A support net for installing electronic samples and a method for transporting and taking the same
By using a support net made of pure carbon, the problems of supporting Netease bending, generating interference signals and prone to deformation in the prior art are solved, and the effect of efficient sample analysis under a transmission electron microscope is achieved.
Patent Information
- Application Number
- CN202411973369.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-30
- Publication Date
- 2025-04-04
AI Technical Summary
The support mesh made of copper or other metal used in the prior art is prone to bend during processing, and will generate interference signals under a transmission electron microscope, and the packaging method will easily cause deformation of the mesh when the user grasps it.
The support mesh made of pure carbon, including isotropic fine-grained carbon, graphite, pyrolytic derived glass carbon or carbon fiber, is designed as a sheet-like structure with specific sample fixing teeth and through-hole markings, and is connected to the support mesh through a strip-shaped slide for easy transportation and access.
Reduced interference from X-ray peaks, providing specific mechanical and electrical properties, the support mesh is strong but fragile, has no burrs when broken, remains flat, and has electrical conductivity and deformation resistance, suitable as a material for the support mesh for transmission electron microscope sample.
Smart Images

Figure CN119757002A_ABST
Abstract
Description
Technical Field
[0001] The invention belongs to the technical field of material analysis, and in particular relates to a support net for installing transmission electron microscope samples and a method for transporting and taking the same. Background Art
[0002] In the prior art, electronic samples are usually installed using support nets made of copper or other metals. Such support nets are prone to bending during handling. Moreover, under a transmission electron microscope, copper or other metal X-ray characteristic spectral lines will be generated. This signal (spectral peak) will become an interference signal during material analysis, causing trouble in sample material analysis. The packaging method of copper or other metal nets makes it easy for users to deform the net when holding it. Compared with copper, the physical property of carbon is conductivity, and it has the strength characteristics of ceramics. It will not deform during holding and has a certain toughness, making it the preferred material for the support net of this patent. Summary of the invention
[0003] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a support net for installing transmission electron microscope samples and a method for transporting and taking the same.
[0004] The technical solution adopted by the present invention to solve its technical problem is: a support net for mounting electronic samples, characterized in that: the support net is made of pure carbon, and the pure carbon includes isotropic fine-grained carbon, graphite, pyrolysis-derived glassy carbon or carbon fiber.
[0005] Preferably, the support net is in the shape of a disc, and its longitudinal cross section is semicircular: the upper two sides are inclined inward, and more than one raised sample fixing teeth are arranged in the middle cavity; the tops of the inclined parts on both sides are higher than the height of the sample fixing teeth; an "M"-shaped cavity is arranged at the bottom of the support net; A characteristic through-hole mark is arranged at the lower part of the support net and below the sample fixing teeth, corresponding to the sample fixing teeth.
[0006] Preferably, more than one sample fixing tooth is provided, and correspondingly, more than one characteristic through-hole-shaped mark is provided.
[0007] Preferably, the top of the sample fixing tooth is in an "M" shape.
[0008] Preferably, the support mesh is a disc-shaped structure with a thickness of 50-500 um.
[0009] The method for transporting and taking the supporting net for mounting the electronic samples is characterized by comprising the following steps: First, the method of transportation: 1) Making a structure in which the support net 1 and the strip-shaped carrier film 2 are integrated: the strip-shaped carrier film 2 and 5-10 support nets 1 are made into one body; 2) Each support net 1 is placed on the strip-shaped carrier 2 at intervals, and the "M"-shaped cavity at the bottom of the support net 1 is connected to the strip-shaped carrier 2; 3) cutting a groove on the base material carrier, inserting the support net 1 and the strip-shaped carrier 2 into the groove on the base material carrier; the insertion of the base material carrier will not affect the support net 1 and the strip-shaped carrier 2; 4) The matrix material carrier tightly clamps the support net 1 and the strip carrier 2, closes the slot, and places them together in a hard box body, and fixes them in the box body without shaking, and then they can be transported; Second, how to use: 1) Use tweezers to forcefully pry the target support mesh 1 placed on the strip carrier 2 sideways without damaging the adjacent support mesh 1; 2) The connection between the "M"-shaped cavity at the bottom of the support net 1 and the strip-shaped carrier 2 breaks inwards instead of outwards when it breaks, thus avoiding the influence of the broken residue on the installation on the transmission electron microscope sample rod; 3) The tops of the inclined parts 12 on both sides of the support net 1 are high, which not only protects each sample fixing tooth 11 from impact from above, but also facilitates the sample to be taken in or out of the fixing tooth 11 without being affected; 4) The inclined parts 12 on both sides of the support net 1 are higher than the sample fixing teeth 11 on which the sample is loaded, so as to prevent the support net 1 from falling and damaging the sample on the sample fixing teeth 11; 5) The characteristic through-hole mark 14 at the bottom of each sample fixing tooth 11 can distinguish different samples; 6) The “M”-shaped top of the sample fixing tooth 11 can conveniently weld the extracted sample to each sample fixing tooth 11 .
