Board test method, device, storage medium and electronic equipment

Abstract

The embodiment of the present application provides a test method, device, computer-readable storage medium and electronic device for a board, which relates to the field of computers. The method includes: when it is determined that multiple boards to be tested are powered on, a test instruction is issued to multiple boards to be tested in parallel through a switching module. In the process of multiple boards to be tested running corresponding test scripts, the temperature conditions of multiple boards to be tested are respectively obtained through the switching module; according to the temperature conditions of multiple boards to be tested, temperature control instructions are respectively issued to multiple boards to be tested through the switching module. When it is determined that the function of the target board to be tested is normal according to the test results of the test script fed back by the target board to be tested, and it is determined that the temperature of the target board to be tested during the test process is kept within a preset range, it is determined that the target board to be tested has passed the test. By issuing test instructions to multiple boards to be tested in parallel, multiple boards to be tested can start testing at the same time, thereby improving the test efficiency.

Description

Technical Field

[0001] The embodiments of the present application relate to the field of computers, and more specifically, to a test method and device for a board, a computer-readable storage medium, and an electronic device. Background Art

[0002] With the development of computer technology, the device form of computer farm (PC Farm) has emerged. It is a high-density computing solution that provides powerful computing power and efficient resource management by stacking multiple personal computer (PC) nodes in a standard server cabinet. Compared with traditional PC deployment solutions, PC Farm has the characteristics of high performance, high efficiency and high returns. PC Farm allows users to deploy multiple computing nodes in a standard cabinet. Each node can run independently and support hot-swappable operations, which is easy to maintain and expand. In addition, PC Farm is usually equipped with a unified management board that can monitor and control the power, heat dissipation and signal status of each node, realizing centralized management and optimization of the entire system.

[0003] In the related art, in order to ensure the normal operation of the PC Farm, it is necessary to test the connectivity and functionality of each node board in the board testing phase.

[0004] However, the board testing method of the related art is relatively inefficient. Summary of the invention

[0005] The embodiments of the present application provide a test method and device for a board, a computer-readable storage medium, and an electronic device, which can improve the test efficiency of the board.

[0006] According to an embodiment of the present application, a board testing method is provided, which is applied to a management board connected to a plurality of boards to be tested through a switching module, the method comprising: in a case where it is determined that the plurality of boards to be tested have been powered on, issuing test instructions to the plurality of boards to be tested in parallel through the switching module, wherein the test instructions are used to instruct the corresponding boards to be tested to run a preset test script, and the preset test scripts for different types of boards to be tested are different; in the process of the plurality of boards to be tested running the corresponding test scripts, respectively obtaining the temperature conditions of the plurality of boards to be tested through the switching module; according to the temperature conditions of the plurality of boards to be tested, issuing temperature control instructions to the plurality of boards to be tested through the switching module, respectively, wherein the temperature control instructions are used to instruct the plurality of boards to be tested to adjust the temperature; in a case where it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and it is determined that the temperature of the target board to be tested during the test is kept within a preset range, determining that the target board to be tested is qualified, wherein the target board to be tested is one of the plurality of boards to be tested.

[0007] In an exemplary embodiment, when multiple boards to be tested are powered on, test instructions are issued to the multiple boards to be tested in parallel through a switching module, including: obtaining power status signals of the multiple boards to be tested through the switching module; determining the number and type of the multiple boards to be tested, and whether the multiple boards to be tested are powered on according to the obtained power status signals; when it is determined that the multiple boards to be tested are powered on, controlling the switching module to connect the paths between the management board and the multiple boards to be tested in parallel according to the number of the multiple boards to be tested; and when the paths between the management board and the multiple boards to be tested are connected according to the types of the multiple boards to be tested, issuing corresponding test instructions to the multiple boards to be tested respectively according to the types of the multiple boards to be tested, wherein different types of boards to be tested have different corresponding test instructions.

[0008] In an exemplary embodiment, during the process of multiple boards to be tested running corresponding test scripts, the temperature conditions of the multiple boards to be tested are respectively obtained through a switching module, including: during the process of multiple boards to be tested running corresponding test scripts, the data of temperature sensors of the multiple boards to be tested are sequentially read through the switching module to respectively obtain the temperature conditions of the multiple boards to be tested; according to the temperature conditions of the multiple boards to be tested, temperature control instructions are respectively issued to the multiple boards to be tested through the switching module, including: according to the temperature conditions of the multiple boards to be tested, the rotation speeds of fans of the multiple boards to be tested are respectively controlled to keep the temperatures of the multiple boards to be tested within a preset range.

[0009] In an exemplary embodiment, during the process of multiple boards under test running corresponding test scripts, after the data of temperature sensors of the multiple boards under test are sequentially read through a switching module to respectively obtain the temperature conditions of the multiple boards under test, the method also includes: sequentially reading the power consumption conditions of the multiple boards under test through the switching module; determining whether the multiple boards under test are abnormal according to the temperature conditions and power consumption conditions of the multiple boards under test; and when it is determined that there is an abnormal board under test among the multiple boards under test, controlling the abnormal board under test to be powered off.

[0010] In an exemplary embodiment, when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and when it is determined that the temperature of the target board to be tested during the test process is maintained within a preset range, before determining that the target board to be tested has passed the test, the method further includes: obtaining, through a switching module, the situation that multiple boards to be tested run corresponding test scripts; when it is determined that there is a first board to be tested that has not completed running the test script among the multiple boards to be tested according to the situation that the multiple boards to be tested run corresponding test scripts, reissuing a test instruction to the first board to be tested; after a preset time period, obtaining the situation that the first board to be tested runs the corresponding test script, and when it is determined that the first board to be tested has not completed running the test script, returning to the step of reissuing the test instruction to the first board to be tested, until the first board to be tested passes the test. The board to be tested completes running the test script or returns to the execution for a preset number of times; a read instruction is issued to the second board to be tested that has completed running the test script through a switching module, wherein the read instruction is used to read the test file generated by the second board to be tested running the test script; when it is determined that there is a third board to be tested that fails to read the test file among the second boards to be tested, the read instruction is reissued to the third board to be tested; when it is determined that the reading of the test file of the third board to be tested fails, the step of reissuing the read instruction to the third board to be tested is returned until the reading of the test file of the third board to be tested is successful or the number of returns to the execution reaches a preset number; and a test result of a fourth board to be tested is determined according to the test file of the fourth board to be tested that successfully reads the test file, wherein the fourth board to be tested is used as the target board to be tested.

[0011] In an exemplary embodiment, the method further includes: in case it is determined that there is a board under test that fails to power on among multiple boards under test, determining that the board under test that fails to power on is faulty; in case it is determined that there is a board under test that fails to read a test file among multiple boards under test, determining that the board under test that fails to read the test file is faulty; in case it is determined based on the test files of the multiple boards under test that there is a board under test that does not completely run a test script among the multiple boards under test, determining that the board under test that does not completely run the test script is faulty.

[0012] In an exemplary embodiment, the method also includes: initializing the storage space of the management board; dividing a space of a preset size from the storage space of the management board as a test space; and storing the test results in the test space when the test results for the test script fed back by the target board to be tested are obtained.

