Solar cell IV / EL in-situ integration automatic test system and method

Abstract

The invention discloses a solar cell IV / EL in-situ integration automatic test system and method, and the system comprises a test darkroom and a temperature control test bench, the test darkroom is used for guaranteeing that a solar cell completes IV bright field test, dark field test, reverse bias and EL test at the same position at the same time; the temperature control testboard is used for adapting to solar cells of various sizes and specifications to complete reverse bias test, solar cell dark characteristic test, EL defect test and solar cell light characteristic test on the temperature control testboard. According to the solar cell IV / EL in-situ integration automatic test system, the in-situ IV / EL integration test is performed on the solar cell on the temperature control test bench, so that the production test steps are reduced, the test efficiency is improved, and the problems of solar cell fragments and electrode surface damage caused by manual operation and repeated clamping are solved.

Description

Technical Field

[0001] The invention relates to the technical field of photovoltaic solar cell testing, and in particular to a solar cell IV / EL in-situ integrated automatic testing system and method. Background Art

[0002] Solar cells use the photovoltaic effect to generate electricity and are widely used in ground-based photovoltaic power generation and spacecraft power conversion. Solar cell electrical performance testing is crucial for solar cell efficiency evaluation and application, including dark characteristic testing, light characteristic testing, EL defect detection, temperature characteristic testing, etc.

[0003] At present, dark characteristic test, light characteristic test, EL defect detection and temperature characteristic test of solar cells are mostly carried out with different test equipments. During the electrical performance test, solar cells need to go back and forth between various test equipments. There are many manual operation steps and long test cycle, which makes it difficult to ensure the uniformity of test status. Moreover, after multiple tests, clamping of solar cells is prone to cause solar cell fragmentation. Summary of the invention

[0004] In order to solve the problems of solar cell fragments and low test efficiency caused by multiple test clamping and manual operation when performing different electrical performance tests on solar cells, the present invention proposes a solar cell IV / EL in-situ integrated automatic test system, which adopts an optical positioning device to ensure the accuracy of the placement position of the solar cell, and performs in-situ IV / EL integrated testing on the solar cell on a temperature-controlled test bench, which not only reduces the production test steps and improves the test efficiency, but also solves the problems of solar cell fragments and electrode surface damage caused by manual operation and multiple clamping.

[0005] The specific technical solutions of the present invention are as follows:

[0006] A solar cell IV / EL in-situ integrated automatic testing system, the system comprises a test darkroom and a temperature-controlled test bench, wherein:

[0007] The test darkroom is used to prevent the solar cells from being affected by surrounding stray light during the electrical performance test;

[0008] The test darkroom adopts a special optical path design, which can ensure that the solar cell can complete IV bright field test, dark field test, reverse bias and EL test at the same position at the same time;

[0009] The temperature control test bench ensures the constant water temperature on the table through a numerically controlled constant temperature water circulation box, and can adapt to solar cells of various sizes to complete reverse bias testing, solar cell dark characteristic testing, EL defect testing, and solar cell light characteristic testing on the temperature control test bench.

[0010] Preferably, the test darkroom uses reflectors, light shutters, and paint to ensure that the solar cells are in a light-free space during the electrical performance test.

[0011] Preferably, when the test cell is a stacked solar cell, the temperature control test bench is also used to test the forward performance and reverse performance of the diode.

[0012] Preferably, the temperature control test bench adjusts and controls the water temperature on the table to test the changes in electrical performance parameters of solar cells at different temperatures, thereby obtaining the temperature characteristics of the solar cells.

[0013] Preferably, the system also includes an automatic feeding module, an optical positioning device, a QR code reader, a data collector, an automatic grading module, a transmission module, and a light gate.

[0014] The automatic loading module is used to realize the automatic loading of solar cells.

[0015] Furthermore, the automatic loading module includes a multi-layer material rack, a material tray, a conveyor belt, and a four-axis robot. The material tray on the multi-layer material rack is extracted by the conveyor belt, and the four-axis robot is used to grab the solar cells to be tested on the material tray.

[0016] The optical positioning device is used to ensure the accuracy of the placement of the solar cell during the test process.

[0017] Furthermore, the optical positioning device includes an optical camera and an optical positioning platform. The optical camera is used to perform optical imaging of the solar cells on the optical positioning platform, and the optical compensation information obtained by comparing the imaging information with the target image is transmitted to the four-axis manipulator. After the four-axis manipulator grabs the solar cell, it accurately places the solar cell on the test bench according to the compensation value.