[0010] Preferably, in the transportation method, the matrix material carrier in step 3) includes silicone rubber, rubber, or soft plastic.
[0011] Preferably, in the transportation method, the groove on the matrix material carrier in step 3) has a depth of about 1 mm.
[0012] Compared with the prior art, the present invention has the following advantages: the material of the present invention is pure carbon, which is a light element; when analyzing samples, it can minimize the interference formed by X-ray spectrum peaks, and can also provide specific mechanical and electrical properties; it is strong but brittle, showing little or no plasticity, and breaking in a brittle rather than ductile manner. Therefore, these materials may have no burrs when broken or processed, and due to the lack of ductility, they will remain flat during the processing; moreover, the carbon material is also conductive and can be obtained in high purity; the material has elemental singularity, certain adhesion, can be formed into a sheet material, has good conductivity, has a certain ability to resist deformation, and will not bend, and is a preferred material for making a transmission electron microscope sample support network.
[0013] The support net structure of the present invention is held on a strip carrier strong enough to withstand the impact forces encountered during packaging and transportation, but the user can easily break it off using tweezers or similar tools to remove the individual support nets; it breaks without being connected, and the support net remains flat, allowing it to be properly placed in the support net holder. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 is a schematic diagram of a single support network according to the first embodiment of the present invention; Figure 2 It is a schematic diagram of the structure in which five support nets are fixed on a belt-shaped carrier according to the first embodiment of the present invention.
[0015] The markings in the figure are: Supporting net; 11. Sample fixing teeth; 12. Inclined portion; 13. "M"-shaped cavity; 14. Characteristic through-hole-shaped mark; 2. Strip carrier. DETAILED DESCRIPTION
[0016] The present invention will be further described below in conjunction with the accompanying drawings: Example
[0017] like Figure 1 , 2 As shown, a support grid for mounting an electronic sample, the support grid 1 is made of pure carbon, and the pure carbon includes isotropic fine-grained carbon, graphite, pyrolysis-derived glassy carbon or carbon fiber.
[0018] The support net 1 is a disc-shaped structure with a thickness of 50-500um, and its longitudinal cross section is semicircular: the upper two sides are inclined inward, and two raised sample fixing teeth 11 are arranged in the middle cavity; the tops of the inclined parts 12 on both sides are higher than the height of the sample fixing teeth 11; an "M"-shaped cavity 13 is arranged at the bottom of the support net 1; Two characteristic through-hole marks 14 are arranged at the lower part of the support net 1 and below the sample fixing teeth 11 , corresponding to the sample fixing teeth 11 ; the top of the sample fixing teeth 11 is in an “M” shape.
[0019] The method for transporting and taking the above-mentioned support net for mounting electronic samples comprises the following steps: First, the transportation method: 1) Make a structure in which the support net 1 and the strip carrier 2 are integrated: integrate the strip carrier 2 with 5-10 support nets 1; 2) Place each support net 1 on the strip carrier 2 at intervals, and connect the "M"-shaped cavity at the bottom of the support net 1 to the strip carrier 2; 3) Cut a groove with a depth of about 1 mm on the base material carrier including silicone rubber, rubber, and soft plastic, and insert the support net 1 and the strip carrier 2 into the groove on the base material carrier; the insertion of the base material carrier will not affect the support net 1 and the strip carrier 2; 4) The base material carrier tightly clamps the support net 1 and the strip carrier 2, and after closing the groove, they are placed together in a hard box body, and fixed in the box body without shaking, so that they can be safely transported.
[0020] Second, the method of taking: 1) Use tweezers to forcefully pry sideways to take the target support net 1 placed on the strip carrier 2 without damaging the adjacent support nets 1; 2) The connection between the "M"-shaped cavity at the bottom of the support net 1 and the strip carrier 2 will break inward instead of outward when broken, avoiding the influence of the broken residue on the installation on the transmission electron microscope sample rod; 3) The top of the inclined part 12 on both sides of the support net 1 is high, which not only protects each sample fixing tooth 11 from the impact from above, but also facilitates the taking in or taking out of the sample on the fixing tooth 11 without being affected; 4) The inclined parts 12 on both sides of the support net 1 are higher than the sample fixing teeth 11 on which the sample is loaded, avoiding the support net 1 from falling and damaging the sample on the sample fixing teeth 11; 5) The characteristic through-hole mark 14 at the bottom of each sample fixing tooth 11 can distinguish different samples; 6) The "M"-shaped top of the sample fixing tooth 11 can conveniently weld the extracted sample to each sample fixing tooth 11.
[0021] The strip carrier 2 is designed to retain the support mesh 1 in a manner that allows easy visualization, extraction and separation of individual support meshes 1 by the user; samples retained on the strip carrier 2 are also easier to handle, clean and inspect, as well as use; the location and design of the separation features are such that any samples retained on the support mesh 1 will be on the inside of a circle defined by the outer diameter of the support mesh 1, typically 0.125 inches or 3.0 mm, so that they can be easily placed into a standard support mesh 1 holder for a transmission electron microscope.
