Electrical control board card test system

Abstract

The invention relates to the field of automatic testing, in particular to an electrical control board card testing system, and aims to improve the testing efficiency. The system comprises an upper computer, one or more test devices, one or more relay switching units, and one or more adapter plates in one-to-one correspondence with board cards to be tested. The relay switching unit is configured to control the on-off state of each relay according to a switching instruction of the upper computer, so that the test equipment and the adapter plate are connected or disconnected; the upper computer is configured to send a switching instruction to the relay switching unit, send an instrument setting instruction and a test instruction to the test equipment and receive a test result; the test equipment is configured to perform parameter setting according to an instrument setting instruction, and send a test signal to the adapter plate or obtain a test result according to a test instruction; and the adapter plate is configured to perform signal conversion and interface adaptation between the test equipment and the to-be-tested board card. According to the system, the testing efficiency is improved, and errors caused by manual operation are avoided.

Description

Technical Field

[0001] The invention relates to the field of automated testing, and in particular to an electrical control board testing system. Background Art

[0002] In the electronics manufacturing industry, electrical control boards are core components of various electronic devices. Their performance and reliability are directly related to the operating quality and stability of the entire equipment. Therefore, comprehensive testing after the board production is completed is an indispensable part of ensuring product quality.

[0003] Since different models of boards have different interfaces and signal standards, the test system needs to be adjusted and adapted whenever the board is replaced. Traditional testing methods often rely on manual operations, and the test equipment and connecting cables need to be frequently replaced during the test process to adapt to boards of different models and specifications, which makes it difficult to improve test efficiency. Summary of the invention

[0004] In order to solve the above problems in the prior art, the present invention provides an electrical control board test system to improve the test efficiency.

[0005] A first aspect of the present invention provides an electrical control board test system, the system comprising: a host computer, one or more test devices, one or more relay switching units, and one or more adapter boards, the number of the adapter boards being the same as the number of boards to be tested and corresponding to each other;

[0006] The relay switching unit is electrically connected to the test device and the adapter board respectively, and is configured to: control the switch state of each relay according to the switching instruction of the host computer, so that the electrical connection between the test device and the adapter board is established or disconnected;

[0007] The host computer is respectively connected to the test device and the relay switching unit for communication, and is configured to: send the switching instruction to the relay switching unit; send instrument setting instructions and test instructions to the test device and receive the test results returned by the test device;

[0008] The test device is configured to set its own parameters according to the instrument setting instruction, and send a test signal to the adapter board or obtain the test result according to the test instruction;

[0009] The adapter board is also electrically connected to the corresponding board to be tested, and is configured to perform signal conversion and interface adaptation between the test equipment and the board to be tested.

[0010] Preferably, each of the relay switching units comprises: a microcontroller, M latches and M relay modules, each of the relay modules comprising N relays that can be independently controlled;

[0011] The microcontroller is configured to: receive the switching instruction sent by the host computer through TCP (Transmission Control Protocol) communication, and send a latch signal and a target state of each relay in the corresponding relay module to each latch according to the switching instruction; or, according to a read instruction of the host computer, send the current switch state of each relay to the host computer; the switching instruction includes: a target state matrix of M×N relays in the relay switching unit;

[0012] The latch is configured to perform a latching operation according to the latching signal and the target state of each relay in the corresponding relay module, thereby controlling the switching state of each relay in the corresponding relay module.

[0013] Wherein, M and N are both preset values.

[0014] Preferably, the host computer includes: a setting module, a control module and a test module;

[0015] The setting module is configured to: set the product information of each board to be tested, the ID (Identity Document) of the corresponding relay switching unit and the ID of the test item according to user input; set the corresponding target state matrix, test parameters, initialization script and test script according to user input for each test item; each board to be tested corresponds to one or more relay switching units and one or more test items; the test parameters are called by the initialization script or the test script;

[0016] The control module is configured to: obtain the ID of the test item selected by the user and the start instruction; in the semi-automatic mode, call the test module to execute the selected test item according to the start instruction and the ID of the selected test item; in the fully automatic mode, call the test module to complete the selected test item and then continue to execute the next test item;

[0017] The test module is configured as follows: according to the target state matrix corresponding to the test item selected by the user, the switching instruction is sent to the corresponding relay switching unit; the initialization script and the test script corresponding to the selected test item are parsed; the instrument setting instruction is sent to the test device according to the initialization script; the test instruction is sent to the test device according to the test script, and the test result returned by the test device is received and displayed.

