Galvanometer life evaluation method and device, computer equipment, storage medium and program product

Abstract

The invention relates to a galvanometer life evaluation method and device, computer equipment, a storage medium and a program product, which are applied to a galvanometer test system. The method comprises the following steps: acquiring test life of a galvanometer in a galvanometer test system under a plurality of test conditions; constructing a galvanometer acceleration model according to the test life, the test temperature and the test rotating speed; according to the galvanometer acceleration model, the test conditions and the normal working conditions, the galvanometer service life of the galvanometer under the normal working conditions is determined; the test conditions comprise test temperature and test rotating speed. According to the method, the galvanometer acceleration model is firstly constructed through the test life of the galvanometer, the test temperature of the galvanometer and the test rotating speed of the galvanometer, and then the galvanometer life of the galvanometer under the normal working condition is determined based on the galvanometer acceleration model, all the test conditions and the normal working condition, so that the method is provided for determining the galvanometer life under the normal working condition; the blank that the service life of the galvanometer cannot be evaluated is filled.

Description

Technical Field

[0001] The present application relates to the technical field of laser scanning galvanometers, and in particular to a galvanometer life assessment method, device, computer equipment, storage medium and program product. Background Art

[0002] The galvanometer is a scanning galvanometer used in the laser industry. Its professional term is high-speed scanning galvanometer Galvoscanning system. Due to its efficient scanning speed and accurate positioning accuracy, it is widely used in laser marking, laser engraving, stage lighting control, laser drilling and other fields.

[0003] The service life of the galvanometer mirror is the same as other scanning mirrors. It is affected by the galvanometer mirror's own factors and the external environment. If the galvanometer mirror is still used for laser marking, laser engraving and other operations after it reaches the end of its service life, it will lead to a waste of resources due to its positioning accuracy and linearity not meeting the standards.

[0004] Therefore, how to evaluate the life of high-speed scanning galvanometers has become a problem that needs to be solved urgently. Summary of the invention

[0005] Based on this, it is necessary to provide a galvanometer life evaluation method, device, computer equipment, storage medium and program product that can evaluate the life of a high-speed scanning galvanometer in response to the above technical problems.

[0006] In a first aspect, the present application provides a galvanometer life assessment method, which is applied to a galvanometer test system, comprising:

[0007] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0008] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0009] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0010] In one embodiment, the obtaining of the test life of the galvanometer in the galvanometer test system under multiple test conditions includes:

[0011] For a test condition, obtain the scanning parameters of the galvanometer under the test condition; the scanning parameters include positioning accuracy and linearity;

[0012] When the positioning accuracy satisfies the first preset condition and / or the linearity satisfies the second preset condition, the scanning time of the galvanometer is acquired, and the scanning time is determined as the test life.

[0013] In one embodiment, the above-mentioned obtaining the scanning parameters of the galvanometer under the test conditions includes:

[0014] Obtain characteristic information of the scanning spot of the galvanometer under test conditions;

[0015] The scanning parameters of the galvanometer are determined according to the characteristic information of the scanning spot.

[0016] In one embodiment, determining the galvanometer life of the galvanometer under each test condition according to the galvanometer acceleration model, each test condition, normal working condition and the test life of the galvanometer in the galvanometer test system under each test condition includes:

[0017] For a test condition, the normal working condition and the test condition are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test condition;

[0018] The life of the galvanometer under normal working conditions is determined based on the acceleration factor under the test conditions and the test life under the test conditions.

[0019] In one embodiment, the normal working conditions and the test conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions, including:

[0020] Input the normal working conditions into the acceleration model for calculation to obtain the test life under normal working conditions;

[0021] The test life and test conditions under normal working conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0022] In one embodiment, the galvanometer acceleration model is constructed according to the test life, test temperature and test rotation speed, including:

[0023] Based on a nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0024] In one embodiment, the test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

[0025] In a second aspect, the present application also provides a galvanometer life evaluation device, which is applied to a galvanometer test system, comprising:

[0026] An acquisition module is used to acquire the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test rotation speed;

[0027] A construction module is used to construct a galvanometer acceleration model according to a test life, a test temperature, and a test rotation speed;

[0028] The determination module is used to determine the galvanometer life of the galvanometer under normal working conditions according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0029] In one embodiment, the acquisition module includes: an acquisition unit and a determination unit, wherein:

[0030] The acquisition unit is specifically used to acquire scanning parameters of the galvanometer under a test condition; the scanning parameters include positioning accuracy and linearity;

[0031] The determination unit is specifically used to obtain the scanning time of the galvanometer when the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, and determine the scanning time as the test life.

