Material defect detection system and method

Abstract

The invention discloses a material defect detection system and method, and relates to the technical field of defect detection. The system comprises an irradiation light source device which comprises a visible light source and an ultraviolet light source which are both used for irradiating a material to be detected; the camera device is used for shooting the to-be-detected material to obtain a material image signal of the to-be-detected material; the control device is connected with the visible light source, the ultraviolet light source and the camera device and is used for controlling the visible light source and the ultraviolet light source to alternately irradiate the to-be-detected material in a stroboscopic manner and controlling the camera device to continuously shoot the to-be-detected material; and the signal processing device is connected with the camera device and is used for obtaining a material defect detection result of the to-be-detected material according to the material image signal.

Description

Technical Field

[0001] The present invention relates to the technical field of defect detection, and in particular to a material defect detection system and method. Background Art

[0002] Corn is rich in nutrients and reasonably priced. It has always been one of the staple foods of mankind. It is of great significance to identify defects in corn (such as aflatoxin identification).

[0003] Corn color sorters use the differences in corn optical properties to automatically sort out different-colored particles, that is, they separate different objects based on the differences in their reflection and transmittance to light of a specific wavelength, thereby identifying defective corn. However, the detection accuracy of the corn color sorting system in the related art needs to be improved. Summary of the invention

[0004] The present invention aims to solve one of the technical problems in the related art at least to a certain extent. To this end, the first object of the present invention is to provide a material defect detection system to improve detection accuracy.

[0005] The second objective of the present invention is to provide a material defect detection method.

[0006] To achieve the above-mentioned purpose, a first aspect of the present invention proposes a material defect detection system, which includes: an irradiation light source device, including a visible light source and an ultraviolet light source, wherein the visible light source and the ultraviolet light source are both used to irradiate the material to be detected; a camera device, used to photograph the material to be detected and obtain a material image signal of the material to be detected; a control device, connected to the visible light source, the ultraviolet light source and the camera device, and used to control the visible light source and the ultraviolet light source to alternately strobe the material to be detected, and at the same time control the camera device to continuously photograph the material to be detected; a signal processing device, connected to the camera device, and used to obtain a material defect detection result of the material to be detected according to the material image signal.

[0007] In addition, the material defect detection system according to the embodiment of the present invention may also have the following additional technical features:

[0008] In one embodiment of the present invention, the control device is specifically used to: generate a first pulse width modulated pulse drive signal and a second pulse width modulated pulse drive signal, so as to use the first pulse width modulated pulse drive signal to control the visible light source to flash, and use the second pulse width modulated pulse drive signal to control the ultraviolet light source to flash; and generate a synchronization signal according to the first pulse width modulated pulse drive signal and the second pulse width modulated pulse drive signal, so as to use the synchronization signal to control the camera device to shoot the material to be detected.

[0009] In one embodiment of the present invention, the material image signal includes a plurality of first image signals and a plurality of second image signals, the first image signal is an image signal captured when the visible light source irradiates the material to be detected, and the second image signal is an image signal captured when the ultraviolet light source irradiates the material to be detected, and the signal processing device is specifically used to: splice the image signals captured at the same position of the material to be detected in the plurality of first image signals, obtain a first signal set according to the splicing result, merge the image signals in the first signal set to obtain a third image signal, and splice the image signals captured at the same position of the material to be detected in the plurality of second image signals, obtain a second signal set according to the splicing result, merge the image signals in the second signal set to obtain a fourth image signal, and obtain a material defect detection result of the material to be detected according to the third image signal and the fourth image signal; wherein the first signal set includes an image signal obtained by splicing the first image signals and a first image signal that is not spliced, and the second signal set includes an image signal obtained by splicing the second image signals and a second image signal that is not spliced.

[0010] In one embodiment of the present invention, the signal processing device is further used to: align the third image signal and the fourth image signal to obtain a material defect detection result of the material to be detected based on the aligned third image signal and the fourth image signal.

[0011] In one embodiment of the present invention, the visible light source is specifically used to irradiate when the first pulse width modulated pulse driving signal is a high level signal, and stop irradiating when the first pulse width modulated pulse driving signal is a low level signal; the ultraviolet light source is specifically used to irradiate when the second pulse width modulated pulse driving signal is a high level signal, and stop irradiating when the second pulse width modulated pulse driving signal is a low level signal.

[0012] In one embodiment of the present invention, the camera device is specifically used to shoot when the synchronization signal is a high-level signal, and the control device is specifically used to: generate a high-level synchronization signal when the first pulse width modulated pulse drive signal or the second pulse width modulated pulse drive signal is a high-level signal; generate a low-level synchronization signal when the first pulse width modulated pulse drive signal and the second pulse width modulated pulse drive signal are both low-level signals.