[0018] Preferably, the system further comprises: one or more industrial power supplies;

[0019] The industrial power supply is configured to configure power supply parameters according to the power supply setting instruction of the host computer, so as to supply power to the relay switching unit, the adapter board and the board to be tested.

[0020] Preferably, the system further comprises: a motherboard;

[0021] The motherboard is configured to: connect the input / output of the test equipment with the relay contacts of the relay switching unit, connect the network interface of the host computer with the network interface of the relay switching unit, and connect the output of the industrial power supply with the power input of the relay switching unit, the adapter board and the board to be tested.

[0022] Preferably, the system further comprises: a warm shock box;

[0023] The temperature shock box is used to simulate the ambient temperature and accommodate the motherboard, one or more relay switching units, one or more adapter boards, and the board to be tested corresponding to each adapter board.

[0024] Preferably, the system further comprises: a server;

[0025] The server is configured to receive and store the board test data sent by the host computer;

[0026] The host computer also includes: a data uploading module;

[0027] The data upload module is configured to: obtain the board test data and send it to the server;

[0028] Among them, the board test data includes: the product information of the board to be tested, the corresponding ID of the relay switching unit and the ID of the test item, and the target state matrix, the test parameters, the initialization script, the test script and the test results corresponding to each test item.

[0029] Preferably, the setting module comprises: a first setting unit, a second setting unit and a third setting unit;

[0030] The first setting unit is configured to: set the product information of each board to be tested, the ID of the corresponding relay switching unit and the ID of the test item according to user input;

[0031] The second setting unit is configured to: display the switch states of the M×N relays in each relay switching unit in a matrix form for each test item, set the switch states according to the user's operation to obtain the target state matrix, or copy the target state matrix of a certain relay switching unit and modify it as the target state matrix of another relay switching unit;

[0032] The third setting unit is configured to: for each of the test items, set test parameters according to user input and obtain an initialization script and a test script written by the user; the test parameters are called by the initialization script or the test script.

[0033] Preferably, the test module comprises: a switching control unit, a parsing unit, an initialization unit and a test unit;

[0034] The switching control unit is configured to send the switching instruction to the corresponding relay switching unit according to the target state matrix corresponding to the test item selected by the user;

[0035] The parsing unit is configured to: parse the initialization script and the test script corresponding to the selected test item respectively using a regular expression to obtain a first parsing result and a second parsing result; the first parsing result and the second parsing result both include: an instruction to write to the test device, an instruction to read the test device and / or a system delay instruction;

[0036] The initialization unit is configured to: execute an instruction to write into the test device, an instruction to read from the test device and / or a system delay instruction according to the first analysis result;

[0037] The test unit is configured to: execute instructions for writing into the test device, instructions for reading from the test device and / or system delay instructions according to the second parsing result, extract the test result from the read data using a regular expression, and display the test result.

[0038] Preferably, the initialization script and the test script are both written in VISA (Virtual Instrument Software Architecture).

[0039] The present invention has the following beneficial effects:

[0040] The electrical control board test system of the present invention can connect multiple boards to be tested, use the host computer to control the relay switching unit to connect or disconnect the connection between the test equipment and the adapter board, send setting instructions and test instructions to the test equipment, and receive the test results returned by the test equipment. With the above scheme, on the one hand, an automated connection and test can be performed on a board to be tested, and on the other hand, when preparing to test the next board to be tested, the test circuit of the previous board can be automatically disconnected and the test circuit of the next board can be connected. Especially under different temperature conditions, when it is necessary to test a plurality of boards to be tested of different models respectively, with the test system of the present invention, only one connection is required, without the need to disconnect the wires, replace the test equipment, replace the board to be tested, reconnect the wires, manually set the test equipment, etc., thereby greatly improving the test efficiency.