[0013] According to another embodiment of the embodiment of the present application, a test device for a board is also provided, the device comprising: a test control module, for issuing test instructions to the multiple boards to be tested in parallel through a switching module when it is determined that the multiple boards to be tested are all powered on, wherein the test instructions are used to instruct the boards to be tested to run preset test scripts, and different types of boards to be tested have different preset test scripts; a temperature acquisition module, for respectively acquiring the temperature conditions of the multiple boards to be tested through the switching module during the process of the multiple boards to be tested running corresponding test scripts; a temperature control module, for issuing temperature control instructions to the multiple boards to be tested through the switching module according to the temperature conditions of the multiple boards to be tested, wherein the temperature control instructions are used to instruct the multiple boards to be tested to adjust the temperature; a test judgment module, for determining that the target board to be tested is qualified in the test when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and it is determined that the temperature of the target board to be tested during the test is kept within a preset range, wherein the target board to be tested is one of the multiple boards to be tested.

[0014] According to another embodiment of the present application, a computer-readable storage medium is provided, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above method embodiments when run.

[0015] According to another embodiment of the present application, an electronic device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0016] According to another embodiment of the present application, a computer program product is provided. The computer program product includes a computer program. When the computer program is executed by a processor, the steps in any one of the above method embodiments are implemented.

[0017] The test method of the board of the present application, by issuing test instructions to multiple boards to be tested in parallel, multiple boards to be tested can start testing at the same time, reducing waiting time, improving test efficiency and throughput of the production line. At the same time, since multiple boards can be tested at one time, test resources are also saved and test costs are reduced. By acquiring temperature data in real time, the management board can respond quickly to abnormal temperature conditions and take measures to avoid overheating of the equipment, thereby protecting the board from damage. Parallel processing of temperature data can ensure the efficiency and accuracy of temperature monitoring in a multi-board test environment, and it is also possible to determine whether the temperature control function of the board is normal through temperature monitoring and temperature regulation. By combining functional testing and temperature monitoring to comprehensively determine whether the board to be tested is qualified, the board can be accurately tested, ensuring the accuracy and efficiency of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0019] Figure 1 It is a hardware structure block diagram of a server device according to a board testing method of an embodiment of the present application;

[0020] Figure 2 is a flow chart of a board testing method according to an embodiment of the present application;

[0021] Figure 3 This is a second flow chart of a board testing method according to an embodiment of the present application;

[0022] Figure 4 is a third flow chart of a board testing method according to an embodiment of the present application;

[0023] Figure 5 is a fourth flow chart of a board testing method according to an embodiment of the present application;

[0024] Figure 6 is a fifth flow chart of a method for testing a board according to an embodiment of the present application;

[0025] Figure 7 is a sixth flowchart of a board testing method according to an embodiment of the present application;

[0026] Figure 8 is a seventh flow chart of a method for testing a board according to an embodiment of the present application;

[0027] Fig. 9 is a structural diagram of a board test system according to an embodiment of the present application;

[0028] Fig.10 is a structural block diagram of a board test device according to an embodiment of the present application;

[0029] Fig.11 It is a schematic diagram of the structure of an optional electronic device according to an embodiment of the present application. DETAILED DESCRIPTION

[0030] The embodiments of the present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0031] It should be noted that the terms "first", "second", etc. in the specification and claims of this application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.

[0032] The board test method embodiment provided in the embodiment of the present application can be executed in a server device or a similar computing device. Taking running on a server device as an example, Figure 1 1 is a hardware structure block diagram of a server device of a board test method according to an embodiment of the present application. Figure 1 As shown, the server device may include one or more ( Figure 1 Only one is shown in the figure) a processor 102 (the processor 102 may include but is not limited to a processing device such as a microprocessor MCU or a programmable logic device FPGA) and a memory 104 for storing data, wherein the server device may also include a transmission device 106 and an input / output device 108 for communication functions. It can be understood by those skilled in the art that Figure 1 The structure shown is only for illustration and does not limit the structure of the above server device. Figure 1 More or fewer components as shown, or with Figure 1 Different configurations shown.

[0033] The memory 104 can be used to store computer programs, for example, software programs and modules of application software, such as the computer program corresponding to the test method of the board in the embodiment of the present application. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, that is, to implement the above method. The memory 104 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 104 may further include a memory remotely arranged relative to the processor 102, and these remote memories may be connected to the server device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0034] The transmission device 106 is used to receive or send data via a network. The specific example of the above network may include a wireless network provided by a communication provider of the server device. In one example, the transmission device 106 includes a network adapter (Network Interface Controller, referred to as NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 106 can be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0035] As described in the background technology, the board test method in the related art is inefficient. The inventors have found that in the board test process of the related art, the test is usually performed in a serial manner, that is, only one board is tested at a time. In this test mode, when the production line needs to process a large number of boards, the test time will be greatly extended, and frequent board plugging and unplugging is required, which is inefficient.

[0036] In view of the above problems, a board test method is provided in this embodiment, which can improve the test efficiency of the board. Figure 2 As shown, the method includes the following steps S200-230:

[0037] Step S200: When it is determined that the plurality of boards to be tested are powered on, a test instruction is sent to the plurality of boards to be tested in parallel through a switching module.

[0038] The test instruction is used to instruct the corresponding board to be tested to run a preset test script, and different types of boards to be tested have different preset test scripts.

[0039] Specifically, in order to improve test efficiency, the management board needs to be able to send test instructions to multiple boards to be tested at the same time to ensure that all boards can start testing at the same time, rather than one by one. This can significantly shorten the test cycle and improve test efficiency.

[0040] Step S210, when the plurality of boards to be tested are running corresponding test scripts, the temperature conditions of the plurality of boards to be tested are respectively obtained by the switching module.

[0041] Specifically, during the test process, the temperature of each board to be tested can be obtained through the switching module to ensure that they operate within a safe temperature range to avoid equipment damage or instability due to overheating.

[0042] Step S220: According to the temperature conditions of the multiple boards to be tested, temperature control instructions are respectively issued to the multiple boards to be tested through the switching module.

[0043] The temperature control instruction is used to instruct multiple boards to be tested to adjust their temperatures.

[0044] Specifically, based on the acquired temperature information, the management board needs to timely adjust the temperature of the board with abnormal temperature to maintain its operation within a preset safe range.

[0045] Step S230, when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested and the temperature of the target board to be tested during the test is kept within a preset range, it is determined that the target board to be tested has passed the test.

[0046] The target board to be tested is one of the multiple boards to be tested.

[0047] Specifically, after obtaining the test results of the target board to be tested for the test script, the management board analyzes whether its function is normal based on the test results, and combines the temperature monitoring data to determine whether it is running within the safe temperature range, and whether the temperature control function of the target board to be tested is normal, so as to determine whether the board test is qualified. For example, it can be determined whether its functional test results meet the preset standards. At the same time, the temperature records during the test process are compared to confirm whether the temperature remains within the preset range. If the function is normal and the temperature is safe, the board is marked as qualified, otherwise it is marked as unqualified. The test results and status marks are recorded in the test log of the management board for subsequent analysis and reporting.

