Contact resistance testing method, system, device and equipment of disconnecting switch and medium

Abstract

The invention relates to the technical field of transformer substation management, and provides a contact resistance testing method, system, device and equipment of an isolating switch and a medium, and the method comprises the steps: determining a target transformer substation and a target isolating switch to be subjected to a contact resistance test; selecting the target transformer substation and the target isolation switch from a transformer substation information list; and according to the received contact resistance test information and the test instruction, performing a contact resistance test on a target isolation switch of the target substation to obtain a target contact resistance test result. According to the technical scheme of the invention, the complex calculation simplification of the isolation switch contact resistance simulation value and the systematized storage, analysis and filing of the test result are realized by using the modern information technology, so that a user can know the contact resistance condition of the isolation switch in time and find the potential safety hazard in time.

Description

[Technical field]

[0001] The present application relates to the technical field of substation management, and in particular to a contact resistance testing method, system, device, equipment and medium for an isolating switch. [Background technology]

[0002] The contact resistance when the isolating switch is closed is a key indicator to determine whether the isolating switch is normal. The increase in contact resistance will cause the temperature of the contact part to rise, increase the resistance of the conductor, and further increase the heat generation. Working for a long time under high current conditions will cause oxidation, softening or aging of the contact surface, which may cause equipment failure.

[0003] The traditional disconnector contact resistance test requires the main switch to be closed. However, due to operating mode requirements, some disconnectors cannot close the main switch during maintenance, resulting in the inability to perform contact resistance tests on some disconnectors for a long time. They can only rely on experience for observation and visual inspection, and cannot promptly discover potential hidden dangers, posing risks to the safe operation of the power grid. [Summary of the invention]

[0004] The embodiments of the present application provide a contact resistance testing method, device, equipment and medium for an isolating switch, aiming to solve the technical problems existing in the related art.

[0005] In a first aspect, an embodiment of the present application provides a contact resistance testing method for an isolating switch, comprising:

[0006] Determine the target substation and target disconnector for contact resistance test;

[0007] Select the target substation and the target disconnector from the substation information list;

[0008] According to the received contact resistance test information and test instruction, a contact resistance test is performed on the target disconnector of the target substation to obtain a target contact resistance test result.

[0009] In one embodiment, optionally, the method further comprises:

[0010] The target disconnector of the target substation and the target contact resistance test result are stored correspondingly.

[0011] In one embodiment, optionally, the method further comprises:

[0012] Receive an input substation information adding instruction and newly added substation information, wherein the substation information includes: an operation number of a disconnector, a substation name, and a voltage level;

[0013] According to the substation information adding instruction, the newly added substation information is added to the substation information list.

[0014] In one embodiment, optionally, the method further comprises:

[0015] Receive input substation information editing instructions;

[0016] According to the substation information editing instruction, the corresponding target substation information is determined, and a corresponding editing operation is performed on the target substation information in the substation information list.

[0017] In one embodiment, optionally, the method further comprises:

[0018] Receive an input query instruction for historical contact resistance test results;

[0019] According to the historical contact resistance test result query instruction, the corresponding target historical contact resistance test result is queried.

[0020] In one embodiment, optionally, performing a contact resistance test on a target disconnector of the target substation according to the received contact resistance test information and test instruction to obtain a target contact resistance test result includes:

[0021] According to the received contact resistance test information and test instructions, multiple contact resistance tests are performed on the target disconnector of the target substation to obtain corresponding contact resistance test results;

[0022] Calculating an average value of the contact resistance test results of the multiple contact resistance tests to obtain an average contact resistance test value;

[0023] The target contact resistance test result is determined according to the difference between the average contact resistance test value and a preset contact resistance value.

[0024] In a second aspect, an embodiment of the present application provides a contact resistance testing system for an isolating switch, comprising:

[0025] The isolating switch closing simulator is used to provide an isolating switch closing simulation scenario when the isolating switch cannot be closed normally;

[0026] A contact resistance tester, used to test the contact resistance of the isolating switch and output the corresponding contact resistance test result;

[0027] A data transmission device is used to transmit the contact resistance test result.