[0041] The microcontroller in the relay switching unit communicates with the host computer to complete the status setting of each relay. Compared with manual wiring or switching using manual dial switches, it is convenient and avoids manual operation errors.

[0042] When performing temperature cycle testing, the motherboard is connected to the test equipment, host computer and industrial power supply outside the temperature chamber through the wiring harness. In this way, multiple boards to be tested can share a set of wiring harnesses, solving the problem of too many wiring harnesses exceeding the width of the temperature chamber inlet when testing multiple boards. In addition, there is no need to develop additional temperature cycle test software and systems. You can use normal temperature test software to perform temperature cycle testing by making corresponding settings.

[0043] The VISA writing of initialization scripts and test scripts is open to users. After these scripts are parsed, only three types of instructions need to be executed by the underlying code: instructions for writing to the test device, instructions for reading from the test device, and system delay instructions. This allows users to quickly develop test plans for the board and change the test method without changing the underlying code.

[0044] The test system of the present invention supports fully automatic, semi-automatic and manual test modes and can adapt to various test scenarios.

[0045] In conclusion, the electrical control board test system of the present invention not only improves the test efficiency, but also avoids the mistakes caused by manual operation. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 It is a main structural diagram of the first embodiment of the electrical control board test system of the present invention;

[0047] Figure 2 is a schematic structural diagram of a relay switching unit in an embodiment of the present invention;

[0048] Figure 3It is a main structural diagram of the second embodiment of the electrical control board test system in the present invention. DETAILED DESCRIPTION

[0049] The preferred embodiments of the present invention are described below with reference to the accompanying drawings. It should be understood by those skilled in the art that these embodiments are only used to explain the technical principles of the present invention and are not intended to limit the protection scope of the present invention.

[0050] In order to make the purpose, technical solution and advantages of the embodiments of the present invention clearer, the technical solution in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0051] It should be noted that, in the description of the present invention, the terms "first" and "second" are only for the convenience of description, and do not indicate or imply the relative importance of the devices, elements or parameters, and therefore cannot be understood as limiting the present invention. In addition, the term "and / or" in the present invention is only a description of the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article, unless otherwise specified, generally indicates that the associated objects before and after are in an "or" relationship.

[0052] The test equipment in the embodiment of the present invention includes an oscilloscope, a multimeter, a frequency meter, etc., and supports SCPI instructions (Standard Commands for Programmable Instruments). The test equipment is connected to the host computer through a switch or a serial port and is controlled by software in the host computer.

[0053] Figure 1 Schematic diagram of the main structure of the electrical control board test system embodiment 1 of the present invention. Figure 1 As shown, the test system 100 of this embodiment includes: a host computer 110, m test devices 120-1 to 120-m, n relay switching units 130-1 to 130-n, and k adapter boards 140-1 to 140-k. There are k adapter boards and boards to be tested 200-1 to 200-k, and they correspond one to one. Among them, m, n and k are all positive integers.

[0054] The relay switching units 130-1 to 130-n are electrically connected to the test devices 120-1 to 120-m and the adapter boards 140-1 to 140-k, respectively, and are configured to control the switching state of each relay according to the switching instructions of the host computer 110, so that the electrical connection is established or disconnected between the test devices 120-1 to 120-m and the adapter boards 140-1 to 140-k.

[0055] According to the actual application scenario, each test device may be connected to one or more relay switching units, each relay switching unit may be connected to one or more test devices, and each adapter board may be connected to one or more relay switching units.

[0056] based on Figure 1 The test system can establish a test line for another board to be tested by simply switching the test system through the human-computer interaction interface of the host computer without having to manually remove or connect wires after testing one of the boards to be tested.

