Test system and method suitable for multiple types of components and electronic equipment

Abstract

The invention belongs to the technical field of electronic component testing, and particularly discloses a testing system and method suitable for multiple types of components and electronic equipment. The system comprises a data acquisition module, a tested board card, an electronic load and a controller, the data acquisition module and the electronic load are connected with the controller; the data acquisition module and the electronic load are connected with the tested board card; the tested board card is used for arranging a switch tube device and / or a sensor device; the data acquisition module is used for acquiring first voltage test data of each output channel of the switch tube device and / or acquiring second voltage test data of the sensor device; the controller is used for performing function test on the switching tube device based on the obtained first voltage test data; and / or, based on the acquired second voltage test data and current test data acquired from the electronic load, performing function test on the sensor device. According to the invention, automatic testing covering multiple types of components can be effectively realized.

Description

Technical Field

[0001] The present application belongs to the technical field of electronic component testing, and more specifically, relates to a testing system, method and electronic equipment applicable to multiple types of components. Background Art

[0002] At present, when performing functional performance tests on electronic components such as Darlington transistors and Hall sensors, the common testing method is to manually use a source meter to test the components to be tested. During the test, the source meter circuit needs to be built, the test connection is complicated, the test time is long, and only one component can be measured at a time, and multiple types of components cannot be tested centrally. At the same time, the device test results will also be affected by the subjective judgment of the tester, resulting in low test efficiency and low test accuracy in the entire test process.

[0003] Therefore, how to better implement the testing of electronic components has become a technical problem that needs to be solved urgently in the industry. Summary of the invention

[0004] In view of the defects of the prior art, the purpose of this application is to better implement the testing of electronic components, aiming to solve the problems of low testing efficiency and low testing accuracy in the entire testing process of existing electronic components.

[0005] To achieve the above objectives, in a first aspect, the present application provides a testing system applicable to multiple types of components, including: Data acquisition module, board under test, electronic load and controller; The data acquisition module and the electronic load are both connected to the controller; the data acquisition module and the electronic load are both connected to the board under test; the board under test is used to set switch tube devices and / or sensor devices; The data acquisition module is used to acquire first voltage test data of the multiple output channels of the switch tube device, and / or to acquire second voltage test data of the sensor device; The controller is used to perform a functional test on the switch tube device based on each of the first voltage test data obtained; And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load, perform a functional test on the sensor device.

[0006] Optionally, the system further comprises a switch matrix module; The switch matrix module is respectively connected to the data acquisition module, the board under test and the controller; each switch branch in the switch matrix module is correspondingly connected to an output channel of the switch tube device; The controller is used to control the switch matrix module to sequentially select each switch branch; The data acquisition module is used to sequentially acquire first voltage test data of each output channel of the switch tube device through the switch matrix module.

[0007] Optionally, the system further comprises a communication module; The controller is connected to the electronic load and the board under test respectively through the communication module; The communication module is used to control the board under test to adjust the switch state of the components under test thereon, or control the operating state of the electronic load under the instruction issued by the controller; The controller is used to obtain current test data from the electronic load through the communication module.

[0008] Optionally, the switch tube device comprises a Darlington transistor device; The data acquisition module is used for sequentially acquiring first voltage test sub-data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in an on state; The data acquisition module is also used to collect the second voltage test sub-data of each output channel of the Darlington transistor device in sequence through the switch matrix module when the Darlington transistor device is in the off state; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data; The controller is used to obtain first voltage test sub-data and second voltage test sub-data of each output channel of the Darlington transistor device, and perform output test on each output channel of the Darlington transistor device based on the first voltage test sub-data and second voltage test sub-data of each output channel.

[0009] Optionally, the sensor device comprises a Hall sensor device; The controller is used for acquiring first current test data from the electronic load through the communication module when the electronic load is in a working state and is in the same current loop as the Hall sensor device; The data acquisition module is used to acquire the third voltage test sub-data of the Hall sensor device; The controller is further configured to perform a zero offset voltage test on the Hall sensor device based on the acquired first current test data and the third voltage test sub-data.

[0010] Optionally, the controller is further used to control the electronic load to sequentially adjust the second current test data in the constant current mode according to the target current range, so as to adjust the current flowing through the Hall sensor device; The data acquisition module is used to collect each fourth voltage test sub-data of the Hall sensor device under different currents; The controller is also used to determine the current-voltage relationship curve of the Hall sensor device according to each second current test data obtained from the electronic load and each fourth voltage test sub-data obtained from the data acquisition module, and perform a linearity error test on the Hall sensor device based on the current-voltage relationship curve.

[0011] In a second aspect, the present application provides a testing method applied to any of the aforementioned testing systems, comprising: Collecting first voltage test data of multiple output channels of the switch device, and / or collecting second voltage test data of the sensor device; Performing a functional test on the switch tube device based on each of the first voltage test data obtained; And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load, perform a functional test on the sensor device.

