Abnormality processing method, device and system for high-position brake lamp and medium

Abstract

The invention provides an exception handling method, device and system for a high-position brake lamp and a medium. The method comprises the following steps: in a test system built based on a to-be-tested high-position brake lamp, carrying out initial ripple test processing on the to-be-tested high-position brake lamp so as to obtain theoretical interference parameters in corresponding ripples when the to-be-tested high-position brake lamp is in an abnormal state; in an established whole vehicle environment, performing verification ripple test processing on the to-be-tested high-position brake lamp to obtain actual interference parameters in corresponding ripples when the to-be-tested high-position brake lamp is in an abnormal state; and according to the theoretical interference parameter and the actual interference parameter, obtaining a final interference parameter in the corresponding ripple when the high braking lamp is abnormal.

Description

Technical Field

[0001] The present application relates to the field of vehicle testing technology, and in particular to a method, device, system and medium for handling abnormalities of a high-mounted brake light. Background Art

[0002] With the development of the automobile industry, the safety performance of automobiles has received widespread attention. As an effective means to reduce the occurrence of rear-end collisions, high-mounted brake lights have improved the safety performance of automobiles. However, when working, high-mounted brake lights will be affected by the external environment, so their brightness will change, and even flicker, which will seriously threaten the life and health of people related to the car. Therefore, it is extremely important to deal with the change in brightness and flickering of high-mounted brake lights.

[0003] In the prior art, there are detailed records of the changes in the brightness of the high-mounted brake lights of fuel vehicles, the causes of flickering, and the treatment methods, but there are no detailed records of the test and treatment methods of the high-mounted brake lights of new energy vehicles. The structures of new energy vehicles and fuel vehicles are not exactly the same, and the specific parameters that affect the performance of high-mounted brake lights are different. Therefore, in order to improve the safety performance of the car, it is urgent to study the test methods, causes, and treatment methods of the changes in the brightness of new energy high-mounted brake lights. Summary of the invention

[0004] The present application provides a method, device, system and medium for handling abnormalities of a high-mounted brake light, so as to solve the problems of brightness changes and flickering of high-mounted brake lights of new energy vehicles in the prior art.

[0005] In a first aspect, the present application provides a method for handling an abnormality of a high-mounted brake lamp, comprising:

[0006] In a test system built based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0007] In the built vehicle environment, the high-mounted brake lamp to be tested is subjected to a verification ripple test to obtain the actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested;

[0008] According to the theoretical interference parameters and the actual interference parameters, the final interference parameters in the ripples corresponding to the abnormality of the high-mounted brake light are obtained.

[0009] In a possible implementation, in a test system built based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including:

[0010] Controlling a waveform generator and a modulated power supply in the test system to output a plurality of first simulated ripples to the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0011] The waveform generator is connected to a modulated power supply, and the modulated power supply is connected to a high-mounted brake lamp to be tested.

[0012] In a possible implementation, in a built vehicle environment, a verification ripple test is performed on the high-mounted brake lamp to be tested to obtain actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested, including:

[0013] Controlling a first test point in the vehicle environment to output a plurality of second simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a first actual interference parameter in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0014] The first test point is set at the DC-DC converter, and an external signal generator and an external power supply are superimposed on the DC-DC converter as the actual power supply.

[0015] In a possible implementation, in a vehicle environment, a verification ripple test is performed on the high-mounted brake lamp to be tested to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including:

[0016] Controlling a second test point in the vehicle environment to output a plurality of third simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a second actual interference parameter in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0017] The second test point is set at the battery that powers the high-mounted brake lamp to be tested, and an external signal generator and an external power supply are superimposed on the battery as the actual power supply.

[0018] In a possible implementation, the interference parameter includes one or a combination of the following: waveform frequency, amplitude, peak value, deviation value, rise time, and waveform duration.