[0013] In one embodiment of the present invention, the control device adopts a pulse current control board.

[0014] In one embodiment of the present invention, the visible light source is an RGB three-color light source or a monochromatic R, G, B light source or a white light source.

[0015] The second aspect of the present invention proposes a material defect detection method, which includes: using a visible light source and an ultraviolet light source to alternately flash the material to be detected, and continuously photographing the material to be detected to obtain a material image signal of the material to be detected; and obtaining a material defect detection result of the material to be detected based on the material image signal.

[0016] In addition, the material defect detection method according to the embodiment of the present invention may also have the following additional technical features:

[0017] In one embodiment of the present invention, the material image signal includes a plurality of first image signals and a plurality of second image signals, the first image signal is an image signal captured when the visible light source irradiates the material to be detected, and the second image signal is an image signal captured when the ultraviolet light source irradiates the material to be detected, and obtaining the material defect detection result of the material to be detected according to the material image signal includes: splicing the image signals captured at the same position of the material to be detected in the plurality of first image signals, and obtaining a first signal set according to the splicing result, and splicing the image signals captured at the same position of the material to be detected in the plurality of second image signals, and obtaining a second signal set according to the splicing result, wherein the first signal set includes image signals obtained by splicing the first image signals and the first image signals that are not spliced, and the second signal set includes image signals obtained by splicing the second image signals and the second image signals that are not spliced; merging the image signals in the first signal set to obtain a third image signal, and merging the image signals in the second signal set to obtain a fourth image signal; and obtaining the material defect detection result of the material to be detected according to the third image signal and the fourth image signal.

[0018] According to the material defect detection system and method of the embodiment of the present invention, it includes: an irradiation light source device, including a visible light source and an ultraviolet light source, both of which are used to irradiate the material to be detected; a camera device, used to shoot the material to be detected and obtain the material image signal of the material to be detected; a control device, connected to the visible light source, the ultraviolet light source and the camera device, used to control the visible light source and the ultraviolet light source to alternately strobe the material to be detected, and at the same time control the camera device to continuously shoot the material to be detected; a signal processing device, connected to the camera device, used to obtain the material defect detection result of the material to be detected according to the material image signal. Therefore, setting a visible light source for irradiation can avoid the afterglow effect caused by light sources such as white light, and improve the accuracy of material defect detection. Moreover, setting a visible light source and an ultraviolet light source for alternating irradiation can avoid the conflict between RGB light and ultraviolet light with large brightness differences, thereby further improving the detection accuracy.

[0019] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 is a structural block diagram of a material defect detection system according to an embodiment of the present invention;

[0021] Figure 2 is a structural schematic diagram of a material defect detection system according to an example of the present invention;

[0022] Figure 3 is a schematic structural diagram of an illuminating light source device according to an example of the present invention;

[0023] Figure 4 is a signal diagram of a material defect detection system according to an example of the present invention;

[0024] Figure 5 is a schematic diagram of signal splicing of an example of the present invention;

[0025] Figure 6 is a schematic diagram of signal merging of an example of the present invention;

[0026] Figure 7 is a schematic diagram of signal alignment of an example of the present invention;

[0027] Figure 8 is a flow chart of a material defect detection method according to an embodiment of the present invention;

[0028] Fig. 9 It is a structural block diagram of an electronic device according to an embodiment of the present invention. DETAILED DESCRIPTION

[0029] The material defect detection system and method of the embodiment of the present invention are described below with reference to the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements with the same or similar functions. The embodiments described with reference to the accompanying drawings are exemplary and should not be construed as limiting the present invention.

[0030] Figure 1 It is a structural block diagram of a material defect detection system according to an embodiment of the present invention.

[0031] like Figure 1 As shown, the material defect detection system 100 includes: an irradiation light source device 200, including a visible light source 700 and an ultraviolet light source 800, both of which are used to irradiate the material to be detected; a camera device 300, used to shoot the material to be detected and obtain a material image signal of the material to be detected; a control device 400, connected to the visible light source 700, the ultraviolet light source 800 and the camera device 300, used to control the visible light source 700 and the ultraviolet light source 800 to alternately strobe the material to be detected, and control the camera device 300 to continuously shoot the material to be detected; a signal processing device 600, connected to the camera device 300, used to obtain a material defect detection result of the material to be detected according to the material image signal. The above-mentioned visible light source 700 is an RGB three-color light source or a monochromatic R, G, B light source or a white light source.

