Integrated circuit test data management method

Abstract

The invention relates to the field of integrated circuit testing, and particularly discloses an integrated circuit test data management method which comprises the following steps: receiving a test task, and performing keyword extraction on the test task; constructing at least one test data storage file according to the extracted keywords, and transmitting the constructed file information to a central server; collecting test data, and storing the test data in a corresponding test data storage file; and sending the current test data storage file to the central server, and deleting the current test data storage file after transmission is completed. According to different test tasks, scattered storage of test data is carried out, transmitted data is cleaned in time, memory occupation of a test machine is reduced, the operation efficiency of the test machine is ensured, part of data is transmitted each time, the data transmission size is reduced, the data transmission accuracy is ensured, and then the accuracy of a subsequent data analysis result is ensured.

Description

Technical Field

[0001] The present invention relates to the field of integrated circuit testing, and in particular to an integrated circuit test data management method. Background Art

[0002] With the rapid advancement of integrated circuit technology, test data management for integrated circuits has become increasingly complex and critical. Traditional test data management methods often rely on simple database storage, which is insufficient for large-scale and diverse testing tasks. On the tester side, the tester collects test data and temporarily stores it before transmitting this temporarily stored data to a central server. However, testers typically store test data in a centralized manner. As the amount of data increases, this method consumes the tester's memory, affecting its operational efficiency and easily leading to data transmission errors, which can affect subsequent data analysis results. Summary of the Invention

[0003] To solve the above problems, the present invention provides an integrated circuit test data management method, which performs decentralized storage of test data according to different test tasks, cleans up transmitted data in a timely manner, reduces the memory usage of the test machine, ensures the operating efficiency of the test machine, and transmits partial data each time to reduce the data transmission size, ensure the accuracy of data transmission, and thus ensure the accuracy of subsequent data analysis results.

[0004] In a first aspect, the technical solution of the present invention provides an integrated circuit test data management method, which is applied to a test machine and includes the following steps: Receive test tasks and extract keywords from them; Construct at least one test data storage file based on the extracted keywords, and transmit the constructed file information to the central server; Collect test data and store the test data in the corresponding test data storage file; Send the current test data storage file to the central server and delete the current test data storage file after the transmission is completed.

[0005] In an optional implementation, keyword extraction is performed on the test task, specifically including: Obtain the test task code and determine the test task type according to the test task code; Call the adaptive keyword extraction program according to the test task type; A keyword extraction program is run to extract keywords from the test task based on preset extraction rules; the keywords at least include the serial number of the device under test.

[0006] In an optional embodiment, constructing at least one test data storage file based on the extracted keywords specifically includes: Filtering target keywords from the extracted keywords, wherein the target keywords are the device under test number and the test item; Count the number of devices under test according to the device numbers; The number of devices under test and test item information are transmitted to a pre-trained file quantity prediction model to obtain the file quantity N; Create N test data storage files, and divide the devices under test into N groups according to their numbers in ascending order, with each group corresponding to a test data storage file.

[0007] In an optional embodiment, after creating N test data storage files, the following steps are further included: The test data storage file is named after the device under test number. The name of the test data storage file includes the minimum device under test number and the maximum device under test number of the stored devices under test.

[0008] In an optional embodiment, after creating N test data storage files, the following steps are further included: Create a test data storage table for each test data storage file; the test data storage table contains various test parameter elements of the test item; Fill the device under test number corresponding to the test data storage file into the test data storage table; Store the test data storage table to the corresponding test data storage file.

[0009] In an optional implementation, the construction file information is transmitted to the central server, specifically including transmitting the number of files to the central server.

[0010] In an optional embodiment, storing the test data in a corresponding test data storage file specifically includes: Get the number of the current device under test; Compare the serial number of the current device under test with the name of each test data storage file; Filter the target test data storage file based on the comparison results; Store the test data to the target test data storage file.

[0011] In an optional embodiment, sending the current test data storage file to the central server specifically includes: Real-time detection of whether the last row of data in the test data storage table in the current test data storage file has been updated; If the update is complete, the test data storage file will be sent to the central server.

[0012] In a second aspect, the technical solution of the present invention provides an integrated circuit test data management method, which is executed by a central server and includes the following steps: Receive file information and test data storage files transmitted by the test machine; the file information is the number of files; Check whether the number of test data storage files received within the preset time period is correct based on the file information; If it is incorrect, a prompt message will be issued.

