Intelligent device for detecting quality of display substrate

Abstract

The invention relates to the technical field of display detection, and discloses a display substrate quality detection intelligent device, which comprises a base, a parallel light source generator, a detected substrate, a shape standard plate, a lifting support leg, a shape detection assembly, a light transmittance indication assembly and a comparison detection assembly, the detected substrate is located above the base, the appearance standard plate is located above the base, and the comparison detection assembly is arranged on the base. The invention particularly provides intelligent equipment for detecting the quality of a display substrate. The intelligent equipment comprises a shape detection assembly, a light transmittance indication assembly and a comparison detection assembly.

Description

Technical Field

[0001] The present invention relates to the technical field of display detection, and in particular to an intelligent device for detecting the quality of a display substrate. Background Art

[0002] An invention patent with announcement number CN103257469B discloses a display substrate quality detection device and detection method, and specifically discloses the technical solution of "an ultrasonic transmitter transmits ultrasonic waves for detection to the substrate, an ultrasonic receiver receives the ultrasonic waves reflected from the substrate, and an ultrasonic analyzer connected to the ultrasonic receiver analyzes the received ultrasonic waves to determine whether the substrate is cracked."

[0003] Although the technical solution of this application has the function of determining whether a substrate is cracked, the ultrasonic transmitter, ultrasonic receiver and ultrasonic analyzer are expensive and inconvenient for grassroots workers to operate. In addition, the technical solution of this application can only determine whether the outer surface of the substrate is cracked, but cannot identify whether there are impurities, bubbles and other defects in the display glass substrate that cause unqualified light transmittance. Summary of the invention

[0004] In view of the above situation, in order to overcome the defects of the prior art, the present invention provides an intelligent device for detecting the quality of display substrates. In order to solve the problem that the prior art cannot distinguish whether there are impurities, bubbles and other defects in the display glass substrate causing unqualified transmittance, the present invention proposes an intelligent device for detecting the quality of display substrates comprising an appearance detection component, a transmittance indication component and a comparison detection component.

[0005] The technical solution adopted by the present invention is as follows: an intelligent device for quality inspection of display substrates, comprising a base, a parallel light source generator, a substrate to be tested, a shape standard plate, a lifting leg, a shape inspection component, a transmittance indication component and a comparison inspection component, wherein the parallel light source generator is fixedly arranged on the base, the substrate to be tested is located above the base, the shape standard plate is located above the base, and the comparison inspection component is arranged on the base; The lifting legs are fixedly arranged on the base, the transmittance indicating assembly is arranged on the lifting legs, the transmittance indicating assembly comprises a lifting platform, a DC motor, a narrow-mouthed hollow tube, a photoresistor, a wire threading tube and a small constant-voltage power supply, the lifting platform is fixedly connected to the lifting legs, the DC motor is fixedly arranged on the lifting platform, the narrow-mouthed hollow tube is fixedly arranged at the tail end of the DC motor, the photoresistor is located in the narrow-mouthed hollow tube, the wire threading tube is fixedly connected with the narrow-mouthed hollow tube, the wire threading tube is fixedly connected with the photoresistor, the small constant-voltage power supply is fixedly arranged on the lifting platform, the photoresistor is connected in series with the DC motor, and the small constant-voltage power supply supplies power to the photoresistor and the DC motor; The shape detection component is arranged on the narrow-mouthed empty tube.

[0006] Furthermore, the substrate under test is located directly above the shape standard plate, the vertical linear array of the transmittance indicating components is provided with two groups, the vertical spacing between the substrate under test and the shape standard plate is equal to the vertical spacing between the two groups of transmittance indicating components, and the shape detection components are provided with two groups of vertical linear arrays.

