A stable chip test fixture and test equipment

Abstract

The present invention relates to the technical field of chip test fixtures, and particularly to a stable chip test fixture and test equipment, including multiple sets of fixture bodies. A storage cavity is formed on the side of the fixture body, and a waste box is movably installed inside the storage cavity. A test group is arranged on the upper side of the fixture body, a detection group is arranged at a position corresponding to the storage cavity on the upper side of the fixture body, and an auxiliary group is arranged at a position corresponding to the test group on the other side of the fixture body; the test group includes a test cavity and a through groove, and a connection core body and a test board are movably arranged inside the test cavity and the through groove. Support plates and limiting rods are respectively arranged on the side of the test board; the detection group includes a connection cavity and a matching cavity. By setting the test fixture and the test group and the detection group therein, the present invention can achieve mechanical trigger pressing and limiting of the chip, ensure the stability and effectiveness during chip testing, and the mechanical structure eliminates the electronic control structure, effectively controlling the cost.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing fixtures, and particularly to a stable chip testing fixture and testing equipment. Background Art

[0002] During the chip manufacturing and processing process, chip testing is a very important part. A testing fixture is a device used to test chips. A pressing plate on the testing fixture is used to fix the chip to fix the test base on the table board. During the testing process, after a batch of products is tested, it is necessary to replace the base of the testing fixture and re-fix the test fixture base, and then continue to test the next batch of products;

[0003] Moreover, in order to achieve automated testing, multiple groups of testing fixtures are set up, and a three-axis transfer mechanical device and a pick-up device are used to transfer and test the chips. After the existing fixtures are installed in the testing equipment, the chips are generally pressed and fixed by a pneumatic device, resulting in a high cost problem. In addition, after the existing testing fixture detects the chips, the unqualified chips need to be sucked and placed in the waste area by the pick-up device, which affects the work efficiency. For this reason, we propose a stable chip testing fixture and testing equipment. Summary of the Invention

[0004] In order to overcome the technical problems existing in the above-mentioned prior art, the present invention provides a stable chip testing fixture and testing equipment.

[0005] To solve the above technical problems, the present invention provides the following technical solutions. A stable chip testing fixture: includes multiple groups of fixture bodies. A storage cavity is opened on the side of the fixture body, and a waste box is movably installed inside the storage cavity. A testing group is arranged on the upper side of the fixture body, a detection group is arranged at the position corresponding to the storage cavity on the upper side of the fixture body, and an auxiliary group is arranged at the position corresponding to the testing group on the other side of the fixture body;

[0006] The testing group includes a testing cavity and a through groove. A connecting core body and a testing board are movably arranged inside the testing cavity and the through groove. Support plates and limiting rods are respectively arranged on the side of the testing board;

[0007] The detection group includes a connecting cavity and a matching cavity. A trigger rod and a support frame are movably arranged inside the connecting cavity and the matching cavity. A limiting block is arranged on the side of the support frame;

[0008] The auxiliary group includes a connecting groove, and a first push plate and a second push plate are movably arranged inside the connecting groove.

[0009] Further, the test group includes a test cavity opened on the upper side of the fixture body. A through groove is opened at the center of the bottom wall of the test cavity. A connecting core is movably installed inside the through groove. A test board is fixedly installed on the side of the connecting core and the test board is movably arranged inside the test cavity. Activity cavities are mirror-symmetrically opened on both inner walls of the test cavity. An activity plate is movably installed inside the activity cavity. A support plate is movably installed at the notch of the activity plate and the support plate extends to the position inside the test cavity. A first spring is fixedly connected to the side of the elastic plate and the inner side of the elastic plate. A first spring is fixedly connected to the bottom side of the activity plate and the bottom wall of the activity cavity.

[0010] Further, the test group further includes a mating groove opened on both inner walls of the test cavity. A limiting rod is movably installed inside the mating groove. An elastic cylinder is fixedly connected between the side of the limiting rod and the wall surface of the mating groove.

[0011] Further, the detection group includes a connection cavity opened inside the fixture body. The connection cavity passes through the inside of the mating groove and is arranged at the upper side of the activity cavity. A mating cavity is opened between the inner walls of the connection cavity and the mating cavity penetrates through the fixture body and is communicated with the test cavity and the storage cavity. A trigger rod is movably installed inside the connection cavity. A second spring is fixedly connected between the side of the trigger rod and the inner wall of the connection cavity.

