Current detection probe

Abstract

The invention provides a current detection probe, which comprises a current clamp and a detection cable, and is characterized in that the detection cable is electrically connected to the current clamp; the detection cable comprises a protective layer, an insulating layer, a probe magnetic core and an inner conductor, the inner conductor is embedded in the probe magnetic core, the insulating layer wraps the probe magnetic core, and the protective layer wraps the insulating layer and the current clamp. The current clamp solves the technical problems that a traditional current clamp causes electromagnetic leakage due to wire exposure and cannot accurately complete detection work due to external interference.

Description

Technical Field

[0001] The invention relates to the technical field of electromagnetic compatibility measurement, and more specifically to a current detection probe. Background Art

[0002] In the development, production and testing of electronic equipment, accurate measurement of current size and waveform is the key to evaluating device performance, power consumption characteristics and stability. Currently, the mainstream current detection tools are mostly clamp-type current clamps based on the Hall effect, which detect current by clamping the circuit to be tested. However, this traditional method has significant disadvantages.

[0003] In actual operation, the common test method requires disconnecting the circuit and using wires to connect for measurement. However, after the skin at both ends of the wire is peeled off, the exposed part will cause electromagnetic leakage. On the one hand, this makes the test signal extremely susceptible to interference sources such as external inductance, resulting in measurement errors and unable to accurately reflect the actual current situation of the device; on the other hand, the signal will also radiate to adjacent circuits, interfering with the normal operation of other components, making it difficult to meet the strict requirements of electromagnetic compatibility (EMC). If the electromagnetic shielding layer is completely grounded, the induction coil of the traditional current probe cannot sense the magnetic field due to the electrostatic shielding effect, and cannot carry out current waveform detection, which limits its application in specific environments. In high-frequency test scenarios, such as testing the instantaneous power consumption under a certain instruction, when it is necessary to pay attention to the size of the peak current, the traditional current probe is prone to inaccurate results due to external interference, and the ADC sampling module cannot accurately capture the peak current due to sampling rate limitations. This poses a huge challenge to accurately evaluating the instantaneous working performance of electronic equipment. Therefore, developing a new type of current probe to solve the above problems is crucial to improving the accuracy and reliability of electronic equipment testing. Summary of the invention

[0004] The purpose of the present invention is to overcome the defects of the prior art and provide a current detection probe, which aims to solve the technical problems that the traditional current clamp cannot accurately complete the detection work due to electromagnetic leakage caused by exposed wires and susceptibility to external interference.

[0005] To achieve the above object, the present invention adopts the following technical solutions:

[0006] A current detection probe comprises a current clamp and a detection cable, wherein the detection cable is electrically connected to the current clamp; the detection cable comprises a protective layer, an insulating layer, a probe core and an inner conductor, wherein the inner conductor is embedded in the probe core, the insulating layer covers the probe core, and the protective layer covers the insulating layer and the current clamp.

[0007] In one embodiment, the probe core includes a core layer and a connecting coil, the core layer is embedded in the insulating layer, one end of the connecting coil is wound around the outer surface of the core layer, and the other end passes through the insulating layer and is connected to the current clamp.

[0008] In one embodiment, a connection groove is provided on the outer surface of the magnetic core layer, and the connection coil is wound in the connection groove.

[0009] In one embodiment, the connection groove is provided in the middle section of the magnetic core layer, and the current clamp is vertically connected to the middle section of the magnetic core layer through the connection coil.

[0010] In one embodiment, a signal processing circuit is provided in the current clamp, and the signal processing circuit is electrically connected to the magnetic core layer through the connecting coil.

[0011] In one embodiment, a clamp adapter is provided at each of the two ends of the detection cable, one end of the clamp adapter is clamped to the end of the detection cable, and the other end is adapted to be connected to the circuit to be tested.

[0012] In one embodiment, two ends of the inner conductor pass through the protective layer, the insulating layer and the probe magnetic core and pass through the clamp adapter, so that the inner conductor is electrically connected to the clamp adapter.

[0013] In one embodiment, the clamp adapter adopts an IPEX interface.

[0014] In one embodiment, the protective layer, the insulating layer, and the probe magnetic core are extruded onto the surface of the inner conductor in a three-layer co-extrusion form.

