Testing device and testing method for multi-path microwave transceiving assembly
By designing an automated test device for multi-channel microwave transmission and reception components, the problems of low testing efficiency and insufficient accuracy in the prior art are solved, and an efficient and accurate testing process is achieved.
Patent Information
- Application Number
- CN202411948035.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-12-27
- Publication Date
- 2025-04-11
AI Technical Summary
In the prior art, the multi-channel microwave transmitter and reception components of microwave detectors with phased array systems are inefficient in testing, which can easily lead to personnel fatigue and test errors. At the same time, repeated plugging and unplugging of high-frequency cables will lead to cable damage and affect the test accuracy.
A test device for a multi-channel microwave transceiver component is designed, including interconnected auxiliary equipment, a host computer and a test module. Through a timing control module, the working timing of the first test channel, the second test channel and the multi-channel microwave transceiver component are automatically controlled to realize automated testing.
No manual testing is required, which improves testing efficiency, ensures the accuracy and accuracy of the test, reduces the number of plugging and unplugging of high-frequency cables, and avoids cable damage.
Smart Images
Figure CN119814186A_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of microwave detector testing, and in particular to a testing device and a testing method for a multi-channel microwave transceiver component. Background Art
[0002] With the rapid development of microwave technology, phased array microwave detectors have become more and more widespread. The core component of phased array detectors is a multi-channel microwave transceiver assembly, which often contains hundreds of transceiver channels, and each channel must be tested in detail, which brings a huge amount of unnecessary duplication of work to the testing work.
[0003] At present, testing work is generally done manually or semi-manually, with low test efficiency. Frequent repetitive work can easily lead to personnel fatigue and test errors. At the same time, high-frequency repeated plugging and unplugging of high-frequency cables can easily cause cable damage, affecting test accuracy. Summary of the invention
[0004] The present invention provides a testing device and a testing method for a multi-channel microwave transceiver component, which eliminates the need for manual testing of the multi-channel microwave transceiver component inside a microwave detector, thereby improving testing efficiency and ensuring testing accuracy and precision.
[0005] In order to achieve the above object, the present invention adopts the following technical solution:
[0006] In a first aspect, the present invention provides a testing device for a multi-channel microwave transceiver assembly, comprising: an auxiliary device, a host computer and a testing module connected to each other, the testing module being connected to the multi-channel microwave transceiver assembly;
[0007] The test module is used to test the multi-channel microwave transceiver assembly, including a timing control module, a first test channel and a second test channel connected to the timing control module; the timing control module is used to control the working timing of the first test channel, the second test channel and the multi-channel microwave transceiver assembly;
[0008] The first test channel and the second test channel are both used for signal transmission;
[0009] The first test channel includes: a first switch matrix unit, a first interface unit and a first data acquisition processing unit connected in sequence; wherein the first switch matrix unit is connected to the multi-channel microwave transceiver assembly, the first interface unit is connected to the auxiliary equipment, and the first data acquisition processing unit is connected to the host computer;
[0010] The second test channel includes: a second switch matrix unit, a second interface unit and a second data acquisition processing unit connected in sequence; wherein the second switch matrix unit is connected to the multi-channel microwave transceiver assembly, the second interface unit is connected to the auxiliary equipment, and the second data acquisition processing unit is connected to the host computer;
[0011] The first switch matrix unit, the first interface unit, the second switch matrix unit and the second interface unit are all connected to the timing control module, and the timing control module is also connected to the host computer.
[0012] The above-mentioned testing device provided by the present invention can directly perform automatic testing on multiple transceiver channels in a multi-channel microwave transceiver component through the host computer control auxiliary equipment and the test module, without the need for manual testing of the multi-channel microwave transceiver component inside the microwave detector, thereby improving the testing efficiency and ensuring the testing accuracy and precision.
[0013] In an implementation of the first aspect, the first switch matrix unit is provided with 8 ports, 2 ports and a control port, the 8 ports of the first switch matrix unit are connected to the multi-channel microwave transceiver assembly through a first high-frequency connector, the 2 ports of the first switch matrix unit are connected to the first interface unit through a first high-frequency cable, and the control port of the first switch matrix unit is connected to the timing control module through a first low-frequency connector.
[0014] The second switch matrix unit is also provided with 8 ports, 2 ports and a control port. The 8 ports of the second switch matrix unit are connected to the multi-channel microwave transceiver assembly through a second high-frequency connector, the 2 ports of the second switch matrix unit are connected to the second interface unit through a second high-frequency cable, and the control port of the second switch matrix unit is connected to the timing control module through a second low-frequency connector.
[0015] In an implementation manner of the first aspect, the first switch matrix unit and the second switch matrix unit each include a plurality of radio frequency switches.