[0032] In one of the embodiments, the acquisition unit is further used to acquire characteristic information of the scanning spot of the galvanometer under the test conditions; and determine the scanning parameters of the galvanometer according to the characteristic information of the scanning spot.

[0033] In one embodiment, the above-mentioned determination module includes: an acquisition unit and a determination unit, wherein:

[0034] The acquisition unit is specifically used for inputting the normal working condition and the test condition into the acceleration model for calculation for a test condition, so as to obtain the acceleration factor under the test condition;

[0035] The determination unit is specifically used to determine the life of the galvanometer under normal working conditions according to the acceleration factor under the test conditions and the test life under the test conditions.

[0036] In one of the embodiments, the acquisition unit is further used to input the normal working conditions into the acceleration model for calculation to obtain the test life under normal working conditions; input the test life and test conditions under normal working conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0037] In one of the embodiments, the above-mentioned construction module is also used to fit the test life, test temperature and test rotation speed based on a nonlinear fitting algorithm to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0038] In one embodiment, the test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

[0039] In a third aspect, the present application further provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and when the processor executes the computer program, the following steps are implemented:

[0040] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0041] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0042] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0043] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein when the computer program is executed by a processor, the following steps are implemented:

[0044] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0045] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0046] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0047] In a fifth aspect, the present application further provides a computer program product, including a computer program, which implements the following steps when executed by a processor:

[0048] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0049] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0050] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0051] The above-mentioned galvanometer life evaluation method, device, computer equipment, storage medium and program product are applied to the galvanometer test system to obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; construct a galvanometer acceleration model according to the test life, test temperature and test speed; determine the galvanometer life of the galvanometer under each test condition according to the galvanometer acceleration model, each test condition and normal working condition; the test conditions include the test temperature and the test speed. The above-mentioned method first constructs a galvanometer acceleration model through the test life of the galvanometer, the test temperature of the galvanometer and the test speed, and then determines the galvanometer life of the galvanometer under normal working conditions based on the galvanometer acceleration model, each test condition and normal working condition, which provides a method for determining the galvanometer life under different test conditions and fills the gap of being unable to evaluate the galvanometer life. BRIEF DESCRIPTION OF THE DRAWINGS

[0052] In order to more clearly illustrate the technical solutions in the embodiments of the present application or related technologies, the drawings required for use in the embodiments of the present application or related technical descriptions will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.

[0053] Figure 1 is an application environment diagram of a galvanometer life assessment method in one embodiment;

[0054] Figure 2 A schematic diagram of a flow chart of a galvanometer life evaluation method in one embodiment;

[0055] Figure 3 A schematic diagram of a flow chart of a galvanometer life evaluation method in another embodiment;

[0056] Figure 4 A schematic diagram of a flow chart of a galvanometer life evaluation method in another embodiment;

[0057] Figure 5 is the relationship between the test temperature, the test rotation speed and the test life under the test conditions in one embodiment;

[0058] Figure 6 A schematic diagram of a curve of a galvanometer acceleration model in one embodiment;

[0059] Figure 7 A schematic diagram of a flow chart of a galvanometer life evaluation method in another embodiment;

[0060] Figure 8 A schematic diagram of a flow chart of a galvanometer life evaluation method in another embodiment;

[0061] Fig. 9 is a structural block diagram of a galvanometer life assessment device in one embodiment;

[0062] Fig.10 FIG. 4 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0063] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0064] The galvanometer is a scanning galvanometer used in the laser industry. Its professional term is high-speed scanning galvanometer Galvoscanning system. Due to its efficient scanning speed and accurate positioning accuracy, it is widely used in laser marking, laser engraving, stage lighting control, laser drilling and other fields.

