Display device

Abstract

The display device may include: a display layer, displaying an image; and a sensor layer, arranged on the display layer, the display layer including: a base layer, defining a first area and a second area adjacent to the first area; a plurality of pixels, arranged in the first area of ​​the base layer and including a cathode; and a power electrode, arranged in the second area of ​​the base layer and connected to the cathode, the sensor layer including a plurality of sensing electrodes and a check line overlapping a connection area connected to the cathode and the power electrode.

Description

Technical Field

[0001] The present invention relates to a display device with improved reliability. Background Art

[0002] Multimedia electronic devices such as televisions, mobile phones, tablet computers, navigation devices, and game consoles have display devices for displaying images. In addition to common input methods such as buttons, keyboards, and mice, the display device may have a sensor layer that can provide a touch-based input method so that users can input information or commands intuitively and conveniently. Summary of the invention

[0003] An object of the present invention is to provide a display device with improved reliability.

[0004] It can be that a display device according to an embodiment of the present invention includes: a display layer, displaying an image; and a sensor layer, arranged on the display layer, the display layer includes: a base layer, defining a first area and a second area adjacent to the first area; a plurality of pixels, arranged in the first area of ​​the base layer and including a cathode; and a power electrode, arranged in the second area of ​​the base layer and connected to the cathode, the sensor layer includes a plurality of sensing electrodes and a check line overlapping a connection area where the cathode and the power electrode are connected.

[0005] It may be that the connection area surrounds at least a portion of the first area.

[0006] The inspection line may be provided in plurality, and the plurality of inspection lines may include a first inspection line overlapping the connection area and a second inspection line overlapping the connection area.

[0007] The first inspection line and the second inspection line may be separated from each other via the first region.

[0008] It may be that, when viewed on a plane, the first inspection line surrounds at least a portion of the first region, and the second inspection line is separated from the first region via the first inspection line.

[0009] The inspection line may have the same width as the contact area.

[0010] It may be that the width of the inspection line is smaller than the width of the connection area.

[0011] It may be that the width of the inspection line is greater than the width of the connection area.

[0012] The inspection line may be provided in plurality, each of the plurality of inspection lines extends in a first direction, and the plurality of inspection lines are arranged along a second direction intersecting the first direction.

[0013] It may be that the connection area is provided in plurality, the inspection line is provided in plurality, and the plurality of inspection lines overlap with the plurality of connection areas in a one-to-one correspondence.

[0014] It may be that the power electrode includes: a first electrode layer; a second electrode layer, arranged on the first electrode layer and connected to the first electrode layer; and a third electrode layer, arranged on the second electrode layer and connected to the second electrode layer, and the cathode is in direct contact with the third electrode layer.

[0015] The inspection line may overlap with the third electrode layer.

[0016] It may be that a display device according to an embodiment of the present invention includes: a base layer, which defines a first area and a second area adjacent to the first area; a power supply electrode, which is arranged in the second area of ​​the base layer and receives a power supply voltage; a light-emitting element, which is arranged in the first area of ​​the base layer and includes an anode, a light-emitting layer arranged on the anode, and a cathode arranged on the light-emitting layer and electrically connected to the power supply electrode; and a check line, which overlaps with a connection area in contact with the cathode and the power supply electrode.

[0017] It may be that the power electrode includes: a first electrode layer; a second electrode layer, arranged on the first electrode layer and connected to the first electrode layer; and a third electrode layer, arranged on the second electrode layer and connected to the second electrode layer, and the cathode is in direct contact with the third electrode layer.

[0018] The third electrode layer may be arranged on the same layer as the anode and include the same material, and the inspection line may overlap with the third electrode layer.

[0019] The inspection line may be provided in plurality, and the plurality of inspection lines may include a first inspection line overlapping the connection area and a second inspection line overlapping the connection area.

[0020] The first inspection line and the second inspection line may be separated from each other via the first region.

[0021] It may be that, when viewed on a plane, the first inspection line surrounds at least a portion of the first region, and the second inspection line is separated from the first region via the first inspection line.

[0022] It may be that the connection area is provided in plurality, the inspection line is provided in plurality, and the plurality of inspection lines overlap with the plurality of connection areas in a one-to-one correspondence.

[0023] The display device may further include: a packaging layer covering the light emitting element, and the inspection line is arranged on the packaging layer.

[0024] As described above, the display device may include an inspection line. The inspection line may overlap with the connection area where the cathode (or common electrode) of the light-emitting element and the power electrode are connected. The inspection line can be used to check the connection state of the cathode and the power electrode. Subsequent processes can be performed based on the connection state of the cathode and the power electrode. For example, when the connection state is judged to be poor, a maintenance process is performed, or when it cannot be repaired, the next process is not performed and the process ends. Therefore, the degradation of touch performance caused by poor connection between the cathode and the power electrode can be prevented. As a result, the reliability of the display device can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 is a perspective view of a display device according to an embodiment of the present invention.

[0026] Figure 2 is a block diagram of a display device according to an embodiment of the present invention.

[0027] Figure 3 is a plan view of a display layer according to an embodiment of the present invention.

[0028] Figure 4 is a plan view of a sensor layer according to an embodiment of the present invention.

[0029] Figure 5a is a cross-sectional view of a display panel according to an embodiment of the present invention.

[0030] Figure 5b is a plan view of a cathode according to an embodiment of the present invention.

[0031] Figure 6 is a cross-sectional view of a display panel according to an embodiment of the present invention.

[0032] Figure 7 is a cross-sectional view of a display panel according to an embodiment of the present invention.

[0033] Figure 8 is a plan view of a sensor layer according to an embodiment of the present invention.

[0034] Fig. 9 is a cross-sectional view of a display panel according to an embodiment of the present invention.

[0035] Fig.10 FIG. 1 is a perspective view showing a partial structure of a display panel according to an embodiment of the present invention.

[0036] Fig.11FIG. 1 is a perspective view showing a partial structure of a display panel according to an embodiment of the present invention.

[0037] Fig.12 FIG. 1 is a perspective view showing a partial structure of a display panel according to an embodiment of the present invention.

[0038] (Explanation of Reference Numerals)

[0039] 1000: Display device 100: Display layer

[0040] 200: sensor layer ED: light emitting element

[0041] ES: Power electrode CE: Cathode

[0042] TL: Check line DETAILED DESCRIPTION

[0043] In this specification, when it is mentioned that a certain constituent element (or region, layer, part, etc.) is "on" another constituent element, "connected to" or "combined to" another constituent element, it means that the certain constituent element can be directly configured / connected / combined on another constituent element, or a third constituent element can be configured between them.

