Server component testing method and device and electronic equipment

Abstract

The embodiment of the invention provides a server component testing method and device and electronic equipment. In the embodiment of the invention, when the performance test instruction is received, the test resources used for the performance test are respectively allocated to the at least N component categories in the server, then the threads corresponding to the component categories can be called, and the performance test can be carried out by utilizing the test resources allocated to the component categories and used for the performance test. And performing pressure performance testing on the components in each component category in parallel. According to the parallel test mode, the test efficiency of the server components can be effectively improved, the problems of high time cost and low test efficiency caused by a serial test mode are avoided, system resources can be fully utilized for testing, the utilization rate of the system resources is improved, and resource waste is avoided; moreover, the parallel test mode of the embodiment can simulate the high pressure load condition generated during the concurrent test of each component, so that the fault detection rate of the server components can be improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a testing method, device and electronic equipment for server components. Background Art

[0002] For a server, memory, network card, central processing unit (CPU), hard disk, and graphics processing unit (GPU) are the five major components that make up the server. The quality reliability of these five major components in the server will affect the overall quality reliability of the server. Therefore, in order to ensure the quality reliability of the server, at least these five major components in the server need to be subjected to corresponding stress performance tests before the server leaves the factory. At present, in practical applications, the five major components in the above-mentioned server are usually subjected to stress performance tests in sequence through a serial test method. However, this serial test method will increase time cost and reduce test efficiency. Summary of the invention

[0003] In view of this, the present application provides a testing method, device and electronic equipment for server components to improve testing efficiency.

[0004] The embodiment of the present application provides a method for testing a server component, which is applied to a server and includes:

[0005] When a performance test indication is received, based on the performance test indication, test resources for performance testing are respectively allocated to at least N component categories in the server; wherein N is greater than 1; and different component categories are allocated different test resources;

[0006] For each component category, the thread corresponding to the component category that has been enabled is called, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category; wherein, at least two different component categories correspond to different threads; and the threads corresponding to N component categories execute stress performance testing in parallel.

[0007] The embodiment of the present application also provides a testing device for a server component, which is applied to a server and includes:

[0008] An allocation module, configured to allocate test resources for performance testing to at least N component categories in the server respectively based on the performance test indication when receiving the performance test indication; wherein N is greater than 1; and different component categories are allocated different test resources;

[0009] The test module is used to call the thread corresponding to the component category that has been enabled for each component category, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category; wherein at least two different component categories correspond to different threads; and the threads corresponding to N component categories execute stress performance testing in parallel.

[0010] The present application also provides an electronic device, the electronic device comprising:

[0011] Processor; and

[0012] A computer-readable storage medium stores computer program instructions, which, when executed by a processor, cause the processor to execute the steps of the above method.

[0013] An embodiment of the present application further provides a computer-readable storage medium, on which computer program instructions are stored. When the computer program instructions are executed by a processor, the processor executes the steps in the above method.

[0014] It can be seen from the above technical scheme that in the embodiment of the present application, when a performance test instruction is received, test resources for performance testing are first allocated to at least N component categories in the server, wherein different component categories are allocated different test resources, which can avoid resource usage conflicts, make full use of system resources, improve system resource utilization, and avoid resource waste. Based on this, the thread corresponding to each component category can be called, and the test resources for performance testing allocated to each component category can be used to perform stress performance testing on the components in each component category in parallel. This parallel testing method of the present embodiment can not only effectively improve the test efficiency of the server components, avoid the problems of high time cost and low test efficiency caused by the serial testing method, but also simulate the high pressure load situation generated when each component is tested concurrently, which can effectively improve the fault detection rate of the server components. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The accompanying drawings, which are incorporated in the specification and constitute a part of this application, illustrate embodiments consistent with the application and, together with the description, serve to explain the principles of the application.

[0016] Figure 1 A schematic diagram of the method flow provided in an embodiment of the present application.

[0017] Figure 2 Another method flow chart provided in the embodiment of the present application.

[0018] Figure 3 A flowchart of another method provided in an embodiment of the present application.

[0019] Figure 4 A schematic diagram of the device structure provided in an embodiment of the present application.

[0020] Figure 5 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0021] As described above, in the related art, a serial test method is used to sequentially perform stress performance tests on the components in the server (such as network cards, hard disks, GPUs, CPUs, and memory, etc.), specifically, the same thread is used to sequentially perform stress performance tests on the various components in the server. However, this serial test method not only increases the test cost such as time cost and reduces the test efficiency, but also fails to fully utilize system resources due to the separate stress performance tests of each component, resulting in resource waste. Therefore, in order to solve this technical problem, this embodiment provides a method for testing server components, by calling threads corresponding to each component category, using the test resources allocated to each component category for performance testing to perform stress performance tests on the components in each component category in parallel, so as to realize the stress performance test of each component in the server; this can not only effectively improve the test efficiency of the server components, avoid the problems of high time cost and low test efficiency caused by the serial test method, but also make full use of system resources for testing, improve system resource utilization, and avoid resource waste; and, this parallel test method of this embodiment can also simulate the high pressure load generated when each component is tested concurrently, so as to improve the fault detection rate of the server components.

[0022] In order to enable those skilled in the art to better understand the technical solutions provided by the embodiments of the present application and to make the above-mentioned purposes, features and advantages of the embodiments of the present application more obvious and understandable, the technical solutions in the embodiments of the present application are further described in detail below in conjunction with the accompanying drawings.

[0023] See also Figure 1 , Figure 1 A flow chart of a method provided in an embodiment of the present application. As an embodiment, the method is applied to a server; the method can be used to perform stress performance testing on components in the server such as a network card, hard disk, GPU, CPU, and memory.

[0024] like Figure 1 As shown, the process may include the following steps:

[0025] Step 101: when a performance test indication is received, based on the performance test indication, test resources for performance testing are respectively allocated to at least N component categories in the server; wherein N is greater than 1.