[0022] The support net 1 is connected to the strip carrier 2 at the "M"-shaped cavity at its bottom to maintain the position of the support net 1 during transportation; the connection is designed to be strong enough to maintain the posture during transportation; the connection needs to be relatively thin so that the support net 1 can be separated from the base of the strip carrier 2 when it is taken out.
[0023] The sample fixing teeth 11 at the concave cavity in the middle of the support net 1 are used for bonding the transmission electron microscope sample; the sample can be bonded to the side of the tooth or to the top of the tooth; the top structure can be flat, and the optimal structure is an M-shaped concave shape.
[0024] At the bottom of the support net 1 and below the sample fixing teeth 11, a characteristic through-hole mark 14 is set corresponding to each sample fixing tooth 11. It can be a number, a dot, or a bar. The characteristic through-hole mark 14 must be a transparent structure to facilitate the identification of the position of each sample fixing tooth 11 under the transmission electron microscope electron image, so as to distinguish the corresponding transmission electron microscope sample on each sample fixing tooth 11.
[0025] The above is only a preferred embodiment of the present invention, and does not limit the present invention in other forms. Any technician familiar with the profession may use the above disclosed technical content to change or modify it into an equivalent embodiment with equivalent changes. However, any simple modification, equivalent change and modification made to the above embodiment according to the technical essence of the present invention without departing from the technical solution of the present invention still belongs to the protection scope of the technical solution of the present invention.
Claims
1. A support net for mounting electronic samples, characterized in that: The support mesh is made of pure carbon, including isotropic fine-grained carbon, graphite, pyrolytically derived glassy carbon, or carbon fibers.
2. The support net for mounting electronic samples according to claim 1, characterized in that: The support net is a disc-shaped structure, and its longitudinal cross section is semicircular: the upper two sides are inclined inward, and more than one protruding sample fixing teeth are arranged in the middle cavity; the top of the inclined parts on both sides is higher than the height of the sample fixing teeth; an "M"-shaped cavity is arranged at the bottom of the support net; A characteristic through-hole mark is arranged at the lower part of the support net and below the sample fixing teeth, corresponding to the sample fixing teeth.
3. The support net for mounting electronic samples according to claim 2, characterized in that: There are more than one sample fixing teeth, and correspondingly, there are more than one characteristic through-hole-shaped marks.
4. The support net for mounting electronic samples according to claim 3, characterized in that: The top of the sample fixing teeth is in an "M" shape.
5. The support net for mounting electronic samples according to claim 4, characterized in that: The support net is a disc-shaped structure with a thickness of 50-500um.
6. A method for transporting and using the support net for mounting electronic samples according to claims 1 to 5, characterized in that: The steps include: Shipping Method: 1) Making a structure in which the support net 1 and the strip-shaped carrier film 2 are integrated: the strip-shaped carrier film 2 and 5-10 support nets 1 are made into one body; 2) Each support net 1 is placed on the strip-shaped carrier 2 at intervals, and the "M"-shaped cavity at the bottom of the support net 1 is connected to the strip-shaped carrier 2; 3) cutting a groove on the base material carrier, inserting the support net 1 and the strip-shaped carrier 2 into the groove on the base material carrier; the insertion of the base material carrier will not affect the support net 1 and the strip-shaped carrier 2; 4) The matrix material carrier tightly clamps the support net 1 and the strip carrier 2, closes the slot, and places them together in a hard box body, and fixes them in the box body without shaking, and then they can be transported; Second, how to use: 1) Use tweezers to forcefully pry the target support mesh 1 placed on the strip carrier 2 sideways without damaging the adjacent support mesh 1; 2) The connection between the "M"-shaped cavity at the bottom of the support net 1 and the strip-shaped carrier 2 breaks inwards instead of outwards when it breaks, thus preventing the broken residue from affecting the installation on the transmission electron microscope sample rod; 3) The tops of the inclined parts 12 on both sides of the support net 1 are high, which not only protects each sample fixing tooth 11 from impact from above, but also facilitates the sample to be taken in or out of the fixing tooth 11 without being affected; 4) The inclined parts 12 on both sides of the support net 1 are higher than the sample fixing teeth 11 on which the sample is loaded, so as to prevent the support net 1 from falling and damaging the sample on the sample fixing teeth 11; 5) The characteristic through-hole mark 14 at the bottom of each sample fixing tooth 11 can distinguish different samples; 6) The "M"-shaped top of the sample fixing tooth 11 can conveniently weld the extracted sample to each sample fixing tooth 11.
7. The method for transporting and taking out the support net for mounting electronic samples according to claim 6, characterized in that: The base material carrier in step 3) of the transportation method includes silicone rubber, rubber, and soft plastic.
8. The method for transporting and taking out the support net for mounting electronic samples according to claim 7, characterized in that: The groove on the base material carrier in step 3) of the transportation method has a depth of about 1 mm.