Demagnetization device and method for Hall current sensor, and control device
By using reference sensors and signal processing units in Hall current sensors to generate demagnetization signals, eliminating the hysteresis magnetic field of the magnetic core component, solving the problem of hysteresis error in Hall current sensor in power-off state, and improving the current detection accuracy.
Patent Information
- Application Number
- CN202411975992.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-31
- Publication Date
- 2025-07-11
- Estimated Expiration
- 2044-12-31
AI Technical Summary
The magnetization remaining in the core of the Hall current sensor during the power-off state causes hysteresis errors, affecting the current detection accuracy.
The reference sensor and the signal processing unit are used to generate a demagnetization signal with a decrease in amplitude and alternating directions in the power-off state, and the current discharge is applied to the primary side to eliminate the magnetic field of the magnetic core member.
It effectively eliminates the hysteresis magnetic field of the magnetic core parts, improves current detection accuracy, is simple in structure and convenient in operation, and is suitable for the research and improvement of Hall current sensors and production process.
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Figure CN119694713B_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the technical field of current sensors, and particularly to a demagnetization device and method for a Hall current sensor, as well as a control device. Background Art
[0002] Current sensors are applied in various industries such as batteries, converters, chargers, renewable energy, industry, and motor vehicles. Currently, the main current sensors for detecting current are shunts, current transformers, Hall current sensors, magnetoresistance, and fluxgate technology current sensors.
[0003] Among them, the Hall current sensor based on the Hall effect has been widely applied because it belongs to non-contact measurement and has good reliability and low power consumption. According to the structure and magnetic flux measurement method, the Hall current sensor can be divided into an open-loop type and a closed-loop type. Taking the open-loop Hall current sensor as an example, a magnetic core is installed in the installation space of its installation shell. The magnetic core has an open air gap formed between the two end portions of the magnetic core. The magnetic core is installed in the outer shell, and the Hall chip is inserted into the open air gap through the outer shell.
[0004] In the open-loop Hall current sensor as described above, relatively weak magnetization remains in the magnetic core. Due to the residual magnetization remaining in the magnetic core, even in a zero magnetic field, a residual magnetic flux is generated from the magnetic core, and the Hall chip generates a hysteresis error due to detecting the residual magnetic flux, affecting the accuracy of current detection. Therefore, how to obtain the hysteresis characteristics of the Hall current sensor is of extremely important significance for the research and production process of the Hall current sensor. Summary of the Invention
[0005] In view of the deficiencies of the above-mentioned related technologies, the purpose of the present disclosure is to provide a demagnetization device, demagnetization method, and control device for a current sensor, which can better study the hysteresis characteristics of the Hall current sensor and is also beneficial to the improvement of the production process of the Hall current sensor.
[0006] The first aspect of the present disclosure provides a demagnetization device for a Hall current sensor. The Hall current sensor includes an installation shell, a magnetic core component, a primary current bar, and a Hall chip. The demagnetization device includes:
[0007] A reference sensor, associated with the primary current bar, for collecting a magnetic field signal corresponding to the primary current flowing through the primary current bar; and
[0008] A signal processing unit, connected to the Hall chip, the reference sensor, and the primary current busbar, is configured to generate a demagnetization signal with a decreasing amplitude and alternating positive and negative directions and apply the demagnetization signal to the primary current busbar to complete the demagnetization of the magnetic core when the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux of the magnetic core detected by the Hall chip is non-zero in a case where the primary current busbar is powered off; the demagnetization signal gradually decays from a set value to zero within a preset demagnetization time, wherein the signal amplitude in a subsequent period of the demagnetization signal is smaller than that in a previous period.
[0009] In some examples of the first aspect, the reference sensor is a fluxgate sensor sleeved on the primary current busbar.
[0010] In some examples of the first aspect, the signal processing unit includes: a control device connected to the Hall chip and the reference sensor; a signal generator controlled by the control device for generating a demagnetization signal; and a signal amplifier connected to the signal generator and the primary current busbar for amplifying the demagnetization signal generated by the signal generator and applying the amplified demagnetization signal to the primary current busbar.
[0011] In some examples of the first aspect, the demagnetization signal is a demagnetization voltage signal, and the demagnetization voltage signal is implemented as a sine wave signal, or a square wave signal, or a trapezoidal wave signal, or a triangular wave signal.
[0012] A second aspect of the present disclosure provides a demagnetization method for a Hall current sensor, which is applied to the demagnetization device of the Hall current sensor as described above. The demagnetization method for the Hall current sensor includes the following steps:
[0013] Detecting the magnetic flux of the magnetic core by using a Hall chip and collecting the magnetic field signal corresponding to the primary current flowing through the primary current busbar by using a reference sensor; and
[0014] In a case where the primary current busbar is powered off, when the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux of the magnetic core detected by the Hall chip is non-zero, generating a demagnetization signal with a decreasing amplitude and alternating positive and negative directions by using the signal processing unit and applying the demagnetization signal to the primary current busbar to complete the demagnetization of the magnetic core; the demagnetization signal gradually decays from a set value to zero within a preset demagnetization time, wherein the signal amplitude in a subsequent period of the demagnetization signal is smaller than that in a previous period.
[0015] In certain examples of the second aspect, a demagnetization signal with a decreasing amplitude and alternating positive and negative directions is generated by the signal processing unit, and the demagnetization signal is applied to the primary current busbar, including the following steps: generating a demagnetization signal with a decreasing amplitude and alternating positive and negative directions; amplifying the demagnetization signal and applying the amplified demagnetization signal to the primary current busbar.