[0026] In this embodiment, upon receiving a performance test indication, test resources for performance testing are first allocated to at least N component categories in the server based on the performance test indication, so as to subsequently perform stress performance testing on each component category in parallel using the test resources allocated to each component category; wherein, in order to avoid resource usage conflicts, different component categories are allocated different test resources. The performance test indication here can be, for example, manually triggered, which is not specifically limited in this embodiment.

[0027] In this embodiment, as an embodiment, the at least N component categories may be information obtained from the performance test instructions. Alternatively, the component categories existing in the server may be obtained through an instruction for obtaining the component categories existing in the server, and then the component categories matching the designated component categories are selected from the obtained component categories as the at least N component categories; wherein the designated component categories may include, for example, network card categories, hard disk categories, GPU categories, CPU categories, and / or memory categories, etc., which are not specifically limited here.

[0028] As for how to allocate test resources for performance testing to at least N component categories in the server based on the performance test indication in this step, an example will be given below and will not be described here.

[0029] Step 102, for each component category, call the thread corresponding to the component category that has been enabled, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category; wherein at least two different component categories correspond to different threads; and the threads corresponding to N component categories execute stress performance testing in parallel.

[0030] In this embodiment, each component in any component category can be understood as each component belonging to the component category in the server; for example, for the network card category, each component in the network card category can refer to each network card in the server; for another example, for the hard disk category, each component in the hard disk category can refer to each hard disk in the server; and so on.

[0031] In this embodiment, at least two different component categories correspond to different threads. As an embodiment, assuming that there are multiple different component categories corresponding to the same thread, for the same thread corresponding to multiple different component categories, the thread can sequentially use the test resources allocated to each component category to perform stress performance tests on each component in each component category; correspondingly, for a thread corresponding to a component category, the thread can use the test resources allocated to the component category to perform stress performance tests on each component in the component category. The threads corresponding to the above N component categories execute stress performance tests in parallel, that is, different threads execute stress performance tests in parallel.

[0032] Exemplarily, assume that the above-mentioned N component categories are network card category, hard disk category, GPU category, CPU category and memory category; wherein, the network card category and hard disk category correspond to the same thread (recorded as thread 1), and the GPU category, CPU category and memory category correspond to one thread respectively (recorded as thread 2, thread 3 and thread 4 respectively); then for the network card category and hard disk category, the above-mentioned thread 1 can be used to sequentially perform stress performance tests on each component in the two component categories of network card category and hard disk category; for example, thread 1 can first use the test resources allocated to the network card category to perform stress performance tests on each component in the network card category, and then thread 1 can use the test resources allocated to the hard disk category to perform stress performance tests on each component in the hard disk category. Of course, the examples here are only exemplary, and the stress performance tests can also be performed on each component in the hard disk category first, and then on each component in the network card category. This embodiment is not specifically limited.

[0033] For the GPU category, the thread 2 corresponding to the GPU category can be used to perform performance stress testing on each component in the GPU category using the test resources allocated to the GPU category. As for the CPU category and the memory category, they are similar to the GPU category and will not be described here.

[0034] Among them, the above-mentioned thread 1, thread 2, thread 3 and thread 4 execute the stress performance test in parallel.

[0035] As for how to call the thread corresponding to the component category that has been turned on for each component category in this step, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category, the following will give an example description and will not be repeated here.

[0036] So far, completed Figure 1 The process shown.

[0037] pass Figure 1It can be seen from the process shown that in the embodiment of the present application, when a performance test instruction is received, test resources for performance testing are first allocated to at least N component categories in the server, wherein different component categories are allocated different test resources, which can avoid resource usage conflicts, make full use of system resources, improve system resource utilization, and avoid resource waste. Based on this, the thread corresponding to each component category can be called, and the test resources for performance testing allocated to each component category can be used to perform stress performance testing on the components in each component category in parallel. This parallel testing method of the present embodiment can not only effectively improve the test efficiency of the server components, avoid the problems of high time cost and low test efficiency caused by the serial testing method, but also simulate the high pressure load situation generated when each component is tested concurrently, which can effectively improve the fault detection rate of the server components.

[0038] The above step 101 is further described below:

[0039] First, describe the test resources:

[0040] In this embodiment, test resources for performance testing may be allocated to each component category from the system resources of the server. For example, as an embodiment, test resources may be allocated to each component category from the logical core and memory resources of the CPU in the server. Here, the logical core refers to the core virtualized by each physical core of the CPU based on the hyperthreading technology, wherein each physical core may correspond to multiple virtualized logical cores. Memory resources refer to available memory resources provided by memory components in the server, such as memory sticks and other devices.

[0041] As for the hard disk resources, GPU resources and network card resources in the server, they are usually only provided to the corresponding components for testing, and other components will not be actively consumed. For example, for hard disk resources, they are only provided to the hard disk for testing, and other components except the hard disk will basically not be actively consumed; even if the memory resources provided by the server are not enough, the server's operating system will perform virtual memory (i.e. swap) processing to obtain virtual memory for other components to test. In addition, this embodiment will also calculate and allocate the test resources that each component needs to use in advance, so there will basically be no situation where the memory resources provided by the above-mentioned server are not enough. As for GPU resources and network card resources, similar to hard disk resources, GPU resources are only provided to the GPU for testing, and network card resources are only provided to the network card for testing.

[0042] Based on the above description, as an embodiment, the test resources allocated to each component category include at least the logic core and memory resources of the CPU. In order to avoid resource usage conflicts, different component categories are allocated different test resources; that is, different component categories are allocated different logic cores, and different component categories are allocated different memory resources.

[0043] The following describes how to allocate test resources for performance testing to at least N component categories in a server respectively:

[0044] First, the test resource allocation for network card category, hard disk category and GPU category is described:

[0045] As an embodiment, if a component category is any one of a network card category, a hard disk category, and a GPU category, the logical core assigned to the component category is determined from all the logical cores of the server; and the memory resources assigned to the component category are determined from all the memory resources of the server based on the logical core assigned to the component category.

