Coating Defect Detection Method, Electronic Device and Storage Medium

Abstract

The present invention provides a method for detecting coating defects, an electronic device, and a storage medium. The method includes: uniformly mixing fluorescent powder with coating powder, and cladding the mixed powder on the surface of a substrate to form a coating to be detected; performing point-by-point detection on the coating to be detected to obtain the measured fluorescence spectrum corresponding to each detection point on the coating to be detected; judging whether each detection point is a defect point and the defect type of the defect point according to the measured fluorescence spectrum corresponding to each detection point and a preset standard fluorescence spectrum; if the defect type is an apparent quality defect, determining the coating quality missing value corresponding to the defect point, and repairing the defect point based on the coating quality missing value. The present invention can improve the detection efficiency and detection accuracy of coating surface defects.

Description

Technical Field

[0001] The present invention relates to the technical field of coating testing, and in particular, to a method for detecting coating defects, an electronic device, and a storage medium. Background Art

[0002] Anti-corrosion, wear-resistant and other coatings are widely used in many industrial fields such as construction, automobile manufacturing, and machining. The surface quality of the coating directly affects the performance, aesthetics, and service life of the product. During the production process of the coating, due to factors such as raw materials, process parameters, and environment, surface defects such as scratches, bubbles, cracks, and pitting are likely to occur. Therefore, it is necessary to detect the surface defects of the coating in order to repair them in time and avoid affecting the performance, aesthetics, and service life of the product.

[0003] Currently, although there are some automated detection methods, due to problems such as low detection accuracy and poor ability to identify complex defects, the automated detection methods have not been widely used. In the related technologies, manual detection is mostly still used to detect the surface defects of the coating, but the manual detection method is inefficient, subjective, and prone to missed detection and false detection. Summary of the Invention

[0004] Embodiments of the present invention provide a method for detecting coating defects, an electronic device, and a storage medium to solve the problems of low efficiency and low detection accuracy in detecting surface defects of coatings.

[0005] In a first aspect, embodiments of the present invention provide a method for detecting coating defects, including:

[0006] Uniformly mix fluorescent powder into the coating powder, and clad the mixed powder on the surface of the substrate to form a coating to be detected;

[0007] Probe the coating to be detected point by point to obtain the measured fluorescence spectrum corresponding to each detection point on the coating to be detected;

[0008] According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, determine whether each detection point is a defect point and the defect type of the defect point;

[0009] If the defect type is an apparent quality defect, determine the coating quality loss value corresponding to the defect point, and repair the defect point based on the coating quality loss value.

[0010] In a possible implementation manner, the determining whether each detection point is a defect point and the defect type of the defect point according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum includes:

[0011] According to the measured fluorescence spectra corresponding to each detection point and the preset standard fluorescence spectra, respectively detect whether the measured fluorescence emission wavelength in the measured fluorescence spectrum is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum;

[0012] If the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, determine that the detection point is a defective point, and the defect type of the defective point is an apparent quality defect;

[0013] If the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, determine that the detection point is a defective point, and the defect type of the defective point is an apparent impurity defect;

[0014] If the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, determine that the detection point is a normal point.

[0015] In a possible implementation manner, if the defect type is an apparent quality defect, determining the coating quality missing value corresponding to the defective point includes:

[0016] If the defect type is an apparent quality defect, obtain the mapping relationship between the fluorescence emission wavelength and the coating quality;

[0017] Based on the standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship, determine the standard coating quality;

[0018] Based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship, determine the measured coating quality corresponding to the defective point;

[0019] According to the difference between the standard coating quality and the measured coating quality, determine the coating quality missing value corresponding to the defective point.

[0020] In a possible implementation manner, the repairing the defective point based on the coating quality missing value includes:

[0021] If the coating quality missing value is greater than 0, determine the coating quality missing value as the powder feeding quality;

[0022] Perform laser cladding on the defective point, and during the laser cladding process, continuously supply a mixed powder to the defective point until the mass of the supplied mixed powder reaches the powder feeding quality.