[0012] Optionally, the switch tube device comprises a Darlington transistor device; and the collecting of first voltage test data of multiple output channels of the switch tube device comprises: When the Darlington transistor device is in an on state, sequentially collecting first voltage test sub-data of each output channel of the Darlington transistor device; When the Darlington transistor device is in an off state, sequentially collecting second voltage test sub-data of each output channel of the Darlington transistor device; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data; Correspondingly, performing a functional test on the switch tube device based on each of the first voltage test data obtained includes: The first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device are obtained, and based on the first voltage test sub-data and the second voltage test sub-data of each output channel, output testing is performed on each output channel of the Darlington transistor device.

[0013] Optionally, the sensor device includes a Hall sensor device; and collecting the second voltage test data of the sensor device includes: When the electronic load is in working state and in the same current loop as the Hall sensor device, first current test data is obtained from the electronic load through the communication module, and third voltage test sub-data output by the Hall sensor device is obtained; Correspondingly, the performing a functional test on the sensor device based on the acquired second voltage test data and the current test data acquired from the electronic load includes: Based on the acquired third voltage test sub-data and the first current test data acquired from the electronic load, performing a zero offset voltage test on the Hall sensor device; The current test data includes the first current test data, and the second voltage test data includes the third voltage test sub-data.

[0014] In a third aspect, the present application provides an electronic device comprising: at least one memory for storing programs; and at least one processor for executing the programs stored in the memory. When the program stored in the memory is executed, the processor is used to execute the method described in the first aspect or any possible implementation of the first aspect.

[0015] In a fourth aspect, the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the method described in the first aspect or any possible implementation of the first aspect.

[0016] In a fifth aspect, the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the method described in the first aspect or any possible implementation of the first aspect.

[0017] It can be understood that the beneficial effects of the second to fifth aspects mentioned above can be found in the relevant description of the first aspect mentioned above, and will not be repeated here.

[0018] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the prior art: The present application provides a test system, method and electronic device suitable for multiple types of components. By using a data acquisition module, a board under test, an electronic load and a controller to reasonably design a test control circuit, the data acquisition module can collect the first voltage test data of each output channel of the switch tube device, and can also collect the second voltage test data of the sensor device. Then, the switch tube device can be tested according to the obtained first voltage test data, and the sensor device can be tested according to the obtained second voltage test data and the current test data obtained from the electronic load. Automated testing covering multiple types of components can be effectively realized, and the test process does not require manual intervention, thereby improving the test efficiency and test accuracy of the entire device testing process. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 This is one of the structural schematic diagrams of a test system applicable to multiple types of components provided in an embodiment of the present application; Figure 2 This is the second structural schematic diagram of a test system applicable to multiple types of components provided in an embodiment of the present application; Figure 3 This is the third structural diagram of a test system applicable to multiple types of components provided in an embodiment of the present application; Figure 4 is a flow chart of a testing method of a testing system provided in an embodiment of the present application; Figure 5 It is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0020] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0021] The term "and / or" in this application is a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The symbol " / " in this application indicates that the associated objects are in an or relationship, for example, A / B means A or B.

[0022] The terms "first" and "second" in the specification and claims of this application are used to distinguish different objects rather than to describe a specific order of the objects. For example, the first voltage test data and the second voltage test data are used to distinguish different voltage test data rather than to describe a specific order of the voltage test data.

[0023] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0024] In the description of the embodiments of the present application, unless otherwise specified, "multi-channel" means two or more channels. For example, multiple output channels refer to two or more output channels of a switching tube device.

[0025] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application.

[0026] Figure 1 is one of the structural diagrams of a test system applicable to multiple types of components provided in an embodiment of the present application, such as Figure 1 As shown, including: Data acquisition module 1, board under test 2, electronic load 3 and controller 4; The data acquisition module 1 and the electronic load 3 are both connected to the controller 4; the data acquisition module 1 and the electronic load 3 are both connected to the board under test 2; the board under test 2 is used to set the switch tube device 21 and / or the sensor device 22; The data acquisition module 1 is used to acquire first voltage test data of multiple output channels of the switch tube device 21 and / or to acquire second voltage test data of the sensor device 22; The controller 4 is used to perform a functional test on the switch tube device 21 based on each first voltage test data obtained; And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load 3 , perform a functional test on the sensor device 22 .

[0027] Specifically, the switch tube device described in the embodiment of the present application is also called a power switch tube or a semiconductor switch, and its core function is to realize the switching of "on" and "off" in the circuit. This device can realize precise control of the circuit state by controlling the flow or disconnection of current. It can specifically include Darlington transistor devices, field effect tube devices, etc.

[0028] The sensor device described in the embodiments of the present application refers to an electronic sensor device that is used to detect the electrical output performance of the device, such as current and voltage, and may specifically include a Hall sensor device, a current transformer device, etc.

[0029] The first voltage test data described in the embodiment of the present application refers to the voltage test data output by the internal multiple output channels of the switch tube device when the switch tube device is working.