[0046] In this embodiment, assuming that at least N component categories include a network card category, a hard disk category, and / or a GPU category, the network card category, the hard disk category, and / or the GPU category are allocated test resources in sequence; as for the allocation order of the test resources of the network card category, the hard disk category, and / or the GPU category, this embodiment does not specifically limit it.

[0047] Exemplarily, assuming that at least N component categories include a network card category, a hard disk category, and a GPU category, test resources can be allocated to the network card category, the hard disk category, and the GPU category in order. Specifically, for example, the network card category, the hard disk category, and the GPU category are traversed in order, and the traversed component category is used as the current component category; then, a logical core is allocated to the current component category from the currently unallocated logical cores of the server; and based on the logical core allocated to the current component category, memory resources are allocated to the current component category from the currently unallocated memory resources of the server.

[0048] In this embodiment, there are many specific implementation methods for determining the logical core to which the component category is assigned from all logical cores of the server. For example, as an embodiment, based on the core allocation information configured for the component category, the logical core to which the component category is assigned is determined from all logical cores of the server. The specific content of the core allocation information is not specifically limited here. For example, the core allocation information may include a core allocation ratio such as 10% or 15%.

[0049] For another example, based on the application requirements of the component category, the logical cores allocated to the component category are determined from all the logical cores of the server; wherein the application requirements of the component category may, for example, mean that if the component category is a network card category, the number of logical cores allocated to the component category is 1; if the component category is a hard disk category or a GPU category, the number of logical cores allocated to the component category is related to the number of components in the component category.

[0050] Here, the number of logical cores allocated to the component category is related to the number of components in the component category. For example, the number of logical cores allocated to the component category is the same as the number of components in the component category. This embodiment does not specifically limit this.

[0051] In this embodiment, as an embodiment, the above-mentioned logical core allocated based on the component category determines the memory resources allocated to the component category from all memory resources of the server. In a specific implementation, for example, if the component category is a network card category, memory resources are allocated to the network card category from all memory resources of the server according to the configured memory allocation information of the network card category;

[0052] If the component category is a hard disk category, L test processes are called through the thread corresponding to the hard disk category to allocate memory resources to the L test processes respectively based on the configured system memory allocation mechanism. Here, the memory resources allocated to the L test processes can be considered as the memory resources allocated to the hard disk category; wherein L is greater than or equal to 1, and L is related to the number of hard disks in the hard disk category;

[0053] If the component category is a GPU category, P test processes are called through the thread corresponding to the GPU category to allocate memory resources to the P test processes based on the configured system memory allocation mechanism. Here, the memory resources allocated to the P test processes can be considered as the memory resources allocated to the GPU category; wherein P is greater than or equal to 1, and P is related to the number of GPUs in the GPU category.

[0054] In this embodiment, the above L is related to the number of hard disks in the hard disk category, for example, L is the same as the number of hard disks in the hard disk category; this embodiment does not specifically limit this. As for the above P being related to the number of GPUs in the GPU category, it is similar and will not be repeated here.

[0055] Next, we describe the test resource allocation for the CPU category and the memory category:

[0056] As an embodiment, if a component category is a CPU category or a memory category, the logical core allocated to the component category is determined from the first core resource; and the memory resource allocated to the component category is determined from the first memory resource. The first core resource and the first memory resource refer to the unallocated logical core and memory resource respectively after all component categories except the CPU category and the memory category in the N component categories have been allocated test resources.

[0057] In this embodiment, the above-mentioned determination of the logical core to which the component category is allocated from the first core resource may include, for example, first determining the second core resource based on the difference between the first core resource and the reserved core resource, such as using the difference between the first core resource and the reserved core resource as the second core resource; and then determining the logical core to which the component category is allocated from the second core resource based on the core allocation information configured for the component category. The reserved core resource is used for use by the operating system of the server; and the reserved core resource is smaller than the first core resource.

[0058] In this embodiment, the reserved kernel resources can be determined based on the second kernel resources. This embodiment does not specifically limit how to determine the reserved kernel resources based on the first kernel resources; for example, a specified number of logical cores can be selected from the first kernel resources as the reserved kernel resources; the specified number here can be 2 or 3, etc., which is not limited by this embodiment. For another example, the reserved kernel resources can be dynamically determined; specifically, multiple reference kernel ranges can be pre-configured, each reference kernel range corresponds to a number; based on this, it can be determined in which reference kernel range the number of logical cores of the first kernel resource is, and the number corresponding to the reference kernel range where the number of logical cores of the first kernel resource is located is used as a reference number, so as to select a reference number of logical cores from the first kernel resource as the reserved kernel resources; and so on.

[0059] In this embodiment, the above-mentioned determination of the memory resources allocated to the component category from the first memory resources may include, for example, first determining the second memory resources based on the difference between the first memory resources and the reserved memory resources, such as using the difference between the first memory resources and the reserved memory resources as the second memory resources; and then determining the memory resources allocated to the component category from the second memory resources based on the memory allocation information configured for the component category. The reserved memory resources are used for use by the operating system of the server; and the reserved memory resources are smaller than the first memory resources.

[0060] In the present embodiment, the above-mentioned reserved memory resources are determined based on the first memory resources. The present embodiment does not specifically limit how to determine the reserved memory resources based on the first memory resources; for example, a memory resource of a specified memory size can be selected from the first memory resource as the reserved memory resource; the specified memory size here can be 5G or 10G, etc., which is not limited by the present embodiment. For another example, the reserved memory resources can be determined dynamically; specifically, multiple reference memory ranges can be pre-configured, each reference memory range corresponding to a memory size; based on this, it can be determined in which reference memory range the memory size of the first memory resource is located, and the memory size corresponding to the reference memory range where the memory size of the first memory resource is located is used as the reference memory size, so as to select a memory resource of the reference memory size from the first memory resource as the reserved memory resource; and so on.

[0061] So far, the further description of the above step 101 is completed. The above step 102 is further described below:

[0062] In this embodiment, for any component category, a thread corresponding to the component category that has been enabled is called so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category, which is different from the component categories other than the component category in the N component categories.