[0012] Further, the detection group further includes a support frame fixedly connected between the trigger rods. A fixed block is fixedly installed on the side of the support frame. A limiting block is movably arranged below the fixed block. An elastic block is fixedly connected between the side of the limiting block and the fixed block. A vision tester is fixedly installed on the upper side of the support frame.

[0013] Further, the auxiliary group includes a connection groove opened on the inner wall of the test cavity. A first push plate is movably installed inside the connection groove. A second push plate is arranged on the side of the first push plate and the second push plate is rotatably connected to the first push plate through a round shaft. A third spring is fixedly connected between the side of the second push plate and the fixture body.

[0014] A stable chip testing device includes the stable chip testing fixture described above;

[0015] It includes a test device main body. The test device main body is arranged below the fixture body. The test module inside the test device main body can be connected and communicated with the connecting core through an interface. Positioning blocks are symmetrically and equidistantly fixedly installed on the upper side of the workbench of the test device main body. A material tray is arranged on the upper side of the test device main body. A three-axis transfer device is arranged on the upper side of the test device main body. A material transfer group is arranged on the side of the three-axis transfer device.

[0016] Further, the material transfer group includes a mounting frame fixedly installed on the side of the slider of the vertical electric slide of the three-axis transfer device. A suction module is vertically and fixedly installed on the lower side of the mounting frame. A first electric push rod is arranged on the side of the mounting frame. A second electric push rod is fixedly installed on the side of the slider of the vertical electric slide of the three-axis transfer device, and a matching block is fixedly installed at the output end of the second electric push rod.

[0017] Compared with the prior art, the beneficial effects that the present invention can achieve are as follows:

[0018] 1. By setting the test fixture and the test group and detection group therein, the present invention can realize the mechanical trigger pressing limit of the chip, ensure the stability and effectiveness of chip testing, and the mechanical structure eliminates the electric control structure, effectively controlling the cost.

[0019] 2. By setting the material transfer group, the test fixture and the auxiliary group therein, after chip testing, the present invention can trigger and push the unqualified chips out of the test cavity into the waste box for collection, so that the suction module does not need to suck and place the unqualified chips anymore. When the chip is unqualified, the suction module can directly suck the material, and then the matching block triggers the second push plate. Subsequently, the suction module can directly place the chip for testing, effectively improving the efficiency of testing chips.

[0020] 3. By setting the test equipment and the material transfer group therein, after the suction module sucks the chip, the second electric push rod can push the matching block to perform a slight deviation correction operation on the chip, ensuring the stable contact and clamping of the chip with the test board subsequently, and improving the stability of chip automation.

[0021] 4. By setting the support plate and its peripheral components, the support plate can elastically support the chip, so that after chip testing, the chip can be separated from the test board under the elastic force, facilitating chip material taking and subsequent waste collection operations.

[0022] 5. By setting components such as the test board and the connecting core body, the test board can be directly pulled out of the test cavity by tools for direct replacement. When installing, the test board is directly inserted into the test cavity, and the connecting core body is clamped with the interface of the workbench of the main body of the test equipment, realizing the electrical connection between the test board and the main body of the test equipment, and facilitating the quick installation and disassembly for different chips.

[0023] 6. By setting components such as the first push plate and the second push plate, when the first push plate and the second push plate are pushed inside the connecting groove, the first push plate can push and collect the waste chips. When the second push plate is manually pulled out of the connecting groove, it bends downward to squeeze the auxiliary fixture main body at the bottom of the test equipment main body to complete disassembly, expanding the functionality of the fixture.

[0024] 7. By modularizing the test fixture and using mechanical structures for internal components, the present invention saves costs and can be set up and used according to requirements, making the test flexible and variable. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 is a schematic diagram of the overall structure of the present invention;

[0026] Figure 2 is a schematic diagram of a partial structure of the fixture of the present invention;

[0027] Figure 3 is a schematic diagram of a partial sectional structure of the test group of the present invention;

[0028] Figure 4 is a schematic diagram of a sectional structure of the fixture main body of the present invention;

[0029] Figure 5 is a schematic diagram of a partial structure of the test group of the present invention;

[0030] Figure 6 is a schematic diagram of a partial exploded structure of the auxiliary group of the present invention;

[0031] Figure 7 is a schematic diagram of a partial structure of the three-axis transfer device of the present invention;

[0032] Figure 8 is a schematic diagram of a partial exploded structure of the three-axis transfer device of the present invention.

