Self-checking method for automatic test equipment

Abstract

The invention belongs to the technical field of avionics, and particularly relates to a self-checking method for automatic test equipment. Comprising the following steps: step 1, counting all to-be-tested test resources of to-be-tested automatic test equipment, and classifying and summarizing the to-be-tested test resources according to different types; 2, according to the number of various types of test resources, a self-checking scheme is determined, so that all types can be detected once; 3, according to the determined self-checking scheme, a self-checking adaptation device is machined; 4, compiling a test command of each signal according to the determined self-checking scheme; and step 5, installing the self-inspection adaptation device to the to-be-detected automatic test equipment, and running the test command by using the general test software on the to-be-detected test equipment to complete the self-inspection process.

Description

Technical Field

[0001] The invention belongs to the technical field of avionics, and in particular relates to a self-test method for automatic test equipment. Background Art

[0002] Avionics products have complex functions and are closely coupled with flight safety. Therefore, quickly and accurately evaluating their functions and performance is crucial to ensuring equipment reliability and extending service life. Due to the large number of signals, complex signal types, and high reliability requirements of avionics products, automatic test equipment is often used for testing to improve test efficiency and accuracy. However, when the test equipment itself fails, it often causes distortion of the test results, seriously affecting the efficiency and credibility of the evaluation. Therefore, comprehensive, rapid, and accurate testing of automatic test equipment to ensure its own performance indicators is an important prerequisite for ensuring reliable product performance.

[0003] When using existing testing methods, such as manual measurement, testers need to use instruments such as multimeters to measure the input and output interfaces of the equipment one by one, which is extremely inefficient, cumbersome and error-prone. Or use external devices to provide signal output and acquisition functions, and the external devices work with automatic test equipment to complete self-test. However, this method introduces new equipment, which is extremely expensive; and testers are required to operate the test equipment and external devices at the same time, which makes the process complicated. For this reason, an innovative self-test method and device for automatic test equipment are designed, which fully utilizes the test resources of the test equipment itself, rationally plans various signal measurement methods, and realizes the low-cost, fast, comprehensive and accurate self-test function of the test equipment. Summary of the invention

[0004] Purpose of the invention: To provide a self-test method for automatic test equipment, overcome the shortcomings of existing methods, meet the needs of low-cost, fast, accurate and comprehensive self-test of automatic test equipment, utilize the test resources and test software of the automatic test equipment itself, and realize comprehensive self-test of all types of signals of the automatic test equipment.

[0005] Technical solution:

[0006] A self-test method for automatic test equipment, comprising:

[0007] Step 1: Count all the test resources to be tested of the automatic test equipment to be tested, and classify and summarize them according to different types;

[0008] Step 2: Determine the self-test plan based on the number of test resources of each type so that all types can be tested;

[0009] Step 3: According to the determined self-test scheme, process the self-test adapter device;

[0010] Step 4: Write the test commands for each signal according to the determined self-test scheme;

[0011] Step 5: Install the self-test adapter device to the automatic test equipment to be tested, and use the universal test software on the test equipment to be tested to run the test command to complete the self-test process.

[0012] Preferably, in step 1, the types of test resources include: power resources, digital I / O resources, isolated digital I / O resources, analog output resources, analog input resources, ARINC 429 bus resources, RS-422 bus resources, RS-232 bus resources, single-pole double-throw switch resources, single-pole single-throw switch resources, matrix switch resources, multiplexer resources, and digital multimeter resources.

[0013] Preferably, in step 2, the self-checking scheme of the digital I / O resources includes:

[0014] Divide the digital I / O resources into two groups equally, one group as discrete output resources and one group as discrete input resources, and connect the discrete output resources to the discrete input resources one-to-one;

[0015] If the digital I / O resources cannot be divided into two groups, connect multiple discrete input resources to one discrete output resource, or connect multiple discrete output resources to one discrete input resource, so that all digital I / O resources can be tested;

[0016] When the discrete output resource is controlled to output a high signal, the discrete input resource detection result should be high; when the discrete output resource is controlled to output a low signal, the discrete input resource detection result should be low; if the discrete input resource detection result of a link does not match the discrete output resource output, the discrete input resource or discrete output resource of this link is faulty.

[0017] Preferably, in step 2, the self-check scheme of the ARINC 429 bus resources is:

[0018] The ARINC 429 bus resources are equally divided into two groups, the ARINC 429 bus resources of the first group are connected one-to-one with the ARINC 429 bus resources of the second group, and the two groups of ARINC 429 bus resources send and receive data respectively to realize self-test;

[0019] If the ARINC 429 bus resources cannot be divided into two groups, multiple ARINC 429 bus resources in one group are connected to one ARINC 429 bus resource in another group, so that all ARINC 429 bus resources are tested;

[0020] The self-test process is as follows: first, the first group of ARINC 429 bus resources sends data, and the second group of ARINC 429 bus resources receives data; then, the second group of ARINC 429 bus resources sends data, and the first group of ARINC 429 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the ARINC 429 bus resource of this link.

[0021] Preferably, in step 2, the self-check scheme of the RS-422 bus resource is:

[0022] The RS-422 bus resources are evenly divided into two groups, the RS-422 bus resources of the first group are connected one-to-one with the RS-422 bus resources of the second group, and the two groups of RS-422 bus resources send and receive data respectively to realize self-checking;

[0023] If the RS-422 bus resources cannot be divided into two groups, multiple RS-422 bus resources in one group are connected to one RS-422 bus resource in another group so that all RS-422 bus resources are tested.

[0024] The self-test process is as follows: first, the first group of RS-422 bus resources sends data, and the second group of RS-422 bus resources receives data; then, the second group of RS-422 bus resources sends data, and the first group of RS-422 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the RS-422 bus resources of this link.

