Strip testing tool and strip testing method
By designing a strip testing tooling, including support plates, adjustment rods, strip chucks and curvature test bench, the problems of low efficiency and high cost of high temperature superconducting strip testing are solved, and an efficient and low damage testing process is achieved.
Patent Information
- Application Number
- CN202510220281.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-02-27
- Publication Date
- 2025-03-28
AI Technical Summary
In the prior art, the testing efficiency of high-temperature superconducting strips is low and the testing cost is high.
A strip testing tool is provided, including a support plate, an adjustment rod, a strip chuck and a curvature test bench. Through the tool, the flattening and bending state test of the high-temperature superconducting strip can be achieved without disassembling the strip.
It improves the testing efficiency of high-temperature superconducting strips, reduces testing costs, and reduces dismantling damage to the strips.
Smart Images

Figure CN119716689A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of high-temperature superconducting technology, and in particular to a strip testing tool and a strip testing method. Background Art
[0002] With the development of high-temperature superconducting technology, high-temperature superconducting tapes are widely used due to their excellent current carrying capacity and high field performance. High-temperature superconducting tapes need to be deformed (such as bent) during use, and it is necessary to ensure that they can still have good performance under deformation.
[0003] Usually, for high-temperature superconducting tapes, it is necessary to conduct sampling tests to determine the performance of the high-temperature superconducting tapes under various conditions, and then determine the use conditions or applicable scenarios of the high-temperature superconducting tapes based on the test results. Testing of high-temperature superconducting tapes is crucial for their actual use.
[0004] However, current testing efficiency for high-temperature superconducting tapes is low. Summary of the invention
[0005] The present application provides a tape testing tool and method to improve the testing efficiency of high-temperature superconducting tapes and reduce the testing cost.
[0006] According to one aspect of the present application, there is provided a strip testing tool, comprising: a support plate, two adjustment rods, two strip clamps and a curvature testing table, wherein the curvature testing table has a curved side surface; The two adjustment rods can move along a first direction on the support plate, and the curvature test table can move along a second direction on the support plate, and the first direction is perpendicular to the second direction; The two strip clamps are respectively sleeved on the two adjustment rods, and each strip clamp can be rotated on the adjustment rod to adjust the direction; The two strip clamps are used to clamp the ends of the strip to be tested respectively; during the flattened state test of the strip to be tested, the two strip clamps are oriented opposite to each other; during the bent state test of the strip to be tested, the two strip clamps are oriented toward the curvature test bench, and the strip to be tested is wrapped around the arc-shaped side surface of the curvature test bench.
[0007] In one embodiment, the adjusting rod is a screw rod, and the adjusting rod is also sleeved with two nuts respectively located on both sides of the strip clamp, and the strip clamp is fixed to the adjusting rod through the two nuts.
[0008] In one embodiment, the support plate has a first strip groove and a second strip groove, the first strip groove extends along the first direction, the second strip groove extends along the second direction, and the second strip groove is located at the mid-perpendicular position of the first strip groove; The two adjustment rods are located in the first strip groove and can move in the first strip groove; The curvature testing platform is connected to the second strip groove and can move along the second strip groove.
[0009] In one embodiment, the strip clamp comprises a C-shaped first clamp body, a pressure block, a threaded rod and a handle; The strip chuck is sleeved on the adjusting rod by the first chuck body; two ends of the first chuck body are opposite, and one end has a through hole facing the other end; The threaded rod passes through the through hole, the pressing block is connected to one end of the threaded rod located between the two ends, and the handle is connected to the other end of the threaded rod; the handle can rotate and drive the threaded rod and the pressing block to move in the extension direction of the threaded rod; The strip clamp clamps the end of the strip to be measured by using the pressing block and the other end of the first clamp body.
[0010] In one embodiment, the strip clamp is a spring clamp, and the strip clamp includes a second clamp body, a first clamp arm, a second clamp arm, a spring, and a connecting component; The strip chuck is sleeved on the adjusting rod by the second chuck body, and the first chuck arm is fixed on the second chuck body; One end of the first clamp arm is connected to one end of the second clamp arm through the connecting component, the spring is sleeved on the connecting component, and two ends of the spring are respectively against one end of the first clamp arm and one end of the second clamp arm; By applying pressure to one end of the first clamp arm and one end of the second clamp arm, the spring is deformed, so that the other end of the first clamp arm and the other end of the second clamp arm can be changed from a fitted state to a separated state; The strip clamp clamps the end of the strip to be measured by using the other end of the first clamp arm and the other end of the second clamp arm.
[0011] In one embodiment, the strip clamp further comprises a power connection hole, and the power connection hole is located at an end of the strip clamp that is relatively far from the measuring strip relative to the adjusting rod; The power connection hole is used to connect to a power connector, and the current transmitted by the power connector is transmitted to the measured strip through the strip clamp.
[0012] In one embodiment, the target surface of the strip clamp has an insulating material; the target surface is the surface of the two strip clamps that is close to each other during the bending state test of the strip to be tested.
[0013] In one embodiment, the curvature test bench has a plurality of arc-shaped side surfaces of different curvatures arranged in a direction away from the support plate, and the strip clamp can also move on the adjustment rod; During the bending state test of the tested strip, the tested strip is wound around different arc-shaped sides of the curvature testing table in batches to perform tests of different curvatures, and the strip clamp is located on the adjusting rod at the same height as the arc-shaped side around which the tested strip is wound.
[0014] According to another aspect of the present application, a strip material testing method is provided, which is applied to the strip material testing tool mentioned above, and the method comprises: Clamping two ends of the strip to be tested in two strip clamps in the strip testing tool respectively, and making the two strip clamps face each other; Move the two adjusting rods where the two strip clamps are located in opposite directions along a first direction until the strip to be tested is taut, and perform a flattening test on the strip to be tested; After the flattened state test is completed, the two adjustment rods are moved toward each other along the first direction on the support plate, and the two strip clamps are rotated so that the two strip clamps face the curvature test table in the strip test fixture; The tested strip is wound around the arc-shaped side surface of the curvature test bench, and the curvature test bench is moved along the second direction toward a side away from the strip clamp until the tested strip is taut, and a bending state test is performed on the tested strip.
[0015] In one embodiment, the curvature test bench has a plurality of arc-shaped side surfaces of different curvatures arranged in a direction away from the support plate, and the strip clamp can also move on the adjustment rod; The method of winding the tested strip around the arc-shaped side surface of the curvature test bench and moving the curvature test bench along the second direction toward a side away from the strip clamp until the tested strip is taut, and performing a bending state test on the tested strip, comprises: Winding the tested strip around the first curved side surface of the curvature test bench, and moving the curvature test bench along the second direction toward a side away from the strip clamp until the tested strip is taut, and performing a bending state test on the tested strip corresponding to the curvature of the first curved side surface; After the bending state test corresponding to the curvature of the first arc-shaped side surface is completed, the curvature test bench is moved along the second direction toward the side close to the strip clamp to relax the tested strip; Winding the strip to be tested around the second curved side surface of the curvature test bench, and moving the strip clamp on the adjustment rod to a position at the same height as the second curved side surface; wherein the curvature of the second curved side surface is greater than the curvature of the first curved side surface; The curvature test bench is moved along the second direction toward the side away from the strip clamp until the strip to be tested is taut, and a bending state test corresponding to the curvature of the second arc-shaped side surface is performed on the strip to be tested.