[0063] As an embodiment, if the component category is a network card category, the test resources allocated to the network card category for performance testing include 1 logical core and the memory resources allocated to the network card category. Figure 2 As shown, if the component category is a network card category, the above-mentioned calling of the thread corresponding to the component category that has been opened, so that the thread corresponding to the component category uses the test resources for performance testing allocated to the component category to perform stress performance testing on each component in the component category, may include the following steps in specific implementation:

[0064] Step 201, traverse each network card in the network card category in order, and use the traversed network card as the current network card.

[0065] In this embodiment, the traversal order of each network card in the network card category is not specifically limited. For example, the traversal order of each network card can be determined based on the network card identifier of each network card (such as network card 1, network card 2, network card 3, ..., etc.) from large to small (or from small to large); or, the traversal order of each network card can be pre-configured based on actual needs.

[0066] Step 202, calling M test processes through the thread corresponding to the network card category, M is greater than or equal to 1, and M is related to the network card port of the current network card; so that the M test processes use the logical core and memory resources allocated to the network card category to perform stress performance tests on the M network card ports of the current network card respectively.

[0067] In this embodiment, the thread corresponding to any component category does not occupy the logical core and memory resources, which is equivalent to a test tool for calling the test process; this embodiment does not specifically limit the creation of the thread corresponding to any component category.

[0068] The test process called by the thread corresponding to the network card category may be, for example, an Internet performance evaluation (Iperf) process, etc., which is not specifically limited here. The Iperf process can simulate network data traffic for the network card to perform data transmission to verify the network performance of the network card and implement stress performance testing of the network card.

[0069] In this embodiment, the above M is related to the network card ports of the current network card, for example, M may be the same as the number of network card ports of the current network card, which is not specifically limited here. The above M test processes may be executed in parallel or in series, which is not specifically limited here.

[0070] In this embodiment, for any network card in the network card category, the test process of the last tested network card can be reused for the stress performance test of the network card without repeated creation or calling, which can improve the test efficiency.

[0071] As an embodiment, if the component category is a hard disk category, the test resources allocated to the hard disk category for performance testing include L logical cores and memory resources allocated to the hard disk category; wherein L is greater than or equal to 1; and L is related to the number of hard disks in the hard disk category.

[0072] Based on this, the above-mentioned calling of the thread corresponding to the component category that has been turned on, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category, can be specifically implemented, for example, including: calling L test processes through the thread corresponding to the hard disk category, so that the L test processes use the L logical cores and memory resources allocated to the hard disk category to respectively perform stress performance testing on the L hard disks in the hard disk category.

[0073] In this embodiment, the L test processes are made to use the L logical cores and memory resources allocated to the hard disk category to perform stress performance tests on the L hard disks in the hard disk category respectively. In the specific implementation, for example, it can be: first, a logical core is allocated to each of the L test processes from the L logical cores allocated to the hard disk category, and different test processes are allocated different logical cores; and a hard disk is allocated to each of the L test processes from the L hard disks, and different test processes are allocated different hard disks; then, each of the L test processes is made to use the logical core and memory resources allocated to the test process to perform stress performance tests on the hard disk allocated to the test process, and the L test processes are executed in parallel. As described above, the memory resources allocated to the test process can refer to the memory resources allocated to the test process based on the system memory allocation mechanism when allocating memory resources to the hard disk category.

[0074] In this embodiment, the test process called by the thread corresponding to the hard disk category may be, for example, a flexible I / O performance tester (Fio) process, etc., which is not specifically limited here. I / O is the abbreviation of input / output. The Fio process can verify the data processing performance of the hard disk by simulating the reading and writing of data, thereby realizing the stress performance test of the hard disk.

[0075] As an embodiment, if the component category is a GPU category, the test resources allocated to the GPU category for performance testing include P logical cores and memory resources allocated to the GPU category; wherein P is greater than or equal to 1; and P is related to the number of GPUs in the GPU category.

[0076] Based on this, the above-mentioned calling of the thread corresponding to the component category that has been turned on, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category, may include, for example, in specific implementation: calling P test processes through the thread corresponding to the GPU category, so that the P test processes use the P logical cores and memory resources allocated to the GPU category to perform stress performance testing on the P GPUs in the GPU category respectively.

[0077] In this embodiment, the test process called by the thread corresponding to the GPU category may be, for example, a Data Center GPU Manager (Dcgm) process, etc., which is not specifically limited here. The Dcgm process can verify the computing performance of the GPU by simulating a large number of GPU-related data computing tasks, thereby implementing a stress performance test of the GPU.

[0078] As for how to make P test processes use the P logical cores and memory resources allocated to the GPU category to perform stress performance tests on the P GPUs in the GPU category respectively, it is similar to how to make L test processes use the L logical cores and memory resources allocated to the hard disk category to perform stress performance tests on the L hard disks in the hard disk category respectively, and will not be repeated here.

[0079] In this embodiment, when the component category is a CPU category, the logical cores in the test resources allocated to the CPU category are related to the CPU in the CPU category; correspondingly, when the component category is a memory category, the memory resources in the test resources allocated to the memory category are related to the memory in the memory category. Therefore, for any component category in the CPU category and the memory category, calling the test process through the thread corresponding to the component category to run the test process using the logical cores and memory resources allocated to the component category can be considered to have achieved the stress performance test of the components in the component category.

[0080] Based on the above description, as an embodiment, if the component category is a CPU category, the test resources allocated to the CPU category for performance testing include X logical cores and memory resources allocated to the CPU category; wherein X is greater than or equal to 1;

[0081] The above-mentioned calling of the thread corresponding to the component category that has been turned on, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category, when specifically implemented, for example includes: calling X test processes through the thread corresponding to the CPU category, so as to use the X logical cores and memory resources allocated to the CPU category to run the X test processes in parallel, so as to achieve stress performance testing on each CPU in the CPU category.

[0082] In this embodiment, the test process called by the thread corresponding to the CPU category may be, for example, a stress-ng process, etc., which is not specifically limited here. The stress-ng process can verify the computing performance of the CPU by simulating a large number of CPU-related data computing tasks, thereby implementing a stress performance test of the CPU.