[0025] Preferably, in step 2, the self-check scheme of the RS-232 bus resource is:

[0026] The RS-232 bus resources are evenly divided into two groups, the RS-232 bus resources of the first group are connected one-to-one with the RS-232 bus resources of the second group, and the two groups of RS-232 bus resources send and receive data respectively to realize self-checking;

[0027] If the RS-232 bus resources cannot be divided into two groups, multiple RS-232 bus resources in one group are connected to one RS-232 bus resource in another group, so that all RS-232 bus resources can be tested;

[0028] The self-test process is as follows: first, the first group of RS-232 bus resources sends data, and the second group of RS-232 bus resources receives data; then, the second group of RS-232 bus resources sends data, and the first group of RS-232 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the RS-232 bus resources of this link.

[0029] Preferably, in step 2, the self-test scheme for implementing self-test by combining some power resources, single-pole double-throw resources and isolated digital I / O resources is:

[0030] Divide the isolated digital I / O resources into two groups equally, input power to the two groups of isolated digital I / O resources respectively, and test the high and low of the signal;

[0031] The specific connection method is to connect the 28V and ±15V output terminals of the power supply resource to the common terminal C of the single-pole double-throw switch resource; divide the isolated digital I / O resources into two groups equally, the first group of isolated digital I / O resources is connected to the B terminal of the single-pole double-throw switch resource, the second group of isolated digital I / O resources is connected to the A terminal of the single-pole double-throw switch resource, and the common terminal COM of the two groups of isolated digital I / O resources is connected to the power ground GND;

[0032] The self-test process is as follows: first, turn on the power supply resources; then, keep the single-pole double-throw switch resources in the default state, the test result of the first group of isolated digital I / O resources should be high, and the test result of the second group of isolated digital I / O resources should be low; finally, switch the single-pole double-throw switch resources to the closed state, the test result of the first group of isolated digital I / O resources should be low, and the test result of the second group of isolated digital I / O resources should be high; if the test results in each state do not match the theoretical state, then the power supply resources, single-pole double-throw switch resources, or isolated digital I / O resources of this link are faulty;

[0033] Among them, if the number of power resource channels is less than the number of single-pole double-throw switch resources, one power resource channel is connected to the common end C of multiple single-pole double-throw switch resources; if the number of single-pole double-throw switch resources is less than half of the number of isolated digital I / O resources, multiple isolated digital I / O resources are connected to the A and B ends of the single-pole double-throw switch; if the number of single-pole double-throw switch resources is greater than half of the number of isolated digital I / O resources, the vacant single-pole double-throw switch resources are used for the detection of other signals.

[0034] Preferably, in step 2, the self-test scheme for implementing self-test by combining analog output resources, analog input resources, power supply resources and some single-pole double-throw switch resources is:

[0035] Use analog input resources to measure the output voltage of analog output resources or measure the 5V output of power resources; the specific connection method is to connect the high end of the analog output resource with the high end of the analog input resource, and connect the low end of the analog output resource with the low end of the analog input resource; the single-pole double-throw switch resource can be used as a single-pole double-throw switch that has been tested in combination with isolated digital I / O, or a single-pole double-throw switch that has not been tested can be used;

[0036] In the case of untested single-pole double-throw switches, one analog output resource can be connected to multiple analog input resources, so that the number of remaining analog input resources is the same as the number of vacant single-pole double-throw switch resources; then, the high end of the remaining analog input resources is connected to the common end C of the vacant single-pole double-throw switch resources, and the low end is connected to the 5V ground GND of the power resource; the A end of the vacant single-pole double-throw switch resource is connected to the 5V output end of the power resource, and the B end is connected to the 5V ground GND of the power resource;

[0037] The self-test process is as follows: for the part where the analog output resource is directly connected to the analog input resource, the output voltage of the analog output resource is controlled, and the detection voltage value of the analog input resource should be equal to the output value; if they are not equal, then there is a fault in the analog output resource or the analog input resource of this link; for the part connected to the single-pole double-throw switch resource, when the single-pole double-throw switch resource is in the default state, the detection value of the analog input resource should be 0V, and when the single-pole double-throw switch resource is in the closed state, the detection value of the analog input resource should be 5V; if the test results in each state do not match the theoretical results, then there is a fault in the power supply resource, the single-pole double-throw switch resource or the analog input resource of this link.

[0038] Preferably, in step 2, the self-test scheme for implementing self-test by combining matrix switch resources, digital multimeter resources and some single-pole single-throw switch resources is:

[0039] Use the resistance measurement function of the digital multimeter resource to test the on / off state of the matrix switch resource; the specific connection method is: first, connect the digital multimeter resource to all horizontal lines of the matrix switch resource; then, connect a single-pole single-throw switch resource to all vertical lines of the matrix switch resource, and connect the two ends to the positive and negative ends of all vertical lines of the matrix switch respectively; the specific self-test process is: first, control the single-pole single-throw switch and all matrix switches to be in the off state; secondly, close the first matrix switch, use the digital multimeter resource to measure the impedance, and the resistance value should be infinite; again, open the first matrix switch, close the second matrix switch, and use the digital multimeter resource to measure the impedance, and the resistance value should be infinite; repeat the operation until all matrix switches are measured; then, control the single-pole single-throw switch to be in the closed state, all matrix switches are in the off state, and use the digital multimeter resource again to measure the impedance when all matrix switches are closed, and the resistance value should all be 0; if the test result does not match the theoretical result, the corresponding matrix switch resource or single-pole single-throw switch resource or digital multimeter resource is faulty.