[0007] Furthermore, the comparison and detection assembly includes a supporting frame, an upper vertical shaft, a planetary disc, a planetary arm, a planetary shaft, a planetary bevel gear, a reversing shaft, a lower vertical shaft, a reversing gear, a lower bevel gear and an encoder, the supporting frame is fixedly arranged on the base, the upper vertical shaft, the reversing shaft and the lower vertical shaft are all vertically rotatable on the supporting frame, two reversing gears are provided, the two reversing gears are meshingly connected, the two reversing gears are respectively fixedly arranged on the reversing shaft and the lower vertical shaft, the lower bevel gear is fixedly arranged on the top of the lower vertical shaft, the planetary disc is fixedly arranged below the upper vertical shaft, the planetary arm is fixedly arranged at the bottom of the planetary disc, the planetary shaft is horizontally rotatable in the planetary arm, the planetary bevel gear is fixedly arranged on the planetary shaft, the planetary bevel gear is meshingly connected with the lower bevel gear, the encoder is fixedly arranged on the planetary arm, and the rotating end of the encoder is fixedly connected to the planetary shaft.

[0008] Furthermore, an upper universal coupling is fixedly provided between the upper vertical shaft and an output end of one DC motor, and a lower universal coupling is fixedly provided between the reversing shaft and an output end of another DC motor.

[0009] Further, the shape detection component includes a thin-walled tube, a flexible thin-walled contact and a barometer, wherein the thin-walled tube is fixedly arranged outside the narrow hollow tube, the flexible thin-walled contact is fixedly arranged at one end of the thin-walled tube, a light-transmitting hole is opened in the center of the flexible thin-walled contact, a connected air cavity is arranged between the thin-walled tube and the flexible thin-walled contact, the barometer is fixedly arranged on the lifting platform, and the detection head of the barometer extends into the air cavity; The two groups of flexible thin-wall contacts of the shape detection components are respectively connected to the tested substrate and the shape standard plate.

[0010] Furthermore, a plate clamp is detachably provided below the tested substrate and the standard shape plate, a connecting arm is fixedly provided between the two plate clamps, and a traction manipulator is fixedly provided on the connecting arm.

[0011] Furthermore, the planetary arms, planetary shafts and planetary bevel gears are each provided in two groups, and the comparison and detection assembly further comprises a counterweight block, and the counterweight block is fixedly arranged on a group of planetary shafts away from the encoder.

[0012] Furthermore, the standard appearance plate is made of acrylic material.

[0013] Furthermore, the inner wall of the narrow-mouthed hollow tube is coated with a light-absorbing coating material.

[0014] The beneficial effects achieved by the present invention using the above structure are as follows: 1. An appearance standard plate is set up, which can perform shape detection through the shape detection component while testing the transmittance of the tested substrate, so as to avoid deformation, size difference and damage of the tested substrate.

[0015] 2. The design of the transmittance indicator component and the comparison detection component enables the equipment to compare the optical performance of the tested substrate based on the existing appearance standard plate during detection, so as to timely discover optical problems such as transmittance defects caused by internal defects of the tested substrate. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 It is a three-dimensional schematic diagram of an intelligent device for detecting quality of display substrates according to the present invention.

[0017] Figure 2 It is a front view schematic diagram of an intelligent device for detecting quality of display substrates according to the present invention.

[0018] Figure 3 It is a three-dimensional schematic diagram of the traction manipulator, connecting arm and plate clamp of the present invention.

[0019] Figure 4 It is a three-dimensional schematic diagram of the lifting legs, the shape detection component and the transmittance indication component of the present invention.

[0020] Figure 5 It is a three-dimensional schematic diagram of the light transmittance indicating assembly of the present invention.

[0021] Figure 6 It is a cross-sectional schematic diagram of the light transmittance indicating component of the present invention.

[0022] Figure 7 It is a cross-sectional schematic diagram of the flexible thin-wall contact of the present invention.

[0023] Figure 8 It is a front view schematic diagram of the comparison and detection component of the present invention.

[0024] Among them, 1. base, 2. parallel light source generator, 3. traction manipulator, 301. connecting arm, 302. plate fixture, 401. tested substrate, 402. shape standard plate, 5. shape detection component, 501. thin-walled tube, 502. flexible thin-walled contact, 503. light-transmitting hole, 504. air cavity, 505. barometer, 6. lifting legs, 7. transmittance indication component, 701. lifting platform, 702. DC motor, 703. narrow empty tube, 704. photoresistor , 705, wire threading, 706, constant voltage small power supply, 8, upper universal coupling, 9, lower universal coupling, 10, comparison detection component, 1001, support stand, 1002, upper vertical shaft, 1003, planetary disc, 1004, planetary arm, 1005, planetary shaft, 1006, planetary bevel gear, 1007, reversing shaft, 1008, lower vertical shaft, 1009, reversing gear, 1010, lower bevel gear, 1011, encoder, 1012, counterweight.