[0033] Wherein: 1. Fixture main body; 11. Storage cavity; 12. Waste box; 2. Test group; 21. Test cavity; 22. Through groove; 23. Connection core; 24. Test board; 25. Activity cavity; 251. Activity plate; 252. Support plate; 253. Elastic plate; 254. First spring; 26. Matching groove; 261. Limit rod; 262. Elastic cylinder; 3. Detection group; 31. Connection cavity; 311. Trigger rod; 32. Matching cavity; 33. Second spring; 34. Support frame; 341. Fixed block; 342. Limit block; 343. Elastic block; 35. Vision tester; 4. Auxiliary group; 41. Connection groove; 42. First push plate; 43. Second push plate; 44. Third spring; 5. Test equipment main body; 51. Positioning block; 6. Material tray; 7. Three-axis transfer device; 701. Mounting frame; 702. Suction module; 703. First electric push rod; 704. Second electric push rod; 705. Matching block. DETAILED DESCRIPTION OF THE INVENTION

[0034] In order to make the technical means, creative features, achieved purposes and effects realized by the present invention easy to understand, the present invention will be further described below in conjunction with specific embodiments. However, the following embodiments are only the preferred embodiments of the present invention, not all of them. Based on the embodiments in the implementation manners, other embodiments obtained by those skilled in the art without creative efforts all fall within the protection scope of the present invention. The experimental methods in the following embodiments are all conventional methods unless otherwise specified. The materials, reagents, etc. used in the following embodiments can be obtained from commercial channels unless otherwise specified.

[0035] Embodiment: As Figures 1 to 6 shown, a stable chip test fixture and test equipment include multiple groups of fixture bodies 1. The fixture body 1 is a rectangular body with circular grooves equidistantly opened at the four corners. A storage cavity 11 is opened on the side of the fixture body 1. The storage cavity 11 is a rectangular cavity. A waste box 12 is movably installed inside the storage cavity 11. The waste box 12 is a rectangular box with a hollow upper side. A test group 2 for testing the chip is arranged on the upper side of the fixture body 1. A detection group 3 for assisting in stable testing is arranged at a position corresponding to the storage cavity 11 on the upper side of the fixture body 1. An auxiliary group 4 for assisting in disassembling the fixture body 1 and removing defective chips is arranged at a position corresponding to the test group 2 on the other side of the fixture body 1;

[0036] The chip can be stably tested through the arranged test group 2, and subsequent chip sorting and material selection can be facilitated;

[0037] The test group 2 includes a test cavity 21 opened on the upper side of the fixture body 1. The test cavity 21 is a rectangular cavity. A through groove 22 penetrating the fixture body 1 is opened at the center of the bottom wall of the test cavity 21. The through groove 22 is a cylindrical cavity. A connecting core 23 is movably installed inside the through groove 22. The connecting core 23 is a cylinder with a signal interface on the bottom side. The connecting core 23 can be electrically connected to subsequent components. When the chip is tested, the circuit is connected. The side of the connecting core 23 is fixedly installed. There is a test board 24 and the test board 24 is movably arranged inside the test cavity 21. The test board 24 is electrically connected to the connecting core 23 through wires. The test board 24 is an integrated circuit board with a test electrical hole. An active cavity 25 is mirrored on the inner wall of both sides of the test cavity 21. The active cavity 25 is an "L"-shaped cavity. A movable plate 251 is movably installed inside the active cavity 25. The movable plate 251 is a "C"-shaped plate. A support plate 252 is movably installed at the notch of the movable plate 251. The support plate 252 is 52 extends to the internal position of the test cavity 21, the support plate 252 is a trapezoidal plate, and the elastic plate 253 is fixedly connected to the side of the first spring 254 and the inner side of the elastic plate 253. The elastic plate 253 is a plate with a continuous "W"-shaped cross-section. The first spring 254 is fixedly connected to the bottom side of the movable plate 251 and the bottom wall of the movable cavity 25 at equal distances; specifically, when the test board 24 is taken out of the test cavity 21 by a tool, the connecting core 23 slides out synchronously, and the connecting core 23 disconnects the circuit connection of the test board 24. The test board 24 can be replaced according to the chip. When the test board 24 is replaced, the test board 24 squeezes the support plate 252 to push the elastic plate 253 to deform and slide into the movable plate 251 to avoid interference. When the chip is tested synchronously, the support plate 252 supports the chip. When the chip is pressed and contacted with the test board 24, the movable plate 251 is driven to push the first spring 254 to deform. After the test, the first spring 254 can make the support plate 252 drive the chip to separate from the test board 24;

