Withstand voltage test circuit for equipment and method, device, equipment and storage medium thereof

Abstract

The present disclosure discloses a withstand voltage test circuit of a device and its method, device, equipment and storage medium, which relates to the field of electrical equipment testing, including: a voltage regulating module, a protection module, and a high-voltage module; the voltage regulating module is connected to the protection module in parallel, and the protection module is connected to the high-voltage module in parallel; the test electrical equipment is connected to the high-voltage module in parallel. Compared with the related art, since the withstand voltage test circuit of the device is connected in parallel, when the withstand voltage test circuit of the device reaches the resonance point, the total impedance of the withstand voltage test circuit of the device is the minimum value. As long as the total impedance of the withstand voltage test circuit of the device is monitored to be the minimum value, the resonance point can be found. Therefore, the withstand voltage test circuit of the device connected in parallel can easily find the resonance point, thereby reducing the difficulty of withstand voltage testing of electrical equipment.

Description

Technical Field

[0001] The present disclosure relates to the field of electrical equipment testing, and in particular to a withstand voltage test circuit for equipment and a method, device, equipment and storage medium thereof. Background Art

[0002] In addition to being subjected to long-term working voltage during operation, electrical equipment is also affected by various overvoltages that may occur in the power system. The voltage withstand test of electrical equipment can generate test voltages that simulate these acting voltages to test the ability of electrical equipment to withstand the test voltage. The voltage withstand test of electrical equipment is an important measure to verify whether the electrical equipment can meet the operating conditions, prevent damage to the electrical equipment and ensure the safe operation of the system.

[0003] In the relevant technology of voltage withstand test of equipment, a series circuit is formed by connecting inductance, capacitance and resistance in series, and the high voltage generated by the series circuit at the resonance point is used to perform a voltage withstand test on the electrical equipment. If the capacitance of the series circuit does not match the capacitance of the electrical equipment, it is difficult to accurately determine the resonance point, which makes it more difficult to perform a voltage withstand test on the electrical equipment. Summary of the invention

[0004] The present disclosure provides a withstand voltage test circuit for equipment and its method, device, equipment and storage medium, which is mainly intended to solve the problem that it is difficult to accurately determine the resonance point, resulting in greater difficulty in conducting withstand voltage tests on electrical equipment.

[0005] According to a first aspect of the present disclosure, a withstand voltage test circuit of a device is provided, which includes: a voltage regulating module, a protection module, and a high voltage module;

[0006] The voltage regulating module is connected in parallel with the protection module, and the protection module is connected in parallel with the high-voltage module;

[0007] The test electrical equipment is connected in parallel with the high voltage module;

[0008] The voltage regulating module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate high voltage based on the resonance point, where the voltage is the highest.

[0009] Optionally, the voltage regulation module includes a voltage regulator and a transformer;

[0010] The voltage regulator is connected in series with the transformer, and the transformer is connected in parallel with the protection module.

[0011] Optionally, the protection module includes a first resistor, a second resistor and a ball gap;

[0012] The first resistor is connected in series with the voltage regulating module, the first resistor is connected in parallel with the second resistor, the second resistor is connected in series with the ball gap, and the ball gap is connected in parallel with the voltage regulating module;

[0013] The first resistor is connected to the high voltage module in parallel, the second resistor is connected to the high voltage module in parallel, and the ball gap is connected to the high voltage module in parallel.

[0014] Optionally, the high voltage module includes a reactor, a first capacitor, a second capacitor, and a voltmeter;

[0015] The reactor is connected in parallel with the protection module, and the reactor is connected in parallel with the test electrical equipment;

[0016] The test electrical device is connected in parallel with the first capacitor, the first capacitor is connected in series with the second capacitor, and the second capacitor is connected in parallel with the test electrical device;

[0017] The voltmeter is connected in parallel with the second capacitor.

[0018] According to a second aspect of the present disclosure, a withstand voltage test method for a device is provided. The method is applied to a withstand voltage test circuit of the device described in the first aspect, and includes:

[0019] Monitoring the first capacitive reactance value of the first capacitor of the high-voltage module and the second capacitive reactance value of the second capacitor in the withstand voltage test circuit of the device, and monitoring the inductive reactance value of the reactor of the high-voltage module; the withstand voltage test circuit of the device is connected in parallel with the test electrical equipment;

[0020] When the sum of the inductive reactance value and the capacitive reactance value is equal, it is determined that the withstand voltage test circuit of the device reaches the resonance point; the sum of the capacitive reactance value is the sum of the first capacitive reactance value and the second capacitive reactance value;

[0021] When it is determined that the withstand voltage test circuit of the device reaches a resonance point, obtaining a voltage value of the second capacitor, and obtaining a first capacitance value of the first capacitor and a second capacitance value of the second capacitor;

[0022] The voltage value of the first capacitor is calculated according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value, and the voltage value of the first capacitor is determined as the withstand voltage value of the test electrical equipment.