[0057] Figure 2 Schematic diagram of the structure of the relay switching unit in the embodiment of the present invention. Figure 2 As shown, in this embodiment, each relay switching unit 130 includes: a microcontroller 131, 8 latches 132-1 to 132-8 and 8 relay modules 133-1 to 133-8, in addition to DB37 terminals 1 and DB37 terminals 2, and each relay module contains 8 relays that can be independently controlled. Among them, the microcontroller can use the STM32F103C8T6 chip, and the latch can use the MIC5801YWM chip, which has a stronger driving capability than the 74 series chip. The microcontroller communicates with the latch through GPIO, and the 8-bit output of each latch is respectively connected to the control pins of the 8 relays in the corresponding relay module, and the 64 lines (or less than 64) from the test equipment 120 (which may come from one of the test equipments or from multiple test equipments) are respectively connected to the normally open pins of the 64 relays, and the common pins of the 64 relays are respectively connected to the DB37 terminals 1 and DB37 terminals 2, and then the two terminals are connected to the adapter board. The relay switching unit of this embodiment adopts a three-layer structure design (the upper layer is provided with a microcontroller and a latch, and the lower two layers are provided with relay modules), so as to realize the miniaturization and modularization of the relay switching unit, and the response speed is within 200ms.

[0058] The microcontroller 131 is configured to: receive the switching instruction sent by the host computer 110 through TCP communication, and send a latch signal and the target state of each relay in the corresponding relay module to each latch according to the switching instruction; or, send the current switch state of each relay to the host computer 110 according to the read instruction of the host computer 110. The switching instruction includes: the target state matrix of the 64 relays in the relay switching unit.

[0059] The latches 132 - 1 to 132 - 8 are configured to perform a latching operation according to a latching signal and a target state of each relay in the corresponding relay module, thereby controlling the switching state of each relay in the corresponding relay module.

[0060] Continue to view Figure 1 In this embodiment, the host computer 110 is respectively connected to the test devices 120-1~120-m and the relay switching units 130-1~130-n for communication, and is configured to: send a switching instruction to the relay switching unit; send an instrument setting instruction and a test instruction to the test device and receive the test result returned by the test device.

[0061] The software in the host computer 110 is written in Qt and provides a rich operation menu. According to the function, it includes: setting module, control module and test module.

[0062] Among them, the setting module is configured as follows: setting the product information of each board to be tested, the ID of the corresponding relay switching unit and the ID of the test item according to user input; setting the corresponding relay target state matrix, test parameters, initialization script and test script for each test item according to user input; each board to be tested corresponds to one or more relay switching units, and one or more test items; the test parameters are called by the initialization script or the test script.

[0063] Specifically, the setting module may include: a first setting unit, a second setting unit and a third setting unit.

[0064] Among them, the first setting unit is configured to: set the product information of each board to be tested, the ID of the corresponding relay switching unit and the ID of the test item according to the user input; the second setting unit is configured to: display the switching status of M×N relays in each relay switching unit in a matrix form for each test item, set the relay switching status according to the user's operation (the user can select the relay to be energized through a graphical interface) to obtain the target state matrix, or copy the target state matrix of a relay switching unit and modify it as the target state matrix of another relay switching unit; the third setting unit is configured to: for each test item, set the test parameters according to the user input and obtain the initialization script and test script written by the user; wherein the test parameters are called by the initialization script or the test script.

[0065] In this embodiment, the initialization script and the test script are open to the user, allowing the user to write the initialization script and the test script using VISA through the human-computer interaction interface. VISA is a communication standard for instrument control and data acquisition, which provides a set of general APIs (application programming interfaces), is a standard I / O function library that is independent of the hardware structure, is independent of hardware devices, interfaces, operating systems, and programming languages, and is applicable to various instrument interfaces.

[0066] The control module in the host computer 110 is configured to: obtain the ID of the test item selected by the user and the start instruction; in semi-automatic mode, call the test module to execute the selected test item according to the start instruction and the ID of the selected test item; in fully automatic mode, call the test module to complete the selected test item and then continue to execute the next test item.