[0016] In the embodiment of the present application, the strip chuck used for clamping the end of the tested strip in the strip test tool is sleeved on the adjustment rod, and it can be rotated on the adjustment rod to adjust the direction. And the adjustment rod and the curvature test bench can move in two vertical directions. In this way, when testing the tested strip, the two strip chucks can be made to clamp the two ends of the tested strip respectively, and the two strip chucks are made to face each other, so that the flattened state test of the tested strip can be achieved. After the strip chuck clamps the tested strip, only the strip chuck is moved to a suitable position along the first direction, and the strip chuck is rotated on the adjustment rod to change the direction of the strip chuck, and the curvature test bench is moved to a suitable position along the second direction, and the tested strip is wound around the side of the curvature test bench, so that the tested strip can be tested for the bending state without disassembling the tested strip. Therefore, the disassembly of the strip during the test can be reduced, the test time can be saved, the test efficiency can be improved, and the damage caused by the disassembly to the strip can be reduced, and the cost of strip testing can be reduced. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] Figure 1 is a schematic diagram of a strip material test provided in an embodiment of the present application; Figure 2 is a schematic diagram of another strip material test provided in an embodiment of the present application; Figure 3 It is a structural schematic diagram of a strip clamp provided in an embodiment of the present application; Figure 4 is a schematic structural diagram of another strip clamp provided in an embodiment of the present application; Figure 5 It is a flow chart of a strip testing method provided in an embodiment of the present application. DETAILED DESCRIPTION
[0018] Many specific details are described in the following description to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways than those described herein, and those skilled in the art can make similar generalizations without violating the connotation of the present application, so the present application is not limited by the specific implementation disclosed below.
[0019] The terms used in one or more embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit one or more embodiments of the present application. The singular forms of "one", "said" and "the" used in one or more embodiments of the present application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used in one or more embodiments of the present application refers to and includes any or all possible combinations of one or more associated listed items. The term "at least one" in one or more embodiments of the present application refers to "one or more", and "multiple" refers to "two or more". The term "including" is an open description and should be understood as "including but not limited to", and may include other content on the basis of the content described.
[0020] It should be understood that, although the terms "first", "second", etc. may be used to describe various information in one or more embodiments of the present application, these information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of one or more embodiments of the present application, "first" may also be referred to as "second", and similarly, "second" may also be referred to as "first". Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".
[0021] Since the advent of high-temperature superconducting materials, high-temperature superconducting technology has developed rapidly. High-temperature superconducting tapes are widely used due to their excellent current carrying capacity, high field performance and mechanical strength. For example, the second-generation high-temperature superconducting tapes represented by rare earth barium copper oxide (REBCO) can be used as electromagnetic coils or electrical transmission media, and are used in power and strong magnetic equipment in the fields of energy, electricity, medical and military. The ambient temperature required for high-temperature superconducting tapes during the flow process is relatively low, such as the need to operate in a low-temperature liquid nitrogen environment below 77K (Kelvin). For example, high-temperature superconducting tapes can be used in nuclear fusion reaction devices (such as tokamaks) to form various magnetic field coils required for their operation, so that these coils can generate stronger magnetic fields and ensure the high operating stability of nuclear fusion reaction devices. For example, high-temperature superconducting tapes are used to prepare toroidal magnetic field (TF, toroidal field) coils, center solenoid (CS, center solenoid) coils and poloidal magnetic field (PF, poloidal field) coils in tokamaks.
[0022] In the process of using high-temperature superconducting tapes to prepare cables or magnets in practical applications, it is inevitable to bend the high-temperature superconducting tapes. High-temperature superconducting tapes are a type of layered ceramic material, which is composed of multiple layers of materials stacked on top of each other. In the process of bending the high-temperature superconducting tape, the layers of material in the high-temperature superconducting tape may be delaminated or broken, thereby reducing or losing the current-carrying capacity of the high-temperature superconducting tape, thereby affecting the safe operation of related equipment or devices. Therefore, bending characteristics are used as one of the important indicators for evaluating the performance of high-temperature superconducting tapes.
[0023] The coil wound with high-temperature superconducting tape can be called a high-temperature superconducting coil. In some large scientific devices, high-temperature superconducting coils are needed to generate extremely high magnetic fields, and the size of the high-temperature superconducting coils in such devices is relatively large. For example, the high-temperature superconducting coil is used as a D-shaped toroidal magnetic field coil in a tokamak. For such a high-temperature superconducting coil, in order to reduce the inductance, under the same number of turns, it is necessary to ensure that the high-temperature superconducting tape has a high critical current and a high current density. At the same time, the high-temperature superconducting tape is also required to have good mechanical properties and meet the deformation requirements such as bending during the coil manufacturing process.
[0024] It is usually necessary to sample and test the prepared high-temperature superconducting tape to determine the critical current and current density that the high-temperature superconducting tape can support, as well as the bending characteristics of the high-temperature superconducting tape (such as determining the maximum bending degree that can be supported), and then determine whether the high-temperature superconducting tape is usable based on the test results, and determine the corresponding use conditions or applicable scenarios if it is usable. How to test high-temperature superconducting tapes conveniently and efficiently is crucial to their actual use.
[0025] At present, the way to test high-temperature superconducting tapes is relatively simple, and the test efficiency still needs to be improved. In a related technology, the test device uses two sliding joints to connect the superconducting tape, and enables the superconducting tape to bypass the bending table. The test device can only directly test the characteristics of the tape in a bent state, and the function of the test device is relatively simple. For the characteristics of the tape in a normal flattened state, it is necessary to use other test devices to test, so the overall test efficiency of the tape is low. In addition, each terminal of the superconducting tape in the test device needs to be fixed to the sliding joint with multiple screws. When replacing the tape sample, it is necessary to loosen the multiple screws at both ends of the tape, and then set the two ends of the replaced tape sample at the two sliding joints, and tighten the multiple screws to fix the replaced tape sample. This method of tape replacement is more cumbersome and the efficiency of tape replacement is low.
[0026] In another related technology, the test device uses a turning diameter test plate to measure the single and hyperbolic critical turning diameter values of high-temperature superconducting tapes. However, this type of test device is relatively complex, requires an external magnetic field, and is easily affected by environmental interference. In addition, this type of test device can only test the turning characteristics of longer superconducting tapes, and its functions are relatively simple, making it difficult to apply to short sample tests of high-temperature superconducting tapes. In addition, after the existing test device changes the test conditions for the high-temperature superconducting tape (such as using a different test device to perform a test in another state), it is difficult to ensure the uniformity of the contact between the end of the high-temperature superconducting tape and its fixed component, which may affect the accuracy of the test results for the same high-temperature superconducting tape.