[0023] Optionally, calculating the voltage value of the first capacitor according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value includes:

[0024] Calculating a quotient of the first capacitance value and the second capacitance value to obtain a quotient result;

[0025] The voltage value of the second capacitor and the quotient value are multiplied to obtain the voltage value of the first capacitor.

[0026] According to a third aspect of the present disclosure, a pressure test device for equipment is provided, comprising:

[0027] A monitoring unit, used to monitor a first capacitive reactance value of a first capacitor of a high voltage module, a second capacitive reactance value of a second capacitor in a withstand voltage test circuit of the device, and to monitor an inductive reactance value of a reactor of the high voltage module; the withstand voltage test circuit of the device is connected in parallel with the test electrical device;

[0028] A first determining unit is used to determine that the withstand voltage test circuit of the device reaches a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal; the sum of the capacitive reactance value is the sum of the first capacitive reactance value and the second capacitive reactance value;

[0029] an acquisition unit, configured to acquire a voltage value of the second capacitor, and acquire a first capacitance value of the first capacitor and a second capacitance value of the second capacitor when it is determined that the withstand voltage test circuit of the device reaches a resonance point;

[0030] The second determining unit calculates the voltage value of the first capacitor according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value, and determines the voltage value of the first capacitor as the withstand voltage value of the tested electrical device.

[0031] Optionally, the second determining unit includes:

[0032] A calculation module, used for calculating a quotient of the first capacitance value and the second capacitance value to obtain a quotient result;

[0033] The calculation module is further used to calculate the product of the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

[0034] According to a fourth aspect of the present disclosure, there is provided an electronic device, including:

[0035] at least one processor; and

[0036] a memory communicatively connected to the at least one processor; wherein,

[0037] The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to execute the method described in the second aspect.

[0038] According to a fifth aspect of the present disclosure, a non-transitory computer-readable storage medium storing computer instructions is provided, wherein the computer instructions are used to enable the computer to execute the method described in the second aspect.

[0039] According to a sixth aspect of the present disclosure, a computer program product is provided, comprising a computer program, wherein when the computer program is executed by a processor, the method described in the second aspect is implemented.

[0040] The voltage withstand test circuit of the equipment provided by the present disclosure and its method, device, equipment and storage medium include: a voltage regulating module, a protection module, and a high-voltage module; the voltage regulating module is connected to the protection module in parallel, and the protection module is connected to the high-voltage module in parallel; the test electrical equipment is connected to the high-voltage module in parallel; the voltage regulating module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate high voltage based on the resonance point, and the voltage at the resonance point is the highest. Compared with the related art, since the voltage withstand test circuit of the equipment is connected in parallel, when the voltage withstand test circuit of the equipment reaches the resonance point, the total impedance of the voltage withstand test circuit of the equipment is the minimum value. As long as the total impedance of the voltage withstand test circuit of the equipment is monitored to be the minimum value, the resonance point can be found. Therefore, the voltage withstand test circuit of the equipment connected in parallel can easily find the resonance point, thereby reducing the difficulty of voltage withstand test on electrical equipment.

[0041] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] The accompanying drawings are used to better understand the present solution and do not constitute a limitation of the present disclosure.

[0043] Figure 1 A schematic diagram of a withstand voltage test circuit for a device provided by an embodiment of the present disclosure;

[0044] Figure 2 A schematic diagram of a process flow of a pressure test method for a device provided by an embodiment of the present disclosure;

[0045] Figure 3A schematic diagram of the structure of a pressure test device for a device provided in an embodiment of the present disclosure;

[0046] Figure 4 A schematic structural diagram of a pressure test device for another device provided in an embodiment of the present disclosure;

[0047] Figure 5 A schematic block diagram of an exemplary electronic device provided for an embodiment of the present disclosure. DETAILED DESCRIPTION

[0048] The following is a description of exemplary embodiments of the present disclosure in conjunction with the accompanying drawings, including various details of the embodiments of the present disclosure to facilitate understanding, which should be considered as merely exemplary. Therefore, it should be recognized by those of ordinary skill in the art that various changes and modifications may be made to the embodiments described herein without departing from the scope and spirit of the present disclosure. Similarly, for the sake of clarity and conciseness, descriptions of well-known functions and structures are omitted in the following description.

[0049] The embodiments of the present disclosure are not exhaustive, but are merely illustrative of some embodiments, and are not intended to be a specific limitation on the scope of protection of the present disclosure. In the absence of contradiction, each step in a certain embodiment can be implemented as an independent embodiment, and the steps can be arbitrarily combined. For example, a solution after removing some steps in a certain embodiment can also be implemented as an independent embodiment, and the order of the steps in a certain embodiment can be arbitrarily exchanged. In addition, the optional implementation methods in a certain embodiment can be arbitrarily combined; in addition, the embodiments can be arbitrarily combined, for example, some or all of the steps of different embodiments can be arbitrarily combined, and a certain embodiment can be arbitrarily combined with the optional implementation methods of other embodiments.