[0044] The same reference numerals refer to the same components. In addition, in the drawings, the thickness, proportion and size of the components are exaggerated for the effective description of the technical content. "And / or" includes all combinations that can be defined by the relevant components.

[0045] The terms "first", "second" and the like may be used to describe a variety of constituent elements, but the above constituent elements are not limited by the above terms. The above terms are only used for the purpose of distinguishing one constituent element from another constituent element. For example, without departing from the scope of the present invention, the first constituent element may be named as the second constituent element, and similarly, the second constituent element may be named as the first constituent element. As long as it is not clearly indicated as different in the context, a singular expression includes a plural expression.

[0046] In addition, terms such as “below”, “lower side”, “above”, and “upper side” are used to explain the relationship between components shown in the drawings. The above terms are relative concepts and are explained based on the directions shown in the drawings.

[0047] The terms "including" or "having" should be understood as being used to specify the existence of the features, numbers, steps, tasks, constituent elements, parts or their combinations recorded in the specification, and do not preclude the existence or additional possibilities of one or more other features or numbers, steps, tasks, constituent elements, parts or their combinations.

[0048] The terms "part" and "unit" refer to software components or hardware components that perform a specific function. Hardware components may include, for example, an FPGA (field-programmable gate array) or an ASIC (application-specific integrated circuit). Software components may refer to executable code and / or data used by executable code in an addressable storage medium. Therefore, software components may be, for example, object-oriented software components, class components, and job components, and may include processes, functions, attributes, steps, subroutines, program code segments, drivers, firmware, microcode, circuits, data, databases, data structures, tables, arrangements, or variables.

[0049] Unless otherwise defined, all terms (including technical terms and scientific terms) used in this specification have the same meanings as those generally understood by persons skilled in the art to which the present invention belongs. In addition, terms such as those defined in commonly used dictionaries should be interpreted as having the same meanings as those in the context of the relevant technology, and should not be interpreted as overly idealized or overly formalized meanings unless explicitly defined herein.

[0050] Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings.

[0051] Figure 1 is a perspective view of a display device 1000 according to an embodiment of the present invention.

[0052] Reference Figure 1 The display device 1000 may be a device activated by an electrical signal. For example, the display device 1000 may be a portable phone, a foldable portable phone, a notebook computer, a television, a tablet, a car navigation system, a game console, or a wearable device, but is not limited thereto. Figure 1 FIG. 1 exemplarily shows that the display device 1000 is a portable phone.

[0053] An active area 1000A and a peripheral area 1000NA may be defined in the display device 1000. The display device 1000 may display an image through the active area 1000A. The active area 1000A may include a surface defined by a first direction DR1 and a second direction DR2. The peripheral area 1000NA may surround the periphery of the active area 1000A.

[0054] The thickness direction of the display device 1000 may be aligned with a third direction DR3 crossing the first direction DR1 and the second direction DR2. Therefore, the front (or top) and back (or bottom) of the components constituting the display device 1000 may be defined based on the third direction DR3.

[0055] Figure 2 is a block diagram of a display device 1000 according to an embodiment of the present invention.

[0056] Reference Figure 2 The display device 1000 may include a display panel DP, a display driving unit 100C, a sensor driving unit 200C and a main driving unit 1000C. The display panel DP may include a display layer 100 and a sensor layer 200 disposed on the display layer 100.

[0057] The display layer 100 may be a structure that substantially generates an image. The display layer 100 may be a light-emitting display layer, for example, the display layer 100 may be an organic light-emitting display layer, an inorganic light-emitting display layer, an organic-inorganic light-emitting display layer, a quantum dot display layer, a micro-LED display layer, or a nano-LED display layer.

[0058] The sensor layer 200 may be disposed on the display layer 100. The sensor layer 200 may sense an external input 2000 applied from the outside. The external input 2000 may include all input members that can provide a change in capacitance. For example, the sensor layer 200 may sense not only an input caused by a passive type input member such as a user's body, but also an input caused by an active type input member that provides a driving signal.

[0059] The main driving unit 1000C may control the overall operation of the display device 1000. For example, the main driving unit 1000C may control the operation of the display driving unit 100C and the sensor driving unit 200C. The main driving unit 1000C may include at least one microprocessor and may also include a graphics controller. The main driving unit 1000C may be referred to as an application processor, a central processing unit, or a main processor.

[0060] The display driving unit 100C can drive the display layer 100. The display driving unit 100C can receive the image data RGB and the control signal D-CS from the main driving unit 1000C. The control signal D-CS may include various signals. For example, the control signal D-CS may include an input vertical synchronization signal, an input horizontal synchronization signal, a main clock, and a data enable signal. The display driving unit 100C may generate a vertical synchronization signal and a horizontal synchronization signal for controlling the timing of providing a signal to the display layer 100 according to the control signal D-CS.

[0061] The sensor driving part 200C may drive the sensor layer 200. The sensor driving part 200C may receive a control signal I-CS from the main driving part 1000C. The control signal I-CS may include a mode determination signal determining a driving mode of the sensor driving part 200C and a clock signal.

[0062] The sensor driving unit 200C can calculate the coordinate information of the input based on the signal received from the sensor layer 200, and provide the coordinate signal I-SS having the coordinate information to the main driving unit 1000C. The sensor driving unit 200C can calculate not only the coordinate information of the input generated by contacting the surface 1000SF of the display device 1000, but also the coordinate information of the input generated by being separated from the surface 1000SF. The input generated by being separated from the surface 1000SF can be referred to as a hovering input.

[0063] The main driving unit 1000C performs an operation corresponding to the user input according to the coordinate signal I-SS. For example, the main driving unit 1000C may operate the display driving unit 100C to display a new application image on the display layer 100 .

[0064] Figure 3 is a plan view of a display layer 100 according to an embodiment of the present invention.

[0065] Reference Figure 3 The display layer 100 includes a display device 1000 (refer to Figure 1 ) of the active region 1000A (refer to Figure 1 ) and the surrounding area 1000NA (refer to Figure 1 ) respectively correspond to the first area 100A and the second area 100NA. In this specification, "area / part and area / part correspond to each other" means overlapping, and is not limited to the same area.

[0066] The first area 100A may be an area activated by an electrical signal, and may be referred to as an active area. For example, the first area 100A may be an area where an image is displayed. The second area 100NA may surround the first area 100A. A driving circuit or a driving line for driving the first area 100A may be configured in the second area 100NA, and may be referred to as a peripheral area.

[0067] Figure 3 The plan view shown may show the state of the display layer 100 before assembly. During the assembly process, the display layer 100 may be bent so that the bending area BA defined in the second area 100NA has a predetermined curvature. Therefore, the parts configured up and down with the bending area BA as a reference may be configured to face each other.