[0023] In a possible implementation manner, the repairing the defective point based on the coating quality missing value includes:

[0024] If the coating mass missing value is less than 0, then the absolute value of the coating mass missing value is determined as the powder removal mass;

[0025] Laser cladding is performed on the defect point, and the mass of the powder removed during the laser cladding process is collected in real time until the mass of the powder removed reaches the powder removal mass.

[0026] In a possible implementation manner, the melting and cladding of the mixed powder on the surface of the substrate to form a to-be-detected coating includes:

[0027] The surface of the substrate is heated by microwave, and during the microwave heating process, the mixed powder after mixing is melted and cladded on the surface of the substrate by using laser cladding technology to form the to-be-detected coating.

[0028] In a possible implementation manner, during the process of melting and cladding the mixed powder after mixing on the surface of the substrate by using laser cladding technology, the powder feeding rate range of the mixed powder is 0.2 - 0.5 g / min, the laser scanning rate range is 6 - 8 mm / s, and the laser power range is 1200 - 1500 W.

[0029] In a possible implementation manner, the step of detecting the to-be-detected coating point by point includes:

[0030] Thermal laser is used to detect the to-be-detected coating point by point.

[0031] In a second aspect, an embodiment of the present invention provides a coating defect detection device, including:

[0032] A cladding module, configured to uniformly mix fluorescent powder in coating powder and melt and clad the mixed powder on the surface of a substrate to form a to-be-detected coating;

[0033] A detection module, configured to:

[0034] Detect the to-be-detected coating point by point to obtain the measured fluorescence spectrum corresponding to each detection point on the to-be-detected coating;

[0035] According to the measured fluorescence spectra corresponding to each detection point and a preset standard fluorescence spectrum, determine whether each detection point is a defect point and the defect type of the defect point;

[0036] A repair module, configured to, if the defect type is an apparent quality defect, determine the coating mass missing value corresponding to the defect point and repair the defect point based on the coating mass missing value.

[0037] In a third aspect, an embodiment of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the method described in the first aspect above or any possible implementation manner of the first aspect are implemented.

[0038] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the steps of the method described in the first aspect above or any possible implementation manner of the first aspect are implemented.

[0039] An embodiment of the present invention provides a coating defect detection method, an electronic device, and a storage medium. By uniformly mixing fluorescent powder in coating powder and cladding it on the surface of a substrate to form a coating to be detected, the fluorescence spectra corresponding to each detection point on the coating to be detected can be used to reflect whether there are defects in the coating covering at each detection point and the corresponding defect types, so as to achieve fast and accurate coating defect detection. Moreover, based on determining that the defect type is an apparent quality defect, an embodiment of the present invention can further determine the coating quality missing value and repair the defect points according to the coating quality missing value, so as to precisely repair the defect points on the coating to be detected in a targeted manner. Description of the Drawings

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for use in the embodiments or the description of the prior art. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other drawings can be obtained based on these drawings.

[0041] Figure 1 is a flowchart of the implementation of the coating defect detection method provided by an embodiment of the present invention;

[0042] Figure 2 is a detection schematic diagram when performing point-by-point detection on the coating to be detected provided by an embodiment of the present invention;

[0043] Figure 3 is a schematic structural diagram of the coating defect detection device provided by an embodiment of the present invention;

[0044] Figure 4 is a schematic diagram of the electronic device provided by an embodiment of the present invention. Detailed Embodiments

[0045] In the following description, specific details such as specific system architectures and technologies are presented for purposes of illustration rather than limitation in order to provide a thorough understanding of the embodiments of the present invention. However, those skilled in the art should understand that the present invention can also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to avoid unnecessary details from obscuring the description of the present invention.

[0046] Defects such as scratches, bubbles, cracks, and pitting on the coating surface not only affect the aesthetics of the product but also its performance and service life. Therefore, it is necessary to detect coating defects for timely repair. In related technologies, manual inspection is mostly used, but manual inspection methods are inefficient, subjective, and prone to missed and false detections.

[0047] To improve the detection accuracy and efficiency of coating surface defects, in the embodiments of the present invention, fluorescent powder is uniformly mixed with coating powder, and the mixed powder after mixing is cladded on the surface of the substrate to form a coating to be detected. On this basis, the actual fluorescence spectra corresponding to each detection point on the coating to be detected are used to reflect the cladding situation of the mixed powder at each detection point, thereby realizing the detection of the surface defects of the coating to be detected.

