Third bending device for VM probe

Abstract

The invention discloses a third bending device for a VM probe, and relates to the technical field of VM probe bending. A third bending device for a VM probe comprises a workbench, a position adjusting piece is installed on the workbench, and a bearing table used for placing the probe and a pressing mechanism used for pressing the probe are installed on the position adjusting piece; the workbench is further provided with a bending mechanism used for bending the probe. The bearing table comprises a bearing plate connected to the position adjusting piece, the upper end of the bearing plate is provided with a containing groove used for containing the probe which is bent twice, and the containing groove comprises a notch used for allowing the probe to extend out of the bearing plate; the bending mechanism comprises a connecting base installed on the workbench, the connecting base is rotationally connected with a bending assembly, and the bending assembly is configured to be capable of bending the probe extending out of the bearing plate after rotating. According to the invention, the probe can be bent for the third time conveniently.

Description

Technical Field

[0001] The present application relates to the technical field of VM probe bending, and in particular to a VM probe third-pass bending device. Background Art

[0002] A probe is a signal transmission detection tool. It is a test interface and is mainly used to test bare cores. It connects the test machine and the chip to transmit signals to accurately detect chip parameters. Among them, the VM probe is a type of probe; the VM probe is mainly used to detect and measure the voltage and current in integrated circuits. VM probes are usually used in the testing of high-end system-level chips. They are processed by micro-electromechanical system technology and have the characteristics of high precision and reliability. Usually, in order to meet actual use needs, the VM straight needle needs to be bent three times after it is manufactured. The existing general bending device is generally used to process the VM straight needle into a VM probe. During the processing process, workers are required to constantly adjust the position of the straight needle and debug the parameters of the bending device, especially the third bending process. It is not convenient for workers to place and adjust the position of the probe that has been bent twice. There are many workers involved, and it is particularly difficult to bend for the third time. Summary of the invention

[0003] In order to facilitate the third bending of the probe, the present application provides a VM probe third bending device.

[0004] The third bending device of a VM probe provided in this application adopts the following technical solution: A VM probe third bending device comprises a workbench, on which a positioning member is installed, on which a bearing platform for placing the probe and a clamping mechanism for clamping the probe are installed; and a bending mechanism for bending the probe is also installed on the workbench; The bearing platform includes a bearing plate connected to the position adjusting member, the upper end of the bearing plate is provided with a receiving groove for accommodating the probe that has been bent twice, and the receiving groove includes a notch for allowing the probe to extend out of the bearing plate; The bending mechanism comprises a connection seat installed on a workbench, the connection seat is rotatably connected with a bending assembly, and the bending assembly is configured to be able to bend the probe extending out of the bearing plate after being rotated.

[0005] By adopting the above technical solution, the following bending action can be achieved: the probe that has been bent twice is placed in the receiving groove so that the part of the probe to be bent is outside the carrier plate, and then the probe is pressed by the pressing mechanism, and then the part of the probe outside the carrier plate is bent by the bending assembly. The present application can facilitate the third bending of the probe.

[0006] Preferably, the bending assembly includes a rotating column rotatably connected to a connecting seat, the rotating column is connected to a connecting plate, a bending piece and a gripping plate are mounted on the connecting plate, and the gripping plate is configured to drive the connecting plate to rotate and thereby drive the bending piece to rotate to bend the probe.

[0007] By adopting the above technical solution, the user can drive the connecting plate to rotate by grasping the gripping plate, thereby driving the bending member to rotate and bend the probe.

[0008] Preferably, the bending member includes a bending block connected to the connecting plate, the bending block having a first bending end face and a second bending end face, the first bending end face is configured to be able to bend the probe in a first direction, and the second bending end face is configured to be able to bend the probe in a second direction, and the first direction and the second direction are opposite.