[0048] In this embodiment, by issuing test instructions to multiple boards to be tested in parallel, multiple boards to be tested can start testing at the same time, which reduces waiting time and improves test efficiency and production line throughput. At the same time, since multiple boards can be tested at one time, test resources are saved and test costs are reduced. By acquiring temperature data in real time, the management board can respond quickly to abnormal temperature conditions and take measures to avoid overheating of the equipment, thereby protecting the boards from damage. Parallel processing of temperature data can ensure the efficiency and accuracy of temperature monitoring in a multi-board test environment, and it is also possible to determine whether the temperature control function of the board is normal through temperature monitoring and temperature regulation. By combining functional testing and temperature monitoring to comprehensively determine whether the board to be tested is qualified, the board can be accurately tested, ensuring the accuracy and efficiency of the test.

[0049] In one embodiment, Figure 3 As shown, step S200, when it is determined that multiple boards to be tested have been powered on, a test instruction is issued to multiple boards to be tested in parallel through a switching module. It includes: steps S300-S330:

[0050] Step S300, obtaining power status signals of multiple boards to be tested through a switching module.

[0051] Specifically, before starting the test, the management board needs to obtain the power status of all boards to be tested to ensure that each board is powered on so that it can respond to the upcoming test instructions. Power status detection is a basic step in the automated test process, which ensures the accuracy and safety of the test.

[0052] Exemplarily, the management board can receive power status signals from each board to be tested through a general-purpose input / output (GPIO) port. These signals are usually provided by the power monitoring circuit on the board to be tested to indicate the power-on status of the board. Through the switching module, the management board can access the GPIO port of each board in turn to read the power status signal, or the switching module can read the signals of multiple boards at the same time, further improving efficiency.

[0053] Step S310: determining the number and type of the plurality of boards to be tested and whether the plurality of boards to be tested are powered on according to the acquired power status signal.

[0054] Specifically, after confirming that all boards to be tested have been powered on, the management board needs to further identify the number and type of boards, because different types of boards require different test instructions.

[0055] Exemplarily, the management board analyzes the power status signals received from the GPIO port, which contain information about the board type (such as through specific signal encoding), or the management board records the type information of the board in advance. The management board combines the type information with the power-on status of the board to determine the specific number, type and power-on status of the board to be tested in the current system.

[0056] Step S320, when it is determined according to the power status signals of the multiple boards to be tested that the multiple boards to be tested are powered on, control the switching module to connect the paths between the management board and the multiple boards to be tested in parallel according to the number of the multiple boards to be tested.

[0057] Specifically, in order to achieve parallel testing, the management board needs to be able to establish communication connections with multiple boards to be tested at the same time, and the switching module can adjust its working mode according to the number of boards to ensure that the communication channel between the management board and each board is unobstructed.

[0058] Exemplarily, based on the determined number of boards, the management board controls the switching module to enter the parallel working mode, and ensures that the communication interfaces (such as serial interface (Universal Asynchronous Receiver / Transmitter, UART), serial interface (Inter-Integrated Circuit, I2C)) between the management board and all boards to be tested are connected at the same time by configuring the corresponding hardware and software settings. In this way, each board can receive instructions from the management board through its own communication channel without being interfered by other boards.

[0059] Step S330 , according to the types of the multiple boards to be tested, when the paths between the management board and the multiple boards to be tested are connected, corresponding test instructions are respectively issued to the multiple boards to be tested according to the types of the multiple boards to be tested.

[0060] Among them, different types of boards to be tested correspond to different test instructions.

[0061] Specifically, in the parallel test mode, the management board needs to be able to send specific test instructions to each board according to the type of the board, so as to perform corresponding functional tests and performance verifications.

[0062] Exemplarily, based on the board type identified above, the management board sends specific test instructions to each board through a parallel communication channel. These instructions contain commands to run specific test scripts, or call the application programming interface (API) of specific functions to detect the functional integrity and performance indicators of the board. Different board types require different instruction sets. For example, the central processing unit (CPU) board needs to run stress test scripts to verify computing performance, while the network card board needs to test network connectivity and data transmission rate.

[0063] In this embodiment, by detecting the power status signal, the management board can pre-screen the boards that are not powered on, avoid testing the unprepared boards, thereby preventing test errors or equipment damage, and ensuring the smooth progress of the automated test process and the safety of the test equipment. Determining the number and type of boards provides necessary information for the subsequent issuance of parallel test instructions. The management board can automatically select appropriate test programs and instructions according to the different types of boards, ensuring the pertinence and effectiveness of the test, avoiding resource waste and test errors. The parallel connection mechanism significantly improves the test efficiency and reduces the test time. Multiple boards can start testing at the same time, without the limitation of serial communication, greatly improving the throughput of the test process, suitable for large-scale and high-density test environments, and reducing production time costs. Sending specific test instructions to different types of boards not only improves the accuracy and pertinence of the test, but also ensures the comparability and effectiveness of the test results. This intelligent test instruction issuance mechanism can automatically adapt to different types of boards without manual intervention, greatly improving the automation level of the test, reducing errors and omissions in the test process, and providing efficient and reliable technical support for large-scale board production testing.

[0064] In one embodiment, Figure 4As shown, step S210, in the process of multiple boards to be tested running corresponding test scripts, the temperature conditions of multiple boards to be tested are respectively obtained by switching modules. It includes: steps S400-S410:

[0065] Step S400, in the process of the plurality of boards to be tested running corresponding test scripts, the data of the temperature sensors of the plurality of boards to be tested are sequentially read by the switching module to respectively obtain the temperature conditions of the plurality of boards to be tested.

[0066] Specifically, during the board test, temperature monitoring is an important part of ensuring test safety and result validity. The management board needs to be able to obtain temperature data of each board in real time so as to make timely temperature adjustment decisions to prevent test interruption or equipment damage caused by overheating of the board.

[0067] Exemplarily, the management board sequentially selects the temperature sensors connected to each board to be tested through the switching module. The switching module can switch the I2C bus to the temperature sensor interface of each board to be tested according to a preset sequence or strategy, and the management board reads the temperature data through the I2C protocol. This process can be periodic to ensure the real-time and continuity of the temperature data, or it can be event-driven, such as actively reporting to the management board when the temperature sensor detects a temperature change.

[0068] Step S220, according to the temperature conditions of the plurality of boards to be tested, respectively sending temperature control instructions to the plurality of boards to be tested through the switching module, including:

[0069] Step S410, according to the temperature conditions of the multiple boards to be tested, respectively controlling the rotation speeds of fans of the multiple boards to be tested, so that the temperatures of the multiple boards to be tested are maintained within a preset range.

[0070] Specifically, after obtaining the temperature data of each board, the management board needs to make temperature adjustment decisions based on this data, mainly by adjusting the fan speed to control heat dissipation and ensure that the temperature of the board is within a safe preset range.

[0071] Exemplarily, the management board analyzes the data read from the temperature sensors of each board, identifies the board whose temperature exceeds the preset range, and determines the fan speed that needs to be adjusted. The management board sends a pulse-width modulation (PWM) signal to the fan control circuit of the corresponding board through a switching module to adjust the fan speed. This process involves increasing the fan speed to enhance heat dissipation, or in some cases reducing the fan speed to reduce noise or energy consumption. The duty cycle of the PWM signal determines the speed of the fan. The management board dynamically adjusts the parameters of the PWM signal according to temperature changes to achieve closed-loop control of the temperature control strategy.