[0065] The service life of a galvanometer mirror is the same as other scanning mirrors. It is affected by the mirror's own factors and the external environment. If the galvanometer mirror is still used for laser marking, laser engraving, etc. after it reaches the end of its service life, it will waste resources because its positioning accuracy and linearity are not up to standard. Therefore, how to evaluate the life of a high-speed scanning galvanometer mirror has become a problem that needs to be solved urgently. This application aims to solve this problem.

[0066] After introducing the background technology of the galvanometer life assessment method provided in the embodiment of the present application, the implementation environment involved in the galvanometer life assessment method provided in the embodiment of the present application will be briefly described below. The galvanometer life assessment method provided in the embodiment of the present application can be applied to Figure 1 The galvanometer test system 01 shown in the figure includes a light source 102, a galvanometer 104 to be evaluated, a detector 106 and a server 108. The light source 102 is used to send a laser signal to the galvanometer 104 to be evaluated. The galvanometer 104 to be evaluated is used to process the laser signal to obtain a processed light spot, and adjust the angle of the galvanometer 104 to be evaluated so that the light spot in the whole range of the galvanometer 104 to be evaluated can be normally incident on the detector 106. The detector 106 is used to determine the positioning accuracy and linearity of the galvanometer 104 to be evaluated according to the position, intensity and other information of the light spot, and send the positioning accuracy and linearity of the galvanometer 104 to be evaluated to the server 108. The server 108 is used to evaluate the life of the galvanometer 104 to be evaluated according to the positioning accuracy and linearity of the galvanometer 104 to be evaluated.

[0067] In other possible implementations, the galvanometer life assessment method provided in the embodiment of the present application can also be applied to terminals, which can be, but are not limited to, various personal computers, laptops, smart phones, tablet computers, IoT devices, and portable wearable devices. IoT devices can be smart speakers, smart TVs, smart car devices, etc. Portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc.

[0068] After introducing the application scenarios of the galvanometer life assessment method provided in the embodiments of the present application, the following focuses on introducing the galvanometer life assessment method described in the present application.

[0069] In one embodiment, Figure 2 As shown in the figure, a method for evaluating the life of a galvanometer is provided. Figure 1 The server in the example is used to illustrate the following steps:

[0070] S201. Obtain the test life of a galvanometer in a galvanometer test system under multiple test conditions.

[0071] The test conditions refer to the normal working range of the galvanometer to be evaluated and / or the conditions that meet the failure mechanism of the galvanometer. The normal working range refers to the condition interval under which the galvanometer to be evaluated can work normally. The failure mechanism refers to the condition interval under which the galvanometer to be evaluated cannot work normally. The test conditions include the test temperature and the test speed. For example, the test speeds are 10 rpm, 20 rpm, 30 rpm, and 40 rpm, and the test temperatures are 20°C, 40°C, 60°C, and 80°C, respectively.

[0072] The test life refers to the time when the galvanometer fails. The test life of the galvanometer can be when the positioning accuracy of the galvanometer does not meet the preset positioning accuracy, or when the linearity of the galvanometer does not meet the preset positioning linearity.

[0073] In the embodiment of the present application, when it is necessary to perform life evaluation on the galvanometer to be evaluated under different test conditions, it is necessary to first obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions.

[0074] Optionally, it can be based on Figure 1 The galvanometer test system shown sets different test conditions, and collects the positioning accuracy and positioning linearity under different test conditions through the detector, and sends the collected positioning accuracy and positioning linearity under different test conditions to the server. The server obtains the test life under the corresponding test conditions according to the positioning accuracy and positioning linearity under different test conditions; or, after obtaining the test life under each test condition, the test life under each test condition is stored in a database. When it is necessary to evaluate the galvanometer life under different test conditions, the corresponding test life can be directly obtained from the database.

[0075] S202: Construct a galvanometer acceleration model according to the test life, test temperature and test rotation speed.