[0032] Specifically, a material defect detection system 100 is provided, which includes an irradiation light source device 200 , a camera device 300 , a control device 400 and a signal processing device 600 . The irradiation light source device 200 includes a visible light source 700 and an ultraviolet light source 800 .

[0033] Since the visible light emitted by the visible light source 700 and the ultraviolet light emitted by the ultraviolet light source 800 have a large difference in brightness, if the two light sources are irradiated at the same time, the visible light and the ultraviolet light will conflict with each other, affecting the recognition effect of defects. Therefore, the control device 400 controls the visible light source 700 and the ultraviolet light source 800 to flash alternately, thereby avoiding the conflict between the visible light and the ultraviolet light, thereby avoiding the decrease in detection accuracy due to the large difference in brightness between the visible light and the ultraviolet light.

[0034] The above-mentioned alternating strobing means that under the control of the control device 400, both the visible light source 700 and the ultraviolet light source 800 strobe, and the strobing is performed alternately, that is, when the visible light source 700 is bright, the ultraviolet light source 800 is dark, and when the ultraviolet light source 800 is bright, the visible light source 700 is dark.

[0035] Furthermore, the control device 400 needs to continuously shoot the material to be inspected while controlling the visible light source 700 and the ultraviolet light source 800 to alternately strobe, so as to obtain the material image signal of the material to be inspected under the irradiation of the visible light source 700 / ultraviolet light source 800. Due to the continuous shooting, multiple image signals can be obtained.

[0036] After obtaining the material image signal, the signal processing device 600 can process the material image signal and determine whether the material to be inspected has material defects based on the material image signal. Through the material defect detection system 100, in addition to being able to effectively identify the appearance defects of corn, it can also combine the image data of visible light and ultraviolet light to detect surface defects that are not obvious or internal defects, such as detecting corn with aflatoxin.

[0037] The material may be corn or other possible materials. As long as the material can be used to identify defective materials based on differences in optical properties, the material defect detection system 100 of the embodiment of the present invention can be applied. The RGB three-color light source refers to a light source that simultaneously irradiates R light (red light), G light (green light), and B light (blue light). The monochromatic R, G, and B light sources refer to light sources that irradiate one of the R light, G light, and B light.

[0038] The following is an explanation with reference to a specific example.

[0039] In this example, see Figure 2 , including: viewpoint 1, channel 2, first three-line array CCD sensor 3, second three-line array CCD sensor 4, first lens 5, second lens 6, first background reflector 7, second background reflector 8, first background light source 9, second background light source 10, first lighting light source device 11, second lighting light source device 12, third lighting light source device 13, fourth lighting light source device 14, first sorting chamber glass 15, second sorting chamber glass 16.

[0040] The first illumination light source device 11, the second illumination light source device 12, the third illumination light source device 13, and the fourth illumination light source device 14 together constitute the visible light source 700 and the ultraviolet light source 800. The first three-line array CCD sensor 3, the second three-line array CCD sensor 4, the first lens 5, and the second lens 6 together constitute the camera device 300.

[0041] refer to Figure 3Taking the first illumination light source device 11 as an example, the first illumination light source device 11 includes a first ultraviolet light source 1101, a Fresnel lens 1102, an ultraviolet glass 1103, an adapter plate 1104, a first visible light source 1105, and a lamp holder 1106. Similarly, the second illumination light source device 12 includes a second ultraviolet light source and a second visible light source, the third illumination light source device 13 includes a third ultraviolet light source and a third visible light source, and the fourth illumination light source device 14 includes a fourth ultraviolet light source and a fourth visible light source. In other words, the four ultraviolet light sources in the first illumination light source device 11, the second illumination light source device 12, the third illumination light source device 13, and the fourth illumination light source device 14 together constitute the ultraviolet light source 800, and the four visible light sources in the first illumination light source device 11, the second illumination light source device 12, the third illumination light source device 13, and the fourth illumination light source device 14 together constitute the visible light source 700.

[0042] Viewpoint 1 is a virtual point. The above system is divided into front and rear views, which are symmetrically distributed with channel 2.

[0043] The components and functions of the first illumination light source device 11 are described as follows. Figure 2 .