[0072] In this embodiment, real-time temperature data reading provides a basis for subsequent temperature control, enabling the management board to respond quickly and prevent the board from overheating during the test. At the same time, by intelligently switching the module, efficient reading of temperature data is achieved, reducing the time for data reading and improving the overall efficiency of the test. By dynamically adjusting the fan speed, the management board can effectively control the board temperature under the test environment to avoid equipment damage or unreliable test results caused by excessive temperature. The closed-loop control mechanism ensures the accuracy and response speed of temperature regulation and improves the safety and stability of the test. At the same time, this intelligent temperature regulation method reduces the dependence on ambient temperature, allowing the test to be carried out under a wider range of conditions, enhancing the adaptability of the test environment and the flexibility of the test.

[0073] In one embodiment, Figure 5 As shown, in step S210, during the process of the plurality of boards to be tested running the corresponding test scripts, after the temperature conditions of the plurality of boards to be tested are respectively obtained by the switching module, the method further includes steps S500-S520:

[0074] Step S500: reading the power consumption of multiple boards to be tested in sequence through a switching module.

[0075] Specifically, power consumption monitoring is another important step to ensure stable operation of the board during the test. By reading the power consumption, abnormal power consumption caused by overload, short circuit and other faults can be discovered in time, which is the key to preventing equipment damage and ensuring the accuracy of test results.

[0076] Exemplarily, the management board sequentially selects the power monitoring chip or circuit connected to each board to be tested through the switching module. The switching module can switch the I2C or other communication bus to the power consumption detection interface of each board to be tested according to a preset sequence or strategy, and the management board reads the power consumption data through these communication protocols. The power consumption data read contains the real-time power consumption information of the board during the test.

[0077] Step S510: determining whether the plurality of boards to be tested are abnormal according to the temperature and power consumption of the plurality of boards to be tested.

[0078] Specifically, the comprehensive analysis of temperature and power consumption data can more accurately determine whether the board is in an abnormal state. This step is the core of ensuring the safety of equipment during the test and the validity of the test results.

[0079] Exemplarily, the management board compares the data read from the temperature sensor and the power consumption detection circuit with the preset normal range, and analyzes the changing trend of temperature and power consumption through software algorithms. If the temperature or power consumption of a board exceeds the normal range, or there are abnormal temperature and power consumption fluctuations in a short period of time, the management board will identify the board as abnormal.

[0080] Step S520: When it is determined that there is an abnormal board to be tested among the multiple boards to be tested, the abnormal board to be tested is powered off.

[0081] Specifically, once a board is found to be in an abnormal state, timely power off is an important means to prevent further damage to the equipment and ensure the safety of the test environment. The power off operation is usually performed immediately after the abnormality is confirmed to reduce potential damage.

[0082] For example, when the management board identifies that a board is in an abnormal state, it switches on the power control circuit related to the board through the switching module. The management board sends a power-off signal through the GPIO port, or sends an instruction through the command interface of the power supply unit (PSU) to stop the PSU from supplying power to the abnormal board. Before powering off, the management board will also record detailed information of the abnormal board, including abnormal time, temperature and power consumption data, for subsequent troubleshooting and analysis.

[0083] In this embodiment, real-time reading of power consumption data helps to detect power consumption anomalies in a timely manner, prevent equipment overheating or damage caused by excessive power consumption, and ensure the safety of the test process. At the same time, power consumption information is also an important indicator for evaluating the performance and stability of the board, and provides data support for subsequent troubleshooting and performance optimization. Combined with the abnormal detection of temperature and power consumption, the accuracy and reliability of fault detection are improved, and misjudgment caused by the abnormality of a single indicator is avoided. This comprehensive monitoring method can warn of potential equipment failures earlier, reduce test interruptions, and improve the continuity and efficiency of the test process. The power-off operation of the abnormal board prevents safety hazards caused by equipment overheating or electrical failure, and protects the test system and other normally operating boards from being affected. At the same time, the power-off mechanism also simplifies the fault isolation process, allowing the management board to continue testing other normal boards, improving test efficiency and the continuity of the production line.

[0084] In one embodiment, Figure 6 As shown, in step S230, after determining that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and determining that the temperature of the target board to be tested during the test is kept within a preset range, before determining that the target board to be tested is qualified, the method further includes steps S600-S660:

[0085] Step S600, obtaining the status of the corresponding test scripts being executed by the plurality of boards to be tested through the switching module.

[0086] Specifically, during the test process, the board to be tested will run preset test scripts, which usually involve comprehensive testing of the board's functions, including signal integrity, performance indicators, etc. After running the test script, the board will generate test files to record key data and results during the test. The management board needs to read these files to evaluate the status of the board.

[0087] Exemplarily, the management board switches a Universal Serial Bus (USB) bus or a similar data transmission interface to the USB slave device interface of the target board to be tested through a switching module. After the board is powered on and initialized, the management board sends an instruction to the switching module to connect it to the USB port of the target board. Then, through the USB communication protocol, it attempts to access and read the test file stored on the board.

[0088] Step S610, when it is determined that there is a first board under test that has not finished running the test script among the multiple boards under test according to the situation that the multiple boards under test run the corresponding test scripts, re-issue a test instruction to the first board under test.

[0089] Step S620, after a preset time, obtain the situation of the first board to be tested running the corresponding test script, and if it is determined that the first board to be tested has not completed running the test script, determine whether the first board to be tested has completed running the test script or the number of times of returning to execute has reached a preset number of times. If the first board to be tested has completed running the test script or the number of times of returning to execute has reached a preset number of times, execute step S630, otherwise return to execute step S610, and reissue the test instruction to the first board to be tested.

[0090] Step S630: sending a read instruction to the second board to be tested that has completed running the test script through the switching module.

[0091] The read instruction is used to read the test file generated by the second board to be tested running the test script, and the second board to be tested is the board to be tested that has completed running the test script.

[0092] Step S640: when it is determined that there is a third board under test that fails to read the test file in the second board under test, re-issue a read instruction to the third board under test.

[0093] Step S650, when it is determined that the reading of the test file of the third board to be tested fails, it is determined whether the reading of the test file of the third board to be tested is successful or whether the number of times of returning to execute reaches a preset number. If the reading of the test file of the third board to be tested is successful or the number of times of returning to execute reaches a preset number, step S660 is executed. Otherwise, the execution returns to step S640, and the step of reissuing the read instruction to the third board to be tested is executed.

[0094] The board under test that successfully reads the test file is used as the fourth board under test. When the test file of the fourth board under test is successfully read, it is determined that the serial link of the fourth board under test is normal.

[0095] Specifically, the normality of the serial link is the basis for device communication and data transmission. By trying to read the test file, it can be verified whether the serial link can stably transmit data, which is an important verification point in the test process.

[0096] For example, when the test file generated by the target board to be tested is successfully read, it will analyze the integrity of the file to check whether the file contains the expected data format and content. If the test file is complete and can be read and parsed correctly, it will be judged that the serial link between the target board to be tested and the management board is normal.

[0097] Step S660, determining the test result of the fourth board to be tested according to the test file of the fourth board to be tested whose test file is successfully read.

[0098] The fourth board to be tested is used as the target board to be tested.

[0099] Specifically, the test file contains detailed data generated after the board to be tested runs the test script, including signal response, performance indicators, error information, etc. Analyzing this data is the key step in ultimately determining whether the board is qualified.

[0100] Exemplarily, the read test file is parsed to extract the test result information therein, including the pass or fail status of the functional test, the indicator data of the performance test, and any error or warning messages. Based on the preset test standards, these data are evaluated to determine whether the various functions of the target board to be tested meet the requirements.