[0038] The inner walls of both sides of the test cavity 21 are symmetrically inclined and provided with matching grooves 26 corresponding to the positions of the active cavity 25. The matching grooves 26 are convex cylindrical grooves. A limiting rod 261 is movably installed inside the matching groove 26 and the limiting rod 261 extends out of the matching groove 26. The limiting rod 261 is a "T"-shaped round rod made of rubber material with a spherical side. An elastic tube 262 is fixedly connected between the side of the limiting rod 261 and the wall of the matching groove 26 and the elastic tube 262 is movably sleeved on the side of the limiting rod 261. The elastic tube 262 is a cylinder with a continuous "W"-shaped cross section. Specifically, before and after the test, the limiting rod 261 is not pushed. Under the elastic force of the elastic tube 262, the limiting rod 261 slides into the matching groove 26. During the test, the chip contacts the test board 24, and the limiting rod 261 is squeezed by subsequent components to slide out of the matching groove 26 to perform a press-limit operation on the chip.

[0039] The set detection group 3 can perform a visual test on the chip to determine whether the chip position is in place, and can trigger other components;

[0040] The detection group 3 includes connection cavities 31 symmetrically opened inside the fixture main body 1, and the connection cavities 31 pass through the inside of the fitting groove 26 and are arranged above the movable cavity 25. The connection cavities 31 are rectangular cavities. A fitting cavity 32 is opened between the inner walls of the connection cavities 31, and the fitting cavity 32 penetrates the fixture main body 1 and communicates with the test cavity 21 and the storage cavity 11. The fitting cavity 32 is an "L"-shaped cavity. A trigger rod 311 is movably installed inside the connection cavity 31, and the trigger rod 311 is correspondingly attached to the side position of the limiting rod 261. The trigger rod 311 is a rectangular rod with trapezoidal grooves equidistantly arranged on the side. By default, the trigger rod 311 pushes the limiting rod 261 out of the inside of the fitting groove 26. When the trigger rod 311 is pushed, the limiting rod 261 will gradually slide into the trapezoidal groove on the side of the trigger rod 311 under the elastic force of the elastic cylinder 262. A second spring 33 is fixedly connected between the side of the trigger rod 311 and the inner wall of the connection cavity 31. The elastic force of the second spring 33 is much greater than the sum of the elastic cylinder 262 and the first spring 254; specifically, when the trigger rod 311 is pushed by subsequent components, the second spring 33 is compressed and deformed. At this time, the trigger rod 311 loses the push on the limiting rod 261 to avoid the chip. On the contrary, when the trigger rod 311 is not pushed, it is reset under the elastic force of the second spring 33 to push the limiting rod 261 so that it can press the chip;

[0041] A support frame 34 is fixedly connected between the trigger rods 311, and the support frame 34 is movably arranged inside the fitting cavity 32 and extends out. The support frame 34 is a rectangular frame. A fixed block 341 is fixedly installed on the side of the support frame 34 close to the test board 24. The fixed block 341 is a rectangular block. A limiting block 342 is movably arranged below the fixed block 341. The limiting block 342 is a trapezoidal block. An elastic block 343 is mirror-symmetrically fixedly connected between the side of the limiting block 342 and the fixed block 341. The elastic block 343 is a curved block made of elastic material. A visual tester 35 is fixedly installed on the upper side of the support frame 34. The visual tester 35 is a prior art and will not be elaborated here; specifically, the subsequent components can push the support frame 34 to drive the connection cavity 31 to move synchronously. Before the test, the support frame 34 drives the visual tester 35 to move accordingly to avoid the chip. During the test, the support frame 34 moves back to its original position. At this time, the limiting block 342 presses against the side of the chip, and the limiting block 342 pushes the elastic block 343 to deform to further limit the chip. Synchronously, the visual tester 35 can perform a visual test on the chip to observe whether the chip is in place;

