A probe arm angle fine-tuning mechanism

Abstract

The embodiment of the present application provides a probe arm angle fine-tuning mechanism, which relates to the technical field of probe seats. A probe arm angle fine-tuning mechanism includes a probe seat, an adjustment block arranged on one side of the probe seat, an L-shaped plate slidably installed on one side of the adjustment block, a fifth-axis adjustment mechanism installed on the L-shaped plate, and the lower end of the fifth-axis adjustment mechanism and the connecting seat, a fixed seat is arranged on the lower side of the connecting seat, and a fourth-axis adjustment mechanism is installed in the fixed seat. The present invention lowers the connecting column by rotating the horizontal high-adjustment knob, so that the positioning pin moves downward, and at the same time, combined with the rotation of the inner column in the bearing three, the positioning pin rotates downward, thereby satisfying the fine-tuning of the upper and lower angles of the probe. By rotating the quick adjustment plate, the adjustment scenario of the rotation angle greater than 30° is realized before the probe is installed. By rotating the fine-tuning knob, the protrusion and the rotating disk are caused to rotate, so as to realize the coarse and fine adjustment of the probe angle. After adjustment, the fixing bolt can be used for positioning to enhance the stability of the probe.

Description

Technical Field

[0001] The present application relates to the technical field of probe seats, and in particular to a probe arm angle fine-tuning mechanism. Background Art

[0002] In the field of precision measurement and testing, the adjustment accuracy and flexibility of the probe holder are crucial to ensure high-quality data acquisition. Traditional probe arms usually only provide four-axis fine-tuning mechanisms (X, Y, Z axis linear movement and one rotation axis), which is sufficient in many cases. However, this design has certain limitations:

[0003] It is difficult for traditional probe arms to adjust the angle of the probe in the horizontal direction, which limits its application scenarios. In order to meet the measurement requirements of different angles, users often need to equip multiple probe arms with different angles, which increases the cost and operation complexity.

[0004] Although some advanced probe holders have introduced the fifth axis adjustment function, most of these designs can only perform coarse adjustment and are difficult to achieve fine angle adjustment. Therefore, in actual use, this type of probe holder is difficult to fully meet the needs of high-precision measurement, especially when the probe angle needs to be fine-tuned. Summary of the invention

[0005] The present application aims to at least solve the problem that the conventional probe arm in the prior art is difficult to adjust the angle of the probe in the horizontal direction, which limits its application scenarios. In order to meet the measurement requirements of different angles, users often need to equip multiple probe arms with different angles, which increases the cost and operation complexity. To this end, the present application proposes a probe arm angle fine-tuning mechanism.

[0006] According to an embodiment of the present application, a probe arm angle fine-tuning mechanism includes a probe seat, an adjustment block arranged on one side of the probe seat, an L-shaped plate slidably installed on one side of the adjustment block, a fifth-axis adjustment mechanism is installed on the L-shaped plate, the lower end of the fifth-axis adjustment mechanism is connected to a connecting seat, a fixed seat is arranged on the lower side of the connecting seat, a fourth-axis adjustment mechanism is installed in the fixed seat, one end of the fourth-axis adjustment mechanism is connected to a positioning pin, and the positioning pin is used to fix the probe.

[0007] Furthermore, the fifth axis adjustment mechanism includes a rotating disk installed on the upper end of the L-shaped plate, and bearing 1 and bearing 2 are installed inside the rotating disk in sequence. A connecting shaft is installed inside bearing 1 and bearing 2, and the lower end of the connecting shaft is connected to the connecting seat key.

[0008] Furthermore, the upper end of the connecting shaft is key-connected with a quick adjustment plate, and the upper end of the quick adjustment plate is threadedly connected with a positioning knob.

[0009] Furthermore, an arc groove is provided on the upper side of the rotating disk, and the lower end of the positioning knob is located in the arc groove.

