Dynamic test waveform generating device for semiconductor gas sensor

Abstract

The invention discloses a waveform generation device for dynamic test of a semiconductor gas sensor, comprising: a voltage regulation module for acquiring an input waveform signal and setting a voltage parameter of the input waveform signal to obtain a first waveform signal; the voltage display module is used for collecting and displaying voltage corresponding to the first waveform signal in real time; the power adjusting module is used for acquiring and receiving the first waveform signal, setting a power parameter of the first waveform signal to obtain a second waveform signal, and transmitting the second waveform signal to the output end; and the output interface is used for outputting the second waveform signal adjusted by the power adjusting module. The waveform generating device for the dynamic test of the semiconductor gas sensor is suitable for the dynamic test of the semiconductor gas sensor, and can simulate the influence of the actual gas concentration change on the sensor, so that the performance of the sensor is evaluated more accurately.

Description

Technical Field

[0001] The invention relates to the technical field of electronic testing equipment, and in particular to a dynamic testing waveform generating device for semiconductor gas sensors. Background Art

[0002] Dynamic testing technology mainly starts from the testing method, and increases the selectivity of the sensor by changing the traditional constant temperature heating method. At present, there are various signal generators on the market, which are generally divided into the following types according to the frequency band: ultra-high frequency range is above 1MHz, up to tens of megahertz; high frequency is hundreds of kilohertz to several megahertz; low frequency range is tens of hertz to hundreds of kilohertz; ultra-low frequency range is a few tenths of hertz to hundreds of hertz. The signal generator can provide a variety of test signals to help engineers test circuits and detect signal parameters such as amplitude, phase, frequency, etc. In addition, it can also be used to test and analyze the characteristics of various signals, such as peak value, frequency, harmonic distortion and phase, etc., to help researchers gain an in-depth understanding of the characteristics of the signal source. However, the traditional dynamic testing technology has the following disadvantages: the traditional dynamic testing technology usually adopts an ultra-low frequency periodic temperature modulation pulse heating source for the temperature modulation dynamic test of semiconductor gas sensors. It is expensive to purchase a multi-function function waveform generator, and the instrument is large in size. Usually, the instrument function is not fully required in experimental testing, resulting in a waste of resources. The simple use of some waveform generator products currently on the market that use DDS technology cannot accurately meet the waveform heating voltage signal that needs to be set to determine the real-time display of high and low voltage parameters, and cannot guarantee the normal progress of experimental testing. Summary of the invention

[0003] In order to solve the technical problems existing in the background technology, the present invention proposes a dynamic test waveform generating device for semiconductor gas sensors.

[0004] The present invention provides a waveform generator for dynamic testing of semiconductor gas sensors, comprising:

[0005] A voltage regulating module, used for acquiring an input waveform signal and setting a voltage parameter of the input waveform signal to obtain a first waveform signal;

[0006] A voltage display module, used for real-time acquisition and display of the voltage corresponding to the first waveform signal;

[0007] A power adjustment module, used for acquiring and receiving a first waveform signal and setting a power parameter of the first waveform signal to obtain a second waveform signal, and transmitting the second waveform signal to an output end;

[0008] An output interface, used to output the second waveform signal adjusted by the power adjustment module;

[0009] The output end of the voltage regulating module is electrically connected to the input end of the voltage display module, the output end of the voltage display module is electrically connected to the input end of the power regulating module, and the output end of the power regulating module is electrically connected to the output interface.

[0010] Preferably, the voltage regulating module specifically includes a chip U1, a capacitor C1, a diode D1, a diode D2, an inductor L2, a capacitor C2, a capacitor C3, a resistor R6, a light emitting diode LED1, a pin connector U6, a resistor R3 and a resistor R1; the first end of the chip U1 is electrically connected to one end of the capacitor C1, one end of the capacitor C1 is electrically connected to one end of the diode D1, the other end of the diode D1 is electrically connected to the second end of the pin connector U6, the second end of the chip U1 is electrically connected to one end of the diode D2, one end of the diode D2 is electrically connected to one end of the inductor L2, and the other end of the inductor L2 is electrically connected to one end of the capacitor C2. Electrically connected, one end of capacitor C2 is electrically connected to one end of capacitor C3, one end of capacitor C2 is electrically connected to one end of resistor R6, the other end of resistor R6 is electrically connected to one end of light emitting diode LED1, the first end of pin connector U6, the other end of capacitor C1, the other end of diode D2, the third end of chip U1, the fifth end of chip U1, the sixth end of chip U1, the other end of capacitor C2, the other end of capacitor C3 and the other end of light emitting diode LED1 are all grounded, one end of resistor R3 is electrically connected to one end of resistor R1, the other end of resistor R1 is grounded, and the other end of resistor R3 is also connected to the output end Out+ of output voltage.

