SERF inertial measurement optical path temperature control system based on non-magnetic incubator

Abstract

According to the SERF inertial measurement optical path temperature control system based on the non-magnetic incubator, through passive heat insulation and internal active control of the incubator, the influence of external environment temperature fluctuation on the characteristics of an optical element is effectively inhibited, so that parameter fluctuation of pumping and detection laser is reduced. The system is composed of an optical path temperature control system, a high-precision temperature control circuit and a power amplification driving circuit. A heat preservation shell in the light path temperature control system delays heat conduction and passively inhibits environment temperature fluctuation; the semiconductor chilling plate increases the heat dissipation power of the incubator; a temperature measuring platinum resistor inputs the temperature at different positions of an optical path system into a high-precision temperature control circuit, an active control quantity is calculated by using an active disturbance rejection algorithm, a heating film is driven to heat after power amplification, a boron nitride insulating layer is designed on the outer surface of the heating film, and electromagnetic interference introduced by heating is inhibited on the basis of improving the temperature uniformity of an incubator; and finally, the temperature fluctuation of the light path is stabilized at + / -10mK, and the long-term stability of the SERF inertial measurement principle prototype is improved.

Description

Technical Field

[0001] The invention relates to a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box, which can be used in the field of SERF inertial measurement instruments. Background Art

[0002] The SERF inertial measurement system polarizes alkali metal atoms in a gas chamber through a beam of pumping laser, obtains optical rotation angle information by measuring the detection light, and calculates parameters such as the polarizability of the atoms. The optical devices used in the optical path include Glan-Taylor prism, polarizer, lens, liquid crystal, 1 / 2 wave plate and 1 / 4 wave plate, all of which are made of fused quartz. When the temperature of the optical path system changes, the thickness of the quartz material will change due to thermal expansion and contraction, thereby causing changes in the phase delay of the wave plate, the splitting of the polarization splitter prism, and the laser ellipticity.

[0003] After the laser is emitted from the laser, it enters the polarizer, liquid crystal, analyzer, wave plate and Glan-Taylor prism in sequence, and finally enters the gas chamber; when the characteristics of the above optical devices change, the parameters such as the polarization degree and ellipticity of the laser incident on the gas chamber cannot be guaranteed. At the same time, the changes in the splitting ratio and phase delay of the Glan-Taylor prism due to temperature will also affect the closed-loop feedback control effect of the laser power. Therefore, controlling the temperature changes of the pumping and detection optical path system and suppressing the interference caused by the temperature fluctuations of the external environment are key factors in improving the long-term stability of the SERF inertial measurement principle prototype. Summary of the invention

[0004] The present invention designs a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box. Based on the long-term stability requirements of the SERF inertial measurement principle prototype, the optical element characteristics in the pumping and detection optical path systems of the prototype are controlled to be not affected by the external environmental temperature fluctuations. The designed temperature box system utilizes multi-point distributed temperature control on the basis of suppressing electromagnetic interference, while ensuring the temperature stability of the pumping and detection optical paths. Combined with the self-disturbance rejection control algorithm, the external environmental temperature interference and the coupling interference between the control loops are suppressed, and finally the temperature fluctuation of the pumping and detection optical paths is achieved to be no more than ±10mK.

[0005] The technical solution of the present invention is as follows

[0006] A SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box, which consists of an optical path temperature control system, a high-precision temperature control circuit, and a power amplifier drive circuit. The optical path temperature control system consists of a heat-insulating shell, a semiconductor refrigeration sheet, a temperature-measuring platinum resistor, a non-magnetic electric heating film, and a boron nitride insulation layer. The high-precision temperature control circuit consists of a dual-collection dual-control circuit board, a host computer system, and a 12V DC power supply. The power amplifier drive circuit consists of a power amplifier circuit board and a ±65V DC power supply.

[0007] The prototype is placed in an insulation shell of 530mm*530mm*400mm in size. Aluminum alloy material is used as the supporting frame inside the insulation shell. Except for the top surface used for heat dissipation, the outer surfaces of other walls are covered with hard polyurethane foam insulation material to suppress the interference introduced by ambient temperature fluctuations.