[0016] In certain examples of the second aspect, the demagnetization method further includes the following steps: after demagnetization is completed within a predetermined demagnetization time, determining whether the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and whether the magnetic flux of the magnetic core component detected by the Hall chip is zero; if it is determined that the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is zero, it indicates that demagnetization is successful; if it is determined that the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is non-zero, it indicates that demagnetization fails.
[0017] In certain examples of the second aspect, the demagnetization method further includes the following steps: if demagnetization is not completed within a predetermined demagnetization time, it indicates that demagnetization fails.
[0018] In certain examples of the second aspect, the demagnetization method further includes the following steps: when demagnetization fails, adjusting the demagnetization signal by the signal processing unit; the adjusting of the demagnetization signal includes at least one of adjusting the amplitude of the demagnetization signal and adjusting the demagnetization time.
[0019] In certain examples of the second aspect, the demagnetization signal is a demagnetization voltage signal, and the demagnetization voltage signal is implemented as a sine wave signal, or a square wave signal, or a trapezoidal wave signal, or a triangular wave signal.
[0020] A third aspect of the present disclosure provides a control device, including:
[0021] A processor;
[0022] A memory storing a demagnetization program;
[0023] Wherein, when the demagnetization program is run by the processor, it executes the demagnetization method of the Hall current sensor as described above.
[0024] As described above, the degaussing device and method for a Hall current sensor provided in the embodiments of the present disclosure, the degaussing device includes: a reference sensor and a signal processing unit. When the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is non-zero when the primary current busbar is powered off, the signal processing unit generates a degaussing signal with a decreasing amplitude and alternating positive and negative directions, and applies the degaussing signal to the primary current busbar, so that the hysteresis magnetic field of the magnetic core component gradually decreases until it becomes zero to achieve degaussing. Compared with the related technologies of degaussing by heating degaussing or applying a reverse magnetic field, etc., it has the advantages of simple structure, convenient operation, and good degaussing effect, can study the hysteresis characteristics of the Hall current sensor, and is beneficial to the research of the Hall current sensor and the improvement of its production process. Description of the Drawings
[0025] Figure 1 It shows a schematic structural diagram of the Hall sensor of the present disclosure in an embodiment.
[0026] Figure 2 It shows Figure 1 a schematic structural diagram of the mounting shell in.
[0027] Figure 3 It shows Figure 1 a schematic structural diagram of the magnetic core component in.
[0028] Figure 4 It shows a schematic structural diagram of the Hall sensor of the present disclosure in another embodiment.
[0029] Figure 5 It shows a schematic structural diagram of the magnetic core component in another embodiment.
[0030] Figure 6 It shows Figure 1 a three-dimensional structure diagram of the magnetic core component in.
[0031] Figure 7 It shows a schematic structural diagram of the degaussing device of the Hall sensor of the present disclosure in an embodiment.
[0032] Figure 8 It shows a schematic structural diagram of the degaussing device of the Hall sensor of the present disclosure in another embodiment.
[0033] Figure 9 It shows a signal schematic diagram of the degaussing signal applied to the primary current busbar in an embodiment.
[0034] Figure 10 and Figure 11 It shows a signal schematic diagram of the degaussing signal applied to the primary current busbar in other embodiments.
[0035] Figure 12 It shows a schematic flowchart of the demagnetization method of the Hall sensor of the present disclosure in an embodiment.
[0036] Figure 13 It shows a detailed schematic flowchart of the demagnetization method of the Hall sensor of the present disclosure in an embodiment.
[0037] Figure 14 It shows a schematic structural diagram of the control device of the present disclosure in an embodiment. Detailed implementation manners
[0038] The following uses specific examples to illustrate the implementation manners of the present disclosure. Those skilled in the art can easily understand other advantages and effects of the present disclosure from the information disclosed in the present disclosure. The present disclosure can also be implemented or applied through different specific implementation manners. Various details in the present disclosure can also be modified or changed according to different viewpoints and application circuits without departing from the spirit of the present disclosure. It should be noted that, without conflict, the embodiments and features in the embodiments of the present disclosure can be combined with each other.
[0039] The following takes the drawings as a reference and details the embodiments of the present disclosure so that those skilled in the technical field to which the present disclosure belongs can easily implement it. The present disclosure can be embodied in many different forms and is not limited to the embodiments described herein.
[0040] In the description of the present disclosure, the reference terms such as "an embodiment", "certain embodiments", "example", "specific example", or "some examples", etc., mean that the specific features, structures, materials, or characteristics represented in connection with the embodiment or example are included in at least one embodiment or example of the present disclosure. Moreover, the specific features, structures, materials, or characteristics represented can be combined in a suitable manner in any one or a group of embodiments or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments or examples represented in the present disclosure and the features of different embodiments or examples.
[0041] In addition, the terms "first" and "second" are only used for the purpose of indication and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" can explicitly or implicitly include at least one of the features. In the description of the present disclosure, the meaning of "a group" is two or more unless otherwise specifically defined.
[0042] To clearly illustrate the present disclosure, devices irrelevant to the description are omitted, and the same or similar components throughout the specification are given the same reference numerals.