[0028] In a third aspect, an embodiment of the present application provides a contact resistance testing device for an isolating switch, comprising:

[0029] A determination module, used to determine a target substation and a target disconnector for contact resistance testing;

[0030] A selection module, used to select the target substation and the target disconnector from the substation information list;

[0031] The test module is used to perform a contact resistance test on a target disconnector of the target substation according to the received contact resistance test information and test instructions to obtain a target contact resistance test result.

[0032] In a fourth aspect, a computer device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the contact resistance test method of the isolating switch when executing the computer program.

[0033] In a fifth aspect, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the contact resistance testing method of the isolating switch are implemented.

[0034] In the scheme implemented by the contact resistance test method, device, equipment and medium of the above disconnector, the target substation and target disconnector to be tested for contact resistance are determined; the target substation and the target disconnector are selected from the substation information list; according to the received contact resistance test information and test instructions, the target disconnector of the target substation is tested for contact resistance to obtain the target contact resistance test result. Through the above technical scheme of the present invention, modern information technology is used to simplify the complex calculation of the disconnector contact resistance simulation value and systematically store, analyze and file the test results, so that the user can timely understand the contact resistance of the disconnector and discover safety hazards in time.

Brief Description of the Drawings

[0035] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0036] Figure 1 A schematic flow chart of a contact resistance testing method for an isolating switch according to an embodiment of the present application is shown.

[0037] Figure 2 A screenshot of a resistance value test interface according to an embodiment of the present application is shown.

[0038] Figure 3A schematic flow chart of step S103 of a contact resistance testing method for an isolating switch according to an embodiment of the present application is shown.

[0039] Figure 4 A screenshot of a resistance value test result according to an embodiment of the present application is shown.

[0040] Figure 5 A screenshot of a substation information adding interface according to an embodiment of the present application is shown.

[0041] Figure 6 A screenshot of an interface for adding isolating switch information according to an embodiment of the present application is shown.

[0042] Figure 7 A screenshot of a substation information editing interface according to an embodiment of the present application is shown.

[0043] Figure 8 A screenshot of an isolating switch information editing interface according to an embodiment of the present application is shown.

[0044] Fig. 9 A screenshot of an isolating switch historical test data query interface according to an embodiment of the present application is shown.

[0045] Fig.10 A block diagram of a contact resistance testing system for an isolating switch according to an embodiment of the present application is shown.

[0046] Fig.11 A block diagram of a contact resistance testing device for an isolating switch according to an embodiment of the present application is shown.

[0047] Fig.12 A block diagram of a computer device according to an embodiment of the present application is shown. [Specific implementation method]

[0048] In order to better understand the technical solution of the present application, the embodiments of the present application are described in detail below with reference to the accompanying drawings.

[0049] It should be clear that the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without creative work are within the scope of protection of the present application.

[0050] The terms used in the embodiments of the present application are only for the purpose of describing specific embodiments, and are not intended to limit the present application. The singular forms "a", "said" and "the" used in the embodiments of the present application and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings.

[0051] In conjunction with the accompanying drawings, some embodiments of the present application are described in detail below. In the absence of conflict, the following embodiments and features in the embodiments can be combined with each other.

[0052] See also Figure 1 , Figure 1 A schematic flow chart of a contact resistance testing method for an isolating switch according to an embodiment of the present application is shown.

[0053] like Figure 1 As shown, a contact resistance test method for an isolating switch is used in a contact resistance test system for an isolating switch, and the method comprises:

[0054] Step S101, determining a target substation and a target disconnector for contact resistance testing.

[0055] In this embodiment, the user may determine which isolating switch of a substation the user wants to perform a contact resistance test on.

[0056] Step S102, selecting the target substation and the target disconnector from the substation information list;

[0057] like Figure 2 As shown, in the resistance value test interface, a substation information list can be displayed, from which a target substation and a target disconnector can be selected. For example, the target substation is substation 1, and the target disconnector is disconnector 11.

[0058] Step S103: performing a contact resistance test on a target disconnector of the target substation according to the received contact resistance test information and test instruction to obtain a target contact resistance test result.

[0059] like Figure 3 As shown, in one embodiment, optionally, step S103 includes:

[0060] Step S301, performing multiple contact resistance tests on the target disconnector of the target substation according to the received contact resistance test information and test instructions to obtain corresponding contact resistance test results;

[0061] Step S302, calculating an average value of the contact resistance test results of the multiple contact resistance tests to obtain an average contact resistance test value;

[0062] Step S303: determining the target contact resistance test result according to the difference between the average contact resistance test value and the preset contact resistance value.