[0068] The display layer 100 may include a base layer 100 - 1 , a plurality of pixels 110 , a plurality of signal lines 120 , 130 , 140 , a first power electrode 150 vdd , a second power electrode 150 vss , a plurality of display pads 160 , and a plurality of sensing pads 170 .

[0069] The base layer 100-1 may include a glass substrate, an organic / inorganic composite material substrate, a silicon substrate or a synthetic resin layer. The synthetic resin layer may include a thermosetting resin. The base layer 100-1 may have a multilayer structure. For example, the base layer 100-1 may also have a three-layer structure of a synthetic resin layer, an adhesive layer and a synthetic resin layer. In particular, the synthetic resin layer may be a polyimide resin layer, and its material is not particularly limited. The synthetic resin layer may include at least any one of acrylic resin, methacrylic resin, polyisoprene resin, vinyl resin, epoxy resin, polyurethane resin, cellulose resin, siloxane resin, polyamide resin and perylene resin.

[0070] A portion of the base layer 100 - 1 included in the first region 100A may also be referred to as a first region, and another portion of the base layer 100 - 1 included in the second region 100NA may also be referred to as a second region.

[0071] The signal lines 120 , 130 , and 140 are connected to the pixels 110 to transmit electrical signals to the pixels 110 . Figure 3 The signal lines 120, 130, 140 are shown as data lines 120, scan lines 130, and power lines 140. However, this is shown as an example, and the signal lines 120, 130, 140 may also include at least one of an initialization voltage line and a light emitting control line, and are not limited to any one embodiment.

[0072] The pixel 110 may be arranged in the first region 100A. In this embodiment, an equivalent circuit diagram of one pixel 110 among a plurality of pixels is enlarged and exemplified.

[0073] The pixel 110 may include a first transistor TFT-S, a second transistor TFT-D, a capacitor CAP, and a light-emitting element ED. On the other hand, it is shown as an example, and the pixel 110 may include electronic components having various configurations and arrays, not limited to any one embodiment. For example, the pixel 110 may also have an equivalent circuit including seven transistors and a capacitor, and the equivalent circuit diagram of the pixel 110 may be deformed into various forms.

[0074] The first transistor TFT-S may be a switching transistor controlling on-off of the pixel 110. The first transistor TFT-S may be a driving transistor transmitting or blocking a data signal transmitted through the data line 120 in response to a scan signal transmitted through the scan line 130.

[0075] The capacitor CAP may be connected to the first transistor TFT-S and the power line 140. The capacitor CAP may charge an amount of charge corresponding to a difference between a data signal transmitted from the first transistor TFT-S and a first power signal applied to the power line 140.

[0076] The second transistor TFT-D may be connected to the first transistor TFT-S, the capacitor CAP, and the light emitting element ED. The second transistor TFT-D may control the driving current flowing to the light emitting element ED corresponding to the amount of charge stored in the capacitor CAP. The on-time of the second transistor TFT-D may be determined according to the amount of charge charged to the capacitor CAP. The second transistor TFT-D may provide the first power signal (or referred to as the first power voltage, ELVDD voltage) transmitted through the power line 140 during the on-time to the light emitting element ED.

[0077] The light emitting element ED may generate light or control the amount of light according to an electrical signal. For example, the light emitting element ED may include an organic light emitting element, a quantum dot light emitting element, a micro LED light emitting element, or a nano LED light emitting element.

[0078] The node ND electrically connected to the light emitting element ED may receive a second power signal (or referred to as a second power voltage, ELVSS voltage). The second power signal may have a level different from that of the first power signal. A driving current corresponding to the difference between the electrical signal provided by the second transistor TFT-D and the second power signal may flow through the light emitting element ED, and the light emitting element ED generates light corresponding to the driving current.

[0079] The first power electrode 150vdd may be disposed in the second region 100NA. The first power electrode 150vdd may be electrically connected to the power line 140. Figure 3 One power line 140 is shown in the figure, but the power line 140 may be provided in plurality, and all of the plurality of power lines 140 may be electrically connected to the first power electrode 150vdd.

[0080] The second power electrode 150vss and the power electrode ES electrically connected to the second power electrode 150vss may be arranged in the second area 100NA. The power electrode ES may surround at least a portion of the first area 100A. The node ND electrically connected to the light emitting element ED may be electrically connected to the power electrode ES. For example, the cathode of the light emitting element ED (or referred to as a common electrode) may be directly connected to the power electrode ES. The second power signal may be provided to the second power electrode 150vss and the power electrode ES. The cathode of the light emitting element ED may be electrically connected to the second power electrode 150vss and the power electrode ES to receive the second power signal.

[0081] The display pad 160 may include a first pad 161, a second pad 162, and a third pad 163. The first pad 161 may be provided in plurality and connected to the data line 120 respectively. The second pad 162 may be electrically connected to the power line 140 through the first power electrode 150vdd. The second pad 162 may be a part of the first power electrode 150vdd. The third pad 163 may be electrically connected to the light emitting element ED through the second power electrode 150vss. The third pad 163 may be a part of the second power electrode 150vss.

[0082] The display layer 100 may provide an electrical signal provided from the outside through the display pad 160 to the pixel 110. On the other hand, the display pad 160 may further include pads for receiving other electrical signals in addition to the first pad 161, the second pad 162 and the third pad 163, without being limited to any one embodiment.

[0083] The plurality of sensing pads 170 may be electrically connected to sensing electrodes of the sensor layer 200 described later. Some sensing pads and other sensing pads among the plurality of sensing pads 170 may be separated and arranged via the display pad 160. However, the arrangement relationship between the sensing pad 170 and the display pad 160 is not limited thereto, and may be modified in various ways.

[0084] The driving chip 190 may be mounted on the second area 100NA of the display layer 100. The driving chip 190 may be a data driving circuit in the form of a chip. However, this is exemplary, and the driving chip 190 may be mounted on a film different from the display layer 100. At this time, the driving chip 190 may also be electrically connected to the display pad 160 through the film.

[0085] Figure 4 is a plan view of a sensor layer 200 according to an embodiment of the present invention.

[0086] Reference Figure 4 The sensor layer 200 includes the display device 1000 (refer to Figure 1 ) of the active region 1000A (refer to Figure 1 ) and the surrounding area 1000NA (refer to Figure 1 ) respectively correspond to the first area 200A and the second area 200NA. The first area 200A may be an area activated according to an electrical signal. For example, the first area 200A may be an area for sensing input, which may be referred to as a sensing area. The second area 200NA may surround the first area 200A.

[0087] The sensor layer 200 may include a base insulating layer 200-1, a first sensing electrode 210, a second sensing electrode 220, a sensing line 230, and a check line TL. The first sensing electrode 210 and the second sensing electrode 220 may be arranged in the first area 200A, and the sensing line 230 and the check line TL may be arranged in the second area 200NA. Information on external input may be obtained through changes in mutual capacitance between the first sensing electrode 210 and the second sensing electrode 220.