[0044] This embodiment is mainly used for aflatoxin detection of corn. The first illumination light source device 11 is composed of a first ultraviolet light source 1101, a Fresnel lens 1102, an ultraviolet glass 1103, an adapter plate 1104, a first visible light source 1105 and a lamp holder 1106. All parts are installed in a fixed position of the lamp holder 1106. The first ultraviolet light source 1101 is a light source with a central wavelength of 365nm, and a light source of a special wavelength band can also be selected according to other mold toxins contained in the material. The first visible light source 1105 is an RGB three-color light source or a monochromatic R, G, B light source or a white light source. Moreover, since the phosphor attached to the surface of an ordinary white light LED has a strong afterglow effect, it cannot be applied to the field of high-frequency time-sharing stroboscopic. Therefore, it is preferred to use an RGB three-color light source or a monochromatic R, G, B light source and ultraviolet light for time-sharing stroboscopic. The Fresnel lens 1102 is used to focus the light emitted by the first ultraviolet light source 1101, so that the light intensity irradiated to the surface of the material is higher. The focusing method here can also be a cylindrical lens or the like. The UV glass 1103 is selected according to the wavelength band of the first UV light source 1101, and its purpose is to filter out the visible light component in the first UV light source 1101. The background light sources 9 and 10 are consistent with the first visible light source 1105, and are RGB three-color light sources or single-color R, G, B light sources or white light sources. Both the background light source and the visible light source 700 are connected to the lamp holder 1106 through a customs adapter. In addition to the role of installing various components, the lamp holder 1106 has a through hole at the bottom, and fans are connected at both ends to dissipate heat from the light source system to ensure the lighting stability of the first UV light source 1101.

[0045] In the selection of three-line array CCD sensors 3 and 4, it is necessary to pay attention to the following: because the fluorescent signal emitted by the material surface when irradiated by the ultraviolet light source 800 is very weak, it is difficult for ordinary CCD cameras to receive effective signals due to their low signal-to-noise ratio and low detection sensitivity. Therefore, it is necessary to use a high-sensitivity, high-signal-to-noise ratio CCD camera, such as a TDI camera.

[0046] In some embodiments of the present invention, the control device 400 is specifically used to: generate a first pulse width modulated pulse drive signal and a second pulse width modulated pulse drive signal, so as to use the first pulse width modulated pulse drive signal to control the visible light source 700 to flash, and use the second pulse width modulated pulse drive signal to control the ultraviolet light source 800 to flash; and generate a synchronization signal according to the first pulse width modulated pulse drive signal and the second pulse width modulated pulse drive signal, so as to use the synchronization signal to control the camera device 300 to shoot the material to be inspected.

[0047] Specifically, in order to realize that the control device 400 can control the visible light source 700 and the ultraviolet light source 800 to alternately flash, and can simultaneously control the camera device 300 to shoot, the control device 400 is configured to generate a first pulse width modulated pulse drive signal and a second pulse width modulated pulse drive signal. For example, it can be configured that when the pulse width modulated pulse drive signal is at a high level, the light source irradiates the material to be detected, and it can also be configured that when the pulse width modulated pulse drive signal is at a low level, the light source irradiates the material to be detected.

[0048] Moreover, a synchronization signal is generated according to the first pulse width modulated pulse driving signal and the second pulse width modulated pulse driving signal. For example, the synchronization signal can be set so that the obtained synchronization signal can control the camera device 300 to shoot when the pulse width modulated pulse driving signal is at a high level, or control the camera device 300 to shoot when the pulse width modulated pulse driving signal is at a low level.

[0049] For example, a visible light source 700 can be set up, which is specifically used to irradiate when the first pulse width modulated pulse driving signal is a high level signal, and stop irradiating when the first pulse width modulated pulse driving signal is a low level signal; an ultraviolet light source 800 is specifically used to irradiate when the second pulse width modulated pulse driving signal is a high level signal, and stop irradiating when the second pulse width modulated pulse driving signal is a low level signal.

[0050] Moreover, the camera device 300 can be configured to specifically take pictures when the synchronization signal is a high-level signal, and the control device 400 can be specifically configured to: generate a high-level synchronization signal when the first pulse width modulated pulse drive signal or the second pulse width modulated pulse drive signal is a high-level signal; and generate a low-level synchronization signal when the first pulse width modulated pulse drive signal and the second pulse width modulated pulse drive signal are both low-level signals.

[0051] Continue above Figure 2 and Figure 3 The example shown is used for illustration.

[0052] In this specific example, the control device 400 uses a pulse current control board. When the system is working, the interface board first generates a pulse synchronization trigger signal to the pulse current control board. After the pulse current control board analyzes the trigger signal, it demodulates the corresponding PWM pulse drive signal according to the requirements of the visible light source 700 and the ultraviolet light source 800, so that it alternately controls the stroboscopic light of the ultraviolet light source 800 and the visible light source 700 at a frequency of 11.3 kHz.