[0042] The set auxiliary group 4 can sort the tested chips, reduce the operation of repeatedly sucking waste chips, and can manually assist in the disassembly operation of the fixture main body 1;

[0043] The auxiliary group 4 includes a connecting groove 41 opened on the inner wall of the test cavity 21 at a position far from the mating cavity 32, and the connecting groove 41 penetrates through the fixture body 1. The connecting groove 41 is a rectangular groove. A first push plate 42 is movably installed inside the connecting groove 41. The first push plate 42 is a convex-shaped plate. A second push plate 43 is arranged on the side surface of the first push plate 42, and the second push plate 43 is rotatably connected to the first push plate 42 through a round shaft. The second push plate 43 is movably arranged at a position extending out of the inside of the connecting groove 41. The second push plate 43 is an "L"-shaped plate and one side is concave. Third springs 44 are symmetrically and fixedly connected between the side surfaces of the second push plate 43 and the fixture body 1. Specifically, during sorting, after the chip test is completed, it is lifted by the support plate 252 and separated from the test plate 24. The second push plate 43 is pushed, causing the first push plate 42 to slide inside the connecting groove 41 accordingly, pushing the chip into the mating cavity 32 and dropping it into the waste box 12 for collection. During disassembly, manually pull the second push plate 43 out of the inside of the connecting groove 41 and press it down to rotate the second push plate 43. At this time, the second push plate 43 presses the bottom components to assist in disassembling the fixture body 1.

[0044] As Figure 1 , Figure 7 and Figure 8 shown, a test equipment main body 5 is arranged on the lower side of the fixture body 1. The test equipment main body 5 is a rectangular control cabinet, and an electric control module, a test module, a power supply group, etc. are integrally arranged inside. The test module inside the test equipment main body 5 can be connected in a snap-fit manner with the connection core 23 through an interface. On the upper side of the workbench of the test equipment main body 5, positioning blocks 51 are symmetrically and equidistantly fixedly installed, and the fixture body 1 is snap-fitted on the side surfaces of the positioning blocks 51. The positioning blocks 51 are cylindrical blocks. Material trays 6 are arranged equidistantly on the upper side of the test equipment main body 5. The material trays 6 are rectangular trays with grooves on the side. A three-axis transfer device 7 is arranged on the upper side of the test equipment main body 5, and the three-axis transfer device 7 completely covers the fixture body 1. The three-axis transfer device 7 is built by three groups of electric slides in three directions and can realize three-axis transfer operations. A material transfer group is arranged on the side surface of the three-axis transfer device 7.

[0045] By setting the material transfer group, chip picking operations can be carried out, and it can cooperate with other components of the trigger fixture for operation.

[0046] The material transfer group includes a mounting frame 701 fixedly installed on the side of the vertical electric slide block of the three-axis transfer device 7. The mounting frame 701 is a rectangular frame. A material suction module 702 is vertically and fixedly installed on the lower side of the mounting frame 701, and the material suction module 702 is connected to the air supply through an air pipe. The material suction module 702 is composed of an air pipe and a nozzle, and can perform pneumatic suction and pick-up operations on the chip. A first electric push rod 703 is arranged on the side of the mounting frame 701 close to the fixture main body 1, and the first electric push rod 703 is fixedly installed inside the mounting frame 701. A second electric push rod 704 is fixedly installed on the side of the vertical electric slide block of the three-axis transfer device 7, and the second electric push rod 704 is arranged below the mounting frame 701. A mating block 705 is fixedly installed at the output end of the second electric push rod 704. The mating block 705 is a "C"-shaped plastic block with a tapered inner side. Specifically, the three-axis transfer device 7 drives the mounting frame 701 and the second electric push rod 704 to move freely in three axes. The material suction module 702 can suck the chip. Before the test, the second electric push rod 704 pushes the mating block 705 to slightly correct the position of the chip sucked by the material suction module 702. The first electric push rod 703 can push the support frame 34 to trigger subsequent operations of the fixture. After the test, the first electric push rod 703 still pushes the support frame 34, and then the second electric push rod 704 pushes the mating block 705 to squeeze the second push plate 43 to slide, triggering subsequent operations of the fixture.

