Switch conversion matrix of radio frequency identification test system
By designing the switch conversion matrix in the RFID test system, automatic switching of different test types is achieved, which solves the problem of time-consuming and error-prone problems of manual switching, and improves testing efficiency and accuracy.
Patent Information
- Application Number
- CN202411806528.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-10
- Publication Date
- 2025-03-18
AI Technical Summary
The existing RFID testing technology is time-consuming and error-prone when conducting different types of tests.
Design a switch conversion matrix of a radio frequency identification test system, including a tag reader and writer test selection module, a tag test type selection module, a tag test routing module and a reader and writer test routing module, and realize automatic switching of different test types through automatic switching.
It realizes automatic switching between the internal module of the RFID test system and the connection method between the test system and the object to be tested, improving the testing efficiency and reducing error occurrence.
Smart Images

Figure CN119645917A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of wireless radio frequency identification, and in particular relates to a switch conversion matrix of a radio frequency identification test system. Background Art
[0002] Radio Frequency Identification (RFID) technology is a non-contact automatic identification technology (hereinafter referred to as RFID technology) that uses radio frequency identification (RFID) communication. It has the characteristics of fast reading and writing, non-visual identification, mobile identification, multi-target identification, positioning and long-term tracking management. As a high-tech technology that processes information quickly, timely and accurately and the basis of information standardization, RFID technology is listed as one of the top ten important technologies in the 21st century. It has been applied in manufacturing, logistics, medical care, transportation, retail, aviation and other fields, and currently has a good market prospect. Therefore, it is becoming more and more important to test radio frequency identification products and ensure the quality of radio frequency identification (RFID) products.
[0003] Common RFID recognition test types include RFID reader test and RFID tag test; RFID reader test includes performance test, communication protocol test, security test and other test types; RFID tag test includes performance test, communication interface test, storage capacity test and other test types.
[0004] The above different types of tests have different compositions of the test systems and the connection methods between the test systems and the objects under test. To complete the tests, either different test systems are used, which requires a large investment in equipment costs and the need to constantly replace the test systems for the same batch of samples; or a comprehensive test system is used to manually change the internal modules of the test system and the connection methods between the test system and the objects under test. Although this method saves costs, it is time-consuming and prone to errors. Summary of the invention
[0005] In order to solve the problem in the existing RFID test technology that the manual switching process is time-consuming and error-prone when performing different types of tests, the present invention provides a switch conversion matrix of an RFID test system, which can automatically switch according to the test type, is efficient and error-prone.
[0006] The technical solution of the present invention is as follows:
[0007] A switch conversion matrix of a radio frequency identification test system includes a tag reader test selection module, a tag test type selection module, a tag test routing module, a reader test routing module,
[0008] The tag reader / writer test selection module is connected to the input end of the reader / writer test routing module, and the output end of the reader / writer test routing module is connected to the tag test type selection module;
[0009] The tag reader / writer test selection module is also connected to the communication serial port of the tag test type selection module;
[0010] The tag test type selection module is connected to the input end of the tag test routing module, and the output end of the tag test routing module is connected to the tag test type selection module;
[0011] The tag test type selection module is connected to the transmitting end of the full anechoic chamber antenna interface, and the receiving end of the full anechoic chamber antenna interface is connected to the tag test type selection module;
[0012] The full anechoic chamber antenna interface is connected to the tag test routing module;
[0013] The input and output terminals of the front panel of the RFID test system cabinet are connected to the tag test type selection module, and the front panel of the RFID test system cabinet is also connected to the reader / writer test routing module;
[0014] The tag test type selection module is connected to the input end of the radio frequency identification test system host, and the output end of the radio frequency identification test system host is connected to the communication serial port of the tag reader test selection module.
[0015] Preferably, the reader / writer test routing module is specifically a reader / writer test routing box, which is used to implement signal routing for radio frequency identification reader / writer testing.
[0016] Preferably, the receiving end of the full anechoic chamber antenna interface is connected to the tag test type selection module, specifically: the Reader Test interface on the front panel of the RFID test system cabinet is connected to the TX / RX communication serial port of the reader test selection module.