[0030] The second voltage test data described in the embodiment of the present application refers to the voltage test data output by the output port of the sensor device when the sensor device is working.

[0031] It should be noted that an electronic load is a device that consumes electrical energy by controlling the conduction of its internal power devices (such as MOSFET or transistor) and relying on the dissipated power of the power tube. It can accurately detect the load voltage and precisely adjust the load current to simulate the response of the real load to the input signal. Electronic loads generally have multiple modes such as constant current, constant voltage, constant resistance, constant power, short circuit and dynamic load, which can simulate various load conditions.

[0032] In the embodiments of the present application, the current flowing through the sensor device in the same loop as the electronic load can be changed by adjusting the rated current of the electronic load.

[0033] In the embodiment of the present application, the data acquisition module and the electronic load are both connected to the controller, and the data acquisition module and the electronic load are both connected to the board under test, thereby realizing the electrical connection between the controller and the board under test.

[0034] In an embodiment of the present application, switch tube devices and / or sensor devices may be provided on the board under test, that is, a single type of device under test, for example, a switch tube device, or a sensor device, may be provided on the board under test for subsequent single-type device testing covering multiple types of components; and two types of devices under test may also be provided on the board under test at the same time, for example, a switch tube device and a sensor device may be provided at the same time for subsequent parallel testing covering multiple types of components.

[0035] The board under test may also be pre-integrated with an FPGA chip to achieve connection control with the controller. The controller may adjust the working state of the device under test on the board under test by controlling the FPGA chip.

[0036] More specifically, in an embodiment of the present application, the system can perform test tasks under two types of test scenarios on multiple types of devices under test set on the tested board. The first type of test scenario refers to a scenario in which the system performs a separate test on a certain type of device among multiple types of devices under test, and the second type of test scenario refers to a scenario in which the system performs parallel testing on various types of devices among multiple types of devices under test.

[0037] In the specific implementation process of the first type of test scenario, the system starts working, and when the board under test is powered on, the data acquisition module can separately collect the voltage test data output by each output channel when the switch tube device on the board under test is running, that is, the first voltage test data; or the data acquisition module can separately collect the second voltage test data output by the sensor device on the board under test. Through the connection with the data acquisition module, the controller can obtain the voltage test data of each output channel of the switch tube device, or obtain the voltage test data output by the sensor device, and obtain the current test data on the loop from the electronic load after receiving the test instruction.

[0038] Furthermore, the controller can test the output function of each channel of the switch tube device according to the first voltage test data obtained; or can test the relevant output function of the sensor device according to the second voltage test data obtained and the current test data obtained from the electronic load. In this way, the system can test a single type of device among multiple types of components.

[0039] In addition, in the specific implementation process of the second type of test scenario, when the system starts working and the board under test is powered on, the data acquisition module can simultaneously collect the first voltage test data output by each output channel when the switch tube device on the board under test is running, and the second voltage test data output by the sensor device on the board under test. Then, the controller can obtain the voltage test data of each output channel of the switch tube device from the data acquisition module, obtain the voltage test data output by the sensor device, and obtain the current test data on the loop from the electronic load after receiving the test instruction.

[0040] Furthermore, the controller can test the output function of each channel of the switch tube device according to the first voltage test data obtained; at the same time, the controller can test the relevant output function of the sensor device according to the second voltage test data obtained and the current test data obtained. Thus, the system can realize parallel testing of components of multiple types.

[0041] The test system applicable to multiple types of components of the embodiment of the present application utilizes a data acquisition module, a board under test, an electronic load, and a controller to reasonably design a test control circuit, so that the data acquisition module can collect the first voltage test data of each output channel of the switch tube device, and can also collect the second voltage test data of the sensor device. Then, the switch tube device can be subjected to relevant functional tests based on the obtained first voltage test data, and the sensor device can be subjected to relevant functional tests based on the obtained second voltage test data and the current test data obtained from the electronic load. This can effectively realize automated testing covering multiple types of components, and the test process does not require manual intervention, thereby improving the test efficiency and test accuracy of the entire device testing process.

[0042] Figure 2 This is a second structural diagram of a test system applicable to multiple types of components provided in an embodiment of the present application, such as Figure 2 As shown, the system further includes a switch matrix module 5; The switch matrix module 5 is connected to the data acquisition module 1, the board under test 2 and the controller 4 respectively; each switch branch in the switch matrix module 5 corresponds to an output channel connected to the switch tube device 21; The controller 4 is used to control the switch matrix module 5 to select each switch branch in turn; The data acquisition module 1 is used to sequentially acquire the first voltage test data of each output channel of the switch tube device through the switch matrix module 5 .

[0043] Specifically, in an embodiment of the present application, the system further includes a switch matrix module, and a switch branch matrix is ​​arranged inside the switch matrix module. The switch matrix module is respectively connected to the data acquisition module, the board under test, and the controller, wherein each switch branch in the switch matrix module corresponds to an output channel of the switch tube device, so as to control the data acquisition module to collect the voltage test data of each output channel of the switch tube device one by one.