[0010] Furthermore, a hollow shell is provided on the upper side of the L-shaped plate, and a protrusion provided on one side of the rotating disk is located in the hollow shell. The protrusion is pushed by a fine-tuning knob on one side of the hollow shell to rotate the rotating disk.

[0011] Furthermore, a fixing bolt is threadedly connected to the other side of the hollow shell, and the fixing bolt is tightened to fix the protrusion.

[0012] Furthermore, the fourth axis adjustment mechanism includes an adjustment slot opened on one side of the fixed seat, and a horizontal height adjustment knob is threadedly connected to the upper end of the adjustment slot. The horizontal height adjustment knob passes through the connecting seat and is rotatably connected to the connecting column, and one end of the connecting column is connected to one side of the positioning pin.

[0013] Furthermore, a pair of bearings three are installed on the other side of the fixing seat, an inner column is installed in the bearing three, and the inner column is connected to the other side of the positioning pin.

[0014] Furthermore, a base is provided at the lower side of the probe seat, an angle adjustment seat is rotatably provided inside the base, a rotating shaft at the center of the angle adjustment seat is fixedly connected to the bottom of the probe seat, and a rotating handle is connected to one side of the angle adjustment seat.

[0015] Furthermore, an X-axis knob and a Y-axis knob are respectively installed on the probe seat, a height adjustment knob is arranged on one side of the adjustment block, and a magnetic attraction knob is installed on the upper end of the probe seat.

[0016] The beneficial effect of the present application is that by rotating the horizontal high-adjustment knob, the connecting column is lowered, thereby moving the positioning pin downward, and at the same time, combined with the rotation of the inner column in the bearing three, the positioning pin is rotated downward, thereby satisfying the fine-tuning of the up and down angles of the probe. By rotating the quick adjustment plate, an adjustment scenario in which the rotation angle is greater than 30° can be achieved before the probe is installed. After the probe is installed, the protrusion and the rotating disk are rotated by rotating the fine-tuning knob to achieve coarse and fine adjustment of the probe angle. After adjustment, the fixing bolt can be used for positioning to enhance the stability of the probe when in use, thereby satisfying the use requirements of the probe in different scenarios.

[0017] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments of the present application will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0019] Figure 1 is a three-dimensional schematic diagram of the overall structure of a probe arm angle fine-tuning mechanism according to an embodiment of the present application;

[0020] Figure 2 It is a schematic diagram of the overall structure disassembly according to an embodiment of the present application;

[0021] Figure 3 This is a schematic diagram of the disassembly of the probe seat and the base structure according to an embodiment of the present application;

[0022] Figure 4 is a schematic diagram of the structure of a base and the like according to an embodiment of the present application;

[0023] Figure 5 is a schematic diagram of a positioning pin being adjusted by a fifth-axis adjustment mechanism according to an embodiment of the present application;

[0024] Figure 6 is a schematic diagram of a positioning pin being adjusted by a fourth axis adjustment mechanism according to an embodiment of the present application;

[0025] Figure 7 is a schematic top view of a structure such as an L-shaped plate according to an embodiment of the present application;

[0026] Figure 8 According to the embodiment of the present application Figure 7 Schematic diagram of the cross-sectional structure along AA;

[0027] Fig. 9 is a schematic diagram of the disassembly of the structure of the fifth axis adjustment mechanism according to an embodiment of the present application;

[0028] Fig.10 It is a schematic diagram of the disassembly of the structure of the fourth axis adjustment mechanism according to an embodiment of the present application.