[0015] In one embodiment, the protective layer is an integrated structure.

[0016] Compared with the prior art, the present invention has the following beneficial effects: by adopting a structure in which the inner conductor is wrapped by a protective layer, an insulating layer and a probe magnetic core, the protective layer is an integrated structure and wraps the insulating layer and the current clamp, and this design forms a complete electromagnetic shielding system. Unlike the traditional current clamp which causes electromagnetic leakage due to exposed wires, this structure can effectively isolate external electromagnetic interference, prevent the test signal from being affected by interference sources such as external inductance, meet electromagnetic compatibility (EMC) requirements, ensure the stability of the measurement environment, and improve the accuracy of the measurement results.

[0017] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the following preferred embodiments are specifically cited and described in detail as follows. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 A schematic diagram of the overall structure of a current detection probe provided by the present invention;

[0019] Figure 2A schematic cross-sectional view of a detection cable of a current detection probe provided by the present invention;

[0020] Figure 3 A schematic diagram of the partial structure of a detection cable of a current detection probe provided by the present invention with the protective layer and the shielding layer removed;

[0021] Figure 4 A schematic structural diagram of a clamp adapter for a current detection probe provided by the present invention.

[0022] Reference numerals

[0023] 1. Current clamp; 2. Detection cable; 21. Protective layer; 22. Insulation layer; 23. Probe core; 231. Core layer; 2311. Connection groove; 232. Connection coil; 24. Inner conductor; 3. Clamp adapter; 31. Connection channel; 32. IPEX interface; 33. Fixing seat; 4. Adapter cable. DETAILED DESCRIPTION

[0024] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0025] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0026] It should be understood that when used in this specification and the appended claims, the terms "include" and "comprises" indicate the presence of described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or combinations thereof.

[0027] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in the specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an" and "the" are intended to include plural forms.

[0028] It should be further understood that the term "and / or" used in the present description and the appended claims refers to any and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0029] See also Figures 1 to 4As shown, an embodiment of the present invention discloses a current detection probe, including a current clamp 1 and a detection cable 2, wherein the detection cable 2 is electrically connected to the current clamp 1; the detection cable 2 includes a protective layer 21, an insulating layer 22, a probe core 23 and an inner conductor 24, wherein the inner conductor 24 is embedded in the probe core 23, the insulating layer 22 covers the probe core 23, and the protective layer 21 covers the insulating layer 22 and the current clamp 1.

[0030] Specifically, the current clamp 1, as a core component for realizing the current detection function, is electrically connected to the detection cable 2. The detection cable 2 plays the role of transmitting signals, and transmits the current signal detected by the current clamp 1 to the subsequent analysis equipment, so that the detected current data can be further processed and analyzed, thereby obtaining various information about the current. This connection method ensures the integrity and functionality of the entire detection system. The current clamp 1 is responsible for sensing the current, and the detection cable 2 is responsible for transmitting the signal. The two cooperate with each other to realize current detection, reduce the interference and loss of the signal during the transmission process, and ensure that the detected current signal can be accurately and completely transmitted to the subsequent analysis equipment, which is helpful for accurate analysis of the current data.

[0031] The inner conductor 24 is embedded in the probe core 23. The inner conductor 24 is a current carrier. When the current to be measured passes through the inner conductor 24, a magnetic field is generated. The function of the probe core 23 is to gather and enhance this magnetic field, making the magnetic field change more obvious for easy detection. The design of the probe core 23 around the inner conductor 24 can more efficiently sense the magnetic field changes generated by the current in the inner conductor 24, providing a basis for subsequent accurate detection of the current size and waveform. The insulating layer 22 covers the probe core 23 and plays a role of isolation and insulation. On the one hand, it isolates the probe core 23 from the external environment to prevent external factors from interfering with the induction of the magnetic field by the probe core 23, and on the other hand, it prevents electrical faults such as short circuits between the probe core 23 and other components. The protective layer 21 covers the insulating layer 22 and the current clamp 1. The existence of the protective layer 21 provides physical protection and electromagnetic shielding functions. It can not only protect the internal insulating layer 22, the probe core 23 and the current clamp 1 from external physical damage, but also block external electromagnetic interference, ensure that the internal current detection process is not affected by the external electromagnetic field, and ensure the accuracy of the detection.