[0088] The first sensing electrodes 210 may be arranged along the first direction DR1, and each of the first sensing electrodes 210 may extend along the second direction DR2. The first sensing electrodes 210 may include first sensing patterns 211 and first connection patterns 212. The first connection patterns 212 may electrically connect two first sensing patterns 211 adjacent to each other. The two first sensing patterns 211 adjacent to each other may be connected to each other through the two first connection patterns 212, but are not limited thereto.

[0089] Each of the second sensing electrodes 220 may extend along the first direction DR1, and the second sensing electrodes 220 may be arranged along the second direction DR2. The second sensing electrode 220 may include a second sensing pattern 221 and a second connection pattern 222. Two first connection patterns 212 and one second connection pattern 222 may be insulated and cross each other. The second sensing pattern 221 and the second connection pattern 222 included in one second sensing electrode 220 may have an integral shape connected to each other. Therefore, the second sensing pattern 221 may be referred to as a first portion, and the second connection pattern 222 may be referred to as a second portion.

[0090] Figure 4 The shapes and arrangement relationship of the first sensing electrodes 210 and the second sensing electrodes 220 shown in the figure are only shown as an example. The shapes and arrangement relationship of the first sensing electrodes 210 and the second sensing electrodes 220 constituting the sensor layer 200 are not limited to Figure 4 The situation shown.

[0091] The sensing line 230 and the inspection line TL can be connected to the sensing pad 170 (see Figure 3 )Electrical connection.

[0092] The sensing line 230 may include a first sensing line 231 and a second sensing line 232. The first sensing line 231 may be electrically connected to the first sensing electrode 210, respectively. The second sensing line 232 may be electrically connected to the second sensing electrode 220, respectively. It may be that a portion of the second sensing line 232 is connected to the left side of a portion of the second sensing electrode 220, and another portion of the second sensing line 232 is connected to the right side of another portion of the second sensing electrode 220. However, the connection relationship between the first sensing line 231 and the first sensing electrode 210 and the connection relationship between the second sensing line 232 and the second sensing electrode 220 are not limited to Figure 4 Example shown.

[0093] The inspection line TL may surround at least a portion of the first region 200A. The inspection line TL may be separated from the first region 200A by the sensing line 230. One end and the other end of the inspection line TL may be respectively connected to the corresponding sensing pad 170, but are not particularly limited thereto. For example, one end of the inspection line TL may be electrically connected to the corresponding sensing pad 170, and the other end may be floating.

[0094] When the light emitting element ED (refer to Figure 3 ) is not normally connected to the power supply electrode ES (refer to Figure 3 ), the cathode cannot properly shield the display layer 100 (refer to Figure 3 ) may affect the capacitance measured in the sensor layer 200. In this case, the sensor layer 200 may malfunction.

[0095] According to an embodiment of the present invention, the inspection line TL can be used to inspect whether the cathode of the light-emitting element ED and the power electrode ES are stably connected. Subsequent processes can be performed according to the connection state of the cathode and the power electrode ES. For example, when the connection state is judged to be poor, a repair process is performed, or when repair is not possible, the next process is not performed and the process ends. Therefore, the degradation of touch performance caused by poor connection between the cathode and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0096] Figure 5a is a cross-sectional view of a display panel DP according to an embodiment of the present invention. Figure 5b is a plan view of a cathode according to an embodiment of the present invention. Figure 5a It includes Figure 3 The cross section of the display layer 100 taken along the II' section line and the Figure 4 The cross-sectional view of the display panel DP is shown as a cross-sectional view of the sensor layer 200 taken along line II′.

[0097] Reference Figure 3 , Figure 4 as well as Figure 5a The display panel DP may include a display layer 100 and a sensor layer 200. The display layer 100 may include a base layer 100-1, a circuit layer 100-2, a light emitting element layer 100-3, and an encapsulation layer 100-4 sequentially arranged along a third direction DR3.

[0098] The buffer layer BFL may be disposed on the base layer 100 - 1 , and the second transistor TFT-D may be disposed on the buffer layer BFL. The second transistor TFT-D may include an active region ALD, a source region SED, a drain region DED, and a control electrode GED.

[0099] The active region ALD, the source region SED, and the drain region DED may be formed from the semiconductor pattern. The source region SED and the drain region DED may extend from the active region ALD in opposite directions to each other in a cross section.

[0100] Figure 5a Only a portion of the semiconductor pattern is shown, and semiconductor patterns may be further configured in other regions. The semiconductor pattern may be arranged in a specific rule across pixels. The electrical properties of the semiconductor pattern may be different depending on whether it is doped or not. The semiconductor pattern may include a first region with high conductivity and a second region with low conductivity. The first region may be doped with an N-type dopant or a P-type dopant. It may be that a P-type transistor includes a doped region doped with a P-type dopant, and an N-type transistor includes a doped region doped with an N-type dopant. The second region may be a non-doped region or a region doped with a lower concentration than the first region.

[0101] The conductivity of the first region may be greater than that of the second region, and may substantially function as an electrode or a signal line. The second region may substantially correspond to an active region (or channel) of a transistor. In other words, a portion of the semiconductor pattern may be an active region ALD of a transistor, another portion may be a source region SED or a drain region DED of a transistor, and yet another portion may be a connecting electrode or a connecting signal line.

[0102] The active region ALD, the source region SED, and the drain region DED may be disposed on the buffer layer BFL. The buffer layer BFL may provide a modified surface for the semiconductor pattern. At this time, the semiconductor pattern may have a high adhesion to the buffer layer BFL compared to the case where it is directly formed on the base layer 100-1. Alternatively, the buffer layer BFL may be a barrier layer protecting the bottom of the semiconductor pattern. At this time, the buffer layer BFL may block the contamination or moisture generated by the base layer 100-1 itself or flowing through the base layer 100-1 from penetrating into the semiconductor pattern.

[0103] The first insulating layer 10 may be disposed on the buffer layer BFL. The first insulating layer 10 may overlap a plurality of pixels together and cover the semiconductor pattern. The first insulating layer 10 may be an inorganic layer and / or an organic layer, and may have a single-layer or multi-layer structure. The first insulating layer 10 may include at least one of aluminum oxide, titanium oxide, silicon oxide, silicon nitride, silicon oxynitride, zirconium oxide, and hafnium oxide. In the present embodiment, the first insulating layer 10 may be a single-layer silicon oxide layer. Not only the first insulating layer 10, but also the insulating layer of the circuit layer 100-2 described later may be an inorganic layer and / or an organic layer, and may have a single-layer or multi-layer structure. The inorganic layer may include at least one of the above-mentioned substances, but is not limited thereto.

