ADC irradiation detection method

Abstract

The invention discloses an ADC irradiation detection method, and belongs to the field of chip detection. The method comprises the steps that firstly, an irradiation detection circuit is built, the irradiation detection circuit comprises a programmable gate array unit, a multi-path switching unit and a matrix switch unit, the programmable gate array unit analyzes a configuration instruction into excitation signals, and the multi-path switching unit and the matrix switch unit synchronously input the excitation signals into an ADC to be detected and a reference ADC; secondly, performing a transient pulse test based on an irradiation detection circuit, and detecting whether the to-be-tested ADC generates a transient pulse or not in an irradiation environment; in addition, function testing in a non-radiation environment and a radiation environment is carried out based on an irradiation detection circuit, and whether the function of the to-be-tested ADC is normal or not is detected. Through the application of the invention, whether the ADC has a problem can be accurately judged.

Description

Technical Field

[0001] The invention relates to an ADC radiation detection method and belongs to the field of chip detection. Background Art

[0002] Analog-to-digital converter is A / D converter, or ADC for short. It is a chip that converts analog signals into digital signals. It is mainly used for data acquisition and can be applied in different environments, such as temperature, humidity, vibration, radiation, etc. Among them, the radiation environment is mainly a special environment in the aerospace field. With the rapid development of the aerospace industry, single-particle radiation-resistant ADC devices are increasingly used in aerospace equipment. Therefore, the evaluation of the radiation resistance of ADC is particularly critical, but at present, the domestic radiation test results are not accurate enough, and it is difficult to accurately evaluate the radiation resistance of ADC. Summary of the invention

[0003] The technical problem solved by the present invention is: to overcome the deficiencies of the prior art and to propose an ADC radiation detection method to achieve the technical effect of accurately judging whether there is a problem with the ADC.

[0004] The technical solution of the present invention is:

[0005] An ADC radiation detection method, comprising:

[0006] Build a radiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit and a matrix switch unit. The programmable gate array unit parses the configuration instruction into an excitation signal, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signal to the ADC to be tested and the reference ADC;

[0007] Transient pulse test based on irradiation detection circuit: The irradiation detection circuit works in an irradiation environment, and takes the non-transient pulse value of the reference ADC as the standard value. The programmable gate array unit receives the voltage information of the ADC to be tested and the reference ADC. When the difference between the transient pulse value of the ADC to be tested and the standard value exceeds the set transient pulse threshold, and the duration exceeds the set pulse width threshold, it is determined that a transient pulse has occurred in the ADC to be tested.

[0008] Functional test based on radiation detection circuit: The radiation detection circuit works in a non-irradiated environment, and the programmable gate array unit records the working current of the ADC to be tested; then, the radiation detection circuit works in an irradiated environment and performs the following tests:

[0009] During the same cycle of the irradiation period, if the difference in the digital quantity collected by the sampling points of the ADC to be tested and the reference ADC is lower than the set maximum error threshold of the sampling point, it is defined as a normal sampling point, otherwise it is an abnormal sampling point; the programmable gate array unit obtains the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle, when Y1 / Y is greater than the set signal abnormality rate threshold, it is determined that the ADC to be tested has a functional interruption, otherwise it is determined that the ADC to be tested is functioning normally;

[0010] The programmable gate array unit compares the working current of the ADC to be tested under the irradiated environment with the working current of the ADC to be tested under the non-irradiated environment. If the absolute value of the difference between the two is greater than the set maximum error of the working current, it is determined that the function of the ADC to be tested is abnormal, otherwise it is determined that the function of the ADC to be tested is normal.

[0011] Furthermore, the set transient pulse threshold, pulse width threshold, signal anomaly rate threshold, acquisition point maximum error threshold of the acquisition signal, operating current threshold and operating current maximum error are configured as a test stimulus set, and the programmable gate array unit parses the test stimulus set to ensure that the information received by the ADC to be tested and the reference ADC is completely consistent.

[0012] Furthermore, there are multiple ADCs to be tested, and the multi-channel switching unit and the matrix switch unit control the multiple ADCs to be tested to determine the test order of the multiple ADCs to be tested.

[0013] Furthermore, the radiation detection circuit also includes a precision reference source unit, which supplies power to the plurality of ADCs to be tested, so as to ensure that the references of all ADCs to be tested are consistent, thereby reducing the reference source signal error between the ADCs to be tested.