[0076] In an embodiment of the present application, after obtaining the test life of the galvanometer in the galvanometer test system under the above-mentioned test temperature and test speed conditions, the test life, test temperature and test speed of the galvanometer can be fitted to obtain a galvanometer acceleration model.

[0077] S203 , determining the galvanometer life of the galvanometer under normal working conditions according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0078] Among them, normal working conditions refer to the preset test temperature and preset test speed , preset test temperature and preset test speed Can be predetermined based on the positioning accuracy and linearity of the galvanometer. For example, the preset test temperature Can be 25℃, preset test speed It can be 20rpm.

[0079] In an embodiment of the present application, after the galvanometer acceleration model is obtained as mentioned above, each test condition, normal working condition and the test life of the galvanometer in the galvanometer test system under each test condition can be input into the galvanometer acceleration model for calculation to determine the galvanometer life under normal working conditions of the galvanometer.

[0080] The galvanometer life assessment method provided in the embodiment of the present application is applied to a galvanometer test system to obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; construct a galvanometer acceleration model based on the test life, test temperature and test rotation speed; determine the galvanometer life of the galvanometer under each test condition based on the galvanometer acceleration model, each test condition and normal working condition; the test conditions include the test temperature and the test rotation speed. The above method first constructs a galvanometer acceleration model through the test life of the galvanometer, the test temperature of the galvanometer and the test rotation speed, and then determines the galvanometer life of the galvanometer under normal working conditions based on the galvanometer acceleration model, each test condition and normal working condition, which provides a method for determining the galvanometer life under normal working conditions and fills the gap of being unable to evaluate the galvanometer life.

[0081] The above method can provide a life test assessment and evaluation basis for laser scanning galvanometer application industries such as laser marking, laser additive manufacturing, laser projection, laser beauty, etc. It is helpful for downstream companies of laser scanning galvanometers to carry out supplier screening, and it is also helpful for midstream and upstream companies to carry out the optimization design of scanning galvanometers and core components.

[0082] In one embodiment, Figure 2 Based on the embodiment shown, the process of obtaining the test life of the galvanometer under various test conditions can be described, such as Figure 3 As shown, the above S201 "obtaining the test life of the galvanometer in the galvanometer test system under multiple test conditions" includes:

[0083] S301 . For a test condition, obtain scanning parameters of a galvanometer under the test condition.

[0084] Among them, the scanning parameters include positioning accuracy and linearity.

[0085] In the embodiment of the present application, for a test condition, when it is necessary to perform life evaluation on the galvanometer to be evaluated under the test condition, it is necessary to first obtain the positioning accuracy and linearity of the galvanometer to be evaluated under the test condition.

[0086] Optionally, a method for obtaining the positioning accuracy and linearity of the test galvanometer to be evaluated is provided below, based on the following Figure 1 The galvanometer test system shown in the figure sets certain test conditions (e.g. test temperature, It can be 40℃, test speed It can be 30rpm), after the light source generates a light spot at the detector position through the galvanometer to be evaluated, the detector determines the positioning accuracy and positioning linearity of the galvanometer to be evaluated based on information such as the position and intensity of the light spot, and sends the collected positioning accuracy and positioning linearity under certain test conditions to the server, and the server obtains the positioning accuracy and positioning linearity under certain test conditions.

[0087] Optionally, a method for obtaining the scanning parameters of the galvanometer under experimental conditions is provided below, such as Figure 4 As shown, the above S301 "obtaining scanning parameters of the galvanometer under test conditions" includes:

[0088] S3011. Obtain characteristic information of the scanning spot of the galvanometer under test conditions.

[0089] The characteristic information of the light spot includes the position and intensity of the light spot.

[0090] In the embodiment of the present application, a light source can generate a light spot on a position sensitive device (PSD) via a galvanometer to be evaluated, and the PSD can obtain characteristic information of the corresponding light spot to analyze the positioning accuracy and linearity of the galvanometer to be evaluated based on the characteristics of the light spot.

[0091] S3012. Determine scanning parameters of the galvanometer according to characteristic information of the scanning spot.

