Method for rapidly detecting static correction long wavelength problem on plane

Abstract

The invention relates to a method for plane rapid detection of a static correction long wavelength problem, and belongs to the technical field of seismic data processing. The method comprises the following specific steps: step 1, loading to-be-detected superposed data; 2, carrying out cross-correlation analysis on the two loaded superposed data; 3, outputting a cross-correlation analysis parameter DT value; 4, judging whether a long wavelength problem exists or not based on the cross-correlation property; and 5, drawing a DT value plane display graph. According to the invention, the cross-correlation influence factors of the near-offset stacked section and the far-offset stacked section are fully utilized, and the difference between the near-offset stacked section and the far-offset stacked section is introduced into the long-wavelength static correction detection technology for the first time; according to the method, the working efficiency of long-wavelength static correction problem detection in the seismic data processing process is remarkably improved, and the long-wavelength static correction problem is recognized more comprehensively, quickly and visually.

Description

Technical Field

[0001] The invention relates to a method for quickly detecting a long wavelength problem of static correction in a plane, and belongs to the technical field of seismic data processing. Background Art

[0002] In the process of seismic data processing, the static correction of primary and residual static correction is repeated multiple times, which solves the static correction problem of medium wavelength and short wavelength better, but there is still a more serious static correction problem of long wavelength. At present, there are many static correction software and many quality control methods. Faced with the static correction values ​​of multiple sets of software, how to conduct comparative quality control and select the appropriate quality control method to obtain the best static correction value is a huge problem we face. At this stage, quality control mainly includes these aspects. One of the existing technologies is to directly judge by superposition. Due to the large amount of data, it is impossible to conduct comprehensive quality control. This method is inefficient and not intuitive. There is also quality control through the superposition of common offset profiles, but it cannot detect whether there is a long wavelength problem. In addition, there is a sub-offset superposition of control lines, and the long wavelength problem is judged by visually checking whether there are errors or jitters in the superimposed profiles of different offsets. This method is relatively subjective and time-consuming.

[0003] Generally speaking, there is currently no effective, comprehensive, fast and objective method to detect whether static corrections have long wavelength problems. Summary of the invention

[0004] In order to solve the above problems existing in the prior art, the present invention discloses an effective, comprehensive and rapid method for detecting whether long-wavelength static correction exists in seismic data, thereby solving the problems of low efficiency, incompleteness and lack of intuitiveness of the prior art methods.

[0005] The technical solution adopted by the present invention is: a method for quickly detecting the long wavelength problem of static correction in a plane, and the specific steps are as follows:

[0006] Step 1: Load the superposition data to be detected;

[0007] Step 2: Perform cross-correlation analysis on the two loaded superposition data;

[0008] Step 3: Output the cross-correlation analysis parameter DT value;

[0009] Step 4: Based on the properties of the cross-correlation, determine whether there is a long wavelength problem.

[0010] Furthermore, the method further comprises step 5: drawing a plane display diagram of the DT value.

[0011] Furthermore, in the step 1, specifically: read in the near-bias stacking data with the static correction amount added, and at the same time read in the far-bias stacking data with the same static correction amount added.

[0012] Furthermore, in the step 1, the headers of the near-biased stacking data and the far-biased stacking data are the same.

[0013] Furthermore, in the step 1, there is an overlapped area between the near offset distance of the near offset stacking data and the far offset distance of the far offset stacking data.

[0014] Furthermore, in step 1, the far offset distance and the near offset distance overlap by 500 to 800 meters, thereby ensuring that the near offset stacking section and the far offset stacking section have overlapping parts.

[0015] Furthermore, in the step 2, specifically: performing a cross-correlation analysis on the loaded adjusted near-bias stacked profile and far-bias stacked profile.