[0008] Two parallel semiconductor cooling sheets are installed on the top surface of the insulation shell, and the heat dissipation power of the top surface is controlled to reach 50W; the inner wall of the insulation shell is adhered with flexible constantan heating film except the heat dissipation surface; the side heating film size is 520mm*390mm, the resistance is 200Ω, the bottom heating film size is 520mm*520mm, the resistance is 100Ω, and the side heating films are heated in parallel during the heating process. After parallel connection, the heating load resistance is also 100Ω. In addition, in order to avoid electromagnetic interference to the prototype after the heating film is powered on, a boron nitride insulation layer is installed on the surface of the heating film. At the same time, due to the high thermal conductivity of boron nitride ceramic materials, it is conducive to improving the temperature uniformity in the temperature box.

[0009] Further, according to the position distribution of the pumping and detection optical paths of the prototype, the pasting position of the platinum resistor is selected. The control loop of each zone adjusts the corresponding heating film heating according to the difference between the target set temperature value and the actual temperature value obtained by the feedback measurement of the platinum resistor; the heating film on the side of the insulation box corresponds to controlling the temperature of the pumping and detection optical paths, and the temperature measuring platinum resistor is pasted at the center of the pumping and detection optical paths; the heating film on the bottom of the insulation box corresponds to controlling the average temperature of the entire optical path system, and the platinum resistor is pasted at the center between the two optical paths. In summary, three control loops are used to perform distributed temperature control on the optical path system of the prototype; due to the large controlled area, an additional monitoring platinum resistor is pasted on the optical path system of the prototype to feedback the temperature fluctuations at other positions of the optical path except the temperature control point, so as to more realistically reflect the temperature control effect of the system.

[0010] The temperature control circuit includes two high-precision dual-sampling and dual-control circuit boards and three high-precision power amplifier circuit boards; the dual-sampling and dual-control circuit boards are composed of five parts: a low-noise power supply module, a platinum resistor driving circuit based on Howland current source, a differential sampling circuit, an STM32G431C8T6 minimum system, and a DDS high-frequency signal generation circuit; the low-noise power supply module uses an LDO linear voltage regulator circuit to realize the voltage conversion of the analog power supply and uses a BUCK step-down circuit to realize the voltage conversion of the digital voltage, and finally completes the power supply of the digital-to-analog chip in the circuit; the Howland current source circuit converts the input voltage into a stable current output, and its principle is to ensure that the output current remains constant when the resistance value of the temperature measuring resistor changes; the differential sampling circuit is composed of a differential operational amplifier THS4131 and an ADC chip AD7190, and the differential operational amplifier converts the voltage at both ends of the platinum resistor The voltage signal is converted into a two-terminal output to the ADC chip to eliminate the influence of common-mode noise; the STM32G431C8T6 minimum system converts the collected platinum resistor resistance into temperature data. In order to suppress the external environment temperature fluctuation and the coupling interference of heating control between each circuit, an anti-disturbance control algorithm is designed. The external environment interference, the coupling disturbance between each circuit and the internal disturbance of the system are regarded as the total disturbance. The change of state quantity and disturbance quantity is tracked by the expanded observer, and the control quantity output is further calculated in combination with the feedback control law; finally, the high-frequency sine wave signal generated by the DDS chip is used by the high-frequency signal generation circuit to modulate the control signal to the high-frequency band to which atoms are insensitive, and finally the control voltage signal is amplified by the PA96 chip in the power amplifier circuit, so as to achieve the purpose of increasing the heating power. The output voltage of the power amplifier circuit is directly added to both ends of the heating film to achieve high-precision temperature control.

[0011] The present invention ultimately utilizes an anti-disturbance control algorithm to control the heating of five heating films in the insulation box through three control loops, thereby realizing real-time, high-precision temperature control of the pumping and detection optical paths of the SERF inertial measurement principle prototype, suppressing changes in the characteristics of optical components caused by temperature fluctuations in the external environment, and thus improving the long-term stability of the prototype output signal.

[0012] The advantages of the present invention over the prior art are:

[0013] 1. The present invention adopts a temperature control scheme combining active and passive control. On the one hand, the SERF inertial measurement principle prototype is placed in a heat-insulating shell for passive heat insulation. On the other hand, the temperature of the optical path system is accurately adjusted by controlling the heating film. Compared with placing the prototype directly in a room temperature environment, this design makes the optical elements in the optical path less affected by temperature fluctuations, and its polarization and spectral characteristics can remain stable for a long time.