[0050] In each embodiment of the present disclosure, unless otherwise specified or there is a logical conflict, the terms and / or descriptions between the embodiments are consistent and can be referenced to each other, and the technical features in different embodiments can be combined to form a new embodiment based on their internal logical relationships.

[0051] The terms used in the embodiments of the present disclosure are only for the purpose of describing specific embodiments and are not intended to limit the present disclosure.

[0052] In the embodiments of the present disclosure, unless otherwise specified, elements expressed in the singular form, such as "a", "an", "the", "above", "said", "aforementioned", "this", etc., may mean "one and only one", or "one or more", "at least one", etc. For example, when using articles such as "a", "an", "the" in English in translation, the noun after the article may be understood as a singular expression or a plural expression.

[0053] In some embodiments, terms such as "in response to ...", "in response to determining ...", "in the case of ...", "at the time of ...", "when ...", "if ...", "if ...", etc. can be used interchangeably.

[0054] In some embodiments, terms such as "greater than", "greater than or equal to", "not less than", "more than", "more than or equal to", "not less than", "higher than", "higher than or equal to", "not lower than", and "above" can be replaced with each other, and terms such as "less than", "less than or equal to", "not greater than", "less than", "less than or equal to", "no more than", "lower than", "lower than or equal to", "not higher than", and "below" can be replaced with each other.

[0055] The prefixes such as "first" and "second" in the embodiments of the present disclosure are only for distinguishing different description objects and do not constitute any restrictions on the position, order, priority, quantity or content of the description objects. For the statement of the description objects, please refer to the description in the context of the claims or embodiments, and no unnecessary restrictions should be constituted due to the use of prefixes.

[0056] In the embodiments of the present disclosure, “plurality” refers to two or more.

[0057] In the embodiments of the present disclosure, terms such as "import", "input", and "read in" can be used interchangeably.

[0058] In some embodiments, devices, etc. can be interpreted as physical or virtual, and their names are not limited to the names recorded in the embodiments. Terms such as "device", "equipment", "device", "circuit", "network element", "node", "function", "unit", "component", "system", "network", "chip", "chip system", "entity", and "subject" can be used interchangeably.

[0059] In some embodiments, the terms "terminal", "terminal device", "user equipment (UE)", "user terminal" "mobile station (MS)", "mobile terminal (MT)", subscriber station, mobile unit, subscriber unit, wireless unit, remote unit, mobile device (mobile device), wireless device (wireless device), wireless communication device (wireless communication device), remote device (remote device), mobile subscriber station (mobile subscriber station), access terminal (access terminal), mobile terminal (mobile terminal), wireless terminal (wireless terminal), remote terminal (remote terminal), handset (handset), user agent (useragent), mobile client (mobile client), client (client) and the like can be used interchangeably.

[0060] In the following description, many specific details are set forth to facilitate a full understanding of the present disclosure, but the present disclosure may also be implemented in other ways different from those described herein; it is obvious that the embodiments in the specification are only part of the embodiments of the present disclosure, rather than all of the embodiments.

[0061] The following describes a withstand voltage test circuit for a device according to an embodiment of the present disclosure and a method, apparatus, device, and storage medium thereof with reference to the accompanying drawings.

[0062] Figure 1 A schematic diagram of a withstand voltage test circuit of a device provided by an embodiment of the present disclosure is shown in FIG. Figure 1 As shown, the voltage withstand test circuit of the device includes: a voltage regulating module, a protection module, and a high-voltage module.

[0063] In order to make the description of the embodiments of the present disclosure easier to understand, Figure 1Taking the structural schematic diagram of the voltage withstand test circuit of the equipment including the voltage regulating module, the protection module and the high-voltage module as an example, the voltage regulating module 10 is connected in parallel with the protection module 20, and the protection module 20 is connected in parallel with the high-voltage module 30; the test electrical equipment 40 is connected in parallel with the high-voltage module 30; the voltage regulating module 10 is used to adjust the voltage input to the test electrical equipment 40, the protection module 20 is used to control the current input to the test electrical equipment 40, and the high-voltage module 30 is used to measure the resonance point of the test electrical equipment 40 and generate high voltage based on the resonance point, and the voltage at the resonance point is the highest.

[0064] The resonance point refers to the specific frequency point where the impedance values ​​of the inductance (inductive reactance) and capacitance (capacitive reactance) of the high-voltage module in the withstand voltage test circuit are equal. In an AC circuit, the impedance of the inductor is proportional to the frequency, while the impedance of the capacitor is inversely proportional to the frequency. When the impedance values ​​of the two are equal, the circuit reaches a resonant state, at which time the total impedance of the circuit is the minimum, the current reaches the maximum, and in a series resonant circuit, the voltage reaches the highest.