[0016] In an implementation of the first aspect, the plurality of radio frequency switches are in any of the following forms:
[0017] The first type is divided into four layers, the first layer is provided with a single-pole double-throw switch, the second layer is provided with a single-pole double-throw switch, the third layer is provided with two single-pole double-throw switches, and the fourth layer is provided with four single-pole double-throw switches, each single-pole double-throw switch includes port 1 and port 2; wherein, port 2 of the single-pole double-throw switch of the first layer is used as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected with port 1 of the single-pole double-throw switch of the second layer, port 2 of the single-pole double-throw switch of the second layer is connected with port 1 of the two single-pole double-throw switches of the third layer, port 2 of the two single-pole double-throw switches of the third layer is connected with port 1 of the four single-pole double-throw switches of the fourth layer, and port 2 of the four single-pole double-throw switches of the fourth layer constitutes 8 ports of the switch matrix;
[0018] The second type is divided into three layers, the first layer is provided with a single-pole double-throw switch, the second layer is provided with a single-pole double-throw switch, and the third layer is provided with two single-pole four-throw switches, each single-pole four-throw switch includes 1 port and 4 ports; wherein, the 2nd port of the single-pole double-throw switch of the first layer is used as the 2nd port of the switch matrix, the 1st port of the single-pole double-throw switch of the first layer is connected with the 1st port of the single-pole double-throw switch of the second layer, the 2nd port of the single-pole double-throw switch of the second layer is connected with the 1st port of the two single-pole four-throw switches of the third layer, and the 4th ports of the two single-pole four-throw switches of the third layer constitute the 8th port of the switch matrix;
[0019] The third type is divided into two layers. A single-pole double-throw switch is set in the first layer, and a single-pole eight-throw switch is set in the second layer. The single-pole eight-throw switch includes port 1 and port 8. Among them, port 2 of the single-pole double-throw switch of the first layer is used as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected to port 1 of the single-pole eight-throw switch of the second layer, and port 8 of the single-pole eight-throw switch of the second layer is used as port 8 of the switch matrix.
[0020] In an implementation of the first aspect, the first interface unit is provided with 2 ports, 4 ports, and a control port, the 2 ports of the first interface unit are connected to the 2 ports of the first switch matrix unit, the 4 ports of the first interface unit are connected to the first data acquisition processing unit and the auxiliary device, and the control port of the first interface unit is connected to the timing control module;
[0021] The second interface unit is also provided with 2 ports, 4 ports and a control port. The 2 ports of the second interface unit are connected to the 2 ports of the second switch matrix unit, the 4 ports of the second interface unit are connected to the second data acquisition processing unit and the auxiliary equipment, and the control port of the second interface unit is connected to the timing control module.
[0022] In an implementation of the first aspect, the first data acquisition processing unit includes a third low-frequency connector, a first data processing chip, and a first communication conversion chip connected in sequence; the third low-frequency connector is connected to the first interface unit, and the first communication conversion chip is connected to the host computer. The second data acquisition processing unit includes a fourth low-frequency connector, a second data processing chip, and a second communication conversion chip connected in sequence; the fourth low-frequency connector is connected to the second interface unit, and the second communication conversion chip is connected to the host computer.
[0023] In an implementation manner of the first aspect, the auxiliary device includes at least one of a vector network analyzer, a signal source, a spectrum analyzer, a high-speed oscilloscope, a power meter, and a noise meter.
[0024] In an implementation manner of the first aspect, the method further includes: a power supply unit connected to the timing control module.
[0025] In a second aspect, the present invention provides a test method for a multi-channel microwave transceiver assembly, based on the above-mentioned test device, comprising:
[0026] The host computer sends a control signal to the timing control module. After receiving the control signal, the timing control module controls the auxiliary device to send a radio frequency signal through the first interface unit / the second interface unit;
[0027] The radio frequency signal is transmitted to the multi-channel microwave transceiver component through the first interface unit / the second interface unit, and the radio frequency signal outputs a feedback signal after passing through the multi-channel microwave transceiver component;
[0028] The feedback signal is transmitted to the first interface unit / the second interface unit through the first switch matrix unit / the second switch matrix unit; the first interface unit / the second interface unit inputs the feedback signal to the first data acquisition processing unit / the second data acquisition processing unit for processing, thereby obtaining a processed feedback signal;
[0029] The first data acquisition processing unit / the second data acquisition processing unit transmits the processed feedback signal to the host computer. BRIEF DESCRIPTION OF THE DRAWINGS
[0030] Figure 1 This is one of the schematic diagrams of the architecture of a testing device for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0031] Figure 2 This is a second schematic diagram of the architecture of a testing device for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0032] Figure 3 This is a third schematic diagram of the architecture of a testing device for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0033] Figure 4 This is a fourth schematic diagram of the architecture of a testing device for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0034] Figure 5 This is a fifth schematic diagram of the architecture of a testing device for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0035] Figure 6 This is a sixth schematic diagram of the architecture of a testing device for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0036] Figure 7 This is one of the schematic diagrams of the architecture of a test device in a test method for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0037] Figure 8 This is a second schematic diagram of the architecture of a test device in a test method for a multi-channel microwave transceiver component provided in an embodiment of the present application;
[0038] Fig. 9 This is the third architectural schematic diagram of a test device in a test method for a multi-channel microwave transceiver component provided in an embodiment of the present application. DETAILED DESCRIPTION
[0039] The terms "first" and "second" etc. in the description and claims of the present invention are used to distinguish different objects rather than to describe a specific order of the objects.
