Optimal annealing temperature selection method, system and equipment for soft magnetic material and medium

Abstract

The invention relates to the technical field of soft magnetic materials, and discloses an optimal annealing temperature selection method, system, equipment and medium for a soft magnetic material.The method comprises the steps that multiple candidate annealing temperatures are determined according to the crystallization temperature interval and the Curie temperature of the soft magnetic material, loss separation is conducted on the soft magnetic material, and magnetic hysteresis loss, eddy current loss and abnormal loss are obtained; the total loss of the candidate annealing temperature is determined by using the hysteresis loss, the eddy current loss and the abnormal loss, and the optimal annealing temperature is determined through the total loss, so that the reliability of predicting the magnetic characteristic loss change of the soft magnetic material is improved through loss decomposition, and the selection accuracy of the annealing temperature of the soft magnetic material is improved; therefore, the magnetic characteristic loss of the soft magnetic material is optimized.

Description

Technical Field

[0001] The present invention relates to the technical field of soft magnetic materials, and in particular to a method, system, equipment and medium for selecting an optimum annealing temperature of a soft magnetic material. Background Art

[0002] With the development of power equipment maximization, miniaturization and broadband, higher requirements are placed on soft magnetic materials used in power equipment. The advantages of nanocrystalline materials, such as high saturation flux density, high initial magnetic permeability and low loss, gradually emerge in high-frequency working scenarios. The prediction of hysteresis and loss characteristics of soft magnetic materials under high-frequency excitation working conditions is of great significance for the status evaluation of power equipment in different working scenarios.

[0003] At present, there are three main approaches to modeling the hysteresis characteristics of soft magnetic materials: 1) neural network method; 2) hybrid method based on hysteresis model and loss statistics theory; 3) numerical method. The neural network method predicts the hysteresis characteristics of soft magnetic materials by layering and combing a large amount of experimental data from the perspective of data analysis, but this method requires the analysis of a large amount of experimental data and cannot have high reliability in actual engineering.

[0004] Based on the hysteresis model and loss statistics theory, the original Bertotti loss separation model is improved according to the loss formation mechanism. The classic Bertotti loss separation model divides the total loss of soft magnetic materials into three parts: hysteresis loss, eddy current loss and abnormal loss, and independently analyzes these three parts of loss. Among them, the hysteresis model (static Preisach model, static JA hysteresis model) is used to calculate the static loss part of soft magnetic materials. Classical eddy current loss and abnormal loss are classic loss expressions based on the ohmic loss and loss statistics theory generated by the external alternating magnetic field. With the complexity of the use scenarios of soft magnetic materials, improved models for complex excitation and high-frequency ranges have been proposed. Considering the influence of skin effect on iron loss, technicians in this field combined with the relevant calculation methods of classical loss and proposed a dynamic hysteresis model for high-frequency sinusoidal excitation, but the model introduces the neural network shape factor coefficient, which requires a large amount of experimental data prediction and is less practical.

[0005] In addition, annealing can improve the magnetic properties of soft magnetic materials by changing their microstructure. The loss changes of soft magnetic materials affect the temperature treatment of soft magnetic materials. However, the current prediction reliability of the loss changes of the magnetic properties of soft magnetic materials is poor, and it is difficult to accurately select the annealing temperature of soft magnetic materials to optimize the magnetic property loss of soft magnetic materials. Summary of the invention

[0006] In view of this, the present invention provides a method, system, equipment and medium for selecting the optimal annealing temperature of soft magnetic materials, which solves the technical problems that the current prediction of the change of magnetic property loss of soft magnetic materials is poor and it is difficult to accurately select the annealing temperature of soft magnetic materials to optimize the magnetic property loss of soft magnetic materials.

[0007] The first aspect of the present invention provides a method for selecting an optimal annealing temperature of a soft magnetic material, comprising:

[0008] Determine multiple candidate annealing temperatures according to the crystallization temperature range and Curie temperature of the soft magnetic material;

[0009] Separating the loss generated by the soft magnetic material at each candidate annealing temperature to obtain hysteresis loss, eddy current loss and abnormal loss;

[0010] Obtaining a total loss at each candidate annealing temperature using the hysteresis loss, the eddy current loss and the abnormal loss;

[0011] The total loss of each candidate annealing temperature is compared, and the candidate annealing temperature with the smallest total loss is selected as the first optimal annealing temperature of the soft magnetic material.