[0053] In order to ensure smooth switching between each driving signal and avoid light interference, the ultraviolet light source 800 and the visible light source 700 are both turned on with a delay and turned off in advance to perform edge compensation and increase the adjustable dead time to avoid the influence of the afterglow effect. The specific time of the delayed opening and early closing is adaptively set according to the needs. In some embodiments, the delayed opening time is set to 2μs, and the early closing time is set to 6μs. The purpose of delaying the opening by 2μs is to prevent the afterglow generated by the visible light source 700 from affecting the fluorescent signal generated on the surface of the material when the ultraviolet light source 800 is turned on when the visible light source 700 is turned off. The purpose of turning off the visible light source 700 by 6μs in advance is to prevent the fluorescent afterglow generated by the ultraviolet light source 800 irradiating the material from affecting the signal reflected by the visible light source 700 irradiating the material when the ultraviolet light source 800 is turned on when the ultraviolet light source 800 is turned off. For details, please refer to Figure 4 .exist Figure 4 In the embodiment, the trigger signal is the pulse synchronization trigger signal generated by the above interface board. Figure 4 The visible R light source, the visible G light source, and the visible B light source together constitute the above-mentioned first pulse width modulation pulse driving signal. Figure 4 The ultraviolet light source 800 here refers to the second pulse width modulation pulse driving signal for controlling the ultraviolet light source 800. Figure 4 The three-line CCD in the figure refers to the synchronization signal for controlling the camera device 300.

[0054] At the same time, when the three-line array CCD camera receives the trigger signal sent by the interface board, it starts to shoot the material to be inspected, and the shooting frequency is 22.6 kHz, ensuring that the trigger signal received by the three-line array CCD cameras of all channels of the system arrives at the same frequency as the synchronization signal of all pulse current control boards, so as to ensure the consistency of the signals of each channel of the system, so that the three-line array CCD camera accurately responds to the fluorescent signal generated by the material irradiated by the ultraviolet light source 800 and the signal reflected by the material irradiated by the visible light source 700. In other words, the shooting frequency of each camera in the camera device 300 needs to be twice the stroboscopic frequency of the light source, that is, the frequency of the trigger signal that triggers the camera device 300 to start shooting preparation and the frequency of the synchronization signal that controls the camera device 300 to shoot also needs to be twice the stroboscopic frequency of the light source. In other words, in order to achieve better control of the camera device 300, it is best to set the stroboscopic frequency of the visible light source 700 and the ultraviolet light source 800 to be the same, so as to prevent the camera device 300 from constantly changing the shooting frequency due to the different stroboscopic frequencies of the visible light source 700 and the ultraviolet light source 800.

[0055] In some embodiments of the present invention, the material image signal includes multiple first image signals and multiple second image signals, the first image signal is an image signal captured when the visible light source 700 irradiates the material to be detected, and the second image signal is an image signal captured when the ultraviolet light source 800 irradiates the material to be detected. The signal processing device 600 is specifically used to: splice the image signals captured at the same position of the material to be detected in the multiple first image signals, obtain a first signal set according to the splicing result, merge the image signals in the first signal set to obtain a third image signal, and splice the image signals captured at the same position of the material to be detected in the multiple second image signals, obtain a second signal set according to the splicing result, merge the image signals in the second signal set to obtain a fourth image signal, and obtain a material defect detection result of the material to be detected according to the third image signal and the fourth image signal; wherein the first signal set includes the image signal obtained by splicing the first image signals and the first image signal that is not spliced, and the second signal set includes the image signal obtained by splicing the second image signals and the second image signal that is not spliced.

[0056] Specifically, the control device 400 controls the visible light source 700 and the ultraviolet light source 800 to alternately flash on the material to be inspected, and controls the camera device 300 to continuously shoot the material to be inspected while the visible light source 700 and the ultraviolet light source 800 alternately flash on the material to be inspected. Obviously, the material image signal captured by the camera device 300 includes both the material image signal captured when the visible light source 700 illuminates the material to be inspected and the material image signal captured when the ultraviolet light source 800 illuminates the material to be inspected.

[0057] Therefore, the material image signal obtained by photographing when the visible light source 700 irradiates the material to be inspected can be made the first image signal, and the material image signal obtained by photographing when the ultraviolet light source 800 irradiates the material to be inspected can be made the second image signal.

[0058] After obtaining the first image signal and the second image signal, the image signal obtained for the same part of the material to be detected in each of the first image signals can be obtained, and the first image signal obtained for the same part of the material to be detected can be spliced. In addition, the image signal obtained for the same part of the material to be detected in each of the second image signals can be obtained, and the second image signal obtained for the same part of the material to be detected can be spliced.