[0040] The “and / or” in the embodiments of the present application indicates the relationship between objects. For example, A and / or B may indicate the following three situations: A exists alone, B exists alone, and A and B exist at the same time.
[0041] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.
[0042] The method and device provided in the embodiments of the present application relate to a microwave detector and can be used to test the microwave detector. Specifically, the multi-channel microwave transceiver components inside the microwave detector are tested by the test device.
[0043] In the prior art, the testing of phased array detectors is mainly performed manually, resulting in low testing efficiency, and the test accuracy and test precision cannot be guaranteed. In order to solve the above problems, the present invention provides a testing device and a testing method for a multi-channel microwave transceiver component, which does not require manual testing of the multi-channel microwave transceiver component inside the microwave detector, can improve the testing efficiency, and ensure the test accuracy and test precision.
[0044] Embodiment 1: This embodiment describes a test device for a multi-channel microwave transceiver assembly, such as Figure 1 As shown, it includes: auxiliary equipment, a host computer and a test module connected to each other, and the test module is connected to a multi-channel microwave transceiver component.
[0045] It should be noted that the auxiliary device receives the control signal from the host computer; the test module receives the control signal from the host computer and sends the test signal to the host computer; the test module sends signals to the auxiliary device and also receives signals from the auxiliary device.
[0046] The auxiliary equipment includes at least one of a vector network analyzer, a signal source, a spectrum analyzer, a high-speed oscilloscope, a power meter and a noise meter.
[0047] The test module is used to test multi-channel microwave transceiver components. Figure 1 ,like Figure 2 As shown, it includes a timing control module, a first test channel and a second test channel connected to the timing control module; the timing control module is used to control the working timing of the first test channel, the second test channel and the multi-channel microwave transceiver component.
[0048] The timing control unit includes a processor, which may be an MCU device (Microcontroller Unit) or a CPLD device (Complex Programmable Logic Device).
[0049] The first test channel and the second test channel are both used for signal transmission.
[0050] The first test channel is described in detail below.
[0051] The first test channel includes: a first switch matrix unit, a first interface unit, and a first data acquisition processing unit connected in sequence; wherein the first switch matrix unit is connected to a multi-channel microwave transceiver assembly, the first interface unit is connected to an auxiliary device, and the first data acquisition processing unit is connected to a host computer. It can be understood that the main function of the first interface unit in this embodiment is to expand the output port of the first switch matrix unit.
[0052] Among them, the first switch matrix unit is provided with 8 ports, 2 ports and a control port. The 8 ports of the first switch matrix unit are connected to the multi-channel microwave transceiver assembly through the first high-frequency connector, the 2 ports of the first switch matrix unit are connected to the first interface unit through the first high-frequency cable, and the control port of the first switch matrix unit is connected to the timing control module through the first low-frequency connector.
[0053] The first interface unit is provided with 2 ports, 4 ports and a control port. The 2 ports of the first interface unit are connected to the 2 ports of the first switch matrix unit, the 4 ports of the first interface unit are connected to the first data acquisition processing unit and the auxiliary equipment, and the control port of the first interface unit is connected to the timing control module.
[0054] The first data acquisition processing unit includes a third low-frequency connector, a first data processing chip and a first communication conversion chip connected in sequence; the third low-frequency connector is connected to the first interface unit, and the first communication conversion chip is connected to the host computer;
[0055] The second test channel is described in detail below.
[0056] The second test channel includes: a second switch matrix unit, a second interface unit and a second data acquisition processing unit connected in sequence; wherein the second switch matrix unit is connected to the multi-channel microwave transceiver assembly, the second interface unit is connected to the auxiliary equipment, and the second data acquisition processing unit is connected to the host computer. It can be understood that the main function of the second interface unit in this embodiment is to expand the output port of the second switch matrix unit.
[0057] Among them, the second switch matrix unit is also provided with 8 ports, 2 ports and a control port. The 8 ports of the second switch matrix unit are connected to the multi-channel microwave transceiver assembly through a second high-frequency connector, the 2 ports of the second switch matrix unit are connected to the second interface unit through a second high-frequency cable, and the control port of the second switch matrix unit is connected to the timing control module through a second low-frequency connector.