[0025] The accompanying drawings are used to provide further understanding of the present invention and constitute a part of the specification. They are used to explain the present invention together with the embodiments of the present invention and do not constitute a limitation of the present invention. DETAILED DESCRIPTION

[0026] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments; based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0027] In the description of the present invention, it is necessary to understand that the terms "upper", "lower", "front", "back", "left", "right", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0028] like Figure 1 to Figure 8 As shown, an intelligent device for display substrate quality inspection includes a base 1, a parallel light source generator 2, a substrate to be tested 401, an appearance standard plate 402, a lifting leg 6, an appearance detection component 5, a transmittance indication component 7 and a comparison detection component 10. The parallel light source generator 2 is fixed on the base 1, the substrate to be tested 401 is located above the base 1, the appearance standard plate 402 is located above the base 1, and the comparison detection component 10 is arranged on the base 1.

[0029] like Figure 1 to Figure 8As shown, the lifting leg 6 is fixedly arranged on the base 1, and the transmittance indicating component 7 is arranged on the lifting leg 6. The transmittance indicating component 7 includes a lifting platform 701, a DC motor 702, a narrow hollow tube 703, a photoresistor 704, a wire threading tube 705 and a constant voltage small power supply 706. The lifting platform 701 is fixedly connected to the lifting leg 6, the DC motor 702 is fixedly arranged on the lifting platform 701, the narrow hollow tube 703 is fixedly arranged at the tail end of the DC motor 702, the photoresistor 704 is located in the narrow hollow tube 703, the wire threading tube 705 is fixedly connected with the narrow hollow tube 703, the wire threading tube 705 is fixedly connected with the photoresistor 704, the constant voltage small power supply 706 is fixedly arranged on the lifting platform 701, the photoresistor 704 is connected in series with the DC motor 702, and the constant voltage small power supply 706 supplies power to the photoresistor 704 and the DC motor 702.

[0030] like Figure 1 to Figure 8 As shown, the shape detection component 5 is arranged on the narrow-mouthed empty tube 703.

[0031] like Figure 1 to Figure 8 As shown, the substrate under test 401 is located directly above the shape standard plate 402, the transmittance indicating component 7 is provided with two groups in a vertical linear array, the vertical spacing between the substrate under test 401 and the shape standard plate 402 is equal to the vertical spacing between the two groups of transmittance indicating components 7, and the shape detection component 5 is provided with two groups in a vertical linear array.

[0032] like Figure 1 to Figure 8 As shown, the comparison detection component 10 includes a support frame 1001, an upper vertical shaft 1002, a planetary disc 1003, a planetary arm 1004, a planetary shaft 1005, a planetary bevel gear 1006, a reversing shaft 1007, a lower vertical shaft 1008, a reversing gear 1009, a lower bevel gear 1010 and an encoder 1011. The support frame 1001 is fixedly arranged on the base 1, the upper vertical shaft 1002, the reversing shaft 1007 and the lower vertical shaft 1008 are all vertically rotatably arranged on the support frame 1001, and two reversing gears 1009 are provided. The two reversing gears 1009 are meshed and connected, and the two reversing gears 1009 are meshed and connected. 9 are respectively fixed on the reversing shaft 1007 and the lower vertical shaft 1008, the lower bevel gear 1010 is fixed on the top of the lower vertical shaft 1008, the planetary disc 1003 is fixed below the upper vertical shaft 1002, the planetary arm 1004 is fixed at the bottom of the planetary disc 1003, the planetary shaft 1005 is horizontally rotatably arranged in the planetary arm 1004, the planetary bevel gear 1006 is fixed on the planetary shaft 1005, the planetary bevel gear 1006 is meshed with the lower bevel gear 1010, the encoder 1011 is fixed on the planetary arm 1004, and the rotating end of the encoder 1011 is fixedly connected to the planetary shaft 1005.