[0044] In the specific implementation process, when the system tests the switch tube device, the controller can directly control the operating state of the control switch matrix module. After controlling the switch matrix module to select a switch branch, the data acquisition module can collect the voltage test data of the output channel connected to the switch branch in the switch tube device through the switch matrix module. After testing the voltage test data of the output channel of the switch tube device, the controller can switch the next output channel of the switch tube device through the control switch matrix module to start the test of the voltage of the next output channel. Similarly, the data acquisition module can collect the voltage test data of each output channel of the switch tube device in turn through the switch matrix module to perform voltage testing on each channel.

[0045] The system of the embodiment of the present application can accurately measure the voltage data of each output channel of the switch tube device by introducing a switch matrix module into the system and utilizing the on-off control performance of the switch matrix module. At the same time, if the voltage data of a certain output channel is abnormal during the test process, the specific channel and device can be quickly located, which is convenient for system fault analysis and beneficial to improving the efficiency and accuracy of switch tube device testing.

[0046] Continue to refer to Figure 2 , in an embodiment of the present application, the system further includes a communication module 6; The controller 4 is connected to the electronic load 3 and the board under test 2 respectively through the communication module 6; The communication module 6 is used to control the tested board 2 to adjust the switch state of the tested components thereon, or control the operating state of the electronic load 3 under the instruction issued by the controller 4; The controller 4 is used to obtain current test data from the electronic load 3 through the communication module 6 .

[0047] Specifically, in an embodiment of the present application, the controller is connected to the electronic load and the board under test respectively through an introduced communication module. In this way, through the communication interaction of the communication module, the controller can control the board under test to adjust the switching state of the components under test (such as switching tube devices and / or sensor devices) thereon, and can also control the operating state of the electronic load to indirectly adjust the output of the sensor device.

[0048] During the specific implementation process, when the system tests the sensor device, the controller can first control the electronic load to turn on through the communication module, and power on the sensor device, thereby forming a current loop, and then change the current flowing through the sensor device by adjusting the current value of the electronic load. At the same time, the controller obtains the current test data of the loop from the electronic load through the communication module, thereby obtaining the current test data flowing through the sensor device, which is used for subsequent testing of the output performance of the sensor device.

[0049] The system of the embodiment of the present application introduces a communication module into the system, and the controller can remotely control and configure the status of the electronic load and the board under test through the communication module, avoiding the tediousness and time-consuming of traditional manual operation, greatly improving the test efficiency, and making the test process faster and more accurate; at the same time, the communication module also supports multi-channel parallel communication, and can simultaneously control multiple types of components on the board under test for testing, further shortening the test cycle and improving the test efficiency.

[0050] Figure 3 This is a third structural diagram of a test system applicable to multiple types of components provided in an embodiment of the present application, such as Figure 3 As shown, in an embodiment of the present application, the switch tube device 21 includes a Darlington transistor device; The data acquisition module 1 is used for sequentially acquiring the first voltage test sub-data of each output channel of the Darlington transistor device through the switch matrix module 5 when the Darlington transistor device is in an on state; The data acquisition module 1 is also used to collect the second voltage test sub-data of each output channel of the Darlington transistor device in sequence through the switch matrix module 5 when the Darlington transistor device is in the off state; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data; The controller 4 is used to obtain the first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device, and perform output test on each output channel of the Darlington transistor device based on the first voltage test sub-data and the second voltage test sub-data of each output channel.

[0051] Specifically, in an embodiment of the present application, the Darlington transistor device includes a plurality of output channels, and each output channel includes one or more Darlington transistors to achieve independent control and driving functions.

[0052] The first voltage test sub-data described in the embodiment of the present application refers to the voltage test sub-data obtained by collecting each output channel of the Darlington transistor device when the device is in an on state.

[0053] The second voltage test sub-data described in the embodiment of the present application refers to the voltage test sub-data obtained by collecting each output channel of the Darlington transistor device when the device is in the off state.

[0054] In an embodiment of the present application, during the process of testing the Darlington transistor device, the controller can obtain the first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device through the data acquisition module, and based on the first voltage test sub-data and the second voltage test sub-data of each output channel, perform output test on each output channel of the Darlington transistor device to realize the switching function test of the Darlington transistor device.

[0055] like Figure 3 As shown, in the embodiment of the present application, the accompanying test chassis is mainly used to install the board under test with the device under test, which can achieve the requirements of fixation, heat dissipation, protection, etc. of the device under test. The accompanying test chassis is designed with interfaces such as power supply and communication, and is powered by an external current source. The power supply and communication signals of the board under test are led to the accompanying test chassis, and convenient interconnection is achieved with various external modules through various interfaces of the accompanying test chassis. At the same time, a power supply module is also provided inside the accompanying test chassis, and the power supply module is used to provide power for the peripheral circuits of the device under test.

[0056] In the embodiment of the present application, the system also provides a human-computer interaction platform at the front end for testers to perform test operations and implement command issuance and control of the system controller.