[0027] The embodiment of the present application provides a strip testing tool and a strip testing method. The strip testing tool can be used to test the characteristics of high-temperature superconducting strips in a normal flat state, and can also be used to test the characteristics of high-temperature superconducting strips in a bent state. In this way, the high-temperature superconducting strips can be tested in many situations without changing the test device. The overall structure of the tool is simple and easy to operate, which can simplify the test process and improve the test efficiency. In addition, the strip testing tool can be used to quickly replace the tested strip samples, further improving the test efficiency.
[0028] Figure 1 is a schematic diagram of a strip material test provided in an embodiment of the present application, Figure 1 In the process, the strip test fixture is used to perform a performance test on the strip 20 (such as a high temperature superconducting strip). Figure 1 As shown, the strip testing tool comprises: a support plate 101 , two adjustment rods 102 , two strip clamps 103 and a curvature testing table 104 .
[0029] Other components other than the support plate 101 may be disposed on the support plate 101, and the support plate 101 is used to carry other components. In some embodiments, there may be other supporting structures below the support plate 101, which is not limited in the embodiments of the present application. In some embodiments, the support plate 101 may be made of insulating material to avoid electrical connection during the strip test and to avoid affecting the strip test effect.
[0030] The two adjustment rods 102 can be arranged on the support plate 101 along a first direction ( Figure 1 The two adjusting rods 102 can be vertically arranged on the support plate 101, and the arrangement direction of the two adjusting rods 102 is also the first direction. The two adjusting rods 102 can approach each other along the first direction, or move away from each other along the first direction. The movement processes of the two adjusting rods 102 are independent of each other.
[0031] In one movement mode of the adjusting rod 102, please continue to refer to Figure 1The support plate 101 has a first strip groove 11 extending in a first direction, and the two adjustment rods 102 are both located in the first strip groove 11 and can move in the first strip groove 11 to achieve movement in the first direction. One end of the adjustment rod 102 can extend into the first strip groove 11, and the position of the adjustment rod 102 in the first strip groove 11 can be fixed by a nut sleeved on the adjustment rod 102.
[0032] In one example, one end of the adjustment rod 102 extending into the first strip groove 11 has a structure protruding to the side, ensuring that the adjustment rod 102 can be stuck in the first strip groove 11 and will not fall out from the top of the support plate 101. The nut can limit the adjustment rod 102 from above, and by locking the nut, the nut and the structure protruding to the side of one end of the adjustment rod 102 can be used to press the edge of the first strip groove 11 together, thereby fixing the adjustment rod 102. In this example, the bottom of the first strip groove 11 can be hollow (in this case, the first strip groove 11 can be considered as a strip-shaped through hole), or it can be not hollow.
[0033] In another example, the bottom of the first strip groove 11 can be hollow, and the adjusting rod 102 can be fixed by two nuts, which are respectively located on both sides of the first strip groove 11. The two nuts are used to press the edges of the first strip groove 11 from the upper and lower sides respectively to fix the adjusting rod 102.
[0034] In another moving mode of the adjusting rod 102, a protruding moving track can be provided on the supporting plate 101 along the first direction, and a clamping component capable of clamping on the moving track is provided at the lower end of the adjusting rod 102. The adjusting rod 102 is connected to the moving track through the clamping component and can move on the moving track, and the clamping component can be locked to fix the position of the adjusting rod 102 when it moves to any position.
[0035] In the strip testing tool, two strip clamps 103 are respectively mounted on two adjustment rods 102, each adjustment rod 102 carries a corresponding strip clamp 103, and each strip clamp 103 can rotate on the adjustment rod 102 to adjust the direction. The strip clamp 103 can rotate around the adjustment rod 102 on which it is located, and can be fixed when rotated to any direction. Figure 1 As shown, the strip clamp 103 has a connecting hole, and the adjusting rod 102 passes through the connecting hole on the strip clamp 103. The position of the strip clamp 103 on the adjusting rod 102 can also be adjusted, and the strip clamp 103 can move up and down on the adjusting rod 102 along its extension direction.
[0036] In one embodiment, the adjusting rod 102 is a screw rod, and the adjusting rod 102 is also provided with two nuts respectively located on both sides of the strip clamp 103, and the two nuts are used to limit the strip clamp 103, and the strip clamp 103 is fixed to the adjusting rod 102 by the two nuts. By tightening the nut located above the strip clamp 103 downward and tightening the nut located below the strip clamp 103 upward, the strip clamp 103 is fixed at a suitable position on the adjusting rod 102. The position of the strip clamp 103 on the adjusting rod 102 can also be adjusted, and the strip clamp 103 can be fixed at any position on the adjusting rod 102 by the two nuts. The orientation of the strip clamp 103 can also be fixed by the two nuts, such as after rotating the strip clamp 103 to a suitable orientation, tightening the two nuts can fix the orientation of the strip clamp 103. In the embodiment of the present application, other types of components that can be clamped and positioned can also be provided on the adjustment rod 102 to fix the strip clamp 103, which is not limited here.
[0037] The two strip clamps 103 are used to clamp the ends of the strip 20 to be tested respectively. The strip test fixture of the embodiment of the present application can be used to perform a flattened state test on the strip 20 to be tested, so as to test the performance of the strip 20 to be tested in a normal state. During the flattened state test of the strip 20 to be tested, the two strip clamps 103 are oriented in opposite directions to ensure that the strip 20 to be tested is in a flattened state and is not bent. The orientation of the strip clamp 103 can refer to the side where the position (such as the strip clamping position) for clamping the strip 20 to be tested is located. Figure 1 The measured strip 20 is in a flattened state, and each strip clamp 103 faces another strip clamp. The strip clamping positions of the two strip clamps 103 can be aligned in a first direction to ensure that the measured strip 20 can be flattened along the first direction.
[0038] When the flattened state test is performed on the tested strip 20, the strip clamp 103 can be moved along the first strip groove 11 according to the length of the tested strip 20, so that the distance between the two strip clamps 103 is less than the length of the tested strip 20, and the two strip clamps 103 are opposite to each other and at the same height relative to the support plate 101. Afterwards, the two strip clamps 103 clamp the two ends of the tested strip 20 respectively, and the two strip clamps 103 move away from each other along the first strip groove 11 until the tested strip 20 is in a tight state, and then the position of the strip clamp 103 is fixed. Afterwards, current is passed through the tested strip 20 to test various performance indicators of the tested strip 20 in a normal state. For example, these performance indicators may include indicators such as critical current, resistance and n value. The n value refers to the critical current density index of the superconducting material, which is used to reflect the nonlinear behavior of the superconducting material when it is close to its critical current.
[0039] Since high-temperature superconducting tapes need to work in a low-temperature environment, the current flow test process of the tape 20 under test in the embodiment of the present application also needs to be performed in a low-temperature environment. For example, after the tape 20 under test is in a taut state, the tape test tool holding the tape 20 under test can be placed in a liquid nitrogen environment, and the tape 20 under test can be cooled to a superconducting state with liquid nitrogen, and then the power supply is turned on to start the actual test.