[0011] Preferably, the power adjustment module includes a socket U3, a resistor R5, a resistor R10, a resistor R8, a resistor R9, a transistor Q2, a resistor R11, a resistor R4, a resistor R13, a resistor R14, a resistor R12, a resistor R2, a resistor R15, a resistor R18, a resistor R19, a resistor R20, a resistor R28, a resistor R27, a resistor R26, a resistor R23, a resistor R24, a resistor R25, a resistor R22, a resistor R21, a resistor R17 and a resistor R16; the first end of the socket U3 is electrically connected to one end of the resistor R5, one end of the resistor R5 is electrically connected to one end of the resistor R10, the other end of the resistor R5 is electrically connected to one end of the resistor R8, the other end of the resistor R10 is electrically connected to one end of the resistor R9, and the first end of the socket U3 is electrically connected to one end of the resistor R5, the first end of the resistor R5 is electrically connected to one end of the resistor R10, the second end of the resistor R5 is electrically connected to one end of the resistor R8, the second end of the resistor R10 is electrically connected to one end of the resistor R9, and the first end of the resistor R8 is electrically connected to one end of the resistor R5. The other end and the other end of resistor R9 are both electrically connected to the base of transistor Q2, the collector of transistor Q2 is electrically connected to one end of resistor R11, one end of resistor R11 is electrically connected to one end of resistor R2, the other end of resistor R2 is connected in series with resistor R12, resistor R14, resistor R15, resistor R18, resistor R19, resistor R20, resistor R28, resistor R27, and resistor R26 in sequence, the other end of resistor R11 is connected in series with resistor R4, resistor R13, resistor R16, resistor R17, resistor R21, resistor R22, resistor R25, resistor R24, and resistor R23 in sequence, the other end of resistor R23 and the other end of resistor R26 are both connected to the output terminal Out-, and the second end of the socket U3 and the emitter of transistor Q2 are both grounded.

[0012] Preferably, the chip U1 is specifically a LM2596 switching voltage regulator.

[0013] Preferably, the voltage display module specifically includes resistor R36, resistor R30, resistor R31, resistor R34, resistor R35, resistor R32, resistor R33, pin connector U5, resistor R29, resistor R7, and pin connector CN1, resistor R36 is connected in parallel with resistor R30, one end of resistor R36 connected in parallel with resistor R30 is electrically connected to one end of resistor R31, and the other end of resistor R31 is grounded, resistor R34 is connected in parallel with resistor R35, one end of resistor R33 is electrically connected to one end of resistor R32, and the other end of resistor R32 is grounded, the first end of pin connector U5 is electrically connected to the other end of resistor R33, the second end of pin connector U5 and the other end of resistor R36 connected in parallel with resistor R30 are connected, resistor R29 is connected in parallel with resistor R7, and the second end of pin connector CN1 is grounded.

[0014] Preferably, the adjustment range of the voltage regulation module is specifically 1.4V-11.4V.

[0015] Preferably, the frequency range of the power adjustment module is 0.01 Hz-50 KHz.

[0016] Preferably, the output interface is specifically a pin connector U4, a first end of the pin connector U4 is connected to the output end Out-, and a second end of the pin connector U4 is connected to the output end Out+.

[0017] In the present invention, the waveform generating device for dynamic testing of semiconductor gas sensors proposed controls the input voltage through a voltage regulating module to output an adjustable periodic square wave signal, and adjusts the frequency range of the periodic square wave signal through a power adjustment module to output a square wave signal with a stable waveform and adjustable amplitude and frequency. It can provide stable signal support under different load conditions and is suitable for fields such as electronic testing, signal simulation and low-frequency driving. It is suitable for dynamic testing of semiconductor gas sensors and can simulate the impact of actual gas concentration changes on the sensor, thereby more accurately evaluating the performance of the sensor. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic diagram of the device architecture of a dynamic test waveform generating device for semiconductor gas sensors proposed by the present invention;

[0019] Figure 2 This is a schematic diagram of the overall structure of a device for dynamically testing a semiconductor gas sensor waveform generator proposed by the present invention;