[0065] In the withstand voltage test, it is very important to find the resonance point, because at the resonance point, the highest voltage can be generated on the tested electrical equipment, thereby effectively testing the withstand voltage performance of the electrical equipment. By adjusting the inductance and capacitance values ​​in the circuit, the frequency of the resonance point can be changed to meet the withstand voltage test requirements of different tested electrical equipment.

[0066] The voltage withstand test circuit of the equipment provided by the present disclosure includes: a voltage regulating module, a protection module, and a high-voltage module; the voltage regulating module is connected to the protection module in parallel, and the protection module is connected to the high-voltage module in parallel; the test electrical equipment is connected to the high-voltage module in parallel; the voltage regulating module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate high voltage based on the resonance point, and the voltage at the resonance point is the highest. Compared with the related art, since the voltage withstand test circuit of the equipment is connected in parallel, when the voltage withstand test circuit of the equipment reaches the resonance point, the total impedance of the voltage withstand test circuit of the equipment is the minimum value. As long as the total impedance of the voltage withstand test circuit of the equipment is monitored to be the minimum value, the resonance point can be found. Therefore, the voltage withstand test circuit of the equipment connected in parallel can easily find the resonance point, thereby reducing the difficulty of voltage withstand test on electrical equipment.

[0067] In some embodiments, please refer to Figure 1 , the voltage regulation module 10 includes a voltage regulator 101 and a transformer 102;

[0068] The voltage regulator 101 and the transformer 102 are connected in series, and the transformer 102 and the protection module 20 are connected in parallel.

[0069] The main function of a voltage regulator is to adjust voltage. In a withstand voltage test circuit, a voltage regulator is used to adjust the voltage level input to the test electrical equipment. By changing the settings of the voltage regulator, the voltage applied to the test equipment can be precisely controlled to simulate different operating conditions or test requirements. This is essential to ensure the accuracy and effectiveness of the test, as it allows the tester to apply specific voltage levels as needed. A transformer is an electrical device used to change voltage, and it works on the principle of electromagnetic induction. In a withstand voltage test circuit, a transformer is connected in series with a voltage regulator to further adjust the voltage. Transformers can increase or decrease voltage, depending on the specific needs of the test. In a withstand voltage test, a transformer is often used to step up the voltage to the required test level, or in some cases, to step down the voltage for safer testing. A transformer can also provide electrical isolation, which means that it can provide isolation between the primary and secondary sides, thereby improving safety, especially when dealing with high voltages.

[0070] The voltage regulator and transformer are connected in series so that they can work together to adjust the voltage. The voltage regulator first makes a preliminary adjustment to the input voltage, and it can flexibly change the output voltage within a certain range. This initially adjusted voltage is used as the input voltage of the transformer. The transformer further changes the voltage according to its turns ratio. For example, if the voltage regulator reduces or increases the input mains voltage (such as 220V) to an intermediate value, the transformer can transform this intermediate voltage to a voltage closer to the withstand voltage test voltage required for testing electrical equipment according to its own transformation ratio. This series connection method can achieve a finer and wider voltage adjustment range to meet the testing requirements of electrical equipment with different withstand voltage levels.

[0071] In some embodiments, please refer to Figure 1 , the protection module 20 includes a first resistor 201, a second resistor 202 and a ball gap 203;

[0072] The first resistor 201 is connected in series with the voltage regulating module 10, the first resistor 201 is connected in parallel with the second resistor 202, the second resistor 202 is connected in series with the ball gap 203, and the ball gap 203 is connected in parallel with the voltage regulating module 10; the first resistor 201 is connected in parallel with the high-voltage module 30, the second resistor 202 is connected in parallel with the high-voltage module 30, and the ball gap 203 is connected in parallel with the high-voltage module 30.

[0073] The first resistor is a component in the protection module that is connected in series with the voltage regulator module, which means that it is located between the voltage regulator module and the protection module and is used to limit the current. When current flows through the first resistor, the resistor consumes a portion of the electrical energy, thereby reducing the current flowing through the subsequent circuit. The first resistor is also connected in parallel with the second resistor, which provides a shunt path that helps to distribute the current between different circuit parts. The second resistor is also part of the protection module, which is connected in parallel with the first resistor and in series with the ball gap. The role of the second resistor is to provide another current limiting and shunt path. In a parallel circuit, the second resistor can help share the current load of the first resistor, thereby protecting the circuit from damage caused by excessive current. The ball gap is a protection device that usually consists of two or more spherical electrodes with a certain gap between them. The main role of the ball gap is to provide protection in overvoltage conditions. When the voltage exceeds the design threshold of the ball gap, an arc will be generated in the ball gap, causing the gap to break down, thereby allowing current to pass, which helps to release the overvoltage energy and protect the circuit from damage. The ball gap is connected in parallel with the first and second resistors, which means that under normal operating conditions, the current flows mainly through the resistors, while under overvoltage conditions, the ball gap intervenes to provide protection.

