Voltage aging test system for three-terminal capacitor and test method thereof

Abstract

The invention discloses a voltage aging test system for a three-terminal capacitor and a test method thereof, and belongs to the technical field of voltage aging test of the three-terminal capacitor, the voltage aging test system specifically comprises a baking module and a performance test module, the baking module is used for heating and aging the three-terminal capacitor for a set time, and the performance test module is used for testing the performance of the three-terminal capacitor. The performance test module is used for testing aging performance indexes of the three-terminal capacitor after the three-terminal capacitor is baked, and the performance test module adopts a performance test clamp to clamp and fix the three-terminal capacitor; the three-terminal capacitor is aged and baked through the baking module, and the baked three-terminal capacitor is fixed by the performance index test fixture and is connected to the performance index tester for testing, so that the test accuracy and reliability are greatly improved, time and labor are saved during test, and the labor intensity and labor force are greatly reduced.

Description

Technical Field

[0001] The invention relates to a voltage aging test system and a test method for a three-terminal capacitor, belonging to the technical field of voltage aging test of a three-terminal capacitor. Background Art

[0002] The aging performance index test of the three-terminal capacitor usually requires placing it in an aging baking oven and baking it at a set temperature for a set time, and then connecting the three-terminal capacitor to a capacitor voltage aging performance index tester for aging performance testing. The three-terminal capacitor is a surface-mount type, and the commonly used method in the industry is to manually connect to several terminals for measurement. This method is time-consuming and labor-intensive, difficult for one person to operate, and has poor test accuracy and reliability. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide a voltage aging test system and a test method for a three-terminal capacitor, which saves time and effort in measurement and can be operated by one person, and the test accuracy and stability are greatly improved.

[0004] The technical solution adopted by the present invention is: a voltage aging test system for a three-terminal capacitor, including a baking module and a performance testing module, wherein the baking module is used to perform heating aging on the three-terminal capacitor for a set time, and the performance testing module is used to test the capacitor aging performance index after the three-terminal capacitor is baked, and the performance testing module uses a performance testing fixture to clamp and fix the three-terminal capacitor.

[0005] Furthermore, the above-mentioned performance testing fixture includes a four-claw finger cylinder, a probe mounting plate, an elastic telescopic probe and a limit plate. The four-claw finger cylinder is fixedly connected to the workbench, the probe mounting plate is an inverted T-plate structure, the upper end face of each finger of the four-claw finger cylinder is fixedly connected to the bottom plate of the probe mounting plate, and the vertical plate of the probe mounting plate is fixedly connected with an elastic telescopic probe. The four elastic telescopic probes can contact the end faces of the four measuring pins of the three-terminal capacitor. The limit plate is fixedly connected to the workbench through a column, and a limit groove for placing the three-terminal capacitor is provided in the middle of the upper end face, and guide grooves for the elastic telescopic probe to pass through are symmetrically arranged on the four sides of the limit groove. An avoidance hole is provided on the limit plate opposite to the probe mounting plate, and the avoidance hole can ensure the radial movement range of the vertical plate of the probe mounting plate. The four elastic telescopic probes are connected to the capacitor aging performance index tester of the three-terminal capacitor.

[0006] Furthermore, a measured placement slot and a placement slot to be measured are respectively arranged on the left and right sides of the workbench. The heights of the measured placement slot and the placement slot to be measured are similar to the limit plate, and square holes are arranged at the bottom.

[0007] Furthermore, the above-mentioned four-claw finger cylinder is connected to a foot-operated pneumatic switch.

[0008] Furthermore, the bottom plate of the probe mounting plate is provided with two symmetrical strip-shaped through holes, and two screws are passed through the strip-shaped through holes to fix the probe mounting plate to the fingers of the four-claw finger cylinder.

[0009] Furthermore, the baking module includes a circuit board and a baking test socket. A plurality of baking test sockets are arranged on the circuit board. A plurality of placement slots for placing three-terminal capacitors are arranged on the top surface of the baking test socket. The plurality of placement slots are connected in parallel to the positive and negative poles of the power supply. A current limiting resistor and an indicator light are connected in series to each placement slot. The current limiting resistor and the indicator light are arranged on the circuit board next to the placement slot. The circuit board is placed in the oven.

