High-precision alloy resistor TCR detection system and method

Abstract

The invention provides a high-precision alloy resistor TCR detection system and method, and the system comprises a part channel which is used for transporting a test carrier in a preset direction; the part channel sequentially comprises a plurality of sub-areas in the preset direction, and each sub-area is correspondingly provided with a detection working chamber. Each detection working chamber comprises a carrier transfer mechanism, when the test carriers are transported to the sub-areas corresponding to the detection working chambers in the part channel in the preset direction, the part channel stops transporting, and the carrier transfer mechanisms transfer the test carriers from the sub-areas to the interiors of the corresponding detection working chambers; the detection working chamber is used for carrying out TCR detection on the high-precision alloy resistor in the test carrier under a corresponding temperature condition; batch detection of resistors is realized, the TCR automatic detection rate is improved, the consistency of detection results is ensured, and the energy consumption in the detection process is reduced.

Description

Technical Field

[0001] The present invention relates to the field of concrete structure monitoring, and in particular to a high-precision alloy resistor TCR detection system and method. Background Art

[0002] Temperature coefficient of resistance (TCR) is an important parameter to measure the performance of precision alloy resistors. In order to ensure the quality of precision alloy resistors, mass-produced precision alloy resistors are usually tested. At present, the mainstream precision alloy resistors in the market are not 100% tested, but are sampled and tested by random sampling. Therefore, there is no equipment for batch testing of precision alloy resistor products.

[0003] The existing sampling test of precision alloy resistors mainly uses mature equipment such as temperature change test chambers, environmental test chambers or oil tanks to test in laboratory environments. However, the above sampling test methods have the following disadvantages: the test temperature adjustment process of the temperature change test chamber and the environmental test chamber is relatively long, and the temperature that has not been adjusted is prone to drift and jitter, and it is difficult to control the temperature stability; the equipment wiring is complicated, and the test requires manual operation; the number of precision alloy resistors tested each time is limited, and large-scale batch testing cannot be achieved; the energy consumption for temperature adjustment during the test process is too large; air is used as the medium during the test process, and testing in a high-temperature environment will accelerate the oxidation of the resistor; although the oil tank can ensure that the resistor is isolated from the air during the test process, the resistor needs to be complicated to clean after being soaked in oil, which can easily cause the resistor to deform, loosen, or even fail; the oil inside the oil tank has a large specific heat capacity, and it takes a long time to adjust the temperature before testing, especially when testing in low-temperature areas, it takes a longer time to stabilize the temperature.

[0004] It can be seen that the existing TCR detection method of high-precision alloy resistors is only suitable for a small number of sampling detection scenarios, and is not suitable for batch rapid automatic detection scenarios. It also requires a lot of manual intervention, which reduces the efficiency of TCR detection. Summary of the invention

[0005] The object of the present invention is to provide a high-precision alloy resistor TCR detection system and method, including: a component channel, used to transport a test carrier along a preset direction; the component channel includes a plurality of sub-areas in sequence along the preset direction, and each sub-area corresponds to a detection studio; each detection studio includes a carrier transfer mechanism, when the test carrier is transported to the sub-area corresponding to the detection studio along the preset direction in the component channel, the component channel suspends transportation, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding detection studio; the detection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under corresponding temperature conditions; the component channel is used to automatically transport the test carrier containing the high-precision alloy resistor, and a plurality of detection studios are used to provide a sealed detection environment with different stable temperature values, so that the resistor can quickly and stably reach the target temperature and avoid oxidation, thereby realizing batch detection of resistors, improving the TCR automatic detection ratio, ensuring the consistency of the detection results, and reducing the energy consumption of the detection process.

[0006] The present invention is achieved through the following technical solutions: High-precision alloy resistor TCR detection system, including: Parts channel, used to transport test vehicles in a preset direction; The component channel includes a plurality of sub-areas in sequence along the preset direction, and each sub-area is correspondingly provided with a detection studio; Each inspection studio includes a carrier transfer mechanism. When the test carrier is transported along the preset direction in the component channel to the sub-area corresponding to the inspection studio, the component channel suspends transportation, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding inspection studio; the inspection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under corresponding temperature conditions.

[0007] Optionally, in the component channel, a movable sealing strip is provided between any two adjacent sub-areas; When the component channel transports the test vehicle, all movable sealing strips are located at their corresponding avoidance positions; When the transportation of the component channel is suspended, all movable sealing strips move from their corresponding avoidance positions to corresponding positions of the component channel, thereby sealing and isolating the two corresponding sub-areas.