[0043] Throughout the specification, when it is said that a device is "connected" to another device, this includes not only the case of "direct connection", but also the case of "indirect connection" in which other elements are placed in between. Additionally, when it is said that a certain device "includes" a certain component, unless there is a particularly contrary record, it does not exclude other components, but means that other components may also be included.
[0044] Although in some examples the terms first, second, etc. are used herein to denote various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another. For example, a first interface and a second interface, etc. are indicated. Furthermore, as used herein, the singular forms "a", "an", and "the" are also intended to include the plural forms unless the context indicates otherwise. It should be further understood that the terms "comprising", "including" indicate the presence of the stated features, steps, operations, elements, circuits, items, kinds, and / or groups, but do not exclude the presence, occurrence, or addition of one or a group of other features, steps, operations, elements, circuits, items, kinds, and / or groups. The terms "or" and "and / or" used herein are interpreted as inclusive, or meaning any one or any combination. Thus, "A, B, or C" or "A, B, and / or C" means "any one of the following: A; B; C; A and B; A and C; B and C; A, B, and C". An exception to this definition only occurs when the combination of elements, functions, steps, or operations is inherently mutually exclusive in some way.
[0045] The technical terms used herein are only applicable to referring to specific embodiments and are not intended to limit the present disclosure. The singular forms used herein also include the plural forms as long as the statement does not clearly indicate the contrary meaning. The meaning of "including" used in the specification is to embody specific characteristics, regions, integers, steps, operations, elements, and / or components, and does not exclude the existence or addition of other characteristics, regions, integers, steps, operations, elements, and / or components.
[0046] Although not defined differently, including the technical terms and scientific terms used herein, all terms have the same meaning as generally understood by those skilled in the technical field to which the present disclosure pertains. Terms defined in commonly used dictionaries are additionally interpreted as having a meaning consistent with the relevant technical literature and the currently presented information, and should not be over-interpreted as ideal or overly formulaic meanings as long as they are not defined.
[0047] In a traditional Hall current sensor, even in the power-off state, there will be residual magnetic domain magnetization in the magnetic core component, generating residual magnetic flux. The Hall chip generates a hysteresis error due to detecting this residual magnetic flux, affecting the accuracy of current detection.
[0048] In view of this, embodiments of the present disclosure provide a demagnetization device and a demagnetization method for a Hall current sensor to solve the problems in the related art.
[0049] The Hall current sensor in the embodiments of the present disclosure can be applied to various industries such as batteries, converters, chargers, renewable energy, industry, and motor vehicles. Taking battery management as an example, the Hall current sensor can detect abnormal battery current in a timely manner, such as excessive current, thereby triggering corresponding protection measures, such as disconnecting the battery charging and discharging circuit, to ensure the safe operation of the battery. By real-time monitoring of the current in the battery pack, the Hall current sensor can provide accurate data support for the energy management system. In addition, according to the output of the Hall current sensor, the charging and discharging strategy of the battery can be optimized, thereby improving the energy utilization efficiency of the entire system.
[0050] Please refer to Figures 1 to 3 , in which Figure 1 is shown as a schematic structural diagram of the Hall sensor in an embodiment, Figure 2 is shown as Figure 1 a schematic structural diagram of the mounting shell in Figure 3 is shown as Figure 1 a schematic structural diagram of the magnetic core component in
[0051] Combined with Figures 1 to 3 , the Hall sensor includes: a mounting shell 11, a magnetic core component 13, a primary current bar 15, and a Hall chip 17.
[0052] The mounting shell 11 is a shell structure made of an insulating material and has a mounting space 101, and the size of the mounting space 101 is adapted to the magnetic core component 13.
[0053] The magnetic core component 13 is installed in the mounting space 111 of the mounting shell 11.
[0054] In the disclosed embodiments of the present application, the Hall sensor can adopt an open-loop Hall sensor.
[0055] As shown in the figure, the magnetic core component 13 has a plugging channel 131, and the mounting shell 11 is provided with a notch 133 corresponding to the plugging channel 131. The cross-sectional size of the plugging channel 131 is adapted to the primary current bar 15, and the primary current bar 15 penetrates through the mounting shell 11 in a manner of being plugged into the plugging channel 131, and the mounting shell 11 is provided with a through hole 115 for the primary current bar 15 to penetrate through.
[0056] The cross-sectional shape of the plugging channel in the magnetic core component 13 is the same as that of the primary current bar 15. Exemplarily, in the embodiment as shown in Figure 1 , the primary current bar 15 is set in a rectangular body shape, and the cross-section of the plugging channel 131 of the magnetic core component 13 is rectangular. However, it is not limited thereto. Please refer toFigure 4 Exemplarily, the primary current bus bar 15' is arranged in a cylindrical shape, the cross-section of the insertion channel of the magnetic core member 13' is circular, and the installation space of the installation shell 11' is circular and adapted to the magnetic core member 13'.
[0057] The primary current bus bar 15 is a metal conductor for conducting the primary current. Exemplarily, the primary current bus bar 15 can be, for example, a live copper bus bar. The two opposite ends of the live copper bus bar can be respectively connected to the terminal blocks. During testing, one end can be connected to the positive electrode and the other end can be connected to the negative electrode.
[0058] The magnetic core member 13 also has a notch 133. The notch 133 is located on the side of the magnetic core member 13 and extends into the insertion channel 131 and communicates with the insertion channel 131. An installation groove 113 is formed in the installation shell 11 corresponding to the notch 133 of the magnetic core member 13, that is, a part of the installation shell 11 is recessed in the notch 133 of the magnetic core member 13 to form the installation groove 113 in the notch 133.