[0010] Furthermore, the positive and negative poles are respectively connected to two conductive pins, which are arranged on the rear side of the base. The circuit board is fixedly connected to the base. The base is placed in a slot on the oven. The slots are arranged in multiple layers. A socket is arranged on the rear wall panel of the oven behind each layer of the slots. The two sockets on the socket are connected to the two conductive pins.

[0011] Furthermore, the base includes a side seat and a bottom plate. Two side seats are used, which are fixedly connected to the front and rear ends of the bottom plate respectively. The circuit board is fixedly connected to the tops of the two side seats. Multiple support columns are arranged between the two side seats, and the two ends of the support columns are fixedly connected to the bottom plate and the circuit board respectively. Furthermore, a handle is provided on the front end surface of the front side seat.

[0012] Furthermore, a welding pad connected to the positive and negative electrodes of the three-terminal capacitor is arranged at the bottom of the placement groove, and an elastic sheet is arranged on the side, and the elastic sheet can clamp the three-terminal capacitor.

[0013] A testing method for a voltage aging test system of a three-terminal capacitor, the method comprising the following steps: 1) Place the three-terminal capacitor to be tested into the placement slot; 2) Insert the base into the oven and connect the conductive pins to the socket; 3) Set the oven temperature, start the oven, reach the old fire test temperature range, and start the socket power supply; 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is judged that the three-terminal capacitor corresponding to the indicator light is short-circuited; 5) Remove the three-terminal capacitor with normal indicator light and place it in the limit slot, start the four-claw finger cylinder, drive the elastic telescopic probe to contact the four side pads of the three-terminal capacitor and connect it to the capacitor aging performance index tester to perform aging performance index test on the baked three-terminal capacitor. Beneficial effects of the present invention: Compared with the prior art, the present invention uses a baking module to perform aging baking on the three-terminal capacitor. After baking, it is fixed with a performance index test fixture and connected to a performance index tester for testing, which greatly improves the test accuracy and reliability, saves time and effort in testing, and greatly reduces labor intensity and labor. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a module schematic diagram of a three-terminal capacitor voltage aging test system; Figure 2 It is a schematic diagram of the front cross-sectional structure of the performance test fixture; Figure 3 It is a schematic diagram of the top view of the performance test fixture; Figure 4 It is a schematic diagram of the structure viewed from above at the limit plate; Figure 5 is a schematic diagram of the side structure of the baking module; Figure 6 is a front view structural diagram of the baking module; Figure 7 It is a schematic diagram of the installation structure of the circuit board and the base of the baking module; Figure 8 It is a schematic diagram of the structure of a three-terminal capacitor viewed from above. DETAILED DESCRIPTION

[0015] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0016] Example 1: Figure 1-8 As shown, a voltage aging test system for a three-terminal capacitor includes a baking module and a performance testing module, wherein the baking module is used to perform heating aging on the three-terminal capacitor for a set time, and the performance testing module is used to test the capacitor aging performance index after the three-terminal capacitor is baked. The performance testing module clamps and fixes the three-terminal capacitor with a performance testing fixture; the three-terminal capacitor is aged and baked by the baking module, and after baking, it is fixed with a performance index test fixture and connected to a performance index tester for testing, which greatly improves the test accuracy and reliability, saves time and effort in testing, and greatly reduces labor intensity and labor.