[0058] The second interface unit is also provided with 2 ports, 4 ports and a control port. The 2 ports of the second interface unit are connected to the 2 ports of the first switch matrix unit, the 4 ports of the second interface unit are connected to the second data acquisition processing unit and the auxiliary equipment, and the control port of the second interface unit is connected to the timing control module.
[0059] Optionally, the high-frequency connector may be an SMA connector, or a connector of a type such as SSMA, SMP or SMC. The low-frequency connector may be a rectangular connector, or a row connector or a board-to-board plug-in connector.
[0060] Specifically, the first switch matrix unit and the second switch matrix unit each include a plurality of radio frequency switches.
[0061] like Figure 3 As shown, the above-mentioned multiple RF switches are: divided into four layers, a single-pole double-throw switch is set in the first layer, a single-pole double-throw switch is set in the second layer, two single-pole double-throw switches are set in the third layer, and four single-pole double-throw switches are set in the fourth layer, and each single-pole double-throw switch includes port 1 and port 2; wherein, port 2 of the single-pole double-throw switch of the first layer serves as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected to port 1 of the single-pole double-throw switch of the second layer, port 2 of the single-pole double-throw switch of the second layer is connected to port 1 of the two single-pole double-throw switches of the third layer, port 2 of the two single-pole double-throw switches of the third layer is connected to port 1 of the four single-pole double-throw switches of the fourth layer, and port 2 of the four single-pole double-throw switches of the fourth layer constitutes 8 ports of the switch matrix.
[0062] The second data acquisition processing unit includes a fourth low-frequency connector, a second data processing chip and a second communication conversion chip connected in sequence; the fourth low-frequency connector is connected to the second interface unit, and the second communication conversion chip is connected to the host computer.
[0063] It should be understood that the first data acquisition processing unit and the second data acquisition processing unit both have functional modules such as data acquisition, data processing and communication. The first data acquisition processing unit and the second data acquisition processing unit are connected to the host computer via Ethernet or serial communication, and can also be connected to the control port of the multi-channel microwave transceiver component via serial communication.
[0064] Furthermore, the first switch matrix unit, the first interface unit, the second switch matrix unit and the second interface unit are all connected to the timing control module, and the timing control module is also connected to the host computer.
[0065] It should be noted that, in this embodiment, the connection relationship between the timing control module and the first switch matrix unit, the first interface unit, the second switch matrix unit and the second interface unit is a unidirectional connection, that is, the first switch matrix unit, the first interface unit, the second switch matrix unit and the second interface unit receive the control signal sent by the timing control module. The connection relationship between the timing control module and the host computer, as well as other connections in the test device are all bidirectional connections, that is, either of the two interconnected parties can receive signals from the other party, and can also send signals to the other party.
[0066] Specifically, the timing control module communicates with the host computer through protocols such as 485, 422 or SPI. The host computer communicates the control command after calculation to the processor of the timing control unit, and the processor parses the received command and sends it to each port for execution. The timing control unit communicates with the multi-channel microwave transceiver component through protocols such as 485, 422 or SPI, and has the function of controlling the signal of the switch of the multi-channel microwave transceiver component.
[0067] Understandable, such as Figure 4 As shown, the above-mentioned testing device also includes: a power supply unit connected to the timing control module.
[0068] Specifically, the power supply unit is mainly composed of devices such as DC-DC (Direct Current - Direct Current, which converts fixed DC voltage into variable DC voltage) and LDO (Low Dropout Regulator). Its main function is to provide power for the test device, and the main output power includes DC power supplies such as ±5V, 3.3V, and ±8V. The external input port of the power supply unit can be a rectangular connector or a dedicated power port, and the internal output port of the power supply unit is a rectangular connector. Since the internal structure of the power supply unit is a common setting in the field, this embodiment will not be described in detail here.
[0069] In this embodiment, the power supply unit has an enable control function, and the specific working principle is: the host computer transmits the enable instruction to the timing control module, and the timing control module controls the enable port level of the power supply unit to achieve enable control, and the control level voltage is 3.3v or 5v. The power supply unit and the timing control module can be interconnected through a rectangular connector, and the diameter of the metal wire between the connectors is not less than 0.15mm.
[0070] Embodiment 2: The difference between this embodiment and embodiment 1 is that Figure 5 As shown, multiple RF switches are divided into three layers, a single-pole double-throw switch is set in the first layer, a single-pole double-throw switch is set in the second layer, and two single-pole four-throw switches are set in the third layer, and each single-pole four-throw switch includes port 1 and port 4; wherein, port 2 of the single-pole double-throw switch of the first layer serves as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected to port 1 of the single-pole double-throw switch of the second layer, port 2 of the single-pole double-throw switch of the second layer is connected to port 1 of the two single-pole four-throw switches of the third layer, and ports 4 of the two single-pole four-throw switches of the third layer constitute 8 ports of the switch matrix.