[0018] The two-dimensional code identifier is used to quickly identify the two-dimensional code information on the back of the solar cell and ensure accurate transmission and recording of relevant information.

[0019] The data collector is used to realize high-speed collection and transmission of solar cell electrical performance parameters.

[0020] The transmission module adopts a four-axis manipulator to grab the solar cells from the temperature-controlled test bench and put them into the grading and splicing positions.

[0021] The automatic grading module includes a multi-stage multi-layer material rack, a material tray, and a truss gripper. The truss gripper transmits the test results of the solar cells from the grading splicing position to the corresponding material tray on the material rack.

[0022] Furthermore, the multi-stage and multi-layer material rack adopts a drawer-type grading design, which can achieve the maximum number of gradings.

[0023] The light gate realizes automatic switching of the light source in the test darkroom through an automatic motor according to a control command.

[0024] The present invention also provides a solar cell IV / EL in-situ integrated automatic testing method, the method comprising the following steps:

[0025] S1: After the automatic test program is started, the automatic loading module extracts the trays on the multi-layer rack through the conveyor belt, and uses a four-axis manipulator to grab the solar cells to be tested on the trays. The multi-layer rack can hold no less than 8 trays;

[0026] S2: The four-axis manipulator grabs the solar cell and moves to the top of the two-dimensional code reader. The two-dimensional code reader 4 quickly recognizes the two-dimensional code information of the solar cell from bottom to top and enters the coding information of the solar cell. If there is a vacant space in the solar cell tray, the four-axis manipulator will automatically skip the vacant space;

[0027] S3: After completing the identification and entry of the solar cell QR code information, the four-axis manipulator places the solar cell in the optical positioning device and moves it away;

[0028] S4: The optical positioning device uses an optical camera to perform optical imaging on the solar cells on the optical positioning platform, and transmits the optical compensation information obtained by comparing the imaging information with the target image to the four-axis manipulator. The four-axis manipulator grabs the solar cells and automatically compensates for the positioning deviation parameters, and accurately places the solar cells on the temperature control test bench at the splicing position. The temperature control test bench opens the vacuum control valve to firmly absorb the solar cells.

[0029] S5: The temperature-controlled test bench moves to the test position in the test darkroom 1 by means of an automatic motor carrying the solar cell, and at this time, the test probe is pressed down to contact the solar cell;

[0030] S6: The solar cells on the temperature control test bench are sequentially subjected to solar cell reverse bias, solar cell dark characteristics, bright field test, and EL defect detection, and then the electrical performance parameters are collected and transmitted through the data acquisition device; if the test cell is a stacked solar cell, the temperature control test bench can also test the forward performance and reverse performance of the bypass diode thereon, and the items and test sequence of the solar cell test can be adjusted as needed; the temperature control test bench adjusts and controls the table water temperature to test the changes in the electrical performance parameters of the solar cell at different temperatures, thereby obtaining the temperature characteristics of the solar cell;

[0031] S7: After the electrical performance test of the solar cell is completed, the automatic motor moves the temperature control test bench from the test position to the splicing position, and the four-axis robot moves the solar cell to the grading splicing position, and then grabs the next solar cell on the optical positioning platform and moves it to the temperature control test bench at the splicing position for the next round of testing; the solar cell transported to the grading splicing position is transferred from the grading splicing position to the corresponding material tray on the material rack by the truss gripper of the automatic grading module according to the test results; the four-axis robot can also place the tested solar cell directly in its original position on the loading tray.

[0032] Compared with the prior art, the present invention has the following beneficial effects:

[0033] (1) The solar cell testing process is fully automated, reducing the debris and erroneous binning that may be caused by human operation.

[0034] (2) During the test, the solar cell is clamped only once, which reduces the damage to the surface of the solar cell electrode caused by the test probe.

[0035] (3) Multiple tests are completed at the same location, eliminating the need to transfer samples between different devices. This reduces production test steps, shortens the test cycle, and improves test efficiency. Performing multiple performance tests at one time is also beneficial for comparing test data.