[0104] The control electrode GED is disposed on the first insulating layer 10. The control electrode GED may be a part of the metal pattern. The control electrode GED overlaps the active region ALD. The control electrode GED may function as a mask in the process of doping the semiconductor pattern.

[0105] The second insulating layer 20 may be disposed on the first insulating layer 10 and cover the control electrode GED. The second insulating layer 20 may overlap the pixel together. The second insulating layer 20 may be an inorganic layer and / or an organic layer and may have a single layer or a multilayer structure. The second insulating layer 20 may include at least one of silicon oxide, silicon nitride and silicon oxynitride. In the present embodiment, the second insulating layer 20 may have a multilayer structure including a silicon oxide layer and a silicon nitride layer.

[0106] The third insulating layer 30 may be disposed on the second insulating layer 20. The third insulating layer 30 may have a single layer or a multi-layer structure. For example, the third insulating layer 30 may have a multi-layer structure including a silicon oxide layer and a silicon nitride layer.

[0107] The first connection electrode CNE1 may be disposed on the third insulating layer 30. The first connection electrode CNE1 may be electrically connected to the second transistor TFT-D through a contact hole penetrating the first, second, and third insulating layers 10, 20, and 30.

[0108] The fourth insulating layer 40 may be disposed on the third insulating layer 30. The fourth insulating layer 40 may be an organic layer. The second connection electrode CNE2 may be disposed on the fourth insulating layer 40. The second connection electrode CNE2 may be connected to the first connection electrode CNE1 through a contact hole penetrating the fourth insulating layer 40. The fifth insulating layer 50 may be disposed on the fourth insulating layer 40. The fifth insulating layer 50 may be an organic layer.

[0109] The circuit layer 100 - 2 may further include a first driving circuit DC1 and a second driving circuit DC2 . The first driving circuit DC1 and the second driving circuit DC2 may include a plurality of thin film transistors formed by the same process as the driving circuit of the pixel. Figure 5a In the example, the first driving circuit DC1 and the second driving circuit DC2 are configured in the second area 100NA, but the present invention is not particularly limited thereto. For example, in order to reduce the width of the second area 100NA, at least a portion of the first driving circuit DC1 and the second driving circuit DC2 may also be configured in the first area 100A.

[0110] The circuit layer 100-2 may also include a portion of the power electrode ES. The power electrode ES may be configured in the second region 100NA. The power electrode ES may include a first electrode layer ES1, a second electrode layer ES2 configured on the first electrode layer ES1 and connected to the first electrode layer ES1, and a third electrode layer ES3 configured on the second electrode layer ES2 and connected to the second electrode layer ES2. For example, the first electrode layer ES1 may be configured on the same layer as the first connection electrode CNE1 and include the same substance. The second electrode layer ES2 may be configured on the same layer as the second connection electrode CNE2 and include the same substance. The third electrode layer ES3 may be configured on the same layer as the anode AE ​​described later and include the same substance. Therefore, the third electrode layer ES3 may be defined as being included in the light emitting element layer 100-3.

[0111] The first electrode layer ES1 may be disposed on the third insulating layer 30. A first opening GP1 exposing a portion of the first electrode layer ES1 may be defined in the fourth insulating layer 40. The second electrode layer ES2 may be disposed on the fourth insulating layer 40 and disposed in the first opening GP1. Therefore, the second electrode layer ES2 may be connected to the first electrode layer ES1 in the first opening GP1. The fifth insulating layer 50 may be disposed on the fourth insulating layer 40 and cover a portion of the second electrode layer ES2. A second opening GP2 exposing a portion of the second electrode layer ES2 may be defined in the fifth insulating layer 50. The third electrode layer ES3 may be connected to the second electrode layer ES2 in the second opening GP2.

[0112] In addition, the first and second dams DM1 and DM2 may be disposed in the second region 100NA. The first dam DM1 may be disposed on the second electrode layer ES2. Compared with the first dam DM1, the second dam DM2 may be further disposed on the outside. It is exemplarily shown that each of the first dam DM1 and the second dam DM2 has a two-layer structure, but the present invention is not limited thereto. For example, each of the first dam DM1 and the second dam DM2 may also include more than three layers, or may be composed of a single layer.

[0113] The lower portion of the first dam DM1 may be formed in the same process as the fifth insulating layer 50. Therefore, the lower portion of the first dam DM1 may have substantially the same thickness as the fifth insulating layer 50 and include the same substance. The upper portion of the first dam DM1 may be formed in the same process as the pixel defining film PDL. Therefore, the upper portion of the first dam DM1 may have substantially the same thickness as the pixel defining film PDL and include the same substance. In the present embodiment, the third electrode layer ES3 may be configured between the upper portion of the first dam DM1 and the lower portion of the first dam DM1. The third electrode layer ES3 may be adjacent to the first dam DM1 and contact a portion of the second electrode layer ES2 not covered by the first dam DM1.

[0114] The lower portion of the second dam DM2 may be formed in the same process as the fourth insulating layer 40. Therefore, the lower portion of the second dam DM2 may have substantially the same thickness as the fourth insulating layer 40 and include the same substance. The upper portion of the second dam DM2 may be formed in the same process as the fifth insulating layer 50. Therefore, the upper portion of the second dam DM2 may have substantially the same thickness as the fifth insulating layer 50 and include the same substance.

[0115] The light emitting element layer 100 - 3 may be disposed on the circuit layer 100 - 2 . The light emitting element layer 100 - 3 may include a light emitting element ED and a pixel definition layer PDL.

[0116] The light emitting element layer 100 - 3 may include organic light emitting materials, inorganic light emitting materials, organic-inorganic light emitting materials, quantum dots, quantum rods, micro LEDs or nano LEDs. In the following, the light emitting element ED is an organic light emitting element, but it is not particularly limited.

[0117] The light emitting element ED may include an anode AE, a light emitting layer EL, and a cathode CE. The anode AE ​​may be referred to as a first electrode or a pixel electrode, and the cathode CE may be referred to as a second electrode or a common electrode.

[0118] The anode AE ​​may be disposed on the fifth insulating layer 50. The anode AE ​​may be connected to the second connection electrode CNE2 through a contact hole penetrating the fifth insulating layer 50. Therefore, the anode AE ​​may be electrically connected to the second transistor TFT-D through the first and second connection electrodes CNE1 and CNE2. The anode AE ​​may include a single-layer or multi-layer structure. The anode AE ​​may include a plurality of layers including indium tin oxide (ITO) and silver (Ag). For example, the anode AE ​​may include a layer including ITO (hereinafter referred to as a "lower ITO layer"), a layer including Ag disposed on the lower ITO layer (hereinafter referred to as an "Ag layer"), and a layer including ITO disposed on the Ag layer.