[0071] Embodiment 3: This embodiment differs from Embodiment 1 in that Figure 6As shown, multiple RF switches are divided into two layers, a single-pole double-throw switch is set in the first layer, and a single-pole eight-throw switch is set in the second layer. The single-pole eight-throw switch includes 1 port and 8 ports, wherein port 2 of the single-pole double-throw switch of the first layer is used as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected to port 1 of the single-pole eight-throw switch of the second layer, and port 8 of the single-pole eight-throw switch of the second layer is used as port 8 of the switch matrix.
[0072] Example 4: This example describes a test method for a multi-channel microwave transceiver assembly, which is implemented by the test device provided in Example 1 and includes a preparation phase and a test phase.
[0073] The preparation stage is described in detail below. The preparation stage includes S101-S104.
[0074] S101, determine the test index, connect the test module, the vector network analyzer to be used, and the multi-channel microwave transceiver component through cables, and check whether the connection is correct. After power on, send a communication signal through the host computer to check whether the communication of each port is normal.
[0075] Specifically, the signal transmitting end of the vector network analyzer is connected to the 4 ports of the first interface unit and the 4 ports of the second interface unit. After the connection, the connection diagram between the test device and the multi-channel microwave transceiver assembly is as shown in FIG. Figure 7 The host computer and the vector network analyzer communicate via a network cable or GPIB technology protocol to achieve data exchange.
[0076] S102. Select the product function to be tested on the host computer to call the test software, and set parameters for the vector network analyzer, including indicators such as working bandwidth, center frequency, and signal power.
[0077] S103, after the vector network analyzer is set, the host computer sets the required number of test links, and controls the first switch matrix unit / the second switch matrix unit in the test module to select the links in the multi-channel microwave transceiver assembly to be tested.
[0078] S104, the host computer switches the transceiver switch of the multi-channel microwave transceiver assembly to the transmission path through the test module.
[0079] The test phase is described in detail below. The test phase includes S201-S207.
[0080] S201, the host computer sends a control signal to the timing control module, and after receiving the control signal, the timing control module controls the auxiliary device (ie, the vector network analyzer) to send a radio frequency signal through the first interface unit / the second interface unit.
[0081] S202, the radio frequency signal is transmitted to the multi-channel microwave transceiver component through the first interface unit / the second interface unit, and the radio frequency signal outputs a feedback signal after passing through the multi-channel microwave transceiver component.
[0082] S203, the feedback signal is transmitted to the first interface unit / the second interface unit through the first switch matrix unit / the second switch matrix unit; the first interface unit / the second interface unit inputs the feedback signal to the first data acquisition processing unit / the second data acquisition processing unit for processing to obtain a processed feedback signal.
[0083] S204. The first data acquisition processing unit / the second data acquisition processing unit transmits the processed feedback signal to the host computer.
[0084] In this embodiment, the host computer controls the vector network analyzer to test the gain, standing wave, attenuation control and phase\delay control and other technical indicators of the multi-channel microwave transceiver assembly. After all indicators are tested, the first data acquisition processing unit / the second data acquisition processing unit collects the processed feedback signal and forms a data file to upload to the host computer.
[0085] Specifically, the gain of the multi-channel microwave transceiver assembly is obtained when the attenuation is controlled to zero and the delay is zero. The host computer sends an instruction to control the attenuation of the multi-channel microwave transceiver assembly through the timing control module, and compares it with the gain value to obtain the attenuation value. The host computer sends an instruction to control the delay of the multi-channel microwave transceiver assembly through the timing control module, and compares it with the phase when there is no delay to obtain the phase difference and calculate the delay.
[0086] S205, the host computer determines whether the number of links of the multi-channel microwave transceiver assembly that has completed the test has reached the set value. If it has not reached the set value, return to S104 to continue the test; if it has reached the set value, stop the test.
[0087] S206. After the test is completed, the host computer calls the pre-stored compensation data to perform data compensation on the data file uploaded by the first data acquisition processing unit / the second data acquisition processing unit (that is, the calibrated data, the attenuation of the device through which the RF signal passes is measured separately before the connection and the data is saved) to compensate for the line loss caused by the test cable.
[0088] S207, after the host computer completes data compensation, it will process the data, extract the gain value, flatness within the gain band, standing wave value, attenuation accuracy and phase\delay accuracy as the final test data output, and form a test data document.
[0089] The test data file may be in a csv format.
[0090] Example 5: This example describes a test method for a multi-channel microwave transceiver assembly, which is implemented by the test device provided in Example 1 and includes a preparation phase and a test phase.