[0063] In one embodiment, optionally, the method further comprises:

[0064] The target disconnector of the target substation and the target contact resistance test result are stored correspondingly.

[0065] Specifically, Figure 4 As shown, you can enter the preset contact resistance value on the resistance test page, click "Resistance Calculation" or press Enter to start the calculation, and then obtain the contact resistance value of the current disconnector based on the difference between the average contact resistance test value and the preset contact resistance value, determine the target contact resistance test result, and click "Save Result" to save the current result.

[0066] In one embodiment, optionally, the method further comprises:

[0067] Receive an input substation information adding instruction and newly added substation information, wherein the substation information includes: an operation number of a disconnector, a substation name, and a voltage level;

[0068] According to the substation information adding instruction, the newly added substation information is added to the substation information list.

[0069] Specifically, Figure 5 As shown, click the Add button to enter the substation information maintenance interface, enter the operation number, substation name, voltage level, remarks and other information, and click the Save button. A prompt message will appear after success.

[0070] like Figure 6 As shown, click the Add button to enter the disconnector information maintenance interface, select the substation to which it belongs, enter the disconnector operation number, voltage level, manufacturer, product model, remarks and other information, and click the Save button. A prompt message will appear after success.

[0071] In one embodiment, optionally, the method further comprises:

[0072] Receive input substation information editing instructions;

[0073] According to the substation information editing instruction, the corresponding target substation information is determined, and a corresponding editing operation is performed on the target substation information in the substation information list.

[0074] Specifically, Figure 7 As shown, select the data to be edited, click the Edit button to enter the substation information editing interface, and click the Save button after editing. Click the selected data and click the Delete button to delete the corresponding substation information.

[0075] like Figure 8As shown, select the data to be edited, click the Edit button to enter the disconnector information editing interface, and click the Save button after editing. Click the selected data and click the Delete button to delete the corresponding disconnector information. Please be careful when deleting.

[0076] In one embodiment, optionally, the method further comprises:

[0077] Receive an input query instruction for historical contact resistance test results;

[0078] According to the historical contact resistance test result query instruction, the corresponding target historical contact resistance test result is queried.

[0079] Specifically, Fig. 9 As shown, query the test data of previous disconnectors. Click View Details to view the results of previous tests.

[0080] Of course, in order to ensure the safety of the contact resistance test system of the isolating switch, the contact resistance test system of the isolating switch can be logged in by logging in with a user name and password.

[0081] Fig.10 A block diagram of a contact resistance testing system for an isolating switch according to an embodiment of the present application is shown.

[0082] like Fig.10 As shown, in a second aspect, an embodiment of the present application provides a contact resistance testing system 1000 for an isolating switch, comprising:

[0083] The isolating switch closing simulator 1001 is used to provide an isolating switch closing simulation scenario when the isolating switch cannot be closed normally;

[0084] The function of the isolating switch closing simulator is to provide a closing simulation scenario of the isolating switch when the isolating switch cannot be closed normally, which includes: a closing simulator chuck and a closing simulator wire. The closing simulator chuck includes contact materials and terminal board materials, wherein the contact materials and terminal board materials can be made of copper alloys, aluminum alloys, and silver alloys, etc., and the two can be fixed by bolt fixing, snap-on fixing, and sheet-type fixing. The closing simulator wire can be made of materials such as copper-plated silver, aluminum alloy, and silver, and can be fixed by bolt fixing, plug-in fixing, and chuck fixing. By screening the simulator chuck and wires, the difference between the contact resistance test value and the actual value during simulation can be minimized.

[0085] A contact resistance tester 1002 is used to test the contact resistance of the isolating switch and output the corresponding contact resistance test result;

[0086] The function of the contact resistance tester is to complete the test of the contact resistance of the disconnector and export the test results. Because of the integration of the test system, the best choice for the tester is to make a complete set of tools with the other two parts, but under limited conditions, using the current mainstream tester will not affect the main functions of the test system.

[0087] The data transmission device 1003 is used to transmit the contact resistance test result.