[0036] (4) The temperature control test bench has high temperature control accuracy and can measure the changes in the electrical performance parameters of solar cells at different temperatures, which is conducive to the study of the temperature characteristics of solar cells. BRIEF DESCRIPTION OF THE DRAWINGS

[0037] In order to more clearly illustrate the technical solution of the embodiment of the present invention, the following briefly introduces the drawings required for describing the embodiment. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0038] Figure 1 A schematic diagram of a solar cell IV / EL in-situ integrated automatic testing system provided by the present invention.

[0039] Figure numerals: 1. test darkroom, 2. automatic loading module, 3. optical positioning device, 4. QR code reader, 5. data collector, 6. temperature control test bench, 7. automatic grading module, 8. transmission module, 9. optical shutter. DETAILED DESCRIPTION

[0040] The specific implementation of the present invention will be further described below in conjunction with the accompanying drawings.

[0041] like Figure 1As shown, the solar cell IV / EL in-situ integrated automatic testing system provided by the present invention comprises a testing darkroom 1 and a temperature-controlled testing platform 6, wherein:

[0042] The test darkroom 1 is used to prevent the solar cells from being affected by surrounding stray light during the electrical performance test, and the test darkroom 1 adopts a special optical path design to ensure that the solar cells can complete IV bright field test, dark field test, reverse bias and EL test at the same position at the same time; the test darkroom 1 uses reflectors, light gates 9, and paint to ensure that the solar cells are in a light-free space during the electrical performance test.

[0043] The temperature control test bench 6 ensures the constant water temperature of the table through a numerically controlled constant temperature water circulation box, and can adapt to solar cells of various sizes and specifications to complete reverse bias test, solar cell dark characteristic test, EL defect test, and solar cell light characteristic test on the temperature control test bench 6. If the test cell is a laminated solar cell, the temperature control test bench 6 can also test the forward performance and reverse performance of the bypass diode thereon. The temperature control test bench 6 adjusts and controls the table water temperature to test the changes in the electrical performance parameters of the solar cell at different temperatures, thereby obtaining the temperature characteristics of the solar cell.

[0044] The system also includes an automatic feeding module 2, an optical positioning device 3, a two-dimensional code recognizer 4, a data collector 5, an automatic grading module 7, a transmission module 8, and a light gate 9, wherein:

[0045] The automatic loading module 2 is used to realize automatic loading of solar cells. The automatic loading module 2 includes a multi-layer material rack, a material tray, a conveyor belt, and a four-axis manipulator. The conveyor belt extracts the material tray on the multi-layer material rack, and the four-axis manipulator grabs the solar cell to be tested on the material tray.

[0046] The optical positioning device 3 is used to ensure the accuracy of the placement of the solar cell during the test. The optical positioning device 3 includes an optical camera and an optical positioning platform. The optical camera is used to perform optical imaging of the solar cell on the optical positioning platform, and the optical compensation information obtained after comparing the imaging information with the target image is transmitted to the four-axis manipulator. After the four-axis manipulator grabs the solar cell, it accurately places the solar cell on the test bench according to the compensation value.

[0047] The two-dimensional code identifier 4 is used to quickly identify the two-dimensional code information on the back of the solar cell and ensure accurate transmission and recording of relevant information.

[0048] The data collector 5 is used to realize high-speed collection and transmission of the electrical performance parameters of the solar cell.

[0049] The transmission module 8 uses a four-axis manipulator to grab the solar cells from the temperature control test bench 6 and place them in the step-by-step splicing position.

[0050] The automatic grading module 7 includes a multi-stage multi-layer material rack, a material tray, and a truss gripper, through which the test results of the solar cells are transferred from the grading splicing position to the corresponding material tray on the material rack. The multi-stage multi-layer material rack adopts a drawer-type grading design, which can achieve the maximum number of grading.

[0051] The light shutter 9 realizes automatic switching of the light source in the test darkroom 1 according to control commands through an automatic motor.