[0040] The strip clamp 103 may be made of a conductive material, such as copper, iron or other conductive materials. In the embodiment of the present application, the strip clamp 103 may be powered to transmit current to the end of the strip 20 to achieve current transmission to the strip 20. For example, the end of the strip 20 to be tested may be wrapped with an auxiliary connection layer, and the auxiliary connection layer has a high conductivity to ensure that the strip clamp 103 efficiently transmits current to the strip 20 to be tested when clamping the end of the strip 20 to be tested. For example, the material of the auxiliary connection layer may include low-resistance materials such as indium, gold or silver.
[0041] In one embodiment, please continue to refer to Figure 1 The strip clamp 103 also has a power connection hole 1030, which is located at one end of the strip clamp 103 that is away from the strip 20 to be measured relative to the adjustment rod 102. In the strip clamp 103, the power connection hole 1030 is away from the strip clamping position relative to the connection hole for inserting the adjustment rod 102, and the end of the strip 20 to be measured is set at the strip clamping position of the strip clamp 103. The power connection hole 1030 can be connected to a power connector, which is connected to an external power source and can transmit the current of the external power source. The current transmitted by the power connector is transmitted to the strip 20 to be measured through the strip clamp 103. In other embodiments, the power connection hole 1030 can also be set at other positions of the strip clamp 103; or the power connection hole 1030 can be omitted, and the power connector is directly connected to the strip 20 to be measured. In this way, the material of the strip clamp 103 can be an insulating material.
[0042] Before testing the strip 20, voltage leads may be welded at certain intervals on the strip 20 to measure the voltage and current at various positions on the strip 20. The information of various performance indicators may be determined by observing the measured voltage and current for a certain period of time.
[0043] The curvature test bench 104 can be arranged on the support plate 101 along the second direction ( Figure 1 The first direction is perpendicular to the second direction. The movable route of the adjusting rod 102 is perpendicular to the movable route of the curvature test platform 104. The movable route of the curvature test platform 104 can be located at the midpoint of the movable route of the adjusting rod 102. For example, Figure 1As shown, the support plate 101 is rectangular, the adjusting rod 102 can move along the length direction at the edge area of the support plate 101, and the curvature test table 104 can move along the width direction at the middle position of the support plate 101. The movable route of the adjusting rod 102 and the movable route of the curvature test table 104 may not overlap. In some embodiments, the movable route of the adjusting rod 102 and the movable route of the curvature test table 104 may also overlap. If the two movable routes intersect each other, the movable route of the adjusting rod 102 is located in the middle area of the support plate 101.
[0044] In one movement mode of the curvature test bench 104, please continue to refer to Figure 1 The support plate 101 has a second strip groove 12 extending along a second direction. The curvature test table 104 is connected to the second strip groove 12 and can move along the second strip groove 12. The second strip groove 12 can be located at the midpoint of the first strip groove 11. The midpoint position mentioned here only means approximately at the midpoint position, and there can be a certain position error. The second strip groove 12 can be spaced a certain distance from the first strip groove 11 (such as Figure 1 In some embodiments, the second strip groove 12 may also pass through the first strip groove 11 and continue to extend along.
[0045] The first curvature test platform 104 may have a connecting piece (not shown) at the bottom, and the curvature test platform 104 is connected to the support plate 101 through the connecting piece. The connecting piece protruding from the bottom of the curvature test platform 104 extends into the second strip groove 12, so that the curvature test platform 104 is connected to the second strip groove 12 by the connecting piece. The connecting piece can move in the second strip groove 12, and accordingly the curvature test platform 104 moves along the second direction.
[0046] In one example, the connector is a threaded rod, on which a nut can be sleeved, and the curvature test bench 104 can be fixed at any position in the second strip groove 12 by locking the nut. The bottom of the second strip groove 12 is hollow, the threaded rod passes through the second strip groove 12, and the nut can be sleeved on the protruding portion of the threaded rod after passing through the second strip groove 12, and the curvature test bench 104 and the nut are respectively located on both sides of the second strip groove 12. In another example, the connector can be a strip protrusion, and the extension direction of the strip protrusion is the same as the extension direction of the second strip groove 12. The strip protrusion can also pass through the second strip groove 12 and be fixed in position by some other fixing components.
[0047] In another moving mode of the curvature test table 104, a protruding moving track can be provided on the support plate 101 along the second direction, and a clamping component capable of clamping on the moving track is provided at the bottom of the curvature test table 104. The curvature test table 104 is connected to the moving track through the clamping component and can move on the moving track, and the clamping component can be locked to fix the position of the curvature test table 104 when it moves to any position.
[0048] The curvature test bench 104 has an arc-shaped side. In the embodiment of the present application, the curvature test bench 104 is taken as an example to be illustrated as a truncated cone. In some embodiments, the curvature test bench 104 may also be semi-truncated cone-shaped or fan-shaped. In some embodiments, the curvature test bench 104 may also be cylindrical or semi-cylindrical. The embodiment of the present application does not limit the shape of the curvature test bench 104, and it is only necessary to ensure that it has an arc-shaped side.
[0049] The curvature test bench 104 may have only one curved side with one curvature, or may have multiple curved sides with different curvatures, and the height of each curved side may be greater than the width of the strip 20 to be tested. The multiple curved sides with different curvatures may be arranged in a direction away from the support plate 101. Different curved sides may be used to test strips with different curvatures. The radius difference of each curved side may be small, so as to facilitate a more precise measurement of the bending performance of the strip 20 to be tested. In some embodiments, the portion of the curvature test bench 104 that contacts the strip 20 to be tested may be insulated to avoid electrical connection with the strip 20 to be tested, which affects the performance test effect of the strip 20 to be tested. For example, the curvature test bench 104 may be made of an insulating material as a whole, or an insulating layer may be plated on the side.
[0050] like Figure 1 As shown, the curvature test bench 104 may include a plurality of stacked concentric circular cake structures of different radii, each circular cake structure providing an arcuate side of a curvature, and these circular cake structures may be an integral structure. In the direction away from the support plate 101 (i.e., the height direction of the curvature test bench 104), the radius of each circular cake structure may gradually decrease. In some embodiments, in the direction away from the support plate 101, the radius of each circular cake structure may also gradually increase, or each circular cake structure may not be gradually arranged according to the radius size. The arcuate side of different circular cake structures can be used to test the strip with different curvatures. In some embodiments, the curvature test bench 104 is semi-conical, which may include a plurality of stacked semi-conical cake structures of different radii.