[0032] The efficient induction of the magnetic field of the current in the inner conductor 24 by the probe core 23 and the blocking of external electromagnetic interference by the protective layer 21 greatly reduce the interference of external factors on current detection. Compared with traditional current detection equipment, this structure can more accurately detect the current in the inner conductor 24 and obtain a purer current signal, thereby improving the accuracy of current detection. At the same time, the dual protection of the insulating layer 22 and the protective layer 21 makes the internal structure of the current detection probe more stable. The insulating layer 22 prevents the occurrence of electrical faults, and the protective layer 21 protects the internal components from physical damage, extending the service life of the equipment and ensuring that the current detection probe can work stably in different environments.

[0033] In one embodiment, the probe core 23 includes a core layer 231 and a connecting coil 232 , the core layer 231 is embedded in the insulating layer 22 , one end of the connecting coil 232 is wound around the outer surface of the core layer 231 , and the other end passes through the insulating layer 22 and is connected to the current clamp 1 .

[0034] Specifically, the probe core 23 is composed of a core layer 231 and a connecting coil 232. The core layer 231 is the main part of the probe core 23 and is embedded in the insulating layer 22. It can be understood that the core layer 231 is made of a material with high magnetic permeability to gather and enhance the magnetic field generated by the current in the inner conductor 24. When current passes through the inner conductor 24, a magnetic field is generated around it. The core layer 231 can effectively concentrate these magnetic fields, making the magnetic field change more significant, thereby facilitating the subsequent detection and processing of the current signal.

[0035] One end of the connecting coil 232 is wound around the outer surface of the magnetic core layer 231. Through this winding method, the connecting coil 232 can closely interact with the magnetic core layer 231. Since the magnetic field gathered and enhanced by the magnetic core layer 231 will cut each other with the connecting coil 232, according to the principle of electromagnetic induction, an induced electromotive force will be generated in the connecting coil 232. The other end of the connecting coil 232 is connected to the current clamp 1 through the insulating layer 22. This connection method realizes the transmission of the current signal induced by the magnetic core layer 231 to the current clamp 1. The insulating layer 22 plays a good insulating protection role here, avoiding electrical faults such as short circuits between the connecting coil 232 and the outside world, and ensuring the stability and reliability of signal transmission.

[0036] Through such a structural design, the current signal is converted from the inner conductor 24 through the magnetic field of the magnetic core layer 231, and then transmitted to the current clamp 1 by the connecting coil 232. The advantage of this design is that it can effectively convert the current signal into an electrical signal form suitable for detection and processing by the current clamp 1. The cooperation between the magnetic core layer 231 and the connecting coil 232 enhances the induction strength of the signal and improves the sensitivity of current detection. The connection between the connecting coil 232 and the current clamp 1 provides a prerequisite for the subsequent amplification, analysis and processing of the current signal, which helps to obtain more accurate current measurement results. Compared with the traditional current detection structure, this design has higher efficiency and accuracy in signal sensing and transmission.

[0037] In one embodiment, a connection groove 2311 is formed on the outer surface of the magnetic core layer 231 , and the connection coil 232 is wound in the connection groove 2311 .

[0038] Specifically, a connection groove 2311 is provided on the outer surface of the magnetic core layer 231, which provides a specific space for the winding of the connection coil 232. This design enables the connection coil 232 to be accurately positioned during winding and fit tightly in the connection groove 2311. Compared with the method of directly winding on the outer surface of the magnetic core layer 231 without the connection groove 2311, the connection groove 2311 effectively prevents the displacement and loosening of the connection coil 232 on the surface of the magnetic core layer 231. During the use of the current detection probe, even if it is subjected to a certain degree of vibration or external interference, the connection coil 232 can still be stably maintained in the connection groove 2311, ensuring the reliability of the connection, thereby ensuring the stability of the current signal transmission. At the same time, it can be understood that the depth of the connection groove 2311 is greater than or equal to the diameter of the connection coil 232, so that when the connection coil 232 is wound in the connection groove 2311, the connection coil 232 will not protrude from the surface of the magnetic core layer 231, thereby making the layout of the connection coil 232 more regular and achieving a more reasonable structural arrangement in a limited space. Compared with the randomly wound connection coil 232, the connection coil 232 wound in the connection slot 2311 occupies less space, making the structure of the entire probe core 23 more compact. This compact structure is not only conducive to the miniaturized design of the current detection probe, but also convenient for integration with other components, providing convenience for the optimization and application expansion of the entire current detection probe. When the current in the inner conductor 24 generates a magnetic field and is concentrated and enhanced by the magnetic core layer 231, the connection coil 232 can more efficiently sense the magnetic field changes of the magnetic core layer 231. Since the connection coil 232 is tightly wound in the connection slot 2311, the coupling effect with the magnetic field of the magnetic core layer 231 is better. According to the principle of electromagnetic induction, this helps to generate a more stable and obvious induced electromotive force in the connection coil 232. Furthermore, a more stable induced electromotive force is transmitted to the current clamp 1 through the connection coil 232, which is conducive to improving the accuracy and sensitivity of current detection and reducing losses and interference during signal transmission.