[0059] In the embodiment as Figure 3 shown, the magnetic core member is configured as a magnetic core (in the following description of Figure 3 , the magnetic core member is identified as 13). The magnetic core member 13 forms an insertion channel 131 in a form with two opposite ends. The notch 133 is formed between the two opposite ends of the magnetic core. However, it is not limited thereto. Please refer to Figure 5 Exemplarily, the magnetic core member is configured as two magnetic cores, which can be called the first magnetic core 132 and the second magnetic core 134. The first magnetic core 132 includes a first end 132a and a second end 132b, and the second magnetic core 134 includes a first end 134a and a second end 134b. The first magnetic core 132 and the second magnetic core 134 form an insertion channel 131 in a form where the first end 132a of the first magnetic core 132 abuts against the first end 134a of the second magnetic core 134 and the second end 132b of the first magnetic core 132 is spaced opposite to the second end 134b of the second magnetic core 134. The notch 133 is formed between the second end 132b of the first magnetic core 132 and the second end 134b of the second magnetic core 134.
[0060] Still taking the magnetic core member 13 in Figure 3 as an example, in some alternative embodiments, as Figure 6As shown, the magnetic core component 13 may include a plurality of magnetic chips 130. Each magnetic chip 130 forms an insertion interface 1310, and the size of the insertion interface 1310 is adapted to the primary current bus 15. The plurality of magnetic chips 130 are stacked in a form corresponding to the insertion interfaces 1310 to form the magnetic core component 13. The insertion interfaces 1310 of the plurality of magnetic chips 130 communicate with each other to form an insertion channel 131 with a certain length. The magnetic core component 13 formed by stacking the plurality of magnetic chips 130 is installed in the installation space 111 of the installation housing 11, and the primary current bus 15 penetrates the installation housing in a manner of simultaneously inserting the insertion channel 131 of the magnetic core component 13 formed by stacking the plurality of magnetic chips 130.
[0061] The Hall chip 17 is installed in the installation groove 113. The Hall chip 17 may include a chip body and a plurality of pins. The plurality of pins extend from the chip body. The chip body of the Hall chip 17 is inserted into the installation groove 113 of the installation housing 11 and the plurality of pins of the Hall chip 17 can extend out. In this way, the Hall chip 17 is insulated from the primary current bus 15 and the magnetic core component 13 through the installation housing 11.
[0062] In this way, when measuring the current of the primary current bus 15, the non-insulated design between the magnetic core component 13 and the primary current bus 15 enables the magnetic core component 13 to be designed smaller and the overall structure to be more compact compared with the related art, effectively reducing the overall size of the Hall current sensor component. Those skilled in the art can understand that for the same magnitude of the current to be measured, the smaller the size of the magnetic core component 13 in the direction where the notch 133 extends towards the insertion channel 131, the greater the corresponding induced magnetic induction intensity and the higher the measurement accuracy of the Hall current sensor. Therefore, the non-insulated design between the magnetic core component 13 and the primary current bus 15 enables the magnetic core component 13 to be designed smaller and the measurement accuracy to be higher.
[0063] Generally, for a Hall current sensor, when powered on, the primary current I p flows through the primary current bus 15, generating a magnetic field. The generated magnetic field is accumulated by the magnetic core component 13, and the Hall chip 17 located at the air gap of the magnetic core component 13 detects the magnetic flux of the magnetic core component 13, and the magnitude of the primary current I p flowing through the primary current bus 15 is obtained by detecting the magnetic flux of the Hall chip. When powered off, the primary current I p flowing through the primary current bus 15 is zero, the magnetic field in the magnetic core component 13 is zero, the magnetic flux of the magnetic core component 13 detected by the Hall chip 17 is zero, and the detected current is zero. However, in practical applications, when powered off, the primary current I pIt is zero, but there is a weak residual magnetization in the magnetic core component 13, generating a residual magnetic flux (which can also be called hysteresis). The Hall chip 17 can still detect the residual magnetic flux in the magnetic core component 13 and obtain a corresponding detection current, affecting the accuracy of current detection. Therefore, it is necessary to demagnetize the magnetic core component 13 with hysteresis.
[0064] Please refer to Figure 7 , which shows a schematic structural diagram of the demagnetization device of the Hall current sensor of the present disclosure in an embodiment.
[0065] As Figure 7 shown, the demagnetization device of the Hall current sensor of the present disclosure includes a reference sensor 21 and a signal processing unit 23.
[0066] As described above, the Hall chip 17 can determine the magnetic field signal of the magnetic core component 13 by detecting the magnetic flux of the magnetic core component 13.
[0067] In some embodiments, if the magnetic flux detected by the Hall chip 17 is zero, the magnetic field signal of the magnetic core component 13 can be determined to be zero; if the magnetic flux of the Hall chip is detected to be non-zero, the magnetic field signal of the magnetic core component 13 can be determined to be non-zero.
[0068] The reference sensor 21 is associated with the primary current busbar 15 and is used to collect the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15.
[0069] In some embodiments, the reference sensor 21 is a fluxgate sensor, and the fluxgate sensor is sleeved on the primary current busbar. Compared with the magnetic core component 13, the fluxgate sensor has the advantages of high sensitivity, high measurement accuracy, and no hysteresis. The fluxgate sensor can accurately reflect the magnetic field signal of the primary current busbar 15, that is, if the primary current I p of the primary current busbar 15 is zero, the magnetic field signal collected by the fluxgate sensor is zero.