[0013] The present invention provides an integrated circuit test data management method that, compared to existing technologies, has the following advantages: multiple test data storage files are constructed based on test task information, each storing test data for a number of devices under test, thereby achieving decentralized storage of test data and timely transmission and deletion. The present invention distributes test data according to different test tasks, promptly clears transmitted data, reduces tester memory usage, and ensures tester operating efficiency. Furthermore, partial data transmission each time reduces data transmission size, ensures data transmission accuracy, and thus ensures the accuracy of subsequent data analysis results. BRIEF DESCRIPTION OF THE DRAWINGS In order to more clearly illustrate the embodiments of the present invention or the technical solutions of the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0014] Figure 1 The present invention provides an integrated circuit test data management method implemented by a test machine.

[0015] Figure 2 The present invention provides an integrated circuit test data management method implemented by a central server. DETAILED DESCRIPTION

[0016] In order to enable those skilled in the art to better understand the present invention, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present invention.

[0017] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art of the present invention. The terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention.

[0018] The integrated circuit test data management method provided in this embodiment is executed by a system composed of a test machine and a central server. The test machine collects and stores test data, and transmits the test data to the central server after storing a certain amount of data.

[0019] Figure 1 This is an integrated circuit test data management method provided by an embodiment of the present invention, which is executed by a tester. According to different requirements, the order of the steps in the flowchart can be changed, and some can be omitted.

[0020] like Figure 1 As shown, the method includes the following steps.

[0021] S1, receive the test task and extract keywords for the test task.

[0022] The test machine receives a test task from the test management terminal and extracts keywords of the test task according to a pre-configured keyword extraction program so as to construct a test data storage file based on the keywords. This embodiment specifically includes the following steps to extract keywords from the test task.

[0023] S1.1, obtain the test task code, and determine the test task type according to the test task code.

[0024] S1.2, call the adaptive keyword extraction program according to the test task type.

[0025] S1.3, running a keyword extraction program to extract keywords from the test task based on a preset extraction rule, where the keywords at least include the serial number of the device under test.

[0026] It should be noted that each test task has a corresponding code, which includes the test task type. Different test task types correspond to different test task file formats and keywords. A keyword extraction program is preconfigured for each test task type. The keyword extraction program extracts keywords from the test task according to preset extraction rules. In this embodiment, the keywords include at least the serial numbers of all devices under test.

[0027] S2, constructing at least one test data storage file according to the extracted keywords, and transmitting the constructed file information to the central server.

[0028] In this embodiment, the keywords of the test task extracted in step S1 are used to construct at least one test data storage file. Each test data storage file stores test data of a different device under test, thereby achieving distributed storage of test data.

[0029] S2.1, screening target keywords from the extracted keywords.

[0030] The target keywords in this embodiment are the device under test number and the test item.

[0031] S2.2, count the number of devices under test according to the device numbers.

[0032] S2.3, the number of devices to be tested and the test item information are transmitted to a pre-trained file quantity prediction model to obtain the file quantity N.

[0033] The test project information may include the test project name, all test parameters required to test the test project, etc. The file quantity prediction model is pre-trained, and the current number of devices to be tested and the test project information are input into the prediction model to obtain the predicted number of files, ensuring that there is sufficient file data to realize the decentralized storage of test data.

[0034] S2.4, create N test data storage files, and divide the devices under test into N groups according to the order of numbers from small to large, each group corresponding to a test data storage file.

[0035] In this embodiment, the devices under test are divided into N groups. First, the devices under test are arranged in ascending order by number, and then divided into N groups according to the number. For example, if there are 100 devices under test and 3 test data storage files, the 100 devices under test are divided into 3 groups. The first and second groups contain 34 devices under test respectively, and the third group contains 32 devices under test.

[0036] S2.5, name the test data storage file with the device number under test.

[0037] In this embodiment, the name of the test data storage file includes the minimum DUT number and the maximum DUT number of the stored DUTs.

[0038] For example, the first test data storage file stores test data of the first group of devices under test, the first group of devices under test are the 1st to 34th devices under test, and the name of the first test data storage file includes the numbers of the 1st and 34th devices under test.

[0039] S2.6, create a test data storage table for each test data storage file; the test data storage table contains various test parameter elements of the test item.

[0040] S2.7, fill the device under test number corresponding to the test data storage file into the test data storage table.

[0041] S2.8, store the test data storage table to the corresponding test data storage file.

[0042] In this embodiment, the test data is stored in the form of a test data storage table. The table stores the device numbers and various test parameters. Before testing, the test data storage table is filled with the device numbers, with each device corresponding to a row.

[0043] In this embodiment, the file quantity is transmitted to the central server so that the central server can detect whether the test data storage file is correctly received.

[0044] S3, collect test data and store the test data in the corresponding test data storage file.

[0045] S3.1, obtain the number of the current device under test.

[0046] S3.2, comparing the serial number of the current device under test with the names of each test data storage file.