[0019] In a possible implementation, obtaining the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light according to the theoretical interference parameter and the actual interference parameter includes:

[0020] If the theoretical interference parameter is consistent with the actual interference parameter, the theoretical interference parameter is used as the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light.

[0021] In a second aspect, the present application provides an abnormality handling device for a high-mounted brake lamp, comprising:

[0022] A theoretical test module, used for performing an initial ripple test process on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0023] The actual test module is used to perform a verification ripple test process on the high-mounted brake lamp to be tested in a vehicle environment to obtain actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested;

[0024] The processing module is used to obtain the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light according to the theoretical interference parameter and the actual interference parameter.

[0025] In a third aspect, the present application provides a high-mounted brake light abnormality handling system, comprising: a high-mounted brake light abnormality handling device, a test system, and a vehicle environment;

[0026] The abnormality handling device for the high-mounted brake light is used to execute the abnormality handling method for the high-mounted brake light as claimed in any one of claims 1 to 6.

[0027] In a fourth aspect, the present application provides a high-mounted brake light device, which is arranged on a new energy vehicle, and the new energy vehicle includes:

[0028] a DC-DC converter, and a battery for powering the high-mounted brake lamp to be tested; wherein the device includes: a first controller, a filter circuit connected to the first controller, a current processing circuit connected to the filter circuit, an LED circuit connected to the current processing circuit, and a second controller connected to the LED circuit;

[0029] The filter circuit includes: a plurality of filter capacitors; wherein the capacitance value of each filter capacitor is set based on the final interference parameter obtained in the abnormality processing method of the high-mounted brake lamp according to any one of claims 1 to 6.

[0030] In a fifth aspect, the present application provides a computer-readable storage medium, comprising: the computer-readable storage medium stores computer execution instructions, and when the computer execution instructions are executed by a processor, they are used to implement the method as claimed in any one of claims 1 to 6.

[0031] The present application proposes a method, device, system and medium for handling an abnormality of a high-mounted brake lamp. In a test system constructed based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; in an already constructed whole vehicle environment, a verification ripple test process is performed on the high-mounted brake lamp to be tested to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; based on the theoretical interference parameters and the actual interference parameters, the final interference parameters in the ripple corresponding to when the high-mounted brake lamp is in an abnormal state are obtained. Compared with the prior art, in which it is impossible to know the interference factors that cause the abnormality of the high-mounted brake lights in new energy vehicles, the present application tests the theoretical interference parameters that cause the abnormality of the high-mounted brake lights in new energy vehicles through a test system, and then further verifies them in the built vehicle environment to obtain the corresponding actual interference parameters, so as to accurately locate the final interference parameters based on the theoretical interference parameters and the actual interference parameters, thereby effectively and conveniently locating the interference parameters that interfere with the abnormality of the high-mounted brake lights of new energy vehicles, and effectively reducing the impact of the interference parameters on the high-mounted brake lights of new energy vehicles by adding capacitors to form a filtering circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0033] Figure 1 A structural diagram of a test system based on a method for handling abnormalities of a high-mounted brake light provided in this application;

[0034] Figure 2 A schematic diagram of a flow chart of a first embodiment of a method for handling an abnormality of a high-mounted brake lamp provided in the present application;

[0035] Figure 3 A flowchart of a second embodiment of a method for handling an abnormality of a high-mounted brake lamp provided in the present application;

[0036] Figure 4 A schematic diagram of the structure of a high-mounted brake light vehicle environment provided in this application;

[0037] Figure 5 A schematic diagram of the structure of a first embodiment of an abnormality handling device for a high-mounted brake lamp provided in the present application;

[0038] Figure 6 A structural schematic diagram of a first embodiment of an abnormality handling system for a high-mounted brake light provided by the present application;

[0039] Figure 7 For this application Figure 7 A schematic structural diagram of a high-mount brake light device provided in this application.