[0051] The strip material testing tool of the embodiment of the present application can also be used to perform a bending state test on the strip material 20 to be tested, so as to test the performance of the strip material 20 to be tested in a bending state. Figure 2 is a schematic diagram of another strip material test provided in an embodiment of the present application, Figure 2 The strip test fixture is used to perform a bending state test on the strip 20 to be tested. During the bending state test of the strip 20 to be tested, a curvature test bench 104 is required to wrap the strip 20 to be tested around the curved side of the curvature test bench 104 so that the strip 20 to be tested has the same curvature as the curved side. During this test, the two strip clamps 103 are also directed toward the curvature test bench 104 to ensure that the strip 20 to be tested has no other bends where the strip clamps 103 are located. Afterwards, the strip 20 to be tested can be powered on to test the performance of the strip 20 to be tested under the curvature. Regarding the method of performing performance testing in a bent state and the indicators that need to be tested, reference can be made to the aforementioned introduction to the performance test in a flattened state, which will not be repeated here.
[0052] In some embodiments, when performing a bending state test, the two strip clamps 103 may be symmetrical about the movable path of the curvature test table 104 to ensure that the states of both sides of the tested strip 20 are consistent and the tested strip 20 better fits the corresponding curved side surface.
[0053] When the curvature test bench 104 has multiple curved side surfaces with different curvatures, during the bending state test of the tested strip 20, the tested strip 20 can be wound around different curved side surfaces of the curvature test bench 104 in batches to test the performance of the tested strip 20 at different curvatures. In each test, the strip clamp 103 is placed on the adjustment rod 102 at the same height as the curved side surface around which the tested strip 20 is wound. Figure 2 Take the example of winding the tested strip 20 around the disk structure with the smallest radius in the curvature test bench 104, that is, winding around the arc side with the largest curvature. When testing different curvatures, the tested strip 20 can be tested in order from small to large curvatures to avoid damage to the strip due to direct bending to a large extent, and ensure measurement accuracy at each curvature.
[0054] In the embodiment of the present application, the bending state test of the tested strip 20 can be performed after the flattened state test. After the flattened state test is completed, the tested strip 20 does not need to be removed from the strip test tooling, and the two strip clamps 103 can be directly moved toward each other to make the tested strip 20 become relaxed. After that, the strip clamps 103 can be rotated so that the two strip clamps 103 are both turned toward the curvature test bench 104, and the tested strip 20 is wound around the arc side of the corresponding curvature on the curvature test bench 104. After that, the curvature test bench 104 can be moved in a direction away from the strip clamps 103, so that the tested strip 20 is in a tight state, so that various performance indicators of the tested strip 20 under the current curvature can be tested. Since the curvature test bench 104 is movable, it can be ensured that for different arc sides, the tested strip 20 can be adjusted to fit the arc side tightly without disassembling and adjusting the strip, so as to ensure that the curvature corresponding to the arc side can be accurately tested.
[0055] During the process of rotating the strip clamp 103 toward the curvature test table 104 and the strip 20 being in the final tensioned state, the distance between the two strip clamps 103 can be further adjusted according to the size of the curved side required for the test to ensure that the distance between the strip clamps 103 matches the size of the curved side.
[0056] Since the heights of the curved sides of different curvatures in the curvature test bench 104 are different, the position of the strip clamp 103 on the adjustment rod 102 can be adjusted based on the height of the curved side so that the height of the strip clamp 103 is consistent with the height of the curved side. In this way, the measured strip 20 is prevented from being folded and damaged, and the measurement accuracy is ensured. The height adjustment process can be performed at any time before the measured strip 20 is in a taut state.
[0057] In the embodiment of the present application, after the various components in the strip test jig and the strip 20 to be tested are adjusted for the curvature of each performance to be measured, the strip test jig and the strip 20 to be tested can be placed in a liquid nitrogen environment as a whole, and the strip 20 to be tested can be cooled to a superconducting state with liquid nitrogen, and then the power supply is turned on to start the actual test. When a test is completed and the curvature needs to be adjusted to continue testing the strip 20 to be tested, the strip test jig and the strip 20 to be tested are taken out of the liquid nitrogen environment, and the various components in the strip test jig and the strip 20 to be tested are adjusted based on the curvature to be tested next, and after the adjustment is completed, they are placed in the liquid nitrogen environment again for testing.
[0058] Please continue to refer to Figure 2In the case of a bending state test, the distance between the two strip clamps 103 may be relatively close, and the strip clamps 103 are made of conductive materials. In order to avoid electrical connection between the two strip clamps 103, an insulating material may be provided on the target surface of the strip clamps 103. The target surface is the surface of the two strip clamps 103 that is close to each other during the bending state test of the tested strip 20. For example, an insulating layer may be plated on the target surface or an insulating tape may be attached.
[0059] The strip material testing tool provided in the embodiment of the present application has a strip material chuck 103 with a movable and rotatable orientation. The strip material testing tool can be used to first test various indicators of the strip material in a normal state, and then, without disassembling the strip material, only move and rotate the strip material chuck 103 to test various performance indicators of the strip material in a bent state. Specifically, the two strip material chucks 103 can be respectively clamped at the two ends of the strip material 20 to be tested, and the two strip material chucks 103 are oriented opposite to each other, so that the flattened state test of the strip material 20 to be tested can be achieved. Afterwards, the strip material chuck 103 is moved to a suitable position along the first direction, and the strip material chuck 103 is rotated on the adjustment rod 102 to change the orientation of the strip material chuck 103, and the curvature test table 104 is moved to a suitable position along the second direction, and the strip material 20 to be tested is wound around the side of the curvature test table 104, so that the strip material 20 to be tested can be tested in a bent state without disassembling the strip material 20 to be tested.
[0060] This can reduce repeated disassembly and installation during the strip testing process, reduce damage to superconducting strip samples during the disassembly and installation process, reduce the strip testing cost, and reduce the time loss caused by disassembly, replacement and installation, thereby ensuring that the overall strip testing efficiency is high.
[0061] In addition, since the end of the strip needs to be clamped during the test, it will be subject to a certain pressure, and the degree of compression of the end will also affect the test results of the strip. If the pressure on the end is small, it may cause the connection state of the strip to be not good enough, the current flow is not smooth enough, resulting in heat during the test, making the measured resistance higher than the actual resistance, resulting in inaccurate test results. If the pressure is too large, it may cause damage to the strip, and then it is impossible to measure accurate data. In the process of testing a strip, if the strip needs to be disassembled and reinstalled, it is difficult to ensure that the degree of compression of the end of the strip is the same each time it is installed, which will cause the results obtained from different test processes of the strip to be mismatched, making the test results less accurate. In the embodiment of the present application, since there is no need to disassemble and install multiple times during the strip test, it can be ensured that the end connection conditions (such as the pressure on the end) of the tested strip 20 during each performance test are kept uniform, avoiding the mismatch of the test results obtained due to different end connection conditions in different performance tests, so the test accuracy of the strip can be improved.
[0062] The following is an introduction to two implementations of the strip clamp 103 in the embodiment of the present application in conjunction with the accompanying drawings. The materials of the various components in the strip clamp 103 can be the same, such as copper and other conductive materials. In some embodiments, the components of the strip clamp 103 that do not need to transmit current can also be made of insulating materials, which is not limited here.