[0017] Compared with the prior art, the present invention has the following beneficial effects:
[0018] The radio frequency identification (RFID) test system switch conversion matrix can realize the automatic switching of the internal modules of the test system and the connection mode between the test system and the object under test on the basis of a comprehensive test system, thereby realizing the automatic switching of different test types, which saves costs and facilitates testing. BRIEF DESCRIPTION OF THE DRAWINGS
[0019] Figure 1 It is a schematic diagram of the overall structure of an embodiment of the present invention;
[0020] Figure 2A schematic diagram of a switch conversion software interface of a host of a radio frequency identification test system of the present invention;
[0021] In the figure: 1- tag reader test selection module, 2- tag test type selection module, 3- tag test routing module, 4- reader test routing module, 5- RFID test system host, 6- full anechoic chamber antenna interface, 7- RFID test system cabinet front panel. DETAILED DESCRIPTION
[0022] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments.
[0023] See also Figure 1 , a switch conversion matrix of a radio frequency identification test system, including a tag reader test selection module 1, a tag test type selection module 2, a tag test routing module 3, and a reader test routing module 4;
[0024] The tag reader / writer test selection module 1 is connected to the input end of the reader / writer test routing module 4, and the output end of the reader / writer test routing module 4 is connected to the tag test type selection module 2;
[0025] The tag reader / writer test selection module 1 is also connected to the communication serial port of the tag test type selection module 2;
[0026] The tag test type selection module 2 is connected to the input end of the tag test routing module 3, and the output end of the tag test routing module 3 is connected to the tag test type selection module 2;
[0027] The tag test type selection module 2 is connected to a transmitting end of a full anechoic chamber antenna interface 6, and a receiving end of the full anechoic chamber antenna interface 6 is connected to the tag test type selection module 2;
[0028] The full anechoic chamber antenna interface 6 is connected to the tag test routing module 3;
[0029] The input and output ends of the RFID test system cabinet front panel 7 are connected to the tag test type selection module 2, and the RFID test system cabinet front panel 7 is also connected to the reader test routing module 4;
[0030] The tag test type selection module 2 is connected to an input end of a radio frequency identification test system host 5 , and an output end of the radio frequency identification test system host 5 is connected to a communication serial port of the tag reader / writer test selection module 1 .
[0031] In this embodiment, the tag test routing module 3 is a tag test routing box, which is used to implement signal routing of different connection modes for RFID tag testing.
[0032] The reader / writer test routing module 4 is specifically a reader / writer test routing box, which is used to implement signal routing for radio frequency identification reader / writer testing.
[0033] The receiving end of the full anechoic chamber antenna interface is connected to the tag test type selection module, specifically: the Reader Test interface on the front panel of the RFID test system cabinet is connected to the Tx / Rx communication serial port of the reader / writer test routing box.
[0034] The tag reader / writer test selection module realizes the selection and signal conduction between the RFID reader / writer and the RFID tag test;
[0035] The tag test type selection switch realizes the selection and signal conduction of different test types such as RFID tag performance test, consistency test, and TIPP test;
[0036] In the present invention, the RFID test system host is installed with switch conversion software for allowing the tester to select the test mode from the software interface, such as Figure 2 shown.
[0037] The present invention has the following working principle:
[0038] See also Figure 1 When performing the RFID reader test, the tester selects reader test-reader on the switch conversion software. The signal sent by the RFID test system will be conducted to the COM port of the tag / reader test selection switch, and then the signal will be conducted to the CH1 port of the tag / reader test selection switch. The signal is input from the IN port of the reader test routing box, and after passing through the inside of the reader test routing box, it is conducted to the Tx / Rx port output, and then output to the Reader Test port on the front panel 7 of the RFID test system cabinet. The Reader Test port is connected to the reader under test, so that the signal is sent to the reader under test. The signal returned from the reader under test is received by the Tx / Rx port of the reader test routing box, and the signal is conducted to the OUT port after passing through the inside of the reader test routing box, and then output to the CH7B port of the tag test type selection switch. The signal reaching the tag test type selection switch is conducted to the COMB port, and then output to the IN port of the RFID test system. The RFID test system analyzes the signal returned by the reader to complete the reader test.