[0101] In this embodiment, whether the test file can be successfully read is a key step to verify whether the serial link (such as a USB link) functions normally. This not only proves that the data communication link between the management board and the board to be tested is correct, but also provides the data required for the subsequent evaluation of the board test results. Verifying the normality of the serial link ensures the reliability of subsequent data communication and provides a guarantee for the accurate transmission of test data. This is particularly important for test environments that rely on stable data links, such as PCFarm's high-density node testing, which can avoid test failures or misjudgment of results due to data transmission errors. Based on the analysis of the test file, the management board can objectively and accurately evaluate the performance and function of the board to be tested and determine whether it meets the factory standards. This process reduces the subjectivity and uncertainty of manual judgment, improves the accuracy of test results, and ensures the quality and consistency of the product. For large-scale production testing, automated result evaluation significantly improves test efficiency, reduces labor costs, and is an important part of improving the level of production line automation.

[0102] In one embodiment, Figure 7 As shown, the method further includes: steps S700-S720:

[0103] Step S700: when it is determined that there is a board under test that fails to power on among the multiple boards under test, determine that the board under test that fails to power on is faulty.

[0104] Specifically, power-on failure is a common problem in device testing, which can be caused by a variety of hardware or software reasons. Timely identification and isolation of boards with power-on failures is critical to ensuring a smooth test process.

[0105] For example, the management board monitors the power-on signals of all boards to be tested through the GPIO port during the power-on phase. If some boards do not send power-on completion signals within a preset time, these boards will be marked as power-on failure. Subsequently, a fault report will be generated based on the number and location of the boards that failed to power on, the fault information will be recorded, and measures will be taken to isolate or mark these boards to prevent them from interfering with the test process of normal boards.

[0106] Step S710: when it is determined that there is a board under test that fails to read the test file among the multiple boards under test, determine that the board under test that fails to read the test file is faulty.

[0107] Specifically, failure to read the test file indicates a problem with the board's storage unit or data transmission link, which is critical for evaluating board functionality and performance because the test file contains critical data after running the test script.

[0108] For example, when the management board attempts to read a test file of a board through the switching module, if the file cannot be successfully accessed or read, it is because of a USB link problem, a file system error, or a board storage unit failure. At this time, the board will be marked as a failure to read the test file, and the failure information will be recorded, including the time point of the failure, the number of attempts, and the cause of the failure.

[0109] Step S720, when it is determined according to the test files of the multiple boards to be tested that there is a board to be tested for which the test script has not been executed completely among the multiple boards to be tested, it is determined that the board to be tested for which the test script has not been executed completely is faulty.

[0110] Specifically, the complete running of the test script is an important part of the test process. Any premature termination or incomplete test will affect the comprehensive evaluation of the board function and performance.

[0111] For example, when analyzing the test file, the test result information in the file is checked to confirm whether all preset test scripts have been successfully run. If it is found that the expected test results are missing or marked as incomplete in the test file of a board, the board will be marked as not completing the test script, and the fault information will be recorded, including the test script breakpoint, break time and other abnormal information.

[0112] In this embodiment, by automatically identifying the board that failed to power on, the management board can take timely measures, such as power off isolation, re-power on attempt or recording fault information, which helps to improve test efficiency, reduce test interruptions caused by equipment problems, and provide a clear direction for subsequent troubleshooting and maintenance. By identifying the board that failed to read the test file, the management board can quickly locate problems in storage or data transmission, which is crucial for quickly identifying and handling hardware failures. It avoids misjudgment of test results due to data reading errors, and improves the accuracy and reliability of the test process. Unfinished test scripts indicate hardware or software problems of the board, such as insufficient processor performance, memory errors or software compatibility issues. By automatically identifying these faults, the management board can ensure that all boards to be tested have passed the complete test process, thereby improving the integrity and effectiveness of the test. This helps to promptly discover and eliminate potential equipment failures in the production line, ensuring product quality and the continuity of the production line.

[0113] In one embodiment, Figure 8 As shown, the method further includes: steps S800-S820:

[0114] Step S800, initializing the storage space of the management board.

[0115] Specifically, during the startup phase of the management board, its storage space needs to be initialized to ensure that the storage device can be correctly identified and used, and also to prepare for subsequent storage area division and data writing.

[0116] Exemplarily, when the management board is powered on, the startup code is executed, which includes the initialization process of the flash memory of the management board. The basic working parameters of the FLASH memory, such as read and write speed, sector size, etc., are set through its internal memory controller, and basic read and write tests are performed to verify the availability and stability of the memory.

[0117] Step S810: divide a space of a preset size from the storage space of the management board as a test space.

[0118] Specifically, in order to store the test results of the board to be tested, a specific area needs to be divided from the storage space of the management board. This area will be used exclusively for storing the test data to avoid confusion with other data.

[0119] Exemplarily, after the storage space is initialized, a portion of the storage space is marked as test space through software programming. This process includes setting a storage block of a preset size as a non-code area and formatting it into a file system format suitable for data storage to ensure that the test results can be correctly stored and read. The preset size is determined based on the average size of the test file and the expected number of boards to be tested to meet the storage requirements.

[0120] Step S820: When the test result for the test script fed back by the target board to be tested is obtained, the test result is stored in the test space.

[0121] Specifically, when the management board obtains the test results from the target board to be tested, it must store these data in the previously divided test space. This is to ensure the safe storage of the test data and is also the basis for subsequent analysis and report generation.

[0122] Exemplarily, after receiving the test results, the data is written to the test space via a USB or similar data transmission interface. This process includes converting the test results into a file format and using the file system API to create and write files. The test results of each board to be tested will be stored in a separate file in the test space to ensure data traceability and analyzability.

[0123] In this embodiment, the initialization process ensures that the storage space is in a stable and predictable state, avoiding data access errors caused by unconfigured or improperly configured memory. This provides a reliable foundation for the subsequent storage area division and data storage, and enhances the stability and data processing capabilities of the management board. Dividing the test space provides the management board with a clear area to store test results, which not only simplifies data management, but also improves data security and readability. By pre-setting the size of the space, storage overflow can be effectively prevented, ensuring data integrity, while facilitating subsequent data retrieval and analysis. By storing the test results directly in the test space of the management board, the process of data transmission and storage can be simplified, and the test efficiency can be improved. The storage of test results also facilitates subsequent batch analysis and the generation of maintenance records, which helps to improve the level of automation in testing and maintenance of systems such as PC Farm, reduce manual intervention, and reduce errors and costs.

[0124] In one embodiment, Fig. 9 As shown in FIG. 1 , it is a structural diagram of the test system of the board card, and the test system of the board card includes:

[0125] The switching module includes a plurality of switching units with different functions, and the first ends of the plurality of switching units are respectively connected to the plurality of boards 10 to be tested.

[0126] The plurality of switching units may include a USB switching unit 21, a UART switching unit 22, an I2C switching unit 23, and an HDMI switching unit 24 (High Definition Multimedia Interface (HDMI)).

[0127] Specifically, the UART switching unit 22 is used to process the serial communication between the management board and multiple nodes. It can switch the UART (Universal Asynchronous Receiver Transmitter) signal of the management board to different nodes to achieve parallel issuance of instructions and monitoring of node status. For example, through the UART switching unit, the management board can send a test script startup command to each node, perform CPU stress testing, network port ping packet testing, etc., and collect test results.