[0092] In the embodiment of the present application, after the characteristic information of the light spot is obtained as described above, the positioning accuracy and linearity of the galvanometer can be determined based on information such as the position of the scanning light spot and the intensity of the light spot.

[0093] Optionally, it can be considered that the smaller the distance between the position of the light spot and the position of the galvanometer to be evaluated, the higher the positioning accuracy and linearity of the galvanometer, and the greater the intensity of the light spot, the higher the positioning accuracy and linearity of the galvanometer.

[0094] S302: When the positioning accuracy satisfies a first preset condition and / or the linearity satisfies a second preset condition, obtain the scanning time of the galvanometer, and determine the scanning time as the test life.

[0095] Among them, the first preset condition may be that the positioning accuracy is greater than a preset positioning accuracy threshold, and the second preset condition may be that the linearity is greater than a preset positioning linearity threshold. The preset positioning accuracy threshold and the preset linearity threshold may be pre-set.

[0096] In an embodiment of the present application, after obtaining the positioning accuracy and linearity of the galvanometer at each moment under each test condition, the moment when the positioning accuracy is greater than a preset positioning accuracy threshold and / or the moment when the linearity is greater than a preset linearity threshold is determined, and this moment is determined as the test life.

[0097] Optionally, the moment when the positioning accuracy is greater than a preset positioning accuracy threshold can be determined as the test life, the moment when the linearity is greater than a preset linearity threshold can be determined as the test life, and the moment when the positioning accuracy is greater than a preset positioning accuracy threshold and the linearity is greater than a preset linearity threshold can be determined as the test life.

[0098] Optionally, at least two galvanometers to be evaluated may be set under each test condition. After the test lifespans of multiple galvanometers to be evaluated under the same test condition are obtained, the average of the test lifespans of multiple galvanometers to be evaluated under the same test condition may be used as the test lifespan under the test condition.

[0099] The method for obtaining the test life of the galvanometer provided in the embodiment of the present application determines the test life of the galvanometer based on the positioning accuracy and linearity of the galvanometer, providing a certain data basis for subsequent determination of the life of the galvanometer based on the test life of the galvanometer.

[0100] In one embodiment, Figure 2 Based on the illustrated embodiment, a method for constructing a galvanometer acceleration model can be described. The above S202 "constructing a galvanometer acceleration model according to a test life, a test temperature, and a test rotation speed" includes:

[0101] Based on the nonlinear fitting algorithm, the test life, test temperature and test speed are fitted to obtain the galvanometer acceleration model.

[0102] Among them, the nonlinear fitting algorithm includes the maximum likelihood estimation algorithm.

[0103] In the embodiment of the present application, after obtaining the test life corresponding to different test temperatures and the test life corresponding to different test speeds, the test life corresponding to different test temperatures and the test life corresponding to different test speeds can be fitted based on the maximum likelihood estimation algorithm to obtain a galvanometer acceleration model. Optionally, the galvanometer acceleration model can be expressed by the following formula (1):

[0104]

[0105] in, Refers to the test life of the galvanometer to be tested. , , and are parameters to be determined respectively. In the embodiment of the present application, =1.5, =0.6, =0.05, =0.5, is the test temperature, is the test speed, is the Boltzmann constant.

[0106] Optional, as follows Figure 5 As shown in , the corresponding relationship between 5 groups of different test temperatures and 5 groups of different test speeds and test life is also provided. Further, based on 5 groups of test temperatures and 5 groups of test speeds, that is, the test life under 25 test conditions, the galvanometer acceleration model shown in the above formula (1) is fitted. In addition, as Figure 6 The figure also provides a curve of the galvanometer acceleration model fitted according to the test life under 25 groups of test conditions.

[0107] The method for determining the galvanometer acceleration model provided in the embodiment of the present application provides data support for the subsequent determination of the life of the galvanometer based on the galvanometer acceleration model.

[0108] In one embodiment, Figure 2 Based on the embodiment shown, the process of determining the life of the galvanometer under various test conditions can be described as follows: Figure 7 As shown, the above S203 "determine the galvanometer life under normal working conditions according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions" includes:

[0109] S401. For a test condition, the normal working condition and the test condition are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test condition.