[0057] More specifically, in an embodiment of the present application, the specific steps of the system performing a switch function test on a Darlington transistor device are as follows: Step S101, installing a board under test provided with a Darlington transistor device into a companion test chassis, and then connecting the companion test chassis and each module in the test system by cables according to a correct connection relationship.

[0058] Step S102, click the run button of the system test software, the test software calls the controller to send instructions to the communication module through the serial port, the communication module is connected to the accompanying test chassis through the communication cable connected to the interface panel, the accompanying test chassis is connected to the board under test through an internal cable, and the board under test starts working after receiving the instruction.

[0059] Step S103, the test software calls the controller to send instructions to the communication module through the PXI interface, the communication module sends instructions to the FPGA chip on the board under test in the companion test chassis, the FPGA chip controls the Darlington transistor device installed on the board under test to be in an on or off state, the data acquisition module collects the first voltage test sub-data of each output channel of the Darlington transistor device in sequence through the switch matrix module, or collects the second voltage test sub-data of each output channel of the Darlington transistor device in sequence, and at the same time, the data acquisition module transmits all the collected test data back to the controller through the USB line.

[0060] During the process, after testing the voltage test data of one channel of the Darlington transistor device, the switch matrix module switches to the next output channel of the Darlington transistor device, starts the voltage test of the next output channel, and the test data is transmitted back to the controller through the switch matrix module and the data acquisition module. And so on, until the voltage test data of all output channels of the Darlington transistor device are tested.

[0061] Among them, the test software sends control instructions, and the controller performs tests based on the judgment data and the returned voltage test data. The instruction analysis represents that the meaning is consistent and qualified, and the analysis results are displayed on the software panel, and the test data is saved locally. Specifically, after the controller obtains the first voltage test sub-data and the second voltage test sub-data of an output channel of the Darlington transistor device, it can subtract the first voltage test sub-data from the second voltage test sub-data, and make a judgment based on the difference and the preset judgment condition. For example, the judgment condition that the difference should be less than ±0.1V is used to determine whether the output voltage data of the output channel is normal when the Darlington transistor device is in the on or off state. In this way, each output channel of the Darlington transistor device is tested until the switch function test of the Darlington transistor device is completed.

[0062] Step S104, after the test is completed, the test software controls the tested board to power off through the serial port and exit the test.

[0063] The system of the embodiment of the present application can promptly detect short circuit, open circuit and other faults inside the transistor by testing the Darlington transistor device output channel by channel, thereby avoiding equipment damage or performance degradation caused by faults in actual applications. At the same time, it can comprehensively evaluate the performance indicators of its switching function and improve test accuracy.

[0064] Continue to refer to Figure 3 , in an embodiment of the present application, the sensor device 22 comprises a Hall sensor device; The controller 4 is used for acquiring first current test data from the electronic load through the communication module 6 when the electronic load 3 is in working state and is in the same current loop as the Hall sensor device; The data acquisition module 1 is used to acquire the third voltage test sub-data of the Hall sensor device; The controller 4 is further configured to perform a zero offset voltage test on the Hall sensor device based on the acquired first current test data and third voltage test sub-data.

[0065] Specifically, the first current test data described in the embodiment of the present application refers to loop current test data obtained from the electronic load when the electronic load is in a working state and is in the same current loop as the Hall sensor device.

[0066] The third voltage test sub-data described in the embodiment of the present application refers to the voltage test data output by the Hall sensor device obtained while obtaining the first current test data.

[0067] The zero offset voltage test described in the embodiment of the present application is used to test the offset voltage of the output signal of the Hall sensor device at zero current. When the measured current is zero, the sensor should theoretically output a zero value, but in practice there will be a certain deviation, which is the zero offset voltage.

[0068] In an embodiment of the present application, during the process of testing the Hall sensor device, the controller can obtain first current test data from the electronic load through the communication module and obtain third voltage test sub-data output by the Hall sensor device through the data acquisition module when the electronic load is in a working state and in the same current loop as the Hall sensor device. Then, the zero offset voltage test of the Hall sensor device can be performed based on the obtained first current test data and third voltage test sub-data.

[0069] More specifically, in an embodiment of the present application, the specific steps of the system performing a zero offset voltage test on a Hall sensor device are as follows: Step S201, installing the board under test provided with the Hall sensor device into the accompanying test chassis, and then connecting the accompanying test chassis and each module in the test system by cables according to the correct connection relationship.

[0070] Step S202, correctly connect the data acquisition module and the electronic load to the corresponding detection points on the board under test in the accompanying test chassis.

[0071] Step S203, the system test software calls the controller to send a control instruction to the communication module through the PXI interface, and the communication module sends the instruction to the electronic load and the board under test through the serial port. The electronic load starts to work in a zero current state to form a current loop, and the board under test starts to work.