[0017] The performance test fixture includes a four-claw finger cylinder 201, a probe mounting plate 202, an elastic retractable probe 203 and a limit plate 204. The four-claw finger cylinder 201 is fixedly connected to a workbench 206. The probe mounting plate 202 is an inverted T-shaped plate structure. The upper end surface of each finger 205 of the four-claw finger cylinder 201 is fixedly connected to the bottom plate of the probe mounting plate 202. The vertical plate of the probe mounting plate 202 is fixedly connected with an elastic retractable probe 203. The four elastic retractable probes 203 can contact the three-terminal On the four measuring pin end faces of the container 103, the limit plate 204 is fixedly connected to the workbench 206 through the column 207, and a limit groove 208 for placing the three-terminal capacitor 103 is arranged in the middle of the upper end face, and guide grooves 209 for the elastic telescopic probe 203 to pass through are symmetrically arranged on the four sides of the limit groove 208. The limit plate 204 facing the probe mounting plate 202 is provided with an avoidance hole 210, and the avoidance hole 210 can ensure the radial movement range of the vertical plate of the probe mounting plate 202. The four elastic telescopic probes 203 are connected The invention relates to a capacitor aging performance index tester for a three-terminal capacitor. When in use, the baked three-terminal capacitor to be tested is clamped with tweezers and placed in the limit groove, and the four-claw finger cylinder is started. Under the inward driving action of the four fingers, the four elastic retractable probes contact the four electrodes of the three-terminal capacitor, which can achieve reliable electrical contact and is also convenient for checking the contact reliability. The elastic structure can also protect the electrodes of the three-terminal capacitor and avoid damage caused by excessive force. The test fixture with this structure is used to fix the three-terminal capacitor and connect it to the performance index tester for testing, which greatly improves the test accuracy and reliability, saves time and effort, and greatly reduces labor intensity and labor. In order to avoid a larger space, the vertical plate length of the probe mounting plate 202 is one-third of the bottom plate length of the probe mounting plate 202 and the vertical plate is arranged against the inside of the bottom plate. The upper end surface of the bottom plate is lower than the bottom surface of the limit plate 204. This structure facilitates the vertical plate to avoid walking at the avoidance hole, and the avoidance hole width is greater than the bottom plate width, which is convenient for adjusting the position of the probe mounting plate 202.

[0018] In order to facilitate the placement of the three-terminal capacitor to be tested, a tested placement slot 211 and a placement slot to be tested 212 are respectively provided on the left and right sides of the workbench 206. The heights of the tested placement slot 211 and the placement slot to be tested 212 are similar to the limiting plate 204, and square holes 213 are provided at the bottom. During testing, the baked three-terminal capacitor is placed in the placement slot to be tested 212 on the right, and the three-terminal capacitor is clamped with tweezers and placed in the limiting slot. After the test is completed, the three-terminal capacitor is clamped with tweezers.

[0019] In order to facilitate the start-up control of the four-claw finger cylinder, the four-claw finger cylinder 201 is connected to a foot-operated pneumatic switch 214 through an air supply pipe. The foot-operated pneumatic switch is easy to operate, saving time and effort. The foot-operated pneumatic switch is connected to the air source. The foot-operated pneumatic switch is stepped on to start the four fingers of the four-claw finger cylinder to move radially synchronously, so that the elastic telescopic probe contacts the four end electrodes of the three-terminal capacitor. The foot-operated pneumatic switch is released, and the four fingers of the four-claw finger cylinder drive the four elastic telescopic probes away from the three-terminal capacitor to complete the test.

[0020] In order to achieve radial position adjustment of the probe mounting plate 202 and to realize rapid adjustment of the position by replacing different limit plates to place different test devices for testing, the bottom plate of the probe mounting plate 202 is provided with two symmetrical strip through holes 216. Two screws 215 are used to pass through the strip through holes 216 to fix the elastic telescopic probe mounting plate 202 to the fingers of the four-claw finger cylinder 201. The radial position can be rapidly adjusted by loosening the screws, adjusting to a suitable position and then tightening the screws. The adjustment is convenient and quick and can adapt to the use requirements of different products after adjustment.

[0021] Among them, the baking module includes a circuit board 101 and a baking test seat 102. A plurality of baking test seats 102 are arranged on the circuit board 101. A plurality of placement slots 105 for placing three-terminal capacitors 103 are arranged on the top surface of the baking test seat 102. The plurality of placement slots 105 are connected in parallel to the positive and negative poles of the power supply. Each placement slot 105 is connected in series with a current limiting resistor 106 and an indicator light 107. The current limiting resistor 106 and the indicator light 107 are arranged on the circuit board 101 next to the placement slot 105. The circuit board 101 is placed in an oven 112. A single placement slot adopts a single circuit to ensure that the inspection voltage is accurate. An indicator light is added at each placement slot. When the product contact is good, the indicator light lights up. If the light goes out, it is judged to be a short circuit, thereby realizing visual inspection and inspection of the baking process, improving inspection accuracy and efficiency, and solving the problems of incomplete product aging, defective products flowing to the customer end, and the inability to inspect the aging process. In order to extend the service life of the indicator light, a current limiting resistor is added in front of each indicator light to avoid excessive current burning the indicator light.