[0033] like Figure 1 to Figure 8As shown, an upper universal coupling 8 is fixedly provided between the upper vertical shaft 1002 and the output end of one DC motor 702 , and a lower universal coupling 9 is fixedly provided between the reversing shaft 1007 and the output end of another DC motor 702 .

[0034] like Figure 1 to Figure 8 As shown, the shape detection component 5 includes a thin-walled tube 501, a flexible thin-walled contact 502 and a barometer 505. The thin-walled tube 501 is fixedly arranged on the outside of the narrow hollow tube 703, the flexible thin-walled contact 502 is fixedly arranged at one end of the thin-walled tube 501, a light-transmitting hole 503 is opened in the center of the flexible thin-walled contact 502, a connected air cavity 504 is provided between the thin-walled tube 501 and the flexible thin-walled contact 502, the barometer 505 is fixedly arranged on the lifting platform 701, and the detection head of the barometer 505 extends into the air cavity 504.

[0035] like Figure 1 to Figure 8 As shown, the two groups of flexible thin-wall contacts 502 of the shape detection components 5 are respectively connected to the substrate 401 to be tested and the shape standard plate 402 .

[0036] like Figure 1 to Figure 8 As shown, a plate fixture 302 is detachably provided under the tested substrate 401 and the shape standard plate 402 , a connecting arm 301 is fixedly provided between the two plate fixtures 302 , and a traction manipulator 3 is fixedly provided on the connecting arm 301 .

[0037] like Figure 1 to Figure 8 As shown, the planetary arms 1004 , the planetary shafts 1005 and the planetary bevel gears 1006 are each provided with two groups, and the comparison detection assembly 10 also includes a counterweight block 1012 , which is fixed on a group of planetary shafts 1005 away from the encoder 1011 .

[0038] like Figure 1 to Figure 8 As shown, the standard shape plate 402 is made of acrylic material.

[0039] like Figure 1 to Figure 8 As shown, the inner wall of the narrow hollow tube 703 is coated with a light absorbing coating material.

[0040] During specific use, the substrate 401 under test and the standard shape plate 402 are respectively clamped in two plate fixtures 302, and the parallel light generated by the parallel light source generator 2 is emitted to the right through the substrate 401 under test and the standard shape plate 402, and passes through the light-transmitting hole 503 in the center of the flexible thin-walled contact 502 and enters the narrow empty tube 703.

[0041] According to the difference in light transmittance between the substrate 401 to be tested and the standard shape plate 402, the light intensity received by the photoresistor 704 in the narrow-mouthed hollow tube 703 is different.

[0042] When the substrate 401 under test has no surface defects (cracks, stains) and internal defects (bubbles, impurities), the light transmittance of different regions of the substrate 401 under test is constant, and the light intensity received by the photoresistor 704 corresponding to the substrate 401 under test is constant. When the constant voltage small power supply 706 supplies power to the photoresistor 704 and the DC motor 702 connected in series, the power of the DC motor 702 corresponding to the substrate 401 under test is constant.

[0043] Similarly, the light transmittance of different areas of the standard shape plate 402 selected by the staff is constant and different from the light transmittance of the tested substrate 401, and the light intensity received by the photoresistor 704 corresponding to the standard shape plate 402 is constant. When the constant voltage small power supply 706 supplies power to the photoresistor 704 and the DC motor 702 connected in series, the power of the DC motor 702 corresponding to the standard shape plate 402 is constant.

[0044] Due to the different light transmittances of the tested substrate 401 and the standard shape plate 402, the two groups of DC motors 702 output different powers (different speeds). Through the transmission of the upper universal coupling 8 and the lower universal coupling 9, in the comparison and detection component 10, the upper vertical shaft 1002 and the lower vertical shaft 1008 rotate in the same direction at a constant speed difference. The planetary disc 1003, the planetary arm 1004, the planetary shaft 1005 and the planetary bevel gear 1006 rotate synchronously with the upper vertical shaft 1002 around the axis of the upper vertical shaft 1002 due to the fixed connection relationship between the planetary disc 1003 and the upper vertical shaft 1002, and the lower bevel gear 1010 rotates synchronously with the lower vertical shaft 1008. The planetary bevel gear 1006 is meshed with the lower bevel gear 1010, and the revolution axis is the same, but there is a speed difference, and the speed difference between the two drives the planetary bevel gear 1006 to rotate.