[0083] As an embodiment, if the component category is a memory category, the test resources allocated to the memory category for performance testing include Y logical cores and memory resources allocated to the memory category; wherein Y is greater than or equal to 1;

[0084] The above-mentioned calling of the thread corresponding to the component category that has been turned on, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category, includes, in specific implementation, for example: calling Y test processes through the thread corresponding to the memory category, so as to use the Y logical cores and memory resources allocated to the memory category to run Y test processes in parallel, so as to realize stress performance testing of each memory in the memory category.

[0085] In this embodiment, the test process called by the thread corresponding to the memory category may be, for example, a memory test (memtester) process, etc., which is not specifically limited here. The memtester process can verify the data processing performance of the memory by simulating a large number of data read and write operations, thereby realizing the stress performance test of the memory.

[0086] It should be noted that the test duration for the pressure performance test corresponding to the above-mentioned component categories can be indicated by the performance test indication; it can also be pre-configured; this embodiment does not specifically limit it.

[0087] In this embodiment, as an embodiment, a test configuration file can be pre-configured, and the specific content of the test configuration file is not specifically limited here, and can be flexibly set based on actual application requirements. For example, as an embodiment, the test configuration file includes at least the number of test rounds and the test information corresponding to each test round; the test information corresponding to any test round includes at least at least one component category that needs to be tested in the test round and the test duration required for the test round.

[0088] Based on the above description, in this embodiment, when at least N component categories are component categories that need to be tested in the current Zth round; where Z is greater than or equal to 1; in the current Zth round, the thread running time of the thread corresponding to each component category in at least N component categories is less than or equal to the test time required for the current Zth round. This embodiment can effectively improve the test efficiency by running the threads corresponding to each component category that needs to be tested in parallel in each round of testing.

[0089] In this embodiment, as an embodiment, the component categories to be tested in different rounds of testing can be the same or different. Based on this, when each round of testing is triggered and started, it is necessary to re-allocate the test resources for performance testing for each component category to be tested in the round of testing; and at the end of the round of testing, all the test resources allocated to each component category to be tested in the round of testing are recovered.

[0090] This embodiment can configure the component categories and test duration to be tested in each round of testing based on actual application requirements through the test configuration file, so that the load pressure of components in each component category tested in the server can be dynamically controlled in time-sharing manner, thereby improving the flexibility of the test; for example, taking two rounds of testing as an example, the component categories to be tested in one round of testing are CPU category and memory category, and the test duration is 1 hour; and the component categories to be tested in another round of testing are network card category, hard disk category, GPU category, CPU category and memory category, and the test duration is 5 hours; then the load pressure of each component in each component category in one round of testing is obviously smaller than the load pressure of each component in each component category in another round of testing.

[0091] In order to facilitate understanding of the specific implementation process of the test method for the above server components, the following is an example description through a specific embodiment:

[0092] The embodiment of the present application proposes a hybrid stress testing tool for server component testing, which is used to perform parallel stress performance testing on server components such as memory, network card, CPU, hard disk, and GPU, so as to improve test efficiency and detection rate and reduce test costs.

[0093] As an example, see Figure 3 The test method flow chart shown in the figure is applied to a server and may include the following steps:

[0094] Step 301, when a performance test indication is received, a mode configuration parameter for indicating a test execution mode of a stress test is obtained, and parameter parsing is performed.

[0095] In this embodiment, the above-mentioned mode configuration parameters may be indicated by the performance test indication, or may be parameters manually configured in advance in the software program corresponding to the hybrid stress testing tool. For example, the mode configuration parameter is "-t:time", wherein the -t field is used to indicate that the test execution mode of this test is the first execution mode, that is, the automatic execution mode, and the time field is used to indicate the test duration required for this test, such as 6 hours, 12 hours or 24 hours. For another example, the mode configuration parameter is "-f:file", wherein the -f field is used to indicate that the test execution mode of this test is the second execution mode, that is, the mode of performing stress performance testing using a test configuration file, and the file field is used to indicate the file storage location of the test configuration file.

[0096] If the parameter parsing is abnormal, for example, the time field in the mode configuration parameter "-t:time" is 0, or the file field in the mode configuration parameter "-f:file" is empty, etc., then an indication of the abnormal mode configuration parameter is output to prompt the relevant technicians. If the parameter parsing is normal, step 302 can be continued.

[0097] Step 302, checking whether the installation package related to the server component is correctly installed, if yes, executing step 303, otherwise, outputting an indication that the installation package related to the server component is abnormally installed.

[0098] In this embodiment, taking the five component categories of memory, network card, CPU, hard disk, and GPU as examples, for each component category, the installation package related to the component category may include, for example, the installation package of the test tool corresponding to the component category, and the installation package of the auxiliary plug-in, etc., which is not specifically limited in this embodiment. The test tool corresponding to any component category can be understood as a test tool for stress performance testing of the component category. Here, the test tool corresponding to any component category can be considered to refer to the test tool described above for calling the test process.

[0099] Step 303 , checking whether the Irq service is enabled; if so, proceeding to step 304 ; otherwise, enabling the Irq service, and continuing to step 304 .

[0100] In this embodiment, Irq is the abbreviation of Interrupt Request (Irq). Irq service refers to a mechanism by which the operating system interrupts the currently executed task when receiving an interrupt request sent by a hardware device to respond to and process these interrupt requests.

[0101] Since the stress performance tests corresponding to the network card category, hard disk category, and GPU category may trigger interrupt requests due to the use of peripherals, which may cause the server's operating system to be unable to handle the interrupt requests and become stuck, the irq service needs to be enabled in advance.

[0102] Step 304: If the test execution mode is determined to be the first execution mode based on the above-mentioned mode configuration parameters, for each component category in the network card category, the hard disk category, and the GPU category, based on the application requirements of the component category, the logical cores assigned to the component category are determined from all logical cores of the server; and based on the logical cores assigned to the component category, the memory resources assigned to the component category are determined from all memory resources of the server. Then, step 305 is executed.