[0040] The above drawings have shown clear embodiments of the present application, which will be described in more detail later. These drawings and text descriptions are not intended to limit the scope of the present application in any way, but to illustrate the concept of the present application to those skilled in the art by referring to specific embodiments. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments made by ordinary technicians in this field under the enlightenment of the embodiments belong to the scope of protection of the present application.

[0042] The terms "first", "second", "third", "fourth", etc. (if any) in the specification and claims of the present application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the present application described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0043] At present, with the development of the automobile industry, the use of high-mounted brake lights can effectively reduce the possibility of rear-end collisions and improve the safety performance of automobiles. However, when working, high-mounted brake lights will be affected by the external environment, so their brightness will change, and even flicker, which will seriously affect the driver's judgment of road conditions. Therefore, changes in the brightness of high-mounted brake lights and flickering may cause traffic accidents.

[0044] In the prior art, in order to prevent the brightness of the high-mounted brake lights from changing and flickering, there are detailed records of the brightness changes, flickering causes and solutions of the high-mounted brake lights of fuel vehicles, but there are no detailed records of the testing and treatment methods of the high-mounted brake lights of new energy vehicles. However, the structures of new energy vehicles and fuel vehicles are not exactly the same, and the specific parameters that affect the high-mounted brake lights are different. Therefore, the method of applying the technical parameters of fuel vehicles to solve the brightness changes and flickering of the high-mounted brake lights of new energy vehicles is not applicable.

[0045] In order to solve the above problems, the concept of the present application is to accurately locate the factors that cause the abnormality of the high-mounted brake light.

[0046] The technical solution of the present application is described in detail below through specific embodiments. It should be noted that the following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be described in detail in some embodiments.

[0047] Figure 1 This is a test system structure diagram based on a method for handling abnormalities of a high-mounted brake light provided in this application, such as Figure 1 As shown, the test system mainly includes: a waveform generator 101, a power module 102 and a high-mounted brake light 103. The waveform generator can control the wave parameters including but not limited to: waveform frequency, amplitude, peak value, deviation value, rise time and waveform duration.

[0048] Figure 2 This is a flow chart of a first embodiment of a method for handling abnormalities of a high-mounted brake light provided by the present application. Figure 2 , the processing method includes:

[0049] Step S201: In a test system constructed based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0050] In this embodiment, a test system for a high-mounted brake light is established (specifically, it can be Figure 1 As shown in the figure, in order to match the experimental environment with the actual situation, that is, to ensure that the high-mounted brake light can maintain normal working conditions under normal conditions, for example, the test system can be tested in a shielded room, the indoor temperature of the shielded room can be around 25°C, and the indoor humidity can be below 80%.

[0051] In addition, in order to further match the actual situation, in the test system, an AC superimposed ripple is used to perform an abnormal test on the high-mounted brake lamp to be tested. By changing at least one of the above-mentioned key parameters in the AC superimposed ripple, and outputting the AC superimposed ripple to the high-mounted brake lamp through the waveform generator 101 and the power supply module 102, it is determined whether the high-mounted brake lamp will be in an abnormal state under the ripples of different key parameters, so that the key parameters in the ripples corresponding to the abnormal state are used as theoretical interference parameters.

[0052] Step S202: In the constructed vehicle environment, a verification ripple test is performed on the high-mounted brake lamp to be tested to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0053] In this embodiment, the constructed vehicle environment mainly includes: a battery management system (Battery Management System; referred to as: BMS), a power distribution system (Power Distribution Module) connected to the BMS, a DC-DC converter connected to the power distribution system, and a high-mounted brake light connected to the DC-DC converter.

[0054] By changing at least one of the above key parameters in the AC superimposed ripple, the DC-DC converter inputs its corresponding ripple into the high-mounted brake light to determine whether the high-mounted brake light will be in an abnormal state under the ripples of different key parameters, thereby taking the key parameters in the ripple corresponding to the abnormal state as the actual interference parameters.

[0055] Step S203: According to the theoretical interference parameter and the actual interference parameter, obtain the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light.