[0009] By adopting the above technical solution, when the connecting plate rotates, the bending block will be driven to rotate, and the rotation of the bending block will cause the probe to be pressed against the first bending end face or the second bending end face, and then the bending block will continue to rotate, causing the first bending end face or the second bending end face to apply force to the probe, thereby bending the probe. This application can realize bending the probe in two different directions.

[0010] Preferably, at least two limit assemblies are installed on the workbench, and the limit assemblies are configured to limit the movement stroke of the connecting plate.

[0011] By adopting the above technical solution, the movement stroke of the connecting plate is limited by a plurality of limit assemblies, so that the bending extent of the probe can be easily controlled.

[0012] Preferably, the limiting assembly includes a limiting seat, a plurality of docking holes 1 are opened on the workbench, and the plurality of docking holes 1 are distributed horizontally and vertically. A docking hole 2 is opened on the limiting seat, and the docking hole 2 and the docking hole 1 are detachably connected with a locking piece, and any docking hole 1 can be docked with the docking hole 2.

[0013] By adopting the above technical solution, the locking member can be disassembled to connect the docking hole 2 with a different docking hole 1 and then the locking member can be reconnected to change the position of the limit seat. This design is used to make the bending range of the probe adjustable.

[0014] Preferably, the clamping mechanism includes a pressing plate arranged at the upper end of the supporting platform, the pressing plate and the supporting platform are slidably connected, and a locking member is detachably connected between the pressing plate and the supporting platform. The pressing plate is configured to be able to slide and then be locked by the locking member to clamp the probe.

[0015] By adopting the above technical solution, the locking piece can be removed to allow the pressure plate to slide, and the sliding pressure plate can maintain / release the pressure on the probe; after sliding and adjusting the position of the pressure plate, the locking piece needs to be reinstalled to ensure that the pressure plate does not move.

[0016] Preferably, a waist-shaped hole is formed on the pressing plate, a connecting hole is formed on the supporting platform, and the locking member is connected to the waist-shaped hole and the connecting hole.

[0017] By adopting the above technical solution, the position of the pressing plate can be easily changed based on the waist-shaped hole and it can also be ensured that the pressing plate can be locked by the locking piece.

[0018] Preferably, the supporting platform includes a sub-plate one, the sub-plate one is connected to the adjusting member, a sub-plate two is mounted on the sub-plate one, the sub-plate two is detachably connected to the sub-plate one, and the receiving groove is provided on the sub-plate two.

[0019] By adopting the above technical solution, the carrier plate can be disassembled to process and adjust the structural style of the receiving groove to meet different probe placement requirements.

[0020] Preferably, the positioning member is a three-axis cylinder.

[0021] By adopting the above technical solution, the three-axis cylinder can easily adjust the position of the probe on three axes.

[0022] In summary, the present invention includes at least one of the following beneficial technical effects: 1. The present application can realize the following bending action: placing the probe that has been bent twice in the receiving groove so that the part of the probe to be bent is outside the carrier plate, and then using the clamping mechanism to clamp the probe, and then using the bending assembly to bend the part of the probe outside the carrier plate. The present application can facilitate the third bending of the probe; 2. When the connecting plate rotates, the bending block will rotate. The rotation of the bending block will cause the probe to be pressed against the first bending end face or the second bending end face. Then, the bending block will continue to rotate, causing the first bending end face or the second bending end face to apply force to the probe, thereby bending the probe. This application can realize bending the probe in two different directions; 3. The locking piece can be disassembled to connect the docking hole 2 with a different docking hole 1 and the locking piece can be reconnected to change the position of the limit seat. This design is used to make the bending range of the probe adjustable. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 is a schematic diagram of the structure of the probe; Figure 2 Schematic diagram of the overall structure of the third bending device of the VM probe in the embodiment of the present application; Figure 3It is a schematic diagram for reflecting the structure of the bearing platform; Figure 4 yes Figure 3 A magnified view of part A; Figure 5 It is a schematic diagram used to reflect the structure of the bending component; Figure 6 It is a cross-sectional view used to represent the bent component.