[0045] The rotating end of the encoder 1011 is fixedly connected to the planetary shaft 1005, and can monitor the rotation speed of the planetary shaft 1005 and the planetary bevel gear 1006 in real time, and the measured rotation speed of the planetary bevel gear 1006 is positively correlated with the transmittance difference between the tested substrate 401 and the tested area of ​​the shape standard plate 402. The encoder 1011 reading is connected to the external computer signal, thereby achieving the effect of real-time detection of the optical performance of the tested substrate 401.

[0046] When there are internal defects such as bubbles or impurities in the inspected area of ​​the substrate 401 under test, the light transmission performance of the inspected area changes suddenly, and the amount of light received by the photoresistor 704 corresponding to the substrate 401 under test changes suddenly, resulting in a sudden change in the resistance of the photoresistor 704. In the case where the constant voltage small power supply 706 supplies constant voltage to the photoresistor 704 and the DC motor 702 connected in series, the sudden change in the resistance of the photoresistor 704 will cause a sudden change in the output power (speed change) of the DC motor 702, which is then transmitted to the upper vertical shaft 1002, the planetary disc 1003, the planetary arm 1004 and the planetary shaft 1005 through the transmission of the upper universal coupling 8, causing a sudden change in the revolution speed of the planetary disc 1003 and the planetary arm 1004. Since the rotation of the planetary bevel gear 1006 is caused by the speed difference between the planetary disk 1003 and the lower upper gear, when the speed of the planetary disk 1003 suddenly changes, the rotation speed of the planetary bevel gear 1006 will undergo a corresponding sudden change, and will be transmitted to the encoder 1011 through the planetary shaft 1005, and then the staff will be informed of the situation of "the optical performance of the inspected area of ​​the tested substrate 401 is defective" through a computer signal.

[0047] The working principle of the shape detection component 5 is as follows: the traction manipulator 3 drives the tested substrate 401 and the shape standard plate 402 to move through the connecting arm 301 and the plate fixture 302, so that the two flexible thin-walled contacts 502 respectively contact the same area of ​​the tested substrate 401 / shape standard plate 402, and continuously change the contact position. During the movement of the tested substrate 401 and the shape standard plate 402, the compression amount of the flexible thin-walled contact 502 changes, and causes the air pressure value in the air cavity 504 to change. The two barometers 505 transmit the air pressure value to the external computer, which determines whether there is an air pressure difference that exceeds the allowable error, and further determines whether the shape of the current inspected area of ​​the tested substrate 401 is qualified.

[0048] The above are only preferred specific implementation modes of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can make equivalent replacements or changes according to the technical solutions and inventive concepts of the present invention within the technical scope disclosed by the present invention, which should be covered by the protection scope of the present invention.

Claims

1. An intelligent device for detecting quality of display substrates, characterized in that: The device comprises a base (1), a parallel light source generator (2), a substrate to be tested (401), an appearance standard plate (402), a lifting leg (6), an appearance detection component (5), a transmittance indication component (7) and a comparison detection component (10), wherein the parallel light source generator (2) is fixedly arranged on the base (1), the substrate to be tested (401) is located above the base (1), the appearance standard plate (402) is located above the base (1), and the comparison detection component (10) is arranged on the base (1); The lifting legs (6) are fixedly mounted on the base (1); the transmittance indicating assembly (7) is mounted on the lifting legs (6); the transmittance indicating assembly (7) comprises a lifting platform (701), a DC motor (702), a narrow hollow tube (703), a photoresistor (704), a wire threading tube (705) and a constant voltage small power supply (706); the lifting platform (701) is fixedly connected to the lifting legs (6); the DC motor (702) is fixedly mounted on the lifting platform (701); the narrow hollow tube (703) is fixedly mounted on the lifting platform (701); The photoresistor (704) is located at the rear end of the DC motor (702), the photoresistor (704) is located in the narrow hollow tube (703), the wire tube (705) is fixedly connected to the narrow hollow tube (703), the wire tube (705) is fixedly connected to the photoresistor (704), the small constant voltage power source (706) is fixedly located on the lifting platform (701), the photoresistor (704) is connected in series with the DC motor (702), and the small constant voltage power source (706) supplies power to the photoresistor (704) and the DC motor (702); The shape detection component (5) is arranged on the narrow-mouthed empty tube (703).