[0008] Optionally, the operating parameters of each movable sealing strip moving from its corresponding avoidance position to the corresponding position of the component channel are monitored in real time; wherein the operating parameters include movement time, movement speed, displacement accuracy, vibration frequency and vibration amplitude; Acquire a first motion parameter using the motion time, the motion speed and the displacement accuracy; The first motion parameter is obtained by the following formula: Among them, P 01 represents the first motion parameter; D represents the displacement accuracy; D z represents the total distance from the avoidance position to the corresponding position of the component channel; n represents the number of movement speed acquisitions; v i represents the speed value corresponding to the i-th motion speed acquisition; v i-1 represents the motion speed value corresponding to the i-1th motion speed acquisition; v bi represents the standard deviation of the motion speed corresponding to the i-th acquisition; P v represents the rate of change of the movement speed corresponding to the current running moment; T represents the movement time of the movable sealing strip from the corresponding avoidance position to the corresponding position of the component channel; T max Indicates the preset maximum allowed exercise duration; Acquire a second motion parameter using the vibration frequency and the vibration amplitude; The second motion parameter is obtained by the following formula: Among them, P 02 represents the second motion parameter; F represents the vibration frequency; F max Indicates the preset maximum allowable vibration frequency value; A indicates the vibration amplitude; A max Indicates the preset maximum allowable vibration amplitude value; Obtaining a comprehensive motion parameter using the first motion parameter and the second motion parameter; The comprehensive motion parameters are obtained by the following formula: Where P represents the comprehensive motion parameter; P 01 represents the first motion parameter; P 02 Indicates the second motion parameter; max() means taking the maximum value of the two values ​​in the brackets; Comparing the comprehensive motion parameter with a preset parameter threshold; When the comprehensive motion parameter exceeds a preset parameter threshold, it is determined that the operation of the active sealing strip is abnormal, and an abnormal alarm is issued; otherwise, it is determined that the operation of the active sealing strip is not abnormal.

[0009] Optionally, the component channel includes a transmission and transportation mechanism and a positioning mechanism; The transmission and transportation mechanism is used to transport the test carrier along a preset direction; The positioning mechanism is used to detect the transportation status of the test carrier along the preset direction, so as to determine whether the test carrier is transported into the sub-area; when the test carrier is transported into the sub-area, the transmission and transportation mechanism suspends the transportation of the test carrier.

[0010] Optionally, the test vehicle comprises a high-precision alloy resistor and a test contact; the test contact is connected to the high-precision alloy resistor; When the test carrier is transferred into the testing studio, the testing studio performs TCR testing on the high-precision alloy resistor through the testing contacts.

[0011] Optionally, all the test studios have different ambient temperatures inside, so that different test studios can be used to perform TCR tests on the same test vehicle under different temperature conditions in sequence.

[0012] Optionally, the detection studio includes a temperature adjustment mechanism, a heat exchange mechanism, a data detection mechanism and a controller; The controller is used to control the operation of the temperature adjustment mechanism, the heat exchange mechanism and the data detection mechanism; The data detection mechanism is used to perform TCR detection on the test vehicle transferred to the inside of the detection studio; The temperature adjustment mechanism and the heat exchange mechanism are used to adjust the ambient temperature inside the detection studio, so that a constant ambient temperature value can be maintained inside the detection studio.

[0013] Optionally, the temperature adjustment mechanism includes a refrigeration device; The heat exchange mechanism includes a heating device and a convection fan.

[0014] Optionally, the carrier transfer mechanism includes a sealing door component and a driving component; When the carrier transfer mechanism is in an idle state, the test carrier passes through the inside of the sealed door component and is transported along a preset direction; When the carrier transfer mechanism is in working state, the test carrier is confined inside the sealing door component, the driving component drives the sealing door component to move, thereby transferring the test carrier to the inside of the detection studio, and the sealing door component seals the detection studio.

[0015] Optionally, the sealing door component includes two sealing doors whose relative position relationship is fixed and can move synchronously; when the carrier transfer mechanism is in an idle state, the two sealing doors are respectively located on opposite sides of the component channel along the preset direction; The driving component includes at least one driving cylinder; the driving cylinder is connected to one of the sealing doors, and when the driving cylinder is extended and retracted, the carrier transfer mechanism switches between an idle state and a working state.

[0016] The detection method using the above-mentioned high-precision alloy resistor TCR detection system includes: Step S1, filling protective gas into all detection studios, and performing temperature adjustment and / or heat exchange operations on the inside of all detection studios, so that different constant ambient temperature values ​​are maintained inside all detection studios; Step S2, identifying the transportation status of the component channel to the test carrier, and when the test carrier is transported to the inside of the corresponding sub-area, controlling the carrier transfer mechanism to transfer the test carrier in the corresponding sub-area to the inside of its corresponding inspection studio; Step S3, performing TCR detection on the test vehicle transferred to the testing studio to obtain corresponding TCR detection data; Step S4, repeating the above steps S2-S3 until the test vehicle completes the TCR detection inside all the detection studios, and storing the corresponding TCR detection data of the test vehicle inside all the detection studios.

[0017] Compared with the prior art, the present invention has the following beneficial effects: The high-precision alloy resistor TCR detection system and method provided in the present application include: a component channel, which is used to transport a test carrier along a preset direction; the component channel includes several sub-areas in sequence along the preset direction, and each sub-area corresponds to a detection studio; each detection studio includes a carrier transfer mechanism, when the test carrier is transported to the sub-area corresponding to the detection studio along the preset direction in the component channel, the component channel suspends transportation, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding detection studio; the detection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under corresponding temperature conditions; the component channel is used to automatically transport the test carrier containing the high-precision alloy resistor, and multiple detection studios are used to provide a sealed detection environment with different stable temperature values, so that the resistors can quickly and stably reach the target temperature and avoid oxidation, thereby realizing batch detection of resistors, improving the TCR automatic detection ratio, ensuring the consistency of the detection results, and reducing the energy consumption of the detection process. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the prior art descriptions. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. Among them: Figure 1 This is a schematic diagram of the overall structure of the high-precision alloy resistor TCR detection system provided by the present invention.