[0128] The I2C switching unit 23 is responsible for the signal switching of the I2C bus, and is used for the management board to monitor and control the devices on the node (such as temperature sensors, voltage regulation chips, etc.) in parallel. Through the I2C switching unit, the management board can obtain the status information of each device on the node, such as temperature, power consumption, etc., and can dynamically adjust the fan speed, monitor the power status, and isolate the faulty node based on this information.

[0129] The USB switching unit 21 is responsible for USB data transmission between the management board and multiple nodes, allowing the management board to be accessed by the nodes as a slave device. Through the USB switching unit, the tested node can read the test file in the USB device of the management board to verify whether the USB link function is normal. In addition, the USB switching unit can also be used to control the power supply state of the USB interface to achieve hot plug management of USB devices.

[0130] The HDMI switching unit 24 is used to switch the high-definition multimedia interface (HDMI) signal between the management board 30 and the multiple boards 10 to be tested, so as to test the HDMI interface function of each board 10 to be tested. Through the HDMI switching unit 24, the management board can detect the video output capability of the node to ensure the normality of the video signal transmission and the integrity of the interface.

[0131] A management board 30 is connected to the second ends of the plurality of switching units. The management board is used to issue test instructions to the plurality of boards to be tested in parallel through the switching module when it is determined that the plurality of boards to be tested are powered on, wherein the test instructions are used to instruct the boards to be tested 10 to run preset test scripts, and the preset test scripts of different types of boards to be tested 10 are different. In the process of the plurality of boards to be tested 10 running corresponding test scripts, the temperature conditions of the plurality of boards to be tested 10 are respectively obtained through the switching module. According to the temperature conditions of the plurality of boards to be tested 10, temperature control instructions are respectively issued to the plurality of boards to be tested 10 through the switching module, wherein the temperature control instructions are used to instruct the plurality of boards to be tested 10 to adjust the temperature. When it is determined that the target board to be tested 10 functions normally according to the test results for the test script fed back by the target board to be tested 10, and it is determined that the temperature of the target board to be tested 10 during the test process is kept within a preset range, it is determined that the target board to be tested 10 is qualified in the test, wherein the target board to be tested 10 is one of the plurality of boards to be tested 10.

[0132] In this embodiment, by setting the management board to issue test instructions to multiple boards to be tested in parallel, multiple boards to be tested can start testing at the same time, reducing waiting time, improving test efficiency and throughput of the production line. At the same time, since multiple boards can be tested at one time, test resources are saved and test costs are reduced. By acquiring temperature data in real time, the management board can respond quickly to abnormal temperature conditions and take measures to avoid overheating of the equipment, thereby protecting the boards from damage. Parallel processing of temperature data can ensure the efficiency and accuracy of temperature monitoring in a multi-board test environment, and it is also possible to determine whether the temperature control function of the board is normal through temperature monitoring and temperature regulation. By combining functional testing and temperature monitoring to comprehensively determine whether the board to be tested is qualified, the board can be accurately tested, ensuring the accuracy and efficiency of the test.

[0133] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus a necessary general hardware platform, and of course by hardware, but in many cases the former is a better implementation method. Based on such an understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods of each embodiment of the present application.

[0134] In this embodiment, a test device for a board is also provided to implement the above-mentioned embodiments and preferred implementation modes, which have been described and will not be repeated. As used below, the term "module" can implement a combination of software and / or hardware for a predetermined function. Although the modules described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware is also and is conceived.

[0135] Fig.10 : is a structural block diagram of a board test device according to an embodiment of the present application, the device comprising:

[0136] The test control module 1001 is used to issue test instructions to the multiple boards to be tested in parallel through the switching module when it is determined that the multiple boards to be tested are all powered on, wherein the test instructions are used to instruct the corresponding boards to be tested to run preset test scripts, and different types of boards to be tested have different preset test scripts.

[0137] The temperature acquisition module 1002 is used to respectively acquire the temperature conditions of the plurality of boards to be tested through the switching module when the plurality of boards to be tested are running corresponding test scripts.

[0138] The temperature control module 1003 is used to send temperature control instructions to the multiple boards to be tested through the switching module according to the temperature conditions of the multiple boards to be tested, wherein the temperature control instructions are used to instruct the multiple boards to be tested to adjust their temperatures.

[0139] The test judgment module 1004 is used to determine whether the target board to be tested has passed the test, when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and when it is determined that the temperature of the target board to be tested during the test is kept within a preset range, wherein the target board to be tested is one of the multiple boards to be tested.

[0140] The above device can start testing of multiple boards to be tested at the same time by issuing test instructions to multiple boards to be tested in parallel, thereby reducing waiting time and improving test efficiency and throughput of the production line. At the same time, since multiple boards can be tested at one time, test resources are saved and test costs are reduced. By acquiring temperature data in real time, the management board can respond quickly to abnormal temperature conditions and take measures to avoid overheating of the equipment, thereby protecting the boards from damage. Parallel processing of temperature data can ensure the efficiency and accuracy of temperature monitoring in a multi-board test environment, and it can also determine whether the temperature control function of the board is normal through temperature monitoring and temperature regulation. By combining functional testing and temperature monitoring to comprehensively determine whether the board to be tested is qualified, the board can be accurately tested, ensuring the accuracy and efficiency of the test.

[0141] In an exemplary embodiment, the test control module 1001 includes:

[0142] The power signal acquisition unit is used to acquire power status signals of multiple boards to be tested through the switching module.

[0143] The power-on judgment unit is used to determine the number and type of the plurality of boards to be tested and whether the plurality of boards to be tested are powered on according to the acquired power state signal.

[0144] The switching unit is used to control the switching module to connect the paths between the management board and the multiple boards to be tested in parallel according to the number of the multiple boards to be tested, when it is determined according to the power status signals of the multiple boards to be tested that the multiple boards to be tested are all powered on.

[0145] The instruction sending unit is used to send corresponding test instructions to the multiple boards to be tested according to the types of the multiple boards to be tested, when the paths between the management board and the multiple boards to be tested are connected, wherein different types of boards to be tested correspond to different test instructions.

[0146] In an exemplary embodiment, the temperature acquisition module 1002 includes:

[0147] The temperature reading unit is used to sequentially read the data of the temperature sensors of the multiple boards to be tested through the switching module during the process of the multiple boards to be tested running the corresponding test scripts, so as to respectively obtain the temperature conditions of the multiple boards to be tested.

[0148] The temperature control module 1003 includes:

[0149] The temperature control unit is used to control the speed of fans of the plurality of boards to be tested respectively according to the temperature conditions of the plurality of boards to be tested, so as to keep the temperature of the plurality of boards to be tested within a preset range.

[0150] In an exemplary embodiment, the above device further includes:

[0151] The power consumption acquisition module is used to read the power consumption of multiple boards to be tested in sequence through the switching module.

[0152] The abnormality judgment module is used to determine whether the multiple boards to be tested are abnormal according to the temperature conditions and power consumption conditions of the multiple boards to be tested.

[0153] The power-off control module is used to control the abnormal board to be tested to be powered off when it is determined that there is an abnormal board to be tested among the multiple boards to be tested.