[0091] The preparation stage is described in detail below. The preparation stage includes S101-S104.
[0092] S101, determine the test index, connect the test module, the signal source to be used, the spectrum analyzer and the multi-channel microwave transceiver components through cables, and check whether the connection is correct. After power on, send a communication signal through the host computer to check whether the communication of each port is normal.
[0093] Specifically, the signal source is connected to the 4 ports of the first interface unit, and the spectrum analyzer is connected to the 4 ports of the second interface unit. After the connection, the connection diagram between the test device and the multi-channel microwave transceiver assembly is as shown in FIG. Figure 8 The host computer, signal source and spectrum analyzer communicate with each other through network cables or GPIB technology protocols to achieve data exchange.
[0094] S102. Select the product function to be tested on the host computer and call the test software, and set the parameters of the signal source and the spectrum analyzer, including the design working bandwidth, center frequency, signal power and waveform setting parameters of the signal source, and the test bandwidth, attenuation value and frequency resolution parameters of the spectrum analyzer.
[0095] S103, after the parameters of the signal source and the spectrum analyzer are set, the host computer sets the required number of test links and controls the first switch matrix unit / the second switch matrix unit in the test module to select the links in the multi-channel microwave transceiver assembly to be tested.
[0096] S104, the host computer switches the transceiver switch of the multi-channel microwave transceiver assembly to the transmission path through the test module.
[0097] The test phase is described in detail below. The test phase includes S201-S207.
[0098] S201, the host computer sends a control signal to the timing control module. After receiving the control signal, the timing control module controls the auxiliary equipment (ie, the signal source and the spectrum analyzer) to send out a radio frequency signal through the first interface unit / the second interface unit.
[0099] S202, the radio frequency signal is transmitted to the multi-channel microwave transceiver component through the first interface unit / the second interface unit, and the radio frequency signal outputs a feedback signal after passing through the multi-channel microwave transceiver component.
[0100] S203, the feedback signal is transmitted to the first interface unit / the second interface unit through the first switch matrix unit / the second switch matrix unit; the first interface unit / the second interface unit inputs the feedback signal to the first data acquisition processing unit / the second data acquisition processing unit for processing to obtain a processed feedback signal.
[0101] S204. The first data acquisition processing unit / the second data acquisition processing unit transmits the processed feedback signal to the host computer.
[0102] In this embodiment, the host computer controls the spectrum analyzer to test the saturated output function of the transmission channel of the multi-channel microwave transceiver component, the input P-1 (that is, the size of the input power when the output power reaches the 1dB compression point) and other technical indicators. At the beginning of the test, the value on the spectrum analyzer is recorded and compared with the value of the signal source to obtain the gain value. Then, the value of the signal source is continuously increased, and this process is repeated to record the gain value until the value drops by 1dB. The signal source transmission power and the power on the spectrum analyzer at this time are recorded. The first data acquisition processing unit / the second data acquisition processing unit collects the signal, forms a data file and uploads it to the host computer.
[0103] S205, the host computer determines whether the number of links of the multi-channel microwave transceiver assembly that has completed the test has reached the set value. If it has not reached the set value, return to S104 to continue the test; if it has reached the set value, stop the test.
[0104] S206. After the test is completed, the host computer calls the pre-stored compensation data to perform data compensation on the data file uploaded by the first data acquisition processing unit / the second data acquisition processing unit (that is, the calibrated data, the attenuation of the device through which the RF signal passes is measured separately before the connection and the data is saved) to compensate for the line loss caused by the test cable.
[0105] S207, after the host computer completes data compensation, it will process the data, extract the transmission saturation power, input P-1 and other technical indicators as the final test data output, and form a test data document.
[0106] Example 6: This example describes a test method for a multi-channel microwave transceiver assembly, which is implemented by the test device provided in Example 1 and includes a preparation phase and a test phase.
[0107] The preparation stage is described in detail below. The preparation stage includes S101-S104.
[0108] S101, determine the test index, connect the test module, the signal source to be used, the high-speed oscilloscope and the multi-channel microwave transceiver assembly through cables, and check whether the connection is correct. After power on, send a communication signal through the host computer to check whether the communication of each port is normal.
[0109] Specifically, the signal source is connected to the 4 ports of the first interface unit, and the high-speed oscilloscope is connected to the 4 ports of the second interface unit. After the connection, the connection diagram between the test device and the multi-channel microwave transceiver assembly is as follows: Figure 8 The host computer, signal source and high-speed oscilloscope communicate with each other through network cables or GPIB technology protocols to achieve data exchange.
[0110] S102. Select the product function to be tested on the host computer and call the test software, and set the parameters of the signal source and the high-speed oscilloscope, including the design working bandwidth, center frequency, signal power, waveform setting and other parameters of the signal source, and the trigger level, sampling rate and sampling mode and other parameters of the high-speed oscilloscope.