[0019] Figure 2 A schematic structural diagram of a carrier transfer mechanism in an idle state in the high-precision alloy resistor TCR detection system provided by the present invention.

[0020] Figure 3 A schematic structural diagram of a carrier transfer mechanism in a working state in the high-precision alloy resistor TCR detection system provided by the present invention.

[0021] Figure 4 A schematic diagram of another structural form of a carrier transfer mechanism in an idle state in the high-precision alloy resistor TCR detection system provided by the present invention.

[0022] Figure 5 This is a structural schematic diagram of the external connection state of the high-precision alloy resistor TCR detection system provided by the present invention.

[0023] Figure 6 A schematic flow chart of the high-precision alloy resistor TCR detection method provided by the present invention. DETAILED DESCRIPTION

[0024] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. It is to be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some structures related to the present application are shown in the accompanying drawings, rather than all structures. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0025] The terms "including" and "having" and any variations thereof in this application are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device comprising a series of steps or units is not limited to the listed steps or units, but may optionally include steps or units not listed, or may optionally include other steps or units inherent to these processes, methods, products or devices.

[0026] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0027] See also Figure 1-5 As shown, the high-precision alloy resistor TCR detection system includes: A component channel is used to transport the test vehicle along a preset direction; the component channel may be, but is not limited to, a conveyor belt; in addition, the component channel may be arranged in a relatively closed box environment, such as by structurally modifying multiple environmental test chambers to form a relatively closed box environment, and the box environment is also filled with protective gases such as nitrogen to effectively prevent oxidation of the high-precision alloy resistor during the detection process; The component channel includes several sub-areas in sequence along the preset direction, and each sub-area corresponds to a detection studio; multiple sub-areas are arranged in sequence along the preset direction on the component channel, each sub-area serves as an area for accommodating high-precision alloy resistors, and each sub-area corresponds to a detection studio, so that the component channel can transport multiple test carriers at the same time, and multiple test carriers are placed on the component channel at equal intervals. Whenever the component channel moves a certain distance (such as the distance length corresponding to the spacing between two adjacent test carriers), all test carriers move synchronously along the preset direction for a certain distance, so that the distance measurement The carrier will enter the corresponding sub-area and align with the corresponding detection studio; in addition, the ambient temperatures inside all detection studios are different from each other. Preferably, the ambient temperatures inside all detection studios increase in an arithmetic progression along a preset direction. For example, the ambient temperatures inside all detection studios are -50°C, -25°C, 0°C, 25°C, 50°C, 75°C, 100°C, 125°C, etc. along a preset direction. In this way, as the component channel continues to transport the test carrier, the test carrier can be placed under different ambient temperature conditions for continuous automatic testing, thereby realizing large-scale batch testing of high-precision alloy resistors; Each inspection studio includes a carrier transfer mechanism. When the test carrier is transported to the sub-area corresponding to the inspection studio along the preset direction in the component channel, the component channel stops transporting, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding inspection studio; the inspection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under the corresponding temperature conditions; each inspection studio is provided with a carrier transfer mechanism, which is used to transfer the test carrier from the component channel to the inspection studio for detection, and when the detection is completed, the test carrier is transferred from the inspection studio back to the component channel, so that the component channel can continue to transport the test carrier, so as to transport the test carrier to the sub-area corresponding to the inspection studio with different ambient temperatures, so as to facilitate continuous batch TCR detection of the test carrier. Optionally, all inspection studios can be located in the same box environment as the component channel, and each inspection studio is also filled with protective gases such as nitrogen to prevent the high-precision alloy resistor from oxidizing at the higher ambient temperature inside the inspection studio, thereby ensuring the effectiveness of the detection of the high-precision alloy resistor. The beneficial effects of the above embodiments are that the high-precision alloy resistor TCR detection system includes: a component channel for transporting a test carrier along a preset direction; the component channel includes several sub-areas in sequence along the preset direction, and each sub-area corresponds to a detection studio; each detection studio includes a carrier transfer mechanism, when the test carrier is transported to the sub-area corresponding to the detection studio along the preset direction in the component channel, the component channel suspends transportation, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding detection studio; the detection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under corresponding temperature conditions; the component channel is used to automatically transport the test carrier containing the high-precision alloy resistor, and multiple detection studios are used to provide a sealed detection environment with different stable temperature values, so that the resistor can quickly and stably reach the target temperature and avoid oxidation, thereby realizing batch detection of resistors, improving the TCR automatic detection ratio, ensuring the consistency of the detection results, and reducing the energy consumption of the detection process.

