50 results about "Test selection" patented technology

A method and system for constructing a test using a computer system that performs specification matching during the test creation process is disclosed. A test developer determines one or more test item databases from which to select test items. The test item databases are organized based on psychometric and / or content specifications. The developer can examine the textual passages, artwork or statistical information pertaining to a test item before selecting it by clicking on a designation of the test item in a database. The developer can then add the test item to a list of test items for the test. The test development system updates pre-designated psychometric and content specification information as the developer adds each test item to the test. The test developer can use the specification information to determine whether to add to, subtract from, or modify the list of test items selected for the test.

A state table includes a plurality of possible states of a computer system and the corresponding actions which produce transitions between source and target states. A set of test programs is stored, each test program performing an action in the state table. A test selects an action corresponding to the current state of the computer system; executes the test program which performs the selected action; determines the state of the computer system after the test program has executed; and compares the determined state to the state indicated in the state table as the target state to the selected action on the source state. When an error is found, instead of stopping execution, the test operations to be performed are dynamically reconfigured. Weightings are dynamically allocated to actions in the state table to create a weighted set, and selection of the next test is carried out using random selection over the weighted set. Thus, the continued testing is biased over time towards particular transitions and / or states near to the error location. This enables a tester to discover any other bugs in the same area and also to obtain further diagnostic data on the failure.

When measurement information 83 such as model number is input, a condition file corresponding to the measurement category 81 selected for each measurement object displayed on the initialization screen 80 is automatically selected. Next, when the test selection items (measurement item 86 and test item 87) are selected, the selection result is retained in the memory. During the measurement, the test condition values, etc. are taken out from the condition file according to the selection result, the test data is generated and provided to the test signal generator to generate the test signal, the test signal is input to the measurement object, and the output signal is passed by the measuring instrument through the interface to measure and provide measurement results. The measurement category of the measurement object can be selected and set on the menu screen, and the condition value change can be set using the test condition registration screen or the like. In this way, the test data is set and changed, and the measurement status and measurement results are displayed by operating the screen.

The invention relates to a system for providing customer requested services relating to - for instance - security, monitoring and / or data acquisition in relation to a data processing device and / or a data network (Target 1 - Target k) of a customer, wherein one or more of a plurality of tests are selected to be executed in relation to said data processing device and / or a data network (Target 1 - Target k), said selection (201; 202; 203; 210) of one or more tests are excuted from a server (TSMADARS -server) which is connectable to said data processing devices and / or data network (Target 1 - Target k) via a communication network (140), and wherein data representing results of said selection of tests may be accessed by the customer via a communication network and / or transmitted to said customer. Hereby the customer or user will have the advantage that it will not be necessary to install / download special testing software on the data processing equipment in question. Thus, problems in relation to the execution of such testing software as well as problems concerning the acquisition of the test results and the analysis of such results may be avoided. Further, as it often will be advantageously to utilize two or more different types or makes of testing software applications / systems, the need to invest in a multitude of testing software applications will be avoided by the invention. Similarly, expenses and labour involved in updating such testing software and / or purchasing new software as the already purchased versions become outdated or obsolete will be avoided.

A method and system for constructing a test using a computer system that performs specification matching during the test creation process is disclosed. A test developer determines one or more test item databases from which to select test items. The test item databases are organized based on psychometric and / or content specifications. The developer can examine the textual passages, artwork or statistical information pertaining to a test item before selecting it by clicking on a designation of the test item in a database. The developer can then add the test item to a list of test items for the test. The test development system updates pre-designated psychometric and content specification information as the developer adds each test item to the test. The test developer can use the specification information to determine whether to add to, subtract from, or modify the list of test items selected for the test.

The invention discloses a simulation interview platform based on AI, and the platform comprises the steps: firstly judging user types which comprise two types: common users, i.e., job hunting users and enterprise HR or technicians; the common user logs in through registration, fills in a resume and selects employment information and then submits the resume; the enterprise HR or the technician creates a reservation through registration authentication; after submitting the resume, the common user selects an AI voice interview or an AI voice plus video interview, selects a simulation surface testquestion for testing, selects a real enterprise HR interview, selects a real enterprise technician for interview or selects to purchase learning materials. According to the invention, common interview questions and interview contents of all posts are collected; and after submission, the AI judges the answer content, publishes a correct answer to an applicant and informs the applicant of the lackof points, and recommends learning materials to specially help the applicant to understand their own deficiencies, so that the own ability and overall employment rate of the user are improved.

