiconductor polymer material analysis device, including a testing device capable of performing the semiconductor polymer material analysis method.

[0022] As a further solution of the present invention: it includes a test bench, which includes a weight, an OPC simulation roller, a motor, a spring pressure device, a corona discharge area, a power connection port, a motor speed control button, a resistance tester, a length adjustment valve, a gap adjustment slider, a current monitor, and a positive and negative electrostatic voltage monitor. The test bench is provided with a clamping mechanism for coaxially installing the electric roller and the OPC simulation roller, the weight and the spring pressure device constitute a pressing mechanism of the pressing clamping mechanism, one side of the clamping mechanism is provided with a length adjustment valve for coarsely adjusting the gap between the electric roller and the OPC simulation roller and a gap adjustment slider for finely adjusting the gap between the electric roller and the OPC simulation roller, and the test bench is provided with a motor for driving the electric roller and the OPC simulation roller on the clamping mechanism to rotate coaxially.

[0023] As a further solution of the present invention: the corona discharge area is located at a position where the charging roller and the OPC simulation roller are close to each other and is provided with a cover for folding external light.

[0024] As a further solution of the present invention: the corona discharge area is provided with a strip display surface for corona line imaging.

[0025] Compared with the prior art, the present invention has the following beneficial effects:

[0026] 1. The analysis method provided by the present invention can quickly analyze the materials of various parts made of polymers through simple test methods and measurement and observation of corona wires. The analysis test equipment requirements are simple, the test process is convenient and easy, and the analysis results can intuitively feedback the material properties, which provides a new analysis solution for polymer material analysis and greatly improves the convenience of polymer material analysis and testing in digital printing equipment.

[0027] 2. Various parts made of high molecular polymers of the present invention can also be tested under this device. The change in resistance value corresponding to the (corresponding) 360-degree rotational movement of the contact-related parts of the elastic body and the change in elasticity can also observe the change in resistance unevenness caused by the contact resistance, which is manifested as changes in dynamically formed volume resistance, line resistance and surface resistance, as well as the time constant and capacitance effect during charging and discharging polarization. For digital imaging systems, the speed of equipment printing can be achieved, which is manifested as the relationship parameters during the charging and discharging process. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a structural schematic diagram of a test device for a semiconductive polymer material analysis method;

[0029] Figure 2 This is the effect diagram of the corona luminescence phenomenon;

[0030] Figure 3It is a halo line diagram of the ion conductive polymer material under the detection of the embodiment;

[0031] Figure 4 It is a halo line diagram of the electronic conductive polymer material under the detection of the embodiment;

[0032] Figure 5 It is a halo line diagram of a polymer material with uneven conductive medium dispersion under the detection of the embodiment;

[0033] Among them: weight 1, OPC simulation roller 2, motor 3, spring pressure device 4, corona discharge area 5, power connection port 6, motor speed control button 7, resistance tester 8, length adjustment valve 9, gap adjustment slider 10, current monitoring 11, positive and negative electrostatic voltage monitor 12. DETAILED DESCRIPTION

[0034] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0035] See also Figure 1-Figure 5 In an embodiment of the present invention, a method for analyzing a semiconductive polymer material specifically comprises the following steps:

[0036] S1: The charging roller and the OPC simulation roller in the functional parts of the imaging system are coaxially clamped and equipped with a rotating mechanism to drive; S2: The charging roller is tested for resistance, and the charging roller and the OPC simulation roller are tested for halo light; the halo light test includes applying a pressure of 750V, the gap between the charging roller and the OPC simulation roller is less than 0.02mm, starting to rotate the charging roller and the OPC simulation roller and observing whether the light between the charging roller and the OPC roller is a continuous light through the light, and after it is normal light, the halo light test function is started, the test time is 15S, the resistance value is read, and the halo light is observed and recorded, and the type and dispersion performance of the conductive medium are judged by the halo light color judgment method. The halo light color judgment method includes: the halo light is a dark gradient, indicating that the conductive medium is a functional material of the ion conductive type; the halo light is a light gradient, indicating that the conductive medium is a functional part of the electronic conductive type; the halo light is a star-shaped halo light, indicating that the conductive medium is dispersed unevenly in the polymer polymerization, and the electric potential energy of the bright spots and dark spots is unbalanced.

[0037] 1. Impedance and current observation and analysis

[0038] Since the resistance of polymers after being doped with various conductive media is different, after doping, due to the change in the energy band structure, the resistance of ionic and electronic conductive media will show obvious changes under voltage, which also affects the current percolation changes under the doping and blending of different polymers.