[0040] Preferably, in step 2, the self-checking scheme for implementing self-checking by combining the multiplexer resources, the single-pole single-throw switch resources and the digital multimeter resources is:

[0041] Control the multiplexer resources to sequentially connect the signal channels of the multiplexer resources to the common channel, and use the digital multimeter resources to measure the on / off state of the single-pole single-throw switch resources connected to the signal channel end of the multiplexer resources at the common channel end;

[0042] The specific connection method is to connect the single-pole single-throw switch resource to the positive and negative ends of the multiplexer resource signal channel, and connect the digital multimeter resource to the positive and negative ends of the multiplexer resource common channel; the specific self-test test process is, first, connect the first signal channel of the multiplexer resource; second, disconnect the single-pole single-throw switch resource connected to the first signal channel; then, use the digital multimeter resource to measure the impedance, and the resistance value should be infinite; then, close the single-pole single-throw switch resource connected to the first signal channel, and use the digital multimeter resource to measure the impedance, and the resistance value should be 0; repeat the operation until all signal channels of the multiplexer resource are tested; if the test result does not match the theoretical result, the corresponding multiplexer resource or single-pole single-throw switch resource or digital multimeter resource is faulty.

[0043] Beneficial effects:

[0044] Self-test of power resources, digital I / O resources, isolated digital I / O resources, analog output resources, analog input resources, ARINC 429 bus resources, RS-422 bus resources, RS-232 bus resources, single-pole double-throw switch resources, single-pole single-throw switch resources, matrix switch resources, multiplexer resources and digital multimeter resources on the automatic test equipment is realized. The present invention utilizes the resources possessed by the automatic test equipment itself to realize self-test, does not require other equipment, and is easy to operate. The self-test adapter designed by the present invention does not require the use of electronic devices, has a simple and reliable structure, is easy to process, and has low cost. The self-test process of the present invention can be started with one button, runs fully automatically, and has high efficiency; it covers all types of test resources of automatic test equipment and has a wide coverage. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] Figure 1 The present invention is a flow chart of the self-test method of the automatic test equipment.

[0046] Figure 2 This is the wiring diagram for the digital I / O resource self-test.

[0047] Figure 3 Wiring diagram for the ARINC 429 bus resource self-test.

[0048] Figure 4 This is the wiring diagram for RS-422 bus resource self-test.

[0049] Figure 5 This is the wiring diagram for the RS-232 bus resource self-test.

[0050] Figure 6Wiring diagram for self-test of isolated digital I / O resources.

[0051] Figure 7 This is the self-test wiring diagram for analog output resources and analog input resources.

[0052] Figure 8 This is the wiring diagram for the matrix switch resource self-test.

[0053] Fig. 9 This is the wiring diagram for the multiplexer resource self-test.

[0054] Fig.10 It is a structural diagram of the self-test adapter; wherein 10.1 is the housing, 10.2 is the connector, and 10.3 is the internal cable. DETAILED DESCRIPTION

[0055] like Figures 1 to 10 , an automatic test equipment self-test method of the present invention comprises:

[0056] Step 1: Count all the test resources to be tested of the automatic test equipment to be tested, and classify and summarize them according to different types;

[0057] Step 2: Determine the self-test plan based on the number of test resources of each type so that all types can be tested;

[0058] Step 3: Process the self-test adapter device according to the designed self-test solution;

[0059] Step 4: Write the test commands for each signal according to the designed self-test scheme;

[0060] Step 5: Install the self-test adapter device to the automatic test equipment to be tested, and use the universal test software on the test equipment to be tested to run the test command to complete the self-test process.

[0061] The types of test resources included in the automatic test equipment include: power supply resources, digital I / O resources, isolated digital I / O resources, analog output resources, analog input resources, ARINC 429 bus resources, RS-422 bus resources, RS-232 bus resources, single-pole double-throw switch resources, single-pole single-throw switch resources, matrix switch resources, multiplexer resources, and digital multimeter resources. The automatic test equipment to be tested also has a controller and general test software.

[0062] The self-checking of each type of test resource is achieved through the following scheme:

[0063] The digital I / O resource can output a TTL high signal or a low signal when used as an output resource, and can detect a TTL high signal or a low signal when used as an input resource. The self-checking scheme is to divide the digital I / O resource into two groups, one group as a discrete output resource and one group as a discrete input resource, and connect the discrete output resource to the discrete input resource one-to-one. When the discrete output resource is controlled to output a high signal, the detection result of the discrete input resource should be high; when the discrete output resource is controlled to output a low signal, the detection result of the discrete input resource should be low. If the detection result of the discrete input resource of a link does not match the output of the discrete output resource, the discrete input resource or discrete output resource of this link is faulty.

[0064] In particular, if the digital I / O resources cannot be divided into exactly two groups, multiple discrete input resources can be connected to one discrete output resource, or multiple discrete output resources can be connected to one discrete input resource, so that all digital I / O resources can be tested.

[0065] The ARINC 429 bus resources have ARINC 429 bus sending and receiving functions, and the self-test scheme is to divide the ARINC 429 bus resources into two groups on average, connect the ARINC 429 bus resources of the first group with the ARINC 429 bus resources of the second group one-to-one, and the two groups of ARINC 429 bus resources send and receive data respectively to realize self-test. Specifically, the connection method is to connect the transmit positive (RX+) port of the first group of ARINC 429 bus resources to the receive positive (TX+) port of the second group of ARINC 429 bus resources; connect the transmit negative (RX-) port of the first group of ARINC 429 bus resources to the receive negative (TX-) port of the second group of ARINC 429 bus resources; connect the receive positive (TX+) port of the first group of ARINC 429 bus resources to the transmit positive (RX+) port of the second group of ARINC 429 bus resources; and connect the receive negative (TX-) port of the first group of ARINC 429 bus resources to the transmit negative (RX-) port of the second group of ARINC 429 bus resources. Specifically, the self-test process is as follows: first, the first group of ARINC 429 bus resources sends data, and the second group of ARINC 429 bus resources receives data; then, the second group of ARINC 429 bus resources sends data, and the first group of ARINC 429 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the ARINC 429 bus resource of this link.

[0066] In particular, if the ARINC 429 bus resources cannot be divided into two groups, multiple ARINC 429 bus resources in one group may be connected to one ARINC 429 bus resource in another group, so that all ARINC 429 bus resources can be tested.