[0070] The signal processing unit 23 is connected to the Hall chip 17, the reference sensor 21, and the primary current busbar 15.
[0071] In some embodiments, the signal processing unit 23 can be connected to the Hall chip 17 and the reference sensor 21 through a CAN bus, a USB data cable, etc.
[0072] The signal processing unit 23 can receive the magnetic flux of the magnetic core member 13 detected by the Hall chip 17 and the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15 collected by the reference sensor 21. Based on the comparison between the magnetic flux of the magnetic core member 13 detected by the Hall chip 17 and the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15, it can be determined whether there is magnetic hysteresis in the magnetic core member 13. For example, when there is no current passing through the primary current busbar 15 in the power-off state, the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15 collected by the reference sensor 21 is zero. If the magnetic flux of the magnetic core member 13 detected by the Hall chip 17 is zero, it indicates that there is no magnetic hysteresis in the magnetic core member 13. If the magnetic flux of the magnetic core member 13 detected by the Hall chip 17 is non-zero, it indicates that there is magnetic hysteresis in the magnetic core member 13.
[0073] In an embodiment of the present disclosure, when the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15 collected by the reference sensor 21 is zero and the magnetic flux of the magnetic core member 13 detected by the Hall chip 17 is non-zero when the primary current busbar 15 is in the power-off state, the signal processing unit 23 generates a demagnetization signal with a decreasing amplitude and alternating positive and negative directions, and applies the demagnetization signal to the primary current busbar 15, so that the magnetic core member 13 eliminates the magnetic field under the action of the demagnetization signal flowing through the primary current busbar 15.
[0074] In practical applications, the demagnetization signal gradually decays from a set value to zero within a preset demagnetization time, wherein the signal amplitude in the latter period is smaller than that in the previous period, that is, the signal amplitude of the demagnetization signal gradually decays until it becomes zero within the period.
[0075] Please refer to Figure 8 , which shows a schematic structural diagram of the demagnetization device of the Hall current sensor of the present disclosure in another embodiment.
[0076] As Figure 8 shown, the Hall current sensor of the present disclosure includes a reference sensor 21 and a signal processing unit, and the signal processing unit may further include: a control device 231, a signal generator 233, and a signal amplifier 235.
[0077] As described above, the Hall chip 17 can determine the magnetic field signal of the magnetic core member 13 by detecting the magnetic flux of the magnetic core member 13.
[0078] In some embodiments, if the magnetic flux detected by the Hall chip 17 is zero, the magnetic field signal of the magnetic core member 13 can be determined to be zero; if the magnetic flux of the Hall chip is detected to be non-zero, the magnetic field signal of the magnetic core member 13 can be determined to be non-zero.
[0079] The reference sensor 21 is associated with the primary current busbar 15 and is used to collect the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15.
[0080] In some embodiments, the reference sensor 21 is a fluxgate sensor, and the fluxgate sensor is sleeved on the primary current bar. Compared with the magnetic core member 13, the fluxgate sensor has the advantages of high sensitivity, high measurement accuracy, and no hysteresis. The fluxgate sensor can accurately reflect the magnetic field signal of the primary current bar 15, that is, if the primary current I of the primary current bar 15 p is zero, the magnetic field signal collected by the fluxgate sensor corresponding to it is zero.
[0081] The control device 231 is connected to the Hall chip 17 and the reference sensor 21, and can receive the magnetic flux detected by the Hall chip 17 and the magnetic field signal corresponding to the primary current flowing through the primary current bar 15 collected by the reference sensor 21. Based on the comparison between the detected magnetic flux and the magnetic field signal corresponding to the primary current flowing through the primary current bar 15, it can be determined whether there is a hysteresis phenomenon in the magnetic core member 13. For example, when there is no current passing through the primary current bar in the power-off state, the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor 21 is zero. If the Hall chip 17 detects that the magnetic flux of the magnetic core member 13 is zero, it indicates that there is no hysteresis phenomenon in the magnetic core member 13. If the Hall chip 17 detects that the magnetic flux of the magnetic core member 13 is non-zero, it indicates that there is a hysteresis phenomenon in the magnetic core member 13.
[0082] In the embodiments of the present disclosure, when the magnetic field signal corresponding to the primary current flowing through the primary current bar 15 collected by the reference sensor 21 is zero and the Hall chip 17 detects that the magnetic flux of the magnetic core member 13 is non-zero when the primary current bar 15 is in the power-off state, the control device 231 generates a degaussing command to the signal generator.
[0083] In some alternative embodiments, the control device 231 can be implemented as an industrial computer. In some embodiments, the control device 231 can be connected to the Hall chip 17 and the reference sensor 21 through a CAN bus, a USB data cable, etc.
[0084] The signal generator 233 is controlled by the control device 231 and is used to generate a degaussing signal. The degaussing signal is a weak signal, which gradually decays from a set value to zero within a preset degaussing time, wherein the amplitude of the excitation voltage in the latter period is smaller than the amplitude of the excitation voltage in the previous period. Exemplarily, the degaussing signal can be, for example, a degaussing voltage signal.
[0085] The signal amplifier 235 is connected to the signal generator 233 and the primary current bar 15, and is used to amplify the degaussing signal generated by the signal generator 233 and apply the amplified degaussing signal to the primary current bar 15.