[0067] The test module in the host computer 110 is configured as follows: according to the target state matrix corresponding to the test item selected by the user, a switching instruction is sent to the corresponding relay switching unit; the initialization script and the test script corresponding to the selected test item are parsed; the instrument setting instruction is sent to the test device according to the initialization script; the test instruction is sent to the test device according to the test script, and the test result returned by the test device is received and displayed.

[0068] Specifically, the test module may include: a switching control unit, a parsing unit, an initialization unit and a test unit.

[0069] Among them, the switching control unit is configured to send a switching instruction to the corresponding relay switching unit according to the relay target state matrix corresponding to the test item selected by the user; the parsing unit is configured to: use regular expressions to parse the initialization script and test script corresponding to the selected test item respectively, and obtain a first parsing result and a second parsing result; the first parsing result and the second parsing result both include: instructions that need to be written to the test device, instructions for reading the test device and / or system delay instructions; the initialization unit is configured to: execute instructions for writing to the test device, instructions for reading the test device and / or system delay instructions according to the first parsing result; the testing unit is configured to: execute instructions for writing to the test device, instructions for reading the test device and / or system delay instructions according to the second parsing result, extract the test results from the read data using regular expressions, and display the test results.

[0070] Continue to view Figure 1 In this embodiment, the test devices 120 - 1 to 120 - m are configured to set their own parameters according to the instrument setting instructions, and send test signals to the corresponding adapter boards or obtain test results according to the test instructions.

[0071] In this embodiment, the adapter boards 140 - 1 ˜ 140 - k are also electrically connected to the corresponding boards to be tested, and are configured to perform signal conversion and interface adaptation between the test equipment and the boards to be tested.

[0072] Figure 3 Schematic diagram of the main structure of the second embodiment of the electrical control board test system of the present invention. Figure 3 As shown, compared with the first embodiment, the test system of this embodiment includes, in addition to the host computer 110, the test equipment 120-1 to 120-m, the relay switching units 130-1 to 130-n and the adapter boards 140-1 to 140-k, the industrial power supply 150-1 to 150-p, the motherboard 160, the temperature shock box 170 and the server 180. Compared with the first embodiment, the host computer 110 of this embodiment further includes: a data upload module, which is configured to obtain the board test data and send it to the server 180. Among them, m, n, k and p are all positive integers.

[0073] In this embodiment, the industrial power supplies 150-1 to 150-p are configured to configure their own power supply parameters according to the power supply setting instructions of the host computer 110, so as to supply power to the relay switching units 130-1 to 130-n, the adapter boards 140-1 to 140-k and the boards to be tested 200-1 to 200-k. The industrial power supplies 150-1 to 150-p can adopt the GW Instek GPD-3303S power supply with a maximum output of 30V / 3A to meet the test requirements.

[0074] In this embodiment, the motherboard 160 is configured to implement the following functions:

[0075] (1) The input / output ports of the test devices 120-1 to 120-m are connected to the relay pins of the relay switching units 130-1 to 130-n so as to control the connection and disconnection between the test devices 120-1 to 120-m and the adapter boards 140-1 to 140-k through the relay switching units 130-1 to 130-n.

[0076] Note: There is no one-to-one correspondence between the test equipment, relay switching unit and adapter board. Here we only explain the general logical relationship between them. In actual use, usually only one of the boards to be tested is tested at the same time. At this time, the required test equipment needs to be connected to the adapter board corresponding to the board to be tested, and these test equipment need to be disconnected from other adapter boards.

[0077] (2) The network interface of the host computer 110 is connected to the network interface of the relay switching units 130 - 1 to 130 - n to realize the remote control and status monitoring of the relay switching units 130 - 1 to 130 - n by the host computer 110 .

[0078] (3) The output ends of the industrial power supplies 150-1 to 150-p are respectively connected to the power input ends of the relay switching units 130-1 to 130-n, the adapter boards 140-1 to 140-k and the boards to be tested 200-1 to 200-k to provide stable working power for these components.

[0079] In this embodiment, the temperature shock box 170 is used to simulate the ambient temperature and accommodate the motherboard 160, the relay switching units 130-1 to 130-n, the adapter boards 140-1 to 140-k and the corresponding boards to be tested 200-1 to 200-k.