[0063] In one implementation of the strip clamp 103, Figure 3 is a schematic structural diagram of a strip clamp provided in an embodiment of the present application. Figure 1 and Figure 2 This type of strip chuck is also used as an example for illustration. Figures 1 to 3 The strip clamp 103 includes a first clamp body 1031, a pressure block 1032, a threaded rod 1033 and a handle 1034. The strip clamp 103 can be similar to a C-type clamp, and the first clamp body 1031 is roughly C-shaped. The first clamp body 1031 can be roughly U-shaped or other shapes. In the strip clamp 103, the power connection hole 1030 can be located on the first clamp body 1031.
[0064] The strip chuck 103 is sleeved on the adjustment rod 102 by using the first chuck body 1031. If there is a connecting hole in the middle position of the first chuck body 1031, the strip chuck 103 is sleeved on the adjustment rod 102 by using the connecting hole. The two ends of the first chuck body 1031 are opposite, and one end has a through hole facing the other end (not shown in the figure), and the threaded rod 1033 passes through the through hole. As hereinafter, the end with the through hole in the first chuck body 1031 is referred to as the first end, and the other end without the through hole is referred to as the second end. The pressing block 1032 is located between the two ends of the first chuck body 1031 and is connected to one end of the threaded rod 1033. The handle 1034 is connected to the other end of the threaded rod 1033. The handle 1034 can rotate and drive the threaded rod 1033 and the pressing block 1032 to move in the extension direction of the threaded rod 1033, so that the pressing block 1032 is close to the second end or away from the second end. The strip clamp 103 clamps the end of the strip 20 to be measured by using the pressing block 1032 and the second end of the first clamp body 1031 .
[0065] In some embodiments, the pressing block 1032 and the threaded rod 1033 in the strip clamp 103 may be an integral structure. Alternatively, the pressing block 1032 may be detachably disposed at one end of the threaded rod 1033, which is not limited here. The pressing block 1032 may be in a square shape, and its surface close to the second end of the first clamp body 1031 may be a plane. The surface of the second end close to the pressing block 1032 may also be a plane. In this way, it can be ensured that the strip 20 to be tested is clamped between two planes to avoid damage to the strip 20 to be tested.
[0066] The handle 1034 and the threaded rod 1033 can be tightly connected or integrally constructed to ensure that the handle 1034 can stably drive the threaded rod 1033 to rotate. Figures 1 to 3 As shown, the handle 1034 can be a symmetrical wing-shaped structure, which has two wing-shaped parts respectively located on both sides of the threaded rod 1033. In some embodiments, the handle 1034 can also be in the shape of a straight strip or a sheet. For example, the end of the threaded rod 1033 has an opening, and the handle 1034 passes through the opening and is fixed to the threaded rod 1033.
[0067] In another implementation of the strip clamp 103, Figure 4 Schematic diagram of another strip clamp provided in the embodiment of the present application. Figure 4 As shown, the strip clamp 103 is a spring clamp, and the strip clamp 103 includes a second clamp body 1035, a first clamp arm 1036, a second clamp arm 1037, a spring (not shown in the figure) and a connecting component 1038. In the strip clamp 103, the power connection hole 1030 can be located on the second clamp body 1035.
[0068] The strip clamp 103 is sleeved on the adjustment rod 102 by means of the second clamp body 1035. For example, a connection hole is provided in the middle of the second clamp body 1035, and the strip clamp 103 is sleeved on the adjustment rod 102 by means of the connection hole. The first clamp arm 1036 is fixed on the second clamp body 1035, and the first clamp arm 1036 extends from the second clamp body 1035.
[0069] One end of the first clamp arm 1036 close to the second clamp body 1035 is connected to one end of the second clamp arm 1037 through a connecting member 1038, and a spring is sleeved on the connecting member 1038, and two ends of the spring are respectively against one end of the first clamp arm 1036 and one end of the second clamp arm 1037. In this way, it can be ensured that in a natural state, one end of the first clamp arm 1036 and one end of the second clamp arm 1037 are separated, and the other end of the first clamp arm 1036 and the other end of the second clamp arm 1037 are in contact with each other under the action of the spring.
[0070] By applying pressure to one end of the first clamp arm 1036 and one end of the second clamp arm 1037, the pressure can be transmitted to the spring, causing the spring to deform, thereby enabling the other end of the first clamp arm 1036 and the other end of the second clamp arm 1037 to change from a fitted state to a separated state. The strip clamp 103 clamps the end of the strip 20 to be measured using the other end of the first clamp arm 1036 and the other end of the second clamp arm 1037. When it is necessary to clamp the strip 20 to be measured, pressure is applied to the end of the springs of the two clamp arms to separate the other ends of the two clamp arms, and the end of the strip 20 to be measured is placed between the other ends of the two clamp arms, and then the pressure on the clamp arms is stopped so that the two clamp arms clamp the end of the strip 20 to be measured. In this manner, the force applied by the strip clamp 103 to the end of the strip 20 to be measured is the elastic force of the spring.
[0071] By using the above-mentioned spring clamp as the strip clamp 103, when replacing the strip to be tested, only a force needs to be applied to the spring clamp, so that the strip to be tested can be replaced more conveniently and quickly, saving the time consumed by strip replacement. In addition, the use of this type of strip clamp 103 can also improve the uniformity of the end connection of the strip to be tested after the strip to be tested is replaced. Since the force provided by the spring in the spring clamp is constant, it can be ensured that the degree of compression of the strip to be tested after replacement is consistent with that before replacement, so the uniformity of the end connection can be ensured to be high.
[0072] In the embodiment of the present application, the strip testing tooling can be used to achieve rapid and non-destructive replacement of the strip under test, and can quickly test the characteristics of the strip under test in a normal flattened state and a bent state, thereby improving the overall strip testing efficiency.
[0073] Figure 51 is a flow chart of a strip material testing method provided in an embodiment of the present application. The method can be applied to any of the strip material testing tools mentioned above. The method can be cross-referenced with the introduction of the strip material testing tool mentioned above. Figure 5 As shown, the method includes the following steps 502 to 508.
[0074] Step 502: Clamp two ends of the strip to be tested in two strip clamps in the strip testing tool respectively, and make the two strip clamps face each other.
[0075] For different strip clamps, the clamping method can be different. Figure 3 The strip chuck 103 shown in the figure can firstly rotate the handle 1034 to drive the pressing block 1032 and the threaded rod 1033 to move outwards, so that a sufficient gap is left between the pressing block 1032 and the second end of the first chuck body 1031. Then, the end of the strip to be measured is placed in the gap, and then the handle 1034 is rotated in the opposite direction to drive the pressing block 1032 and the threaded rod 1033 to move inwards, so that the pressing block 1032 presses the end of the strip to be measured.
[0076] For the above Figure 4 The strip clamp 103 shown can apply pressure to one end of the springs of the two clamp arms to separate the other ends of the two clamp arms, place the end of the strip 20 to be measured between the other ends of the two clamp arms, and then stop applying pressure to the clamp arms so that the two clamp arms clamp the end of the strip 20 to be measured.