[0154] In an exemplary embodiment, the above device further includes:

[0155] The first situation acquisition module is used to acquire the situations of the corresponding test scripts running on the plurality of boards to be tested through the switching module.

[0156] The resending instruction module is used to resend the test instruction to the first board to be tested when it is determined that there is a first board to be tested that has not completed the test script among the multiple boards to be tested according to the situation that the corresponding test scripts are run by the multiple boards to be tested.

[0157] The second situation acquisition module is used to obtain the situation of the first board under test running the corresponding test script after a preset time period. When it is determined that the first board under test has not completed running the test script, it returns to execute the step of reissuing the test instruction to the first board under test until the first board under test completes running the test script or the number of returns to execute reaches a preset number.

[0158] The first reading module is used to send a reading instruction to the second board to be tested that has completed running the test script through the switching module, wherein the reading instruction is used to read the test file generated by the second board to be tested running the test script.

[0159] The second reading module is used for reissuing a reading instruction to the third board to be tested when it is determined that there is a third board to be tested that fails to read the test file among the second boards to be tested.

[0160] The read resend module is used to return to the step of reissuing the read instruction to the third board to be tested when it is determined that the test file of the third board to be tested fails to be read, until the test file of the third board to be tested is successfully read or the number of return executions reaches a preset number.

[0161] The result determination module is used to determine the test result of the fourth board to be tested according to the test file of the fourth board to be tested whose test file is successfully read, wherein the fourth board to be tested is used as the target board to be tested.

[0162] In an exemplary embodiment, the above device further includes:

[0163] The first fault judgment module is used to determine that the board under test that fails to power on is a fault when it is determined that there is a board under test that fails to power on among the multiple boards under test.

[0164] The second fault judgment module is used to determine that the board under test that fails to read the test file is a fault when it is determined that there is a board under test that fails to read the test file among the multiple boards under test.

[0165] The third fault judgment module is used to determine that the board under test that has not completed the test script is faulty when it is determined that there is a board under test among the multiple boards under test that has not completed the test script according to the test files of the multiple boards under test.

[0166] In an exemplary embodiment, the above device further includes:

[0167] The initialization module is used to initialize the storage space of the management board.

[0168] The space division module is used to divide a space of a preset size from the storage space of the management board as a test space.

[0169] The storage module is used to store the test result in the test space when the test result for the test script fed back by the target board to be tested is obtained.

[0170] It should be noted that the above modules can be implemented by software or hardware. For the latter, it can be implemented in the following ways, but not limited to this: the above modules are all located in the same processor. Alternatively, the above modules are located in different processors in any combination.

[0171] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above method embodiments when run.

[0172] Optionally, in this embodiment, the computer program may be configured to perform the following steps by means of the computer program:

[0173] S1, when it is determined that multiple boards to be tested are powered on, a test instruction is issued to the multiple boards to be tested in parallel through a switching module, wherein the test instruction is used to instruct the corresponding boards to be tested to run a preset test script, and different types of boards to be tested have different preset test scripts.

[0174] S2, when the corresponding test scripts are executed on the plurality of boards to be tested, the temperature conditions of the plurality of boards to be tested are respectively obtained by switching modules.

[0175] S3, according to the temperature conditions of the plurality of boards to be tested, respectively sending temperature control instructions to the plurality of boards to be tested through the switching module, wherein the temperature control instructions are used to instruct the plurality of boards to be tested to adjust the temperature.

[0176] S4, when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and it is determined that the temperature of the target board to be tested during the test is kept within a preset range, it is determined that the target board to be tested has passed the test, wherein the target board to be tested is one of the multiple boards to be tested.

[0177] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk or an optical disk.

[0178] The embodiment of the present application also provides an electronic device, such as Fig.11 As shown, the electronic device includes a memory 1102 and a processor 1104. The memory 1102 stores a computer program, and the processor 1104 is configured to execute the steps in any of the above method embodiments through the computer program.

[0179] Optionally, in this embodiment, the processor 1104 may be configured to perform the following steps through a computer program:

[0180] S1, when it is determined that multiple boards to be tested are powered on, a test instruction is issued to the multiple boards to be tested in parallel through a switching module, wherein the test instruction is used to instruct the corresponding boards to be tested to run a preset test script, and different types of boards to be tested have different preset test scripts.

[0181] S2, when the corresponding test scripts are executed on the plurality of boards to be tested, the temperature conditions of the plurality of boards to be tested are respectively obtained by switching modules.

[0182] S3, according to the temperature conditions of the plurality of boards to be tested, respectively sending temperature control instructions to the plurality of boards to be tested through the switching module, wherein the temperature control instructions are used to instruct the plurality of boards to be tested to adjust the temperature.

[0183] S4, when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and it is determined that the temperature of the target board to be tested during the test is kept within a preset range, it is determined that the target board to be tested has passed the test, wherein the target board to be tested is one of the multiple boards to be tested.

[0184] For specific examples in this embodiment, reference may be made to the examples described in the above embodiments and exemplary implementation modes, and this embodiment will not be described in detail herein.

[0185] Alternatively, a person skilled in the art may understand that: Fig.11 The structure shown is for illustration only. Fig.11 The structure of the electronic device is not limited. For example, the electronic device may also include Fig.11 More or fewer components (such as network interfaces, etc.) as shown in, or with Fig.11 Different configurations shown.

[0186] Among them, the memory 1102 can be used to store software programs and modules, such as the program instructions / modules corresponding to the test method of the board and the test device of the board in the embodiment of the present application. The processor 1104 executes various functional applications and data processing by running the software programs and modules stored in the memory 1102, that is, realizing the above-mentioned test method of the board. The memory 1102 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some instances, the memory 1102 may further include a memory remotely arranged relative to the processor 1104, and these remote memories may be connected to the terminal via a network. Examples of the above-mentioned networks include but are not limited to the Internet, corporate intranets, local area networks, mobile communication networks and combinations thereof. Among them, the memory 1102 can be specifically but not limited to being used to store information such as system configuration files. As an example, such as Fig.11 As shown, the memory 1102 may include but is not limited to the modules in the test device of the board. In addition, it may also include but is not limited to other module units in the test device of the board, which will not be described in detail in this example.

[0187] Optionally, the transmission device 1106 is used to receive or send data via a network. Specific examples of the network may include a wired network and a wireless network. In one example, the transmission device 1106 includes a network adapter (Network Interface Controller, NIC), which can be connected to other network devices and routers via a network cable so as to communicate with the Internet or a local area network. In one example, the transmission device 1106 is a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.

[0188] In addition, the electronic device further includes: a display 1108; and a connection bus 1111, which is used to connect various module components in the electronic device.

[0189] In other embodiments, the electronic device may be a node in a distributed system, wherein the distributed system may be a blockchain system, and the blockchain system may be a distributed system formed by connecting the multiple nodes in the form of network communication. Among them, the nodes may form a peer-to-peer (P2P) network, and any form of computing device, such as a server, terminal, or other electronic device, may become a node in the blockchain system by joining the peer-to-peer network.

[0190] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any one of the above method embodiments are implemented.

[0191] An embodiment of the present application further provides another computer program product, including a non-volatile computer-readable storage medium, wherein the non-volatile computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps in any of the above method embodiments are implemented.