[0024] Markings in the accompanying drawings: 1. probe; 2. workbench; 21. first limit assembly; 211. limit seat; 2111. docking hole 2; 22. second limit assembly; 23. docking hole 1; 3. adjustment member; 4. bearing platform; 41. bearing plate; 411. receiving groove; 4111. groove body 1; 4112. groove body 2; 4113. notch; 412. sub-plate 1; 413. sub-plate 2; 414. connecting hole; 5. clamping mechanism; 51. pressing plate; 511. waist-shaped hole; 6. bending mechanism; 61. connecting seat; 62. bending assembly; 621. rotating column; 622. connecting plate; 623. bending member; 6231. bending block; 6232. first bending end face; 6233. second bending end face; 624. grip plate. DETAILED DESCRIPTION

[0025] The present invention is further described in detail below in conjunction with the accompanying drawings.

[0026] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0027] The present application embodiment discloses a VM probe third bending device. It is used to facilitate the third bending, referring to Figure 1 , Figure 1 Schematic diagram of the structure of the probe 1 after being bent three times.

[0028] Reference Figure 2 The VM probe third bending device includes a workbench 2, on which is mounted a positioning member 3, which is preferably a three-axis cylinder, on which is mounted a support platform 4 for placing the probe 1 and a clamping mechanism 5 for clamping the probe 1, the three-axis cylinder being able to drive the support platform 4 and the clamping mechanism 5 to move in three-axis directions to adjust the position of the probe 1, the specific structure of the three-axis cylinder being prior art and therefore not described again here; a bending mechanism 6 for bending the probe 1 is also mounted on the workbench 2.

[0029] First, the probe 1 that has been bent twice is placed on the support platform 4, and then the positioning member 3 is used to drive the support platform 4 to move to adjust the probe 1 to a suitable bending position, and then the clamping mechanism 5 is used to clamp the probe 1 to ensure that the probe 1 does not move during bending, and then the bending mechanism 6 is used to bend the probe 1.

[0030] Reference Figure 2 , Figure 3 and Figure 4 The supporting platform 4 includes a supporting plate 41 connected to the adjusting member 3, and a receiving groove 411 for placing the probe 1 that has been bent twice is opened at the upper end of the supporting plate 41; specifically, the receiving groove 411 includes a connected groove body 1 4111 and a groove body 2 4112, and one end of the groove body 2 4112 passes through the outside of the supporting plate 41 and forms a notch 4113 on the supporting plate 41.

[0031] After the twice-bent probe 1 is placed in the receiving groove 411, the bent end of the probe 1 will be placed in the groove body 1 4111, and the needle body of the probe 1 will be placed in the groove body 4112. At this time, the needle body of the probe 1 will be attached to the inner wall of the groove body 4112 and the top of the probe 1 will be flush with the upper end of the supporting plate 41. The part of the probe 1 to be bent extends to the outside of the supporting plate 41 through the groove 4113. The probe 1 can be deformed and bent by applying unilateral force to the probe 1 extending out of the supporting plate 41.

[0032] Reference Figure 2 and Figure 3 The clamping mechanism 5 includes a pressing plate 51 disposed on the upper end of the carrier plate 41. The pressing plate 51 and the carrier plate 41 are slidably connected. A locking member is detachably connected between the pressing plate 51 and the carrier plate 41. The locking member is preferably a bolt. The pressing plate 51 can be locked by the locking member after sliding, thereby clamping the probe 1. Specifically, a waist-shaped hole 511 is opened on the pressing plate 51, and a connecting hole 414 is opened on the carrier plate 41. The locking member is connected to the waist-shaped hole 511 and the connecting hole 414.

[0033] After the probe 1 is placed in the receiving groove 411 , the locking piece is removed and the pressing plate 51 is moved so that the pressing plate 51 presses the probe 1 in the receiving groove 411 . The locking piece is then reinstalled to lock the pressing plate 51 .