[0074] In the protection module, by connecting the first resistor, the second resistor and the ball gap in parallel, the resonance point can be accurately measured without interfering with the voltage adjustment.

[0075] In some embodiments, please refer to Figure 1 , the high voltage module 30 includes a reactor 301, a first capacitor 302, a second capacitor 303, and a voltmeter 304;

[0076] The inductor 301 is connected in parallel with the protection module 20, and the inductor 301 is connected in parallel with the test electrical equipment 40; the test electrical equipment 40 is connected in parallel with the first capacitor 302, the first capacitor 302 is connected in series with the second capacitor 303, and the second capacitor 303 is connected in parallel with the test electrical equipment 40; the voltmeter 304 is connected in parallel with the second capacitor 303.

[0077] Reactors are used to limit current or adjust the phase of a circuit. They provide inductive reactance through the action of inductance, thereby controlling the flow of current in an AC circuit. In a withstand voltage test circuit, the reactor is connected in parallel with the protection module and the test electrical equipment. It is mainly used to adjust the current and voltage to ensure that the current is not too large during the test, and it also helps to form a resonant condition.

[0078] The first capacitor is a capacitor in the withstand voltage test circuit, which is connected in parallel with the test electrical equipment. The function of the first capacitor is to store electrical energy and provide capacitive reactance in the circuit. It is connected in series with the second capacitor and can help form a resonant circuit, thereby generating a high voltage at the resonance point. By adjusting the capacitance value, the resonant frequency of the circuit can be affected, thereby optimizing the effect of the withstand voltage test.

[0079] The second capacitor is also a capacitor in the withstand voltage test circuit, usually connected in series with the first capacitor and in parallel with the test electrical equipment. The function of the second capacitor is similar to that of the first capacitor, mainly used to store electrical energy and provide capacitive reactance. Under resonant conditions, the second capacitor works together with the first capacitor to help the circuit reach the resonance point and generate the highest voltage.

[0080] A voltmeter is an instrument used to measure the voltage in a circuit. In the withstand voltage test circuit, the voltmeter is connected in parallel with the second capacitor, and is mainly used to monitor the voltage value of the second capacitor in real time. By measuring the reading of the voltmeter, the voltage level of the circuit at the resonance point can be obtained, thereby determining the withstand voltage performance of the tested electrical equipment.

[0081] By monitoring the capacitive reactance values ​​of the first capacitor and the second capacitor and the inductive reactance value of the reactor, the conditions for the circuit to reach the resonance point can be accurately determined. At the resonance point, the voltage value of the first capacitor can be calculated based on the voltage value and capacitance value of the second capacitor, and this voltage value represents the withstand voltage value of the tested electrical equipment.

[0082] According to an embodiment of the present disclosure, the present disclosure also proposes a pressure test method for a device, such as Figure 2 As shown, Figure 2 The present invention provides a flow chart of a method for withstand voltage testing of a device provided in an embodiment of the present invention. The method is applied to a withstand voltage testing circuit of the device. The method comprises the following steps:

[0083] Step 501, monitor the first capacitive reactance value of the first capacitor of the high-voltage module, the second capacitive reactance value of the second capacitor in the voltage withstand test circuit of the device, and monitor the inductive reactance value of the inductor of the high-voltage module; the voltage withstand test circuit of the device is connected in parallel with the test electrical equipment.

[0084] The calculation formula of the capacitive reactance value can be realized by formula (1):

[0085]

[0086] Among them, Xc is the capacitive reactance value, f is the frequency of the alternating current, and C is the capacitance value of the capacitor.

[0087] The calculation formula of the inductive reactance value can be realized by formula (2):

[0088] X L =2πfL (2)

[0089] Among them, X L is the inductive reactance value, f is the frequency of the AC power, and L is the inductance value of the reactor.

[0090] By monitoring the capacitive reactance of the capacitor and the inductive reactance of the reactor, it is possible to determine whether the circuit has reached the resonance point. At the resonance point, the sum of the inductive reactance of the inductor and the capacitive reactance of the capacitor is equal, at which point the total impedance of the circuit is minimum and the voltage is maximum.

[0091] Step 502, when the sum of the inductive reactance value and the capacitive reactance value is equal, determine that the withstand voltage test circuit of the device reaches a resonance point; the sum of the capacitive reactance value is the sum of the first capacitive reactance value and the second capacitive reactance value.

[0092] By adjusting the frequency of the alternating current until the sum of the inductive reactance and the capacitive reactance is equal, and by testing at the resonant point, the insulation performance and ability of the electrical equipment to withstand high voltage environments can be more accurately evaluated, thereby improving the accuracy of the withstand voltage test.

[0093] Step 503, when it is determined that the withstand voltage test circuit of the device reaches the resonance point, obtain the voltage value of the second capacitor, and obtain the first capacitance value of the first capacitor and the second capacitance value of the second capacitor.

[0094] The capacitance values ​​of the first capacitor and the second capacitor are usually preset parameters and can be determined according to test requirements and circuit configuration during the circuit design stage.