[0052] In this embodiment, the working process of the solar cell IV / EL in-situ integrated automatic testing system is as follows:

[0053] S1: After the automatic test program is started, the automatic loading module 2 extracts the trays on the multi-layer rack through the conveyor belt, and uses a four-axis manipulator to grab the solar cells to be tested on the trays. The multi-layer rack can hold no less than 8 trays;

[0054] S2: The four-axis manipulator grabs the solar cell and moves to the top of the two-dimensional code recognizer 4. The two-dimensional code recognizer 4 quickly recognizes the two-dimensional code information of the solar cell from bottom to top and enters the coding information of the solar cell. If there is a vacant space in the solar cell tray, the four-axis manipulator will automatically skip the vacant space;

[0055] S3: After completing the identification and entry of the solar cell QR code information, the four-axis manipulator places the solar cell on the optical positioning device 3 and moves it away;

[0056] S4: The optical positioning device 3 performs optical imaging of the solar cell on the optical positioning platform through an optical camera, and transmits the optical compensation information obtained after comparing the imaging information with the target image to the four-axis manipulator, which grabs the solar cell and automatically compensates for the positioning deviation parameters, and accurately places the solar cell on the temperature control test bench 6 located at the splicing position, and the temperature control test bench 6 opens the vacuum control valve to firmly absorb the solar cell;

[0057] S5: The temperature-controlled test bench 6 is driven by an automatic motor to carry the solar cell to the test position in the test darkroom 1, and the test probe is pressed down to contact the solar cell;

[0058] S6: The solar cells on the temperature control test bench 6 are sequentially subjected to solar cell reverse bias, solar cell dark characteristics, bright field test, and EL defect detection, and then the electrical performance parameters are collected and transmitted through the data acquisition device 5; if the test cell is a laminated solar cell, the temperature control test bench 6 can also test the forward performance and reverse performance of the bypass diode thereon, and the items and test sequence of the solar cell test can be adjusted as needed; the temperature control test bench 6 adjusts and controls the table water temperature to test the changes in the electrical performance parameters of the solar cell at different temperatures, thereby obtaining the temperature characteristics of the solar cell;

[0059] S7: After the electrical performance test of the solar cell is completed, the automatic motor moves the temperature control test bench 6 from the test position to the splicing position, and the four-axis manipulator moves the solar cell to the grading splicing position, and then grabs the next solar cell on the optical positioning platform and moves it to the temperature control test bench 6 located at the splicing position for the next round of testing; the solar cell transported to the grading splicing position is transferred from the grading splicing position to the corresponding material tray on the material rack by the truss gripper of the automatic grading module 7 according to the test results; the four-axis manipulator can also place the tested solar cell directly in its original position in the loading tray.

[0060] The above specific implementation modes are used to illustrate the present invention. Any modifications and changes made to the present invention within the spirit of the present invention and the protection scope of the claims shall fall within the protection scope of the present invention.

Claims

1. A solar cell IV / EL in-situ integrated automatic testing system, characterized in that: The system comprises a test darkroom (1) and a temperature-controlled test bench (6), wherein: The test darkroom (1) is used to prevent the solar cell from being affected by surrounding stray light during the electrical performance test; The test darkroom (1) adopts a special optical path design, which can ensure that the solar cell can complete IV bright field test, dark field test, reverse bias and EL test at the same position at the same time; The temperature control test bench (6) ensures the constant water temperature of the table surface through a numerically controlled constant temperature water circulation box, and can adapt to solar cells of various sizes and specifications to complete reverse bias testing, solar cell dark characteristic testing, EL defect testing, and solar cell light characteristic testing on the temperature control test bench (6).

2. The solar cell IV / EL in-situ integrated automatic testing system according to claim 1 is characterized in that: The test darkroom (1) uses a reflector, a light shutter (9) and paint to ensure that the solar cell is in a light-free space during the electrical performance test.

3. The solar cell IV / EL in-situ integrated automatic testing system according to claim 1 is characterized in that: When the test cell is a stacked solar cell, the temperature control test bench (6) can also be used to test the forward performance and reverse performance of the diode.

4. The solar cell IV / EL in-situ integrated automatic testing system according to claim 1 is characterized in that: The temperature control test bench (6) tests the changes in the electrical performance parameters of the solar cells at different temperatures by adjusting and controlling the water temperature on the table, thereby obtaining the temperature characteristics of the solar cells.