[0072] In step S204, the controller reads the current test data of the electronic load through the serial port of the communication module (electrical interface standard RS232), that is, obtains the first current test data; at the same time, the data acquisition module reads the voltage test data output by the Hall sensor device on the board under test through the data cable, that is, obtains the third voltage test sub-data, and uploads it to the controller. In step S205, the controller compares the preset criteria in the test software with the test result. For example, the criteria can be set as the first current test data ≤ ±0.1A is qualified, and the third voltage test sub-data ≤ ±0.05V is qualified. After that, the test result data of the Hall sensor device can be obtained and the data is retained in the local database, thereby completing the zero offset voltage test of the Hall sensor device.

[0073] The system of the embodiment of the present application obtains current test data from the electronic load and collects voltage test data of the Hall sensor device at this time when the electronic load is in a working state and is in the same current loop as the Hall sensor device. It tests whether the zero-point offset voltage of the Hall sensor device is qualified from two aspects of loop current data and device output voltage data. Compared with the traditional method of only measuring the device voltage test data, the zero-point offset voltage of the device can be determined more accurately, thereby further improving the test accuracy of the device test.

[0074] Continue to refer to Figure 3 In an embodiment of the present application, the controller 4 is further used to control the electronic load 3 to sequentially adjust the second current test data in the constant current mode according to the target current range to adjust the current flowing through the Hall sensor device; The data acquisition module 1 is used to collect each fourth voltage test sub-data of the Hall sensor device under different currents; The controller 4 is also used to determine the current-voltage relationship curve of the Hall sensor device according to each second current test data obtained from the electronic load 3 and each fourth voltage test sub-data obtained from the data acquisition module 1, and perform a linearity error test on the Hall sensor device based on the current-voltage relationship curve.

[0075] Specifically, the target current range described in the embodiments of the present application refers to a range from zero current to the maximum rated current of the Hall sensor device.

[0076] The second current test data described in the embodiment of the present application refers to the loop current test data obtained by the electronic load adjusting the set current value in the constant current mode in sequence according to the target current range.

[0077] The fourth voltage test sub-data described in the embodiment of the present application refers to voltage test data corresponding to the output of the Hall sensor device at different currents after the current flowing through the Hall sensor device is gradually adjusted.

[0078] The linearity error test described in the embodiment of the present application refers to the degree of nonlinearity between the output voltage of the Hall sensor device and the measured current, which can be specifically expressed as the maximum deviation of the current-voltage relationship curve of the Hall sensor device from the ideal straight line and the percentage of its full-scale output.

[0079] In an embodiment of the present application, during the test of the Hall sensor device, the controller can also control the electronic load to adjust the current test data in the constant current mode according to the target current range, that is, the second current test data, to adjust the current flowing through the Hall sensor device, so that the data acquisition module can collect the various voltage test data of the Hall sensor device under different currents, that is, the fourth voltage test sub-data. Furthermore, the controller can calculate the current-voltage relationship curve of the Hall sensor device based on the acquired second current test data and fourth voltage test sub-data, and make a judgment based on the current-voltage relationship curve to realize the linearity error test of the Hall sensor device.

[0080] More specifically, in an embodiment of the present application, the specific steps of the system performing a linearity error test on a Hall sensor device are as follows: Step S301, installing the board under test provided with the Hall sensor device into the accompanying test chassis, and then connecting the accompanying test chassis and each module in the test system by cables according to the correct connection relationship.

[0081] Step S302, correctly connect the data acquisition module and the electronic load to the corresponding detection points on the board under test in the accompanying test chassis.

[0082] Step S303, the system test software calls the controller to send a control instruction to the communication module through the PXI interface, and the communication module sends the instruction to the electronic load and the board under test through the serial port. The electronic load starts working to form a current loop, and the board under test starts working.

[0083] Step S304, the controller controls the electronic load to turn on through the serial port of the communication module (electrical interface standard RS232) to power on the test circuit. The electronic load is used to simulate the load and put it in constant current mode to consume the output power of the circuit DC power supply. The current value flowing through the Hall current sensor is changed by adjusting the electronic load current value according to the target current range, and the electronic load current value is specifically controlled from 0 to the maximum rated current value of the device. During the process, the controller can obtain each second current test data from the electronic load. At the same time, the data acquisition module can measure the voltage test data output by the Hall sensor device at each current value, that is, the fourth voltage test sub-data. The controller can read the above voltage test data measured by the data acquisition module through USB. After that, the controller can determine the current and voltage relationship curve of the Hall sensor device by calculation.

[0084] In step S305, the controller performs comparative calculation and analysis based on the current and voltage relationship curve of the Hall sensor device and the pre-imported criteria to determine whether the test result is qualified, and retains the test result data in the local database, thereby completing the linearity error test of the Hall sensor device.

[0085] It should be noted that the qualification criteria for each device under test during the test process can be determined based on the device model and device manual.

[0086] In an embodiment of the present application, the controller may also perform an output accuracy error test on the Hall sensor device by acquiring output voltage test data of the Hall sensor device measured by the data acquisition module in combination with preset ideal voltage test data.