[0016] Furthermore, in step 2, the cross-correlation analysis is specifically as follows: given that both real functions f1(t) and f2(t) are energy signals, namely, the input near-offset stacking data and far-offset stacking data, respectively; comparing the similarity between one signal and another signal with a time delay of τ, the cross-correlation function is introduced and defined as:

[0017]

[0018]

[0019] The cross-correlation function is a function of the time difference τ between the two signals, R 12 (τ) refers to the cross-correlation value of the energy signal f1(t) compared with the energy signal f2(t) when the lead time is τ; R 21 (τ) refers to the cross-correlation value of the energy signal f2(t) compared to the energy signal f1(t) when the lead time is τ; generally:

[0020] R 12 (τ)≠R 21 (τ)

[0021] Find the R of each 12 (τ) or R 21 (τ), and find the extreme value A in the cross-correlation value, as well as the time DT value corresponding to the extreme value A.

[0022] Furthermore, in step 3, specifically: output the DT value of each channel, record it in the data channel header, and print the channel header, which mainly includes the geodetic east coordinate X and geodetic north coordinate Y of the superimposed data section and the DT value.

[0023] Furthermore, in step 4, specifically, when the DT value is between -2 and 2, it indicates that there is no long wavelength problem; otherwise, there is a long wavelength problem.

[0024] Furthermore, in step 5, specifically: plane display is performed with the X coordinate and the Y coordinate as the horizontal and vertical coordinates and the DT value as the Z axis.

[0025] Furthermore, in the step 5, the distribution of DT values ​​is displayed on a plane diagram, and by checking which area has continuous block or strip distribution of non-zero values, it is proved that the area has a long wavelength problem.

[0026] The present invention discloses a method for rapid plane detection of long-wavelength static correction problems. The method has the beneficial effect of making full use of the cross-correlation influencing factors of near-offset stack sections and far-offset stack sections, and for the first time considering the use of the difference between the near-offset stack sections and the far-offset stack sections and introducing them into the long-wavelength static correction detection technology. This method significantly improves the work efficiency of detecting long-wavelength static correction problems in the process of seismic data processing, and identifies long-wavelength static correction problems more comprehensively, quickly and intuitively. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0028] Figure 1 Shown is a flow chart of the present invention;

[0029] Figure 2 Shown is a near-offset overlay of refraction static correction;

[0030] Figure 3 Shown is a refraction statics correction far offset stack;

[0031] Figure 4 The figure shows the plane diagram of DT value obtained by cross-correlation of refraction static correction;

[0032] Figure 5 Shown is a schematic diagram of characteristic parameters of the cross-correlation function;

[0033] Figure 6 Shown is a near-offset stack of tomographic static correction;

[0034] Figure 7 Shown is a tomographic statics correction far-offset stack;

[0035] Figure 8 The figure shows the plane diagram of DT value obtained by cross-correlation of tomographic static correction.

[0036] Specific implementation methods

[0037] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] Example 1

[0039] like Figures 1 to 5 As shown, a method for quickly detecting the long wavelength problem of static correction on a plane is provided. The specific steps are as follows:

[0040] Step 1: Load the superposition data to be detected; specifically: Figure 2 and 3 As shown, method A (refraction static correction method) is used to perform tomographic static correction calculation to obtain static correction amount A. Static correction amount A is used to perform near-offset stacking to obtain a tomographic static correction near-offset stacking map of method A, and static correction amount A is used to perform far-offset stacking to obtain a tomographic static correction far-offset stacking map of method A. That is, the near-biased stacking data with the static correction amount added is read in, and the far-biased stacking data with the same static correction amount added is read in at the same time. There is an overlapping area between the near-offset distance of the near-biased stacking data and the far-offset distance of the far-biased stacking data. In this embodiment, there is a 600-meter overlapping part. The headers of the near-biased stacking data and the far-biased stacking data are the same, and the number of tracks is the same, which is convenient for subsequent matching with the header.