[0029] Figure numerals: 1. probe seat; 2. X-axis knob; 3. Y-axis knob; 4. magnetic knob; 5. adjustment block; 6. height adjustment knob; 7. L-shaped plate; 8. hollow shell; 9. fine-tuning knob; 10. fixing bolt; 11. connecting shaft; 12. bearing one; 13. bearing two; 14. rotating disk; 15. arc groove; 16. bump; 17. quick adjustment plate; 18. positioning knob; 19. connecting seat; 20. fixing seat; 21. horizontal height adjustment knob; 22. adjustment groove; 23. connecting column; 24. positioning pin; 25. inner column; 26. bearing three; 27. base; 28. angle adjustment seat; 29. ​​turning handle. DETAILED DESCRIPTION

[0030] The technical solutions in the embodiments of the present application will be described below in conjunction with the drawings in the embodiments of the present application.

[0031] In order to make the purpose, technical solutions and advantages of the implementation methods of this application clearer, the technical solutions in the implementation methods of this application will be clearly and completely described below in conjunction with the drawings in the implementation methods of this application. Obviously, the described implementation methods are part of the implementation methods of this application, not all of the implementation methods. Based on the implementation methods in this application, all other implementation methods obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0032] Therefore, the following detailed description of the embodiments of the present application provided in the accompanying drawings is not intended to limit the scope of the present application for protection, but merely represents the selected embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0033] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0034] In the description of the present application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicating orientations or positional relationships are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present application.

[0035] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of the features. In the description of this application, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0036] In this application, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to specific circumstances.

[0037] In the present application, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0038] A probe arm angle fine-tuning mechanism according to an embodiment of the present application is described below with reference to the accompanying drawings.

[0039] like Figure 1 and Figure 2 As shown, a probe arm angle fine-tuning mechanism according to an embodiment of the present application includes a probe seat 1, on which an X-axis knob 2 and a Y-axis knob 3 are respectively installed. The X-axis knob 2 is used to make the probe move horizontally on the X-axis, and the Y-axis knob 3 is used to make the probe move horizontally on the Y-axis. A height adjustment button 6 is provided on one side of the adjustment block 5, and the height adjustment button 6 is used to make the probe move horizontally on the Z-axis. The above are all adjustment methods of the three-axis probe seat 1 in the prior art and will not be repeated here, and a magnetic knob 4 is installed at the upper end of the probe seat 1.

[0040] like Figure 2As shown, an adjustment block 5 is arranged on one side of the probe seat 1, and an L-shaped plate 7 is slidably installed on one side of the adjustment block 5. A fifth-axis adjustment mechanism is installed on the L-shaped plate 7. The lower end of the fifth-axis adjustment mechanism is connected to the connecting seat 19. The fifth-axis adjustment mechanism is used to adjust the coarse and fine angles of the probe. At the same time, a fixed seat 20 is arranged on the lower side of the connecting seat 19, and a fourth-axis adjustment mechanism is installed in the fixed seat 20. The fourth-axis adjustment mechanism is used to realize the micro-angle adjustment of the probe in the up and down directions. Therefore, one end of the fourth-axis adjustment mechanism is connected to the positioning pin 24, and the positioning pin 24 is used to fix the probe.

[0041] Specifically, Figures 5 to 9 As shown, the specific structure of the fifth axis adjustment mechanism is disclosed. The fifth axis adjustment mechanism includes a rotating disk 14 installed on the upper end of the L-shaped plate 7, and bearing 12 and bearing 2 13 are installed in the rotating disk 14 in sequence. A connecting shaft 11 is installed in the bearing 12 and the bearing 2 13. The lower end of the connecting shaft 11 passes through the L-shaped plate 7 and is key-connected with the connecting seat 19. Bearing 2 13 is also installed at the connection position between the L-shaped plate 7 and the connecting shaft 11 to eliminate the gap. Therefore, when the connecting shaft 11 rotates, the connecting seat 19 can be driven to rotate to adjust the installation angle of the probe.