[0110] In an embodiment of the present application, after the galvanometer acceleration model, normal working conditions and various test conditions are obtained as mentioned above, for one test condition, the normal working conditions and the test conditions can be input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0111] Optionally, the following provides a specific implementation method of inputting normal working conditions and test conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions. The acceleration factor under the test conditions can be expressed by the following formula (2):

[0112]

[0113] in, The test temperature is The test speed is The acceleration factor under the conditions, is the test temperature under normal working conditions, is the test speed under normal working conditions.

[0114] Optionally, the method of obtaining the acceleration factor under the test conditions can be further described, such as Figure 8 As shown, the above S401 "inputting normal working conditions and test conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions" includes:

[0115] S4011. Input the normal working conditions into the galvanometer acceleration model for calculation to obtain the test life under the normal working conditions.

[0116] In the embodiment of the present application, before determining the acceleration factor under the test conditions, the normal working parameters under the normal working conditions can also be determined first, and the normal working conditions can be input into the galvanometer acceleration model for calculation to obtain the test life under the normal working conditions. Optionally, the test life under the normal working conditions can be determined using the following formula (3):

[0117]

[0118] in, Refers to the test life under normal working conditions. is the test temperature under normal working conditions, is the test speed under normal working conditions.

[0119] S4012. Input the test life and test conditions under normal working conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0120] In the embodiment of the present application, after the test life under normal working conditions is determined as above, the test life under normal working conditions and the test conditions can be input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions. The acceleration factor under the test conditions can be found in the above formula (2).

[0121] S402 , determining the life of the galvanometer under normal working conditions according to the acceleration factor under the test conditions and the test life of the galvanometer in the galvanometer test system under the test conditions.

[0122] In the embodiment of the present application, after the acceleration factor under the test conditions is obtained as mentioned above, the galvanometer life of the galvanometer under normal working conditions can be determined based on the acceleration factor under the test conditions and the test life of the galvanometer in the galvanometer test system under the test conditions.

[0123] Optionally, a method for determining the life of a galvanometer under normal working conditions is provided below, as shown in the following formula (4). The life of the galvanometer under test conditions can be expressed as:

[0124]

[0125] in, The test temperature is , the test speed is Galvanometer life under conditions, The test temperature is , the test speed is The acceleration factor under the conditions, The test temperature is The test speed is Test life of the galvanometer under certain conditions.

[0126] The method for determining the life of the galvanometer under test conditions provided in the embodiments of the present application first constructs a galvanometer acceleration model, and then determines the life of the galvanometer under various test conditions based on the galvanometer acceleration model, various test conditions and normal working conditions. This provides a method for determining the life of the galvanometer under normal working conditions, filling the gap of being unable to evaluate the life of the galvanometer.

[0127] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0128] Based on the same inventive concept, the embodiment of the present application also provides a galvanometer life assessment device for implementing the galvanometer life assessment method involved above. The implementation solution provided by the device to solve the problem is similar to the implementation solution recorded in the above method, so the specific limitations in one or more galvanometer life assessment device embodiments provided below can refer to the limitations of the galvanometer life assessment method above, and will not be repeated here.

[0129] In an exemplary embodiment, Fig. 9 As shown, a galvanometer life evaluation device is provided, which is applied to a galvanometer test system, including: an acquisition module 10, a construction module 11 and a determination module 12, wherein:

[0130] The acquisition module 10 is used to acquire the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test rotation speed.

[0131] The construction module 11 is used to construct a galvanometer acceleration model according to the test life, test temperature and test rotation speed.

[0132] The determination module 12 is used to determine the galvanometer life of the galvanometer under normal working conditions according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0133] In an exemplary embodiment, the acquisition module 10 includes: an acquisition unit and a determination unit, wherein:

[0134] The acquisition unit is specifically used to acquire scanning parameters of the galvanometer under a test condition; the scanning parameters include positioning accuracy and linearity;

[0135] The determination unit is specifically used to obtain the scanning time of the galvanometer when the positioning accuracy meets the first preset condition and / or the linearity meets the second preset condition, and determine the scanning time as the test life.