The invention discloses a controllable Chiplet serial test circuit, and belongs to the technical field of testing or measuring of semiconductor devices in the manufacturing or processing process. The test circuit comprises a master control test module, a slave control test module, a clock control module and an output module, the master control test module is composed of a test access port module, a segment insertion bit module and a test data register module, and a test control signal is generated through the master control test module; the slave control test modules respectively control test input signals of the slave control core particles after receiving the test control signals. Meanwhile, the test control signal is input to the clock control module to obtain a clock signal of the slave control core particle. The output signal of the test output module is determined by the test control signal. According to the test circuit, an external test port is used for directly controlling an internal test signal of the multi-core-particle integrated circuit, core particle test selection and final test output are realized, and effectiveness and independence of each core particle test are ensured.

The invention discloses a mobile phone display screen pressure resistance testing device and a using method thereof. The mobile phone display screen pressure resistance testing device comprises a main frame and a controller, the controller is installed on the surface of the main frame, a pressing device capable of applying pressure at high precision is installed at the top of the main frame, and a testing device capable of converting stations is installed at the bottom of the pressing device; four testing rods are evenly installed outside the testing device, and the controller is electrically connected with the bearing device and the pressing device. The pressing device drives the testing rods to conduct pressure testing on a screen, operation of two modes can be conducted, pressure can be directly applied to the screen till the screen is abnormal, the maximum pressure resistance value of the screen is obtained, a rated pressure value can be set through the pressure sensor, stable pressure application testing is carried out in a required range, the operation modes are rich, the testing selectivity is multiple, the practicability is high, the testing compatibility for different screens is high, meanwhile, the testing device is convenient to change positions, the operation of multi-station testing is simplified, and the efficiency is high.

The invention discloses an MOSFET wafer adjacent particle test method and a test circuit thereof. The test method comprises the following steps of S101, connecting a drain electrode loading end and adrain electrode measurement end of an MOSFET wafer through a resistor; S102, judging that the basic functions of the N tested MOSFET particles are normal by testing VTH small current parameters; S103,testing Rdson, and selecting particles which have a normal function and are closest to the tested particles as auxiliary particles; S104, driving the grid electrodes of the auxiliary particles to bein a normally-on state; S105, connecting the measurement end of the common drain electrode to the source electrode of the auxiliary particles, and then performing Rdson parameter test; correspondingly, the invention also discloses a MOSFET wafer adjacent particle test circuit, which can improve the measurement precision of the Rdson parameter of the MOSFET wafer and effectively reduce the test error.

The invention provides a method and system for automatically verifying independent power-on and power-off control of a hard disk, and the method comprises the following steps: S1, executing an automatic test script, and starting a test; S2, selecting to power on or power off the hard disk of the cluster; S3, powering on or powering off the hard disks of the cluster in sequence according to the selected operation; S4, judging whether the power-on or power-off operation of the hard disk of the cluster is completed or not; And S5, if yes, completing the power-on or power-off operation of the harddisk. The system comprises a test starting module, a hard disk operation selection module, a hard disk power-on and power-off operation action module and a hard disk power-on and power-off operationcompletion judgment module. Automatic power-on and power-off control over a large number of hard disk modules of the cluster is achieved, the power-on and power-off control result can be automaticallyverified, efficient, fast and accurate power-on and power-off control over hard disks is achieved, manual testing is replaced, testing time is greatly saved, and the working efficiency is improved.

A system for designing machine and deep learning models for an embedded platform is disclosed. The system includes a storage subsystem configured to store a plurality of datasets, one or more augmented datasets, a plurality of models and one or more frameworks. The storage subsystem includes a database module and a proposal module. The system also includes a code generation subsystem operatively coupled to the storage subsystem. The code generation subsystem is configured to generate a code in a predefined computer language for a selected model. The system also includes an implementation subsystem operatively coupled to the code generation subsystem. The implementation subsystem is configured to generate one or more test cases and one or more use-cases to test the selected model based on a generated code.