[0012] Preferably, the candidate annealing temperature covers the crystallization temperature range and the Curie temperature.

[0013] Preferably, the hysteresis loss is determined by calculating the magnetic field intensity corresponding to the static hysteresis loss of the nanocrystalline magnetic ring at the candidate annealing temperature using the Preisach model.

[0014] Preferably, the abnormal loss is derived from magnetic domain theory; wherein the abnormal loss derived from magnetic domain theory is:

[0015]

[0016] In the formula, The annealing temperature is Abnormal loss, is the electrical conductivity of the material, is the cross-sectional area of ​​the material, is the abnormal loss statistical parameter, is the excitation frequency, is the annealing temperature, is the dimensionless coefficient, is a constant, To find the derivative symbol, is the magnetic field intensity, is time; among them,

[0017]

[0018] In the formula, , , , , , , , , , , , All are fitting coefficients.

[0019] Preferably, the eddy current loss is calculated by a piecewise linear method as:

[0020]

[0021] In the formula, is the eddy current loss, is the proportional coefficient under segment i, is the amplitude of the external alternating magnetic field intensity in segment i, is the output hysteresis angle, is the angular frequency, is the total number of segments, is the segment index, is the magnetic field strength at the upper and lower surfaces of the material, is a constant, is the magnetic field intensity at time t, is the magnetic field intensity, is the proportional coefficient under segment n, is the amplitude of the external alternating magnetic field intensity under segment n, is the output hysteresis angle under n segments.

[0022] Preferably, the method further comprises:

[0023] Determine the proportion of hysteresis loss, the proportion of eddy current loss and the proportion of abnormal loss according to the hysteresis loss, the eddy current loss, the abnormal loss and the total loss;

[0024] A second optimal annealing temperature is determined from the plurality of candidate annealing temperatures according to the hysteresis loss ratio, the eddy current loss ratio or the abnormal loss ratio.

[0025] In a second aspect, the present invention provides an optimal annealing temperature selection system for soft magnetic materials, comprising:

[0026] A candidate temperature determination module, used to determine a plurality of candidate annealing temperatures according to the crystallization temperature range and Curie temperature of the soft magnetic material;

[0027] A loss separation module, used for separating the loss generated by the soft magnetic material at each candidate annealing temperature to obtain hysteresis loss, eddy current loss and abnormal loss;

[0028] a total loss determination module, configured to obtain a total loss for each candidate annealing temperature by using the hysteresis loss, the eddy current loss and the abnormal loss;

[0029] The annealing temperature selection module is used to compare the total loss of each candidate annealing temperature and select the candidate annealing temperature with the smallest total loss as the first optimal annealing temperature of the soft magnetic material.

[0030] In a third aspect, the present invention provides an electronic device comprising a memory and a processor, wherein the memory stores a computer program, and when the computer program is executed by the processor, the processor executes the steps of the method for selecting the optimal annealing temperature of soft magnetic materials as described in the first aspect.

[0031] In a fourth aspect, the present invention provides a computer-readable storage medium having a computer program stored thereon, which, when executed, implements the steps of the method for selecting an optimal annealing temperature for soft magnetic materials as described in the first aspect.

[0032] In a fifth aspect, the present invention provides a computer program product, comprising a computer program stored on a non-transitory computer-readable storage medium, wherein the computer program comprises program instructions, wherein when the program instructions are executed by a computer, the computer executes the steps of the method for selecting the optimal annealing temperature of a soft magnetic material as described in the first aspect.