[0014] 2. The present invention attaches two semiconductor cooling sheets in parallel to the top surface of the designed thermal insulation shell, adding an active heat dissipation process to the system, thereby avoiding the increase in thermal equilibrium temperature of the SERF inertial measurement optical path system caused by the use of the thermal insulation shell, which affects the normal operation of the laser in the prototype.

[0015] 3. The present invention uses a boron nitride insulating layer on the outer layer of the heating film to avoid electromagnetic interference in the prototype caused by the power supply of the heating film. At the same time, since the boron nitride material has good thermal conductivity, the temperature field in the temperature box can be further made more uniform.

[0016] 4. The present invention realizes multi-point temperature control of the optical path by utilizing a total of five heating films on the bottom and side surfaces to control three heating circuits respectively. Compared with single-point temperature control, the present invention has stronger anti-interference ability, ensures the temperature stability of the optical path system in a larger range, and enables the system to better suppress the temperature drift caused by external temperature fluctuations.

[0017] 5. Based on the anti-disturbance algorithm, the present invention regards the disturbance caused by the external environment temperature fluctuation and the coupling between the three heating circuits as the total disturbance, performs real-time tracking and compensation for the disturbance, realizes fine control of the temperature of the optical path system, improves the anti-disturbance ability of the system, reduces the influence of the mutual coupling between the circuits, and improves the stability of the system; BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 The overall components of a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box

[0019] Figure 2 This is the overall installation structure diagram of a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box.

[0020] Figure 3 A top view of the temperature control box in a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box.

[0021] Figure 4 The schematic diagram of the SERF inertial measurement principle prototype in a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box.

[0022] Figure 5 This is a SERF inertial measurement principle prototype system structure diagram in a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box.

[0023] Figure 6 The structure and size of the heating film on the side of the temperature box in a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box

[0024] Figure 7The structure and size of the heating film on the bottom of the temperature box in a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box

[0025] The marks in the figure are:

[0026] 1-optical path temperature control system, 2-high-precision temperature control circuit, 3-power amplifier drive circuit; 11-pumping optical path platinum resistor, 12-detection optical path platinum resistor, 13-optical path system center platinum resistor, 14-open-loop monitoring platinum resistor, 15 insulation shell, 16-SERF inertial measurement principle prototype, 17-semiconductor cooling sheet, 18-boron nitride insulation layer, 19-bottom surface heating film, 110-first side parallel heating film, 111-second side parallel heating Thermal film, L1-pumping optical path, L2-prototype detection optical path, L3-magnetic shielding system, L4-non-magnetic electric heating system; 151-heat dissipation surface, 152-insulation outer wall, L11-first reflector of pumping optical path, L12-pumping optical path liquid crystal, L13-pumping optical path beam expander, L14-first 1 / 2 wave plate of pumping optical path, L15-first polarization beam splitter prism of pumping optical path, L16-1 / 4 wave plate of pumping optical path, L17-second reflector of pumping optical path, L18 - third reflector of the pumping light path, L19- second 1 / 2 wave plate of the pumping light path, L110- pumping laser, L21- first reflector of the detection light path, L22- first 1 / 2 wave plate of the detection light path, L23- first polarization beam splitter prism of the detection light path, L24- second 1 / 2 wave plate of the detection light path, L25- second polarization beam splitter prism of the detection light path, L26- third polarization beam splitter prism of the detection light path, L27- third 1 / 2 wave plate of the detection light path, L28- detection light path The second reflector, L29-detection laser, L210-detection optical path fourth 1 / 2 wave plate, L211-Wollaston prism, L212-balanced differential amplifier; 21-first dual-sampling dual-control board, 22-second dual-sampling dual-control board, 23-host computer system, 24-dual-sampling dual-control board 12V DC power supply; 31 first power amplifier circuit board, 32 second power amplifier circuit board, 33-third power amplifier circuit board, 34-power amplifier board ±65V power supply DETAILED DESCRIPTION

[0027] In order to facilitate the understanding of the present invention, the present invention is described in more detail below in conjunction with specific embodiments and comparative examples:

[0028] A SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box consists of an optical path temperature control system 1, a high-precision temperature control circuit 2, and a power drive amplifier circuit 3;

[0029] The structure diagram of the optical path temperature control system 1 is as follows Figure 2As shown, the temperature control box designed therein consists of an insulating shell 15, a semiconductor cooling sheet 17, a boron nitride insulating layer 18, a bottom heating film 19, a first parallel heating film 110, and a second parallel heating film 111; the insulating shell 15 structure is divided into two parts, the top surface of which is a heat dissipation surface 151 made of aluminum alloy, and the other five surfaces except the top surface are an insulating outer wall 152 made of foamed polyurethane material, the semiconductor cooling sheet 17 is installed on the heat dissipation surface 151, and the heat dissipation power is 50W when working. The heating film is pasted on the aluminum alloy inner surface of the insulating shell, and the sizes of the side heating film and the bottom heating film of the insulating box used are as follows Figure 6 and Figure 7 As shown, and as Figure 3 As shown, the left inner surface heating film and the rear inner surface heating film are connected in parallel to obtain a first parallel heating film 110, and the right inner surface heating film and the front inner surface heating film are connected in parallel to obtain a second parallel heating film 111. At the same time, a boron nitride insulating layer 18 is added to the surface of each heating film to reduce the electromagnetic interference introduced by the power supply of the heating film and improve the uniformity of the temperature field in the temperature box. Finally, the SERF inertial measurement principle prototype 16 is placed in the center of the insulation shell 15 for temperature control;

[0030] SERF inertial measurement principle prototype 16 Figure 4 It consists of a pumping optical path L1, a detection optical path L2, a magnetic shielding system L3 and a non-magnetic electric heating system L4; wherein the pumping optical path L1 polarizes alkali metal atoms through a 770nm circularly polarized laser, and the polarized alkali metal atoms hyperpolarize the inert gas atoms in the gas chamber to make the system sensitive to rotation signals; the detection optical path L2 uses a linearly polarized light with a wavelength of 795nm to pass through the gas chamber to detect the optical rotation angle information, and calculates the spin precession signal of the atom through the polarization difference method; the magnetic shielding system L3 relies on three layers of Permalloy for passive magnetic shielding, and uses a three-axis magnetic compensation coil for active magnetic compensation, thereby jointly resisting the interference of the external magnetic field and providing a zero magnetic environment for the system; the gas chamber is fixed at the center of the oven of the non-magnetic electric heating system L4, and the outer side of the oven is wrapped with a flexible heating film, and the gas chamber is heated to 180°C through a high-frequency driving current of 100khz;

[0031] Since the characteristics of the optical components of the pumping and detection optical system in the prototype change, the fluctuations of parameters such as laser power, polarization state, and ellipticity will directly affect the long-term stability of SERF inertial measurement. Therefore, it is necessary to control the temperature of the optical system to reduce the impact of temperature fluctuations on the temperature-sensitive devices of the optical system.

[0032] according to Figure 5As shown, the pumping optical path L1 is composed of a variety of optical elements L11 to L110, among which the optical properties of the pumping optical path liquid crystal L12, the first polarization beam splitter prism L15 and the second polarization beam splitter prism L18 are most susceptible to temperature fluctuations; the detection optical path L2 is composed of a variety of optical elements L21 to L212, among which the multiple polarization beam splitters in the optical path are most susceptible to temperature fluctuations; therefore, according to needs, platinum resistors are attached near the temperature sensitive elements in the pumping and detection optical path systems, such as Figure 5 As shown, the pumping optical path platinum resistor 11 and the detection optical path platinum resistor 12 are respectively used to measure the temperature of the temperature sensitive elements in the pumping and detection optical paths, wherein the temperature of the pumping optical path is heated and temperature-controlled by the first parallel heating film 110, and the temperature of the detection optical path is heated and temperature-controlled by the second parallel heating film 111; at the same time, in order to stabilize the average temperature of the optical path system, the bottom surface heating film 19 and the platinum resistor 13 at the center of the optical path are pasted, which serve as an actuator and a measuring unit for closed-loop feedback control, respectively. Finally, due to the large area of ​​the SERF inertial measurement optical path system, the optical path open-loop monitoring platinum resistor 14 is also required to be pasted to measure the temperature changes at other positions of the optical path except the control point.