The invention discloses a whole vehicle testing method of an intelligent speed limit reminding system, which can effectively detect the reliability of the intelligent speed limit reminding system. The method comprises the steps of: classifying the intelligent speed limit reminding system according to use functions, and determining test items under each classification; determining test conditions of each actual measurement item according to test requirements of various functions; formulating an expected result of each test item of the intelligent speed limit reminding system under the test condition to serve as a single evaluation standard; integrating the test items, the test conditions and the single evaluation standards, and formulating a test evaluation table; testing the intelligent speed limit reminding system of a plurality of vehicles, namely, selecting multiple evaluation personnel, testing the intelligent speed limit reminding system of each vehicle type item by item according to the test evaluation table, and scoring according to a single evaluation standard; and counting evaluation results of all evaluation personnel, and comprehensively calculating a test result of the intelligent speed limit reminding system.

The invention relates to a test method and device. The test method comprises the steps: obtaining data flow information of a to-be-tested program, the weight of a basic block in the control flow information, and the first address information of the basic block, and enabling the data in the data flow information to serve as a seed to be added into a seed queue; performing dynamic instrumentation onthe to-be-tested program to obtain second address information of a basic block in the to-be-tested program, and taking the weight of the basic block corresponding to the first address information asthe weight of the basic block corresponding to the second address information under the condition that the second address information is the same as the first address information; and taking the seedsin the seed queue as input to run the to-be-tested program after dynamic instrumentation, and guiding an execution path of the seeds by utilizing the weights of the basic blocks in the to-be-tested program so as to test the to-be-tested program. The test method guides the execution path of the seed in the to-be-tested program through the weight of the basic block, can select the correct test direction for the test, can improve the test efficiency, and can save the test time and the test cost.

Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting, by a test selection system, a regression test case from a plurality of regression test cases in a software testing lifecycle system. The test selection system determines a product release weight associated with the regression test case, where the product release weight incorporates new features associated with a product release. The test selection system obtains a regression test case value for the regression test case by applying the product release weight. The test selection system selects the regression test case for use in regression testing for the product release, based on the regression test case value and executes the regression test case on a system.

The invention provides an unbalanced learning-based abnormal cell remote transfer classification method and system, and the method comprises the steps: obtaining a plurality of data sequences with a certain cell remote transfer and a plurality of data sequences without a certain cell remote transfer, dividing the data set into a training set and a test set, enabling the training set to be used fortraining a model, and enabling the test set to be used for testing the model; firstly, a training set is input into a feature selection algorithm to be compared with a classification result of an original situation data set, and p features with the best result are selected; Using an oversampling algorithm to obtain a training set of which the ratio of positive and negative samples is 1: 1, respectively inputting the training set into a classification algorithm, testing by using a data sequence of a test set, and selecting to obtain an oversampling algorithm i of a training set Pi with an optimal evaluation result; By adjusting the proportion of the positive and negative samples, the training set is input into an oversampling algorithm for obtaining a training set Pi, the proportion of thepositive and negative samples is gradually increased to a set proportion, and the optimal proportion of the positive and negative samples is classified and evaluated. According to the technical scheme, an oversampling algorithm is used for attempting to increase the proportion of the positive samples, and better model evaluation indexes and the recall rate of a few positive samples are obtained.

The invention discloses a cutter head drive sealing test bench, comprising: a sealing chamber; a power box including a power box block 1 and a power box block 2, and the power box block 2 is provided with a grease hole; a driving rotation device including a rotating The motor is fixed on the first block of the power box, the power transmission gear is fixed on the output shaft of the rotating motor, the rotating bearing meshes with the power transmission gear through the inner ring gear, the outer ring of the transmission bearing is fixed on the first block of the power box, and the force ring The front end is sealed and the rear end is fixed to the inner ring of the rotating bearing, and the outer sealing ring is fixed to the outside of the stressed ring; the bottom support frame is supported on the bottom of the sealing chamber and the power box; the equipment mounting frame for placing the auxiliary system. Test the driving seal ring by simulating the soil quality, pressure, and cutter head speed of the corresponding project, and select the seal ring that meets the working conditions, thereby improving the reliability of the cutter head drive and improving the safety of the shield machine construction personnel.