[0033] It can be seen from the above technical scheme that the present invention determines multiple candidate annealing temperatures through the crystallization temperature range and Curie temperature of the soft magnetic material, and separates the hysteresis loss, eddy current loss and abnormal loss of the soft magnetic material, and uses the hysteresis loss, eddy current loss and abnormal loss to determine the total loss of the candidate annealing temperatures, and determines the optimal annealing temperature through the total loss, thereby improving the reliability of the prediction of the loss change of the magnetic properties of the soft magnetic material through loss decomposition, improving the accuracy of selecting the annealing temperature of the soft magnetic material, and optimizing the magnetic property loss of the soft magnetic material. BRIEF DESCRIPTION OF THE DRAWINGS

[0034] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0035] Figure 1 A flow chart of a method for selecting an optimal annealing temperature for a soft magnetic material provided in an embodiment of the present invention;

[0036] Figure 2 It is a schematic diagram of the annealing process of nanocrystalline soft magnetic materials;

[0037] Figure 3 is the fitting result of the hysteresis loop of different magnetic density;

[0038] Figure 4 Basic magnetization curves of nanocrystalline magnetic rings at different annealing temperatures.

[0039] Figure 5a , Figure 5b Comparison diagram between dynamic hysteresis loop fitting and measurement for each annealing temperature treatment;

[0040] Figure 6a , Figure 6b , Figure 6c , Figure 6d This is a graph showing how each loss ratio changes with annealing temperature at different operating frequencies;

[0041] Figure 7 A schematic diagram of the structure of an optimal annealing temperature selection system for a soft magnetic material;

[0042] Figure 8 The figure is a schematic diagram of the structure of an electronic device. DETAILED DESCRIPTION

[0043] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0044] An embodiment of the present application provides a method for selecting an optimal annealing temperature for a soft magnetic material. This embodiment can be applicable to the situation of selecting an optimal annealing temperature for a soft magnetic material. The method can be performed by an optimal annealing temperature selection device for a soft magnetic material. The optimal annealing temperature selection device for a soft magnetic material can be implemented in the form of hardware and / or software. The optimal annealing temperature selection device for a soft magnetic material can be configured in a computer device.

[0045] like Figure 1 As shown, the embodiment of the present application provides a method for selecting the optimal annealing temperature of a soft magnetic material, comprising the following steps S1 to S4. Among them:

[0046] Step S1, determining a plurality of candidate annealing temperatures according to the crystallization temperature range and Curie temperature of the soft magnetic material.

[0047] Among them, the soft magnetic materials targeted by the embodiments of the present application are mainly nanocrystalline soft magnetic materials. Multiple candidate annealing temperatures are set by the crystallization temperature range and Curie temperature of the nanocrystalline soft magnetic materials, and the candidate annealing temperatures cover the crystallization temperature range and Curie temperature, thereby improving the accuracy of the annealing temperature. At the same time, in order to improve the selection efficiency of the annealing temperature, the error of the candidate annealing temperature covering the crystallization temperature range and Curie temperature should not be too large, and the error can be between 50 degrees.

[0048] Exemplarily, the crystallization temperature of the nanocrystalline soft magnetic material is 510° C., and the Curie temperature is 565° C., and five candidate annealing temperatures of 520° C., 540° C., 560° C., 580° C., and 600° C. may be set.

[0049] like Figure 2 As shown, during the annealing process of the nanocrystalline soft magnetic material, the nanocrystalline magnetic ring is heat treated by a three-stage heating gradient heating method. After the annealing furnace is evacuated to vacuum, the annealing temperature is increased to the target temperature of the first heating stage at a heating rate of 10°C / min, and the temperature is kept for 10 minutes; then the annealing temperature is increased to the target temperature of the second heating stage at a heating rate of 5°C / min, and the temperature is kept for 10 minutes; then the annealing temperature is increased to the target annealing temperature at a heating rate of 1°C / min, and the temperature is kept for 2 hours, so that the nanocrystalline magnetic ring material is fully crystallized; finally, the nanocrystalline magnetic ring is taken out when the temperature in the vacuum annealing furnace reaches room temperature.

[0050] Step S2: Separate the loss generated by the soft magnetic material at each candidate annealing temperature to obtain hysteresis loss, eddy current loss and abnormal loss.

[0051] Among them, based on the field separation technology and the loss separation consistency principle, the losses generated by the soft magnetic material are separated through the Bertotti loss separation model to obtain hysteresis loss, eddy current loss and abnormal loss.