[0087] The system of the embodiment of the present application can simulate different current operating conditions and load conditions by introducing an electronic load into the test system, thereby more comprehensively evaluating the linearity error of the Hall sensor, ensuring that the output signal of the sensor under different loads maintains a high accuracy, and improving the test accuracy of the overall test of the Hall sensor device.

[0088] The testing method of the testing system provided in the present application is described below. The testing method of the testing system described below can be referenced to the testing system described above.

[0089] Figure 4 is a flow chart of a test method of a test system provided in an embodiment of the present application, which can be applied to any of the aforementioned test systems, such as Figure 4 As shown, the method includes: Step S1, collecting first voltage test data of multiple output channels of a switch tube device, and / or collecting second voltage test data of a sensor device; Step S2, performing a functional test on the switch tube device based on the obtained first voltage test data; and / or, performing a functional test on the sensor device based on the obtained second voltage test data and the current test data obtained from the electronic load.

[0090] It can be understood that the detailed implementation of the above method can refer to the introduction of the detailed functional implementation of each unit / module in the above system embodiment, which will not be repeated here.

[0091] It should be understood that the above method is applied to the system in the above embodiment. The implementation principle and technical effects of the method are similar to the description of the corresponding program modules in the above system. The corresponding processes in the method can refer to the working process of the system and will not be repeated here.

[0092] The test method of the embodiment of the present application utilizes a data acquisition module, a board under test, an electronic load and a controller to reasonably design a test control circuit, so that the data acquisition module can collect the first voltage test data of each output channel of the switch tube device, and can also collect the second voltage test data of the sensor device. Then, the switch tube device can be subjected to relevant functional tests based on the obtained first voltage test data, and the sensor device can be subjected to relevant functional tests based on the obtained second voltage test data and the current test data obtained from the electronic load. This can effectively realize automated testing covering multiple types of components, and the test process does not require manual intervention, thereby improving the test efficiency and test accuracy of the entire device testing process.

[0093] Based on the content of the above embodiment, as an optional embodiment, the switch tube device includes a Darlington transistor device; collecting first voltage test data of multiple output channels of the switch tube device includes: When the Darlington transistor device is in an on state, first voltage test sub-data of each output channel of the Darlington transistor device are collected in sequence; When the Darlington transistor device is in the off state, the second voltage test sub-data of each output channel of the Darlington transistor device is collected in sequence; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data; Correspondingly, performing a functional test on the switch tube device based on each first voltage test data obtained includes: The first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device are obtained, and based on the first voltage test sub-data and the second voltage test sub-data of each output channel, output tests are performed on each output channel of the Darlington transistor device.

[0094] Based on the content of the above embodiment, as an optional embodiment, the sensor device includes a Hall sensor device; collecting the second voltage test data of the sensor device includes: When the electronic load is in working state and in the same current loop as the Hall sensor device, first current test data is obtained from the electronic load through the communication module, and third voltage test sub-data output by the Hall sensor device is obtained; Correspondingly, based on the acquired second voltage test data and the current test data acquired from the electronic load, a functional test is performed on the sensor device, including: Based on the acquired third voltage test sub-data and the first current test data acquired from the electronic load, performing a zero offset voltage test on the Hall sensor device; The current test data includes first current test data, and the second voltage test data includes third voltage test sub-data.

[0095] Based on the method in the above embodiment, the embodiment of the present application provides an electronic device, such as Figure 5 As shown, the electronic device may include: a processor (Processor) 510, a communication interface (Communications Interface) 520, a memory (Memory) 530 and a communication bus 540, wherein the processor 510, the communication interface 520, and the memory 530 communicate with each other through the communication bus 540. The processor 510 can call the logic instructions in the memory 530 to execute the method in the above embodiment.

[0096] In addition, the logic instructions in the above-mentioned memory 530 can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes a number of instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application.

[0097] Based on the method in the above embodiment, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the method in the above embodiment.

[0098] Based on the method in the above embodiment, an embodiment of the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the method in the above embodiment.

[0099] It is understandable that the processor in the embodiment of the present application may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, transistor logic devices, hardware components or any combination thereof. The general-purpose processor may be a microprocessor or any conventional processor.

[0100] The method steps in the embodiments of the present application can be implemented by hardware or by a processor executing software instructions. The software instructions can be composed of corresponding software modules, and the software modules can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, mobile hard disks, CD-ROMs, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an ASIC.

[0101] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented by software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted through the computer-readable storage medium. The computer instructions may be transmitted from a website site, computer, server or data center to another website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)), etc.

[0102] It should be understood that the various numerical numbers involved in the embodiments of the present application are only used for the convenience of description and are not used to limit the scope of the embodiments of the present application.

[0103] It should be understood that expressions such as "including" and "may include" that may be used in the present application indicate the existence of the disclosed functions, operations, or constituent elements, and do not limit one or more additional functions, operations, and constituent elements. In the present application, terms such as "including" and / or "having" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components, or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components, or combinations thereof.