The present disclosure provides a chip test analysis circuit, comprising: an address decoding circuit, configured to generate a first test selection signal and a second test selection signal; an output test circuit, configured to select a corresponding to-be-output test signal from a plurality of to-be-output test signals according to the first test selection signal, and output the selected to-be-output test signal to a test node for output signal test analysis; an input test circuit, configured to select an input test channel corresponding to the second test selection signal from a plurality of input test channels according to the second test selection signal, and input a to-be-input test signal to a corresponding circuit inside a to-be-tested chip through the selected input test channel for internal circuit test analysis; and a test direction selection circuit, configured to generate a test mode selection signal, the test mode selection signal being used to control the output test circuit and the test node to be connected or disconnected, and control the input test circuit and the test node to be disconnected or connected.

The invention discloses a controllable Chiplet serial test circuit, which belongs to the technical field of testing or measurement of semiconductor devices in the process of manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock control module, and an output module. The master control test module is composed of a test access port module, a segment insertion bit module, and a test data register module. The test control module is generated through the master control test module. After receiving the test control signal, the slave control test module respectively controls the test input signal of the slave control core particles. At the same time, the test control signal is input to the clock control module to obtain the clock signal of the slave chip. The output signal of the test output module is determined by the test control signal. The test circuit uses the external test port to directly control the internal test signal of the multi-chip integrated circuit, realizes the selection of the chip test and the final test output, and ensures the validity and independence of each chip test.

The embodiment of the invention discloses a display module and a module testing method, the display module is a display module after a to-be-tested display module is tested, and the to-be-tested display module comprises a display substrate, a test bonding pad and a test circuit board; a plurality of signal lines to be tested and a multiplexer are arranged on the display substrate, and the test bonding pad comprises a plurality of test input ends and test output ends; a plurality of test signal input structures and test signal analysis structures are arranged on the test circuit board; the at least one test signal input structure is configured to input a test selection signal to the test input end, and the test signal analysis structure is configured to analyze a signal output by the test output end; and the multiplexer is electrically connected with the plurality of test signal lines, the plurality of test input ends and the test output end, and is configured to select a signal of one signal line in the plurality of test signal lines and output the signal to the test output end under the control of a test selection signal input by the plurality of test input ends.

The invention relates to the technical field of chip testing, in particular to a chip testing sub-mode entry system, which is characterized in that a mode decoder sets a signal of a corresponding testing sub-mode as a preset second level according to sub-mode entry information and coding information corresponding to M testing sub-modes, the signal of the test sub-mode and the signal of the test mode serve as the input of an AND gate corresponding to the test sub-mode, the AND gate corresponding to the test sub-mode serves as the input of a test selector, and when the signal of the test sub-mode and the signal of the test mode are both preset second levels, the test selector enters the test sub-mode; the mode register can be configured and the test sub-mode can be entered only by two interfaces of the first communication port, and the two interfaces can be released after entering the test sub-mode and used for participating in test excitation input, so that the reusability of the interfaces is improved, the chip area is effectively saved, the chip design and manufacturing cost is reduced, and the test efficiency is improved. And the convenience of entering the chip sub-test mode is also improved.

A technique for sampling a primitive ID map. The technique includes identifying a sample point having a location in a texture space; obtaining a primitive ID sample from the primitive ID map based on the location of the sample point in the texture space; identifying a primitive based on the primitive ID; testing the location in the texture space for inclusion within the identified primitive; and selecting either the primitive ID or a different primitive ID based on the testing.

A method of testing a change in a software code includes, searching a database of tests to identify a subset of the tests that include a function that executes the change, forming, from the subset, a multitude of groups each having a different execution path. The tests in the same group have the same execution path. The method further includes prioritizing the tests within each of the multitude of groups based on one or more testing characteristics, and selecting, from each of the groups, one or more of the prioritized tests to test the change.