[0022] In order to facilitate baking in the oven, the positive and negative poles are respectively connected to two conductive pins 104, and the two conductive pins 104 are arranged on the rear side of the base 108. The circuit board 101 is fixedly connected to the base 108, and the base 108 is placed in a slot 109 on the oven 112. The slot 109 is arranged in multiple layers, and a socket 110 is arranged on the rear wall plate of the oven 112 behind each layer of the slot 109. The two sockets on the socket 110 are connected to the two conductive pins 104. After the structure is pushed into the oven slot, the positive and negative poles of the socket are automatically connected, which reduces the cable layout, the base support, better stability, and also avoids the circuit board from being affected.

[0023] In order to improve the supporting stability and facilitate use in the oven, the base 108 includes a side seat 801 and a bottom plate 802. Two side seats 801 are used, which are fixedly connected to the front and rear ends of the bottom plate 802 respectively. The circuit board 101 is fixedly connected to the tops of the two side seats 801. A plurality of support columns 803 are arranged between the two side seats 801. The two ends of the support columns 803 are fixedly connected to the bottom plate 802 and the circuit board 101 respectively. The support of this structure is stable and reliable. The side seat 801 is a convex strip structure. The two raised sides of the side seats are arranged opposite to each other. The bottom plate and the circuit board are arranged on a step formed by the relative arrangement. The structural stability is better. In order to facilitate pulling out in the oven, a handle 804 is provided on the front end surface of the front side seat 801 .

[0024] In order to ensure the reliability of the conductive connection, a pad for connecting the positive and negative electrodes of the three-terminal capacitor is arranged at the bottom of the placement groove 105, and two symmetrical elastic sheets are arranged on the side, and the elastic sheets can clamp the three-terminal capacitor.

[0025] Embodiment 2: A testing method for a voltage aging testing system of a three-terminal capacitor, the method comprising the following steps: 1) Place the three-terminal capacitor to be tested into the placement slot; 2) Insert the base into the oven and connect the conductive pins to the socket; 3) Set the oven temperature, start the oven, reach the old fire test temperature range, and start the socket power supply; 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is judged that the three-terminal capacitor corresponding to the indicator light is short-circuited; 5) Remove the three-terminal capacitor with normal indicator light and place it in the limit slot, start the four-claw finger cylinder, drive the elastic telescopic probe to contact the four side pads of the three-terminal capacitor and connect it to the capacitor aging performance index tester to perform aging performance index test on the baked three-terminal capacitor. The above description is only a specific implementation mode of the present invention, but the protection scope of the present invention is not limited thereto. Any technician familiar with the technical field can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A voltage aging test system for a three-terminal capacitor, characterized in that: It includes a baking module and a performance testing module, wherein the baking module is used to perform heating aging on the three-terminal capacitor for a set time, and the performance testing module is used to test the capacitor aging performance index after baking the three-terminal capacitor. The performance testing module uses a performance testing fixture to clamp and fix the three-terminal capacitor.

2. A voltage aging test system for a three-terminal capacitor according to claim 1, characterized in that: The performance test fixture comprises a four-claw finger cylinder (201), a probe mounting plate (202), an elastic telescopic probe (203) and a limit plate (204); the four-claw finger cylinder (201) is fixedly connected to a workbench (206); the probe mounting plate (202) is an inverted T-shaped plate structure; the upper end surface of each finger (205) of the four-claw finger cylinder (201) is fixedly connected to the bottom plate of the probe mounting plate (202); the elastic telescopic probe (203) is fixedly connected to the vertical plate of the probe mounting plate (202); the four elastic telescopic probes (203) are capable of contacting the four measuring pin terminals of the three-terminal capacitor (103) The limiting plate (204) is fixedly connected to the workbench (206) through a column (207), and a limiting groove (208) for placing a three-terminal capacitor (103) is arranged in the middle of the upper end surface, and guide grooves (209) for elastic telescopic probes (203) to pass through are symmetrically arranged on four sides of the limiting groove (208), and an avoidance hole (210) is arranged on the limiting plate (204) directly opposite to the probe mounting plate (202), and the avoidance hole (210) can ensure the radial movement range of the vertical plate of the probe mounting plate (202), and the four elastic telescopic probes (203) are connected to the capacitance aging performance index tester of the three-terminal capacitor.