[0039] In one embodiment, the connection slot 2311 is disposed in the middle section of the magnetic core layer 231 , and the current clamp 1 is vertically connected to the middle section of the magnetic core layer 231 through the connection coil 232 .

[0040] Specifically, the connection groove 2311 is provided in the middle section of the magnetic core layer 231, so that the connection coil 232 is wound in the area of ​​the magnetic field of the magnetic core layer 231 which is relatively uniform and strong. When a current passes through the inner conductor 24 to generate a magnetic field, the middle section of the magnetic core layer 231 can gather a relatively stable and concentrated magnetic field. The connection coil 232 is wound here, which can more efficiently sense the magnetic field changes of the magnetic core layer 231. According to the principle of electromagnetic induction, the induced electromotive force generated is more stable and significant. The current clamp 1 is vertically connected to the middle section of the magnetic core layer 231 through the connection coil 232. This vertical connection method helps to reduce interference on the signal transmission path, so that the current signal sensed by the connection coil 232 can be more directly and efficiently transmitted to the current clamp 1, thereby improving the accuracy and sensitivity of current detection. Compared with connecting at other positions of the magnetic core layer 231, vertical connection in the middle section can better utilize the magnetic field characteristics of the magnetic core layer 231 and optimize the signal sensing and transmission process. At the same time, the connection groove 2311 is set in the middle section of the magnetic core layer 231, and the current clamp 1 is vertically connected thereto, which optimizes the stability of the entire structure from a mechanical point of view. The vertical connection method makes the force distribution between the current clamp 1 and the magnetic core layer 231 more uniform. When the current detection probe is subjected to vibration or external force, compared with the non-vertical connection, the structure can remain more stable and reduce the risk of loose connection or component displacement due to uneven force. This helps to ensure that the connection between the current clamp 1 and the magnetic core layer 231 is always reliable in various complex use environments, ensuring the normal operation of the current detection probe and extending the service life of the equipment.

[0041] In one embodiment, a signal processing circuit is provided in the current clamp 1 , and the signal processing circuit is electrically connected to the magnetic core layer 231 through the connecting coil 232 .

[0042] Specifically, a signal processing circuit is provided in the current clamp 1 to realize the integration of the signal processing function. The traditional current detection system may require additional independent equipment to process the collected current signal, while the present design integrates the signal processing circuit into the current clamp 1, which reduces the external connection components of the system and reduces the risk of interference of the signal during transmission. At the same time, the integrated design makes the entire current detection probe structure more compact, convenient to carry and use, and improves the practicality and application flexibility of the device. The signal processing circuit is electrically connected to the magnetic core layer 231 through the connecting coil 232, thereby constructing a direct and coherent signal transmission and processing path. When the current in the inner conductor 24 generates a magnetic field, the magnetic core layer 231 senses and converts it into an electrical signal, and the connecting coil 232 transmits the signal directly to the signal processing circuit in the current clamp 1. This close connection method avoids the problems of attenuation and distortion that may occur when the signal is transmitted over long distances or passes through multiple connection points. The signal processing circuit can amplify, filter, shape, and process the signal transmitted from the magnetic core layer 231 in a timely and accurate manner, ensuring that the processed signal has a higher quality, and providing a reliable data basis for subsequent data analysis and application.