[0067] The RS-422 bus resources have RS-422 bus sending and receiving functions, and the self-checking scheme is to divide the RS-422 bus resources into two groups evenly, connect the RS-422 bus resources of the first group with the RS-422 bus resources of the second group one-to-one, and the two groups of RS-422 bus resources send and receive data respectively to realize self-checking. Specifically, the connection method is to connect the transmitting positive (RX+) port of the first group of RS-422 bus resources with the receiving positive (TX+) port of the second group of RS-422 bus resources; connect the transmitting negative (RX-) port of the first group of RS-422 bus resources with the receiving negative (TX-) port of the second group of RS-422 bus resources; connect the receiving positive (TX+) port of the first group of RS-422 bus resources with the transmitting positive (RX+) port of the second group of RS-422 bus resources; connect the receiving negative (TX-) port of the first group of RS-422 bus resources with the transmitting negative (RX-) port of the second group of RS-422 bus resources; and connect the ground (GND) port of the first group of RS-422 bus resources with the ground (GND) port of the second group of RS-422 bus resources. Specifically, the self-test process is that first, the first group of RS-422 bus resources sends data, and the second group of RS-422 bus resources receives data; then, the second group of RS-422 bus resources sends data, and the first group of RS-422 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the RS-422 bus resources of this link.

[0068] In particular, if the RS-422 bus resources cannot be divided into two groups, multiple RS-422 bus resources in one group can be connected to one RS-422 bus resource in another group, so that all RS-422 bus resources can be tested.

[0069] The RS-232 bus resources have RS-232 bus sending and receiving functions, and the self-test scheme is to divide the RS-232 bus resources into two groups, connect the RS-232 bus resources of the first group to the RS-232 bus resources of the second group one-to-one, and the two groups of RS-232 bus resources send and receive data respectively to realize self-test. Specifically, the connection method is to connect the sending (RX) port of the first group of RS-232 bus resources to the receiving (TX) port of the second group of RS-232 bus resources; connect the receiving (TX) port of the first group of RS-232 bus resources to the sending (RX) port of the second group of RS-232 bus resources; connect the ground (GND) port of the first group of RS-232 bus resources to the ground (GND) port of the second group of RS-232 bus resources. Specifically, the self-test process is that first, the first group of RS-232 bus resources sends data, and the second group of RS-232 bus resources receives data; then, the second group of RS-232 bus resources sends data, and the first group of RS-232 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the RS-232 bus resources of this link.

[0070] In particular, if the RS-232 bus resources cannot be divided into two groups, multiple RS-232 bus resources in one group can be connected to one RS-232 bus resource in another group, so that all RS-232 bus resources can be tested.

[0071] The power supply resource can provide 28V, ±15V, and 5V voltages.

[0072] The single-pole double-throw switch resource has the function of selectively connecting two signals. The default state of the single-pole double-throw switch resource is that the common end C is connected to the end B; the closed state is that the common end C is connected to the end A. The single-pole double-throw switch resource includes a power single-pole double-throw switch resource and a signal single-pole double-throw switch resource.

[0073] The isolated digital I / O resource can input voltage signals up to ±30V and detect them as high or low signals.

[0074] The partial power supply resources, single-pole double-throw resources and isolated digital I / O resources are used in combination to realize self-test, and the self-test scheme is to divide the isolated digital I / O resources into 2 groups on average, input power to the 2 groups of isolated digital I / O resources respectively, and test the high and low signals. Specifically, the connection method is to connect the 28V and ±15V output ends of the power supply resources to the common end C of the single-pole double-throw switch resources; divide the isolated digital I / O resources into 2 groups on average, connect the first group of isolated digital I / O resources to the B end of the single-pole double-throw switch resources, and connect the second group of isolated digital I / O resources to the A end of the single-pole double-throw switch resources, and connect the common end (COM) of the two groups of isolated digital I / O resources to the power ground (GND). Specifically, the self-test process is as follows: first, turn on the power supply resources; then, keep the single-pole double-throw switch resources in the default state, the test result of the first group of isolated digital I / O resources should be high, and the test result of the second group of isolated digital I / O resources should be low; finally, switch the single-pole double-throw switch resources to the closed state, the test result of the first group of isolated digital I / O resources should be low, and the test result of the second group of isolated digital I / O resources should be high. If the test results in each state do not match the above, then the power supply resources, single-pole double-throw switch resources, or isolated digital I / O resources of this link are faulty.

[0075] In particular, if the number of power resource channels is less than the number of SPDT switch resources, one power resource channel can be connected to the common terminal C of multiple SPDT switch resources. If the number of SPDT switch resources is less than half of the number of isolated digital I / O resources, multiple isolated digital I / O resources can be connected to the A and B terminals of the SPDT switch. If the number of SPDT switch resources is greater than half of the number of isolated digital I / O resources, some SPDT switch resources can be left vacant for detection of other signals.

[0076] The analog output resource can output a voltage in the range of ±10V.

[0077] The analog input resource can detect an input voltage with a maximum range of ±10V.

[0078] The analog output resources, analog input resources, power supply resources and some single-pole double-throw switch resources are used in combination to realize self-test, and the self-test scheme is: use the analog input resources to measure the output voltage of the analog output resources or measure the 5V output of the power supply resources. Specifically, the connection method is to connect the high end of the analog output resources with the high end of the analog input resources, and connect the low end of the analog output resources with the low end of the analog input resources. The single-pole double-throw switch resources can be used as a single-pole double-throw switch that has been tested in combination with isolated digital I / O, and can also be used as an untested single-pole double-throw switch.

[0079] In particular, in the case of untested SPDT switches, one analog output resource can be connected to multiple analog input resources, so that the number of remaining analog input resources is the same as the number of vacant SPDT switch resources. Then, the high end of the remaining analog input resources is connected to the common terminal C of the vacant SPDT switch resources, and the low end is connected to the 5V ground (GND) of the power supply resource; the A end of the vacant SPDT switch resource is connected to the 5V output end of the power supply resource, and the B end is connected to the 5V ground (GND) of the power supply resource.