[0028] In another embodiment, in the component channel, a movable sealing strip is provided between any two adjacent sub-areas; When the test vehicle is transported in the parts channel, all movable sealing strips are located in their corresponding avoidance positions; When the transportation of the component channel is suspended, all movable sealing strips move from their corresponding avoidance positions to corresponding positions of the component channel, thereby sealing and isolating the two corresponding sub-areas.

[0029] The beneficial effect of the above embodiment is that the component channel is formed by structural transformation of multiple environmental test chambers, so that the component channel will inevitably have an airtightness problem at the connection position of the two environmental test chambers. In order to improve the airtightness of the component channel and prevent the outside air from entering the detection studio during the transfer of the test carrier to the detection studio, a movable sealing strip is set between any two adjacent sub-areas in the component channel, and the component channel, especially the gap between the two adjacent sub-areas, is sealed and isolated by the movable sealing strip to prevent the air from the outside environment from entering the component channel and the detection studio during the detection process, effectively preventing the high-precision alloy resistor from oxidizing in the component channel and the detection studio when it contacts the air. Specifically, when the component channel transports the test carrier, all the movable sealing strips are located at their corresponding avoidance positions; when the component channel suspends transportation, all the movable sealing strips move from their corresponding avoidance positions to the corresponding positions of the component channel (such as the gap position between the two adjacent sub-areas), so that the movable sealing strip can switch back and forth between the avoidance position and the corresponding position, so as to achieve effective sealing of the component channel and the detection studio; wherein the movable sealing strip can be driven by a cylinder to move along the guide rail, thereby improving the reciprocating motion stability of the movable sealing strip.

[0030] In another embodiment, the operating parameters of each movable sealing strip moving from its corresponding avoidance position to the corresponding position of the component channel are monitored in real time; wherein the operating parameters include movement time, movement speed, displacement accuracy, vibration frequency and vibration amplitude; Obtaining a first motion parameter using motion time, motion speed, and displacement accuracy; The first motion parameter is obtained by the following formula: Among them, P 01 represents the first motion parameter; D represents the displacement accuracy; D z represents the total distance from the avoidance position to the corresponding position of the component channel; n represents the number of movement speed acquisitions; v i represents the speed value corresponding to the i-th motion speed acquisition; v i-1 represents the motion speed value corresponding to the i-1th motion speed acquisition; v bi represents the standard deviation of the motion speed corresponding to the i-th acquisition; P v represents the rate of change of the motion speed corresponding to the current running moment; T represents the motion time of the movable sealing strip moving from the corresponding avoidance position to the corresponding position of the component channel; T max Indicates the preset maximum allowed exercise duration; Obtaining a second motion parameter using the vibration frequency and the vibration amplitude; The second motion parameter is obtained by the following formula: Among them, P 02 represents the second motion parameter; F represents the vibration frequency; F max Indicates the preset maximum allowable vibration frequency value; A indicates the vibration amplitude; A max Indicates the preset maximum allowable vibration amplitude value; Obtaining a comprehensive motion parameter using the first motion parameter and the second motion parameter; Among them, the comprehensive motion parameters are obtained by the following formula: Where P represents the comprehensive motion parameter; P 01 represents the first motion parameter; P 02 Indicates the second motion parameter; max() means taking the maximum value of the two values ​​in the brackets; comparing the integrated motion parameter with a preset parameter threshold; When the comprehensive motion parameter exceeds the preset parameter threshold, it is determined that the operation of the active sealing strip is abnormal, and an abnormal alarm is issued; otherwise, it is determined that the operation of the active sealing strip is normal.

[0031] The beneficial effect of the above embodiment is that the motion parameters of the active sealing strip from the avoidance position to the corresponding position of the component channel, including motion time, motion speed, displacement accuracy, vibration frequency and vibration amplitude, are monitored in real time, so as to achieve a comprehensive and accurate grasp of the motion state of the active sealing strip. The acquisition of these parameters not only helps to understand the basic motion characteristics of the active sealing strip, but also provides a deep insight into the subtle changes in its motion process, providing a solid foundation for subsequent abnormality identification and performance evaluation. By calculating the first motion parameter (P 01 ) and the second motion parameter (P 02), this technical solution can comprehensively evaluate the motion performance of the active sealing strip. The first motion parameter combines the displacement accuracy, velocity change rate, motion time and the preset maximum allowable motion time, which can reflect the stability and efficiency of the active sealing strip during the motion process. The second motion parameter takes into account the vibration frequency and vibration amplitude, which helps to identify potential mechanical failures or wear problems. When the comprehensive motion parameter (P) exceeds the preset parameter threshold, the system can quickly determine that there is an abnormality in the operation of the active sealing strip and issue an abnormal alarm. This timely abnormality identification capability helps to reduce fault downtime and improve production efficiency. In addition, through real-time monitoring and abnormality identification, the operation problems of the active sealing strip can be discovered and handled in time, thereby avoiding production interruptions and safety hazards caused by failures. At the same time, through continuous monitoring and analysis of motion parameters, the life and performance change trend of the active sealing strip can be predicted, providing data support for preventive maintenance. This data-based maintenance strategy can reduce maintenance costs and improve the overall reliability and stability of the system. As a key component on the production line, the operating status of the active sealing strip directly affects the quality and production efficiency of the product. Through accurate monitoring of the movement state of the active sealing strip and identification of abnormalities, potential production problems can be discovered and solved in a timely manner, thereby optimizing the production process and improving product quality and production efficiency. In addition, it can also provide data support for the optimization design and improvement of the production line, and promote the intelligentization and automation level of the production line. The technical solution adopts a modular design and is easy to integrate and expand with other monitoring systems and production equipment. With the continuous upgrading and expansion of the production line, new monitoring points and parameters can be easily added to meet more complex production needs. At the same time, it also supports remote monitoring and data analysis functions, providing a more convenient and efficient means for production management and decision-making.