[0052] Among them, the hysteresis model (static Preisach model, static JA hysteresis model) is used to calculate the static loss part of soft magnetic materials. Classical eddy current loss and abnormal loss are classical loss expressions based on the ohmic loss and loss statistics theory generated by the external alternating magnetic field.

[0053] Specifically, since both eddy current loss and abnormal loss are closely related to the excitation frequency, when the applied excitation frequency is close to 0, the total loss of the soft magnetic material is only the hysteresis loss. Therefore, the hysteresis loss is determined by calculating the magnetic field intensity corresponding to the static hysteresis loss of the nanocrystalline magnetic ring at the candidate annealing temperature using the Preisach model.

[0054] Among them, the Preisach density function (also called distribution function) is defined according to experimental data or material properties. The function describes the weights of different magnetization states. The Preisach model and the known density function are used to simulate the hysteresis loop under different magnetic field strengths. By integrating the relationship curve between the magnetization intensity and the magnetic field on the hysteresis loop, the total hysteresis loss within a cycle can be obtained.

[0055] Among them, the abnormal loss is derived from the magnetic domain theory; Among them, the abnormal loss derived from the magnetic domain theory is:

[0056]

[0057] In the formula, The annealing temperature is Abnormal loss, is the electrical conductivity of the material, is the cross-sectional area of ​​the material, is the abnormal loss statistical parameter, is the excitation frequency, is the annealing temperature, is the dimensionless coefficient, The value is 0.1356. is a constant, The value of The sign of When is positive, The value is 1, when When it is a negative value, The value is -1. To find the derivative symbol, is the magnetic field intensity, is time; where, under the working magnetic flux density of Bm=0.8T, according to the identification results of the abnormal loss parameter V of the nanocrystalline magnetic ring after annealing at various temperatures under various working conditions, the abnormal loss parameter V at each frequency is combined with the annealing temperature, and the relationship between the annealing temperature coefficient and the abnormal loss parameter V is fitted as follows:

[0058]

[0059] In the formula, , , , , , , , , , , , All are fitting coefficients.

[0060] Among them, the eddy current loss is calculated by the piecewise linear method as:

[0061]

[0062] In the formula, is the eddy current loss, is the proportional coefficient under segment i, is the amplitude of the external alternating magnetic field intensity in segment i, is the output hysteresis angle, is the angular frequency, is the total number of segments, is the segment index, is the magnetic field strength at the upper and lower surfaces of the material, is a constant, is the magnetic field intensity at time t, is the magnetic field intensity, is the proportional coefficient under segment n, is the amplitude of the external alternating magnetic field intensity under segment n, is the output hysteresis angle under segment n.

[0063] It should be noted that based on the high-frequency dynamic hysteresis model considering the skin effect, a piecewise linear method is used to approximate the basic magnetization curves at different annealing temperatures to obtain the eddy current losses at different annealing temperatures.

[0064] Specifically, the eddy current loss is calculated based on Maxwell's equations:

[0065]

[0066] In the formula, is the magnetic field strength in the y direction, is the y direction, is the magnetic induction intensity in the y direction.

[0067] When the soft magnetic material is in the unsaturated state, the magnetic permeability can be regarded as a constant. Therefore, the basic magnetization curve of soft magnetic materials can be approximated by a piecewise linear law.

[0068] Among them, the magnetic properties of the magnetic ring can be measured by the Brukerhaus system. The hysteresis loop of different magnetic flux density (0.1-1.2T) at the corresponding frequency can be obtained by inputting a 5-20kHz signal. The connection points of the vertices of the hysteresis loops at different magnetic flux density constitute the basic magnetization curve, and its slope is also the magnetic permeability. , which is used to calculate the eddy current magnetic field strength. Figure 3 The fitting results of the hysteresis loops of different magnetic flux densities are shown. The piecewise linear method is to obtain the magnetic permeability under multiple magnetic flux densities by measuring , to describe the accuracy of the eddy current magnetic field intensity more accurately through numerical values, so that the fitting of the hysteresis loop is more accurate.