3. A voltage aging test system for a three-terminal capacitor according to claim 2, characterized in that: A measured placement slot (211) and a placement slot to be measured (212) are respectively arranged on the left and right sides of the workbench (206). The heights of the measured placement slot (211) and the placement slot to be measured (212) are similar to the limit plate (204), and square frame holes (213) are arranged at the bottom.

4. A voltage aging test system for a three-terminal capacitor according to claim 2, characterized in that: The four-claw finger cylinder (201) is connected to a foot-operated pneumatic switch (214).

5. A voltage aging test system for a three-terminal capacitor according to claim 2, characterized in that: The bottom plate of the probe mounting plate (202) is provided with two symmetrical strip-shaped through holes (202), and two screws (215) are passed through the strip-shaped through holes (202) to fix the probe mounting plate (202) to the fingers of the four-claw finger cylinder (201).

6. A voltage aging test system for a three-terminal capacitor according to claim 2, characterized in that: The baking module comprises a circuit board (101) and a baking test seat (102); a plurality of baking test seats (102) are arranged on the circuit board (101); a plurality of placement slots (105) for placing three-terminal capacitors (103) are arranged on the top surface of the baking test seat (102); the plurality of placement slots (105) are connected in parallel to the positive and negative electrodes of a power source; each placement slot (105) is connected in series with a current limiting resistor (106) and an indicator light (107); the current limiting resistor (106) and the indicator light (107) are arranged on the circuit board (101) next to the placement slot (105); and the circuit board (101) is placed in a baking oven (112).

7. A voltage aging test system for a three-terminal capacitor according to claim 1, characterized in that: The positive and negative electrodes are respectively connected to two conductive pins (104), the two conductive pins (104) are arranged on the rear side of the base (108), the circuit board (101) is fixedly connected to the base (108), the base (108) is placed in a slot (109) on the oven (112), the slot (109) is arranged in multiple layers, and a socket (110) is arranged on the rear wall plate of the oven (112) behind each layer of the slot (109), and the two sockets on the socket (110) are connected to the two conductive pins (104).

8. A voltage aging test system for a three-terminal capacitor according to claim 1, characterized in that: The base (108) comprises a side seat (801) and a bottom plate (802). Two side seats (801) are provided and are respectively fixedly connected to the front and rear ends of the bottom plate (802). The circuit board (101) is fixedly connected to the tops of the two side seats (801). A plurality of support columns (803) are arranged between the two side seats (801). The two ends of the support columns (803) are respectively fixedly connected to the bottom plate (802) and the circuit board (101).

9. A voltage aging test system for a three-terminal capacitor according to claim 4, characterized in that: A welding pad connected to the positive and negative electrodes of the three-terminal capacitor is arranged at the bottom of the placement groove (105), and an elastic sheet is arranged on the side, and the elastic sheet can clamp the three-terminal capacitor.

10. The testing method of a voltage aging testing system for a three-terminal capacitor according to claim 6, characterized in that: The method comprises the following steps: 1) Place the three-terminal capacitor to be tested into the placement slot; 2) Insert the base into the oven and connect the conductive pins to the socket; 3) Set the oven temperature, start the oven, reach the old fire test temperature range, and start the socket power supply; 4) When the set baking time is reached, observe whether the indicator light is on. If the indicator light is off, it is judged that the three-terminal capacitor corresponding to the indicator light is short-circuited; 5) Remove the three-terminal capacitor with normal indicator light and place it in the limit slot, start the four-claw finger cylinder, drive the elastic telescopic probe to contact the four side pads of the three-terminal capacitor and connect it to the capacitor aging performance index tester to perform aging performance index test on the baked three-terminal capacitor.

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