[0086] Please refer to Figure 9, which shows a signal schematic diagram of the demagnetization signal applied to the primary current busbar in an embodiment. As Figure 9 shown, the applied demagnetization signal can be, for example, a demagnetization voltage signal, which is implemented as a sinusoidal wave signal with positive and negative alternations, and the sinusoidal wave signal gradually decays periodically. Exemplarily, the demagnetization voltage signal is positive and has an amplitude of I1 in the first half-cycle of the first period, the demagnetization voltage signal is negative and has an amplitude of I2 (I2 < I1) in the second half-cycle of the first period, the demagnetization voltage signal is positive and has an amplitude of I3 (I3 < I2) in the first half-cycle of the second period, the demagnetization voltage signal is negative and has an amplitude of I4 (I4 < I3) in the second half-cycle of the second period, ……, until it decays to zero. During this process, the magnetic field accumulated in the magnetic core component will gradually decay until it becomes zero following the change of the demagnetization current signal flowing through the primary current busbar, thus completing the demagnetization.
[0087] Of course, the applied demagnetization voltage signal can also adopt other waveforms. Exemplarily, the applied excitation voltage can also be a square wave signal, or a trapezoidal wave signal (as Figure 10 shown), or a triangular wave signal (as Figure 11 shown), etc.
[0088] When applying the demagnetization device of the Hall current sensor as Figure 8 shown, first, in the case where the Hall current sensor is powered off, the control device 231 receives the magnetic flux detected by the Hall chip 17 of the magnetic core component 13 and makes the reference sensor 21 collect the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15; if the magnetic field signal corresponding to the primary current flowing through the primary current busbar 15 collected by the reference sensor 21 is zero and the magnetic flux detected by the Hall chip 17 of the magnetic core component 13 is non-zero, the control device 231 sends a demagnetization instruction to the signal generator 233 to the signal generator 233, making the signal generator 233 generate a gradually decaying demagnetization signal according to the demagnetization instruction. The demagnetization signal is amplified by the signal amplifier 235 and then applied to the primary current busbar 15. In this way, a gradually decaying demagnetization current flowing through the primary current busbar 15 is generated, so that the magnetic field of the magnetic core component 13 gradually decays until it decays to zero, completing the demagnetization.
[0089] Among them, the amplitude and demagnetization time of the demagnetization signal can both be set according to the product specifications and demagnetization requirements of the applied Hall current sensor. For example, according to the product specifications and demagnetization requirements of the Hall current sensor, increase the amplitude and demagnetization time of the demagnetization signal. In addition, if the magnetic core component cannot be demagnetized to a zero magnetic field within the preset demagnetization time, the signal processing unit or the control device in the signal processing unit can be made to apply a gradually decaying demagnetization signal to the primary current busbar again to continue demagnetizing the magnetic core component.
[0090] The degaussing device of the Hall current sensor provided in the embodiments of the present disclosure includes a reference sensor and a signal processing unit. When the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is non-zero when the primary current busbar is in a power-off state, the signal processing unit generates a degaussing signal with a decreasing amplitude and alternating positive and negative directions, and applies the degaussing signal to the primary current busbar, so that the hysteresis magnetic field of the magnetic core component gradually decreases until it becomes zero to achieve degaussing. Compared with the related techniques of degaussing by heating degaussing or applying a reverse magnetic field, etc., it has the advantages of simple structure, convenient operation, and good degaussing effect, can study the hysteresis characteristics of the Hall current sensor, and is beneficial to the research of the Hall current sensor and the improvement of its production process.
[0091] The present disclosure further provides a degaussing method for a Hall current sensor.
[0092] Please refer to Figure 12 , which shows a schematic flow chart of the degaussing method of the Hall sensor of the present disclosure in an embodiment.
[0093] The degaussing method of the Hall sensor is applied to a degaussing device of a Hall current sensor, and the degaussing device includes a reference sensor and a signal processing unit.
[0094] As Figure 12 shown, the degaussing method of the Hall sensor includes the following steps:
[0095] Step S301, detecting the magnetic flux of the magnetic core component by using a Hall chip and collecting the magnetic field signal corresponding to the primary current flowing through the primary current busbar by using a reference sensor.
[0096] In some embodiments, if the detected magnetic flux of the magnetic core component is zero, it can be determined that the magnetic field signal of the magnetic core component is zero; if the detected magnetic flux of the magnetic core component is non-zero, it can be determined that the magnetic field signal of the magnetic core component is non-zero.
[0097] In some embodiments, if the primary current I p of the primary current busbar is zero, the corresponding magnetic field signal collected by the reference sensor is zero.
[0098] Step S303, when the primary current busbar is in a power-off state, determine whether the degaussing condition is met?
[0099] In step S303, the signal processing unit receives the magnetic field signal corresponding to the primary current flowing through the primary current bus collected by the reference sensor and the magnetic flux of the magnetic core component detected by the Hall chip, and determines whether the degaussing condition is met based on this. The degaussing condition includes: the magnetic field signal corresponding to the primary current flowing through the primary current bus collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is non-zero.
[0100] If the degaussing condition is not met, return to step S301; if the degaussing condition is met, proceed to step S305.
[0101] Step S305, use the signal processing unit to generate a degaussing signal with a decreasing amplitude and alternating positive and negative directions, and apply the degaussing signal to the primary current bus to complete the degaussing of the magnetic core component.