[0043] In one embodiment, a clamp adapter 3 is respectively provided at both ends of the detection cable 2, one end of the clamp adapter 3 is clamped to the end of the detection cable 2, and the other end is adapted to be connected to the circuit to be tested.

[0044] Specifically, one end of the clamp adapter 3 is fixed to the end of the detection cable 2 by means of a snap connection. The snap connection is a mechanical connection method, which tightly connects the clamp adapter 3 and the detection cable 2 through a specific bayonet, slot or buckle structure. The advantage of this connection method is that it is easy to operate. It can quickly connect and separate the two without the help of complex tools or cumbersome installation processes, thereby improving the efficiency of equipment assembly and disassembly. At the same time, the snap connection structure can ensure the firmness of the connection. During normal use, it will not easily fall off or loosen, ensuring a stable connection between the detection cable 2 and the clamp adapter 3.

[0045] The other end of the clamp adapter 3 is designed to be compatible with the circuit to be tested. This means that the interface shape, size, electrical characteristics, etc. of the clamp adapter 3 are specifically designed according to different types of circuits to be tested to ensure seamless connection with various circuits to be tested. This adaptability design takes into account the diversity of circuits to be tested in practical applications. Whether it is electronic devices of different brands and models, or circuits with different interface standards, they can be connected to the detection cable 2 by selecting a suitable clamp adapter 3, thereby applying the current detection probe to a wide range of test scenarios.

[0046] In one embodiment, two ends of the inner conductor 24 pass through the protective layer 21 , the insulating layer 22 and the probe magnetic core 23 and pass through the clamp adapter 3 , so that the inner conductor 24 is electrically connected to the clamp adapter 3 .

[0047] Specifically, the inner conductor 24 passes through the multi-layer structure of the protective layer 21, the insulating layer 22 and the probe core 23. The main function of the protective layer 21 is to protect the internal structure from external physical damage and electromagnetic interference. The insulating layer 22 is used to isolate the inner conductor 24 from other components to prevent short circuits. The probe core 23 is used to sense the magnetic field generated by the current of the inner conductor 24 to achieve current detection. Both ends of the inner conductor 24 pass through these layered structures and are finally passed through the clamp adapter 3. This design ensures a direct electrical connection between the inner conductor 24 and the clamp adapter 3. Through this connection method, when the current in the circuit to be tested flows into the inner conductor 24, it can be smoothly transmitted through the clamp adapter 3 to the detection cable 2 and then reach the current clamp 1, realizing the construction of a complete path for the current from the circuit to be tested to the detection equipment.

[0048] The inner conductor 24 is directly passed through the clamp adapter 3 and electrically connected thereto, providing a stable and continuous path for current transmission. It is understandable that the clamp adapter 3 is provided with a connection channel 31 for the inner conductor 24 to pass through and fix the inner conductor 24, and a fixing seat 33 for fixing the outer surface of the detection cable 2. Compared with other methods that may have indirect connections or unstable connections, this direct connection greatly reduces the contact resistance. The stable electrical connection ensures the integrity of the current signal during transmission, reduces the risk of signal distortion and attenuation, and ensures that the current detection probe can accurately sense the current size and changes in the circuit to be tested, thereby improving the measurement accuracy. At the same time, the protective layer 21 wraps the part through which the inner conductor 24 passes and the entire connection structure, which can better play the role of electromagnetic shielding. When the inner conductor 24 transmits current, a certain electromagnetic field will be generated, and the external electromagnetic field may also interfere with the current signal in the inner conductor 24. The presence of the protective layer 21 can block the leakage of the electromagnetic field of the inner conductor 24, and prevent the external electromagnetic field from interfering with the current signal of the inner conductor 24, ensuring that the current detection process is not affected by the external electromagnetic environment, thereby obtaining a purer and more accurate current detection result and meeting the electromagnetic compatibility (EMC) requirements.

[0049] In one embodiment, the clamp adapter 3 adopts an IPEX interface 32 .