[0056] In this embodiment, for example, if the theoretical interference parameter is consistent with the actual interference parameter, the theoretical interference parameter is used as the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

[0057] In this embodiment, an initial ripple test process is performed on the high-mounted brake light to be tested in a test system built based on the high-mounted brake light to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake light to be tested; then, in the built whole vehicle environment, a verification ripple test process is performed on the high-mounted brake light to be tested, so as to obtain actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake light to be tested; then, based on the theoretical interference parameters and the actual interference parameters, the final interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake light are obtained. Compared with the prior art in which it is impossible to know the interference factors that cause the abnormality of the high-mounted brake light in the new energy vehicle, the present application tests the theoretical interference parameters that cause the abnormality of the high-mounted brake light in the new energy vehicle through the test system, and then further verifies them in the built whole vehicle environment to obtain the corresponding actual interference parameters, so as to accurately locate the final interference parameters based on the theoretical interference parameters and the actual interference parameters, thereby effectively and conveniently locating the interference parameters that interfere with the abnormality of the high-mounted brake light of the new energy vehicle.

[0058] Figure 3 This is a flow chart of a second embodiment of a method for handling abnormalities of a high-mounted brake light provided in this application. Figure 2 Based on the embodiment shown, see Figure 3 A specific implementation of step S201 is:

[0059] Step S301, control the waveform generator and the modulated power supply in the test system to output a plurality of first simulated ripples to the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0060] In this embodiment, if Figure 1 As shown, the waveform generator is connected to a modulated power supply, the modulated power supply is connected to the high-mounted brake lamp to be tested, the waveform generator and the modulated power supply in the test system are controlled, and multiple first simulated ripples (i.e., the above-mentioned AC superimposed ripples) are output to the high-mounted brake lamp to be tested, so as to obtain the theoretical interference parameters in the ripples corresponding to the abnormal state of the high-mounted brake lamp to be tested.

[0061] For example, during the test, when the key parameter in the AC superimposed ripple is the frequency parameter, the high-mounted brake light has no obvious brightness change when the frequency is 0-40kHz, and when it is 40kHz, the brightness of the high-mounted brake light begins to change, indicating that it is in an abnormal state. The brightness of the high-mounted brake light changes when the frequency is 40kHz-96kHz, and when it is 96kHz, the high-mounted brake light flickers, indicating that it is in an abnormal state. Based on this, it can be determined that between 40kHz and 96kHz, and including 40kHz and 96kHz, are interference theory interference parameters.

[0062] Accordingly, a specific implementation of step S202 includes:

[0063] Step S302, controlling the first test point in the vehicle environment to output a plurality of second simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a first actual interference parameter in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0064] The first test point is set at the DC-DC converter, and an external signal generator and an external power supply are superimposed on the DC-DC converter as the actual power supply.

[0065] Optionally, the method may further include:

[0066] Step S303, controlling the second test point in the vehicle environment to output a plurality of third simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a second actual interference parameter in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state;

[0067] The second test point is arranged at the battery that supplies power to the high-mounted brake lamp to be tested, and an external signal generator and an external power supply are superimposed on the battery as the actual power supply.

[0068] In this embodiment, combined with Figure 4 To illustrate, Figure 4 A schematic diagram of the structure of a high-mounted brake light vehicle environment provided in this application, such as Figure 4 As shown, in the vehicle environment, the first test point and the second test point are as follows Figure 4 Corresponding settings are made in (① represents the first test point; ② represents the second test point), that is, the first test point is set at the DC-DC converter; the second test point is set at the battery that supplies power to the high-mounted brake lamp to be tested. Then, multiple second simulated ripples can be output to the high-mounted brake lamp to be tested at the first test point, and / or multiple third simulated ripples can be output to the high-mounted brake lamp to be tested at the second test point to test the actual interference parameters corresponding to when the high-mounted brake lamp is in an abnormal state.