[0014] Furthermore, when the radiation detection circuit is operating in a radiation environment, if the operating current of the ADC to be tested is greater than a set operating current threshold and the duration exceeds the operating current duration threshold, the precision reference source unit cuts off power to the ADC to be tested to stop the test.

[0015] Furthermore, before executing the power-off operation, the precision reference source unit sends a power-off signal to the programmable gate array unit, and the programmable gate array unit obtains the output waveform, operating voltage and operating current of the ADC to be tested, and records them in the database for storage.

[0016] Furthermore, when the radiation detection circuit is working in the radiation environment, the first 2 bits of the n-bit ADC to be tested are removed, and the 2-n bits are XORed to obtain the number of samples P in a single cycle. According to the radiation time t and the signal cycle T, the total data bit A is obtained, and the flip number B during the radiation period is obtained. n , in order to accurately obtain the performance status of the ADC to be tested.

[0017] Furthermore, if there are multiple ADCs to be tested, the same number of test stimulus sets are set, and each test stimulus set corresponds to an ADC to be tested, thereby improving the data detection rate of the programmable gate array unit; in addition, if the programmable gate array unit detects that one of the ADCs to be tested is malfunctioning, the test stimulus set corresponding to the ADC is used as the test stimulus set for the ADC and any other ADC to be tested. If only the ADC that was previously malfunctioning becomes abnormal again, the ADC is confirmed to be malfunctioning, thereby improving the inspection accuracy.

[0018] The advantages of the present invention compared with the prior art are:

[0019] (1) The present invention constructs a radiation detection circuit, in which a programmable gate array unit parses a configuration instruction into an excitation signal, and a multi-way switching unit and the matrix switch unit synchronously input the excitation signal to the ADC to be tested and the reference ADC to ensure synchronization of control timing and data return between the ADC to be tested and the reference ADC, thereby improving the accuracy of detection.

[0020] (2) The present invention can realize simultaneous detection of multiple ADCs to be tested, and power the multiple ADCs to be tested through a precise reference source unit, thereby ensuring that the references of the ADCs to be tested are consistent and reducing the reference source signal errors between the ADCs to be tested.

[0021] (3) The present invention integrates the threshold values ​​of various detection parameters into a test stimulus set, and parses the test stimulus set through a programmable gate array unit to ensure that the information received by the ADC to be tested and the reference ADC is completely consistent. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the preferred embodiments below. The accompanying drawings are only for the purpose of illustrating the preferred embodiments and are not to be considered as limiting the present invention. Moreover, the same reference symbols are used throughout the accompanying drawings to represent the same components. In the accompanying drawings:

[0023] Figure 1 The figure is a flow chart of the ADC radiation detection method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0024] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0025] The present invention proposes an ADC radiation detection method, such as Figure 1 As shown, specifically including:

[0026] S1: Build a radiation detection circuit. The radiation detection circuit includes a programmable gate array unit, a multi-way switching unit and a matrix switch unit. The programmable gate array unit parses the configuration instructions into excitation signals. The multi-way switching unit and the matrix switch unit synchronously input the excitation signals to the ADC to be tested and the reference ADC to ensure that the two excitation signals of the ADC to be tested and the reference ADC are completely consistent, so as to control the synchronization of timing and data return.

[0027] S2: Preset the transient pulse threshold and pulse width threshold, and use the non-transient pulse value of the reference ADC as the standard value. When the difference between the transient pulse value of the ADC to be tested and the standard value exceeds the transient pulse threshold, and the duration exceeds the pulse width threshold, it is determined that a transient pulse has occurred. The reference ADC and the ADC to be tested are the same model devices.

[0028] S3: preset the signal abnormality rate threshold X and the maximum error threshold of the acquisition point of the acquisition signal. When the digital value difference between the ADC to be tested and the reference ADC in the same cycle during the irradiation period is lower than the maximum error threshold of the acquisition point, it is defined as a normal sampling point, otherwise it is an abnormal sampling point. Obtain the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle. When Y1 / Y>X, the ADC to be tested is functionally interrupted. When Y1 / Y≤X, the ADC to be tested is normal.

