A general microwave switch testing device and testing method
By designing a universal microwave switch testing device, which utilizes multiple lines on the test PCB board and test base to connect the microwave switch pins, and combines fixtures and crimping components, the problem of non-universality of existing testing devices is solved, and efficient and accurate microwave switch testing is achieved.
Patent Information
- Application Number
- CN202411704655.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-26
- Publication Date
- 2025-12-02
- Estimated Expiration
- 2044-11-26
AI Technical Summary
Existing microwave switch testing equipment is not universally applicable, which increases testing complexity and reduces testing efficiency.
A universal microwave switch testing device was designed, including a test PCB board and a test base. The PCB board has multiple lines connecting to the microwave switch pins. Combined with test fixtures and crimping components, it can adapt to the testing of microwave switches with different numbers of pins.
It expands the applicability of microwave switch testing devices, improves testing efficiency and accuracy, simplifies the installation process, and enhances portability and electrical connection stability.
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Figure CN119667216B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of microwave switch testing equipment technology, and in particular to a general microwave switch testing equipment and testing method. Background Technology
[0002] Radio frequency (RF) microwave switches are switching devices used to control radio frequency (RF) and microwave signals. They are widely used in wireless communication systems, radar, wireless sensor networks, and other fields to control signal transmission, routing, and modulation. Microwave switch testing equipment connects to external testing devices and power supplies to jointly test the performance of microwave switches. Microwave switches have different pin counts, and the test items vary accordingly. For each type of microwave switch, a matching testing device is required, increasing the complexity of the testing and thus reducing efficiency. Summary of the Invention
[0003] In view of this, the purpose of this application is to propose a universal microwave switch testing device and testing method to solve the problem that the current microwave switch testing devices are not universal, which increases the difficulty of testing.
[0004] To achieve the above objectives, this application provides a universal microwave switch testing device, comprising:
[0005] A test PCB board is provided with multiple lines, and a microwave switch is provided on the test PCB board. At least some of the lines are connected to the microwave switch pins to test microwave switches with different numbers of pins.
[0006] Test base, used to mount the test PCB board.
[0007] Optionally, a test fixture is also included, which includes a mounting base and a crimping assembly. Both the test base and the crimping assembly are connected to the mounting base, and the crimping assembly is used to fix the microwave switch.
[0008] Optionally, the crimping assembly includes a vertical rod, a horizontal rod, a driving component, and a pressing block. The vertical rod is fixedly connected to the mounting base, the horizontal rod is fixedly connected to the top of the vertical rod, the driving component is fixedly connected to the horizontal rod and its output shaft passes through the horizontal rod, the pressing block is connected to the output shaft of the driving component, and the pressing block abuts against the microwave switch.
[0009] Optionally, the test base has a reserved slot at the bottom and a plurality of mounting slots communicating with the reserved slot on the side wall of the test base.
[0010] Optionally, the bottom of the reserved groove is provided with a first mounting plate, and the first mounting plate is provided with a connection hole so that the first mounting plate can be connected to the mounting base.
[0011] Optionally, the circuit includes radio frequency circuits, control circuits, and power supply circuits.
[0012] Optionally, the test base has multiple SMA connectors on its sidewall for connecting the RF circuitry on the PCB board to external test equipment.
[0013] Optionally, the test PCB board is soldered with multiple terminals, and the control circuit and the power supply circuit are connected to an external power supply device through the terminals.
[0014] Based on the same inventive concept, this disclosure also provides a general microwave switch testing method, applied to the above-mentioned testing device, comprising the following steps:
[0015] The test PCB board is mounted on the test base;
[0016] The microwave switch is placed on the test PCB board, and the target pin of the microwave switch is connected to the target line on the PCB board according to the test requirements.
[0017] The target circuit is connected to external testing equipment and external power supply equipment to test the performance of the microwave switch.
[0018] As can be seen from the above, this application provides a universal microwave switch testing device, including a PCB board and a test base. The test base is used to mount the test PCB board, which has multiple lines. At least some of the lines are connected to microwave switch pins to test microwave switches with different numbers of pins. That is, the test PCB board has a rich array of lines to meet the testing needs of various microwave switches, thereby expanding the applicability of the microwave switch testing device and improving testing efficiency. Attached Figure Description
[0019] To more clearly illustrate the technical solutions in this application or related technologies, the drawings used in the description of the embodiments or related technologies will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.