[0033] The pumping optical path platinum resistor 11, the detection optical path platinum resistor 12 and the optical path center platinum resistor 13 are used as measurement units for closed-loop control. The temperatures at different positions in the entire optical path system area are measured and fed back to the first dual-sampling dual-control circuit board 21 and the second dual-sampling dual-control circuit board 22. The circuit boards are powered by a 12V DC power supply 24. In order to reduce the coupling interference caused by the heating conduction between the three control loops, an anti-disturbance control algorithm is written. The ambient temperature disturbance during the system operation and the coupling interference between the loops are regarded as the total external disturbance. The system differential equation is written in the following form:

[0034]

[0035] Among them, a1, a2 are system characteristic parameters, b is the control gain, ω is the total external disturbance to the system, and a1, a2, and b are unknown quantities. Errors will also be introduced in the process of establishing the system model. The direct error between the model parameters and the actual parameters is regarded as a disturbance caused by internal uncertainty of the system.

[0036] At this time, let b = b0 + Δb, and define the generalized total disturbance of the system as the sum of the model error and the external disturbance, that is:

[0037]

[0038] b0 is the known part of the controller gain b, and Δb is the unknown modeling error.

[0039] According to the above differential equation, the state equation of the system is written. At this time, the total disturbance f has become an expansion state of the system:

[0040]

[0041] The extended observer is further used to quickly track and estimate the changes in each state variable of the system:

[0042]

[0043] in C=[1 0 0], L=[-β1,-β2,-β3] T ,z1,z2,z3 are parameters y, And the estimated term of the total disturbance f of the system, L is the observer error feedback gain matrix to be solved; the pole of the system characteristic equation is placed at the observer bandwidth, and the observer gain matrix can be calculated as:

[0044]

[0045] Design a feedback controller to calculate the control quantity, let u = (-z3 + u0) / b0, the controller output u0 = -k p (z1-y ref )-k d z2,y ref Ignore z3 for the setting value. The estimation error of the second-order system becomes:

[0046]

[0047] The closed-loop transfer function of the system is a second-order system without zeros:

[0048]

[0049] Design controller gain matrix K = [k d k p ] T , which designs:

[0050]

[0051] where ω c is the controller bandwidth;

[0052] Burn the designed system expansion observer and control rate code into the dual sampling and dual control circuit board, and adjust the observer bandwidth ω by the host computer system 23 o and controller bandwidth ω c To adjust the control performance;

[0053] The three control signals obtained after calculation are amplified by the first power amplifier circuit board 31, the second power amplifier circuit board 32 and the third power amplifier circuit board 33, and drive the first parallel heating film 110, the second parallel heating film 111 and the bottom heating film 19 to heat respectively. Finally, relying on the above scheme, a SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box can reduce the temperature fluctuation of the prototype optical path system from the original ±1K to ±10mK, thereby ensuring the temperature stability of the optical path system in the SERF inertial measurement principle prototype, reducing the fluctuation of the pumping and detection lasers, and improving the long-term stability index of the prototype.

[0054] It should be noted that the above-mentioned specific implementation methods can enable those skilled in the art to understand the present invention more comprehensively, but do not limit the present invention in any way. Therefore, although the present invention has been described in detail with reference to the drawings and embodiments, those skilled in the art should understand that the present invention can still be modified or replaced by equivalents. In short, all technical solutions and changes that do not deviate from the spirit and scope of the present invention should be included in the protection scope of the patent of the present invention.

[0055] The contents not described in detail in the specification of the present invention belong to the prior art known to the professional and technical personnel in this field.