[0069] In the magnetization saturation state, the Horizontal approximation, we get

[0070]

[0071] In the formula, is the magnetic induction intensity of the i-th segment, is the maximum magnetic field intensity, The segmentation points at different annealing temperatures The corresponding magnetic permeability, is the intercept on the B axis. Section The Maxwell equations are:

[0072]

[0073] In the formula, is the magnetic field strength on the upper and lower surfaces of the material, j is an imaginary number, and the angular frequency , is the excitation frequency, is the amplitude of the external alternating magnetic field strength ; is the skin depth, , and the total magnetic field strength inside the material is obtained for:

[0074]

[0075] In the formula, is the wave vector, is the strip thickness, wave vector In the present embodiment, the magnetic field strength corresponding to the eddy current loss is approximately taken as the average magnetic field strength. Therefore, for the magnetic field strength corresponding to the average eddy current loss inside the nanocrystal, for:

[0076]

[0077] In the formula, is the proportionality coefficient, and its expression is as follows:

[0078]

[0079] In the formula, is the skin coefficient, , Skin depth The initial phase angle and output lag angle are related to . The expressions of each parameter are:

[0080]

[0081] When the material changes from an unsaturated state to a saturated state, based on the ideal saturated state Step response relationship, establish Maxwell equations when the material is saturated, and solve the total magnetic field strength of the material for:

[0082]

[0083] In the formula, is the equivalent yield effect depth in the y direction at time t, is the amplitude of the external alternating magnetic field intensity when the fractional segment is n, The expression is:

[0084]

[0085] when When the magnetic field strength of the external alternating magnetic field is for:

[0086]

[0087] The magnetic field intensity expression of eddy current loss in the saturated state of soft magnetic materials is obtained as follows:

[0088]

[0089] In summary, combined with the eddy current loss calculation formula of the unsaturated and saturated states of magnetic materials, and referring to Figure 4 The basic magnetization curves of the nanocrystalline magnetic ring at different annealing temperatures in the figure, the magnetic field intensity corresponding to the eddy current loss under high-frequency excitation is:

[0090]

[0091] In the formula, is the eddy current loss, is the proportional coefficient under segment i, is the amplitude of the external alternating magnetic field intensity in segment i, is the output hysteresis angle, is the angular frequency, is the total number of segments, is the segment index, is the magnetic field strength at the upper and lower surfaces of the material, is a constant, is the magnetic field intensity at time t, is the magnetic field intensity, is the proportional coefficient under segment n, is the amplitude of the external alternating magnetic field intensity under segment n, is the output hysteresis angle under segment n.

[0092] Step S3: obtaining the total loss of each candidate annealing temperature by using the hysteresis loss, eddy current loss and abnormal loss.

[0093] Among them, the sum of hysteresis loss, eddy current loss and abnormal loss is the total loss of the candidate annealing temperature.

[0094] Step S4: comparing the total loss of each candidate annealing temperature, and selecting the candidate annealing temperature with the smallest total loss as the first optimal annealing temperature of the soft magnetic material.

[0095] It can be understood that in order to reduce the total loss of the soft magnetic material, it is necessary to determine a candidate annealing temperature with the minimum total loss as the optimal annealing temperature of the soft magnetic material.

[0096] like Figure 5a From the dynamic hysteresis loop fitting and measurement comparison diagram of each annealing temperature treatment shown in ~b, it can be seen that with the increase of the working magnetic flux density and frequency of the nanocrystalline magnetic ring, the magnetization trajectory of the nanocrystalline magnetic ring at different annealing temperatures can be fitted more accurately, which verifies the effectiveness of considering the skin effect in the high-frequency loss calculation. Analysis of the fitting results of the hysteresis loop at different annealing temperatures shows that when approaching the crystallization temperature of the nanocrystalline material, the total loss value of the nanocrystalline magnetic ring is larger, and the error in the hysteresis loop fitting is larger. As the annealing temperature increases to the optimal annealing temperature range of the nanocrystalline material, the total loss value of the nanocrystalline decreases, and the hysteresis loop prediction is more accurate.