[0032] In summary, the technical solution has significant technical effects in terms of performance indicators. It not only improves the monitoring accuracy of the movement status of the movable sealing strip and the timeliness and accuracy of abnormality identification, but also improves the reliability and maintainability of the system, providing strong support for optimizing production processes and improving product quality.

[0033] In another embodiment, the component channel includes a transmission transport mechanism and a positioning mechanism; The transmission transport mechanism is used to transport the test vehicle along a preset direction; The positioning mechanism is used to detect the transport status of the test carrier along a preset direction, so as to determine whether the test carrier is transported into the sub-area; when the test carrier is transported into the sub-area, the transmission transport mechanism suspends the transport of the test carrier.

[0034] The beneficial effects of the above embodiments are that, in practical applications, the component channel may include a transmission transport structure composed of components such as chains and gears to transport the test carrier along a preset direction, which can improve the transportation stability and continuity of the test carrier. Figure 2 It can be seen that the component channel is provided with several test studios arranged in sequence. If the distance that the test carrier is transported in the component channel at a time exceeds the distance between two adjacent test studios, the test carrier cannot be accurately transferred to the next test studio that needs to be tested, that is, the test carrier cannot be continuously tested for TCR, resulting in the loss of TCR test data of the test carrier. In order to ensure that the test carrier can be accurately and comprehensively transferred to all test studios in sequence for TCR testing, infrared positioning sensors and other positioning mechanisms are set inside the component channel to detect the length of the transportation distance of the test carrier along the preset direction. When the distance corresponding to the single transportation of the test carrier is equal to the distance between two adjacent test studios, it indicates that the test carrier has been transported to the next sub-area. At this time, the transmission transportation mechanism is controlled to suspend the transportation of the test carrier, so that all test carriers placed on the component channel can be accurately transported to the corresponding sub-area and aligned with the corresponding test studio, so as to facilitate the subsequent accurate transfer of the test carrier to the corresponding test work for TCR testing.

[0035] In another embodiment, the test vehicle includes a high-precision alloy resistor and a test contact; the test contact is connected to the high-precision alloy resistor; When the test carrier is transferred to the testing studio, the testing studio performs TCR testing on the high-precision alloy resistor through the test contacts.

[0036] The beneficial effect of the above embodiment is that the test carrier may include a limiting structure and a test contact, wherein the limiting structure is used to fix the high-precision alloy resistor. When the high-precision alloy resistor is placed on the limiting structure, the high-precision alloy resistor will be in electrical contact with the test contact. The position of the test contact on the test carrier is fixed. When the high-precision alloy resistor is placed on the limiting structure and is in electrical contact with the test contact, if the test carrier is transferred to the inside of the detection studio as a whole, the test contact of the test carrier will be accurately electrically connected to the TCR detection circuit inside the detection studio, and the TCR detection of the high-precision alloy resistor can be performed instantly whenever the test carrier is transferred to the inside of the detection studio, so as to realize batch rapid TCR detection of a large number of high-precision alloy resistors. Since the mass-produced high-precision alloy resistors have the same shape and size, at this time, the high-precision alloy resistor only needs to be placed in the limiting structure of the test carrier to automatically and quickly perform TCR detection.

[0037] In another embodiment, all the detection studios have different ambient temperatures inside, so that different detection studios are used to perform TCR detection on the same test vehicle in sequence under different temperature conditions.

[0038] The beneficial effect of the above embodiment is that in actual operation, the ambient temperature inside all the detection studios is -50°C, -25°C, 0°C, 25°C, 50°C, 75°C, 100°C, 125°C... and so on along the preset direction. In this way, as the component channel continues to transport the test carrier, the test carrier can be placed under different ambient temperature conditions for continuous automated TCR testing, thereby realizing large-scale batch testing of high-precision alloy resistors. The setting of the ambient temperature inside all the above-mentioned detection studios belongs to one of the temperature setting methods. Technicians in this field can set the ambient temperature inside all the detection studios according to actual needs, and no further examples are given here.

[0039] In another embodiment, the detection studio includes a temperature adjustment mechanism, a heat exchange mechanism, a data detection mechanism and a controller; The controller is used to control the operation of the temperature adjustment mechanism, the heat exchange mechanism and the data detection mechanism; The data testing organization is used to perform TCR testing on the test vehicle that is transferred to the testing studio; The temperature adjustment mechanism and the heat exchange mechanism are used to adjust the ambient temperature inside the detection studio, so that the ambient temperature inside the detection studio can be maintained at a constant value.