[0029] S4: preset the working current threshold IDD1 and the maximum working current error M, record the working current IDD0 of the ADC to be tested before irradiation and the working current IDD2 of the ADC to be tested after irradiation, when |IDD2-IDD0|>M, the ADC to be tested is abnormal in function, when |IDD2-IDD0|≤M, the ADC of the device to be tested is in normal function state.

[0030] S5: Send the results of steps S2 to S4 to the programmable gate array unit. Through the judgment method of S2 to S4, it is possible to accurately determine whether the ADC to be tested is abnormal, and if so, accurately determine the abnormal condition.

[0031] During the irradiation period, remove the first 2 bits of the n-bit ADC to be tested, perform XOR on the 2-n bits, and obtain the number of samples P in a single cycle. The irradiation time is t, the signal cycle is T, and the total data volume is A. A = A = (t / T) × P, and the flip number B during the irradiation period is obtained. n , flip rate = B n / A. By obtaining the flip rate of the ADC to be tested, the performance status of the ADC to be tested can be accurately obtained.

[0032] In the above steps, the transient pulse threshold is selected as 10% of the measured signal output by the ADC to be tested; the pulse width threshold is selected as the us level, which is flexibly defined according to the test requirements; the signal anomaly rate threshold is defined as the number of cycle anomalies in the n-cycle sinusoidal signal. The maximum error threshold of the sampling point of the acquisition signal is defined as: the amount of sampled data of n cycles at a certain rate is the basic value, and the amount of abnormal data collected during the irradiation process is how much, and the error threshold is the allowable error ratio. The working current threshold is defined as the basic current, and the threshold is defined as 1.5 times the normal current.

[0033] In a possible implementation, the detection circuit can be connected to multiple ADCs to be tested, and the multi-way switching unit and the matrix switch unit control the multiple ADCs to be tested to determine the test order of the multiple ADCs to be tested and facilitate switching the tests on the multiple ADCs to be tested.

[0034] In a possible implementation, the detection circuit further includes a precision reference source unit, which supplies power to multiple ADCs to be tested, so as to ensure that the reference references of the multiple ADCs to be tested are consistent, and reduce the reference source signal error between the multiple ADCs to be tested. At the same time, a working current duration threshold is preset, and when the working current of the ADC to be tested during irradiation is greater than IDD1, and the duration exceeds the working current duration threshold, the precision reference source unit cuts off the power to the ADC to be tested for testing.

[0035] Furthermore, before the precision reference source unit is powered off, the programmable gate array unit obtains the output waveform, operating voltage and operating current of the ADC to be measured at that time, and records them in the database for storage to avoid data loss due to sudden power failure.

[0036] In one possible implementation, the required test configuration is preset as a test excitation set to facilitate synchronous data transmission, such as configuring the transient pulse threshold, pulse width threshold, signal anomaly rate threshold X, maximum error threshold of the acquisition point of the acquisition signal, working current threshold IDD1 and working current maximum error M as a test excitation set, and the programmable gate array unit parses the test excitation set to ensure that the information received by the ADC to be tested and the reference ADC is completely consistent.

[0037] Furthermore, the test stimulus set includes a first test stimulus set, a second test stimulus set, and a third test stimulus set. At the first time when the first ADC to be tested performs the first test task, the first ADC to be tested and the reference ADC simultaneously input the first test stimulus set to obtain a first test result; at the second time when the first ADC to be tested performs the first test task, the second ADC to be tested and the reference ADC simultaneously input the second test stimulus set to obtain a second test result; at the third time when the first ADC to be tested performs the first test task, the third ADC to be tested and the reference ADC simultaneously input the third test stimulus set to obtain a third test result. Through fast switching on the clock, synchronous detection of three types of test tasks under the same test task and synchronous collection of test results are achieved, thereby achieving a more efficient test process.

[0038] When the first test result is abnormal, the second ADC to be tested and the reference ADC are simultaneously input with the first test stimulus set, and if the test result is normal, it is determined that there is a problem with the first ADC to be tested. By comparing, the result is more accurate.

[0039] The above-described embodiments are only preferred specific implementations of the present invention. Common changes and substitutions made by those skilled in the art within the scope of the technical solution of the present invention should be included in the protection scope of the present invention.