[0095] Step 504: Calculate the voltage value of the first capacitor according to the voltage value of the second capacitor, the first capacitor, and the second capacitor, and determine the voltage value of the first capacitor as the withstand voltage value of the test electrical device.

[0096] The calculation formula of the voltage value of the first capacitor can be implemented by formula (3):

[0097]

[0098] Among them, U1 is the voltage value of the first capacitor, U2 is the voltage value of the second capacitor, C1 is the first capacitance value, and C2 is the second capacitance value.

[0099] In actual power system operation, electrical equipment will face various complex voltage conditions. The withstand voltage value determined by this calculation method can simulate the withstand capacity of electrical equipment under possible overvoltage conditions.

[0100] The voltage withstand test method of the equipment provided by the present disclosure includes: a voltage regulating module, a protection module, and a high-voltage module; the voltage regulating module is connected to the protection module in parallel, and the protection module is connected to the high-voltage module in parallel; the test electrical equipment is connected to the high-voltage module in parallel; the voltage regulating module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate high voltage based on the resonance point, and the voltage at the resonance point is the highest. Compared with the related art, since the voltage withstand test circuit of the equipment is connected in parallel, when the voltage withstand test circuit of the equipment reaches the resonance point, the total impedance of the voltage withstand test circuit of the equipment is the minimum value. As long as the total impedance of the voltage withstand test circuit of the equipment is monitored to be the minimum value, the resonance point can be found. Therefore, the voltage withstand test circuit of the equipment connected in parallel can easily find the resonance point, thereby reducing the difficulty of voltage withstand test on the electrical equipment.

[0101] As a refinement of step 504, when calculating the voltage value of the first capacitor based on the voltage value of the second capacitor, the first capacitance value, and the second capacitance value, it can be implemented in but not limited to the following manner: calculating the quotient of the first capacitance value and the second capacitance value to obtain a quotient result; and calculating the product of the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

[0102] Specifically, the implementation process of this embodiment is a textual description of formula (3).

[0103] In summary, the embodiments of the present disclosure can achieve the following effects:

[0104] Since the voltage withstand test circuit of the equipment is connected in parallel, when the voltage withstand test circuit of the equipment reaches the resonance point, the total impedance of the voltage withstand test circuit of the equipment is minimum. As long as the total impedance of the voltage withstand test circuit of the equipment is monitored to be minimum, the resonance point can be found. Therefore, the voltage withstand test circuit of the equipment connected in parallel can easily find the resonance point, thereby reducing the difficulty of voltage withstand test on electrical equipment.

[0105] Corresponding to the above-mentioned device pressure test method, the present invention also provides a device for pressure test. Since the device embodiment of the present invention corresponds to the above-mentioned method embodiment, the details not disclosed in the device embodiment can be referred to the above-mentioned method embodiment, and will not be repeated in the present invention.

[0106] Figure 3 A schematic diagram of a pressure test device for a device provided in an embodiment of the present disclosure is shown in FIG. Figure 3 As shown, including:

[0107] A monitoring unit 61 is used to monitor a first capacitive reactance value of a first capacitor of a high voltage module and a second capacitive reactance value of a second capacitor in a withstand voltage test circuit of the device, and to monitor an inductive reactance value of a reactor of the high voltage module; the withstand voltage test circuit of the device is connected in parallel with the test electrical device;

[0108] A first determining unit 62 is used to determine that the withstand voltage test circuit of the device reaches a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal; the sum of the capacitive reactance value is the sum of the first capacitive reactance value and the second capacitive reactance value;

[0109] An acquisition unit 63 is used to acquire a voltage value of the second capacitor, and acquire a first capacitance value of the first capacitor and a second capacitance value of the second capacitor when it is determined that the withstand voltage test circuit of the device reaches a resonance point;

[0110] The second determining unit 64 calculates the voltage value of the first capacitor according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value, and determines the voltage value of the first capacitor as the withstand voltage value of the tested electrical device.

[0111] The voltage withstand test device of the equipment provided by the present disclosure includes: a voltage regulating module, a protection module, and a high-voltage module; the voltage regulating module is connected to the protection module in parallel, and the protection module is connected to the high-voltage module in parallel; the test electrical equipment is connected to the high-voltage module in parallel; the voltage regulating module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate high voltage based on the resonance point, and the voltage at the resonance point is the highest. Compared with the related art, since the voltage withstand test circuit of the equipment is connected in parallel, when the voltage withstand test circuit of the equipment reaches the resonance point, the total impedance of the voltage withstand test circuit of the equipment is the minimum value. As long as the total impedance of the voltage withstand test circuit of the equipment is monitored to be the minimum value, the resonance point can be found. Therefore, the voltage withstand test circuit of the equipment connected in parallel can easily find the resonance point, thereby reducing the difficulty of voltage withstand test on electrical equipment.