[0119] The pixel defining film PDL may be disposed on the fifth insulating layer 50. An opening OP may be provided in the pixel defining film PDL. A portion of the anode AE ​​may be exposed through the opening OP. A light emitting layer EL may be disposed on the exposed anode AE. The light emitting layer EL includes a light emitting substance, and if an electrical signal is applied, it may be excited to generate light.

[0120] The cathode CE may be disposed on the light emitting layer EL and the pixel defining film PDL. The cathode CE may be disposed in the entire first region 100A and may extend toward the second region 100NA. The cathode CE may contact the power electrode ES to receive the second power signal. For example, the cathode CE may directly contact the third electrode layer ES3 of the power electrode ES. The region where the cathode CE and the third electrode layer ES3 are connected may be defined as a connection region CNT-A.

[0121] Reference Figure 5b , the cathode CE shows the first region 100A and the connection region CNT-A. The connection region CNT-A of the cathode CE may have a shape surrounding at least a portion of the first region 100A.

[0122] Reference Figure 5a , the encapsulation layer 100-4 may be disposed on the light emitting element layer 100-3. In another embodiment of the present invention, the light emitting element layer 100-3 may further include a covering layer disposed between the encapsulation layer 100-4 and the cathode CE and covering the cathode CE. In this case, the encapsulation layer 100-4 may directly cover the covering layer.

[0123] The encapsulation layer 100 - 4 may include a first inorganic layer 60 , an organic layer 70 , and a second inorganic layer 80 that are sequentially stacked. Figure 5a exemplarily shows that the encapsulation layer 100 - 4 includes two inorganic layers and one organic layer, but is not limited thereto. For example, the encapsulation layer 100 - 4 may also include three inorganic layers and two organic layers, and in this case, the inorganic layers and the organic layers may have an alternately stacked structure.

[0124] The first inorganic layer 60 may cover the light emitting element layer 100-3 and extend to the region where the first dam DM1 and the second dam DM2 are disposed. In order to control the flow of the organic substance to be coated on the first inorganic layer 60, the first inorganic layer 60 may be subjected to a hydrophobic or hydrophilic plasma treatment, but is not particularly limited thereto. The organic layer 70 may be disposed on the first inorganic layer 60. The organic layer 70 may be formed by evaporation, printing or coating of an organic substance. According to this embodiment, the second opening GP2 and the first dam DM1 and the second dam DM2 may prevent the liquid organic substance from overflowing. The second inorganic layer 80 may cover the organic layer 70.

[0125] In one embodiment of the present invention, the area where the cathode CE and the third electrode layer ES3 are connected, ie, the connection area CNT-A, may overlap all of the first inorganic layer 60 , the organic layer 70 , and the second inorganic layer 80 .

[0126] The sensor layer 200 may include a base insulating layer 200-1, a first conductive layer 200-2, an intermediate insulating layer 200-3, a second conductive layer 200-4, and a cover insulating layer 200-5. The sensor layer 200 may be formed through a continuous process after forming the display layer 100. However, it is not limited thereto.

[0127] The base insulating layer 200-1 may be directly disposed on the display layer 100. For example, the base insulating layer 200-1 may be in direct contact with the second inorganic layer 80. The base insulating layer 200-1 may have a single layer or a multi-layer structure. Alternatively, the base insulating layer 200-1 may be omitted.

[0128] Each of the first conductive layer 200-2 and the second conductive layer 200-4 may have a single-layer structure, or a multi-layer structure stacked along the third direction DR3. The conductive layer of the single-layer structure may include a metal layer or a transparent conductive layer. The metal layer may include molybdenum, silver, titanium, copper, aluminum, and alloys thereof. The transparent conductive layer may include transparent conductive oxides such as indium tin oxide (ITO), indium zinc oxide (IZO), zinc oxide (ZnO), and indium zinc tin oxide (IZTO). In addition, the transparent conductive layer may include conductive polymers such as PEDOT, metal nanowires, graphene, etc.

[0129] The conductive layer of the multilayer structure may include multiple metal layers. The multiple metal layers may have a three-layer structure of, for example, titanium / aluminum / titanium. The conductive layer of the multilayer structure may include at least one metal layer and at least one transparent conductive layer.

[0130] Each of the first conductive layer 200-2 and the second conductive layer 200-4 may include a pattern constituting a sensing electrode. Figure 4 , the first conductive layer 200-2 may include the first connection pattern 212, and the second conductive layer 200-4 may include the first sensing pattern 211, the second sensing pattern 221, and the second connection pattern 222. In addition, each of the first conductive layer 200-2 and the second conductive layer 200-4 may include the sensing line 230. For example, the first conductive layer 200-2 may include a portion of the sensing line 230, and the second conductive layer 200-4 may include another portion of the sensing line 230.

[0131] The intermediate insulating layer 200-3 may be disposed between the first conductive layer 200-2 and the second conductive layer 200-4 and cover the first conductive layer 200-2. A portion of the second conductive layer 200-4 may be electrically connected to a portion of the first conductive layer 200-2 via a contact hole penetrating the intermediate insulating layer 200-3. The cover insulating layer 200-5 may be disposed on the intermediate insulating layer 200-3 and cover the second conductive layer 200-4.

[0132] At least one of the intermediate insulating layer 200-3 and the capping insulating layer 200-5 may include an inorganic film. The inorganic film may include at least one of aluminum oxide, titanium oxide, silicon oxide, silicon oxynitride, zirconium oxide, and hafnium oxide.

[0133] At least one of the intermediate insulating layer 200-3 and the cover insulating layer 200-5 may include an organic film. The organic film may include at least one of acrylic resin, methacrylic resin, polyisoprene resin, vinyl resin, epoxy resin, polyurethane resin, cellulose resin, siloxane resin, polyimide resin, polyamide resin, and perylene resin.

[0134] In an embodiment of the present invention, at least any one of the first conductive layer 200 - 2 and the second conductive layer 200 - 4 may include an inspection line TL. Figure 5a In the example, the first conductive layer 200-2 includes the inspection line TL, but the present invention is not limited thereto. For example, the second conductive layer 200-4 may also include the inspection line TL, the inspection line TL has a multi-layer structure, and the inspection line TL may also include a first sub-layer included in the first conductive layer 200-2 and a second sub-layer electrically connected to the first sub-layer and included in the second conductive layer 200-4.

