Full-field non-contact health monitoring method and device for large-scale structure

By dividing the large structure into multiple sub-regions to be tested, each sub-region is monitored using a distributed speckle interferometer, and through multiple phase shift method and color image stitching technology, high-resolution, full-field, and non-contact health monitoring of large structures is achieved, solving the problem of inefficiency of traditional methods.

CN119715567AActive Publication Date: 2025-03-28ZHEJIANG UNIV OF TECH
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Patent Information

Application Number
CN202510199320.2
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-02-24
Publication Date
2025-03-28
Estimated Expiration
2045-02-24

AI Technical Summary

Technical Problem

Health monitoring of large structures faces problems such as large area to be measured, traditional contact monitoring methods have low spatial resolution, weak static monitoring capabilities, and temperature sensitivity, making it difficult to achieve high-resolution, full-field, and non-contact health monitoring.

Method used

By dividing the area to be monitored into multiple sub-regions to be tested, each sub-region corresponds to a distributed channel separation speckle interferometer, using multiple phase shift method and phase change diagram processing, combined with color image splicing technology, the splicing and defect positioning of the full-field monitoring data are achieved.

Benefits of technology

It realizes high-resolution, full-field, and non-contact health monitoring of large structures, solves the problem of inefficiency of traditional methods, and provides efficient and reliable health assessment technology.

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Abstract

The invention discloses a full-field non-contact health monitoring method for a large-scale structure. The method mainly comprises the following steps: S1, dividing monitoring sub-regions; dividing the to-be-monitored area into a plurality of to-be-monitored sub-areas; arranging a plurality of distributed channel discrete speckle interferometers to respectively and synchronously image and monitor each to-be-detected sub-region; s2, acquiring a speckle interferogram and a dual-channel color map; the monitored object is deformed; respectively collecting speckle interferograms and dual-channel color maps before and after deformation of the to-be-detected sub-region; s3, processing a speckle interferogram; processing the speckle interferograms before and after deformation, extracting a phase fringe pattern reflecting defect information of the to-be-detected sub-region, and determining a defect form; s4, splicing the monitoring data; splicing the two-color channel images shot by the sub-regions to be detected; and performing geometric transformation and fusion on the phase change information by using the two-color channel image splicing parameters obtained before and after splicing to generate full-field monitoring data, and obtaining the defect position and damage evolution of the monitored object.
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