[0102] Through the above steps, the degaussing of the magnetic core component can be achieved.
[0103] In the degaussing method of the Hall current sensor provided in the embodiments of the present disclosure, in the case where the Hall current sensor is powered off, when the magnetic field signal corresponding to the primary current flowing through the primary current bus collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is non-zero, a gradually decaying degaussing signal is applied to the primary current bus to degauss the magnetic core component. Compared with related technologies such as using heating degaussing or applying a reverse magnetic field for degaussing, it has the advantages of simple structure, convenient operation, and good degaussing effect.
[0104] Please refer to Figure 13 , which shows the flow schematic diagram of the degaussing method of the Hall sensor of the present disclosure in another embodiment.
[0105] The degaussing method of the Hall sensor is applied to a degaussing device of a Hall current sensor. The degaussing device includes a reference sensor and a signal processing unit. The signal processing unit includes a controller, a signal generator, and a signal amplifier.
[0106] As Figure 13 shown, the degaussing method of the Hall sensor includes the following steps:
[0107] Step S401, use the Hall chip to detect the magnetic flux of the magnetic core component and use the reference sensor to collect the magnetic field signal corresponding to the primary current flowing through the primary current bus.
[0108] In some embodiments, if the detected magnetic flux of the magnetic core component is zero, the magnetic field signal of the magnetic core component can be determined to be zero; if the detected magnetic flux of the magnetic core component is non-zero, the magnetic field signal of the magnetic core component can be determined to be non-zero.
[0109] In some embodiments, if the primary current I of the primary current bus pIf it is zero, the magnetic field signal collected by the reference sensor is zero.
[0110] Step S403, when the primary current bar is powered off, determine whether the degaussing condition is met?
[0111] In step S403, the signal processing unit receives the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor and the magnetic flux of the magnetic core detected by the Hall chip, and determines whether the degaussing condition is met based on this. The degaussing condition includes: the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor is zero and the magnetic flux of the magnetic core detected by the Hall chip is non-zero.
[0112] If the degaussing condition is not met, return to step S401; if the degaussing condition is met, proceed to step S405.
[0113] Step S405, use the control device to send a degaussing command to the signal generator.
[0114] Step S407, use the signal generator to generate a degaussing signal with a decreasing amplitude and alternating positive and negative directions according to the received degaussing command.
[0115] In some alternative embodiments, the degaussing signal is a degaussing voltage signal, and the degaussing voltage signal is implemented as a sine wave signal, or a square wave signal, or a trapezoidal wave signal, or a triangular wave signal.
[0116] Step S409, use the signal amplifier to amplify the degaussing signal and apply the amplified degaussing signal to the primary current bar.
[0117] Step S411, determine whether degaussing is completed within a predetermined degaussing time.
[0118] If degaussing is completed within the predetermined degaussing time, proceed to step S413; if degaussing is not completed within the predetermined degaussing time, it indicates that degaussing fails due to degaussing timeout, and proceed to step S415.
[0119] Step S413, determine whether degaussing is successful?
[0120] In step S413, the control device receives the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor and the magnetic flux of the magnetic core detected by the Hall chip, and determines whether degaussing is successful based on this. The judgment basis for successful degaussing specifically includes: the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor is zero and the magnetic flux of the magnetic core detected by the Hall chip is zero.
[0121] If it is determined that the magnetic field signal corresponding to the primary current flowing through the primary current bus collected by the reference sensor is zero and the Hall chip detects that the magnetic flux of the magnetic core component is zero, it indicates that the demagnetization is successful; if it is determined that the magnetic field signal corresponding to the primary current flowing through the primary current bus collected by the reference sensor is zero and the Hall chip detects that the magnetic flux of the magnetic core component is non-zero, it indicates that the demagnetization fails, and proceed to step S415.
[0122] Step S415, when the demagnetization fails, adjust the demagnetization signal.
[0123] In some embodiments, the control device adjusts the demagnetization signal when it determines that the demagnetization fails.
[0124] In some alternative embodiments, the adjustment of the demagnetization signal includes adjusting the amplitude of the demagnetization signal.
[0125] In some alternative embodiments, the adjustment of the demagnetization signal includes adjusting the demagnetization time.
[0126] Subsequently, return to step S405 and continue to perform demagnetization. Use the control device to send a demagnetization command to the signal generator until the demagnetization is successful.
[0127] Through the above steps, the demagnetization of the magnetic core component can be achieved.
[0128] Please refer to Figure 14 , which shows a schematic structural diagram of the control device of the present disclosure in an embodiment.
[0129] As Figure 14 shown, the control device includes a processor 51 and a memory 53. The processor 51 and the memory 53 can communicate through a bus 52. The memory 53 may store a demagnetization program. The processor 51 executes each step in the integrated chip test combining finished product test and quality assurance test by running the demagnetization program in the memory 53.
[0130] The bus 52 may be a Peripheral Component Interconnect (PCI) bus or an Extended Industry Standard Architecture (EISA) bus, etc. The bus can be divided into an address bus, a data bus, a control bus, etc. For the sake of convenience of representation, although only a thick line is shown in the figure, it does not mean that there is only one bus or one type of bus.