[0080] Specifically, the self-test process is that for the part where the analog output resource is directly connected to the analog input resource, the analog output resource output voltage is controlled, and the analog input resource detection voltage value should be equal to the output value; if they are not equal, then the analog output resource or analog input resource of this link is faulty. For the part connected to the single-pole double-throw switch resource, when the single-pole double-throw switch resource is in the default state, the analog input resource detection value should be 0V, and when the single-pole double-throw switch resource is in the closed state, the analog input resource detection value should be 5V. If the test results in each state do not match the above, then the power supply resource, single-pole double-throw switch resource or analog input resource of this link is faulty.

[0081] The single-pole single-throw switch resource can control the signal connection state. The single-pole single-throw switch resource includes a power single-pole single-throw switch resource and a signal single-pole single-throw switch resource.

[0082] The matrix switch resource includes multiple horizontal lines and vertical lines, and switches are arranged at the intersections of the horizontal lines and the vertical lines. When the switch is closed, the horizontal line and the vertical line where the switch is located are connected. The horizontal lines and the vertical lines of the matrix switch are both double-wire systems.

[0083] The digital multimeter resource can measure physical quantities such as voltage, current, and resistance. The digital multimeter resource can detect the on and off of a switch by measuring resistance. Specifically, when the switch is closed, the measured resistance should be 0; when the switch is open, the measured resistance should be infinite.

[0084] The matrix switch resources, digital multimeter resources and some single-pole single-throw switch resources are used in combination to realize self-checking, and the self-checking scheme is: use the resistance measurement function of the digital multimeter resources to test the on-off state of the matrix switch resources. Specifically, the connection method is, first, connect the digital multimeter resources to all horizontal lines of the matrix switch resources; then, connect a single-pole single-throw switch resource to all vertical lines of the matrix switch resources, and the two ends are respectively connected to the positive end and the negative end of all vertical lines of the matrix switch. Specifically, the self-checking test process is, first, control the single-pole single-throw switch and all matrix switches to be in the disconnected state; secondly, close the first matrix switch (first row and first column position), use the digital multimeter resources to measure the impedance, and the resistance value should be infinite; again, disconnect the first matrix switch, close the second matrix switch, use the digital multimeter resources to measure the impedance, and the resistance value should be infinite; repeat the above operation until all matrix switches have completed the measurement. Then, control the SPST switch to be in the closed state, and all matrix switches to be in the open state. Use the digital multimeter resource to measure the impedance of all matrix switches when they are closed according to the above operation again. The resistance value should be 0. If the test result does not match the above, the corresponding matrix switch resource, SPST switch resource, or digital multimeter resource is faulty.

[0085] The multiplexer resource includes multiple signal channels and a common channel. The multiplexer resource can realize the selection of any signal channel to be connected to the common channel through software control. The multiplexer resource can work in a two-wire or single-wire mode.

[0086] The multiplexer resources, single-pole single-throw switch resources and digital multimeter resources are used in combination to realize self-checking, and the self-checking scheme is: control the multiplexer resources to connect the signal channels of the multiplexer resources to the common channel in sequence, and use the digital multimeter resources to measure the on-off state of the single-pole single-throw switch resources connected to the signal channel end of the multiplexer resources at the common channel end. Specifically, the connection method is to connect the single-pole single-throw switch resources to the positive and negative ends of the signal channel of the multiplexer resources, and connect the digital multimeter resources to the positive and negative ends of the common channel of the multiplexer resources. Specifically, the self-checking test process is, first, connect the first signal channel of the multiplexer resources; second, disconnect the single-pole single-throw switch resources connected to the first signal channel; then, use the digital multimeter resources to measure the impedance, and the resistance value should be infinite; then, close the single-pole single-throw switch resources connected to the first signal channel, and use the digital multimeter resources to measure the impedance, and the resistance value should be 0. Repeat the above operation until all signal channels of the multiplexer resources are tested. If the test results do not match the above, the corresponding multiplexer resources, single-pole single-throw switch resources, or digital multimeter resources are faulty.

[0087] In particular, a single-pole single-throw switch resource can be connected to multiple signal channels of a multiplexer resource, with the goal of allowing all remaining single-pole single-throw switch resources and all multiplexer resources to be fully tested.

[0088] Furthermore, according to the designed self-test scheme, a self-test adapter is processed. The self-test adapter consists of a housing 10.1, a connector 10.2, and an internal cable 10.3. The housing 10.1 is made of metal, and its size is as small as possible while meeting the internal wiring space requirements. The connector 10.2 is arranged according to the interface connector of the automatic test equipment. The connection relationship and wire type of the internal cable 10.3 are arranged according to the self-test scheme of each type of signal mentioned above.

[0089] The self-checking adapter does not require any other electronic devices and has the advantages of being simple, reliable, easy to process and low in cost.

[0090] Furthermore, according to the designed self-test scheme, test commands for various types of signals are written. The test commands are run through the test software of the automatic test equipment. Specifically, the writing of the test commands needs to be based on the self-test test process in the self-test scheme of each signal type, and describe the behaviors such as signal output, switch opening and closing, and signal detection in the self-test test process in sequence. In particular, the test command describing the signal detection also includes the expected test results.

[0091] Furthermore, the self-test adapter is installed on an automatic test device, and the test software on the test device is used to run the test command to complete the self-test process. The test software automatically executes the test command without manual intervention.

[0092] The specific implementation scheme of the present invention is described in detail with reference to the accompanying drawings and technical solutions.

[0093] The embodiment of the present invention provides a method and device for self-checking of automatic testing equipment, which are used to implement self-checking of automatic testing equipment. Figure 1 A flowchart of a self-test method for automatic test equipment provided by an embodiment of the present invention. Figure 1 The method specifically comprises:

[0094] Step 1: Count all the test resources to be tested of the automatic test equipment, and classify and summarize them according to different types. In this embodiment, the test resources included in the automatic test equipment are counted as follows.

[0095] Power resources: 2 28V power supplies, 2 +15V power supplies, 2 -15V power supplies, and 2 5V power supplies.