[0104] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

Claims

1. A test system suitable for multiple types of components, characterized in that: include: Data acquisition module, board under test, electronic load and controller; The data acquisition module and the electronic load are both connected to the controller; the data acquisition module and the electronic load are both connected to the board under test; the board under test is used to set switch tube devices and / or sensor devices; The data acquisition module is used to acquire first voltage test data of the multiple output channels of the switch tube device, and / or to acquire second voltage test data of the sensor device; The controller is used to perform a functional test on the switch tube device based on each of the first voltage test data obtained; And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load, perform a functional test on the sensor device.

2. The test system according to claim 1, characterized in that: Also included is a switch matrix module; The switch matrix module is respectively connected to the data acquisition module, the board under test and the controller; each switch branch in the switch matrix module is correspondingly connected to an output channel of the switch tube device; The controller is used to control the switch matrix module to sequentially select each switch branch; The data acquisition module is used to sequentially acquire first voltage test data of each output channel of the switch tube device through the switch matrix module.

3. The test system according to claim 1, characterized in that: Also includes a communication module; The controller is connected to the electronic load and the board under test respectively through the communication module; The communication module is used to control the board under test to adjust the switch state of the components under test thereon, or control the operating state of the electronic load under the instruction issued by the controller; The controller is used to obtain current test data from the electronic load through the communication module.

4. The test system according to claim 2, characterized in that: The switch tube device comprises a Darlington transistor device; The data acquisition module is used for sequentially acquiring first voltage test sub-data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in an on state; The data acquisition module is also used for sequentially acquiring second voltage test sub-data of each output channel of the Darlington transistor device through the switch matrix module when the Darlington transistor device is in the off state; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data; The controller is used to obtain first voltage test sub-data and second voltage test sub-data of each output channel of the Darlington transistor device, and perform output test on each output channel of the Darlington transistor device based on the first voltage test sub-data and second voltage test sub-data of each output channel.

5. The test system according to claim 3, characterized in that: The sensor device comprises a Hall sensor device; The controller is used for acquiring first current test data from the electronic load through the communication module when the electronic load is in a working state and is in the same current loop as the Hall sensor device; The data acquisition module is used to acquire the third voltage test sub-data of the Hall sensor device; The controller is further configured to perform a zero offset voltage test on the Hall sensor device based on the acquired first current test data and the third voltage test sub-data.

6. The test system according to claim 5, characterized in that: The controller is also used to control the electronic load to sequentially adjust the second current test data in the constant current mode according to the target current range, so as to adjust the current flowing through the Hall sensor device; The data acquisition module is used to collect each fourth voltage test sub-data of the Hall sensor device under different currents; The controller is also used to determine the current-voltage relationship curve of the Hall sensor device according to each second current test data obtained from the electronic load and each fourth voltage test sub-data obtained from the data acquisition module, and perform a linearity error test on the Hall sensor device based on the current-voltage relationship curve.

7. A testing method applied to the testing system according to any one of claims 1 to 6, characterized in that: include: Collecting first voltage test data of multiple output channels of the switch device, and / or collecting second voltage test data of the sensor device; Performing a functional test on the switch tube device based on each of the first voltage test data obtained; And / or, based on the acquired second voltage test data and the current test data acquired from the electronic load, perform a functional test on the sensor device.

8. The testing method according to claim 7, characterized in that: The switch tube device includes a Darlington transistor device; the collecting of first voltage test data of multiple output channels of the switch tube device includes: When the Darlington transistor device is in an on state, sequentially collecting first voltage test sub-data of each output channel of the Darlington transistor device; When the Darlington transistor device is in an off state, sequentially collecting second voltage test sub-data of each output channel of the Darlington transistor device; the first voltage test data includes the first voltage test sub-data and the second voltage test sub-data; Correspondingly, performing a functional test on the switch tube device based on each of the first voltage test data obtained includes: The first voltage test sub-data and the second voltage test sub-data of each output channel of the Darlington transistor device are obtained, and based on the first voltage test sub-data and the second voltage test sub-data of each output channel, output testing is performed on each output channel of the Darlington transistor device.

9. The testing method according to claim 7, characterized in that: The sensor device includes a Hall sensor device; and collecting the second voltage test data of the sensor device includes: When the electronic load is in working state and in the same current loop as the Hall sensor device, first current test data is obtained from the electronic load through the communication module, and third voltage test sub-data output by the Hall sensor device is obtained; Correspondingly, the performing a functional test on the sensor device based on the acquired second voltage test data and the current test data acquired from the electronic load includes: Based on the acquired third voltage test sub-data and the first current test data acquired from the electronic load, performing a zero offset voltage test on the Hall sensor device; The current test data includes the first current test data, and the second voltage test data includes the third voltage test sub-data.

10. An electronic device, characterized in that: include: at least one memory for storing a computer program; At least one processor is used to execute the program stored in the memory. When the program stored in the memory is executed, the processor is used to execute the method according to any one of claims 7 to 9.

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