[0040] The beneficial effect of the above embodiment is that the detection studio is used to provide a stable ambient temperature condition for the TCR detection of high-precision alloy resistors under sealed conditions filled with nitrogen or other protective gases. In order to improve the temperature adjustment efficiency of the detection studio and reduce temperature drift jitter, a temperature adjustment mechanism and a heat exchange mechanism are set inside the detection studio, and a controller is used to control the temperature adjustment mechanism and the heat exchange mechanism, so that the temperature adjustment mechanism and the heat exchange mechanism adjust the heat inside the detection studio and the heat exchange rate with the outside world, so that the detection studio can maintain a constant ambient temperature value, and provide a reliable temperature environment for the data detection mechanism to accurately perform TCR detection on the high-precision alloy resistor. The data detection mechanism may include but is not limited to a voltage-adjustable power supply and a current sensor, which are used to apply a fixed voltage to the high-precision alloy resistor and detect the current value flowing through the high-precision alloy resistor.

[0041] In another embodiment, the temperature adjustment mechanism includes a refrigeration device; The heat exchange mechanism includes a heating device and a convection fan.

[0042] The beneficial effect of the above-mentioned embodiment is that in actual operation, the temperature adjustment mechanism is configured to include refrigeration equipment such as a condenser, and the heat exchange mechanism is configured to include heating equipment and a convection fan, so as to lower and increase the ambient temperature inside the detection studio, accurately maintain the ambient temperature inside the detection studio at a constant value, and avoid the drift and jitter of the ambient temperature inside the detection studio affecting the TCR detection accuracy of the high-precision alloy resistor.

[0043] In another embodiment, a carrier transfer mechanism includes a sealing door component and a drive component; When the carrier transfer mechanism is in an idle state, the test carrier passes through the inside of the sealed door component and is transported in a preset direction; When the carrier transfer mechanism is in working state, the test carrier is confined inside the sealing door component, the driving component drives the sealing door component to move, thereby transferring the test carrier to the inside of the detection studio, and the sealing door component seals the detection studio.

[0044] The beneficial effects of the above embodiments are as follows: Figure 2-3 As shown, Figure 2 and 3 The action forms corresponding to the idle state and working state of the carrier transfer mechanism respectively. The carrier transfer mechanism includes a sealing door component and a driving component; wherein, when the carrier transfer mechanism is in the idle state, the carrier transfer mechanism is in the initial position, at which time the test carrier passes through the inside of the sealing door component and is transported along the preset direction, and the carrier transfer mechanism does not move the test carrier; when the carrier transfer mechanism is in the working state, the component channel suspends the transportation of the test carrier, so that the test carrier stops moving. At this time, the test carrier is confined inside the sealing door component, and the driving component drives the sealing door component to move, thereby transferring the test carrier to the inside of the inspection studio, and the sealing door component seals the inspection studio. wherein, the sealing door component is used to isolate the gap space between the inspection studio and the component channel, to avoid heat exchange between the inside of the inspection studio and the component channel, resulting in ambient temperature drift and jitter inside the inspection studio, and effectively reduce energy loss inside the inspection studio. Figure 2-3 It can be seen that the carrier transfer mechanism can be set in cooperation with the component channel in the form of a top pull seal; Figure 4 It can be seen that the carrier transfer mechanism can also be set up in cooperation with the component channel in a bottom push sealing manner; whether the carrier transfer mechanism is set up in a top pull sealing manner or a bottom push sealing manner, it can realize the sealing operation of the inspection studio during the transfer of the test carrier, which is not described in detail here.

[0045] In another embodiment, the sealing door component includes two sealing doors whose relative position relationship is fixed and can move synchronously; when the carrier transfer mechanism is in an idle state, the two sealing doors are respectively located on opposite sides of the component channel along a preset direction; The driving component includes at least one driving cylinder; the driving cylinder is connected to one of the sealing doors, and when the driving cylinder is extended and retracted, the carrier transfer mechanism switches between an idle state and a working state.

[0046] The beneficial effects of the above embodiments are as follows: the sealing door component includes two sealing doors whose relative position relationship is fixed and can move synchronously; the driving component includes at least one driving cylinder; and the driving cylinder is connected to one of the sealing doors. When the carrier transfer mechanism is in an idle state, the two sealing doors are respectively located on opposite sides of the component channel along a preset direction. When the driving cylinder is extended and retracted, the carrier transfer mechanism switches between an idle state and a working state, so that the carrier transfer mechanism transfers the corresponding test carrier to the corresponding test studio for TCR testing, thereby improving the TCR automated testing ratio, ensuring the consistency of the test results, and reducing the energy consumption of the test process.

[0047] In addition, Figure 5 As shown, the high-precision alloy resistor TCR detection system is also connected to a server (such as a computer terminal) through a control network and an acquisition network, so that the server can manage the action states of the component channels and the carrier transfer mechanism in the high-precision alloy resistor TCR detection system through the control network and the acquisition network respectively, and collect the TCR detection data generated by the detection studio, thereby realizing integrated control of the high-precision alloy resistor TCR detection system.