[0112] Furthermore, in a possible implementation of this embodiment, as Figure 4 As shown, the second determining unit 64 includes:

[0113] A calculation module 641 is used to calculate a quotient of the first capacitance value and the second capacitance value to obtain a quotient value result;

[0114] The calculation module 641 is further used to calculate the product of the voltage value of the second capacitor and the quotient result to obtain the voltage value of the first capacitor.

[0115] It should be noted that the above explanation of the method embodiment is also applicable to the device of the embodiment of the present disclosure, and the principle is the same, which is no longer limited in the embodiment of the present disclosure.

[0116] According to an embodiment of the present disclosure, the present disclosure also provides an electronic device, a readable storage medium and a computer program product.

[0117] Figure 5 A schematic block diagram of an example electronic device 700 that can be used to implement an embodiment of the present disclosure is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices, and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present disclosure described and / or required herein.

[0118] like Figure 5 As shown, the device 700 includes a computing unit 701, which can perform various appropriate actions and processes according to a computer program stored in a ROM (Read-Only Memory) 702 or a computer program loaded from a storage unit 708 to a RAM (Random Access Memory) 703. In the RAM 703, various programs and data required for the operation of the device 700 can also be stored. The computing unit 701, the ROM 702, and the RAM 703 are connected to each other via a bus 707. An I / O (Input / Output) interface 705 is also connected to the bus 707.

[0119] A number of components in the device 700 are connected to the I / O interface 705, including: an input unit 706, such as a keyboard, a mouse, etc.; an output unit 707, such as various types of displays, speakers, etc.; a storage unit 708, such as a disk, an optical disk, etc.; and a communication unit 709, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 709 allows the device 700 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0120] The computing unit 701 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the computing unit 701 include, but are not limited to, a CPU (Central Processing Unit), a GPU (Graphic Processing Units), various dedicated AI (Artificial Intelligence) computing chips, various computing units running machine learning model algorithms, a DSP (Digital Signal Processor), and any appropriate processor, controller, microcontroller, etc. The computing unit 701 performs the various methods and processes described above, such as a withstand voltage test method for a device. For example, in some embodiments, the withstand voltage test method for a device may be implemented as a computer software program, which is tangibly contained in a machine-readable medium, such as a storage unit 708. In some embodiments, part or all of the computer program may be loaded and / or installed on the device 700 via the ROM 702 and / or the communication unit 709. When the computer program is loaded into the RAM 703 and executed by the computing unit 701, one or more steps of the method described above may be performed. Alternatively, in other embodiments, the computing unit 701 may be configured to execute the aforementioned withstand voltage test method of the device in any other appropriate manner (for example, by means of firmware).

[0121] Various embodiments of the systems and techniques described above herein may be implemented in digital electronic circuit systems, integrated circuit systems, FPGAs (Field Programmable Gate Arrays), ASICs (Application-Specific Integrated Circuits), ASSPs (Application Specific Standard Products), SOCs (System On Chips), CPLDs (Complex Programmable Logic Devices), computer hardware, firmware, software, and / or combinations thereof. These various embodiments may include: being implemented in one or more computer programs that may be executed and / or interpreted on a programmable system including at least one programmable processor that may be a special purpose or general purpose programmable processor that may receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0122] The program code for implementing the method of the present disclosure may be written in any combination of one or more programming languages. These program codes may be provided to a processor or controller of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that the program code, when executed by the processor or controller, enables the functions / operations specified in the flow chart and / or block diagram to be implemented. The program code may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0123] In the context of the present disclosure, a machine-readable medium may be a tangible medium that may contain or store a program for use by or in conjunction with an instruction execution system, device, or equipment. A machine-readable medium may be a machine-readable signal medium or a machine-readable storage medium. A machine-readable medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device, or device, or any suitable combination of the foregoing. More specific examples of machine-readable storage media may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a RAM, a ROM, an EPROM (Electrically Programmable Read-Only-Memory) or a flash memory, an optical fiber, a CD-ROM (Compact Dis sc Read-Only Memory), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0124] To provide interaction with a user, the systems and techniques described herein can be implemented on a computer having: a display device (e.g., a CRT (Cathode-Ray Tube) or LCD (Liquid Crystal Display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball), through which the user can provide input to the computer. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0125] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: LAN (Local Area Network), WAN (Wide Area Network), the Internet, and blockchain networks.

[0126] A computer system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The relationship between the client and the server is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services ("Virtual Private Server", or "VPS" for short). The server may also be a server of a distributed system, or a server combined with a blockchain.

[0127] It should be noted that artificial intelligence is a discipline that studies how computers can simulate certain human thought processes and intelligent behaviors (such as learning, reasoning, thinking, planning, etc.), and includes both hardware-level and software-level technologies. Artificial intelligence hardware technologies generally include technologies such as sensors, dedicated artificial intelligence chips, cloud computing, distributed storage, and big data processing; artificial intelligence software technologies mainly include computer vision technology, speech recognition technology, natural language processing technology, as well as machine learning / deep learning, big data processing technology, knowledge graph technology, and other major directions.