[0069] The abnormal state includes but is not limited to: flickering state and brightness change state, etc. The interference parameters include one or a combination of the following: waveform frequency, amplitude, peak value, deviation value, rise time and waveform duration.

[0070] It should be noted that in this embodiment, in the whole vehicle environment, the test is carried out using the waveform frequency as an example. If the actual interference parameters verified by the test are consistent with the theoretical interference parameters, the theoretical interference parameters can be used as the final interference parameters in the ripple corresponding to the abnormality of the high-mounted brake light.

[0071] In this embodiment, on the basis of the determination of the theoretical interference parameters, the corresponding first test point and / or second test point are set in the whole vehicle environment to test and verify the high-mounted brake light, so as to obtain the actual interference parameters in the whole vehicle environment that is more in line with the actual environment, and then determine the final interference parameters based on the theoretical interference parameters and the actual interference parameters, so as to more effectively and accurately determine the interference parameters that cause the high-mounted brake light to be in an abnormal state, and provide effective guidance for the subsequent resolution of the abnormal state.

[0072] Figure 5 This is a structural diagram of a first embodiment of an abnormality handling device for a high-mounted brake lamp provided in the present application, as shown in FIG. Figure 5 As shown, the processing device includes: a theoretical test module 51, a practical test module 52 and a processing module 53.

[0073] Among them, the theoretical test module 51 is used to perform initial ripple test processing on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0074] The actual test module 52 is used to perform a verification ripple test process on the high-mounted brake lamp to be tested in a vehicle environment, so as to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state.

[0075] The processing module 53 is used to obtain the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake light according to the theoretical interference parameter and the actual interference parameter.

[0076] In this embodiment, the processing device can perform the above Figure 2 or Figure 3 The implementation principle and benefits of the method shown are similar and will not be repeated here.

[0077] Figure 6 This is a structural diagram of a first embodiment of a high-mounted brake light abnormality processing system provided by the present application, such as Figure 6 As shown, the processing device includes: an abnormality processing device 61 for a high-mounted brake light, a test system 62 and a vehicle environment 63.

[0078] Among them, the abnormal processing device 63 of the high-mounted brake light triggers the test system 62 to use the initial ripple to test the high-mounted brake light to be tested, and obtains the theoretical interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake light, and then triggers the whole vehicle environment 63 to continue to use the initial ripple to perform a verification test on the high-mounted brake light to be tested, and obtain the actual interference parameters, and then obtain the final interference parameters based on the theoretical interference parameters and the actual interference parameters.

[0079] The present application also provides a high-mounted brake light device, which is arranged on a new energy vehicle, and the new energy vehicle includes: a DC-DC converter, and a battery for supplying power to the high-mounted brake light to be tested. For example, Figure 7 A schematic diagram of the structure of a high-mounted brake light device provided in this application, such as Figure 7 As shown, the device includes: a first controller 701, a filter circuit 702 connected to the first controller 701, a current regulation circuit 703 connected to the filter circuit, an LED circuit 704 connected to the current regulation circuit, and a second controller 705 connected to the LED circuit;

[0080] The filter circuit includes: a plurality of filter capacitors; wherein the capacitance value of each filter capacitor is set based on the final interference parameter obtained in the abnormality handling method of the high-mounted brake lamp described in the above embodiment. And capacitors C2 and C3 with different values ​​are usually connected in parallel (such as Figure 7 As shown), a resonant relationship is formed to make the voltage lag behind the current, and the entire circuit has capacitance, which enables it to suppress a frequency band when used in the high-mounted brake light.

[0081] For example, when the final interference parameter is an AC superimposed ripple frequency of 96 kHz, the capacitance value of the filter capacitors C2 and C3 connected in parallel is 47 μF.

[0082] An embodiment of the present application also provides a readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the technical solution provided by any of the aforementioned method embodiments is implemented.