[0048] To make the objectives, technical solutions, and advantages of the present invention clearer, the following will be described through specific embodiments with reference to the accompanying drawings.

[0049] Figure 1 The following is a flowchart for implementing the coating defect detection method provided by the embodiments of the present invention, which is described in detail as follows:

[0050] Step 101: Uniformly mix fluorescent powder with coating powder, and cladd the mixed powder after mixing on the surface of the substrate to form a coating to be detected.

[0051] In the embodiments of the present invention, by uniformly mixing fluorescent powder with coating powder and cladding it on the surface of the substrate to form a coating, it can provide a basis for subsequent defect detection. And the fluorescent powder will not affect the function of the coating itself. Exemplarily, the fluorescent powder can be fluorescein isothiocyanate.

[0052] Here, the mass ratio of the fluorescent powder to the coating powder can be determined according to actual situations, and the embodiments of the present invention do not make specific limitations thereon. Exemplarily, the mass of the fluorescent powder can be 10% of the mass of the coating powder.

[0053] In some embodiments, when cladding the mixed powder on the surface of the substrate, the surface of the substrate can be preheated by microwave, and during the microwave heating process, the mixed powder after mixing is cladded on the surface of the substrate by using laser cladding technology to form a coating to be detected.

[0054] Among them, before microwave heating the surface of the substrate, ultrasonic cleaning can be performed on the surface of the substrate first to keep the surface of the substrate clean, oil-free and free of other pollutants, ensuring that the cladding coating can better adhere to the surface of the substrate.

[0055] In the embodiments of the present invention, a microwave heating device can be added to the surface of the substrate to perform microwave heating on the surface of the substrate. Microwave heating can effectively remove air, water stains, dirt, etc. on the surface of the substrate, avoiding the generation of pseudo-defects during the coating cladding process. Moreover, microwave heating can rapidly raise the temperature of the material as a whole, making it easier for the thin layer of the substrate and the cladding material (i.e., the mixed powder) to melt during the cladding process, reducing the thermal stress on the surface of the cladding layer (i.e., the coating) and the material.

[0056] In some embodiments, during the process of cladding the mixed powder after mixing onto the surface of the substrate using the laser cladding technology, powder feeding can be used for laser cladding. The powder feeding rate range of the mixed powder can be set to 0.2 - 0.5 g / min, the laser scanning rate range can be set to 6 - 8 mm / s, and the laser power range can be set to 1200 - 1500 W.

[0057] Among them, setting the powder feeding rate range of the mixed powder to 0.2 - 0.5 g / min can effectively ensure a stable supply of the mixed powder during the laser cladding process.

[0058] The embodiments of the present invention can perform double-layer cladding on the substrate, and the cladding thickness of each layer is 0.1 - 0.2 μm to ensure the coating performance.

[0059] After cladding is completed, using the microwave heating device, gradually cool the temperature of the substrate to room temperature to slowly cool the cladding layer, thereby avoiding the generation of thermal stress.

[0060] The embodiments of the present invention use the laser cladding technology with microwave heating synchronization to achieve coating cladding, which can ensure the quality of coating cladding to the greatest extent during the process, thereby minimizing the apparent defects of the coating as much as possible.

[0061] Step 102: Perform point-by-point detection on the coating to be measured to obtain the measured fluorescence spectrum corresponding to each detection point on the coating to be measured.

[0062] See Figure 2 , in the embodiments of the present invention, a coordinate system can be established on the surface of the coating, and laser is used to perform dot detection one by one in the coordinate system to obtain the measured fluorescence spectrum corresponding to each detection point.

[0063] In some embodiments, a thermal laser can be used to perform point-by-point detection on the coating to be measured.

[0064] Among them, the thermal laser can eliminate the pseudo-defects that can be volatilized at high temperature on the coating surface by heating, such as water stains, oil stains, and some organic substances.

[0065] Step 103: According to the measured fluorescence spectra corresponding to each detection point and the preset standard fluorescence spectra, determine whether each detection point is a defect point and the defect type of the defect point.