[0041] Step 2: Perform cross-correlation analysis on the two loaded stacked data; specifically: perform cross-correlation analysis on the loaded adjusted near-offset stacked profile and far-offset stacked profile. This method uses the cross-correlation of the near-offset stacked profile and the far-offset stacked profile to determine the similarity between the two, and then quickly detect whether there is a long wavelength problem in the static correction. The cross-correlation similarity is as follows: It is known that the real functions f1(t) and f2(t) are both energy signals, that is, the input near-offset stacked data and far-offset stacked data respectively; compare the similarity between one signal and the other signal with a delay of τ, and introduce the cross-correlation function defined as:

[0042]

[0043]

[0044] The cross-correlation function is a function of the time difference τ between the two signals, R 12(τ) refers to the cross-correlation value of the energy signal f1(t) compared with the energy signal f2(t) when the lead time is τ; R 21 (τ) refers to the cross-correlation value of the energy signal f2(t) compared to the energy signal f1(t) when the lead time is τ; generally:

[0045] R 12 (τ)≠R 21 (τ)

[0046] By selecting the same data at different offset distances for near-offset stacking and far-offset stacking, we can find the R of each trace. 12 (τ) or R 21 The cross-correlation value of (τ) is as follows: Figure 5 As shown in the diagram, find the extreme value A in the cross-correlation value and the time DT value corresponding to the extreme value A.

[0047] Step 3: Output the cross-correlation analysis parameter DT value; specifically: output the DT value of each channel, record it in the data channel header, and print the channel header, which mainly includes the geodetic east coordinate X and geodetic north coordinate Y of the stacked data section and the DT value;

[0048] Step 4: Based on the properties of the cross-correlation, determine whether there is a long wavelength problem. If there is no long wavelength problem in the near-biased stacking and the far-biased stacking, the DT value corresponding to the maximum value of the cross-correlation is at 0 under ideal conditions. However, there is a certain difference between the actual data and the ideal data, and the DT value is generally between -2 and 2. If the similarity is good, that is, the DT value is between -2 and 2, it means that there is no long wavelength problem. Otherwise, there is a long wavelength problem. This method can also quickly judge the quality of the correction amount for multiple sets of static corrections based on the percentage of similarity.

[0049] Step 5: Draw a DT value plane display diagram. Specifically: use the X-coordinate and Y-coordinate as the horizontal and vertical coordinates, and the DT value as the Z axis for plane display. Display the distribution of DT values ​​on the plane diagram, and by checking which area has continuous block or strip distribution of non-zero values, it is proved that the area has a long wavelength problem. Figure 4 Method A (refraction static correction method) cross-correlation to obtain the DT value plane diagram shows that the DT value at point A is 5.3 (the color here is red), and the DT value is not between -2 and 2, that is, it does not meet the value near 0, indicating that there is a long-wavelength static correction problem at this location. The DT value at point B is 0.8 (the color here is green), which meets the value near 0, indicating that there is no long-wavelength static correction problem at this location. By comparing the DT values, it is very convenient to find out which area has a long-wavelength static correction problem.

[0050] Embodiment 2:

[0051] like Figure 6-8As shown, method B (tomographic static correction method) is used to perform tomographic static correction calculation to obtain static correction amount B. Static correction amount B is used to perform near-offset stacking to obtain method B tomographic static correction near-offset stacking map, and static correction amount B is used to perform far-offset stacking to obtain method B tomographic static correction far-offset stacking map. Subsequently, a cross-correlation analysis is performed on the near-offset stacking and the far-offset stacking to obtain the DT value, and a DT value plane map is drawn. Figure 8 Zhongyu Figure 4 At the same position C (green here), the DT value is 0.9, which is close to 0. There is no long-wavelength static correction problem at this location.