[0042] Furthermore, a quick adjustment plate 17 is keyed to the upper end of the connecting shaft 11, and a positioning knob 18 is threadedly connected to the upper end of the quick adjustment plate 17. At the same time, an arc groove 15 is opened on the upper side of the rotating disk 14, and the lower end of the positioning knob 18 is located in the arc groove 15. Before the probe is installed, the connecting shaft 11 can be quickly rotated with the connecting seat 19 by rotating the quick adjustment plate 17, thereby changing the angle of the positioning pin 24, and while the rotating disk 14 rotates, the positioning knob 18 slides in the arc groove 15. The application scenario of this operation is that when the adjustment angle is greater than 30°, the quick adjustment plate 17 can be fixed by tightening the positioning knob 18 after adjustment, thereby improving the stability of the device.

[0043] Furthermore, a hollow shell 8 is provided on the upper side of the L-shaped plate 7, and a protrusion 16 provided on one side of the rotating disk 14 is located in the hollow shell 8. The protrusion 16 rotates the rotating disk 14 by pushing the fine-tuning knob 9 on one side of the hollow shell 8. After the probe is installed, when the angle needs to be adjusted, the fine-tuning knob 9 can be rotated to make the protrusion 16 rotate with the rotating disk 14 and the connecting shaft 11 in the hollow shell 8, so as to realize coarse and fine adjustment of the probe angle.

[0044] In addition, a fixing bolt 10 is threadedly connected to the other side of the hollow shell 8. After the fine-tuning knob 9 is adjusted, the fixing bolt 10 is tightened to fix the protrusion 16, position the rotating disk 14 after fine-tuning, and enhance the stability of the device.

[0045] like Fig.10As shown, the specific structure of the fourth axis adjustment mechanism is disclosed, wherein the fourth axis adjustment mechanism includes an adjustment slot 22 opened on one side of the fixed seat 20, and the upper end of the adjustment slot 22 is threadedly connected with a horizontal height adjustment knob 21, the horizontal height adjustment knob 21 passes through the connecting seat 19 and is rotatably connected to the connecting column 23, one end of the connecting column 23 is connected to one side of the positioning pin 24, and the horizontal height of the probe can be fine-tuned by rotating the horizontal height adjustment knob 21, and a pair of bearings 3 26 are installed on the other side of the fixed seat 20, and an inner column 25 is installed in the bearing 3 26, and the inner column 25 is connected to the other side of the positioning pin 24, and due to the restriction of the inner column 25, when the positioning pin 24 moves up and down, the other side of the positioning pin 24 drives the inner column 25 to rotate in the bearing 3 26, so that the positioning pin 24 is rotated and offset while moving up and down, thereby satisfying the fine-tuning of the up and down angles of the probe.

[0046] like Figure 3 and Figure 4 As shown, a base 27 is provided on the lower side of the probe seat 1, and an angle adjustment seat 28 is rotatably provided on the inner side of the base 27. The rotating shaft at the center of the angle adjustment seat 28 is fixedly connected to the bottom of the probe seat 1, and a rotating handle 29 is connected to one side of the angle adjustment seat 28. After the probe seat 1 is installed, the rotating handle 29 can be rotated to drive the angle adjustment seat 28 to rotate around its central rotating shaft, thereby changing the angle of the probe seat 1 relative to the base 27. This method allows the user to adjust the angle of the probe over a wide range as needed. Combined with other fine-tuning mechanisms, the angle of the probe can be further fine-tuned after installation to ensure the best contact position and angle.

[0047] Working principle of the probe arm angle fine-tuning mechanism: install the probe seat 1 at a suitable position, and according to usage requirements, preferably adjust the use angle of the fifth-axis adjustment mechanism through the quick adjustment plate 17, and then install the probe on the positioning pin 24. At this time, the probe can be adjusted on the X, Y, and Z axes according to usage requirements, and the probe can also be coarsely and finely adjusted through the fourth-axis adjustment mechanism and the fifth-axis adjustment mechanism. The angle adjustment seat 28 can also be driven to rotate around its central axis by rotating the handle 29, thereby changing the angle of the probe seat 1 relative to the base 27. This method allows users to adjust the probe angle over a wide range as needed.