[0047] S3.3, filter the target test data storage file based on the comparison results.

[0048] S3.4, store the test data into the target test data storage file.

[0049] This embodiment searches for target test data storage files based on the DUT number. Each test data storage file is named after the DUT number, allowing for searching the target test data storage file based on the DUT number. For example, if the DUT number is 003 and the name of a test data storage file contains 001 and 034, then 003 is between 001 and 034. Therefore, the target test data storage file for the DUT is the test data file whose name contains 001 and 034.

[0050] S4, sending the current test data storage file to the central server, and deleting the current test data storage file after the transmission is completed.

[0051] This embodiment detects in real time whether the last row of data in the test data storage table in the current test data storage file has been updated; if the update is completed, the test data storage file is sent to the central server.

[0052] To reduce memory usage, delete the file after the transfer is complete.

[0053] Figure 2 This is an integrated circuit test data management method provided by an embodiment of the present invention, which is executed by a central server. According to different requirements, the order of the steps in the flowchart can be changed, and some can be omitted.

[0054] like Figure 2 As shown, the method includes the following steps.

[0055] SS1, receives the file information and test data storage files transmitted by the test machine. The file information in this embodiment is the number of files.

[0056] SS2, based on the file information, detects whether the number of test data storage files received within the preset time period is correct.

[0057] SS3, if incorrect, issues a prompt message.

[0058] The central server pre-configures a time period, which can start from the time the first test data storage file is received. The server then checks whether all test data storage files can be received within the predicted time period. If they can be received, the data transmission is normal. Otherwise, the data transmission is abnormal and a prompt message is issued. It should be noted that the test machine deletes the current test data storage file after receiving the confirmation that the central server has received the current test data storage file normally.

[0059] The above disclosure is only a preferred embodiment of the present invention, but the present invention is not limited thereto. Any non-creative changes that can be thought of by those skilled in the art, as well as several improvements and modifications made without departing from the principles of the present invention, should fall within the scope of protection of the present invention.

Claims

1. A method for managing integrated circuit test data, characterized in that: Applied to the test machine, including the following steps: Receive test tasks and extract keywords from the test tasks; Construct at least one test data storage file according to the extracted keywords, and transmit the constructed file information to the central server; Collect test data and store the test data in corresponding test data storage files; Send the current test data storage file to the central server and delete the current test data storage file after the transmission is completed.

2. The integrated circuit test data management method according to claim 1, characterized in that: Extract keywords for test tasks, including: Obtain the test task code, and determine the test task type according to the test task code; Call the adapted keyword extraction program according to the test task type; A keyword extraction program is run to extract keywords from the test task based on preset extraction rules; the keywords at least include the serial number of the device under test.

3. The integrated circuit test data management method according to claim 2, characterized in that: Constructing at least one test data storage file according to the extracted keywords, specifically including: Filtering target keywords from the extracted keywords, wherein the target keywords are the device under test number and the test item; Count the number of devices under test according to the device numbers under test; The number of devices to be tested and the test item information are transmitted to a pre-trained file quantity prediction model to obtain the file quantity N; Create N test data storage files, and divide the devices under test into N groups according to the order of numbers from small to large, and each group corresponds to a test data storage file.

4. The integrated circuit test data management method according to claim 3, characterized in that: After creating N test data storage files, the following steps are also included: The test data storage file is named after the device under test number, and the name of the test data storage file includes the minimum device under test number and the maximum device under test number of the stored devices under test.

5. The integrated circuit test data management method according to claim 4, characterized in that: After creating N test data storage files, the following steps are also included: Create a test data storage table for each test data storage file; the test data storage table contains various test parameter elements of the test item; Fill the device under test number corresponding to the test data storage file into the test data storage table; Store the test data storage table to the corresponding test data storage file.

6. The integrated circuit test data management method according to claim 5, characterized in that: Transmit the build file information to the central server, specifically including transmitting the file quantity to the central server.

7. The integrated circuit test data management method according to claim 6, characterized in that: Store the test data in the corresponding test data storage file, including: Get the number of the current device under test; Compare the serial number of the current device under test with the name of each test data storage file; Filter the target test data storage file according to the comparison results; Store the test data to the target test data storage file.

8. The integrated circuit test data management method according to claim 7, characterized in that: Send the current test data storage file to the central server, including: Real-time detection of whether the last row of data in the test data storage table in the current test data storage file has been updated; If the update is complete, the test data storage file is sent to the central server.

9. An integrated circuit test data management method, characterized in that: Executed by the central server, including the following steps: Receive file information and test data storage files transmitted by the test machine; the file information is the number of files; Check whether the number of test data storage files received within a preset time period is correct according to the file information; If it is incorrect, a prompt message will be issued.

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