Claims

1. An ADC irradiation detection method, characterized in that: include: Build a radiation detection circuit, which includes a programmable gate array unit, a multi-way switching unit and a matrix switch unit. The programmable gate array unit parses the configuration instruction into an excitation signal, and the multi-way switching unit and the matrix switch unit synchronously input the excitation signal to the ADC to be tested and the reference ADC; Transient pulse test based on irradiation detection circuit: The irradiation detection circuit works in an irradiation environment, and takes the non-transient pulse value of the reference ADC as the standard value. The programmable gate array unit receives the voltage information of the ADC to be tested and the reference ADC. When the difference between the transient pulse value of the ADC to be tested and the standard value exceeds the set transient pulse threshold, and the duration exceeds the set pulse width threshold, it is determined that a transient pulse has occurred in the ADC to be tested. Functional test based on radiation detection circuit: The radiation detection circuit works in a non-irradiated environment, and the programmable gate array unit records the working current of the ADC to be tested; then, the radiation detection circuit works in an irradiated environment and performs the following tests: During the same period of irradiation, if the difference between the digital quantities collected by the sampling points of the ADC to be tested and the reference ADC is lower than the set maximum error threshold of the sampling point, it is defined as a normal sampling point, otherwise it is an abnormal sampling point; The programmable gate array unit obtains the total number of sampling points Y and the number of abnormal sampling points Y1 in the same cycle. When Y1 / Y is greater than the set signal abnormality rate threshold, it is determined that the ADC to be tested has a functional interruption, otherwise it is determined that the ADC to be tested is functioning normally; The programmable gate array unit compares the working current of the ADC to be tested under the irradiated environment with the working current of the ADC to be tested under the non-irradiated environment. If the absolute value of the difference between the two is greater than the set maximum error of the working current, it is determined that the function of the ADC to be tested is abnormal, otherwise it is determined that the function of the ADC to be tested is normal.

2. The ADC radiation detection method according to claim 1, characterized in that: The set transient pulse threshold, pulse width threshold, signal anomaly rate threshold, acquisition point maximum error threshold of the acquisition signal, working current threshold and working current maximum error are configured as a test stimulus set, and the programmable gate array unit parses the test stimulus set to ensure that the information received by the ADC to be tested and the reference ADC is completely consistent.

3. The ADC radiation detection method according to claim 1, characterized in that: There are multiple ADCs to be tested. The multi-channel switching unit and the matrix switching unit control the multiple ADCs to be tested to determine the test sequence of the multiple ADCs to be tested.

4. The ADC radiation detection method according to claim 3, characterized in that: The radiation detection circuit also includes a precision reference source unit, which supplies power to the plurality of ADCs to be tested, so as to ensure that the references of all ADCs to be tested are consistent, thereby reducing the reference source signal error between the ADCs to be tested.

5. The ADC radiation detection method according to claim 4, characterized in that: When the radiation detection circuit is working in the radiation environment, if the working current of the ADC to be tested is greater than the set working current threshold and the duration exceeds the working current duration threshold, the precision reference source unit cuts off the power to the ADC to stop the test.

6. The ADC radiation detection method according to claim 5, characterized in that: Before executing the power-off operation, the precision reference source unit sends a power-off signal to the programmable gate array unit, and the programmable gate array unit obtains the output waveform, operating voltage and operating current of the ADC to be tested, and records them in the database for storage.

7. The ADC radiation detection method according to claim 1, characterized in that: When the radiation detection circuit is working in the radiation environment, the first 2 bits of the n-bit ADC to be tested are removed, and the 2-n bits are XORed to obtain the number of samples P in a single cycle. According to the radiation time t and the signal cycle T, the total data bit A is obtained, and the flip number B during the radiation period is obtained. n , in order to accurately obtain the performance status of the ADC to be tested.

8. The ADC radiation detection method according to claim 2, characterized in that: If there are multiple ADCs to be tested, set the same number of test stimulus sets, each test stimulus set corresponds to one ADC to be tested, so as to improve the data detection rate of the programmable gate array unit; In addition, if the programmable gate array unit detects that one of the ADCs to be tested is malfunctioning, the test stimulus set corresponding to the ADC will be used as the test stimulus set for the ADC and any other ADC to be tested. If only the ADC that was previously malfunctioning becomes abnormal again, the ADC is confirmed to be malfunctioning, thereby improving the accuracy of the inspection.

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