[0059] After the first image signals obtained from the same part of the material to be detected are spliced, the spliced ​​image signal and the unspliced ​​first image signal can be included in the same signal set to obtain a first signal set.

[0060] After the second image signals obtained from the same part of the material to be detected are spliced, the spliced ​​image signal and the unspliced ​​second image signal can be included in the same signal set to obtain a second signal set.

[0061] After obtaining the first signal set, the image signals in the first signal set can be combined to obtain a third image signal. After obtaining the second signal set, the image signals in the second signal set can be combined to obtain a fourth image signal.

[0062] Optionally, the signal processing device 600 may also be used to: align the third image signal and the fourth image signal to obtain a material defect detection result of the material to be detected based on the aligned third image signal and the fourth image signal.

[0063] Furthermore, the signal processing device 600 can obtain a material defect detection result of the material to be detected according to the third image signal and the fourth image signal.

[0064] Continue below Figure 2 The example shown is used for illustration.

[0065] Specifically, see Figure 5 In the signal splicing example shown, when the material to be inspected slides through channel 2 to viewpoint 1, at time t1, the three-line array CCD camera collects XXB1 signal, at time t2, XXB2 signal, at time t3, XG1B3, at time t4, XG2B4 signal, at time t5, R1G3B5 signal, at time t6, R2G4B6 signal... When the three-line array CCD camera is working continuously, the signals obtained at the same point of the material to be inspected are spliced ​​to obtain R1G1B1, R2G2B2..., where R1G1B1, R3G3B3, R5G5B5... are fluorescent signals generated by the ultraviolet light source 800 irradiating the surface of the material to be inspected, and R2G2B2, R4G4B4, R6G6B6... are signals reflected from the surface of the material to be inspected by the visible light source 700.

[0066] See also Figure 6 The signal merging example shown in the figure merges the signals obtained by the above splicing to obtain two sets of data, the third image signal and the fourth image signal. The fourth image signal is only the fluorescent signal generated by the ultraviolet light source 800 irradiating the material to be detected, and the third image signal is only the visible signal reflected by the visible light source 700 irradiating the material to be detected. Figure 6 In , 1024 pixels RGB are visible, which means that the image corresponding to the visible light source 700 has 1024 pixels. Figure 6 In the figure, ultraviolet 1024 pixels RGB means that the image corresponding to the ultraviolet light source 800 has 1024 pixels.

[0067] See also Figure 7 In the signal alignment example shown, in order to make the third image signal and the fourth image signal use the same delay time for easy debugging, the third image signal and the fourth image signal need to be aligned. Since the image signal corresponding to the RGB light and the image signal corresponding to the ultraviolet light are collected randomly after power-on, the first collected signal is allowed to wait for the later collected signal to align the data. Figure 7 In , 1024 pixels RGB are visible, which means that the image corresponding to the visible light source 700 has 1024 pixels. Figure 7 In the figure, ultraviolet 1024 pixels RGB means that the image corresponding to the ultraviolet light source 800 has 1024 pixels.

[0068] After obtaining the third image signal and the fourth image signal, the third image signal can be identified using a traditional shape and color selection algorithm and a deep learning algorithm, and the fourth image signal can be identified using a traditional color selection algorithm.

[0069] In summary, the material defect detection system of the embodiment of the present invention includes: an irradiation light source device, including a visible light source and an ultraviolet light source, both of which are used to irradiate the material to be detected; a camera device, used to photograph the material to be detected and obtain a material image signal of the material to be detected; a control device, connected to the visible light source, the ultraviolet light source and the camera device, used to control the visible light source and the ultraviolet light source to alternately strobe the material to be detected, and at the same time control the camera device to continuously photograph the material to be detected; a signal processing device, connected to the camera device, used to obtain the material defect detection result of the material to be detected according to the material image signal. Therefore, setting a visible light source for irradiation can avoid the afterglow effect caused by light sources such as white light, and improve the accuracy of material defect detection. Moreover, setting the visible light source and the ultraviolet light source for alternating irradiation can avoid the conflict between RGB light and ultraviolet light with large brightness difference, thereby further improving the detection accuracy. By setting the alternating irradiation mode of the visible light source and the ultraviolet light source to alternating stroboscopic irradiation, it can be achieved that every position on the surface of the material can be irradiated in a very short time. In addition, setting the light source for irradiation to include a visible light source and an ultraviolet light source can achieve the acquisition of visible and invisible features of the material surface.

[0070] Furthermore, the present invention provides a material defect detection method.

[0071] Figure 8 It is a flow chart of a material defect detection method according to an embodiment of the present invention.