[0034] Reference Figure 2 The bending mechanism 6 includes a connection seat 61 installed on the workbench 2. The connection seat 61 is rotatably connected to a bending assembly 62. The bending assembly 62 can be rotated to bend the probe 1 extending out of the carrier plate 41.

[0035] Reference Figure 5 and Figure 6The bending assembly 62 includes a rotating column 621, a bearing is installed on the connecting seat 61, the rotating column 621 is rotatably connected to the connecting seat 61 through the bearing, and the rotating column 621 is connected to a connecting plate 622; a bending piece 623 and a gripping plate 624 are installed on the connecting plate 622, and the gripping plate 624 can drive the connecting plate 622 to rotate, thereby driving the bending piece 623 to rotate to apply force to the probe 1, thereby bending the probe 1. Specifically, the bending piece 623 includes a bending block 6231 connected to the upper end of the connecting plate 622, and the bending block 6231 has a first bending end face 6232 and a second bending end face 6233, and the first bending end face 6232 and the second bending end face 6233 are both inclined inwardly toward the direction of the receiving groove 411, and the first bending end face 6232 can bend the probe 1 in a first direction, and the second bending end face 6233 can bend the probe 1 in a second direction, and the first direction and the second direction are opposite.

[0036] In the present application, the probe 1 can be bent in different directions; after the probe 1 is pressed, the connecting plate 622 can be driven to rotate by holding the holding plate 624, thereby driving the bending block 6231 to rotate so that the first bending end face 6232 or the second bending end face 6233 applies force to the probe 1, and the probe 1 will be deformed and bent due to the force.

[0037] Reference Figure 2 Since the angle of rotation of the connecting plate 622 driven by directly holding the holding plate 624 is uncontrollable, the bending extent of the probe 1 may deviate. Therefore, in order to achieve accurate bending, at least two limit assemblies are installed on the workbench 2. Among them, in this embodiment, there are specifically two limit assemblies, which are the first limit assembly 21 and the second limit assembly 22. The first limit assembly 21 can limit the starting end of the stroke of the connecting plate 622, and the second limit assembly 22 can limit the end of the stroke of the connecting plate 622. The combination of the first limit assembly 21 and the second limit assembly 22 can limit the movement stroke of the connecting plate 622.

[0038] Reference Figure 2 Specifically, the two limit components have the same structure. Take the structure of the first limit component 21 as an example: the first limit component 21 includes a limit seat 211, and a plurality of docking holes 23 are opened on the workbench 2, and the plurality of docking holes 23 are distributed horizontally and vertically. The limit seat 211 is provided with a docking hole 2111, and the docking hole 2111 and the docking hole 1 23 are detachably connected with a locking member, and the locking member is preferably a bolt, and any docking hole 23 can be docked with the docking hole 2111.

[0039] The locking piece can be disassembled and the limiting seat 211 can be moved, and then the second docking hole 2111 is docked with the other docking hole 1 23 and the locking piece is screwed on to adjust the position of the limiting seat 211. At this time, the movement stroke of the connecting plate 622 is adjusted.

[0040] Reference Figure 3 In order to make the present application applicable to bending probes 1 of different types and sizes, the carrier plate 41 includes a sub-plate 412, which is connected to the adjustment member 3, and a sub-plate 413 is installed on the sub-plate 412 by screws, and the receiving groove 411 is opened on the sub-plate 413.

[0041] The second sub-board 413 can be disassembled and replaced to accommodate other probes 1 or the receiving groove 411 can be processed again to adjust the size of the probe 1 that can be placed.

[0042] The implementation principle of the third bending device of the VM probe in the embodiment of the present application is: First, place the probe 1 that has been bent twice in the receiving groove 411, and then use the adjusting member 3 to drive the supporting platform 4 to move so as to adjust the probe 1 to a suitable bending position. Then, remove the locking member and move the pressure plate 51 so that the pressure plate 51 presses the probe 1 in the receiving groove 411, reinstall the locking member to lock the pressure plate 51, and finally hold the holding plate 624 to drive the connecting plate 622 to rotate, thereby driving the bending block 6231 to rotate so that the first bending end face 6232 or the second bending end face 6233 applies force to the probe 1, and the probe 1 will be deformed and bent due to the force.