[0083] Those skilled in the art can understand that all or part of the steps of implementing the above-mentioned method embodiments can be completed by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When the program is executed, the steps of the above-mentioned method embodiments are executed; and the aforementioned storage medium includes: ROM, RAM, disk or optical disk and other media that can store program codes.

[0084] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, rather than to limit it. Although the present application has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A method for handling abnormalities of a high-mounted brake light, characterized in that: include: In a test system built based on the high-mounted brake lamp to be tested, an initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; In the built vehicle environment, a verification ripple test process is performed on the high-mounted brake lamp to be tested to obtain actual interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; According to the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the high-mounted brake lamp being in an abnormal state is obtained.

2. The method according to claim 1, characterized in that: In the test system built based on the high-mounted brake lamp to be tested, the initial ripple test process is performed on the high-mounted brake lamp to be tested to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state, including: Controlling a waveform generator and a modulated power supply in the test system to output a plurality of first simulated ripples to the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripples corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; Wherein, the waveform generator is connected to the modulatable power supply, and the modulatable power supply is connected to the high-mounted brake lamp to be tested.

3. The method according to claim 2, characterized in that The verification ripple test process is performed on the high-mounted brake lamp to be tested in the built vehicle environment to obtain actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested, including: Controlling a first test point in the vehicle environment to output a plurality of second simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a first actual interference parameter in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; The first test point is set at the DC-DC converter, and an external signal generator and an external power supply are superimposed on the DC-DC converter as the actual power supply.

4. The method according to claim 2 or 3, characterized in that: The verification ripple test process is performed on the high-mounted brake lamp to be tested in the vehicle environment to obtain actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested, including: Controlling a second test point in the vehicle environment to output a plurality of third simulated ripples to the high-mounted brake lamp to be tested, so as to obtain a second actual interference parameter in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; The second test point is arranged at the battery that supplies power to the high-mounted brake lamp to be tested, and an external signal generator and an external power supply are superimposed on the battery as the actual power supply.

5. The method according to any one of claims 2 to 4, characterized in that: The interference parameters include one or a combination of the following: waveform frequency, amplitude, peak value, deviation value, rise time and waveform duration.

6. The method according to any one of claims 2 to 4, characterized in that: The obtaining, according to the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp includes: If the theoretical interference parameter is consistent with the actual interference parameter, the theoretical interference parameter is used as the final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

7. A high-mount brake light abnormality processing device, characterized in that: include: A theoretical test module, used for performing an initial ripple test process on the high-mounted brake lamp to be tested in a test system built based on the high-mounted brake lamp to be tested, so as to obtain theoretical interference parameters in the ripple corresponding to when the high-mounted brake lamp to be tested is in an abnormal state; An actual test module, used for performing a verification ripple test process on the high-mounted brake lamp to be tested in a vehicle environment, so as to obtain actual interference parameters in the ripple corresponding to the abnormal state of the high-mounted brake lamp to be tested; The processing module is used to obtain, according to the theoretical interference parameter and the actual interference parameter, a final interference parameter in the ripple corresponding to the abnormality of the high-mounted brake lamp.

8. A high-mount brake light abnormality handling system, characterized in that: include: High-mount brake light abnormality handling device, test system, and vehicle environment; Wherein, the high-mounted brake light abnormality handling device is used to execute the high-mounted brake light abnormality handling method as described in any one of claims 1 to 6.

9. A high-mounted brake light device, characterized in that: The device is provided on a new energy vehicle, the new energy vehicle comprising: a DC-DC converter, and a battery for supplying power to the high-mounted brake lamp to be tested; wherein the device comprises: a first controller, a filter circuit connected to the first controller, a current processing circuit connected to the filter circuit, an LED circuit connected to the current processing circuit, and a second controller connected to the LED circuit; The filtering circuit includes: a plurality of filtering capacitors; wherein the capacitance value of each filtering capacitor is set based on the final interference parameter obtained in the abnormality processing method of the high-mounted brake lamp according to any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 6 when executed by a processor.

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