[0136] In an exemplary embodiment, the acquisition unit is further configured to acquire characteristic information of a scanning spot of the galvanometer under test conditions; and determine scanning parameters of the galvanometer according to the characteristic information of the scanning spot.

[0137] In an exemplary embodiment, the determination module 12 includes: an acquisition unit and a determination unit, wherein:

[0138] The acquisition unit is specifically used for inputting the normal working condition and the test condition into the galvanometer acceleration model for calculation for a test condition, so as to obtain the acceleration factor under the test condition;

[0139] The determination unit is specifically used to determine the galvanometer life of the galvanometer under normal working conditions according to the acceleration factor under the test conditions and the test life of the galvanometer in the galvanometer test system under the test conditions.

[0140] In an exemplary embodiment, the acquisition unit is further used to input the normal working conditions into the acceleration model for calculation to obtain the test life under normal working conditions; input the test life and test conditions under normal working conditions into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0141] In an exemplary embodiment, the construction module 11 is also used to perform fitting processing on the test life, test temperature and test rotation speed based on a nonlinear fitting algorithm to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0142] In an exemplary embodiment, the above test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

[0143] Each module in the above-mentioned galvanometer life assessment device can be implemented in whole or in part by software, hardware, or a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the operations corresponding to each of the above modules.

[0144] In an exemplary embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as shown in FIG. Fig.10As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, referred to as I / O) and a communication interface. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The database of the computer device is used to store relevant data of the galvanometer. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a galvanometer life assessment method is implemented.

[0145] Those skilled in the art will understand that Fig.10 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0146] In an exemplary embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0147] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0148] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0149] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0150] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0151] For a test condition, obtain the scanning parameters of the galvanometer under the test condition; the scanning parameters include positioning accuracy and linearity;

[0152] When the positioning accuracy satisfies the first preset condition and / or the linearity satisfies the second preset condition, the scanning time of the galvanometer is acquired, and the scanning time is determined as the test life.

[0153] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0154] Obtain characteristic information of the scanning spot of the galvanometer under test conditions;

[0155] The scanning parameters of the galvanometer are determined according to the characteristic information of the scanning spot.

[0156] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0157] For a test condition, the normal working condition and the test condition are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test condition;

[0158] The life of the galvanometer under normal working conditions is determined based on the acceleration factor under the test conditions and the test life under the test conditions.

[0159] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0160] Input the normal working conditions into the acceleration model for calculation to obtain the test life under normal working conditions;

[0161] The test life and test conditions under normal working conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0162] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0163] Based on a nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0164] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0165] The test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

[0166] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0167] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0168] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0169] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0170] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0171] For a test condition, obtain the scanning parameters of the galvanometer under the test condition; the scanning parameters include positioning accuracy and linearity;

[0172] When the positioning accuracy satisfies the first preset condition and / or the linearity satisfies the second preset condition, the scanning time of the galvanometer is acquired, and the scanning time is determined as the test life.

[0173] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0174] Obtain characteristic information of the scanning spot of the galvanometer under test conditions;

[0175] The scanning parameters of the galvanometer are determined according to the characteristic information of the scanning spot.

[0176] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0177] For a test condition, the normal working condition and the test condition are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test condition;

[0178] The life of the galvanometer under normal working conditions is determined based on the acceleration factor under the test conditions and the test life under the test conditions.

[0179] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0180] Input the normal working conditions into the acceleration model for calculation to obtain the test life under normal working conditions;

[0181] The test life and test conditions under normal working conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0182] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0183] Based on a nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0184] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0185] The test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

[0186] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0187] Obtain the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test speed;

[0188] Construct a galvanometer acceleration model based on the test life, test temperature and test speed;

[0189] The galvanometer life under normal working conditions is determined according to the galvanometer acceleration model, various test conditions, normal working conditions and the test life of the galvanometer in the galvanometer test system under various test conditions.

[0190] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0191] For a test condition, obtain the scanning parameters of the galvanometer under the test condition; the scanning parameters include positioning accuracy and linearity;

[0192] When the positioning accuracy satisfies the first preset condition and / or the linearity satisfies the second preset condition, the scanning time of the galvanometer is acquired, and the scanning time is determined as the test life.