[0080] In this embodiment, the server 180 is configured to receive and store the board test data sent by the host computer 110. The server 180 is transformed from an industrial computer, uses the mainstream Centos7 system, and installs the Oracle 11g database. The database design applies a large number of constraints, such as unique constraints, primary key constraints, foreign key constraints, etc., to ensure the correctness and integrity of the data and to ensure that no erroneous information will appear during the information operation process. Sequence sequences are used as non-business primary keys to ensure the uniqueness of the ID. Data tables are associated through foreign keys to reduce data redundancy. And in the software, data is added, deleted, modified, and queried through cascade operations. Through the above design, the accuracy of the data is guaranteed at both the database and the software.

[0081] The board test data includes: product information of each board to be tested, the ID of the corresponding relay switching unit and the ID of the test item, as well as the relay target state matrix, test parameters, initialization script, test script and test results corresponding to each test item.

[0082] In the prior art, only one board to be tested can be tested at a time during temperature cycle testing, and each test takes 120 hours. The main reasons are as follows:

[0083] (1) The width of the wire inlet of the warm shock box is limited and can only accommodate one set of wire harnesses.

[0084] (2) The test requires nearly 200 high-temperature wires, which means too many wire harnesses and difficult to manufacture test tools.

[0085] In this embodiment, there are 4 boards to be tested, and the motherboard is connected to the external test equipment through a harness. In this way, the 4 boards can share a set of harnesses, solving the problem of multi-board testing and the problem of too many harnesses. In addition, there is no need to develop additional temperature cycle test software and system, and the normal temperature test software can be used to perform the temperature cycle test by making corresponding settings.

[0086] Those skilled in the art should be able to appreciate that the method steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of electronic hardware and software, the composition and steps of each example have been generally described in the above description according to function. Whether these functions are performed in electronic hardware or software depends on the specific application and design constraints of the technical solution. Those skilled in the art may use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0087] So far, the technical solutions of the present invention have been described in conjunction with the preferred embodiments shown in the accompanying drawings. However, it is easy for those skilled in the art to understand that the protection scope of the present invention is obviously not limited to these specific embodiments. Without departing from the principle of the present invention, those skilled in the art can make equivalent changes or substitutions to the relevant technical features, and the technical solutions after these changes or substitutions will fall within the protection scope of the present invention.

Claims

1. An electrical control board test system, characterized in that: The system comprises: a host computer, one or more test devices, one or more relay switching units, and one or more adapter boards; the number of the adapter boards is the same as the number of the boards to be tested and they correspond one to one; The relay switching unit is electrically connected to the test device and the adapter board respectively, and is configured to: control the switch state of each relay according to the switching instruction of the host computer, so that the electrical connection between the test device and the adapter board is established or disconnected; The host computer is respectively connected to the test device and the relay switching unit for communication, and is configured to: send the switching instruction to the relay switching unit; send instrument setting instructions and test instructions to the test device and receive the test results returned by the test device; The test device is configured to set its own parameters according to the instrument setting instruction, and send a test signal to the adapter board or obtain the test result according to the test instruction; The adapter board is also electrically connected to the corresponding board to be tested, and is configured to perform signal conversion and interface adaptation between the test equipment and the board to be tested.

2. The electrical control board test system according to claim 1, characterized in that: Each of the relay switching units comprises: a microcontroller, M latches and M relay modules, each of the relay modules comprising N relays that can be independently controlled; The microcontroller is configured to: receive the switching instruction sent by the host computer through TCP communication, and send a latch signal and a target state of each relay in the corresponding relay module to each latch according to the switching instruction; or, according to a read instruction of the host computer, send the current switch state of each relay to the host computer; the switching instruction includes: a target state matrix of M×N relays in the relay switching unit; The latch is configured to perform a latching operation according to the latching signal and a target state of each relay in the corresponding relay module, thereby controlling the switch state of each relay in the corresponding relay module; Wherein, M and N are both preset values.