[0039] See also Figure 1When performing the RFID tag performance test, the tester selects the tag test-dual antenna on the switch conversion software. The signal sent by the RFID test system will be conducted to the COM port of the tag / reader test selection switch, and then the signal will be conducted to the CH0 port of the tag / reader test selection switch, and then output to the COM A port of the tag test type selection switch. Then the signal will be conducted to the CH4A port, and the signal will be directly output to the RF interface f (transmitter) of the full anechoic chamber antenna interface. The RF interface f (transmitter) of the full anechoic chamber antenna interface is connected to the transmitting antenna, and the signal can be sent to the tag under test through the air interface. The signal returned from the tag under test is received by the receiving antenna connected to the RF interface e (receiver) of the full anechoic chamber antenna interface through the air interface, and then output to the CH5B port of the tag test type selection switch. The signal reaching the tag test type selection switch is conducted to the COMB port, and then output to the IN port of the RFID test system. The RFID test system analyzes the signal returned by the tag to complete the tag performance test.
[0040] See also Figure 1 When performing RFID tag consistency test, the tester selects Tag Test-Front Panel on the switch conversion software. The signal sent by the RFID test system will be conducted to the COM port of the tag / reader test selection switch, and then the signal will be conducted to the CH0 port of the tag / reader test selection switch, and then output to the COMA port of the tag test type selection switch. Then the signal will be conducted to the CH6A port, and then output to the OUT (Tag Test) port on the front panel of the RFID test system cabinet. The OUT (Tag Test) port is connected to a dipole antenna, and the dipole antenna sends the signal to the tag under test through the air interface. The signal returned from the tag under test is received by another dipole antenna connected to the IN (Tag Test) port on the front panel through the air interface, and then output to the CH6B port of the tag test type selection switch. The signal reaching the tag test type selection switch is conducted to the COMB port, and then output to the IN port of the RFID test system. The RFID test system analyzes the signal returned by the tag to complete the tag consistency test.
[0041] See also Figure 1When conducting the RFID tag T IPP test, the tester selects the tag test-single antenna one, single antenna two, single antenna three, single antenna four on the switch conversion software. The signal sent by the RFID test system will be conducted to the COM port of the tag / reader test selection switch, and then the signal will be conducted to the CH0 port of the tag / reader test selection switch, and then output to the COM A port of the tag test type selection switch, and then the signal will be conducted to the four ports of CH0A, CH1A, CH2A, and CH3A, and the signal will be output to the four ports of I N1, I N2, I N3, and I N4 of the tag test routing box. After passing through the inside of the tag test routing box, the signal is conducted to the four ports of ANT1, ANT2, ANT3, and ANT4, and then output to the RF interface a, RF interface b, RF interface c, and RF interface d of the full anechoic chamber. The RF interface a, RF interface b, RF interface c, and RF interface d of the full anechoic chamber are respectively connected to the four antennas of the transceiver, and the signal can be sent to the tag under test through the air interface. The signal returned from the tested tag is received by four antennas through the air interface, and then output to the ANT1, ANT2, ANT3 and ANT4 ports of the tag test routing box through the RF interface a, RF interface b, RF interface c and RF interface d of the full radio wave darkroom. After passing through the inside of the tag test routing box, the signal is conducted to the OUT1, OUT2, OUT3, OUT4 ports, and then output to the CH0B, CH1B, CH2B, CH3B ports of the tag test type selection switch. The signal reaching the tag test type selection switch is conducted to the COMB port, and then output to the IN port of the RFID test system. The RFID test system analyzes the signal returned by the tag to complete the tag T IPP test.
[0042] The above descriptions are merely embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.
Claims
1. A switch conversion matrix of a radio frequency identification test system, characterized in that: It includes a tag reader test selection module, a tag test type selection module, a tag test routing module, and a reader test routing module; The tag reader / writer test selection module is connected to the input end of the reader / writer test routing module, and the output end of the reader / writer test routing module is connected to the tag test type selection module; The tag reader / writer test selection module is also connected to the communication serial port of the tag test type selection module; The tag test type selection module is connected to the input end of the tag test routing module, and the output end of the tag test routing module is connected to the tag test type selection module; The tag test type selection module is connected to a transmitting end of a full anechoic chamber antenna interface, and a receiving end of the full anechoic chamber antenna interface is connected to the tag test type selection module; The tag test type selection module is connected to an input end of a radio frequency identification test system host, and the output end of the radio frequency identification test system host is connected to the communication serial port of the tag reader / writer test selection module.
2. The switch conversion matrix of a radio frequency identification test system according to claim 1, characterized in that: The tag test routing module is used to implement signal routing of different connection modes for RFID tag testing.
3. The switch conversion matrix of a radio frequency identification test system according to claim 1, characterized in that: The reader / writer test routing module is used to implement signal routing for radio frequency identification reader / writer testing.