[0096] Digital I / O resources: 128 channels in total, of which channels 1 to 96 can be configured as discrete output resources or input resources, and channels 97 to 128 can only be configured as discrete input resources.

[0097] ARINC 429 bus resources: 16 channels.

[0098] RS-422 bus resources: 44 channels.

[0099] RS-232 bus resources: 5 channels.

[0100] Isolated digital I / O resources: 128 channels.

[0101] SPDT switch resources: 80 channels.

[0102] Analog input resources: 80 channels.

[0103] Analog output resources: 34 channels.

[0104] SPST switch resources: 100 channels.

[0105] Matrix switch resources: 4 rows and 32 columns.

[0106] Multiplexer resources: 196 channels.

[0107] Digital multimeter resources: 1 channel

[0108] Step 2: Design a self-test plan based on the number of each type of test resources.

[0109] Specifically, the digital I / O resource self-checking scheme in this embodiment is to configure 1 to 64 digital I / O resources as discrete output resources and 65 to 128 digital I / O resources as discrete input resources. The 1 to 64 digital I / O resources are connected to the 65 to 128 digital I / O resources according to connection mode 2.1, so that all the 128 digital I / O resources can achieve self-checking.

[0110] Specifically, the ARINC 429 bus resource self-checking scheme in this embodiment is that 1 to 8 ARINC 429 bus resources and 9 to 16 ARINC 429 bus resources are connected one-to-one in connection mode 3.1, and all the 16 ARINC 429 bus resources can achieve self-checking.

[0111] Specifically, the RS-422 bus resource self-check scheme in this embodiment is that 1 to 22 RS-422 bus resources and 23 to 44 RS-422 bus resources are connected one-to-one in connection mode 4.1, so that all 44 RS-422 bus resources can achieve self-check.

[0112] Specifically, the RS-232 bus resource self-test scheme in this embodiment is that the 1st RS-232 bus resource and the 2nd RS-232 bus resource are connected in connection mode 5.1; the 3rd RS-232 bus resource and the 4th and 5th RS-232 bus resources are connected in connection mode 5.2, and then all the 5 RS-232 bus resources can achieve self-test.

[0113] Specifically, the self-test scheme of the isolated digital I / O resources in this embodiment is that the first 28V power supply resource is connected with the 1st to 48th isolated digital I / O resources and the 1st to 24th single-pole double-throw switch resources in connection mode 6.1; the second 28V power supply resource is connected with the 49th to 64th isolated digital I / O resources and the 25th to 32nd single-pole double-throw switch resources in connection mode 6.1; the first +15V power supply resource is connected with the 65th to 80th isolated digital I / O resources and the 33rd to 40th single-pole double-throw switch resources in connection mode 6.1. The second +15V power supply resource is connected with 81 to 96 isolated digital I / O resources and 41 to 48 single-pole double-throw switch resources in connection mode 6.1; the first -15V power supply resource is connected with 97 to 112 isolated digital I / O resources and 49 to 56 single-pole double-throw switch resources in connection mode 6.1; the second -15V power supply resource is connected with 113 to 128 isolated digital I / O resources and 57 to 64 single-pole double-throw switch resources in connection mode 6.1. Then all the 128 isolated digital I / O resources can realize self-test; 64 single-pole double-throw switch resources can realize self-test, and the remaining 16 can wait for self-test; the remaining 2 5V power supplies of the power supply resources are waiting for self-test.

[0114] Specifically, the analog input and analog output resource self-check scheme in this embodiment is that the analog output resources of 1 to 30 are connected with the analog input resources of 1 to 60 in connection mode 7.1; the analog output resources of 31 to 34 are connected with the analog input resources of 61 to 64 in connection mode 7.2; the 1st 5V power supply is connected with the analog input resources of 65 to 72 and the single-pole double-throw switch resources of 65 to 72 in connection mode 7.3; the 2nd 5V power supply is connected with the analog input resources of 73 to 80 and the single-pole double-throw switch resources of 73 to 80 in connection mode 7.3. Then, all the 80 analog input resources realize self-check; all the 34 analog output resources realize self-check; all the single-pole double-throw switch resources realize self-check; and all the power supply resources realize self-check.

[0115] Specifically, the matrix switch resource self-test solution in this embodiment is that the digital multimeter resource and the matrix switch resource 4 are connected horizontally in connection mode 8.1; the first single-pole single-throw switch resource and the matrix switch resource 32 are connected vertically in connection mode 8.1. Then the 4 rows and 32 columns of matrix switch resources are all self-tested; the digital multimeter resources are all self-tested; and the remaining 99 single-pole single-throw switch resources are to be self-tested.

[0116] Specifically, the multiplexer resource self-checking scheme in this embodiment is that 1-194 multiplexer resources and 2-98 single-pole single-throw switch resources are connected in connection mode 9.1; 195-196 multiplexer resources and 99-100 single-pole single-throw switch resources are connected in connection mode 9.2. Then all the multiplexer resources can realize self-checking; all the single-pole single-throw switch resources can realize self-checking.

[0117] The self-checking scheme can realize self-checking of all resources of the automatic testing equipment in this embodiment.

[0118] Step 3: According to the self-test solution designed in step 2, process the self-test adapter device.

[0119] The self-test adapter device is composed of a shell 10.1, a connector 10.2 and an internal cable 10.3. The shell 10.1 is made of steel and has the following dimensions: 406.4 mm long, 180 mm wide and 164.8 mm high. The connector 10.2 is an ITA connector that is plugged into the interface of the automatic test equipment; the number, specification and arrangement of the connectors 10.2 correspond to the connectors of the automatic test equipment. The internal cables 10.3 are connected according to the self-test solution designed in step 2, and the wire diameters are all 0.2 mm. 2 In particular, the line type of the ARINC 429 bus is a twisted pair, the line type of the RS-422 bus and RS-232 bus is a twisted shielded pair, and the line type of the other cables are all single-strand wires.