[0020] Figure 3 This is a schematic diagram of the structure of a voltage regulation module for a semiconductor gas sensor dynamic test waveform generating device proposed by the present invention;

[0021] Figure 4 This is a schematic diagram of the structure of a power adjustment module for a semiconductor gas sensor dynamic test waveform generating device proposed by the present invention. DETAILED DESCRIPTION

[0022] Reference Figure 1-4 The present invention provides a waveform generator for dynamic testing of semiconductor gas sensors, comprising:

[0023] A voltage regulating module, used for acquiring an input waveform signal and setting a voltage parameter of the input waveform signal to obtain a first waveform signal;

[0024] A voltage display module, used for real-time acquisition and display of the voltage corresponding to the first waveform signal;

[0025] A power adjustment module, used for acquiring and receiving a first waveform signal and setting a power parameter of the first waveform signal to obtain a second waveform signal, and transmitting the second waveform signal to an output end;

[0026] An output interface, used to output the second waveform signal adjusted by the power adjustment module;

[0027] The output end of the voltage regulating module is electrically connected to the input end of the voltage display module, the output end of the voltage display module is electrically connected to the input end of the power regulating module, and the output end of the power regulating module is electrically connected to the output interface.

[0028] In this embodiment, the voltage regulating module obtains the input waveform signal through the waveform generating circuit and provides power to the device by connecting to the power supply module.

[0029] Specifically, the voltage regulation module specifically includes a chip U1, a capacitor C1, a diode D1, a diode D2, an inductor L2, a capacitor C2, a capacitor C3, a resistor R6, a light emitting diode LED1, a pin connector U6, a resistor R3 and a resistor R1; a first end of the chip U1 is electrically connected to one end of the capacitor C1, one end of the capacitor C1 is electrically connected to one end of the diode D1, the other end of the diode D1 is electrically connected to the second end of the pin connector U6, the second end of the chip U1 is electrically connected to one end of the diode D2, one end of the diode D2 is electrically connected to one end of the inductor L2, and the other end of the inductor L2 is electrically connected to one end of the capacitor C2. One end of the capacitor C2 is electrically connected to one end of the capacitor C3, one end of the capacitor C2 is electrically connected to one end of the resistor R6, the other end of the resistor R6 is electrically connected to one end of the light emitting diode LED1, the first end of the pin connector U6, the other end of the capacitor C1, the other end of the diode D2, the third end of the chip U1, the fifth end of the chip U1, the sixth end of the chip U1, the other end of the capacitor C2, the other end of the capacitor C3 and the other end of the light emitting diode LED1 are all grounded, one end of the resistor R3 is electrically connected to one end of the resistor R1, the other end of the resistor R1 is grounded, and the other end of the resistor R3 is also connected to the output terminal Out+ of the output voltage.

[0030] In this embodiment, the voltage regulation module achieves the effect of voltage division by connecting the adjustable potentiometer to the LM2596 to adjust the resistor to control the output voltage. The input DC voltage is reduced to a lower output voltage by forming a BUCK buck circuit through the LM2596 voltage regulator chip and the switch tube. The BUCK buck circuit achieves the voltage reduction effect by controlling the switching time duty cycle of the switch. When the switch is closed, the current flows from the positive electrode of the power supply to the negative electrode, passing through the inductor, capacitor and load, gradually increasing the current and voltage; when the switch is disconnected, the magnetic energy stored in the inductor is converted into electrical energy, forming a loop through the diode, and gradually reducing the current and voltage; by controlling the switching time duty cycle of the switch, the voltage at both ends of the load can be controlled, thereby achieving voltage reduction, achieving stable control of the input voltage, providing accurate DC power supply for the entire circuit, and ensuring the reliability and consistency of the output signal. The voltage adjustment module can effectively adjust the input parameters and output a stable power supply voltage to meet the working requirements of the power amplifier circuit.