[0077] Please continue to refer to Figure 1 and Figure 2 You can also loosen the nuts on both sides of the strip clamp 103 on the adjusting rod 102 in the strip testing tooling, so that the strip clamp 103 can rotate on the adjusting rod 102, and then rotate the two strip clamps 103 to face each other, and then tighten the nuts to fix the direction of the strip clamp 103.
[0078] If the distance between the two strip clamps 103 is originally large, the adjusting rods 102 can be moved toward each other in the first strip groove 11 before step 502 to shorten the distance between the two strip clamps 103 , and then step 502 is performed.
[0079] Step 504: Move the two adjustment rods where the two strip clamps are located in opposite directions along the first direction until the strip to be tested is taut, and perform a flattening test on the strip to be tested.
[0080] For example, after the end of the measured strip 20 is clamped by the strip clamp 103, the adjusting rod 102 can be moved to put the measured strip 20 in a taut state. Then, the position of the adjusting rod 102 can be fixed, such as by tightening the nut on the adjusting rod 102 for clamping with the first strip groove 11, so as to fix the position of the adjusting rod 102. In some embodiments, if the length of the measured strip 20 is short, only one adjusting rod 102 can be moved to put the measured strip 20 in a taut state.
[0081] After the tested strip 20 and the strip testing fixture are adjusted, the overall structural state can be as follows: Figure 1 As shown, the actual performance test can then be performed on the tested strip 20. For example, the strip test fixture holding the tested strip 20 is placed in a liquid nitrogen environment, the tested strip 20 is cooled to a superconducting state by liquid nitrogen, and then a current is transmitted to the strip clamp 103 in the strip test fixture, so that the current is transmitted to the tested strip 20 through the strip clamp 103, and then various performance indicators of the tested strip 20 in a flattened state are measured.
[0082] Step 506: After the flattening state test of the tested strip is completed, the two adjustment rods are moved toward each other along the first direction on the support plate, and the two strip clamps are rotated so that the two strip clamps face the curvature test table in the strip test fixture.
[0083] For example, after the flattened state test of the tested strip 20 is completed, the strip test fixture and the tested strip 20 can be adjusted to perform a bending state test on the tested strip 20. After the strip test fixture holding the tested strip 20 is taken out of the liquid nitrogen environment, the nut on the adjustment rod 102 in the strip test fixture can be loosened to move the adjustment rod 102 toward each other in the first strip groove 11 to relax the tested strip 20. The two strip clamps 103 can also be rotated to face the curvature test table 104, and then the nuts used to fix the strip clamps 103 are tightened to fix the direction of the strip clamps 103.
[0084] Step 508: Wrap the tested strip around the arc-shaped side surface of the curvature test bench, and move the curvature test bench along the second direction toward the side away from the strip clamp until the tested strip is taut, and perform a bending state test on the tested strip.
[0085] For example, after the tested strip 20 is relaxed, the tested strip 20 can be wound around the curved side of the curvature test bench 104, and the positions of the adjusting rod 102 and the curvature test bench 104 are adjusted to make the tested strip 20 tight, and then the nut is tightened to fix the positions of the adjusting rod 102 and the curvature test bench 104. Before the tested strip 20 is not tight and fits the curved side, the adjusting rod 102 and the curvature test bench 104 can continue to move adaptively to put the tested strip 20 in a desired state. After that, the actual performance test can be performed on the tested strip 20. The actual performance test process can refer to the relevant introduction of the flattened state test in the aforementioned step 504, which will not be repeated here.
[0086] During the bending state test, the distance between the two strip clamps 103 and the curvature test bench 104 can be equal to ensure that the state of the tested strip 20 on both sides of the curvature test bench 104 is the same, avoiding the strip shape from affecting the test results and ensuring a better strip test effect.
[0087] In the embodiment of the present application, the curvature test bench has a plurality of arc-shaped side surfaces of different curvatures arranged in a direction away from the support plate, and the strip clamp can also move on the adjustment rod. Accordingly, step 508 may include the following steps 1 to 4, so as to wrap around different arc-shaped side surfaces in batches and perform bending state tests for different curvatures. During these tests, the strip to be tested may not be disassembled.
[0088] Step 1: Wrap the tested strip around the first curved side surface of the curvature test bench, and move the curvature test bench along the second direction toward the side away from the strip clamp until the tested strip is taut, and perform a bending state test on the tested strip corresponding to the curvature of the first curved side surface.
[0089] The first curved side surface may be any curved side surface in the curvature test bench. The bending state test process of the first curved side surface may refer to the introduction to step 508 above, which will not be described in detail here.
[0090] Step 2: After the bending state test corresponding to the curvature of the first arc-shaped side surface is completed, the curvature test bench is moved along the second direction toward the side close to the strip clamp to relax the tested strip.
[0091] After the bending state test corresponding to the curvature of the first arc-shaped side is completed, the curvature can be adjusted to test the performance of the tested strip under other curvatures. The curvature test bench can be moved toward the side close to the strip clamp in the second strip groove by loosening the nut fixing the curvature test bench to relax the tested strip, and then the tested strip can be wound around the arc-shaped side of other curvatures for testing. In the process of relaxing the tested strip, the position of the adjustment rod can also be adjusted adaptively.
[0092] Step three, wrap the tested strip around the second curved side of the curvature test bench, and move the strip clamp on the adjustment rod to a position at the same height as the second curved side; wherein the curvature of the second curved side is greater than the curvature of the first curved side.
[0093] Since the curved side surfaces with different curvatures in the curvature test bench are arranged in sequence along the height direction, the height of the strip clamp needs to be adjusted accordingly when adjusting the test curvature to ensure that the strip clamp is at the same height as the curved side surface to be tested, thereby ensuring that the tested strip is in a good condition.
[0094] In the embodiment of the present application, during the bending state test of the tested strip, the performance tests of different curvatures can be performed on the tested strip in order from small to large curvatures. Accordingly, after the test is performed using the first curved side surface, the test can be performed using the second curved side surface with a larger curvature.
[0095] Step 4: Move the curvature test bench along the second direction toward the side away from the strip clamp until the strip to be tested is taut, and perform a bending state test corresponding to the curvature of the second arc-shaped side surface on the strip to be tested.
[0096] Step 4 can refer to step 1 and will not be repeated here.
[0097] After performing the bending state test corresponding to the curvature of the second curved side surface, the curved side surface may be further adjusted to perform complete state tests of other curvatures on the tested strip. The specific method may be inferred from the above steps and will not be described in detail here.