[0066] In the embodiments of the present invention, the defect types of the defect points are mainly divided into apparent quality defects and apparent impurity defects. Among them, the apparent quality defects mainly include: quality loss defects such as scratches, bubbles, cracks, and pinholes in the coating quality, and quality increase defects such as bulges, sags, and accumulations. The apparent impurity defects mainly include: defects brought by external substances such as impurities and dirt on the coating.

[0067] The measured fluorescence spectra corresponding to the detection points may include data such as the measured fluorescence emission wavelength and the measured fluorescence peak position. Among them, the measured fluorescence emission wavelength can reflect the quality of the fluorescent powder at the detection point, and thus reflect the coating quality at the detection point. The measured fluorescence peak position can reflect the coating physical properties at the detection point, and thus reflect whether there are impurities, dirt, etc. at the detection point.

[0068] In the embodiments of the present invention, by comparing the measured fluorescence spectra and the standard fluorescence spectra, it can be determined whether each detection point is a defect point, and further determine the defect type of the defect point.

[0069] It can be understood that different fluorescent powders are fixedly corresponding to different fluorescence spectra. On the basis of determining the fluorescent powder, the preset standard fluorescence spectra are also correspondingly determined. Exemplarily, when the fluorescent powder is fluorescein isothiocyanate, the fluorescence spectrum corresponding to fluorescein isothiocyanate can be directly used as the preset standard fluorescence spectrum. Among them, the fluorescence emission wavelength in the fluorescence spectrum corresponding to fluorescein isothiocyanate is 520 - 530 nm.

[0070] Or, to avoid theoretical errors, the laser detection can also be performed on the defect-free coating in advance, so as to obtain the fluorescence spectrum corresponding to the defect-free coating, and determine this fluorescence spectrum as the preset standard fluorescence spectrum.

[0071] Step 104: If the defect type is an apparent quality defect, determine the coating quality loss value corresponding to the defect point, and repair the defect point based on the coating quality loss value.

[0072] According to the above, the embodiments of the present invention can determine the defect type of the defect point according to the measured fluorescence spectrum at the defect point. If the defect point is an apparent quality defect, the embodiments of the present invention can determine the coating quality loss value at the defect point according to the measured fluorescence spectrum, and repair the defect point according to the coating quality loss value.

[0073] It is understandable that when the defect points are quality - missing defects such as scratches, bubbles, cracks, pinholes, etc. in the coating quality, the coating quality - missing value is greater than 0. On the contrary, when the defect points are quality - increasing defects such as bulges, sags, accumulations, etc., the coating quality - missing value is less than 0.

[0074] Among them, for the apparent impurity defects at the defect points, the impurities, dirt, etc. at the defect points can be removed by manual cleaning to repair the apparent impurity defects.

[0075] In some embodiments, after repairing each defect point, the repaired coating to be tested can be detected point - by - point again to obtain the measured fluorescence spectrum corresponding to each detection point, and then jump to execute the step of judging whether each detection point is a defect point according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum. It is determined that the repair is completed until all detection points on the coating to be tested are normal points.

[0076] Compared with the prior art, in the embodiment of the present invention, the fluorescent powder is uniformly mixed with the coating powder and cladded on the surface of the substrate to form the coating to be tested, so that the coating coverage at each detection point on the coating to be tested can be reflected by the fluorescence spectrum corresponding to each detection point, as well as the corresponding defect type, thereby realizing rapid and accurate coating defect detection. Moreover, in the embodiment of the present invention, on the basis of determining that the defect type is an apparent quality defect, the coating quality - missing value can be further determined, and the defect points can be repaired according to the coating quality - missing value, so as to accurately repair the defect points on the coating to be tested in a targeted manner.

[0077] According to the above, the fluorescence emission wavelength of the fluorescence spectrum can reflect the quality of the fluorescent powder, and the mass ratio between the fluorescent powder and the coating powder is a fixed value. Therefore, in the embodiment of the present invention, the fluorescence emission wavelength is used to reflect the coating quality at the detection point, and then whether there is an apparent quality defect at the detection point is detected. The fluorescence peak position can reflect the coating physical properties at the detection point, and then whether there are impurities, dirt, etc. at the detection point. Therefore, in the embodiment of the present invention, the fluorescence peak position can be used to detect whether there is an apparent impurity defect at the detection point.