[0103] As for how to determine the logical core assigned to the component category from all logical cores of the server based on the application requirements of the component category, and determine the memory resources assigned to the component category from all memory resources of the server based on the logical core assigned to the component category, please refer to the above related description and will not be repeated here.

[0104] Step 305 : for each component category in the CPU category and the memory category, a logical core is allocated to the component category from the first core resource, and a memory resource is allocated to the component category from the first memory resource. Then, step 306 is executed.

[0105] As for how to allocate a logical core from the first core resource to the component category, and allocate a memory resource from the first memory resource to the component category, please refer to the above related description, which will not be repeated here.

[0106] Step 306, for each component category to be tested in this test, call the thread corresponding to the component category that has been enabled, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category.

[0107] The component categories that need to be tested in this test refer to at least N component categories mentioned above.

[0108] Step 307: If the test execution mode is determined to be the second execution mode based on the above mode configuration parameters, a test configuration file is obtained and verified. If the test configuration file is successfully verified, step 308 is executed.

[0109] In this embodiment, the test configuration file includes at least the number of test rounds and the test information corresponding to each test round; the test information corresponding to any test round includes at least at least one component category that needs to be tested in that test round, the test time required for that test round, and the core allocation ratio and memory allocation ratio of at least one component category.

[0110] In this embodiment, the verification of the test configuration file may include, for example, checking whether the test duration of each round of testing is abnormal, such as 0 or a negative number, whether the sum of the kernel allocation ratios corresponding to each round of testing is abnormal, such as exceeding 100%, and whether the sum of the memory allocation ratios corresponding to each round of testing is abnormal, such as exceeding 100%, etc.; if there are no abnormalities in the above checks, it means that the verification is successful, otherwise the verification fails, and an indication of the abnormality of the test configuration file is output.

[0111] Step 308: If the test configuration file is successfully verified, for each component category in the network card category, the hard disk category, and the GPU category, a logical core is allocated to the component category from all logical cores of the server based on the core allocation ratio of the component category in the test configuration file, and a memory resource is allocated to the component category from all memory resources of the server based on the logical core allocated to the component category. Then, step 309 is executed.

[0112] Step 309 : for each component category in the CPU category and the memory category, a logical core is allocated to the component category from the first core resource, and a memory resource is allocated to the component category from the first memory resource. Then, step 310 is executed.

[0113] Step 310, for each component category to be tested in this test, call the thread corresponding to the component category that has been enabled, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category.

[0114] In this embodiment, the stress performance test process of each component category is monitored in real time and corresponding log records are made; if there is an abnormal end or a faulty component is detected, the stress test results corresponding to each component category are output, and the test resources allocated to each component category are recovered, and the test is exited. As for the specific content of the stress test results of each component category, this embodiment does not specifically limit it.

[0115] The server component testing method provided in this embodiment can improve the testing efficiency by performing stress performance tests on each component in each component category in parallel. Compared with the serial testing method, the parallel testing method of this embodiment can increase the testing time of each component category while keeping the same test time. For example, if the total test time of the serial testing method is 24 hours, then these 24 hours need to be allocated to each component category. In this embodiment, since the stress performance tests of each component category are performed in parallel, the test time corresponding to each component category can be 24 hours. This can effectively improve the detection rate of the test.

[0116] Correspondingly, compared to the serial testing method, when the detection rate remains roughly the same, the test time required by this embodiment may be less than the test time required by the serial testing method, such as 1 / 3 of the test time required by the serial testing method, thereby improving the test efficiency and reducing the test cost.

[0117] In addition, this embodiment can flexibly configure the component category, test duration, number of test rounds, etc. required to be tested based on actual application requirements through the test configuration file. This can flexibly and dynamically control the load pressure during the test of each component category, thereby better matching the user's actual usage environment and improving the flexibility and reliability of the test.

[0118] At this point, the description of the method provided in the embodiment of the present application is completed. The following is a description of the device provided in the embodiment of the present application:

[0119] See also Figure 4 , Figure 4 The present invention provides a schematic diagram of a server component testing device according to an embodiment of the present invention. The device is applied to a server. Figure 4 As shown, the device 400 includes:

[0120] The allocation module 401 is used for, when receiving a performance test indication, respectively allocating test resources for performance testing to at least N component categories in the server based on the performance test indication; wherein N is greater than 1; and different component categories are allocated different test resources;

[0121] The test module 402 is used to call the thread corresponding to the component category that has been enabled for each component category, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category; wherein at least two different component categories correspond to different threads; and the threads corresponding to N component categories execute stress performance testing in parallel.

[0122] As an embodiment, the test resources allocated to each component category include at least the logic core and memory resources of the central processing unit CPU; different component categories are allocated different logic cores; different component categories are allocated different memory resources.

[0123] As an embodiment, if the component category is a network card category, the test resources allocated to the network card category for performance testing include 1 logical core and memory resources allocated to the network card category;

[0124] Calling the thread corresponding to the component category that has been enabled so that the thread corresponding to the component category uses the test resources for performance testing allocated to the component category to perform stress performance testing on each component in the component category includes:

[0125] Traverse each network card in the network card category in order, and use the traversed network card as the current network card;

[0126] M test processes are called through the thread corresponding to the network card category, where M is greater than or equal to 1 and is related to the network card port of the current network card; so that the M test processes use the logical core and memory resources allocated to the network card category to perform stress performance tests on the M network card ports of the current network card respectively.