[0131] In some embodiments, the processor 51 may be implemented as a Central Processing Unit (CPU), a Micro Controller Unit (MCU), a System on Chip (SoC), a Field Programmable Gate Array (FPGA), or the like. The memory 53 may include volatile memory for temporarily storing data when the program is running, such as Random Access Memory (RAM). The memory 53 may also include non-volatile memory (Non-Volatile Memory; NVM) for data storage, such as Read-Only Memory (ROM), flash memory, a Hard Disk Drive (HDD), or a Solid-State Disk (SSD).
[0132] In practical applications, the control device may be associated with each component in the degaussing device, and is used to implement the detection of the Hall chip and the primary current busbar in the Hall current sensor and apply a gradually decaying degaussing signal to the primary current busbar, so as to complete the degaussing of the magnetic core component.
[0133] The above embodiments merely illustrate the principles and effects of the present disclosure, rather than being suitable for limiting the present disclosure. Any person familiar with this technology can modify or change the above embodiments without departing from the spirit and scope of the present disclosure. Therefore, all equivalent modifications or changes made by those with ordinary knowledge in the technical field without departing from the spirit and technical idea disclosed by the present disclosure should still be covered by the protection scope of the present disclosure.
Claims
1. A demagnetization device for a Hall current sensor, characterized in that, The Hall current sensor is an open-loop Hall current sensor, including a mounting shell, a magnetic core component, a primary current busbar, and a Hall chip. The magnetic core component has a notch, and the Hall chip is inserted into the notch through a housing; The degaussing device includes: A reference sensor, associated with the primary current busbar, for collecting the magnetic field signal corresponding to the primary current flowing through the primary current busbar; And A signal processing unit, including: a control device, a signal generator, and a signal amplifier. Among them, the control device is connected to the Hall chip and the reference sensor, the signal generator is connected to the control device, the signal amplifier is connected to the signal generator and the primary current busbar. The control device can receive the magnetic flux detected by the Hall chip for the magnetic core component and the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor. When the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux detected by the Hall chip for the magnetic core component is non-zero when the primary current busbar is in a power-off situation, the control device controls the signal generator to generate a degaussing signal with a decreasing amplitude and alternating positive and negative directions. The signal amplifier amplifies the degaussing signal generated by the signal generator and applies the amplified degaussing signal to the primary current busbar to complete the degaussing of the magnetic core component; The degaussing signal gradually decays from a set value to zero within a preset degaussing time, where the signal amplitude in the latter period of the degaussing signal is smaller than that in the previous period.
2. The demagnetization device of the Hall current sensor according to claim 1, characterized in that, The reference sensor is a fluxgate sensor, sleeved on the primary current busbar.
3. The demagnetization device of the Hall current sensor according to claim 1, characterized in that The degaussing signal is a degaussing voltage signal, and the degaussing voltage signal is implemented as a sine wave signal, or a square wave signal, or a trapezoidal wave signal, or a triangular wave signal.
4. A demagnetization method for a Hall current sensor, characterized in that, A degaussing device applied to a Hall current sensor. The Hall current sensor is an open-loop Hall current sensor, including a mounting shell, a magnetic core component, a primary current busbar, and a Hall chip. The magnetic core component has a notch, and the Hall chip is inserted into the notch through a housing; The degaussing device includes a reference sensor and a signal processing unit. The degaussing method includes the following steps: Detecting the magnetic flux of the magnetic core component by using the Hall chip and collecting the magnetic field signal corresponding to the primary current flowing through the primary current busbar by using the reference sensor; And In the case where the primary current busbar is in a power-off situation, when the magnetic field signal corresponding to the primary current flowing through the primary current busbar collected by the reference sensor is zero and the magnetic flux detected by the Hall chip for the magnetic core component is non-zero, using the signal processing unit to generate a degaussing signal with a decreasing amplitude and alternating positive and negative directions, amplifying the degaussing signal and applying the amplified degaussing signal to the primary current busbar to complete the degaussing of the magnetic core component; The degaussing signal gradually decays from a set value to zero within a preset degaussing time, where the signal amplitude in the latter period of the degaussing signal is smaller than that in the previous period.
5. The degaussing method of the Hall current sensor according to claim 4, wherein The degaussing method further includes the following steps: after degaussing is completed within a predetermined degaussing time, determining whether the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor is zero and whether the magnetic flux of the magnetic core component detected by the Hall chip is zero; if it is determined that the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is zero, it indicates that degaussing is successful; if it is determined that the magnetic field signal corresponding to the primary current flowing through the primary current bar collected by the reference sensor is zero and the magnetic flux of the magnetic core component detected by the Hall chip is non-zero, it indicates that degaussing fails.
6. The degaussing method of the Hall current sensor according to claim 5, characterized in that The degaussing method further includes the following steps: if degaussing is not completed within a predetermined degaussing time, it indicates that degaussing fails.
7. The degaussing method of the Hall current sensor according to claim 5 or 6, characterized in that The degaussing method further includes the following steps: when degaussing fails, adjusting the degaussing signal by using the signal processing unit; the adjusting of the degaussing signal includes at least one of adjusting the amplitude of the degaussing signal and adjusting the degaussing time.
8. The degaussing method of the Hall current sensor according to claim 4, characterized in that The degaussing signal is a degaussing voltage signal, and the degaussing voltage signal is implemented as a sine wave signal, or a square wave signal, or a trapezoidal wave signal, or a triangular wave signal.
9. A control device, characterized in that, Comprising: A processor; A memory storing a degaussing program; Wherein, when the degaussing program is run by the processor, it executes the degaussing method of the Hall current sensor according to any one of claims 4 to 8.
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