[0020] Figure 1 This is a schematic diagram of the structure of the test PCB board shown in an embodiment of this application;
[0021] Figure 2 This is a schematic diagram of the structure of the test base shown in an embodiment of this application;
[0022] Figure 3 This is a schematic diagram of the structure of the test fixture shown in the embodiment of this application;
[0023] Figure 4This is a schematic diagram of the reserved slot structure shown in an embodiment of this application;
[0024] Figure 5 This is a schematic diagram of the hardware structure of an electronic device according to an embodiment of this application.
[0025] Reference numerals: 1. Test PCB board; 11. Circuit; 2. Test base; 21. Reserved slot; 22. Mounting slot; 3. Test fixture; 31. Mounting base; 32. Crimping assembly; 321. Vertical bar; 322. Horizontal bar; 323. Driving component; 324. Pressing block; 4. First mounting plate; 41. Connecting hole; 5. Second mounting plate; 6. Calibration component. Detailed Implementation
[0026] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with specific embodiments and the accompanying drawings.
[0027] It should be noted that, unless otherwise defined, the technical or scientific terms used in the embodiments of this application should have the ordinary meaning understood by one of ordinary skill in the art to which this application pertains. The terms "first," "second," and similar terms used in the embodiments of this application do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as "comprising" or "including" mean that the element or object preceding the word encompasses the elements or objects listed after the word and their equivalents, without excluding other elements or objects. Terms such as "connected" or "linked" are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as "upper," "lower," "left," and "right" are only used to indicate relative positional relationships; when the absolute position of the described object changes, the relative positional relationship may also change accordingly.
[0028] As mentioned in the background, an RF microwave switch is a switching device used to control RF and microwave signals. It is widely used in wireless communication systems, radar, wireless sensor networks, and other fields to control signal transmission, routing, and modulation.
[0029] The performance of radio frequency (RF) microwave switches is crucial for the normal operation of wireless communication systems, radar, wireless sensor networks, and other fields. Therefore, the testing of microwave switches is particularly important. Microwave switch testing equipment connects to external testing devices and power supplies to jointly test the performance of microwave switches. However, microwave switches have different pin counts and different test items. Each type of microwave switch requires a matching testing device, increasing the complexity of the testing and thus reducing efficiency.
[0030] The following is in conjunction with the appendix Figure 1-5The embodiments of this application will be described in detail below.
[0031] like Figure 1 and Figure 2 As shown, a general-purpose microwave switch testing device includes:
[0032] Test PCB 1, on which multiple lines 11 are provided, and a microwave switch is provided on the test PCB 1. At least a portion of the lines 11 are connected to the microwave switch pins to test microwave switches with different numbers of pins.
[0033] Test base 2 is used to mount test PCB board 1.
[0034] In addition, the line 11 includes radio frequency lines, control lines and power supply lines.
[0035] Specifically, the test PCB 1 is designed as a square, with the microwave switch located at its center. Line 11 extends from the microwave switch pin (at the center of the test PCB 1) to the edge of the test PCB 1 for connection to external test equipment and power supplies. Multiple RF lines are provided, each of equal length, extending relatively evenly to different edges of the test PCB 1 to ensure sufficient space between them and avoid RF signal crosstalk. Control and power supply lines are centrally located, as far away as possible from the RF lines to prevent crosstalk between control and RF signals, which could affect normal testing.
[0036] In this embodiment, according to the test requirements, the pins on the microwave switch are connected to the corresponding lines 11 on the test PCB board 1. The lines 11 are connected to external test equipment and external power supply equipment to complete the test of the microwave switch. The test PCB board 1 has multiple lines 11, and at least some of the lines 11 are connected to the microwave switch pins. That is, the lines 11 on the test PCB board 1 are abundant and can meet the test requirements of various microwave switches, thereby expanding the applicability of the microwave switch test device and improving the test efficiency.
[0037] like Figure 3 As shown, in some embodiments, a general microwave switch testing device further includes a test fixture 3, which includes a mounting base 31 and a crimping assembly 32. The test base 2 and the crimping assembly 32 are both connected to the mounting base 31, and the crimping assembly 32 is used to fix the microwave switch.
[0038] In this embodiment, the mounting base 31 provides a mounting position for the microwave switch and the crimping assembly 32. The crimping assembly 32 firmly presses the microwave switch onto the test PCB board 1, which not only avoids test interruption caused by test switch misalignment, but also ensures that the microwave switch and the test PCB board 1 are tightly fitted to maintain good electrical connectivity.