Systems and methods for dynamically selecting source code development tests using a trained machine learning (ML) model are disclosed. In certain embodiments, a plurality of data features is derived from information indicating a plurality of modifications to a source code repository. Based at least in part on the derived data features, an ML model is trained to identify correlations between the modifications and a plurality of historical source code development test results. Upon receiving an indication of one or more additional modifications to the source code repository, the trained ML model dynamically selects, from a plurality of source code development tests, a subset of source code development tests relevant to the additional modifications.

Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting, by a test selection system, a regression test case from a plurality of regression test cases in a software testing lifecycle system. The test selection system calculates a fault detection score for the regression test case, based on a fault detection decay rate score associated with the regression test case. The test selection system selects the regression test case for execution on a test system based on the fault detection score, and executes the regression test case on the test system.

Methods, system, and non-transitory processor-readable storage medium for a test selection system are provided herein. An example method includes selecting a regression test case from a plurality of regression test cases in a software testing lifecycle system. A test selection system calculates a score for the regression test case using an Analytic Hierarchy Process (AHP) assigned weight. Using the score, the test selection system visualizes a relationship between the regression test case and goals associated with a regression testing effort. The test selection system selects the regression test case for use in the regression testing effort based on the visualized relationship, and executes the regression test case on a system.

The application discloses a MOSFET wafer adjacent particle testing method and a testing circuit thereof, and the testing method comprises the following steps: S101, connecting the drain loading end and the drain measuring end of the MOSFET wafer through a resistor; S102, judging the basic function of N measured MOSFET particles to be normal by testing a small current parameter of VTH; S103, testing Rdson, and selecting a particle closest to the measured particle as an auxiliary particle; S104, driving the gate of the auxiliary particle to be always on; and S105, connecting the measuring end of the common drain to the source of the auxiliary particle, and then testing the Rdson parameter; the application further discloses a MOSFET wafer adjacent particle testing circuit, and the testing circuit can improve the measurement accuracy of the Rdson parameter of the MOSFET wafer and effectively reduces the testing error.

An integrated circuit includes a configurable delay chain, which contains a chain of binary delay blocks. Each binary delay block includes the following. Inputs receive an input signal, a select signal and a test control signal. A delay branch transmits the input signal with a delay, and a bypass branch transmits the input signal without the delay. Selector circuitry is connected to the delay branch and to the bypass branch. The selector circuitry selects either the delay branch or the bypass branch according to the select signal. According to the test control signal, test circuitry produces a test signal to test the selector circuitry.

Methods, system, and non-transitory processor-readable storage medium for a test selection and prioritization system are provided herein. An example method includes mining, by the system, a test case repository comprising test cases and execution results, to identify relationships between test cases based on the execution of the test cases according to a test case execution plan. The system creates a first test case execution plan comprising a first subset of the test cases based on the identified relationships. A test management system executes the first subset of the test cases according to the first test case execution plan on at least one test system. The system assesses results of the execution of the first subset to identify a second test case execution plan, where the second test case execution plan results in test execution failures occurring earlier than test cases executed according to the test case execution plan.

The present disclosure provides a memory and an electronic device, wherein an external clock signal and N internal clock signals are present in the memory, the external clock signal is used to sample a data signal received from the outside, and the N internal clock signals are used to sample and generate a data signal sent to the outside; based on a test selection signal, a selection circuit outputs one of the N internal clock signals and the external clock signal as a detection clock signal.

The invention relates to a page test display method and device, electronic equipment and a storage medium, by displaying a test selection page comprising at least one test configuration information selection area, based on a selection instruction for target test configuration information in the selection area, a target test page corresponding to the target test configuration information is displayed, and the test configuration information is displayed. The processing efficiency of test style display can be improved, and the convenience of selecting the target test page for display can be improved; and in response to the page recovery instruction, displaying the initial page based on the initial configuration information associated with the information resource address of the test configuration information in the browser plug-in cache, so that the initial configuration information stored on the local terminal of the user can be automatically recovered, the influence of page test on the initial configuration information stored on the local terminal of the user is avoided, and the user experience is improved. Therefore, the normal use of the business function of the browser is ensured.