[0078] In some embodiments, when judging whether each detection point is a defect point and the defect type of the defect point, the measured fluorescence emission wavelength in the measured fluorescence spectrum and the standard fluorescence emission wavelength in the standard fluorescence spectrum, and the measured fluorescence peak position in the measured fluorescence spectrum and the standard fluorescence peak position in the standard fluorescence spectrum can be respectively detected according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum.

[0079] Among them, if the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, it is determined that the detection point is a defective point, and the defect type of the defective point is an apparent quality defect; if the position of the measured fluorescence peak is inconsistent with the standard fluorescence peak position, it is determined that the detection point is a defective point, and the defect type of the defective point is an apparent impurity defect; if the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength and the position of the measured fluorescence peak is consistent with the standard fluorescence peak position, it is determined that the detection point is a normal point.

[0080] Here, the fact that the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength can be understood as that the difference between the measured fluorescence emission wavelength and the standard fluorescence emission wavelength is within a preset error range.

[0081] In another embodiment, considering that the fluorescence emission wavelength corresponding to the same coating quality is not a fixed parameter but within a numerical range, the embodiment of the present invention can also pre-obtain the fluorescence emission wavelengths in the fluorescence spectra corresponding to multiple defect-free coatings, and determine the initial fluorescence emission wavelength range according to the multiple fluorescence emission wavelengths. At the same time, in combination with the preset allowable range of coating quality error, on the basis of the initial fluorescence emission wavelength range, the standard fluorescence emission wavelength range is determined. Among them, if the measured fluorescence emission wavelength is within the standard fluorescence emission wavelength range, it is determined that there is no apparent quality defect at the detection point; if the measured fluorescence emission wavelength is not within the standard fluorescence emission wavelength range, it is determined that there is an apparent quality defect at the detection point.

[0082] Specifically, the embodiment of the present invention can determine the initial fluorescence emission wavelength range according to the maximum and minimum values of the fluorescence emission wavelengths in the fluorescence spectra corresponding to multiple defect-free coatings. On this basis, in combination with the fluorescence emission wavelength range corresponding to the preset quality error range, the initial fluorescence emission wavelength range is broadened to the standard fluorescence emission wavelength range.

[0083] If the defect type is an apparent quality defect, the embodiment of the present invention can also determine the coating quality missing value corresponding to the defective point according to the measured fluorescence spectrum at the defective point, and then perform defect repair according to the coating quality missing value.

[0084] Among them, when determining the coating quality missing value, the mapping relationship between the fluorescence emission wavelength and the coating quality can be obtained first; then, based on the standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship, the standard coating quality is determined; based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship, the measured coating quality corresponding to the defective point is determined; finally, according to the difference between the standard coating quality and the measured coating quality, the coating quality missing value corresponding to the defective point is determined.

[0085] In the embodiments of the present invention, the fluorescence emission wavelengths in the measured fluorescence spectra at normal points with different coating thicknesses can be obtained in advance. Among them, the coating quality can be determined according to the coating thickness, so as to obtain the mapping relationship between the fluorescence emission wavelength and the coating quality. Referring to Table 1, taking fluorescein isothiocyanate as an example, Table 1 exemplarily shows the mapping relationship between the fluorescence emission wavelength, the coating thickness, and the coating quality.

[0086] Table 1

[0087]

[0088] According to the corresponding relationship between the fluorescence emission wavelength and the coating quality, the standard coating quality and the measured coating quality can be determined respectively. In the embodiments of the present invention, the difference between the standard coating quality and the measured coating quality is determined as the coating quality missing value. Here, Table 1 is only an example, used to illustrate that there is a mapping relationship between the fluorescence emission wavelength and the coating quality, rather than a specific limitation on the mapping relationship. Users can measure and determine the specific numerical mapping relationship between the fluorescence emission wavelength and the coating quality according to the actual situation.

[0089] It should be noted that, based on the preset allowable range of quality error and the characteristics of the fluorescence emission wavelength, the embodiments of the present invention broaden the standard fluorescence emission wavelength to a standard fluorescence emission wavelength range, for example, 100 - 101 nm.