[0135] In one embodiment of the present invention, the inspection line TL may overlap with the connection area CNT-A. For example, the inspection line TL may be used to inspect whether the cathode CE of the light emitting element ED and the power electrode ES are stably connected. For example, if the capacitance measured by the inspection line TL is within the capacitance range that becomes the standard of qualified products, it can be determined that the cathode CE and the power electrode ES are stably connected. Alternatively, if the capacitance measured by the inspection line TL exceeds the capacitance range that becomes the standard of qualified products, it can be considered that the contact between the cathode CE and the power electrode ES is poor.

[0136] The subsequent process can be performed according to the connection state of the cathode CE and the power electrode ES. For example, when the connection state is judged to be bad, the repair process is performed, or when the repair is impossible, the next process is not performed and the process is ended. Therefore, the degradation of touch performance caused by the poor connection between the cathode CE and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0137] In one embodiment of the present invention, the width WT-1 of the inspection line TL and the width WT-2 of the contact region CNT-A may be substantially the same. The widths WT-1 and WT-2 may be the widths in the direction intersecting the extending direction of the inspection line TL or the widths in the direction parallel to the direction separating the inspection line TL and the first region 200A.

[0138] Figure 6 FIG. 1 is a cross-sectional view of a display panel DPa according to an embodiment of the present invention. Figure 6 When, for Figure 5a The same reference numerals are given to the structures described in the figure, and the description thereof is omitted.

[0139] The display panel DPa may include a display layer 100 and a sensor layer 200. The sensor layer 200 may include an inspection line TLa overlapping a turn-on region CNT-A where the cathode electrode CE and the power electrode ES are turned on.

[0140] In one embodiment of the present invention, the width WT-1a of the inspection line TLa may be greater than the width WT-2 of the connection area CNT-A. Therefore, even if there is a misalignment between the inspection line TLa and the connection area CNT-A, the inspection line TLa may overlap with the entirety of the connection area CNT-A. Therefore, the defect of the connection area CNT-A may be stably detected through the inspection line TLa. Predetermined measures may be taken for the detected defect. Therefore, the degradation of touch performance caused by the connection failure between the cathode CE and the power electrode ES may be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0141] Figure 7 FIG. 1 is a cross-sectional view of a display panel DPb according to an embodiment of the present invention. Figure 7 When, for Figure 5a The same reference numerals are given to the structures described in the figure, and the description thereof is omitted.

[0142] Reference Figure 7 , the display panel DPb may include a display layer 100 and a sensor layer 200. The sensor layer 200 may include an inspection line TLb overlapping a turn-on region CNT-A where the cathode electrode CE and the power electrode ES are turned on.

[0143] The width WT-1b of the check line TLb can be smaller than the width WT-2 of the connection area CNT-A. At this time, the check line TLb can be sufficiently separated from the sensing line 232. In addition, even if there is a misalignment between the check line TLb and the connection area CNT-A, the entirety of the check line TLb can overlap with the connection area CNT-A. Therefore, the check line TLb can be used to detect a defect in the connection area CNT-A. Predetermined measures can be taken for the detected defect. Therefore, a decrease in touch performance caused by poor connection between the cathode CE and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0144] Figure 8 is a plan view of a sensor layer 200 according to an embodiment of the present invention. Fig. 9 FIG. 4 is a cross-sectional view of a display panel DPc according to an embodiment of the present invention. Figure 8 as well as Fig. 9 When, for Figure 4 as well as Figure 5a The same reference numerals are given to the structures described in the figure, and the description thereof is omitted.

[0145] Reference Figure 8 as well as Fig. 9 , the sensor layer 200 may include an inspection line TLc. The inspection line TLc is provided in plurality, and the plurality of inspection lines TLc may include a first inspection line TL1, a second inspection line TL2, and a third inspection line TL3 overlapping the turn-on region CNT-A. Each of the first inspection line TL1, the second inspection line TL2, and the third inspection line TL3 may be spaced apart from each other in a direction intersecting the relative extension direction. Figure 8 as well as Fig. 9 Different from the example shown, two or more inspection lines TLc may be provided.

[0146] The first inspection line TL1 may surround at least a portion of the first region 200A, and the second inspection line TL2 may be separated from the first region 200A via the first inspection line TL1. The third inspection line TL3 may be separated from the first region 200A via the first and second inspection lines TL1 and TL2.

[0147] According to one embodiment of the present invention, the capacitance can be measured respectively through the first to third inspection lines TL1, TL2, and TL3. If at least one of the capacitances measured through the first to third inspection lines TL1, TL2, and TL3 exceeds the capacitance range that becomes a qualified product standard, it can be regarded that the contact between the cathode CE and the power electrode ES is poor. The location where the poor connection area CNT-A occurs can be detected by comparing the capacitances measured through the first to third inspection lines TL1, TL2, and TL3. Predetermined measures can be taken for the detected poor connection. Therefore, the degradation of touch performance caused by the poor connection between the cathode CE and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0148] Fig.10 1 is a perspective view showing a portion of a display panel according to an embodiment of the present invention. Fig.10 The cathode CE and the inspection line TLd are shown in FIG.

[0149] Reference Fig.10 , a turn-on region CNT-A may be defined in the cathode CE. The inspection line TLd may overlap the turn-on region CNT-A. The inspection line TLd may include a first inspection line TL1a and a second inspection line TL2a.

[0150] When observed on a plane, the first inspection line TL1a and the second inspection line TL2a can be separated from each other by the first area 100A. Each of the capacitors can be measured by the first and second inspection lines TL1a, TL2a. If at least one of the capacitances measured by the first and second inspection lines TL1a, TL2a exceeds the capacitance range that becomes a qualified product standard, it can be regarded that the contact between the cathode CE and the power electrode ES is poor. The location where the defect occurs in the connection area CNT-A can be detected by comparing the capacitances measured by the first and second inspection lines TL1a, TL2a. Predetermined measures can be taken for the detected defect. Therefore, a decrease in touch performance caused by poor connection between the cathode CE and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0151] Fig.11 1 is a perspective view showing a portion of a display panel according to an embodiment of the present invention. Fig.11 The cathode CE and the inspection line TLe are shown in FIG.

[0152] Reference Fig.11In the cathode CE, a plurality of connection regions CNT-A1, CNT-A2, CNT-A3, and CNT-A4 may be defined. In each of the connection regions CNT-A1, CNT-A2, CNT-A3, and CNT-A4, the cathode CE may be in direct contact with the power electrode ES (see Figure 5a ). The inspection line TLe may overlap with the contact areas CNT-A1, CNT-A2, CNT-A3, and CNT-A4 in a one-to-one correspondence.

[0153] In one embodiment of the present invention, the connection areas CNT-A1, CNT-A2, CNT-A3, CNT-A4 may include first to fourth connection areas CNT-A1, CNT-A2, CNT-A3, CNT-A4, and the inspection line TLe may include first to fourth inspection lines TL1b, TL2b, TL3b, TL4b.