[0047] Working principle:

[0048] Before the test: First step, place the material tray 6 filled with materials on the upper side of the test equipment main body 5, and control the three-axis transfer device 7 by the test equipment main body 5 to drive the material transfer group to perform the material picking operation;

[0049] Second step, the material suction module 702 sucks the chip inside the corresponding material tray 6, and then the second electric push rod 704 pushes the mating block 705 to perform a slight position correction operation on the chip;

[0050] Third step, the three-axis transfer device 7 drives the mounting frame 701 to move to the upper side of the fixture main body 1. At this time, the first electric push rod 703 pushes the support frame 34 to move inside the mating cavity 32. At this time, the fixing block 341 slides into the mating cavity 32 accordingly, and the trigger rod 311 moves synchronously, so that the limiting rod 261 slides to the trapezoidal groove position of the trigger rod 311 under the elastic force of the elastic cylinder 262. At this time, the limiting rod 261 slides into the mating groove 26 and the connection cavity 31 to avoid interfering with the chip;

[0051] During testing: First step, the three-axis transfer device 7 drives the chip suction module 702 to place the sucked chip downward inside the test chamber 21. The chip contacts the side position of the support plate 252, and continues to press the chip to make it contact and engage with the test board 24. The movable plate 251 then squeezes the first spring 254 downward to store energy. The chip suction module 702 loses the suction on the chip, and the material placement is completed.

[0052] Second step, the first electric push rod 703 retracts and resets. The support frame 34 loses the push and pull force. Through the elastic force of the second spring 33, the trigger rod 311 and the support frame 34 complete the reset. The trigger rod 311 squeezes the limit rod 261 to make it slide out of the mating groove 26 to perform multi-point extrusion and limitation on the chip. Synchronously, the limit block 342 also squeezes and contacts the side of the chip to limit it. At this time, the three-axis transfer device 7 can drive the chip suction module 702 to pick up other chips.

[0053] Third step, the vision tester 35 tests the position of the chip to determine whether it is engaged in place. If not in place, the chip suction module 702 returns to pick it up, and the position is corrected again through the mating block 705. When in place, the main body 5 of the test equipment is connected to the test board 24 through the connecting core 23 to test the chip for magnetic variables and electrical variables, etc., to determine whether the chip is qualified.

[0054] After testing: First step, after the chip is tested, the three-axis transfer device 7 drives the mounting bracket 701 to move to the upper side position corresponding to the fixture main body 1. After the first electric push rod 703 pushes the support frame 34 to move, the subsequent operations are determined according to the chip test results.

[0055] Second step, when the chip is tested to be qualified, the support frame 34 is pushed. At this time, the limit block 342 and the limit rod 261 do not interfere with the chip. Through the elastic force of the first spring 254, the support plate 252 drives the chip to move upward, so that it is separated from the test board 24. The qualified chip is sucked by the chip suction module 702 and then placed back into the material tray 6. Subsequently, the material picking and testing continue.

[0056] Third step, when the chip is unqualified, the support frame 34 is pushed in the same way. At this time, the limit block 342 and the limit rod 261 do not interfere with the chip. The support plate 252 drives the chip to move upward to separate it from the test board 24. Different from the above, at this time, the chip suction module 702 sucks a group of chips to the upper side position of the fixture main body 1. The second electric push rod 704 pushes the mating block 705 to contact the second push plate 43. The second push plate 43 drives the first push plate 42 to slide inside the connecting groove 41 to push the chip into the mating cavity 32 and drop into the waste box 12 for collection. Subsequently, the chip suction module 702 can place the test material and continue the subsequent operations.

[0057] Fourthly, when it is necessary to replace the whole fixture body 1 and the internal components, the test board 24 and the connection core 23 can be directly pulled out according to the method. When the test board 24 is pulled out, the support board 252 is squeezed and slides into the movable board 251 for avoidance. On the contrary, when installing, manually press the support board 252 to avoid it and install and replace the test board 24. In addition, manually pull the second push plate 43 out of the connection groove 41, and then press it down to make the second push plate 43 squeeze the bottom test equipment body 5 to assist in disassembling the fixture body 1.

[0058] The embodiments of the present invention have been described in detail above with reference to the accompanying drawings. However, the present invention is not limited to this. Various changes can be made without departing from the spirit of the present invention within the scope of knowledge possessed by those skilled in the art.