[0127] As an embodiment, if the component category is a hard disk category, the test resources allocated to the hard disk category for performance testing include L logical cores and memory resources allocated to the hard disk category; L is greater than or equal to 1; and L is related to the number of hard disks in the hard disk category;

[0128] Calling the thread corresponding to the component category that has been enabled so that the thread corresponding to the component category uses the test resources for performance testing allocated to the component category to perform stress performance testing on each component in the component category includes: calling L test processes through the thread corresponding to the hard disk category so that the L test processes use the L logical cores and memory resources allocated to the hard disk category to perform stress performance testing on the L hard disks in the hard disk category respectively;

[0129] and / or,

[0130] If the component category is a GPU category, the test resources allocated to the GPU category for performance testing include P logical cores and memory resources allocated to the GPU category; P is greater than or equal to 1; and P is related to the number of GPUs in the GPU category;

[0131] Calling the thread corresponding to the component category that has been turned on so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance tests on each component in the component category includes: calling P test processes through the thread corresponding to the GPU category so that the P test processes use the P logical cores and memory resources allocated to the GPU category to perform stress performance tests on the P GPUs in the GPU category respectively.

[0132] As an embodiment, if the component category is a CPU category, the test resources allocated to the CPU category for performance testing include X logical cores and memory resources allocated to the CPU category; X is greater than or equal to 1;

[0133] Calling the thread corresponding to the component category that has been enabled so that the thread corresponding to the component category uses the test resources for performance testing allocated to the component category to perform stress performance testing on each component in the component category includes: calling X test processes through the thread corresponding to the CPU category to run the X test processes in parallel using the X logical cores and memory resources allocated to the CPU category to implement stress performance testing on each CPU in the CPU category;

[0134] and / or,

[0135] If the component category is a memory category, the test resources allocated to the memory category for performance testing include Y logical cores and memory resources allocated to the memory category; Y is greater than or equal to 1;

[0136] Calling the thread corresponding to the component category that has been turned on so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category includes: calling Y test processes through the thread corresponding to the memory category to use the Y logical cores and memory resources allocated to the memory category to run Y test processes in parallel to achieve stress performance testing of each memory in the memory category.

[0137] As an embodiment, if a component category is any one of a network card category, a hard disk category, and a GPU category, the logical core allocated to the component category is determined from all logical cores of the server; and the memory resources allocated to the component category are determined from all memory resources of the server based on the logical core allocated to the component category;

[0138] If a component category is a CPU category or a memory category, the logical core allocated to the component category is determined from the first core resources; and the memory resources allocated to the component category are determined from the first memory resources; wherein the first core resources and the first memory resources refer respectively to the unallocated logical cores and memory resources remaining after all component categories except the CPU category and the memory category in the N component categories have been allocated test resources.

[0139] As an embodiment, determining the logical core to which the component category is assigned from all logical cores of the server includes:

[0140] Based on the core allocation information configured for the component category, determining the logical core to which the component category is allocated from all logical cores of the server; or,

[0141] Based on the application requirements of the component category, the logical cores assigned to the component category are determined from all the logical cores of the server; if the component category is a network card category, the number of logical cores assigned to the component category is 1; if the component category is a hard disk category or a GPU category, the number of logical cores assigned to the component category is related to the number of components in the component category.

[0142] As an embodiment, determining the logical core to which the component category is allocated from the first core resource includes: determining the second core resource according to the difference between the first core resource and the reserved core resource; the reserved core resource is less than the first core resource; determining the logical core to which the component category is allocated from the second core resource based on the core allocation information configured for the component category;

[0143] Determining the memory resources allocated to the component category from the first memory resources includes: determining the second memory resources based on the difference between the first memory resources and the reserved memory resources; the reserved memory resources are determined based on the first memory resources; the reserved memory resources are smaller than the first memory resources; and determining the memory resources allocated to the component category from the second memory resources based on the memory allocation information configured for the component category.

[0144] As an embodiment, at least N component categories are component categories that need to be tested in the current Zth round; Z is greater than or equal to 1;

[0145] In the current Zth round, the thread running time of the thread corresponding to each component category in at least N component categories is less than or equal to the test time required by the current Zth round.

[0146] So far, completed Figure 4 The structural description of the device is shown.

[0147] The implementation process of the functions and effects of each module in the above-mentioned device is specifically described in the implementation process of the corresponding steps in the above-mentioned method, which will not be repeated here.

[0148] For the device embodiment, since it basically corresponds to the method embodiment, the relevant parts can refer to the partial description of the method embodiment. The device embodiment described above is only schematic, wherein the modules described as separate components may or may not be physically separated, and the components displayed as modules may or may not be physical modules, that is, they may be located in one place, or they may be distributed on multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the present application scheme. A person of ordinary skill in the art can understand and implement it without paying creative labor.

[0149] See also Figure 5A schematic diagram of the hardware structure of an electronic device provided for an exemplary embodiment of the present application. The electronic device may include a processor 501, a communication interface 502, a computer-readable storage medium 503, and a communication bus 504. The processor 501, the communication interface 502, and the computer-readable storage medium 503 communicate with each other via the communication bus 504. Among them, the computer-readable storage medium 503 stores computer program instructions; the processor 501 can execute the steps of the method described in the above embodiment by executing the computer program instructions stored on the computer-readable storage medium 503. The electronic device may also include other hardware according to the actual function of the electronic device, which will not be described in detail.

[0150] Correspondingly, an embodiment of the present application further provides a computer-readable storage medium, on which a number of computer program instructions are stored. When the computer program instructions are executed by a processor, the method disclosed in the above example of the present application can be implemented.

[0151] Exemplarily, the computer-readable storage medium may be any electronic, magnetic, optical or other physical storage device that may contain or store information, such as executable instructions, data, etc. For example, the computer-readable storage medium may be: RAM (Radom Access Memory), volatile memory, non-volatile memory, flash memory, storage drive (such as hard disk drive), solid state drive, any type of storage disk (such as optical disk, DVD, etc.), or similar storage medium, or a combination thereof. The processor and memory may be supplemented by or incorporated into a dedicated logic circuit.

[0152] The above are only preferred embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A method for testing a server component, characterized in that: The method is applied to a server and includes: When a performance test indication is received, based on the performance test indication, test resources for performance testing are respectively allocated to at least N component categories in the server; wherein N is greater than 1; and different component categories are allocated different test resources; For each component category, the thread corresponding to the component category that has been enabled is called, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category; wherein at least two different component categories correspond to different threads; and the threads corresponding to the N component categories execute stress performance testing in parallel.