[0193] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0194] Obtain characteristic information of the scanning spot of the galvanometer under test conditions;

[0195] The scanning parameters of the galvanometer are determined according to the characteristic information of the scanning spot.

[0196] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0197] For a test condition, the normal working condition and the test condition are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test condition;

[0198] The life of the galvanometer under normal working conditions is determined based on the acceleration factor under the test conditions and the test life under the test conditions.

[0199] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0200] Input the normal working conditions into the acceleration model for calculation to obtain the test life under normal working conditions;

[0201] The test life and test conditions under normal working conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

[0202] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0203] Based on a nonlinear fitting algorithm, the test life, test temperature and test rotation speed are fitted to obtain a galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

[0204] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0205] The test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

[0206] A person of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment method can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, an artificial intelligence (AI) processor, etc., but are not limited to this.

[0207] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this application.

[0208] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for evaluating the life of a galvanometer, characterized in that: The method is applied to a galvanometer test system, and the method comprises: Obtaining the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test rotation speed; Constructing a galvanometer acceleration model according to the test life, the test temperature and the test rotation speed; The galvanometer life of the galvanometer under the normal working conditions is determined according to the galvanometer acceleration model, the test conditions, the normal working conditions and the test life of the galvanometer in the galvanometer test system under the test conditions.

2. The method according to claim 1, characterized in that The step of obtaining the test life of the galvanometer in the galvanometer test system under multiple test conditions includes: For a test condition, obtaining scanning parameters of the galvanometer under the test condition; the scanning parameters include positioning accuracy and linearity; When the positioning accuracy satisfies a first preset condition and / or the linearity satisfies a second preset condition, the scanning time of the galvanometer is acquired, and the scanning time is determined as the test life.

3. The method according to claim 2, characterized in that The obtaining of the scanning parameters of the galvanometer under the test conditions includes: Acquire characteristic information of the scanning spot of the galvanometer under the test conditions; The scanning parameters of the galvanometer are determined according to the characteristic information of the scanning light spot.

4. The method according to claim 1, characterized in that: Determining the galvanometer life of the galvanometer under the normal working conditions according to the galvanometer acceleration model, each of the test conditions, the normal working conditions and the test life of the galvanometer in the galvanometer test system under each of the test conditions includes: For one test condition, the normal working condition and the test condition are input into the acceleration model for calculation to obtain the acceleration factor under the test condition; The life of the galvanometer mirror under the normal working conditions is determined according to the acceleration factor under the test conditions and the test life under the test conditions.

5. The method according to claim 4, characterized in that The inputting the normal working condition and the test condition into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test condition includes: Inputting the normal working conditions into the acceleration model for calculation to obtain the test life under the normal working conditions; The test life under the normal working conditions and the test conditions are input into the galvanometer acceleration model for calculation to obtain the acceleration factor under the test conditions.

6. The method according to claim 1, characterized in that The step of constructing a galvanometer acceleration model according to the test life, the test temperature and the test rotation speed includes: Based on a nonlinear fitting algorithm, the test life, the test temperature and the test rotation speed are fitted to obtain the galvanometer acceleration model; the nonlinear fitting algorithm includes a maximum likelihood estimation algorithm.

7. The method according to any one of claims 1 to 6, characterized in that: The test conditions satisfy the normal operating range of the galvanometer, and / or the test conditions satisfy the failure mechanism of the galvanometer.

8. A galvanometer life evaluation device, characterized in that: Applied to a galvanometer test system, the device comprises: An acquisition module, used for acquiring the test life of the galvanometer in the galvanometer test system under multiple test conditions; the test conditions include test temperature and test rotation speed; A construction module, used for constructing a galvanometer acceleration model according to the test life, the test temperature and the test rotation speed; A determination module is used to determine the galvanometer life of the galvanometer under the normal working conditions according to the galvanometer acceleration model, the test conditions, the normal working conditions and the test life of the galvanometer in the galvanometer test system under the test conditions.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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