[0048] See also Figure 6 As shown, a high-precision alloy resistor TCR detection method provided by an embodiment of the present application. The high-precision alloy resistor TCR detection method includes: Step S1, filling protective gas into all the detection studios, and performing temperature adjustment and / or heat exchange operations on all the detection studios, so that different constant ambient temperature values ​​are maintained inside all the detection studios; before actually performing TCR detection on the high-precision alloy resistor, it is necessary to pre-adjust the temperature of all the detection studios so that all the detection studios can maintain the ambient temperature that they need to provide. For this purpose, all the detection studios are linked, and the server is used to control all the detection studios and component channels, so that all the detection studios and component channels enter the corresponding operation mode; in addition, protective gases such as nitrogen are filled into all the detection studios and component channels to prevent the high-precision alloy resistors from coming into contact with the air and being oxidized; Step S2, identifying the transportation status of the test carrier in the component channel, when the test carrier is transported to the corresponding sub-area, controlling the carrier transfer mechanism to transfer the test carrier in the corresponding sub-area to the corresponding inspection studio; placing a number of test carriers in one-to-one correspondence at different corresponding positions on the component channel, at this time the component channel will transport all the test carriers along the preset direction, perform positioning detection on the transportation status of the test carrier (such as the length of the transportation distance, etc.), and determine whether the test carrier is transported to the corresponding sub-area of ​​the component channel. If so, control the carrier transfer mechanism to transfer the test carrier in the corresponding sub-area to the corresponding inspection studio, so as to realize batch and continuous TCR detection of high-precision alloy resistors contained in all test carriers on the component channel; Step S3, performing TCR detection on the test carrier transferred to the testing studio to obtain corresponding TCR detection data; performing automated TCR detection on the high-precision alloy resistor of the test carrier transferred to the testing studio through the data detection mechanism inside the testing studio to obtain TCR detection data of the high-precision alloy resistor under corresponding ambient temperature conditions, thereby providing a reliable data basis for subsequent analysis of the resistance value variation characteristics of the high-precision alloy resistor with temperature; Step S4, repeat the above steps S2-S3 until the test vehicle completes the TCR detection inside all detection studios, and stores the corresponding TCR detection data of the test vehicle inside all detection studios, so as to facilitate the subsequent accurate TCR characteristic analysis of all high-precision alloy resistors in mass production.

[0049] In general, the high-precision alloy resistor TCR detection system and method include: a component channel, which is used to transport the test carrier along a preset direction; the component channel includes several sub-areas in sequence along the preset direction, and each sub-area corresponds to a detection studio; each detection studio includes a carrier transfer mechanism, when the test carrier is transported to the sub-area corresponding to the detection studio along the preset direction in the component channel, the component channel suspends transportation, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding detection studio; the detection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under corresponding temperature conditions; the component channel is used to automatically transport the test carrier containing the high-precision alloy resistor, and multiple detection studios are used to provide a sealed detection environment with different stable temperature values, so that the resistors can quickly and stably reach the target temperature and avoid oxidation, thereby realizing batch detection of resistors, improving the TCR automatic detection ratio, ensuring the consistency of the detection results, and reducing the energy consumption of the detection process.

[0050] The above is only a specific implementation of the present invention, and any other improvements made based on the concept of the present invention are considered to be within the protection scope of the present invention.

Claims

1. High-precision alloy resistor TCR detection system, characterized by: include: Parts channel, used to transport test vehicles in a preset direction; The component channel includes a plurality of sub-areas in sequence along the preset direction, and each sub-area is correspondingly provided with a detection studio; Each inspection studio includes a carrier transfer mechanism. When the test carrier is transported along the preset direction in the component channel to the sub-area corresponding to the inspection studio, the component channel suspends transportation, and the carrier transfer mechanism transfers the test carrier from the sub-area to the corresponding inspection studio; the inspection studio performs TCR detection on the high-precision alloy resistor inside the test carrier under corresponding temperature conditions.

2. The high-precision alloy resistor TCR detection system according to claim 1, characterized in that: In the component channel, a movable sealing strip is provided between any two adjacent sub-areas; When the component channel transports the test vehicle, all movable sealing strips are located at their corresponding avoidance positions; When the transportation of the component channel is suspended, all movable sealing strips move from their corresponding avoidance positions to corresponding positions of the component channel, thereby sealing and isolating the two corresponding sub-areas.