[0120] Step 4: Write the test command according to the self-test solution designed in step 2.

[0121] In this embodiment, the test command is a macro instruction statement executable by the A-ITF universal test platform software of the automatic test equipment.

[0122] It should be understood that the macro instruction statement is the test command used in this embodiment. In other possible embodiments, the test command may be in any other form, and such implementation should not be considered to be beyond the scope of the present invention.

[0123] Step 5: Install the self-test adapter processed in step 3 to the automatic testing equipment, and use the test software on the testing equipment to run the test command written in step 4 to complete the self-test process.

[0124] In this example, the self-test adapter is installed and fixed to the automatic test equipment through the positioning and locking device on the automatic test equipment. In this example, the test software is the A-ITF universal test platform software, which can automatically run the test commands one by one with one click, and display whether the test command is executed successfully or the result is correct.

[0125] It should be understood that the A-ITF universal test platform software is the test software used in this embodiment. In other possible embodiments, the test software may be any other software that implements the test function, and such implementation should not be considered to be beyond the scope of the present invention.

[0126] In this embodiment, the automatic test equipment has a total of 948 test resources that need to be tested. If manual testing is adopted, it will take 2 to 3 days to complete. However, using the method and device of the present invention, the self-test takes about 10 minutes, and the efficiency is improved by about 2.5*8*60 / 10=120 times.

[0127] The present invention can realize self-inspection of test resources of automatic test equipment through the above technical scheme. This method does not require other external equipment and is easy to operate. The designed device does not require electronic components, has low cost and high reliability. It adopts an automatic testing method with high efficiency and wide coverage.

[0128] The specific embodiments described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above are only specific embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A self-test method for automatic test equipment, characterized in that: include: Step 1: Count all the test resources to be tested of the automatic test equipment to be tested, and classify and summarize them according to different types; Step 2: Determine the self-test plan based on the number of test resources of each type so that all types can be tested; Step 3: According to the determined self-test scheme, process the self-test adapter device; Step 4: Write the test commands for each signal according to the determined self-test scheme; Step 5: Install the self-test adapter device to the automatic test equipment to be tested, and use the universal test software on the test equipment to be tested to run the test command to complete the self-test process.

2. The automatic test equipment self-test method according to claim 1, characterized in that: In step 1, the types of test resources include: power resources, digital I / O resources, isolated digital I / O resources, analog output resources, analog input resources, ARINC429 bus resources, RS-422 bus resources, RS-232 bus resources, single-pole double-throw switch resources, single-pole single-throw switch resources, matrix switch resources, multiplexer resources, and digital multimeter resources.

3. The automatic test equipment self-test method according to claim 2, characterized in that: In step 2, the self-test solution for digital I / O resources includes: Divide the digital I / O resources into two groups equally, one group as discrete output resources and one group as discrete input resources, and connect the discrete output resources to the discrete input resources one-to-one; If the digital I / O resources cannot be divided into two groups, connect multiple discrete input resources to one discrete output resource, or connect multiple discrete output resources to one discrete input resource, so that all digital I / O resources can be tested; When the discrete output resource is controlled to output a high signal, the discrete input resource detection result should be high; when the discrete output resource is controlled to output a low signal, the discrete input resource detection result should be low; if the discrete input resource detection result of a link does not match the discrete output resource output, the discrete input resource or discrete output resource of this link is faulty.

4. The automatic test equipment self-test method according to claim 3, characterized in that: In step 2, the self-test scheme for the ARINC 429 bus resources is: The ARINC 429 bus resources are equally divided into two groups, the ARINC 429 bus resources of the first group are connected one-to-one with the ARINC 429 bus resources of the second group, and the two groups of ARINC 429 bus resources send and receive data respectively to realize self-test; If the ARINC 429 bus resources cannot be divided into two groups, multiple ARINC 429 bus resources in one group are connected to one ARINC 429 bus resource in another group, so that all ARINC 429 bus resources are tested; The self-test process is as follows: first, the first group of ARINC 429 bus resources sends data, and the second group of ARINC 429 bus resources receives data; then, the second group of ARINC 429 bus resources sends data, and the first group of ARINC 429 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the ARINC 429 bus resource of this link.

5. The automatic test equipment self-test method according to claim 4, characterized in that: In step 2, the self-test scheme of the RS-422 bus resources is: The RS-422 bus resources are evenly divided into two groups, the RS-422 bus resources of the first group are connected one-to-one with the RS-422 bus resources of the second group, and the two groups of RS-422 bus resources send and receive data respectively to realize self-checking; If the RS-422 bus resources cannot be divided into two groups, multiple RS-422 bus resources in one group are connected to one RS-422 bus resource in another group, so that all RS-422 bus resources are tested; The self-test process is as follows: first, the first group of RS-422 bus resources sends data, and the second group of RS-422 bus resources receives data; then, the second group of RS-422 bus resources sends data, and the first group of RS-422 bus resources receives data; If the data received on a link does not match the data sent, there is a fault in the RS-422 bus resources of this link.

6. The automatic test equipment self-test method according to claim 5, characterized in that: In step 2, the self-test scheme of the RS-232 bus resources is: The RS-232 bus resources are evenly divided into two groups, the RS-232 bus resources of the first group are connected one-to-one with the RS-232 bus resources of the second group, and the two groups of RS-232 bus resources send and receive data respectively to realize self-checking; If the RS-232 bus resources cannot be divided into two groups, multiple RS-232 bus resources in one group are connected to one RS-232 bus resource in another group, so that all RS-232 bus resources can be tested; The self-test process is as follows: first, the first group of RS-232 bus resources sends data, and the second group of RS-232 bus resources receives data; then, the second group of RS-232 bus resources sends data, and the first group of RS-232 bus resources receives data; if the data received by a link does not match the data sent, then there is a fault in the RS-232 bus resources of this link.