[0039] 2. Observation and analysis of the conductive mechanism

[0040] Corona discharge is a gas discharge phenomenon that occurs under high voltage. When the voltage is greater than the dielectric strength of the gas, in the medium such as air between metals and non-metals, the inter-electrode electric field exceeds the gas breakdown electric field strength, resulting in ionization of air molecules and accumulation of charges, which will eventually produce a visible luminescence effect. Specifically, when high voltage induces a strong electric field, the gas molecules in the air will be affected by the electric field and ionized into charged ions and free electrons. These electrons will move toward nearby electrodes under the action of the electric field force and be adsorbed and accumulated on the surface. If accumulated to a certain extent, a corona luminescence phenomenon will be generated on the electrode surface. Figure 2 As shown:

[0041] Ion-conducting and electronic-conducting media or mixed ion-conducting and electronic-conducting media are added to the polymer material, and these media can be manifested in the changing forms of corona and discharge impedance under voltage electric field.

[0042] Designing different functional components requires selecting different types of materials to correspond, so analysis and detection are the most critical links. We use the corona method to determine the electrical performance status of functional components when the "device" is in working state.

[0043] Ionic conductive polymer materials: Conductive polymers with positive and negative ions as carriers are called ionic conductive polymers, which are an important type of conductive materials. Ionic conduction is different from electronic conduction. First, the volume of ions is much larger than that of electrons, so they cannot move freely between the crystal lattices of solids. Therefore, most of the ionic conductive media we see in daily life are liquid, and ions are more likely to move in a directional manner in liquids by diffusion. Secondly, ions can carry positive or negative charges, and the movement directions of positive and negative charges are opposite under the action of the electric field, and the volume, chemical properties, and physical and chemical properties of each ion are different.

[0044] Example 1

[0045] A semiconductive polymer material analysis device, such as Figure 1As shown, the test bench includes a weight 1, an OPC simulation roller 2, a motor 3, a spring pressure device 4, a corona discharge area 5, a power connection port 6, a motor speed control button 7, a resistance tester 8, a length adjustment valve 9, a gap adjustment slider 10, a current monitor 11, and a positive and negative electrostatic voltage monitor 12. The test bench is provided with a clamping mechanism for coaxially mounting the electric roller and the OPC simulation roller 2. The weight 1 and the spring pressure device 4 constitute a pressing mechanism for the pressing clamping mechanism. One side of the clamping mechanism is provided with a A length regulating valve 9 for adjusting the distance between the charging roller and the OPC simulation roller 2, and a gap adjusting slider 10 for fine-tuning the distance between the charging roller and the OPC simulation roller 2, the test bench is provided with a motor 3 for driving the coaxial rotation of the charging roller and the OPC simulation roller 2 on the clamping mechanism, wherein the corona discharge area is located at a position where the charging roller and the OPC simulation roller are close to each other and is provided with a cover for folding external light, the corona discharge area is provided with a strip display surface for halo line imaging, and the background color of the display surface is set to black for easy halo line display and observation.

[0046] The above device is used as a test equipment to test different polymer materials:

[0047] Test 1:

[0048] The ionic conductive agent is doped into the rubber material, mainly for ionic conductivity, to produce the corresponding charging roller in the digital printing machine.

[0049] In an environment with a temperature of 23-25°C and a humidity of 50%,

[0050] Resistance detection: voltage 250V, resistance 0.1~0.3MΩ;

[0051] When the voltage is 500V, the resistance is 0.1~0.3MΩ;

[0052] Halo test: pressurize 750V, the gap between the charging roller and the OPC simulation roller is less than 0.02mm, start the device switch to start rotating and observe whether the light between the charging roller and the OPC roller is a continuous light through the light. If it is normal light, start the halo test function, the test time is 15S, read the data, the resistance is 0.3~0.5MΩ, and the halo line is as follows Figure 3 As shown:

[0053] The halo is a dark gradient (blue light), indicating that the conductive medium is an ion conductive type functional material. The resistance performance is: the voltage changes, but the resistance measurement data does not change. This shows that this functionality is applied in digital printing equipment. Usually, the resistance does not change with the change of voltage, and it should be a current control loop type.

[0054] Test 2

[0055] Electronically conductive polymers: In the conduction process of electronic polymers, the carriers are free electrons or holes in the polymer. The conduction process requires that the carriers can migrate in a directed manner within the polymer under the action of an electric field to form an electric current.

[0056] Carbon black is doped into rubber materials, mainly for conductivity, to produce the corresponding charging roller in digital printing machines.