[0050] Specifically, in this embodiment, the clamp adapter 3 preferably adopts an IPEX interface 32. The IPEX interface 32 has extremely low insertion loss. In the process of transmitting the current signal from the circuit to be tested through the detection cable 2 to the current clamp 1, the low insertion loss IPEX interface 32 can minimize the attenuation of the signal. Compared with other common interfaces, the IPEX interface 32 can ensure that a more complete and accurate current signal is transmitted to the current clamp 1, thereby improving the accuracy of current detection. In addition, its good anti-interference performance can effectively resist the influence of external electromagnetic interference on the current signal. In a complex electromagnetic environment, ordinary interfaces may cause the current signal to be mixed with noise, resulting in deviations in the detection results, while the IPEX interface 32 relies on its excellent anti-interference ability to ensure the purity of the signal and provide strong support for the accurate detection of the current size and waveform. At the same time, the IPEX interface 32 package occupies a small board area, which allows the current detection probe to be more flexibly arranged on a single board when connected to the circuit to be tested. In modern electronic equipment, the circuit board space is becoming more and more compact, and strict requirements are placed on the space occupied by the test equipment interface. The clamp adapter 3 with the IPEX interface 32 does not occupy too much space on the single board, is convenient for installation and connection in a narrow circuit board area, and improves the applicability of the current detection probe in various devices.

[0051] It is understandable that the circuit under test is provided with an adapter seat adapted to the clamp adapter 3, thereby ensuring that the two can be accurately connected. The adapted interface shape, size and electrical characteristics enable the clamp adapter 3 to be firmly inserted into the adapter seat. This tight and precise connection method reduces the problem of poor contact caused by mismatched connections. During the current detection process, a stable connection can ensure that the current signal is reliably transmitted from the circuit under test to the current detection probe, providing a basis for obtaining accurate current measurement results. Compared with mismatched connection methods, this adaptation design greatly improves the reliability of the connection and reduces the risk of interruption during signal transmission.

[0052] Furthermore, in the normal working state without current testing, the adapter cable 4 of suitable length can also be electrically connected to the adapter seat to ensure the normal conduction of the circuit. One end of the adapter cable 4 is connected to the current clamp 1, and the other end is connected to the adapter seat, so as to fill the circuit gap when the current detection probe is not connected, so that the current can flow in the circuit according to the original path. This avoids the situation where the circuit is interrupted due to the removal of the current detection probe, thereby affecting the normal operation of the equipment. Whether it is for the continuous operation of equipment on the production line or for electronic systems that need to maintain stable power supply, it is very important to maintain circuit continuity to ensure the stability and reliability of the entire system. At the same time, when the current detection probe is not in use, the circuit can still remain intact and work normally, which enhances the flexibility of the equipment. Users can install or remove the current detection probe for testing at any time according to actual needs without permanent modification of the circuit. For equipment that needs to be switched for use in different scenarios, the current detection probe can be connected to obtain relevant data when the current needs to be tested, and the circuit can be maintained through the adapter cable 4 during daily operation, which meets the diverse use needs and expands the scope of application of the equipment.

[0053] In one embodiment, the protective layer 21 , the insulating layer 22 , and the probe magnetic core 23 are extruded onto the surface of the inner conductor 24 in a three-layer co-extrusion form.

[0054] Specifically, the three-layer co-extrusion process realizes the synchronous extrusion coating of the protective layer 21, the insulating layer 22 and the probe core 23 on the surface of the inner conductor 24, integrating the multi-layer structure manufacturing process that may have required multiple production steps to complete into a continuous process. Compared with the traditional layered manufacturing and then assembly method, the production cycle is greatly shortened and the production efficiency is improved. It reduces the manual intervention and assembly links in the production process, reduces the product quality differences caused by human factors, and is conducive to large-scale and standardized production. At the same time, the close combination of the insulating layer 22 and the protective layer 21 can provide more reliable insulation and electromagnetic shielding performance. The insulating layer 22 can effectively isolate the inner conductor 24 from the outside world, prevent leakage and short circuit, and ensure safe use. The protective layer 21 can block external electromagnetic interference and prevent the electromagnetic field generated by the inner conductor 24 from leaking out, ensuring that the current detection probe can accurately detect the current signal in a complex electromagnetic environment, thereby improving the accuracy and reliability of the detection result; the close fit and precise positional relationship between the probe magnetic core 23 and the inner conductor 24 are conducive to the probe magnetic core 23 better sensing the magnetic field generated by the current in the inner conductor 24, thereby improving the sensitivity and stability of the magnetic field sensing. As a result, the current detection probe can more accurately detect the current size and waveform, meeting the needs of high-precision current detection.