[0090] In some embodiments, when repairing the defective points based on the coating quality missing value, if the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder feeding quality; laser cladding is performed on the defective points, and mixed powder is transported to the defective points in real time during the laser cladding process until the mass of the transported mixed powder reaches the powder feeding quality.

[0091] Here, if the coating quality missing value is greater than 0, it is determined that the defective point is a quality missing defect. At this time, the powder feeding quality can be determined according to the coating quality missing value, and powder feeding laser cladding synchronized with microwave heating is performed on the defective points again according to the powder feeding quality, so as to achieve targeted repair of the defective points.

[0092] If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removing quality; laser cladding is performed on the defective points, and the mass of the removed powder during the laser cladding process is collected in real time until the mass of the removed powder reaches the powder removing quality.

[0093] Here, if the coating quality missing value is less than 0, it is determined that the defective point is a quality increasing defect. At this time, the powder removing quality can be determined according to the coating quality missing value, and laser cladding is performed on the defective points again according to the powder removing quality to remove the excess powder, so as to achieve targeted repair of the defective points.

[0094] It should be understood that the magnitudes of the sequence numbers of the steps in the above embodiments do not imply the order of execution. The order of execution of each process should be determined according to its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present invention.

[0095] The following is an apparatus embodiment of the present invention. For details not described in detail, reference may be made to the corresponding method embodiments above.

[0096] Figure 3 The structural schematic diagram of the coating defect detection apparatus provided by the embodiments of the present invention is shown. For the convenience of description, only the parts related to the embodiments of the present invention are shown and are described in detail as follows:

[0097] As Figure 3 shown, the coating defect detection apparatus 3 includes: a cladding module 31, a detection module 32, and a repair module 33.

[0098] The cladding module 31 is used to uniformly mix fluorescent powder in the coating powder and clad the mixed powder on the surface of the substrate to form a coating to be detected;

[0099] The detection module 32 is used for:

[0100] Performing point-by-point detection on the coating to be detected to obtain the measured fluorescence spectrum corresponding to each detection point on the coating to be detected;

[0101] Judging whether each detection point is a defect point and the defect type of the defect point according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum;

[0102] The repair module 33 is used to determine the coating quality missing value corresponding to the defect point if the defect type is an apparent quality defect, and repair the defect point based on the coating quality missing value.

[0103] Optionally, the detection module 32 is specifically used for:

[0104] Detecting whether the measured fluorescence emission wavelength in the measured fluorescence spectrum is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum, respectively, according to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum;

[0105] If the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, it is determined that the detection point is a defect point, and the defect type of the defect point is an apparent quality defect;

[0106] If the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent impurity defect;

[0107] If the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, then the detection point is determined to be a normal point.

[0108] Optionally, the repair module 33 is specifically used for:

[0109] If the defect type is an apparent quality defect, obtaining a mapping relationship between the fluorescence emission wavelength and the coating quality;

[0110] Determining a standard coating quality based on a standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship;

[0111] Determining the measured coating quality corresponding to the defect point based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship;

[0112] According to the difference between the standard coating quality and the measured coating quality, the coating quality missing value corresponding to the defective point is determined.

[0113] Optionally, the repair module 33 is specifically used for:

[0114] If the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder feeding quality;

[0115] Laser cladding is performed on the defective point, and mixed powder is delivered to the defective point in real time during the laser cladding process until the mass of the delivered mixed powder reaches the powder delivery mass.

[0116] Optionally, the repair module 33 is specifically used for:

[0117] If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removal quality;

[0118] Laser cladding is performed on the defective points, and the mass of powder removed during the laser cladding process is collected in real time until the mass of powder removed reaches the powder removal mass.

[0119] Optionally, the cladding module 31 is specifically used for:

[0120] The surface of the substrate is heated by microwaves, and during the microwave heating process, the mixed powder is clad on the surface of the substrate by using laser cladding technology to form the coating to be tested.