[0088] The data transmission device completes the data exchange within the allowed time. In addition, it can also perform logical calculation analysis on the data exported by the tester and give a judgment result. The difference between the test results in the simulation environment and the actual situation can be further reduced by means of logical analysis.

[0089] like Fig.11 As shown, in a third aspect, an embodiment of the present application provides a contact resistance testing device 1100 for an isolating switch, comprising:

[0090] A determination module 1101 is used to determine a target substation and a target disconnector for contact resistance testing;

[0091] A selection module 1102 is used to select the target substation and the target disconnector from the substation information list;

[0092] The testing module 1103 is used to perform a contact resistance test on the target disconnector of the target substation according to the received contact resistance test information and test instruction, and obtain a target contact resistance test result.

[0093] In one embodiment, optionally, the device further comprises:

[0094] The storage module is used to store the target disconnector of the target substation and the target contact resistance test result in correspondence.

[0095] In one embodiment, optionally, the device further comprises:

[0096] A first receiving module is used to receive an input substation information adding instruction and newly added substation information, wherein the substation information includes: an operation number of a disconnector, a substation name and a voltage level;

[0097] An adding module is used to add the newly added substation information to the substation information list according to the substation information adding instruction.

[0098] In one embodiment, optionally, the device further comprises:

[0099] A second receiving module is used to receive an input substation information editing instruction;

[0100] The editing module is used to determine the corresponding target substation information according to the substation information editing instruction, and perform corresponding editing operations on the target substation information in the substation information list.

[0101] In one embodiment, optionally, the device further comprises:

[0102] A third receiving module is used to receive an input query instruction for historical contact resistance test results;

[0103] The query module is used to query the corresponding target historical contact resistance test result according to the historical contact resistance test result query instruction.

[0104] In one embodiment, optionally, the test module is used to:

[0105] According to the received contact resistance test information and test instructions, multiple contact resistance tests are performed on the target disconnector of the target substation to obtain corresponding contact resistance test results;

[0106] Calculating an average value of the contact resistance test results of the multiple contact resistance tests to obtain an average contact resistance test value;

[0107] The target contact resistance test result is determined according to the difference between the average contact resistance test value and a preset contact resistance value.

[0108] In the scheme implemented by the contact resistance test method, device, equipment and medium of the above disconnector, the target substation and target disconnector to be tested for contact resistance are determined; the target substation and the target disconnector are selected from the substation information list; according to the received contact resistance test information and test instructions, the target disconnector of the target substation is tested for contact resistance to obtain the target contact resistance test result. Through the above technical scheme of the present invention, modern information technology is used to simplify the complex calculation of the disconnector contact resistance simulation value and systematically store, analyze and file the test results, so that the user can timely understand the contact resistance of the disconnector and discover safety hazards in time.

[0109] In a fourth aspect, a computer device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the steps of the contact resistance test method of the isolating switch when executing the computer program.

[0110] In a fifth aspect, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the contact resistance testing method of the isolating switch are implemented.

[0111] It should be noted that, those skilled in the art can clearly understand that, for the convenience and simplicity of description, the specific working processes of the contact resistance testing device and each module of the isolating switch described above can refer to the corresponding processes in the aforementioned contact resistance testing method embodiment of the isolating switch, and will not be repeated here.

[0112] It should be noted that, those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the model training device and each module described above can refer to the corresponding processes in the aforementioned contact resistance testing method embodiment of the isolating switch, and will not be repeated here.

[0113] The contact resistance test device of the disconnector can be implemented in the form of a computer program. Fig.12 Runs on the computer device shown.

[0114] Fig.12 A block diagram of a computer device according to an embodiment of the present application is shown.

[0115] See also Fig.12 The computer device includes a processor, a memory and a network interface connected through a system bus, wherein the memory may include a storage medium and an internal memory.

[0116] The storage medium can store an operating system and a computer program. The computer program includes program instructions, and when the program instructions are executed, the processor can execute any one of the multi-source data contact resistance testing methods for an isolating switch provided in the embodiments of the present application.

[0117] The processor is used to provide computing and control capabilities and support the operation of the entire computer equipment.

[0118] The internal memory provides an environment for the operation of the computer program in the storage medium. When the computer program is executed by the processor, the processor can execute any contact resistance test method of the isolating switch with multi-source data. The storage medium can be non-volatile or volatile.