[0031] Specifically, the power adjustment module includes a socket U3, a resistor R5, a resistor R10, a resistor R8, a resistor R9, a transistor Q2, a resistor R11, a resistor R4, a resistor R13, a resistor R14, a resistor R12, a resistor R2, a resistor R15, a resistor R18, a resistor R19, a resistor R20, a resistor R28, a resistor R27, a resistor R26, a resistor R23, a resistor R24, a resistor R25, a resistor R22, a resistor R21, a resistor R17 and a resistor R16; a first end of the socket U3 is electrically connected to one end of the resistor R5, one end of the resistor R5 is electrically connected to one end of the resistor R10, the other end of the resistor R5 is electrically connected to one end of the resistor R8, the other end of the resistor R10 is electrically connected to one end of the resistor R9, and the other end of the resistor R8 is electrically connected to one end of the resistor R16. The second end of the socket U3 and the other end of the resistor R9 are electrically connected to the base of the transistor Q2, the collector of the transistor Q2 is electrically connected to one end of the resistor R11, one end of the resistor R11 is electrically connected to one end of the resistor R2, the other end of the resistor R2 is connected in series with the resistor R12, the resistor R14, the resistor R15, the resistor R18, the resistor R19, the resistor R20, the resistor R28, the resistor R27, and the resistor R26 in sequence, the other end of the resistor R11 is connected in series with the resistor R4, the resistor R13, the resistor R16, the resistor R17, the resistor R21, the resistor R22, the resistor R25, the resistor R24, and the resistor R23 in sequence, the other end of the resistor R23 and the other end of the resistor R26 are both connected to the output terminal Out-, the second end of the socket U3 and the emitter of the transistor Q2 are both grounded.

[0032] In this embodiment, the generator signal is amplified by connecting the transistor switch in series with the resistor in parallel, and the power amplifier module forms a common emitter amplifier circuit through the transistor switch, which has efficient signal power amplification capability. The circuit output end can output a low voltage of 0V.

[0033] Specifically, the chip U1 is a LM2596 switching voltage regulator.

[0034] Specifically, the voltage display module specifically includes resistor R36, resistor R30, resistor R31, resistor R34, resistor R35, resistor R32, resistor R33, pin connector U5, resistor R29, resistor R7, and pin connector CN1. Resistor R36 is connected in parallel with resistor R30, one end of resistor R36 connected in parallel with resistor R30 is electrically connected to one end of resistor R31, and the other end of resistor R31 is grounded, resistor R34 is connected in parallel with resistor R35, one end of resistor R33 is electrically connected to one end of resistor R32, and the other end of resistor R32 is grounded, the first end of pin connector U5 is electrically connected to the other end of resistor R33, the second end of pin connector U5 and the other end of resistor R36 connected in parallel with resistor R30 are connected, resistor R29 is connected in parallel with resistor R7, and the second end of pin connector CN1 is grounded.

[0035] Specifically, the adjustment range of the voltage adjustment module is 1.4V-11.4V, and the frequency range of the power adjustment module is 0.01Hz-50KHz.

[0036] In this embodiment, the output interface is specifically a pin connector U4, a first end of the pin connector U4 is connected to the output end Out-, and a second end of the pin connector U4 is connected to the output end Out+.

[0037] In the specific working process of the semiconductor gas sensor dynamic test waveform generating device of this embodiment, the input voltage is controlled by connecting LM2596 to an adjustable potentiometer to adjust the resistance to achieve the effect of voltage division, and the output is a periodic square wave signal adjustable between 1.4V and 11.4V, and the frequency range is adjustable between 0.01Hz and 50KHz. By optimizing the circuit design, the square wave signal output by the circuit has the characteristics of stable waveform, adjustable amplitude and frequency, and can provide stable signal support under different load conditions, and is suitable for electronic testing, signal simulation, low-frequency driving and other fields.

[0038] The above description is only a preferred specific implementation manner of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical scheme and inventive concept of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. A waveform generator for dynamic testing of semiconductor gas sensors, characterized in that: include: A voltage regulating module, used for acquiring an input waveform signal and setting a voltage parameter of the input waveform signal to obtain a first waveform signal; A voltage display module, used for real-time acquisition and display of the voltage corresponding to the first waveform signal; A power adjustment module, used for acquiring and receiving a first waveform signal and setting a power parameter of the first waveform signal to obtain a second waveform signal, and transmitting the second waveform signal to an output end; An output interface, used to output the second waveform signal adjusted by the power adjustment module; The output end of the voltage regulating module is electrically connected to the input end of the voltage display module, the output end of the voltage display module is electrically connected to the input end of the power regulating module, and the output end of the power regulating module is electrically connected to the output interface.