[0057] In an environment with a temperature of 23-25°C and a humidity of 50%,

[0058] Resistance detection: voltage 250V, resistance is 0.7~0.8MΩ;

[0059] When the voltage is 500V, the resistance is 0.1~0.3MΩ;

[0060] Halo test: pressurize 750V, the gap between the charging roller and the OPC simulation roller is less than 0.02mm, start the device switch to start rotating and observe whether the light between the charging roller and the OPC roller is a continuous light through the light. If it is normal light, start the halo test function, the test time is 15S, read the data, the resistance is 0.3~0.5MΩ, and the halo line is as follows Figure 4 As shown:

[0061] The halo is a gradient light blue (white light), indicating that the conductive medium is an electronic conductive type functional component. The resistance is manifested as: voltage changes, and the resistance measurement data shows obvious changes. When the voltage is low, the resistance is high, and when the voltage is high, the resistance is low. This shows that this functional component is used in digital printing equipment. Usually, the current does not change with the change of voltage, and it should be a voltage control loop type.

[0062] Test 3:

[0063] In an environment with a temperature of 23-25°C and a humidity of 50%;

[0064] Halo detection: pressurize 750V, the gap between the charging roller and the OPC simulation roller is less than 0.02mm, start the device switch to start rotating and observe whether the light between the charging roller and the OPC roller is a continuous light. Figure 5 As shown, the test function is enabled, the test time is 15S, and the data is read. The resistance is 0.3~0.5MΩ, which appears as a star-shaped halo. This indicates that the conductive medium is dispersed unevenly in the polymer, and the electric potential energy of the bright spots and dark spots is unbalanced. This functional component is used in digital printing equipment. Usually, the printed products show uneven light and dark depth, which affects the real effect of the drawing and becomes a defective product. This detection method has been applied in the production and research and development process.

[0065] When a conductive medium in a composite manner of ion conduction and electron conduction is added to a high molecular polymer, the "device" is set to observe the current and resistance under non-discharge conditions. When the voltage is changed, the resistance and current will increase or decrease slightly. This functional component has good weather resistance when used in digital printing equipment.

[0066] The specific test method of the above embodiment includes:

[0067] The corona discharge detection method for the electrical properties of the functional components of the electronic imaging system of the present invention is based on the actual working structure of the imaging components in various digital printing devices, and simulates the electronic imaging structure to perform measurements in a working state. The detection process is as follows (preferably performed under darkroom conditions):

[0068] 1. Preparation: Wear anti-static gloves, clean the surface of the product to be tested, and place it for testing;

[0069] 2. Connect the voltage supply and continuous current feedback device to the power supply, turn on the start button to check the reliability and safety of the equipment;

[0070] 3. Turn on the motor (electric motor) to make the working restoration form detection rod rotate;

[0071] 4. Load the required test products into the special product testing rack;

[0072] Select the appropriate voltage (multi-stage 100V~1500V) on the resistance tester, press the start button to start testing, and observe the corona phenomenon between the product and the test rod. A uniform blue light indicates an OK product, while a red light or spark spot indicates an NG product.

[0073] The electrical performance simulation detection device for functional components of the electronic imaging system, the action state of the imaging component in the digital printing device is pressurized by springs and gravity, and a reliable working charge and discharge relative distance is achieved for the photosensitive drum.

[0074] like Figure 1 As shown, the synchronous pressure device is designed in the shape of a pole, which is convenient for lifting and placing the measured parts, and the movement of the pole-shaped slot can adapt to the adjustment of the measured parts of different lengths; the pressure fulcrum is used to achieve different pressure requirements by counterweight method; under the fulcrum and the measured part, a metal drum with the same outer diameter as the common photosensitive drum is used to simulate the working state of the photosensitive drum relative to the charging roller. The metal drum can be driven by a speed regulating motor to rotate 360 ​​degrees, detect, and perform corona discharge, electrical parameters (non-discharge type), contact type, and at the same time detect and determine the runout and parallel straightness and OPC contact reliability and parallelism runout. With the resistance tester: continuous voltage supply and current feedback can be provided, and data can be read intuitively.

[0075] Adjust the gap between the tested component and the simulated photosensitive drum to 0.06mm, observe the discharge corona between PCR and OPC, and passively rotate with OPC under the condition of weight force at both ends of the charging roller PCR. At both ends of PCR, the U-shaped conductive rotating fulcrum is added with the test voltage, and 360-degree rotating corona discharge is performed through the gap generated by the surface of the conductive polymer material component of the tested object and the surface of the simulated photosensitive drum OPC.