[0043] The embodiments of this specific implementation method are all preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Therefore, all equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A VM probe third bending device, characterized in that: The invention comprises a workbench (2), wherein a positioning member (3) is installed on the workbench (2), and a bearing platform (4) for placing a probe (1) and a clamping mechanism (5) for clamping the probe (1) are installed on the positioning member (3); and a bending mechanism (6) for bending the probe (1) is also installed on the workbench (2); The bearing platform (4) comprises a bearing plate (41) connected to the positioning member (3); the upper end of the bearing plate (41) is provided with a receiving groove (411) for accommodating the probe (1) that has been bent twice; the receiving groove (411) comprises a notch (4113) for allowing the probe (1) to extend outside the bearing plate (41); The bending mechanism (6) comprises a connecting seat (61) mounted on the workbench (2), the connecting seat (61) being rotatably connected to a bending assembly (62), the bending assembly (62) being configured to be able to bend the probe (1) extending out of the supporting plate (41) after being rotated.

2. The VM probe third bending device according to claim 1, characterized in that: The bending assembly (62) comprises a rotating column (621) rotatably connected to a connecting seat (61); the rotating column (621) is connected to a connecting plate (622); a bending piece (623) and a gripping plate (624) are mounted on the connecting plate (622); the gripping plate (624) is configured to drive the connecting plate (622) to rotate, thereby driving the bending piece (623) to rotate and bend the probe (1).

3. The VM probe third bending device according to claim 2, characterized in that: The bending member (623) comprises a bending block (6231) connected to the connecting plate (622), the bending block (6231) having a first bending end surface (6232) and a second bending end surface (6233), the first bending end surface (6232) being configured to be able to bend the probe (1) in a first direction, the second bending end surface (6233) being configured to be able to bend the probe (1) in a second direction, the first direction and the second direction being opposite.

4. The VM probe third bending device according to claim 2, characterized in that: At least two limit assemblies are installed on the workbench (2), and the limit assemblies are configured to limit the movement stroke of the connecting plate (622).

5. The VM probe third bending device according to claim 4, characterized in that: The limiting assembly comprises a limiting seat (211), a plurality of docking holes (23) are provided on the workbench (2), the plurality of docking holes (23) are distributed horizontally and vertically, a docking hole (2111) is provided on the limiting seat (211), the docking hole (2111) and one of the docking holes (23) are detachably connected with a locking piece, and any of the docking holes (23) can be docked with the docking hole (2111).

6. The VM probe third bending device according to claim 1, characterized in that: The clamping mechanism (5) comprises a pressing plate (51) arranged at the upper end of the supporting platform (4); the pressing plate (51) and the supporting platform (4) are slidably connected; a locking member is detachably connected between the pressing plate (51) and the supporting platform (4); the pressing plate (51) is configured to be locked by the locking member after sliding, thereby clamping the probe (1).

7. The VM probe third bending device according to claim 6, characterized in that: The pressing plate (51) is provided with a waist-shaped hole (511), the bearing platform (4) is provided with a connecting hole (414), and the locking member is connected to the waist-shaped hole (511) and the connecting hole (414).

8. The VM probe third bending device according to claim 1, characterized in that: The support platform (4) comprises a sub-plate 1 (412), wherein the sub-plate 1 (412) is connected to the positioning member (3), a sub-plate 2 (413) is mounted on the sub-plate 1 (412), the sub-plate 2 (413) and the sub-plate 1 (412) are detachably connected, and the receiving groove (411) is provided on the sub-plate 2 (413).

9. The VM probe third bending device according to claim 1, characterized in that: The positioning member (3) is a three-axis cylinder.

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