3. The electrical control board test system according to claim 2, characterized in that: The host computer includes: a setting module, a control module and a test module; The setting module is configured to: set the product information of each board to be tested, the ID of the corresponding relay switching unit and the ID of the test item according to user input; set the corresponding target state matrix, test parameters, initialization script and test script for each test item according to user input; each board to be tested corresponds to one or more relay switching units and one or more test items; the test parameters are called by the initialization script or the test script; The control module is configured to: obtain the ID of the test item selected by the user and the start instruction; in the semi-automatic mode, call the test module to execute the selected test item according to the start instruction and the ID of the selected test item; in the fully automatic mode, call the test module to complete the selected test item and then continue to execute the next test item; The test module is configured as follows: according to the target state matrix corresponding to the test item selected by the user, the switching instruction is sent to the corresponding relay switching unit; the initialization script and the test script corresponding to the selected test item are parsed; the instrument setting instruction is sent to the test device according to the initialization script; the test instruction is sent to the test device according to the test script, and the test result returned by the test device is received and displayed.

4. The electrical control board test system according to claim 3, characterized in that: The system also includes: one or more industrial power supplies; The industrial power supply is configured to configure power supply parameters according to the power supply setting instruction of the host computer, so as to supply power to the relay switching unit, the adapter board and the board to be tested.

5. The electrical control board test system according to claim 4, characterized in that: The system further comprises: a motherboard; The motherboard is configured to: connect the input / output of the test equipment with the relay contacts of the relay switching unit, connect the network interface of the host computer with the network interface of the relay switching unit, and connect the output of the industrial power supply with the power input of the relay switching unit, the adapter board and the board to be tested.

6. The electrical control board test system according to claim 5, characterized in that: The system also includes: a warm shock box; The temperature shock box is used to simulate the ambient temperature and accommodate the motherboard, one or more relay switching units, one or more adapter boards, and the board to be tested corresponding to each adapter board.

7. The electrical control board test system according to claim 6, characterized in that: The system further comprises: a server; The server is configured to receive and store the board test data sent by the host computer; The host computer also includes: a data uploading module; The data upload module is configured to: obtain the board test data and send it to the server; Among them, the board test data includes: the product information of the board to be tested, the corresponding ID of the relay switching unit and the ID of the test item, and the target state matrix, the test parameters, the initialization script, the test script and the test results corresponding to each test item.

8. The electrical control board test system according to claim 3, characterized in that: The setting module includes: a first setting unit, a second setting unit and a third setting unit; The first setting unit is configured to: set the product information of each board to be tested, the ID of the corresponding relay switching unit and the ID of the test item according to user input; The second setting unit is configured to: display the switch states of the M×N relays in each relay switching unit in a matrix form for each test item, set the switch states according to the user's operation to obtain the target state matrix, or copy the target state matrix of a certain relay switching unit and modify it as the target state matrix of another relay switching unit; The third setting unit is configured to: for each of the test items, set test parameters according to user input and obtain an initialization script and a test script written by the user; the test parameters are called by the initialization script or the test script.

9. The electrical control board test system according to claim 3, characterized in that: The test module includes: a switching control unit, a parsing unit, an initialization unit and a test unit; The switching control unit is configured to send the switching instruction to the corresponding relay switching unit according to the target state matrix corresponding to the test item selected by the user; The parsing unit is configured to: parse the initialization script and the test script corresponding to the selected test item respectively using a regular expression to obtain a first parsing result and a second parsing result; the first parsing result and the second parsing result both include: an instruction to write to the test device, an instruction to read the test device and / or a system delay instruction; The initialization unit is configured to: execute an instruction to write into the test device, an instruction to read from the test device and / or a system delay instruction according to the first analysis result; The test unit is configured to: execute instructions for writing into the test device, instructions for reading from the test device and / or system delay instructions according to the second parsing result, extract the test result from the read data using a regular expression, and display the test result.

10. The electrical control board test system according to claim 3, characterized in that: The initialization script and the test script are both written using VISA.

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