[0072] like Figure 8 As shown, the material defect detection method includes:

[0073] S81, alternately strobe the material to be inspected with a visible light source and an ultraviolet light source, and simultaneously continuously photograph the material to be inspected to obtain a material image signal of the material to be inspected.

[0074] S82, obtaining a material defect detection result of the material to be detected according to the material image signal.

[0075] In some embodiments of the present invention, the material image signal includes multiple first image signals and multiple second image signals, the first image signal is an image signal taken when a visible light source irradiates the material to be detected, and the second image signal is an image signal taken when an ultraviolet light source irradiates the material to be detected. Obtaining a material defect detection result of the material to be detected according to the material image signal includes: splicing the image signals taken at the same position of the material to be detected in the multiple first image signals, obtaining a first signal set according to the splicing result, and splicing the image signals taken at the same position of the material to be detected in the multiple second image signals, and obtaining a second signal set according to the splicing result, wherein the first signal set includes image signals obtained by splicing the first image signals and the first image signals that are not spliced, and the second signal set includes image signals obtained by splicing the second image signals and the second image signals that are not spliced; merging the image signals in the first signal set to obtain a third image signal, and merging the image signals in the second signal set to obtain a fourth image signal; obtaining the material defect detection result of the material to be detected according to the third image signal and the fourth image signal.

[0076] It should be noted that for other specific implementations of the material defect detection method of the embodiment of the present invention, reference can be made to the material defect detection system of the above embodiment.

[0077] The material defect detection method of the embodiment of the present invention uses a visible light source and an ultraviolet light source to alternately strobe the material to be detected, and continuously photographs the material to be detected to obtain a material image signal of the material to be detected; and obtains a material defect detection result of the material to be detected based on the material image signal. Setting a visible light source for irradiation can avoid the afterglow effect caused by light sources such as white light, thereby improving the accuracy of material defect detection.

[0078] Furthermore, the present invention provides an electronic device.

[0079] Fig. 9 It is a structural block diagram of an electronic device according to an embodiment of the present invention.

[0080] like Fig. 9As shown, the electronic device 500 includes: a processor 501 and a memory 503. The processor 501 and the memory 503 are connected, such as through a bus 502. Optionally, the electronic device 500 may also include a transceiver 504. It should be noted that in actual applications, the transceiver 504 is not limited to one, and the structure of the electronic device 500 does not constitute a limitation on the embodiments of the present invention.

[0081] Processor 501 may be a CPU (Central Processing Unit), a general purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array) or other programmable logic devices, transistor logic devices, hardware components or any combination thereof. It may implement or execute various exemplary logic blocks, modules and circuits described in conjunction with the disclosure of the present invention. Processor 501 may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, etc.

[0082] The bus 502 may include a path to transmit information between the above components. The bus 502 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus. The bus 502 may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 5 Only one thick line is used in the diagram, but this does not mean that there is only one bus or only one type of bus.

[0083] The memory 503 is used to store a computer program corresponding to the material defect detection method of the above embodiment of the present invention, and the computer program is controlled and executed by the processor 501. The processor 501 is used to execute the computer program stored in the memory 503 to implement the content shown in the above method embodiment.

[0084] in, Figure 8 The electronic device 500 shown is only an example and should not bring any limitation to the functions and scope of use of the embodiments of the present invention.

[0085] The electronic device of the embodiment of the present invention, by implementing the material defect detection method of the above embodiment and setting a visible light source for irradiation, can avoid the afterglow effect caused by light sources such as white light, thereby improving the accuracy of material defect detection.

[0086] It should be noted that the logic and / or steps represented in the flowchart or otherwise described herein can be considered as a sequenced list of executable instructions for implementing logical functions, and can be specifically implemented in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purposes of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection portion with one or more wirings (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), an optical fiber device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways if necessary, and then stored in a computer memory.

[0087] It should be understood that the various parts of the present invention can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiment, a plurality of steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. If implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0088] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0089] In the description of this specification, the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and cannot be understood as a limitation on the present invention.

[0090] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0091] In the description of this specification, unless otherwise specified, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0092] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0093] Although the embodiments of the present invention have been shown and described above, it is to be understood that the above embodiments are exemplary and are not to be construed as limitations of the present invention. A person skilled in the art may change, modify, replace and vary the above embodiments within the scope of the present invention.