[0098] In summary, in the embodiment of the present application, the strip clamp used to clamp the end of the strip to be tested is sleeved on the adjusting rod, and it can be rotated on the adjusting rod to adjust the direction, and the adjusting rod and the curvature test bench can move in two vertical directions. In this way, when testing the strip to be tested, the two strip clamps can be made to clamp the two ends of the strip to be tested respectively, and the two strip clamps are made to face each other, so that the flattened state test of the strip to be tested can be achieved. After the strip clamp clamps the strip to be tested, only the strip clamp is moved to a suitable position along the first direction, and the strip clamp is rotated on the adjusting rod to change the direction of the strip clamp, and the curvature test bench is moved to a suitable position along the second direction, and the strip to be tested is wound around the side of the curvature test bench, so that the strip to be tested can be tested for bending state without disassembling the strip to be tested. Therefore, the disassembly of the strip during the test can be reduced, the test time can be saved, the test efficiency can be improved, and the damage caused by the disassembly to the strip can be reduced, and the cost of strip testing can be reduced.
[0099] The above describes specific embodiments of the present application. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the accompanying drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.
[0100] Those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the present application. In the above embodiments, the description of each embodiment has its own emphasis, and for parts not described in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.
[0101] The preferred embodiments of the present application disclosed above are only used to help explain the present application. The optional embodiments do not describe all the details in detail, nor do they limit the present application to the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of the present application. The present application selects and specifically describes these embodiments in order to better explain the principles and practical applications of the present application, so that those skilled in the art can understand and use the present application well.
Claims
1. A strip testing tool, characterized in that: include: A support plate, two adjustment rods, two strip clamps and a curvature test table, wherein the curvature test table has a curved side surface; The two adjustment rods can move along a first direction on the support plate, and the curvature test table can move along a second direction on the support plate, and the first direction is perpendicular to the second direction; The two strip clamps are respectively sleeved on the two adjustment rods, and each strip clamp can be rotated on the adjustment rod to adjust the direction; The two strip clamps are used to clamp the ends of the strip to be tested respectively; during the flattened state test of the strip to be tested, the two strip clamps are oriented opposite to each other; during the bent state test of the strip to be tested, the two strip clamps are oriented toward the curvature test bench, and the strip to be tested is wrapped around the arc-shaped side surface of the curvature test bench.
2. The strip testing tool according to claim 1, characterized in that: The adjusting rod is a screw rod, and two nuts are sleeved on the adjusting rod and are respectively located on both sides of the strip clamp, and the strip clamp is fixed on the adjusting rod through the two nuts.
3. The strip testing tool according to claim 1, characterized in that: The support plate has a first strip groove and a second strip groove, the first strip groove extends along the first direction, the second strip groove extends along the second direction, and the second strip groove is located at the mid-perpendicular position of the first strip groove; The two adjustment rods are located in the first strip groove and can move in the first strip groove; The curvature testing platform is connected to the second strip groove and can move along the second strip groove.
4. The strip testing tool according to any one of claims 1 to 3, characterized in that: The strip chuck comprises a first chuck body, a pressing block, a threaded rod and a handle; The strip chuck is sleeved on the adjusting rod by the first chuck body; two ends of the first chuck body are opposite, and one end has a through hole facing the other end; The threaded rod passes through the through hole, the pressing block is located between the two ends and connected to one end of the threaded rod, and the handle is connected to the other end of the threaded rod; the handle can rotate and drive the threaded rod and the pressing block to move in the extension direction of the threaded rod; The strip clamp clamps the end of the strip to be measured by using the pressing block and the other end of the first clamp body.
5. The strip testing tool according to any one of claims 1 to 3, characterized in that: The strip clamp is a spring clamp, and the strip clamp comprises a second clamp body, a first clamp arm, a second clamp arm, a spring and a connecting component; The strip chuck is sleeved on the adjusting rod by the second chuck body, and the first chuck arm is fixed on the second chuck body; One end of the first clamp arm is connected to one end of the second clamp arm through the connecting component, the spring is sleeved on the connecting component, and two ends of the spring are respectively against one end of the first clamp arm and one end of the second clamp arm; By applying pressure to one end of the first clamp arm and one end of the second clamp arm, the spring is deformed, so that the other end of the first clamp arm and the other end of the second clamp arm can be changed from a fitted state to a separated state; The strip clamp clamps the end of the strip to be measured by using the other end of the first clamp arm and the other end of the second clamp arm.
6. The strip testing tool according to any one of claims 1 to 3, characterized in that: The strip clamp also has a power connection hole, and the power connection hole is located at an end of the strip clamp that is relatively far away from the measuring strip relative to the adjusting rod; The power connection hole is used to connect to a power connector, and the current transmitted by the power connector is transmitted to the measured strip through the strip clamp.
7. The strip testing tool according to any one of claims 1 to 3, characterized in that: The target surface of the strip clamp has an insulating material; the target surface is the surface of the two strip clamps that is close to each other during the bending state test of the strip to be tested.
8. The strip testing tool according to any one of claims 1 to 3, characterized in that: The curvature test bench has a plurality of arc-shaped side surfaces with different curvatures arranged in a direction away from the support plate, and the strip clamp can also move on the adjustment rod; During the bending state test of the tested strip, the tested strip is wound around different arc-shaped sides of the curvature testing table in batches to perform tests of different curvatures, and the strip clamp is located on the adjusting rod at the same height as the arc-shaped side around which the tested strip is wound.
9. A strip testing method, characterized in that: Applicable to the strip testing tool according to any one of claims 1 to 8, the method comprising: Clamping two ends of the strip to be tested in two strip clamps in the strip testing tool respectively, and making the two strip clamps face each other; Move the two adjusting rods where the two strip clamps are located in opposite directions along a first direction until the strip to be tested is taut, and perform a flattening test on the strip to be tested; After the flattened state test is completed, the two adjustment rods are moved toward each other along the first direction on the support plate, and the two strip clamps are rotated so that the two strip clamps face the curvature test table in the strip test fixture; The tested strip is wound around the arc-shaped side surface of the curvature test bench, and the curvature test bench is moved along the second direction toward a side away from the strip clamp until the tested strip is taut, and a bending state test is performed on the tested strip.
10. The method according to claim 9, characterized in that The curvature test bench has a plurality of arc-shaped side surfaces with different curvatures arranged in a direction away from the support plate, and the strip clamp can also move on the adjustment rod; The method of winding the tested strip around the arc-shaped side surface of the curvature test bench and moving the curvature test bench along the second direction toward a side away from the strip clamp until the tested strip is taut, and performing a bending state test on the tested strip, comprises: Winding the tested strip around the first curved side surface of the curvature test bench, and moving the curvature test bench along the second direction toward a side away from the strip clamp until the tested strip is taut, and performing a bending state test on the tested strip corresponding to the curvature of the first curved side surface; After the bending state test corresponding to the curvature of the first arc-shaped side surface is completed, the curvature test bench is moved along the second direction toward the side close to the strip clamp to relax the tested strip; Winding the strip to be tested around the second curved side surface of the curvature test bench, and moving the strip clamp on the adjustment rod to a position at the same height as the second curved side surface; wherein the curvature of the second curved side surface is greater than the curvature of the first curved side surface; The curvature test bench is moved along the second direction toward the side away from the strip clamp until the strip to be tested is taut, and a bending state test corresponding to the curvature of the second arc-shaped side surface is performed on the strip to be tested.
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