[0192] The embodiments of the present application also provide a computer program, which includes computer instructions, which are stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer-readable storage medium, and the processor executes the computer instructions, so that the computer device performs the steps of any one of the above method embodiments.

[0193] Obviously, those skilled in the art should understand that the above modules or steps of the present application can be implemented by a general computing device, they can be concentrated on a single computing device, or distributed on a network composed of multiple computing devices, they can be implemented by a program code executable by a computing device, so that they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be executed in a different order from that herein, or they can be made into individual integrated circuit modules, or multiple modules or steps therein can be made into a single integrated circuit module for implementation. Thus, the present application is not limited to any specific combination of hardware and software.

[0194] The above description is only the preferred embodiment of the present application and is not intended to limit the present application. For those skilled in the art, the present application may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the principles of the present application shall be included in the protection scope of the present application.

Claims

1. A method for testing a board, characterized in that: Applied to a management board connected to a plurality of boards to be tested via a switching module, the method comprises: When it is determined that the plurality of boards to be tested are all powered on, the switching module sends a test instruction to the plurality of boards to be tested in parallel, wherein the test instruction is used to instruct the corresponding boards to be tested to run a preset test script, and different types of boards to be tested have different preset test scripts; In the process of the plurality of boards to be tested running corresponding test scripts, the temperature conditions of the plurality of boards to be tested are respectively obtained through the switching module; According to the temperature conditions of the multiple boards to be tested, the switching module sends temperature control instructions to the multiple boards to be tested respectively, wherein the temperature control instructions are used to instruct the multiple boards to be tested to adjust the temperature; When it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and when it is determined that the temperature of the target board to be tested is kept within a preset range during the test, it is determined that the target board to be tested has passed the test, wherein the target board to be tested is one of the multiple boards to be tested.

2. The board testing method according to claim 1, characterized in that: When it is determined that the plurality of boards to be tested are all powered on, issuing test instructions to the plurality of boards to be tested in parallel through the switching module comprises: Acquiring power status signals of the plurality of boards to be tested through the switching module; Determine the number and type of the plurality of boards to be tested and whether the plurality of boards to be tested are powered on according to the acquired power status signal; When it is determined according to the power status signals of the multiple boards to be tested that the multiple boards to be tested are all powered on, controlling the switching module to connect the paths between the management board and the multiple boards to be tested in parallel according to the number of the multiple boards to be tested; When the paths between the management board and the plurality of boards to be tested are connected, corresponding test instructions are respectively issued to the plurality of boards to be tested according to types of the plurality of boards to be tested, wherein different types of boards to be tested correspond to different test instructions.

3. The board testing method according to claim 1, characterized in that: In the process of the plurality of boards to be tested running corresponding test scripts, respectively obtaining the temperature conditions of the plurality of boards to be tested through the switching module includes: In the process of the plurality of boards to be tested running corresponding test scripts, the switching module sequentially reads data from the temperature sensors of the plurality of boards to be tested, so as to respectively obtain the temperature conditions of the plurality of boards to be tested; The step of sending temperature control instructions to the plurality of boards to be tested respectively through the switching module according to the temperature conditions of the plurality of boards to be tested comprises: According to the temperature conditions of the multiple boards to be tested, the rotation speeds of the fans of the multiple boards to be tested are controlled respectively, so that the temperatures of the multiple boards to be tested are maintained within a preset range.

4. The board testing method according to claim 3, characterized in that: In the process of the plurality of boards to be tested running corresponding test scripts, after the switching module sequentially reads the data of the temperature sensors of the plurality of boards to be tested to respectively obtain the temperature conditions of the plurality of boards to be tested, the method further includes: The power consumption of the plurality of boards to be tested is sequentially read through the switching module; Determine whether the multiple boards to be tested are abnormal according to the temperature and power consumption of the multiple boards to be tested; When it is determined that there is an abnormal board to be tested among the plurality of boards to be tested, the abnormal board to be tested is controlled to be powered off.

5. The board testing method according to any one of claims 1 to 4, characterized in that: When it is determined that the function of the target board to be tested is normal according to the test result of the test script fed back by the target board to be tested, and it is determined that the temperature of the target board to be tested is kept within a preset range during the test, before determining that the target board to be tested is qualified, the method further includes: obtaining, through the switching module, the situation that the multiple boards to be tested are running the corresponding test scripts; When it is determined that there is a first board under test that has not completed running the test script among the plurality of boards under test according to the situation that the plurality of boards under test run the corresponding test scripts, reissuing a test instruction to the first board under test; After a preset time, obtaining the situation that the first board to be tested runs the corresponding test script, and if it is determined that the first board to be tested has not completed running the test script, returning to execute the step of reissuing the test instruction to the first board to be tested, until the first board to be tested completes running the test script or the number of times of returning to execute reaches a preset number; Sending a read instruction to the second board to be tested that has completed running the test script through the switching module, wherein the read instruction is used to read the test file generated by the second board to be tested running the test script; When it is determined that there is a third board to be tested that fails to read the test file in the second board to be tested, reissuing a read instruction to the third board to be tested; In the case of determining that the reading of the test file of the third board to be tested fails, returning to the step of reissuing the read instruction to the third board to be tested until the reading of the test file of the third board to be tested succeeds or the number of times of returning to execute reaches a preset number; The test result of the fourth board to be tested is determined according to the test file of the fourth board to be tested that has successfully read the test file, wherein the fourth board to be tested serves as the target board to be tested.

6. The board testing method according to claim 5, characterized in that: The method further comprises: In the case where it is determined that there is a board under test that fails to power on among the multiple boards under test, determining that the board under test that fails to power on is faulty; In the case where it is determined that there is a board under test that fails to read the test file among the multiple boards under test, determining that the board under test that fails to read the test file is faulty; When it is determined according to the test files of the multiple boards to be tested that there is a board to be tested for which the test script has not been completely executed among the multiple boards to be tested, it is determined that the board to be tested for which the test script has not been completely executed is faulty.

7. The board testing method according to any one of claims 1 to 4, characterized in that: The method further comprises: Initializing the storage space of the management board; Dividing a space of a preset size from the storage space of the management board as a test space; When the test result for the test script fed back by the target board to be tested is obtained, the test result is stored in the test space.

8. A board test device, characterized in that: The device comprises: A test control module, used for issuing test instructions to the multiple boards to be tested in parallel through the switching module when it is determined that the multiple boards to be tested are all powered on, wherein the test instructions are used to instruct the boards to be tested to run preset test scripts, and different types of boards to be tested have different preset test scripts; A temperature acquisition module, used for respectively acquiring the temperature conditions of the plurality of boards to be tested through the switching module during the process of the plurality of boards to be tested running corresponding test scripts; A temperature control module, used for sending temperature control instructions to the multiple boards to be tested respectively through the switching module according to the temperature conditions of the multiple boards to be tested, wherein the temperature control instructions are used to instruct the multiple boards to be tested to adjust the temperature; The test judgment module is used to determine that the target board to be tested has passed the test, when it is determined that the function of the target board to be tested is normal according to the test result for the test script fed back by the target board to be tested, and when it is determined that the temperature of the target board to be tested during the test is kept within a preset range, wherein the target board to be tested is one of the multiple boards to be tested.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, wherein the computer program implements the steps of the method described in any one of claims 1 to 7 when executed by a processor.

10. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the steps of the method described in any one of claims 1 to 7 are implemented.

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