[0111] S103, after the parameters of the signal source and the high-speed oscilloscope are set, the host computer sets the required number of test links and controls the first switch matrix unit / the second switch matrix unit in the test module to select the links in the multi-channel microwave transceiver assembly to be tested.
[0112] S104, the host computer turns on the signal of the transceiver switch of the multi-channel microwave transceiver assembly through the test module.
[0113] The test phase is described in detail below. The test phase includes S201-S207.
[0114] S201, the host computer sends a control signal to the timing control module. After receiving the control signal, the timing control module controls the auxiliary equipment (ie, the signal source and the high-speed oscilloscope) to send a radio frequency signal through the first interface unit / the second interface unit.
[0115] S202, the radio frequency signal is transmitted to the multi-channel microwave transceiver component through the first interface unit / the second interface unit, and the radio frequency signal outputs a feedback signal after passing through the multi-channel microwave transceiver component.
[0116] S203, the feedback signal is transmitted to the first interface unit / the second interface unit through the first switch matrix unit / the second switch matrix unit; the first interface unit / the second interface unit inputs the feedback signal to the first data acquisition processing unit / the second data acquisition processing unit for processing to obtain a processed feedback signal.
[0117] S204. The first data acquisition processing unit / the second data acquisition processing unit transmits the processed feedback signal to the host computer.
[0118] In this embodiment, the host computer controls the high-speed oscilloscope to test the technical indicators of the start-up delay of the multi-channel microwave transceiver components. When the test starts, the values on the high-speed oscilloscope are recorded, the SW signal and the RF signal are displayed on the oscilloscope, and the graphics on the high-speed oscilloscope are formed into a data document. The first data acquisition processing unit / the second data acquisition processing unit uploads the signal acquisition data document and the picture (i.e., the above-mentioned processed feedback signal) to the host computer, and the data document and the picture are also saved in the host computer.
[0119] S205, the host computer turns on the transceiver switch signal of the multi-channel microwave transceiver assembly through the test module.
[0120] S206, the host computer controls the high-speed oscilloscope to test the signal closing delay technical indicators of the receiving channel of the multi-channel microwave transceiver component. The test starts, records the values on the high-speed oscilloscope, displays the SW signal and the RF signal on the oscilloscope, forms a data document with the graphics on the high-speed oscilloscope, and the first data acquisition processing unit / the second data acquisition processing unit collects data and uploads it to the host computer, and also saves the picture in the host computer.
[0121] S207, the host computer determines whether the number of links of the multi-channel microwave transceiver assembly that has completed the test has reached the set value. If it has not reached the set value, return to S104 to continue testing; if it has reached the set value, stop testing.
[0122] S208. The host computer processes the received data, extracts the signal delay data when opening and closing respectively, and outputs them to form a test data document.
[0123] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present application.
Claims
1. A test device for a multi-channel microwave transceiver assembly, characterized in that: include: Auxiliary equipment, a host computer and a test module connected to each other, wherein the test module is connected to a multi-channel microwave transceiver assembly; The test module is used to test the multi-channel microwave transceiver assembly, including a timing control module, a first test channel and a second test channel connected to the timing control module; The timing control module is used to control the working timing of the first test channel, the second test channel and the multi-channel microwave transceiver component; The first test channel and the second test channel are both used for signal transmission; The first test channel includes: a first switch matrix unit, a first interface unit and a first data acquisition processing unit connected in sequence; wherein the first switch matrix unit is connected to the multi-channel microwave transceiver assembly, the first interface unit is connected to the auxiliary device, and the first data acquisition processing unit is connected to the host computer; The second test channel includes: a second switch matrix unit, a second interface unit and a second data acquisition processing unit connected in sequence; wherein the second switch matrix unit is connected to the multi-channel microwave transceiver assembly, the second interface unit is connected to the auxiliary device, and the second data acquisition processing unit is connected to the host computer; The first switch matrix unit, the first interface unit, the second switch matrix unit and the second interface unit are all connected to the timing control module, and the timing control module is also connected to the host computer.
2. The testing device according to claim 1, characterized in that: The first switch matrix unit is provided with 8 ports, 2 ports and a control port, the 8 ports of the first switch matrix unit are connected to the multi-channel microwave transceiver assembly through a first high-frequency connector, the 2 ports of the first switch matrix unit are connected to the first interface unit through a first high-frequency cable, and the control port of the first switch matrix unit is connected to the timing control module through a first low-frequency connector; The second switch matrix unit is also provided with 8 ports, 2 ports and a control port. The 8 ports of the second switch matrix unit are connected to the multi-channel microwave transceiver assembly through a second high-frequency connector, the 2 ports of the second switch matrix unit are connected to the second interface unit through a second high-frequency cable, and the control port of the second switch matrix unit is connected to the timing control module through a second low-frequency connector.