[0121] Optionally, during the process of cladding the mixed powder on the surface of the substrate by using laser cladding technology, the powder feeding rate of the mixed powder ranges from 0.2 to 0.5 g / min, the laser scanning rate ranges from 6 to 8 mm / s, and the laser power ranges from 1200 to 1500 W.

[0122] Optionally, the detection module 32 is specifically configured to:

[0123] Detect the coating to be measured point by point by using a thermal laser.

[0124] The embodiment of the present device can be used to implement the above method embodiment, and its technical principle and implementation effect are the same as those of the above method embodiment, which will not be elaborated here.

[0125] Figure 4 is a schematic diagram of an electronic device provided by an embodiment of the present invention. As Figure 4 shown, the electronic device 4 of this embodiment includes: a processor 40, a memory 41, and a computer program 42 stored in the memory 41 and executable on the processor 40. When the processor 40 executes the computer program 42, the steps in the above-mentioned method embodiments for detecting coating defects are implemented, such as Figure 1 the steps 101 to 104 shown. Alternatively, when the processor 40 executes the computer program 42, the functions of each module / unit in the above device embodiments are implemented, such as Figure 3 the functions of the modules 31 to 33 shown.

[0126] Exemplarily, the computer program 42 can be divided into one or more modules / units. The one or more modules / units are stored in the memory 41 and executed by the processor 40 to complete the present invention. The one or more modules / units can be a series of computer program instruction segments capable of performing specific functions, and these instruction segments are used to describe the execution process of the computer program 42 in the electronic device 4. For example, the computer program 42 can be divided into Figure 3 the modules 31 to 33 shown.

[0127] The electronic device 4 can be a computing device such as a desktop computer, a notebook, a palm computer, and a cloud server. The electronic device 4 may include, but is not limited to, a processor 40 and a memory 41. Those skilled in the art can understand that Figure 4 this is only an example of the electronic device 4 and does not constitute a limitation on the electronic device 4. It may include more or fewer components than shown in the figure, or combine some components, or different components. For example, the electronic device may further include input / output devices, network access devices, a bus, etc.

[0128] The so-called processor 40 may be a Central Processing Unit (CPU), or may also be other general-purpose processors, Digital Signal Processors (DSPs), Application Specific Integrated Circuits (ASICs), Field-Programmable Gate Arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0129] The memory 41 may be an internal storage unit of the electronic device 4, such as the hard disk or memory of the electronic device 4. The memory 41 may also be an external storage device of the electronic device 4, such as a plug-in hard disk, Smart Media Card (SMC), Secure Digital (SD) card, Flash Card, etc. equipped on the electronic device 4. Further, the memory 41 may also include both the internal storage unit and the external storage device of the electronic device 4. The memory 41 is used to store the computer program and other programs and data required by the electronic device. The memory 41 may also be used to temporarily store data that has been output or is to be output.

[0130] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, only the above division of each functional unit and module is used as an example. In actual applications, the above functions can be allocated to different functional units and modules as needed, that is, the internal structure of the device can be divided into different functional units or modules to complete all or part of the functions described above. Each functional unit and module in the embodiments can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of each functional unit and module are only for the convenience of mutual distinction and do not limit the protection scope of this application. The specific working processes of the units and modules in the above system can refer to the corresponding processes in the foregoing method embodiments and will not be elaborated here.

[0131] In the above embodiments, the descriptions of the various embodiments have their own emphases. For parts not detailed or recorded in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0132] Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware or a combination of computer software and electronic hardware. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. A professional technician can use different methods for each specific application to implement the described functions, but such implementation should not be considered to exceed the scope of the present invention.

[0133] In the embodiments provided by the present invention, it should be understood that the disclosed device / electronic device and method can be implemented in other ways. For example, the device / electronic device embodiments described above are merely illustrative. For example, the division of the modules or units is only a logical function division. In actual implementation, there may be other division methods. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection between each other can be through some interfaces. The indirect coupling or communication connection of the device or unit can be in an electrical, mechanical or other form.

[0134] The units described as separate components may or may not be physically separated. The components displayed as units may or may not be physical units, that is, they can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0135] In addition, the functional units in each embodiment of the present invention can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above integrated units can be implemented in the form of hardware or in the form of software functional units.