Claims

1. A SERF inertial measurement optical path temperature control system based on a non-magnetic temperature box, including an optical path temperature control system, a high-precision temperature control circuit, and a power amplifier drive circuit, characterized in that: The optical path temperature control system consists of an insulating shell, a semiconductor refrigeration plate, a pumping optical path platinum resistor, a detection optical path platinum resistor, an optical path center platinum resistor, an open-loop monitoring platinum resistor, a bottom heating film, a first parallel heating film, a second parallel heating film, and a boron nitride insulation layer on the surface of each heating film; the high-precision temperature control circuit consists of a first dual-sampling dual-control circuit board, a second dual-sampling dual-control circuit board, a host computer system and a 12V DC power supply; the power amplifier drive circuit consists of a first power amplifier circuit board, a second power amplifier circuit board, a third power amplifier circuit board, and a ±65V DC power supply. The SERF inertial measurement principle prototype is placed in an insulated shell, with aluminum alloy plates used for internal support. At the same time, hard foamed polyurethane material is pasted on the sides and bottom to reduce the impact of external ambient temperature fluctuations on the inside of the insulated shell, thereby passively suppressing environmental interference. The optical path system in the SERF inertial measurement principle prototype includes a pumping optical path and a detection optical path. In order to improve the overall temperature stability of the optical path system, a distributed temperature control scheme is implemented for the optical path system. A pumping optical path platinum resistor, a detection optical path platinum resistor and an optical path center platinum resistor are installed at the pumping optical path, the detection optical path and the center of the prototype optical path system respectively. The temperature fluctuations at different positions of the optical path system are measured for subsequent feedback control. At the same time, an additional platinum resistor is added at any position of the optical path system for open-loop temperature monitoring to reflect the temperature fluctuations at other positions outside the temperature control point. In order to suppress ambient temperature fluctuations, the system uses a non-magnetic electric heating film for active temperature rise control, and the electric heating film is attached to the inner surface of the side and bottom of the insulation shell. The left inner surface heating film and the rear inner surface heating film of the parallel insulation box serve as the first parallel heating film. The temperature fluctuation at the pumping light path is controlled by the feedback temperature of the platinum resistor in the pumping light path. The right inner surface heating film and the front inner surface heating film of the parallel insulation box serve as the second parallel heating film. The temperature fluctuation at the detection light path is controlled by the feedback temperature of the platinum resistor in the detection light path. Finally, the bottom surface heating film is used to control the stability of the average temperature of the overall light path system through the feedback temperature of the platinum resistor in the center of the light path. There are three control loops in total. At the same time, the heating film adopts a twisted pair winding design to reduce the influence of the magnetic field generated by electric heating on the SERF inertial measurement.

2. The optical path temperature control system according to claim 1, characterized in that: Since the SERF inertial measurement principle prototype needs high-temperature heating of the alkali metal gas chamber when it is working, the heat conduction in the prototype makes the temperature of the optical path system higher than the ambient temperature; after adding the thermal insulation shell, the heat convection in the optical path is reduced, which further increases its thermal equilibrium temperature, thereby affecting the normal operation of the laser. Therefore, a semiconductor cooling plate is added to the thermal insulation shell for active heat dissipation; two cooling plates on the top of the thermal insulation shell are connected in parallel, and the heat dissipation power is set to 50W.

3. The optical path temperature control system according to claim 1, characterized in that: The shell of the SERF inertial measurement prototype is made of aluminum alloy conductor material, and the bottom heating film is in direct contact with the prototype shell. In order to further suppress the electromagnetic interference caused by the heating film when it is energized, it is necessary to add a boron nitride insulation layer on the heating film. Its thermal conductivity is 20~100W / m·K, which has good thermal conductivity. While performing electromagnetic insulation, it makes the temperature field distribution in the temperature box more uniform.

4. The optical path temperature control system according to claim 1, characterized in that: The temperature control scheme adopts an anti-disturbance control algorithm, regards the external environment temperature fluctuation, the heat coupling between each control loop and the parameter change of the controlled object as the total disturbance, estimates the total disturbance in real time through the extended observer, and calculates the control quantity in combination with the feedback control law. The control signal is further modulated by the DDS module on the dual-sampling and dual-control circuit board to a high-frequency band to which the alkali metal atoms in the SERF inertial measurement are insensitive, thereby reducing the magnetic field interference generated by the heating film on the atoms; the modulated control signal is input into the power amplifier driving circuit to drive the heating film. Finally, the temperature control scheme can effectively suppress the influence of the ambient temperature fluctuation on the performance of the optical components in the SERF inertial measurement optical path system, ensure the stability of the parameters such as the power and polarization degree of the pumping and detection laser incident on the gas chamber, and significantly improve the long-term stability of the system.

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