2. The dynamic test waveform generating device for semiconductor gas sensor according to claim 1, characterized in that: The voltage regulating module specifically includes a chip U1, a capacitor C1, a diode D1, a diode D2, an inductor L2, a capacitor C2, a capacitor C3, a resistor R6, a light emitting diode LED1, a pin connector U6, a resistor R3 and a resistor R1; a first end of the chip U1 is electrically connected to one end of the capacitor C1, one end of the capacitor C1 is electrically connected to one end of the diode D1, the other end of the diode D1 is electrically connected to the second end of the pin connector U6, the second end of the chip U1 is electrically connected to one end of the diode D2, one end of the diode D2 is electrically connected to one end of the inductor L2, and the other end of the inductor L2 is electrically connected to one end of the capacitor C2. One end of the capacitor C2 is electrically connected to one end of the capacitor C3, one end of the capacitor C2 is electrically connected to one end of the resistor R6, the other end of the resistor R6 is electrically connected to one end of the light emitting diode LED1, the first end of the pin connector U6, the other end of the capacitor C1, the other end of the diode D2, the third end of the chip U1, the fifth end of the chip U1, the sixth end of the chip U1, the other end of the capacitor C2, the other end of the capacitor C3 and the other end of the light emitting diode LED1 are all grounded, one end of the resistor R3 is electrically connected to one end of the resistor R1, the other end of the resistor R1 is grounded, and the other end of the resistor R3 is also connected to the output terminal Out+ of the output voltage.

3. The dynamic test waveform generator for semiconductor gas sensors according to claim 2, characterized in that: The power adjustment module includes a socket U3, a resistor R5, a resistor R10, a resistor R8, a resistor R9, a transistor Q2, a resistor R11, a resistor R4, a resistor R13, a resistor R14, a resistor R12, a resistor R2, a resistor R15, a resistor R18, a resistor R19, a resistor R20, a resistor R28, a resistor R27, a resistor R26, a resistor R23, a resistor R24, a resistor R25, a resistor R22, a resistor R21, a resistor R17 and a resistor R16; a first end of the socket U3 is electrically connected to one end of the resistor R5, one end of the resistor R5 is electrically connected to one end of the resistor R10, the other end of the resistor R5 is electrically connected to one end of the resistor R8, the other end of the resistor R10 is electrically connected to one end of the resistor R9, and the other end of the resistor R8 is electrically connected to one end of the resistor R16. The second end of the socket U3 and the other end of the resistor R9 are electrically connected to the base of the transistor Q2, the collector of the transistor Q2 is electrically connected to one end of the resistor R11, one end of the resistor R11 is electrically connected to one end of the resistor R2, the other end of the resistor R2 is connected in series with the resistor R12, the resistor R14, the resistor R15, the resistor R18, the resistor R19, the resistor R20, the resistor R28, the resistor R27, and the resistor R26 in sequence, the other end of the resistor R11 is connected in series with the resistor R4, the resistor R13, the resistor R16, the resistor R17, the resistor R21, the resistor R22, the resistor R25, the resistor R24, and the resistor R23 in sequence, the other end of the resistor R23 and the other end of the resistor R26 are both connected to the output terminal Out-, the second end of the socket U3 and the emitter of the transistor Q2 are both grounded.

4. The dynamic test waveform generating device for semiconductor gas sensor according to claim 2, characterized in that: The chip U1 is specifically a LM2596 switching voltage regulator.

5. The dynamic test waveform generator for semiconductor gas sensors according to claim 1, characterized in that: The voltage display module specifically includes resistor R36, resistor R30, resistor R31, resistor R34, resistor R35, resistor R32, resistor R33, pin connector U5, resistor R29, resistor R7, and pin connector CN1. Resistor R36 is connected in parallel with resistor R30, one end of resistor R36 connected in parallel with resistor R30 is electrically connected to one end of resistor R31, and the other end of resistor R31 is grounded. Resistor R34 is connected in parallel with resistor R35, one end of resistor R33 is electrically connected to one end of resistor R32, and the other end of resistor R32 is grounded. The first end of pin connector U5 is electrically connected to the other end of resistor R33, the second end of pin connector U5 and the other end of resistor R36 connected in parallel with resistor R30 are connected, resistor R29 is connected in parallel with resistor R7, and the second end of pin connector CN1 is grounded.

6. The dynamic test waveform generator for semiconductor gas sensors according to claim 1, characterized in that: The adjustment range of the voltage regulation module is specifically 1.4V-11.4V.

7. The dynamic test waveform generator for semiconductor gas sensors according to claim 1, characterized in that: The frequency range of the power adjustment module is specifically 0.01 Hz-50 KHz.

8. The dynamic test waveform generating device for semiconductor gas sensor according to claim 3, characterized in that: The output interface is specifically a pin connector U4, a first end of the pin connector U4 is connected to the output end Out-, and a second end of the pin connector U4 is connected to the output end Out+.

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