[0076] In order to observe better, we operate in a darkroom, where we can observe various discharge phenomena. At the same time, the resistance meter displays the discharge resistance. When the electric field voltage is changed, the discharge corona will change in brightness, and the discharge resistance will also change in impedance. Through this corona discharge method, we basically simulate the actual working state of the photosensitive drum and charging roller, and use the changes in halo and resistance to detect product characteristics. While detecting corona discharge, we obtain the characteristics of the discharge resistance.

[0077] It is obvious to those skilled in the art that the present invention is not limited to the details of the above exemplary embodiments, and that the present invention can be implemented in other specific forms without departing from the spirit or basic features of the present invention. Although this specification is described in accordance with the implementation modes, not every implementation mode includes only one technical solution. This description of the specification is only for the sake of clarity. Those skilled in the art should regard the specification as a whole. The technical solutions in each embodiment can also be appropriately combined to form other implementation modes that can be understood by those skilled in the art.

Claims

1. A method for analyzing semiconductive polymer materials, characterized in that: The specific steps include: S1: The charging roller and the OPC simulation roller in the functional parts of the imaging system are coaxially clamped and equipped with a rotating mechanism drive; S2: Conduct resistance test on the charging roller, and conduct halo test on the charging roller and the OPC simulation roller; The halo detection includes applying a pressure of 750V, the gap between the charging roller and the OPC simulation roller is less than 0.02mm, starting to rotate the charging roller and the OPC simulation roller and observing whether the light between the charging roller and the OPC roller is a continuous light through the light. If it is a normal light, the halo test function is started, the test time is 15S, the resistance value is read, and the halo line is observed and recorded, and the type of conductive medium and the dispersion performance are judged by the halo color judgment method; The halo color judgment method comprises: The halo is a dark gradient, indicating that the conductive medium is an ion conductive type of functional material; The halo is a light gradient, indicating that the conductive medium is an electronic conductive type functional part; The halo appears as a star-shaped halo, indicating that the conductive medium is dispersed unevenly in the polymer and the electric potential energy of the bright spots and dark spots is unbalanced.

2. A method for analyzing a semiconductive polymer material according to claim 1, characterized in that: The step S1 includes measuring with a resistance meter, a current detection device and a positive and negative electrode electrostatic voltage test device.

3. A method for analyzing a semiconductive polymer material according to claim 1, characterized in that: In the step S2 resistance detection: When the voltage changes but the resistance measurement data does not change, this functional component is used in digital printing equipment as a current control loop; When the voltage changes, the resistance measurement data shows obvious changes. When the voltage is low, the resistance is high, and when the voltage is high, the resistance is low. This shows that this functional component is used in digital printing equipment. The current does not change with the change of voltage. It is a voltage control loop type.

4. A method for analyzing a semiconductive polymer material according to claim 1, characterized in that: In the halo test in step S2, the halo line is set to be observed in a dark environment for convenient observation.

5. A method for analyzing a semiconductive polymer material according to claim 4, characterized in that: The lighting observation in step S2 includes using a prominent color lighting that can highlight the halo line.

6. A semiconductor polymer material analysis device, characterized in that: The invention comprises a testing device capable of carrying out a semiconductive polymer material analysis method as described in any one of claims 1-5.

7. A semiconductive polymer material analysis device according to claim 6, characterized in that: The invention comprises a test bench, wherein the test bench comprises a weight (1), an OPC simulation roller (2), a motor (3), a spring pressure device (4), a corona discharge area (5), a power connection port (6), a motor speed adjustment button (7), a resistance tester (8), a length adjustment valve (9), a gap adjustment slider (10), a current monitor (11), and a positive and negative electrostatic voltage monitor (12).

8. A semiconductive polymer material analysis device according to claim 7, characterized in that: The test bench is provided with a clamping mechanism for coaxially mounting a charging roller and an OPC simulation roller (2); the weight (1) and the spring pressure device (4) constitute a synchronous pressure device for pressing down the clamping mechanism; one side of the clamping mechanism is provided with a length regulating valve (9) for coarsely adjusting the distance between the electric roller and the OPC simulation roller (2) and a gap regulating slider (10) for finely adjusting the distance between the electric roller and the OPC simulation roller (2); the test bench is provided with the motor (3) for driving the electric roller and the OPC simulation roller (2) on the clamping mechanism to coaxially rotate.

9. A semiconductive polymer material analysis device according to claim 7, characterized in that: The corona discharge area (5) is located at a position where the charging roller and the OPC simulation roller are close to each other and is provided with a cover for folding external light.

10. A semiconductive polymer material analysis device according to claim 9, characterized in that: The corona discharge area (5) is provided with a strip display surface for corona line imaging.

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