Claims

1. A material defect detection system, characterized in that: The system comprises: An irradiation light source device, including a visible light source and an ultraviolet light source, wherein the visible light source and the ultraviolet light source are both used to irradiate the material to be detected; A camera device, used for photographing the material to be detected to obtain a material image signal of the material to be detected; A control device connected to the visible light source, the ultraviolet light source and the camera device, and used to control the visible light source and the ultraviolet light source to alternately strobe the material to be detected, and control the camera device to continuously photograph the material to be detected; A signal processing device is connected to the camera device and is used to obtain a material defect detection result of the material to be detected based on the material image signal.

2. The material defect detection system according to claim 1, characterized in that: The control device is specifically used for: Generate a first pulse width modulated pulse driving signal and a second pulse width modulated pulse driving signal, so as to control the visible light source to strobe by using the first pulse width modulated pulse driving signal, and control the ultraviolet light source to strobe by using the second pulse width modulated pulse driving signal; as well as, A synchronization signal is generated according to the first pulse width modulated pulse driving signal and the second pulse width modulated pulse driving signal, so as to use the synchronization signal to control the camera device to photograph the material to be detected.

3. The material defect detection system according to claim 1, characterized in that: The material image signal includes a plurality of first image signals and a plurality of second image signals, wherein the first image signal is an image signal obtained by photographing when the visible light source irradiates the material to be detected, and the second image signal is an image signal obtained by photographing when the ultraviolet light source irradiates the material to be detected, and the signal processing device is specifically used for: The image signals captured at the same position of the material to be detected from a plurality of the first image signals are spliced, and a first signal set is obtained according to the splicing result, and the image signals in the first signal set are merged to obtain a third image signal, and the image signals captured at the same position of the material to be detected from a plurality of the second image signals are spliced, and a second signal set is obtained according to the splicing result, and the image signals in the second signal set are merged to obtain a fourth image signal, and a material defect detection result of the material to be detected is obtained according to the third image signal and the fourth image signal; wherein the first signal set includes image signals obtained by splicing the first image signals and the first image signal that is not spliced, and the second signal set includes image signals obtained by splicing the second image signals and the second image signal that is not spliced.

4. The material defect detection system according to claim 3, characterized in that: The signal processing device is further used for: The third image signal and the fourth image signal are aligned to obtain a material defect detection result of the material to be detected according to the aligned third image signal and the fourth image signal.

5. The material defect detection system according to claim 2, characterized in that: The visible light source is specifically used to illuminate when the first pulse width modulated pulse driving signal is a high level signal, and stop irradiating when the first pulse width modulated pulse driving signal is a low level signal; The ultraviolet light source is specifically used to irradiate when the second pulse width modulated pulse driving signal is a high level signal, and stop irradiating when the second pulse width modulated pulse driving signal is a low level signal.

6. The material defect detection system according to claim 5, characterized in that: The camera device is specifically used for shooting when the synchronization signal is a high-level signal, and the control device is specifically used for: When the first pulse width modulated pulse driving signal or the second pulse width modulated pulse driving signal is a high level signal, generating a high level synchronization signal; When the first pulse width modulated pulse driving signal and the second pulse width modulated pulse driving signal are both low level signals, a low level synchronization signal is generated.

7. The material defect detection system according to claim 1, characterized in that: The control device adopts a pulse current control board.

8. The material defect detection system according to claim 1, characterized in that: The visible light source is an RGB three-color light source or a monochromatic R, G, B light source or a white light source.

9. A material defect detection method, characterized in that: The method comprises: Using a visible light source and an ultraviolet light source to alternately flash the material to be detected, and simultaneously continuously photographing the material to be detected to obtain a material image signal of the material to be detected; A material defect detection result of the material to be detected is obtained according to the material image signal.

10. The material defect detection method according to claim 9, characterized in that: The material image signal includes a plurality of first image signals and a plurality of second image signals, wherein the first image signal is an image signal obtained by photographing when the visible light source irradiates the material to be detected, and the second image signal is an image signal obtained by photographing when the ultraviolet light source irradiates the material to be detected, and obtaining the material defect detection result of the material to be detected according to the material image signal includes: splicing image signals obtained by shooting at the same position of the material to be detected from a plurality of the first image signals, and obtaining a first signal set according to the splicing result; and splicing image signals obtained by shooting at the same position of the material to be detected from a plurality of the second image signals, and obtaining a second signal set according to the splicing result, wherein the first signal set includes image signals obtained by splicing the first image signals and first image signals that are not spliced, and the second signal set includes image signals obtained by splicing the second image signals and second image signals that are not spliced; Combining the image signals in the first signal set to obtain a third image signal, and combining the image signals in the second signal set to obtain a fourth image signal; A material defect detection result of the material to be detected is obtained according to the third image signal and the fourth image signal.

Images