[0052] Embodiment 3:

[0053] In order to quickly compare the tomographic static correction method A and method B, which one solves the long wavelength problem better, Figure 1 The process is operated and the results are Figure 4 and Figure 8 , Figure 4 and Figure 8 By comparison, we can see that: Figure 8 The continuous block or strip distribution is significantly less than Figure 4 ,in addition Figure 8 The middle green area is much larger than Figure 4 The green area in the figure is near 0. Therefore, it can be concluded that tomographic static correction method B solves the long-wavelength static correction problem of the data better than method A.

[0054] In addition, from Figure 4 and Figure 8 In contrast, Figure 4 The DT value at point A is 5.3, which is not close to 0. There is a long-wavelength static correction problem at this point. Figure 8 and Figure 4 At the same position C, the DT value is 0.9, which is close to 0, indicating that there is no long-wavelength static correction problem at this location. Figure 4 and Figure 8 , you can easily see Figure 8 The DT value near 0 is more than Figure 4 Method B has fewer long-wavelength static correction problems. In other words, this method can distinguish the advantages and disadvantages of method A and method B very well.

[0055] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for rapid detection of long wavelength problems in plane static correction, characterized in that: The following steps are involved: Step 1: Load the superposition data to be detected; Step 2: Perform cross-correlation analysis on the two loaded superposition data; Step 3: Output the cross-correlation analysis parameter DT value; Step 4: Based on the properties of the cross-correlation, determine whether there is a long wavelength problem.

2. A method for rapid detection of long wavelength static correction problems in a plane according to claim 1, characterized in that: The method also includes step 5: drawing a plane display diagram of the DT value.

3. The method for rapid detection of long wavelength static correction in a plane according to claim 1, characterized in that: In step 1, specifically: read in the near offset stacking data with static correction added, and read in the far offset stacking data with the same static correction added; the headers of the near offset stacking data and the far offset stacking data are the same; there is an overlapping area between the near offset distance of the near offset stacking data and the far offset distance of the far offset stacking data.

4. The method for rapid detection of long wavelength static correction in a plane according to claim 1, characterized in that: In step 2, specifically: perform cross-correlation analysis on the loaded adjusted near-bias stacked profile and far-bias stacked profile.

5. A method for rapid detection of long wavelength static correction problems in a plane according to claim 4, characterized in that: In step 2, the cross-correlation analysis is as follows: it is known that both real functions f1(t) and f2(t) are energy signals, namely, the input near-offset stacking data and far-offset stacking data, respectively; the similarity between one signal and another signal with a time delay of τ is compared, and the cross-correlation function is introduced and defined as: The cross-correlation function is a function of the time difference τ between the two signals, R 12 (τ) refers to the cross-correlation value of the energy signal f1(t) compared with the energy signal f2(t) when the lead time is τ; R 21 (τ) refers to the cross-correlation value of the energy signal f2(t) compared with the energy signal f1(t) when the lead time is τ; R 12 (τ)≠R 21 (t) Find the R of each 12 (τ) or R 21 (τ), and obtain the extreme value A in the cross-correlation value, and the time DT value corresponding to the extreme value A.

6. The method for rapid detection of long wavelength static correction in a plane according to claim 1, characterized in that: In step 3, specifically: output the DT value of each channel, record it in the data channel header, and print the channel header, which mainly includes the geodetic east coordinate X and geodetic north coordinate Y of the superimposed data section and the DT value.

7. The method for rapid detection of long wavelength static correction in a plane according to claim 1, characterized in that: In step 4, specifically, when the DT value is between -2 and 2, there is no long wavelength problem; otherwise, there is a long wavelength problem.

8. The method for rapid detection of long wavelength static correction in a plane according to claim 2, characterized in that: In step 5, specifically: plane display is performed with the X coordinate and the Y coordinate as the horizontal and vertical coordinates and the DT value as the Z axis.

9. A method for rapid detection of long wavelength static correction problems in a plane according to claim 2, characterized in that: In step 5, the distribution of DT values ​​is displayed on a plane graph, and by checking which area has continuous block or strip-shaped non-zero values, it is proved that the area has a long wavelength problem.

Images