[0128] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this disclosure can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solutions disclosed in this disclosure can be achieved, and this document does not limit this.

[0129] The above specific implementations do not constitute a limitation on the protection scope of the present disclosure. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present disclosure shall be included in the protection scope of the present disclosure.

Claims

1. A withstand voltage test circuit for a device, characterized in that: include: Voltage regulating module, protection module, high voltage module; The voltage regulating module is connected in parallel with the protection module, and the protection module is connected in parallel with the high-voltage module; The test electrical equipment is connected in parallel with the high voltage module; The voltage regulating module is used to adjust the voltage input to the test electrical equipment, the protection module is used to control the current input to the test electrical equipment, and the high-voltage module is used to measure the resonance point of the test electrical equipment and generate high voltage based on the resonance point, where the voltage is the highest.

2. The withstand voltage test circuit of the device according to claim 1, characterized in that: The voltage regulation module includes a voltage regulator and a transformer; The voltage regulator is connected in series with the transformer, and the transformer is connected in parallel with the protection module.

3. The withstand voltage test circuit of the device according to claim 1, characterized in that: The protection module includes a first resistor, a second resistor and a ball gap; The first resistor is connected in series with the voltage regulating module, the first resistor is connected in parallel with the second resistor, the second resistor is connected in series with the ball gap, and the ball gap is connected in parallel with the voltage regulating module; The first resistor is connected to the high voltage module in parallel, the second resistor is connected to the high voltage module in parallel, and the ball gap is connected to the high voltage module in parallel.

4. The withstand voltage test circuit of the device according to claim 1, characterized in that: The high voltage module includes a reactor, a first capacitor, a second capacitor, and a voltmeter; The reactor is connected in parallel with the protection module, and the reactor is connected in parallel with the test electrical equipment; The test electrical device is connected in parallel with the first capacitor, the first capacitor is connected in series with the second capacitor, and the second capacitor is connected in parallel with the test electrical device; The voltmeter is connected in parallel with the second capacitor.

5. A method for pressure resistance test of equipment, characterized in that: include: Monitoring the first capacitive reactance value of the first capacitor of the high-voltage module and the second capacitive reactance value of the second capacitor in the withstand voltage test circuit of the device, and monitoring the inductive reactance value of the reactor of the high-voltage module; the withstand voltage test circuit of the device is connected in parallel with the test electrical equipment; When the sum of the inductive reactance value and the capacitive reactance value is equal, it is determined that the withstand voltage test circuit of the device reaches the resonance point; the sum of the capacitive reactance value is the sum of the first capacitive reactance value and the second capacitive reactance value; When it is determined that the withstand voltage test circuit of the device reaches a resonance point, obtaining a voltage value of the second capacitor, and obtaining a first capacitance value of the first capacitor and a second capacitance value of the second capacitor; The voltage value of the first capacitor is calculated according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value, and the voltage value of the first capacitor is determined as the withstand voltage value of the test electrical equipment.

6. The method according to claim 5, characterized in that Calculating the voltage value of the first capacitor according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value includes: Calculating a quotient of the first capacitance value and the second capacitance value to obtain a quotient result; The voltage value of the second capacitor and the quotient value are multiplied to obtain the voltage value of the first capacitor.

7. A pressure test device for equipment, characterized in that: include: A monitoring unit, used to monitor a first capacitive reactance value of a first capacitor of a high voltage module, a second capacitive reactance value of a second capacitor in a withstand voltage test circuit of the device, and to monitor an inductive reactance value of a reactor of the high voltage module; the withstand voltage test circuit of the device is connected in parallel with the test electrical device; A first determining unit is used to determine that the withstand voltage test circuit of the device reaches a resonance point when the sum of the inductive reactance value and the capacitive reactance value is equal; the sum of the capacitive reactance value is the sum of the first capacitive reactance value and the second capacitive reactance value; an acquisition unit, configured to acquire a voltage value of the second capacitor, and acquire a first capacitance value of the first capacitor and a second capacitance value of the second capacitor when it is determined that the withstand voltage test circuit of the device reaches a resonance point; The second determining unit calculates the voltage value of the first capacitor according to the voltage value of the second capacitor, the first capacitor value, and the second capacitor value, and determines the voltage value of the first capacitor as the withstand voltage value of the tested electrical device.

8. An electronic device, characterized in that: include: at least one processor; as well as a memory communicatively connected to the at least one processor; wherein, The memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor to enable the at least one processor to perform the method according to any one of claims 5 to 6.

9. A non-transitory computer-readable storage medium storing computer instructions, characterized in that: The computer instructions are used to cause the computer to execute the method according to any one of claims 5-6.

10. A computer program product, characterized in that It comprises a computer program which, when executed by a processor, implements the method according to any one of claims 5-6.

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