2. The intelligent device for detecting quality of display substrates according to claim 1, characterized in that: The substrate under test (401) is located directly above the shape standard plate (402), two groups of vertical linear arrays of the transmittance indicating components (7) are provided, the vertical spacing between the substrate under test (401) and the shape standard plate (402) is equal to the vertical spacing between the two groups of transmittance indicating components (7), and two groups of vertical linear arrays of the shape detection components (5) are provided.

3. The intelligent device for detecting quality of display substrates according to claim 2, characterized in that: The comparison detection component (10) comprises a support frame (1001), an upper vertical shaft (1002), a planetary disc (1003), a planetary arm (1004), a planetary shaft (1005), a planetary bevel gear (1006), a reversing shaft (1007), a lower vertical shaft (1008), a reversing gear (1009), a lower bevel gear (1010) and an encoder (1011); the support frame (1001) is fixedly arranged on the base (1); the upper vertical shaft (1002), the reversing shaft (1007) and the lower vertical shaft (1008) are all vertically rotatably arranged on the support frame (1001); two reversing gears (1009) are provided, the two reversing gears (1009) are meshedly connected, and the two reversing gears (1009) are meshedly connected. ) are respectively fixed on the reversing shaft (1007) and the lower vertical shaft (1008), the lower bevel gear (1010) is fixed on the top of the lower vertical shaft (1008), the planetary disc (1003) is fixed below the upper vertical shaft (1002), the planetary arm (1004) is fixed at the bottom of the planetary disc (1003), the planetary shaft (1005) is horizontally rotatable in the planetary arm (1004), the planetary bevel gear (1006) is fixed on the planetary shaft (1005), the planetary bevel gear (1006) is meshed with the lower bevel gear (1010), the encoder (1011) is fixed on the planetary arm (1004), and the rotating end of the encoder (1011) is fixedly connected to the planetary shaft (1005).

4. The intelligent device for detecting quality of display substrates according to claim 3, characterized in that: An upper universal coupling (8) is fixedly provided between the upper vertical shaft (1002) and the output end of a DC motor (702), and a lower universal coupling (9) is fixedly provided between the reversing shaft (1007) and the output end of another DC motor (702).

5. The intelligent device for detecting quality of display substrates according to claim 4, characterized in that: The shape detection component (5) comprises a thin-walled tube (501), a flexible thin-walled contact (502) and a barometer (505); the thin-walled tube (501) is fixedly arranged outside the narrow hollow tube (703); the flexible thin-walled contact (502) is fixedly arranged at one end of the thin-walled tube (501); a light-transmitting hole (503) is provided at the center of the flexible thin-walled contact (502); a connected air cavity (504) is provided between the thin-walled tube (501) and the flexible thin-walled contact (502); the barometer (505) is fixedly arranged on the lifting platform (701); and the detection head of the barometer (505) extends into the air cavity (504); The two groups of flexible thin-wall contacts (502) of the appearance detection components (5) are respectively fitted and connected to the substrate to be tested (401) and the appearance standard plate (402).

6. The intelligent device for detecting quality of display substrates according to claim 5, characterized in that: A plate clamp (302) is detachably provided below the tested substrate (401) and the standard shape plate (402), a connecting arm (301) is fixedly provided between the two plate clamps (302), and a traction manipulator (3) is fixedly provided on the connecting arm (301).

7. The intelligent device for detecting quality of display substrates according to claim 6, characterized in that: The planetary arms (1004), the planetary shafts (1005) and the planetary bevel gears (1006) are each provided in two groups. The comparison detection assembly (10) further comprises a counterweight (1012), wherein the counterweight (1012) is fixedly arranged on a group of planetary shafts (1005) away from the encoder (1011).

8. The intelligent device for detecting quality of display substrates according to claim 1, characterized in that: The shape standard plate (402) is made of acrylic material.

9. The intelligent device for detecting quality of display substrates according to claim 1, characterized in that: The inner wall of the narrow-mouthed empty tube (703) is coated with a light-absorbing coating material.

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