[0119] The network interface is used for network communication, such as sending assigned tasks, etc. Those skilled in the art will understand that Fig.12 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have a different arrangement of components.

[0120] It should be understood that the processor may be a central processing unit (CPU), and the processor may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0121] In addition, an embodiment of the present application provides a computer-readable storage medium storing computer-executable instructions, wherein the computer-executable instructions are used to execute the steps of the method in the embodiment of the first aspect.

[0122] It should be noted that the above functions or steps that can be implemented by the computer-readable storage medium or electronic device can refer to the relevant description in the aforementioned method embodiment. To avoid repetition, they will not be described one by one here.

[0123] It should be understood that the term "and / or" used in this article is only a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0124] It should be understood that, although the terms first, second, etc. may be used to describe the setting unit in the embodiments of the present application, these setting units should not be limited to these terms. These terms are only used to distinguish the setting units from each other. For example, without departing from the scope of the embodiments of the present application, the first setting unit may also be referred to as the second setting unit, and similarly, the second setting unit may also be referred to as the first setting unit.

[0125] The word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining" or "in response to detecting", depending on the context. Similarly, the phrases "if it is determined" or "if (stated condition or event) is detected" may be interpreted as "when it is determined" or "in response to determining" or "when detecting (stated condition or event)" or "in response to detecting (stated condition or event)", depending on the context.

[0126] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0127] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of hardware plus software functional units.

[0128] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM is available in many forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM).

[0129] The embodiments described above are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. Such modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention, and should all be included in the protection scope of the present invention.

Claims

1. A contact resistance testing method for an isolating switch, characterized in that: The method comprises: Determine the target substation and target disconnector for contact resistance test; Select the target substation and the target disconnector from the substation information list; According to the received contact resistance test information and test instruction, a contact resistance test is performed on the target disconnector of the target substation to obtain a target contact resistance test result.

2. The method according to claim 1, characterized in that The method further comprises: The target disconnector of the target substation and the target contact resistance test result are stored correspondingly.

3. The method according to claim 1, characterized in that The method further comprises: Receive an input substation information adding instruction and newly added substation information, wherein the substation information includes: an operation number of a disconnector, a substation name, and a voltage level; According to the substation information adding instruction, the newly added substation information is added to the substation information list.

4. The method according to claim 3, characterized in that The method further comprises: Receive input substation information editing instructions; According to the substation information editing instruction, the corresponding target substation information is determined, and a corresponding editing operation is performed on the target substation information in the substation information list.

5. The method according to claim 1, characterized in that: The method further comprises: Receive an input query instruction for historical contact resistance test results; According to the historical contact resistance test result query instruction, the corresponding target historical contact resistance test result is queried.

6. The method according to claim 1, characterized in that According to the received contact resistance test information and test instruction, a contact resistance test is performed on the target disconnector of the target substation to obtain a target contact resistance test result, including: According to the received contact resistance test information and test instructions, multiple contact resistance tests are performed on the target disconnector of the target substation to obtain corresponding contact resistance test results; Calculating an average value of the contact resistance test results of the multiple contact resistance tests to obtain an average contact resistance test value; The target contact resistance test result is determined according to the difference between the average contact resistance test value and a preset contact resistance value.

7. A contact resistance test system for an isolating switch, characterized in that: The system comprises: The isolating switch closing simulator is used to provide an isolating switch closing simulation scenario when the isolating switch cannot be closed normally; A contact resistance tester, used to test the contact resistance of the isolating switch and output the corresponding contact resistance test result; A data transmission device is used to transmit the contact resistance test result.

8. A contact resistance test device for an isolating switch, characterized in that: include: A determination module, used to determine a target substation and a target disconnector for contact resistance testing; A selection module, used to select the target substation and the target disconnector from the substation information list; The test module is used to perform a contact resistance test on a target disconnector of the target substation according to the received contact resistance test information and test instructions to obtain a target contact resistance test result.

9. A computer device, characterized in that: include: at least one processor; and, a memory communicatively coupled to the at least one processor; The memory stores instructions executable by the at least one processor, wherein the instructions are configured to execute the method according to any one of claims 1 to 6.

10. A computer-readable storage medium, characterized in that: Computer executable instructions are stored, and the computer executable instructions are used to execute the method according to any one of claims 1 to 6.

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