[0039] In some embodiments, the crimping assembly 32 includes a vertical rod 321, a horizontal rod 322, a driving member 323, and a pressing block 324. The vertical rod 321 is fixedly connected to the mounting base 31, the horizontal rod 322 is fixedly connected to the top of the vertical rod 321, the driving member 323 is fixedly connected to the horizontal rod 322 and its output shaft passes through the horizontal rod 322, the pressing block 324 is connected to the output shaft of the driving member 323, and the pressing block 324 abuts against the microwave switch.
[0040] Specifically, the pressure block 324 is detachably connected to the output shaft of the drive component 323, such as by threaded connection or snap-fit, allowing for easy replacement of the pressure block 324 to match the size of the microwave switch. This ensures more uniform pressure on the microwave switch, thereby improving test accuracy. A pressure sensor can be installed on the pressure block 324 to facilitate real-time monitoring of pressure changes during the pressing process, preventing damage to the test switch due to excessive pressure. The control system controls the operation of the drive component 323 and precisely controls the downward movement distance of the pressure block 324, ensuring that the pressure block 324 precisely presses down on the microwave switch under test. This ensures that the pressure block 324 can secure the microwave switch while avoiding unnecessary damage.
[0041] In addition, the drive component 323 is a cylinder assembly or a hydraulic cylinder assembly. Cylinder assemblies and hydraulic cylinder assemblies are easy to control and operate smoothly, making them suitable for microwave switch testing devices.
[0042] In this embodiment, the vertical rod 321 provides an installation position for the horizontal rod 322 and positions the horizontal rod 322 above the test switch. The horizontal rod 322 provides an installation position for the driving component 323. The driving component 323 drives the pressure block 324 to press against the test switch. The pressing efficiency is high and the pressing speed and pressure are controllable, which improves the efficiency and safety of the test.
[0043] like Figure 2 and Figure 4 As shown, in some embodiments, the test base 2 has a reserved slot 21 at the bottom and a plurality of mounting slots 22 communicating with the reserved slot 21 on the side wall of the test base 2.
[0044] In this embodiment, the reserved slot 21 provides additional space for installing and fixing other components or equipment, and the opening of the reserved slot 21 can reduce the overall weight of the mounting base 31, thereby improving the portability of the testing device. The side wall of the mounting base 31 has multiple mounting slots 22 that communicate with the reserved slot 21, which facilitates the passing of bolts and other components through the mounting slots 22 to fix other accessories and connectors without the need for complex positioning and drilling operations, simplifying the installation process and improving installation efficiency.
[0045] In some embodiments, the bottom of the reserved slot 21 is provided with a first mounting plate 4, and the first mounting plate 4 is provided with a connection hole 41 so that the first mounting plate 4 can be connected to the mounting base 31.
[0046] In this embodiment, a threaded bolt can be connected to the connecting hole 41. The bolt connects the mounting base 31 and the first mounting plate 4, thereby fixing the test base 2 on the mounting base 31 and improving the stability of the test base 2.
[0047] like Figure 1 and Figure 4 As shown, in some embodiments, the test base 2 has multiple SMA connectors connected to its sidewall for connecting the radio frequency lines on the test PCB board 1 to external test equipment.
[0048] In addition, multiple terminals are soldered on the test PCB board 1, and the control circuit and the power supply circuit are connected to an external power supply device through the terminals.
[0049] Specifically, the SMA connector is connected to the second mounting plate 5, which is bolted to the side wall of the test base 2.
[0050] For example, the RF lines on the test PCB board 1 can be set to seven, and the second mounting plate 5 and SMA connectors can also be set to seven accordingly, such as... Figure 1 As shown, the seven SMA connectors are named K1, K2, K3, K4, K5, K6, and K7 respectively. Each RF line is connected to one SMA connector. The PCB board is square, and every two RF lines form a group of RF lines. Each group of RF lines extends from the center of the test PCB board 1 to different edges of the test PCB board 1 and connects to the corresponding SMA connector. The remaining RF line extends from the center of the test PCB board 1 to the remaining edge of the test PCB board 1 and connects to the corresponding SMA connector. There is sufficient space between the above RF lines to effectively avoid RF signal crosstalk.