[0048] The above are only embodiments of the present application and are not intended to limit the scope of protection of the present application. For those skilled in the art, the present application may have various changes and variations. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in the subsequent drawings.

[0049] The above are only specific implementations of the present application, but the protection scope of the present application is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A probe arm angle fine-tuning mechanism, characterized in that: The invention comprises a probe seat (1), an adjustment block (5) arranged on one side of the probe seat (1), an L-shaped plate (7) slidably mounted on one side of the adjustment block (5), a fifth axis adjustment mechanism mounted on the L-shaped plate (7), a lower end of the fifth axis adjustment mechanism connected to a connecting seat (19), a fixing seat (20) arranged on the lower side of the connecting seat (19), a fourth axis adjustment mechanism mounted in the fixing seat (20), one end of the fourth axis adjustment mechanism connected to a positioning pin (24), and the positioning pin (24) used to fix the probe.

2. The probe arm angle fine-tuning mechanism according to claim 1, characterized in that: The fifth shaft adjustment mechanism comprises a rotating disk (14) mounted on the upper end of the L-shaped plate (7), wherein a first bearing (12) and a second bearing (13) are sequentially mounted inside the rotating disk (14), a connecting shaft (11) is mounted inside the first bearing (12) and the second bearing (13), and the lower end of the connecting shaft (11) is key-connected to a connecting seat (19).

3. The probe arm angle fine-tuning mechanism according to claim 2, characterized in that: The upper end of the connecting shaft (11) is key-connected with a quick adjustment plate (17), and the upper end of the quick adjustment plate (17) is thread-connected with a positioning knob (18).

4. The probe arm angle fine-tuning mechanism according to claim 3, characterized in that: An arc groove (15) is provided on the upper side of the rotating disk (14), and the lower end of the positioning knob (18) is located in the arc groove (15).

5. The probe arm angle fine-tuning mechanism according to claim 4, characterized in that: A hollow shell (8) is arranged on the upper side of the L-shaped plate (7), and a convex block (16) arranged on one side of the rotating disk (14) is located in the hollow shell (8). The convex block (16) is pushed by a fine-tuning knob (9) on one side of the hollow shell (8) to rotate the rotating disk (14).

6. The probe arm angle fine-tuning mechanism according to claim 5, characterized in that: The other side of the hollow shell (8) is threadedly connected with a fixing bolt (10), and tightening the fixing bolt (10) is used to fix the protrusion (16).

7. The probe arm angle fine-tuning mechanism according to claim 1, characterized in that: The fourth axis adjustment mechanism comprises an adjustment slot (22) provided on one side of the fixing seat (20), the upper end of the adjustment slot (22) being threadedly connected with a horizontal height adjustment knob (21), the horizontal height adjustment knob (21) passing through the connecting seat (19) and being rotatably connected with a connecting column (23), one end of the connecting column (23) being connected to one side of a positioning pin (24).

8. The probe arm angle fine-tuning mechanism according to claim 7, characterized in that: A pair of bearing three (26) is installed on the other side of the fixing seat (20), an inner column (25) is installed inside the bearing three (26), and the inner column (25) is connected to the other side of the positioning pin (24).

9. The probe arm angle fine-tuning mechanism according to claim 1, characterized in that: A base (27) is arranged at the lower side of the probe seat (1), an angle adjustment seat (28) is rotatably arranged inside the base (27), a rotating shaft at the center of the angle adjustment seat (28) is fixedly connected to the bottom of the probe seat (1), and a rotating handle (29) is connected to one side of the angle adjustment seat (28).

10. The probe arm angle fine-tuning mechanism according to claim 9, characterized in that: The probe seat (1) is respectively provided with an X-axis knob (2) and a Y-axis knob (3), a height adjustment knob (6) is arranged on one side of the adjustment block (5), and a magnetic attraction knob (4) is installed at the upper end of the probe seat (1).

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