3. The testing device according to claim 2, characterized in that: The first switch matrix unit and the second switch matrix unit each include a plurality of radio frequency switches.
4. The testing device according to claim 3, characterized in that: The multiple radio frequency switches are in any of the following forms: The first type is divided into four layers, wherein the first layer is provided with a single-pole double-throw switch, the second layer is provided with a single-pole double-throw switch, the third layer is provided with two single-pole double-throw switches, and the fourth layer is provided with four single-pole double-throw switches, and each single-pole double-throw switch includes port 1 and port 2; wherein port 2 of the single-pole double-throw switch of the first layer serves as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected to port 1 of the single-pole double-throw switch of the second layer, port 2 of the single-pole double-throw switch of the second layer is connected to port 1 of the two single-pole double-throw switches of the third layer, port 2 of the two single-pole double-throw switches of the third layer is connected to port 1 of the four single-pole double-throw switches of the fourth layer, and port 2 of the four single-pole double-throw switches of the fourth layer constitutes 8 ports of the switch matrix; The second type is divided into three layers, the first layer is provided with a single-pole double-throw switch, the second layer is provided with a single-pole double-throw switch, and the third layer is provided with two single-pole four-throw switches, each single-pole four-throw switch includes 1 port and 4 ports; wherein, the 2 ports of the single-pole double-throw switch of the first layer are used as the 2 ports of the switch matrix, the 1 port of the single-pole double-throw switch of the first layer is connected to the 1 port of the single-pole double-throw switch of the second layer, the 2 ports of the single-pole double-throw switch of the second layer are connected to the 1 ports of the two single-pole four-throw switches of the third layer, and the 4 ports of the two single-pole four-throw switches of the third layer constitute the 8 ports of the switch matrix; The third type is divided into two layers, a single-pole double-throw switch is set in the first layer, and a single-pole eight-throw switch is set in the second layer, the single-pole eight-throw switch includes 1 port and 8 ports, wherein port 2 of the single-pole double-throw switch of the first layer serves as port 2 of the switch matrix, port 1 of the single-pole double-throw switch of the first layer is connected to port 1 of the single-pole eight-throw switch of the second layer, and port 8 of the single-pole eight-throw switch of the second layer serves as port 8 of the switch matrix.
5. The testing device according to claim 2, characterized in that: The first interface unit is provided with 2 ports, 4 ports, and a control port, the 2 ports of the first interface unit are connected to the 2 ports of the first switch matrix unit, the 4 ports of the first interface unit are connected to the first data acquisition processing unit and the auxiliary device, and the control port of the first interface unit is connected to the timing control module; The second interface unit is also provided with 2 ports, 4 ports and a control port. The 2 ports of the second interface unit are connected to the 2 ports of the second switch matrix unit, the 4 ports of the second interface unit are connected to the second data acquisition and processing unit and the auxiliary equipment, and the control port of the second interface unit is connected to the timing control module.
6. The testing device according to claim 1, characterized in that: The first data acquisition and processing unit includes a third low-frequency connector, a first data processing chip, and a first communication conversion chip connected in sequence; the third low-frequency connector is connected to the first interface unit, and the first communication conversion chip is connected to the host computer; The second data acquisition and processing unit includes a fourth low-frequency connector, a second data processing chip and a second communication conversion chip which are connected in sequence; the fourth low-frequency connector is connected to the second interface unit, and the second communication conversion chip is connected to the host computer.
7. The testing device according to claim 1, characterized in that: The auxiliary equipment includes at least one of a vector network analyzer, a signal source, a spectrum analyzer, a high-speed oscilloscope, a power meter and a noise meter.
8. The testing device according to claim 1, characterized in that: Also includes: A power supply unit connected to the timing control module.
9. A method for testing a multi-channel microwave transceiver assembly, based on the testing device according to any one of claims 1 to 7, characterized in that: include: The host computer sends a control signal to the timing control module, and after receiving the control signal, the timing control module controls the auxiliary device to send a radio frequency signal through the first interface unit / the second interface unit; The radio frequency signal is transmitted to the multi-channel microwave transceiver component through the first interface unit / the second interface unit, and the radio frequency signal outputs a feedback signal after passing through the multi-channel microwave transceiver component; The feedback signal is transmitted to the first interface unit / the second interface unit through the first switch matrix unit / the second switch matrix unit; the first interface unit / the second interface unit inputs the feedback signal to the first data acquisition processing unit / the second data acquisition processing unit for processing, thereby obtaining a processed feedback signal; The first data acquisition and processing unit / the second data acquisition and processing unit transmits the processed feedback signal to the host computer.