[0136] When the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, to implement all or part of the processes in the above-described embodiment methods of the present invention, it can also be completed by a computer program instructing relevant hardware. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, the steps of the above-described various coating defect detection method embodiments can be implemented. Among them, the computer program includes computer program code, and the computer program code can be in the form of source code, object code, executable file, or some intermediate form, etc. The computer-readable medium can include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electrical carrier signal, telecommunication signal, and software distribution medium, etc. The above-described embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present invention and should all be included in the protection scope of the present invention.

Claims

1. A coating defect detection method, characterized in that: include: The fluorescent powder is uniformly mixed with the coating powder, and the mixed powder is melt-coated on the surface of the substrate to form a coating to be tested; Probing the coating to be tested point by point to obtain a measured fluorescence spectrum corresponding to each detection point on the coating to be tested; According to the measured fluorescence spectrum corresponding to each detection point and the preset standard fluorescence spectrum, respectively detecting whether the measured fluorescence emission wavelength in the measured fluorescence spectrum is consistent with the standard fluorescence emission wavelength in the standard fluorescence spectrum, and whether the measured fluorescence peak position in the measured fluorescence spectrum is consistent with the standard fluorescence peak position in the standard fluorescence spectrum; If the measured fluorescence emission wavelength is inconsistent with the standard fluorescence emission wavelength, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent quality defect; If the measured fluorescence peak position is inconsistent with the standard fluorescence peak position, the detection point is determined to be a defect point, and the defect type of the defect point is an apparent impurity defect; If the measured fluorescence emission wavelength is consistent with the standard fluorescence emission wavelength, and the measured fluorescence peak position is consistent with the standard fluorescence peak position, then the detection point is determined to be a normal point; If the defect type is an apparent quality defect, the coating quality missing value corresponding to the defect point is determined, and the defect point is repaired based on the coating quality missing value.

2. The coating defect detection method according to claim 1, characterized in that: If the defect type is an apparent quality defect, determining the coating quality missing value corresponding to the defect point includes: If the defect type is an apparent quality defect, obtaining a mapping relationship between the fluorescence emission wavelength and the coating quality; Determining a standard coating quality based on a standard fluorescence emission wavelength in the standard fluorescence spectrum and the mapping relationship; Determining the measured coating quality corresponding to the defect point based on the measured fluorescence emission wavelength in the measured fluorescence spectrum and the mapping relationship; According to the difference between the standard coating quality and the measured coating quality, the coating quality missing value corresponding to the defective point is determined.

3. The coating defect detection method according to claim 2, characterized in that: The repairing of the defective point based on the coating quality missing value comprises: If the coating quality missing value is greater than 0, the coating quality missing value is determined as the powder feeding quality; Laser cladding is performed on the defective point, and mixed powder is delivered to the defective point in real time during the laser cladding process until the mass of the delivered mixed powder reaches the powder delivery mass.

4. The coating defect detection method according to claim 2, characterized in that: The repairing of the defective point based on the coating quality missing value comprises: If the coating quality missing value is less than 0, the absolute value of the coating quality missing value is determined as the powder removal quality; Laser cladding is performed on the defective points, and the mass of powder removed during the laser cladding process is collected in real time until the mass of powder removed reaches the powder removal mass.

5. The coating defect detection method according to claim 1, characterized in that: The mixed powder is melt-coated on the surface of the substrate to form a coating to be tested, comprising: The surface of the substrate is heated by microwaves, and during the microwave heating process, the mixed powder is clad on the surface of the substrate by using laser cladding technology to form the coating to be tested.

6. The coating defect detection method according to claim 5, characterized in that: In the process of cladding the mixed powder onto the substrate surface using laser cladding technology, the powder feeding rate of the mixed powder ranges from 0.2 to 0.5 g / min, the laser scanning rate ranges from 6 to 8 mm / s, and the laser power ranges from 1200 to 1500 W.

7. The coating defect detection method according to claim 1, characterized in that: The point-by-point detection of the coating to be tested comprises: The coating to be tested is detected point by point using a thermal laser.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the coating defect detection method as described in any one of claims 1 to 7 are implemented.

9. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the steps of the coating defect detection method as described in any one of claims 1 to 7 are implemented.

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