[0051] In addition, the test PCB board 1 has three power supply lines and two control lines, each power supply line and each control line is connected to a terminal block, such as... Figure 1As shown, the five terminals are named W1, W2, W3, W4, and W5 respectively. An additional terminal, named W6, is provided on the test PCB 1 for grounding protection of the test PCB 1. The three power supply lines and two control lines are arranged in a concentrated manner, extending from the center of the test PCB 1 to the edge of the test PCB 1 where there is only one radio frequency line. The layout of the above lines 11 is compact and reasonable, and can minimize crosstalk between the radio frequency lines and the control lines, thereby improving the accuracy of the test. In addition, the number of the above radio frequency lines, control lines and power supply lines can meet the test requirements of most test switches, improving the applicability of the test device.
[0052] In this embodiment, the SMA connector, as a standard form of RF connector, has excellent electrical performance and mechanical stability. Connecting the RF lines on the test PCB 1 to the external test equipment through the SMA connector can ensure a stable and reliable connection and reduce signal loss. As an important component of electrical connection, the terminal block is soldered onto the PCB board to ensure a stable and reliable connection between the control lines and power supply lines and the external power supply equipment, avoiding circuit failures caused by loose terminal blocks.
[0053] Based on the same inventive concept, corresponding to any of the above embodiments, this application also provides a general microwave switch testing method, including the following steps:
[0054] S101, Test PCB board 1 is mounted on test base 2;
[0055] Specifically, the steps include: Preparation: Ensure the test base 2 is stable and flat, without damage or deformation. Check the test PCB board 1 for damage, short circuits, or open circuits, ensuring all components and lines 11 on the test PCB board 1 are undamaged or deformed; Installation: Place the test PCB board 1 on the test base 2 according to the design requirements, ensuring good contact between the test PCB board 1 and the test base 2, without looseness or misalignment. Use fixing devices (such as screws, clips, etc.) to fix the test PCB board 1 to the base to prevent it from moving or being damaged during testing; Inspection and debugging: After installation, check again whether the connection between the test PCB board 1 and the test base 2 is firm and reliable. Use a multimeter and other tools to check whether the power supply lines, control lines, and RF lines on the test PCB board 1 are conductive and normal, ensuring there are no short circuits or open circuits.
[0056] S102. The microwave switch is placed on the test PCB board 1. According to the test requirements, the target pin of the microwave switch is connected to the target line 11 of the PCB board.
[0057] Specifically, the bottom of the microwave switch is placed on the center of the test PCB board 1, and the target pin of the microwave switch is connected to the target line 11 of the PCB board. Then, the crimping assembly 32 is activated to crimp the PCB board and the microwave switch, so as to avoid test interruption caused by test switch misalignment, and at the same time ensure that the microwave switch and the test PCB board 1 are tightly attached to maintain good electrical connection.
[0058] S103 and target line 11 connect to external test equipment and external power supply equipment to test the performance of microwave switches.
[0059] Specifically, the RF lines connect to external test equipment, while the power supply and control lines connect to external power supply equipment. When testing the insertion loss, isolation, and return loss of a microwave switch, the external test equipment includes a vector network analyzer and a DC blocker, and the external power supply equipment is mainly a DC regulated power supply. When testing the 1dB compression point performance of a microwave switch, the external test equipment includes a spectrum analyzer, a DC blocker, and a signal source, and the external power supply equipment is mainly a DC regulated power supply.
[0060] In addition, to ensure the accuracy and precision of the test, a through-calibrator 6 was designed to match the test device. Before the formal test, the through-calibrator 6 is connected to the external test equipment to test the line loss data. The external test equipment will automatically use the line loss data generated by this calibrator 6 to calibrate the subsequent test data. This design can effectively improve the accuracy of the test and ensure the reliability of the test results.
[0061] The general microwave switch testing method in this embodiment is simple in process, highly efficient, and accurate.
[0062] In summary, the test PCB board 1 in this application has multiple lines 11, at least some of which are connected to microwave switch pins. The abundance of lines 11 on the test PCB board 1 can meet the testing requirements of various microwave switches, thereby expanding the applicability of the microwave switch testing device and improving testing efficiency.
[0063] In this application, the mounting base 31 provides a mounting position for the test device and the crimping assembly 32. The crimping assembly 32 firmly presses the microwave switch onto the test PCB board 1, which not only avoids test interruption caused by test switch misalignment, but also ensures that the microwave switch and the test PCB board 1 are tightly fitted to maintain good electrical connection.
[0064] In this application, the test base 2 has a reserved slot 21 and a mounting slot 22. The reserved slot 21 provides additional space for installing and fixing other components or equipment, and the reserved slot 21 reduces the overall weight of the mounting base 31, thereby improving the portability of the test device. The side wall of the mounting base 31 has multiple mounting slots 22 that communicate with the reserved slot 21, which facilitates the passage of bolts and other components through the mounting slots 2 to fix other accessories and connectors without the need for complex positioning and drilling operations, simplifying the installation process and improving installation efficiency.