2. The method according to claim 1, characterized in that: The test resources allocated to each component category at least include the logic core and memory resources of the central processing unit CPU; wherein different component categories are allocated different logic cores, and different component categories are allocated different memory resources.

3. The method according to claim 1 or 2, characterized in that: If the component category is a network card category, the test resources allocated to the network card category for performance testing include 1 logical core and the memory resources allocated to the network card category; The calling of the thread corresponding to the component category that has been enabled so that the thread corresponding to the component category performs stress performance testing on each component in the component category using the test resources for performance testing allocated to the component category includes: Traverse each network card in the network card category in order, and use the traversed network card as the current network card; M test processes are called through the thread corresponding to the network card category, where M is greater than or equal to 1 and is related to the network card port of the current network card; so that the M test processes use the logical core and memory resources allocated to the network card category to perform stress performance tests on the M network card ports of the current network card respectively.

4. The method according to claim 1 or 2, characterized in that: If the component category is a hard disk category, the test resources allocated to the hard disk category for performance testing include L logical cores and memory resources allocated to the hard disk category; L is greater than or equal to 1; and L is related to the number of hard disks in the hard disk category; The calling of the thread corresponding to the component category that has been enabled so that the thread corresponding to the component category uses the test resources for performance testing allocated to the component category to perform stress performance testing on each component in the component category includes: calling L test processes through the thread corresponding to the hard disk category so that the L test processes use the L logical cores and memory resources allocated to the hard disk category to perform stress performance testing on the L hard disks in the hard disk category respectively; and / or, If the component category is a GPU category, the test resources allocated to the GPU category for performance testing include P logical cores and memory resources allocated to the GPU category; P is greater than or equal to 1; and P is related to the number of GPUs in the GPU category; The calling of the thread corresponding to the component category that has been turned on so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category includes: calling P test processes through the thread corresponding to the GPU category so that the P test processes use the P logical cores and memory resources allocated to the GPU category to perform stress performance testing on the P GPUs in the GPU category respectively.

5. The method according to claim 1 or 2, characterized in that: If the component category is a CPU category, the test resources allocated to the CPU category for performance testing include X logical cores and memory resources allocated to the CPU category; X is greater than or equal to 1; The calling of the thread corresponding to the component category that has been enabled so that the thread corresponding to the component category uses the test resources for performance testing allocated to the component category to perform stress performance testing on each component in the component category includes: calling X test processes through the thread corresponding to the CPU category so as to run the X test processes in parallel using the X logical cores and memory resources allocated to the CPU category so as to implement stress performance testing on each CPU in the CPU category; and / or, If the component category is a memory category, the test resources allocated to the memory category for performance testing include Y logical cores and memory resources allocated to the memory category; Y is greater than or equal to 1; The calling of the thread corresponding to the component category that has been turned on so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category includes: calling Y test processes through the thread corresponding to the memory category to run the Y test processes in parallel using the Y logical cores and memory resources allocated to the memory category to achieve stress performance testing on each memory in the memory category.

6. The method according to claim 2, characterized in that If a component category is any one of a network card category, a hard disk category, and a GPU category, the logical core assigned to the component category is determined from all logical cores of the server; as well as , the memory resources allocated to the component category are determined from all memory resources of the server based on the logical core allocated to the component category; If a component category is a CPU category or a memory category, the logical core assigned to the component category is determined from the first core resources; as well as , the memory resources allocated to the component category are determined from the first memory resources; wherein, the first core resources and the first memory resources respectively refer to the unallocated logical cores and memory resources remaining after all component categories except the CPU category and the memory category in the N component categories have been allocated test resources.

7. The method according to claim 6, characterized in that Determining the logical core to which the component category is assigned from all logical cores of the server includes: Based on the core allocation information configured for the component category, determining the logical core to which the component category is allocated from all the logical cores of the server; or, Based on the application requirements of the component category, the logical cores assigned to the component category are determined from all the logical cores of the server; wherein, if the component category is a network card category, the number of logical cores assigned to the component category is 1; if the component category is a hard disk category or a GPU category, the number of logical cores assigned to the component category is related to the number of components in the component category.

8. The method according to claim 6, characterized in that Determining the logical core to which the component category is allocated from the first core resource includes: determining a second core resource according to a difference between the first core resource and the reserved core resource; the reserved core resource is determined according to the first core resource; the reserved core resource is less than the first core resource; determining the logical core to which the component category is allocated from the second core resource based on the core allocation information configured for the component category; Determining the memory resources allocated to the component category from the first memory resources includes: determining the second memory resource based on the difference between the first memory resource and the reserved memory resource; the reserved memory resource is determined based on the first memory resource; the reserved memory resource is smaller than the first memory resource; and determining the memory resource allocated to the component category from the second memory resource based on the memory allocation information configured for the component category.

9. The method according to claim 1, characterized in that: The at least N component categories are component categories that need to be tested in the current Zth round; Z is greater than or equal to 1; In the current Zth round, the thread running time of the thread corresponding to each component category in the at least N component categories is less than or equal to the test time required by the current Zth round.

10. A testing device for a server component, characterized in that: The device is applied to a server and includes: an allocation module, configured to allocate test resources for performance testing to at least N component categories in the server respectively based on the performance test indication when receiving the performance test indication; wherein N is greater than 1; and different component categories are allocated different test resources; A test module is used to call the thread corresponding to the component category that has been enabled for each component category, so that the thread corresponding to the component category uses the test resources allocated to the component category for performance testing to perform stress performance testing on each component in the component category; wherein at least two different component categories correspond to different threads; and the threads corresponding to the N component categories execute stress performance testing in parallel.

11. An electronic device, characterized in that: The electronic device includes: Processor; and A computer-readable storage medium, wherein computer program instructions are stored in the computer-readable storage medium, and when the computer program instructions are executed by the processor, the processor executes the steps in any one of the methods of claims 1 to 9.

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