3. The high-precision alloy resistor TCR detection system according to claim 2, characterized in that: Real-time monitoring of the operating parameters of each movable sealing strip moving from its corresponding avoidance position to the corresponding position of the component channel; wherein the operating parameters include movement time, movement speed, displacement accuracy, vibration frequency and vibration amplitude; Acquire a first motion parameter using the motion time, the motion speed and the displacement accuracy; The first motion parameter is obtained by the following formula: Among them, P 01 represents the first motion parameter; D represents the displacement accuracy; D z represents the total distance from the avoidance position to the corresponding position of the component channel; n represents the number of movement speed acquisitions; v i represents the speed value corresponding to the i-th motion speed acquisition; v i-1 represents the motion speed value corresponding to the i-1th motion speed acquisition; v bi represents the standard deviation of the motion speed corresponding to the i-th acquisition; P v represents the rate of change of the movement speed corresponding to the current running moment; T represents the movement time of the movable sealing strip from the corresponding avoidance position to the corresponding position of the component channel; T max Indicates the preset maximum allowed exercise duration; Acquire a second motion parameter using the vibration frequency and the vibration amplitude; The second motion parameter is obtained by the following formula: Among them, P 02 represents the second motion parameter; F represents the vibration frequency; F max Indicates the preset maximum allowable vibration frequency value; A indicates the vibration amplitude; A max Indicates the preset maximum allowable vibration amplitude value; Obtaining a comprehensive motion parameter using the first motion parameter and the second motion parameter; The comprehensive motion parameters are obtained by the following formula: Where P represents the comprehensive motion parameter; P 01 represents the first motion parameter; P 02 Indicates the second motion parameter; max() means taking the maximum value of the two values ​​in the brackets; Comparing the comprehensive motion parameter with a preset parameter threshold; When the comprehensive motion parameter exceeds a preset parameter threshold, it is determined that the operation of the active sealing strip is abnormal, and an abnormal alarm is issued; otherwise, it is determined that the operation of the active sealing strip is not abnormal.

4. The high-precision alloy resistor TCR detection system according to claim 1, characterized in that: The component channel includes a transmission and transportation mechanism and a positioning mechanism; The transmission and transportation mechanism is used to transport the test carrier along a preset direction; The positioning mechanism is used to detect the transportation status of the test carrier along the preset direction, so as to determine whether the test carrier is transported into the sub-area; when the test carrier is transported into the sub-area, the transmission and transportation mechanism suspends the transportation of the test carrier.

5. The high-precision alloy resistor TCR detection system according to claim 1, characterized in that: The test vehicle comprises a high-precision alloy resistor and a test contact; the test contact is connected to the high-precision alloy resistor; When the test carrier is transferred into the testing studio, the testing studio performs TCR testing on the high-precision alloy resistor through the testing contacts.

6. The high-precision alloy resistor TCR detection system according to claim 1, characterized in that: All test studios have different ambient temperatures inside, so different test studios can be used to perform TCR tests on the same test vehicle under different temperature conditions in turn.

7. The high-precision alloy resistor TCR detection system according to claim 1, characterized in that: The detection studio includes a temperature adjustment mechanism, a heat exchange mechanism, a data detection mechanism and a controller; The controller is used to control the operation of the temperature adjustment mechanism, the heat exchange mechanism and the data detection mechanism; The data detection mechanism is used to perform TCR detection on the test vehicle transferred to the inside of the detection studio; The temperature adjustment mechanism and the heat exchange mechanism are used to adjust the ambient temperature inside the detection studio, so that a constant ambient temperature value can be maintained inside the detection studio.

8. The high-precision alloy resistor TCR detection system according to claim 7, characterized in that: The temperature adjustment mechanism includes a refrigeration device; The heat exchange mechanism includes a heating device and a convection fan.

9. The high-precision alloy resistor TCR detection system according to claim 1, characterized in that: The carrier transfer mechanism includes a sealing door component and a driving component; When the carrier transfer mechanism is in an idle state, the test carrier passes through the inside of the sealed door component and is transported along a preset direction; When the carrier transfer mechanism is in working state, the test carrier is confined inside the sealing door component, the driving component drives the sealing door component to move, thereby transferring the test carrier to the inside of the detection studio, and the sealing door component seals the detection studio.

10. The high-precision alloy resistor TCR detection system according to claim 9, characterized in that: The sealing door component comprises two sealing doors whose relative position relationship is fixed and can move synchronously; when the carrier transfer mechanism is in an idle state, the two sealing doors are respectively located on opposite sides of the component channel along the preset direction; The driving component includes at least one driving cylinder; the driving cylinder is connected to one of the sealing doors, and when the driving cylinder is extended and retracted, the carrier transfer mechanism switches between an idle state and a working state.

11. A detection method using the high-precision alloy resistor TCR detection system according to any one of claims 1 to 10, characterized in that: include: Step S1, filling protective gas into all detection studios, and performing temperature adjustment and / or heat exchange operations on the inside of all detection studios, so that different constant ambient temperature values ​​are maintained inside all detection studios; Step S2, identifying the transportation status of the component channel to the test carrier, and when the test carrier is transported to the inside of the corresponding sub-area, controlling the carrier transfer mechanism to transfer the test carrier in the corresponding sub-area to the inside of its corresponding inspection studio; Step S3, performing TCR detection on the test vehicle transferred to the testing studio to obtain corresponding TCR detection data; Step S4, repeating the above steps S2-S3 until the test vehicle completes the TCR detection inside all the detection studios, and storing the corresponding TCR detection data of the test vehicle inside all the detection studios.

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