Claims

1. A stable chip test fixture, comprising a plurality of sets of fixture bodies (1), characterized in that: A storage cavity (11) is provided on the side of the jig body (1), a waste material box (12) is movably installed inside the storage cavity (11), a test group (2) is provided on the upper side of the jig body (1), a detection group (3) is provided on the upper side of the jig body (1) at a position corresponding to the storage cavity (11), and an auxiliary group (4) is provided on the other side of the jig body (1) at a position corresponding to the test group (2); The test group (2) comprises a test cavity (21) provided on the upper side of the fixture body (1); a through groove (22) is provided at the center of the bottom wall of the test cavity (21); a connecting core (23) is movably installed inside the through groove (22); a test plate (24) is fixedly installed on the side of the connecting core (23) and the test plate (24) is movably arranged inside the test cavity (21); movable cavities (25) are provided on the inner walls of both sides of the test cavity (21) in a mirror-like manner; a movable plate (251) is movably installed inside the movable cavity (25); a support plate (252) is movably installed at the recess of the movable plate (251) and the support plate (252) extends to a position inside the test cavity (21); an elastic plate (253) is fixedly connected to the side of the support plate (252) and the inner side of the movable plate (251); and a first spring (254) is fixedly connected to the bottom side of the movable plate (251) and the bottom wall of the movable cavity (25); The test group (2) further comprises matching grooves (26) provided on the inner walls of both sides of the test cavity (21), a limit rod (261) being movably installed inside the matching groove (26), and an elastic tube (262) being fixedly connected between the side surface of the limit rod (261) and the wall surface of the matching groove (26); The detection group (3) comprises a connecting cavity (31) provided inside the fixture body (1), and the connecting cavity (31) is arranged at an upper side of the movable cavity (25) through the inside of the matching groove (26); a matching cavity (32) is provided between the inner walls of the connecting cavity (31), and the matching cavity (32) penetrates the fixture body (1) and is connected to the test cavity (21) and the storage cavity (11); a trigger rod (311) is movably installed inside the connecting cavity (31), and a second spring (33) is fixedly connected between the side of the trigger rod (311) and the inner wall of the connecting cavity (31); The detection group (3) further comprises a support frame (34) fixedly connected between the trigger rods (311), a fixed block (341) is fixedly mounted on the side of the support frame (34), a limit block (342) is movably arranged on the lower side of the fixed block (341), an elastic block (343) is fixedly connected between the limit block (342) and the side of the fixed block (341), and a visual tester (35) is fixedly mounted on the upper side of the support frame (34); The auxiliary group (4) comprises a connecting groove (41), and a first push plate (42) and a second push plate (43) are movably arranged inside the connecting groove (41).

2. A stable chip testing fixture according to claim 1, characterized in that: The auxiliary group (4) comprises a connecting groove (41) formed on the inner wall of the test cavity (21); a first push plate (42) is movably mounted inside the connecting groove (41); a second push plate (43) is arranged on a side of the first push plate (42) and the second push plate (43) is rotatably connected to the first push plate (42) via a circular shaft; and a third spring (44) is fixedly connected between the second push plate (43) and a side of the fixture body (1).

3. A stable chip testing device, characterized in that: A stable chip test fixture comprising any one of claims 1 to 2; The invention comprises a test equipment body (5), wherein the test equipment body (5) is arranged on the lower side of the fixture body (1), a test module inside the test equipment body (5) can be connected to a connecting core (23) by means of an interface, positioning blocks (51) are symmetrically and equidistantly fixedly mounted on the upper side of a workbench of the test equipment body (5), a material tray (6) is arranged on the upper side of the test equipment body (5), a three-axis transfer device (7) is arranged on the upper side of the test equipment body (5), and a material transfer group is arranged on the side of the three-axis transfer device (7).

4. A stable chip testing device according to claim 3, characterized in that: The material transfer group comprises a mounting frame (701) fixedly mounted on the side of a vertical electric slide block of a three-axis transfer device (7); a material suction module (702) is vertically fixedly mounted on the lower side of the mounting frame (701); a first electric push rod (703) is arranged on the side of the mounting frame (701); a second electric push rod (704) is fixedly mounted on the side of the vertical electric slide block of the three-axis transfer device (7); and a matching block (705) is fixedly mounted on the output end of the second electric push rod (704).

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