[0065] It should be noted that the method in this embodiment can be executed by a single device, such as a computer or server. The method can also be applied in a distributed scenario, where multiple devices cooperate to complete the task. In such a distributed scenario, one of these devices may execute only one or more steps of the method in this embodiment, and the multiple devices will interact with each other to complete the method described.
[0066] It should be noted that the above description describes some embodiments of this application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in a different order than that shown in the above embodiments and still achieve the desired result. Furthermore, the processes depicted in the drawings do not necessarily require a specific or sequential order to achieve the desired result. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0067] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the program to implement the general microwave switch testing method described in any of the above embodiments.
[0068] Figure 5 This embodiment illustrates a more specific hardware structure of an electronic device. The device may include a processor 1010, a memory 1020, an input / output interface 1030, a communication interface 1040, and a bus 1050. The processor 1010, memory 1020, input / output interface 1030, and communication interface 1040 are interconnected internally via the bus 1050.
[0069] The processor 1010 can be implemented using a general-purpose CPU (Central Processing Unit), microprocessor, application-specific integrated circuit (ASIC), or one or more integrated circuits, and is used to execute relevant programs to implement the technical solutions provided in the embodiments of this specification.
[0070] The memory 1020 can be implemented in the form of ROM (Read Only Memory), RAM (Random Access Memory), static storage device, dynamic storage device, etc. The memory 1020 can store the operating system and other applications. When the technical solutions provided in the embodiments of this specification are implemented by software or firmware, the relevant program code is stored in the memory 1020 and is called and executed by the processor 1010.
[0071] The input / output interface 1030 is used to connect input / output modules to realize information input and output. Input / output modules can be configured as components within the device (not shown in the figure) or externally connected to the device to provide corresponding functions. Input devices may include keyboards, mice, touchscreens, microphones, various sensors, etc., while output devices may include displays, speakers, vibrators, indicator lights, etc.
[0072] The communication interface 1040 is used to connect a communication module (not shown in the figure) to enable communication between this device and other devices. The communication module can communicate via wired means (such as USB, Ethernet cable, etc.) or wireless means (such as mobile network, WIFI, Bluetooth, etc.).
[0073] Bus 1050 includes a pathway for transmitting information between various components of the device, such as processor 1010, memory 1020, input / output interface 1030, and communication interface 1040.
[0074] It should be noted that although the above-described device only shows the processor 1010, memory 1020, input / output interface 1030, communication interface 1040, and bus 1050, in specific implementations, the device may also include other components necessary for normal operation. Furthermore, those skilled in the art will understand that the above-described device may only include the components necessary for implementing the embodiments of this specification, and not necessarily all the components shown in the figures.
[0075] The electronic devices described above are used to implement the corresponding general microwave switch testing methods in any of the foregoing embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0076] Based on the same inventive concept, corresponding to the methods of any of the above embodiments, this application also provides a non-transitory computer-readable storage medium that stores computer instructions for causing the computer to execute a general microwave switch testing method as described in any of the above embodiments.
[0077] The computer-readable medium of this embodiment includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transfer medium that can be used to store information accessible by a computing device.
[0078] The computer instructions stored in the storage medium of the above embodiments are used to cause the computer to execute the general microwave switch testing method as described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0079] Based on the same concept, corresponding to any of the above embodiments, this application also provides a computer program product, including computer program instructions, which, when run on a computer, cause the computer to perform the method described in any of the above embodiments, and have the beneficial effects of the corresponding method embodiments, which will not be repeated here.
[0080] It should be noted that the embodiments of this application can also be further described in the following ways:
[0081] It is understood that before using the technical solutions of the various embodiments in this disclosure, users will be informed of the type, scope of use, and usage scenarios of the personal information involved in an appropriate manner, and user authorization will be obtained.
[0082] For example, upon receiving a user's active request, a prompt message is sent to the user to explicitly inform them that the requested operation will require the acquisition and use of the user's personal information. This allows the user to independently choose, based on the prompt message, whether to provide personal information to the software or hardware such as electronic devices, applications, servers, or storage media performing the operations of this disclosed technical solution.