7. The automatic test equipment self-test method according to claim 6, characterized in that: In step 2, the self-test solution for implementing self-test by combining some power resources, single-pole double-throw resources, and isolated digital I / O resources is as follows: Divide the isolated digital I / O resources into two groups equally, input power to the two groups of isolated digital I / O resources respectively, and test the high and low of the signal; The specific connection method is to connect the 28V and ±15V output terminals of the power supply resource to the common terminal C of the single-pole double-throw switch resource; divide the isolated digital I / O resources into two groups equally, the first group of isolated digital I / O resources is connected to the B terminal of the single-pole double-throw switch resource, the second group of isolated digital I / O resources is connected to the A terminal of the single-pole double-throw switch resource, and the common terminal COM of the two groups of isolated digital I / O resources is connected to the power ground GND; The self-test process is, first, turn on the power source; Then, keep the single-pole double-throw switch resource in the default state, the test result of the first group of isolated digital I / O resources should be high, and the test result of the second group of isolated digital I / O resources should be low; finally, switch the single-pole double-throw switch resource to the closed state, the test result of the first group of isolated digital I / O resources should be low, and the test result of the second group of isolated digital I / O resources should be high; If the test results in each state do not match the theoretical state, then the link power supply resource, single-pole double-throw switch resource, or isolated digital I / O resource is faulty; Among them, if the number of power resource channels is less than the number of single-pole double-throw switch resources, one power resource channel is connected to the common end C of multiple single-pole double-throw switch resources; if the number of single-pole double-throw switch resources is less than half of the number of isolated digital I / O resources, multiple isolated digital I / O resources are connected to the A and B ends of the single-pole double-throw switch; if the number of single-pole double-throw switch resources is greater than half of the number of isolated digital I / O resources, the vacant single-pole double-throw switch resources are used for the detection of other signals.

8. The automatic test equipment self-test method according to claim 7, characterized in that: In step 2, the self-test scheme for implementing self-test by combining analog output resources, analog input resources, power resources and some single-pole double-throw switch resources is as follows: Use analog input resources to measure the output voltage of analog output resources or measure the 5V output of power resources; the specific connection method is to connect the high end of the analog output resource with the high end of the analog input resource, and connect the low end of the analog output resource with the low end of the analog input resource; the single-pole double-throw switch resource can be used as a single-pole double-throw switch that has been tested in combination with isolated digital I / O, or a single-pole double-throw switch that has not been tested can be used; In the case of untested single-pole double-throw switches, one analog output resource can be connected to multiple analog input resources, so that the number of remaining analog input resources is the same as the number of vacant single-pole double-throw switch resources; then, the high end of the remaining analog input resources is connected to the common end C of the vacant single-pole double-throw switch resources, and the low end is connected to the 5V ground GND of the power resource; the A end of the vacant single-pole double-throw switch resource is connected to the 5V output end of the power resource, and the B end is connected to the 5V ground GND of the power resource; The self-test process is as follows: for the part where the analog output resource is directly connected to the analog input resource, the output voltage of the analog output resource is controlled, and the detection voltage value of the analog input resource should be equal to the output value; if they are not equal, then there is a fault in the analog output resource or the analog input resource of this link; for the part connected to the single-pole double-throw switch resource, when the single-pole double-throw switch resource is in the default state, the detection value of the analog input resource should be 0V, and when the single-pole double-throw switch resource is in the closed state, the detection value of the analog input resource should be 5V; if the test results in each state do not match the theoretical results, then there is a fault in the power supply resource, the single-pole double-throw switch resource or the analog input resource of this link.

9. The automatic test equipment self-test method according to claim 8, characterized in that: In step 2, the self-test solution for implementing self-test by combining matrix switch resources, digital multimeter resources and some single-pole single-throw switch resources is as follows: Use the resistance measurement function of the digital multimeter resource to test the on / off state of the matrix switch resource; the specific connection method is: first, connect the digital multimeter resource to all horizontal lines of the matrix switch resource; then, connect a single-pole single-throw switch resource to all vertical lines of the matrix switch resource, and connect the two ends to the positive and negative ends of all vertical lines of the matrix switch respectively; the specific self-test process is: first, control the single-pole single-throw switch and all matrix switches to be in the off state; Secondly, close the first matrix switch and use the digital multimeter resource to measure the impedance. The resistance should be infinite. Again, open the first matrix switch and close the second matrix switch. Use the digital multimeter resource to measure the impedance. The resistance should be infinite. Repeat the operation until all matrix switches are measured. Then, control the single-pole single-throw switch to the closed state and all matrix switches to the open state. Use the digital multimeter resource to measure the impedance when all matrix switches are closed. The resistance should all be 0. If the test results do not match the theoretical results, there is a fault in the corresponding matrix switch resources, single-pole single-throw switch resources, or digital multimeter resources.

10. The automatic test equipment self-test method according to claim 9, characterized in that: In step 2, the self-test solution for implementing self-test by combining multiplexer resources, single-pole single-throw switch resources, and digital multimeter resources is as follows: Control the multiplexer resources to sequentially connect the signal channels of the multiplexer resources to the common channel, and use the digital multimeter resources to measure the on / off state of the single-pole single-throw switch resources connected to the signal channel end of the multiplexer resources at the common channel end; The specific connection method is to connect the single-pole single-throw switch resource to the positive and negative ends of the multiplexer resource signal channel, and connect the digital multimeter resource to the positive and negative ends of the multiplexer resource common channel; the specific self-test test process is, first, connect the first signal channel of the multiplexer resource; second, disconnect the single-pole single-throw switch resource connected to the first signal channel; then, use the digital multimeter resource to measure the impedance, and the resistance value should be infinite; then, close the single-pole single-throw switch resource connected to the first signal channel, and use the digital multimeter resource to measure the impedance, and the resistance value should be 0; repeat the operation until all signal channels of the multiplexer resource are tested; if the test result does not match the theoretical result, the corresponding multiplexer resource or single-pole single-throw switch resource or digital multimeter resource is faulty.

Images