5. The solar cell IV / EL in-situ integrated automatic testing system according to claim 1 is characterized in that: The system further comprises an automatic feeding module (2), an optical positioning device (3), a two-dimensional code recognizer (4), a data collector (5), an automatic grading module (7), a transmission module (8), and an optical shutter (9), wherein: The automatic loading module (2) is used to realize automatic loading of solar cells; The optical positioning device (3) is used to ensure the accuracy of the placement of the solar cell during the test; The two-dimensional code identifier (4) is used to quickly identify the two-dimensional code information on the back of the solar cell and ensure accurate transmission and recording of relevant information; The data collector (5) is used to realize high-speed collection and transmission of solar cell electrical performance parameters; The transmission module (8) uses a four-axis manipulator to grab the solar cells from the temperature control test bench (6) and place them in the grading and splicing positions; The automatic grading module (7) comprises a multi-stage multi-layer material rack, a material tray, and a truss gripper, and the truss gripper is used to transfer the test results of the solar cells from the grading splicing position to the corresponding material tray on the material rack; The light shutter (9) realizes automatic switching of the light source in the test darkroom (1) according to control commands through an automatic motor.

6. The solar cell IV / EL in-situ integrated automatic testing system according to claim 5 is characterized in that: The automatic loading module (2) comprises a multi-layer material rack, a material tray, a conveyor belt, and a four-axis manipulator. The material tray on the multi-layer material rack is extracted by the conveyor belt, and the solar cell to be tested on the material tray is grasped by the four-axis manipulator.

7. The solar cell IV / EL in-situ integrated automatic testing system according to claim 5, characterized in that: The optical positioning device (3) comprises an optical camera and an optical positioning platform. The optical camera is used to perform optical imaging on the solar cell on the optical positioning platform and transmit optical compensation information obtained by comparing the imaging information with the target image to a four-axis manipulator. After the four-axis manipulator grabs the solar cell, it accurately places the solar cell on the test bench according to the compensation value.

8. The solar cell IV / EL in-situ integrated automatic testing system according to claim 5, characterized in that: The multi-stage and multi-layer material rack adopts a drawer-type grading design, which can achieve a maximum number of gradings.

9. A solar cell IV / EL in-situ integrated automatic testing method, characterized in that: The test method comprises the following steps: S1: After the automatic test program is started, the automatic loading module (2) extracts the material tray on the multi-layer material rack through the conveyor belt, and uses a four-axis manipulator to grab the solar cells to be tested on the material tray. The multi-layer material rack can hold no less than 8 material trays; S2: The four-axis manipulator grabs the solar cell and moves to the top of the two-dimensional code recognizer (4). The two-dimensional code recognizer (4) quickly recognizes the two-dimensional code information of the solar cell from bottom to top and enters the coding information of the solar cell. If there is a vacant space in the solar cell tray, the four-axis manipulator will automatically skip the vacant space. S3: After completing the identification and entry of the solar cell QR code information, the four-axis manipulator places the solar cell on the optical positioning device (3) and moves it away; S4: The optical positioning device (3) uses an optical camera to perform optical imaging on the solar cell on the optical positioning platform, and transmits the optical compensation information obtained by comparing the imaging information with the target image to the four-axis manipulator. The four-axis manipulator grabs the solar cell and automatically compensates for the positioning deviation parameters, and accurately places the solar cell on the temperature control test bench (6) located at the splicing position. The temperature control test bench (6) opens the vacuum control valve to firmly absorb the solar cell. S5: The temperature-controlled test bench (6) is driven by an automatic motor to carry the solar cell to the test position in the test darkroom 1, and the test probe is pressed down to contact the solar cell; S6: The solar cells on the temperature control test bench (6) are subjected to reverse bias, dark characteristics, bright field test, and EL defect detection in sequence, and then the electrical performance parameters are collected and transmitted through the data acquisition device (5); if the test cell is a stacked solar cell, the temperature control test bench (6) can also test the forward performance and reverse performance of the bypass diode thereon, and the items and test sequence of the solar cell test can be adjusted as required; the temperature control test bench (6) tests the changes in the electrical performance parameters of the solar cell at different temperatures by adjusting and controlling the water temperature on the table, thereby obtaining the temperature characteristics of the solar cell; S7: After the solar cell electrical performance test is completed, the automatic motor moves the temperature control test bench (6) from the test position to the splicing position, and the four-axis manipulator moves the solar cell to the grading splicing position, and then grabs the next solar cell on the optical positioning platform and moves it to the temperature control test bench (6) located at the splicing position for the next round of testing; the solar cell transported to the grading splicing position is transferred from the grading splicing position to the corresponding material tray on the material rack according to the test results by the truss gripper of the automatic grading module (7); the four-axis manipulator can also directly place the tested solar cell in its original position on the loading tray.

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