[0083] As an optional but not limited implementation, in response to a user's active request, sending a prompt message to the user can be done via a pop-up window, where the prompt message can be presented in text format. Furthermore, the pop-up window can also include a selection control allowing the user to choose "agree" or "disagree" to provide personal information to the electronic device.
[0084] It is understood that the above notification and user authorization process are merely illustrative and do not constitute a limitation on the implementation of this disclosure. Other methods that comply with relevant laws and regulations may also be applied to the implementation of this disclosure.
[0085] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of this application is limited to these examples; under the concept of this application, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the embodiments of this application as described above, which are not provided in detail for the sake of brevity.
[0086] Additionally, to simplify the description and discussion, and to avoid obscuring the embodiments of this application, the well-known power / ground connections to integrated circuit (IC) chips and other components may or may not be shown in the provided drawings. Furthermore, the apparatus may be shown in block diagram form to avoid obscuring the embodiments of this application, and this also takes into account the fact that the details of the implementation of these block diagram apparatuses are highly dependent on the platform on which the embodiments of this application will be implemented (i.e., these details should be fully understood by those skilled in the art). While specific details (e.g., circuits) have been set forth to describe exemplary embodiments of this application, it will be apparent to those skilled in the art that the embodiments of this application can be implemented without these specific details or with variations thereof. Therefore, these descriptions should be considered illustrative rather than restrictive.
[0087] Although this application has been described in conjunction with specific embodiments thereof, many substitutions, modifications, and variations of these embodiments will be apparent to those skilled in the art from the foregoing description. For example, other memory architectures (e.g., dynamic RAM (DRAM)) may be used with the embodiments discussed.
[0088] The embodiments of this application are intended to cover all such substitutions, modifications, and variations that fall within the broad scope of the claims of this application. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the embodiments of this application should be included within the protection scope of this application.
Claims
1. A universal microwave switch testing device, characterized in that, include: Test PCB (1), the test PCB (1) is provided with multiple lines (11), the microwave switch is provided on the test PCB (1), at least part of the lines (11) are connected to the microwave switch pins, so as to test microwave switches with different numbers of pins; Test base (2) is used to mount the test PCB board (1); The line (11) includes radio frequency lines, control lines and power supply lines; The test base (2) has multiple SMA connectors on its side wall for connecting the RF circuits on the test PCB (1) and external test equipment. The test PCB board (1) has multiple terminals soldered on it, and the control line and the power supply line are connected to an external power supply device through the terminals. The test PCB (1) has multiple edges, and the radio frequency lines are arranged in multiple sets, all extending from the center of the test PCB (1) to different edges of the test PCB (1) to connect to the SMA connectors located on the corresponding edges. The control lines and the power supply lines are arranged in multiple lines, all extending from the center of the test PCB (1) to one edge of the test PCB (1) to connect to the corresponding terminals. The control lines and the power supply lines are arranged in a concentrated manner.
2. The universal microwave switch testing device according to claim 1, characterized in that, It also includes a test fixture (3), which includes a mounting base (31) and a crimping assembly (32). The test base (2) and the crimping assembly (32) are both connected to the mounting base (31), and the crimping assembly (32) is used to fix the microwave switch.
3. The universal microwave switch testing device according to claim 2, characterized in that, The crimping assembly (32) includes a vertical rod (321), a horizontal rod (322), a driving member (323), and a pressing block (324). The vertical rod (321) is fixedly connected to the mounting base (31). The horizontal rod (322) is fixedly connected to the top of the vertical rod (321). The driving member (323) is fixedly connected to the horizontal rod (322), and its output shaft passes through the horizontal rod (322). The pressing block (324) is connected to the output shaft of the driving member (323), and the pressing block (324) abuts against the microwave switch.
4. The universal microwave switch testing device according to claim 2, characterized in that, The test base (2) has a reserved slot (21) at the bottom and a plurality of mounting slots (22) communicating with the reserved slot (21) on the side wall.
5. A universal microwave switch testing device according to claim 4, characterized in that, The bottom of the reserved slot (21) is provided with a first mounting plate (4), and the first mounting plate (4) is provided with a connecting hole (41) so that the first mounting plate (4) can be connected to the mounting base (31).
6. A universal microwave switch testing method, applied to the testing apparatus according to any one of claims 1-5, comprising the following steps: The test PCB board (1) is mounted on the test base (2); The microwave switch is placed on the test PCB board (1). According to the test requirements, the target pin of the microwave switch is connected to the target line (11) of the PCB board. The target line (11) is connected to external test equipment and external power supply equipment to test the performance of microwave switches.
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