[0055] In one embodiment, the protective layer 21 is an integrated structure.

[0056] Specifically, the protective layer 21 of the integrated structure does not have a splicing gap, which makes the protective layer 21 more solid at the physical level. When the current detection probe is subjected to external physical impact, vibration or stretching, the integrated structure can evenly disperse the stress and effectively avoid rupture and damage caused by stress concentration at the gap. Compared with the spliced ​​protective layer 21, the integrated structure greatly improves the ability of the protective layer 21 to resist external forces, ensures that the internal insulation layer 22, the probe core 23 and the inner conductor 24 and other components are reliably protected, maintains the integrity of the current detection probe structure, and extends the service life of the equipment. When used in a humid, dusty or corrosive environment, it is difficult for moisture, dust and corrosive substances to penetrate into the protective layer 21, avoiding erosion of internal sensitive components. This not only ensures that the electrical performance of the current detection probe is not affected, but also reduces equipment failures caused by environmental factors, so that the current detection probe can adapt to a wider range of application scenarios and enhances its applicability in harsh environments. At the same time, the complete integrated protective layer 21 can form a continuous and closed electromagnetic shielding space. When there is electromagnetic interference from the outside, the integrated protective layer 21 can more effectively block the interference magnetic field from entering the interior, and prevent the magnetic field generated by the current in the inner conductor 24 from leaking out. This good electromagnetic shielding performance ensures that the current detection probe can work normally in a complex electromagnetic environment, reduces the impact of external electromagnetic interference on the detection results, improves the accuracy and stability of the detection data, and ensures that the current signal obtained by the current detection probe is true and reliable, meeting the electromagnetic compatibility (EMC) requirements.

[0057] The above examples are only used to further illustrate the technical content of the present invention, so that readers can understand it more easily, but they do not mean that the implementation of the present invention is limited to this. Any technical extension or re-creation made according to the present invention is protected by the present invention. The protection scope of the present invention shall be subject to the claims.

Claims

1. A current detection probe, characterized in that: It comprises a current clamp and a detection cable, wherein the detection cable is electrically connected to the current clamp; the detection cable comprises a protective layer, an insulating layer, a probe core and an inner conductor, wherein the inner conductor is embedded in the probe core, the insulating layer covers the probe core, and the protective layer covers the insulating layer and the current clamp.

2. A current detection probe according to claim 1, characterized in that: The probe magnetic core comprises a magnetic core layer and a connecting coil. The magnetic core layer is embedded in the insulating layer. One end of the connecting coil is wound around the outer surface of the magnetic core layer, and the other end passes through the insulating layer and is connected to the current clamp.

3. A current detection probe according to claim 2, characterized in that: The outer surface of the magnetic core layer is provided with a connection groove, and the connection coil is wound in the connection groove.

4. A current detection probe according to claim 3, characterized in that: The connection groove is arranged in the middle section of the magnetic core layer, and the current clamp is vertically connected to the middle section of the magnetic core layer through the connection coil.

5. A current detection probe according to claim 2, characterized in that: A signal processing circuit is provided in the current clamp, and the signal processing circuit is electrically connected to the magnetic core layer through the connecting coil.

6. The current detection probe according to claim 1, characterized in that: A clamp adapter is respectively provided at both ends of the detection cable, one end of the clamp adapter is clamped to the end of the detection cable, and the other end is adapted to be connected to the circuit to be tested.

7. A current detection probe according to claim 6, characterized in that: Two ends of the inner conductor pass through the protective layer, the insulating layer and the probe magnetic core and pass through the clamp adapter, so that the inner conductor is electrically connected to the clamp adapter.

8. A current detection probe according to claim 7, characterized in that: The clamp adapter adopts an IPEX interface.

9. The current detection probe according to claim 1, characterized in that: The protective layer, the insulating layer and the probe magnetic core are extruded onto the surface of the inner conductor in a three-layer co-extrusion form.

10. The current detection probe according to claim 1, characterized in that: The protective layer is an integrated structure.

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