[0154] Each of the capacitors can be measured by the first to fourth inspection lines TL1b, TL2b, TL3b, and TL4b. If at least one of the capacitors measured by the first to fourth inspection lines TL1b, TL2b, TL3b, and TL4b exceeds the capacitance range that becomes a qualified product standard, it can be considered that the contact between the cathode CE and the power electrode ES is poor. The location where the defect occurs in the connection area CNT-A1, CNT-A2, CNT-A3, and CNT-A4 can be detected by comparing the capacitance measured by the first to fourth inspection lines TL1b, TL2b, TL3b, and TL4b. Predetermined measures can be taken for the detected defect. Therefore, the degradation of touch performance caused by the poor connection between the cathode CE and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0155] Fig.12 FIG. 1 is a perspective view showing a partial structure of a display panel according to an embodiment of the present invention.

[0156] Reference Fig.12 In the cathode CE, a plurality of connection areas CNT-A1 and CNT-A2 may be defined. The inspection line TLf may overlap the connection areas CNT-A1 and CNT-A2 in a one-to-one correspondence. Alternatively, the connection areas CNT-A1 and CNT-A2 may include first and second connection areas CNT-A1 and CNT-A2, and the inspection line TLf may include first and second inspection lines TL1b and TL2b.

[0157] Each of the capacitors is measured by the first and second inspection lines TL1b and TL2b. If at least one of the capacitors exceeds the capacitance range that becomes a qualified product standard, it can be considered that the contact between the cathode CE and the power electrode ES is poor. The location where the defect occurs in the connection area CNT-A1 and CNT-A2 can be detected by comparing the capacitances measured by the first and second inspection lines TL1b and TL2b. Thereafter, predetermined measures can be taken for the detected defect. Therefore, the degradation of touch performance caused by the poor connection between the cathode CE and the power electrode ES can be prevented. As a result, the display device 1000 (refer to Figure 1 ) reliability.

[0158] As described above, the display device may include an inspection line. The inspection line may overlap with the connection area where the cathode (or common electrode) of the light-emitting element and the power electrode are connected. The inspection line can be used to check the connection state of the cathode and the power electrode. Subsequent processes can be performed based on the connection state of the cathode and the power electrode. For example, when the connection state is judged to be poor, a maintenance process is performed, or when it cannot be repaired, the next process is not performed and the process ends. Therefore, the degradation of touch performance caused by poor connection between the cathode and the power electrode can be prevented. As a result, the reliability of the display device can be improved.

[0159] The above description is made with reference to the preferred embodiments of the present invention, but it is understood by those skilled in the art or those with general knowledge in the art that various modifications and changes can be made to the present invention without exceeding the scope of the concept and technical field of the present invention recorded in the attached claims. Therefore, the technical scope of the present invention is not limited by the contents recorded in the detailed description of the specification, but should be limited by the scope of the claims.

Claims

1. A display device, wherein: include: Display layer, displaying images; as well as A sensor layer is arranged on the display layer. The display layer comprises: a base layer defining a first region and a second region adjacent to the first region; a plurality of pixels, arranged in the first region of the substrate layer and comprising a cathode; and a power supply electrode, arranged in the second region of the base layer and connected to the cathode, The sensor layer includes a plurality of sensing electrodes and an inspection line overlapping a connection area where the cathode and the power electrode are connected.

2. The display device according to claim 1, wherein: The access area surrounds at least a portion of the first area.

3. The display device according to claim 1, wherein: The inspection line is provided in plurality, and the plurality of inspection lines include a first inspection line overlapping the turn-on area and a second inspection line overlapping the turn-on area.

4. The display device according to claim 3, wherein: The first inspection line and the second inspection line are separated from each other via the first region.

5. The display device according to claim 3, wherein: When viewed on a plane, the first inspection line surrounds at least a portion of the first region, and the second inspection line is spaced apart from the first region via the first inspection line.

6. The display device according to claim 1, wherein: The width of the inspection line is the same as the width of the contact area.

7. The display device according to claim 1, wherein: The width of the inspection line is smaller than the width of the contact area.

8. The display device according to claim 1, wherein: The width of the inspection line is greater than the width of the contact area.

9. The display device according to claim 1, wherein: The inspection line is provided in plurality, each of the plurality of inspection lines extends in a first direction, and the plurality of inspection lines are arranged along a second direction intersecting the first direction.

10. The display device according to claim 1, wherein: The connection area is provided in plurality, the inspection line is provided in plurality, The plurality of inspection lines overlap with the plurality of contact areas in a one-to-one correspondence.

11. The display device according to claim 1, wherein: The power supply electrode comprises: a first electrode layer; a second electrode layer, disposed on the first electrode layer and connected to the first electrode layer; and A third electrode layer is disposed on the second electrode layer and is connected to the second electrode layer. The cathode is in direct contact with the third electrode layer.

12. The display device according to claim 11, wherein: The inspection line overlaps with the third electrode layer.

13. A display device, wherein: include: a base layer defining a first region and a second region adjacent to the first region; a power supply electrode, disposed in the second region of the base layer and receiving a power supply voltage; a light-emitting element, arranged in the first region of the base layer, and comprising an anode, a light-emitting layer arranged on the anode, and a cathode arranged on the light-emitting layer and electrically connected to the power electrode; as well as The inspection line overlaps with the contact area of ​​the cathode and the power electrode.

14. The display device according to claim 13, wherein: The power supply electrode comprises: a first electrode layer; a second electrode layer, disposed on the first electrode layer and connected to the first electrode layer; and A third electrode layer is disposed on the second electrode layer and is connected to the second electrode layer. The cathode is in direct contact with the third electrode layer.

15. The display device according to claim 14, wherein: The third electrode layer is disposed on the same layer as the anode and includes the same material, and the inspection line overlaps with the third electrode layer.

16. The display device according to claim 13, wherein: The inspection line is provided in plurality, and the plurality of inspection lines include a first inspection line overlapping the turn-on area and a second inspection line overlapping the turn-on area.

17. The display device according to claim 16, wherein: The first inspection line and the second inspection line are separated from each other via the first region.

18. The display device according to claim 16, wherein: When viewed on a plane, the first inspection line surrounds at least a portion of the first region, and the second inspection line is spaced apart from the first region via the first inspection line.

19. The display device according to claim 13, wherein: The connection area is provided in plurality, the inspection line is provided in plurality, The plurality of inspection lines overlap with the plurality of contact areas in a one-to-one correspondence.

20. The display device according to claim 13, wherein: The display device further includes: an encapsulation layer, covering the light emitting element, The inspection line is configured on the packaging layer.

Images