A chip loading device for chip testing equipment with high supply efficiency

By designing single loading components and steering components in chip testing equipment, the automatic loading and transport of the chip is solved, and the problems of slow loading speed and operating risks in the prior art are improved, and the loading efficiency and safety are improved.

CN119750200AActive Publication Date: 2025-04-04SHENZHEN TANGCHENG TECH CO LTD
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Patent Information

Application Number
CN202510251956.7
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2025-03-05
Publication Date
2025-04-04
Estimated Expiration
2045-03-05

AI Technical Summary

Technical Problem

During the loading process of existing chip performance testing equipment, manual loading speed is slow, and loading and unloading are carried out separately, resulting in slow process. At the same time, the chip after detection is still in a high temperature state, which poses operational risks.

Method used

A chip loading device for chip testing equipment with high supply efficiency is designed, using single-body loading and steering components, and the chip is automatically loaded and transported through electric sliders and lifting sliders to avoid manual direct docking.

Benefits of technology

The supply efficiency of chip loading is improved, the safety of loading operations is ensured, and the loading time is reduced and the detection efficiency is improved through automated transportation and docking.

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Abstract

The present invention discloses a chip loading device for chip testing equipment with high supply efficiency, and relates to the field of chip testing technology. The present invention includes a loading platform, a test equipment body is provided on one side of the loading platform, a test end is provided on the side of the test equipment body facing the loading platform, a test interface is provided on the side of the test end facing the loading platform, a heat preservation groove is provided inside the test interface, and two horizontally arranged and mutually parallel transposition linear guides are fixedly installed on the top of the loading platform. By setting a single loading component and a steering component, the present invention does not need to manually insert the circuit board directly into the test equipment body, and only needs to manually or mechanically insert multiple circuit boards into the transfer insert in sequence, which effectively avoids the direct docking between the loading station and the test station, ensures the safety of the loading operation, and improves the chip loading and supply efficiency through the batch automatic transportation and docking of the circuit board.
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