[0097] It should be noted that the embodiment of the present application determines multiple candidate annealing temperatures through the crystallization temperature range and Curie temperature of the soft magnetic material, and separates the loss of the soft magnetic material into hysteresis loss, eddy current loss and abnormal loss, and uses the hysteresis loss, eddy current loss and abnormal loss to determine the total loss of the candidate annealing temperatures, and determines the optimal annealing temperature through the total loss, thereby improving the reliability of the prediction of the loss change of the magnetic properties of the soft magnetic material through loss decomposition, improving the accuracy of selecting the annealing temperature of the soft magnetic material, and optimizing the magnetic property loss of the soft magnetic material.

[0098] In some embodiments, due to different requirements, the proportion of each loss component of nanocrystalline soft magnetic materials at different operating frequencies varies with the annealing temperature. The hysteresis loss reaches its maximum when it is close to the crystallization temperature. As the annealing temperature increases, the proportion of hysteresis loss decreases. The main factor affecting iron loss is the grain size. As the grain size increases, the grain boundaries decrease, the density of defects within the crystal decreases, and the resistance to the movement of the domain wall decreases, which reduces the iron loss. When the annealing temperature reaches the Curie temperature range of the nanocrystalline material, the hysteresis loss value reaches the lowest and the proportion reaches a low level.

[0099] As the operating frequency of nanocrystalline materials increases, it is necessary to adjust the heat treatment conditions according to application requirements. Figure 6a It can be seen from the changes of each loss ratio in ~d with the annealing temperature at different operating frequencies that the hysteresis loss ratio reaches the minimum value under different annealing temperature conditions when applied to different operating frequencies. Therefore, in practical applications, in order to obtain ideal magnetic properties, the annealing conditions can be adjusted, and different annealing temperatures can be set for magnetic components according to different frequency conditions.

[0100] To this end, the method further comprises:

[0101] S501. Determine the proportion of hysteresis loss, eddy current loss and abnormal loss according to the hysteresis loss, eddy current loss, abnormal loss and total loss.

[0102] S502 : determining a second optimal annealing temperature from a plurality of candidate annealing temperatures according to the hysteresis loss ratio, the eddy current loss ratio, or the abnormal loss ratio.

[0103] Among them, according to the loss requirements, the candidate annealing temperature corresponding to the smallest hysteresis loss ratio, the smallest eddy current loss ratio, or the smallest abnormal loss ratio can be selected as the optimal annealing temperature.

[0104] For example, from the perspective of improving product characteristics, the eddy current loss is large, and the product thickness can be improved from the perspective of improving the skin effect of the product, or the electric field distribution can be improved through the equalizing ring. However, since the experiment is tested at a limited annealing temperature and frequency, in actual applications, in order to obtain ideal magnetic properties, the annealing conditions can be adjusted, and different annealing temperatures can be set for the magnetic components for different frequency conditions to obtain minimum losses.

[0105] Based on the same inventive concept, an embodiment of the present application also provides an optimal annealing temperature selection system for soft magnetic materials for implementing the above-mentioned optimal annealing temperature selection method for soft magnetic materials.

[0106] The solution to the problem provided by the system is similar to the solution described in the above method. Therefore, the specific limitations in the embodiments of the optimal annealing temperature selection system for one or more soft magnetic materials provided below can be found in the above limitations on the optimal annealing temperature selection method for soft magnetic materials, and will not be repeated here.

[0107] like Figure 7 As shown, the embodiment of the present application provides an optimal annealing temperature selection system for soft magnetic materials, comprising:

[0108] A candidate temperature determination module 100 is used to determine a plurality of candidate annealing temperatures according to the crystallization temperature range and Curie temperature of the soft magnetic material;

[0109] A loss separation module 200 is used to separate the loss generated by the soft magnetic material at each candidate annealing temperature to obtain hysteresis loss, eddy current loss and abnormal loss;

[0110] A total loss determination module 300, for obtaining a total loss for each candidate annealing temperature using hysteresis loss, eddy current loss and abnormal loss;

[0111] The annealing temperature selection module 400 is used to compare the total loss of each candidate annealing temperature and select the candidate annealing temperature with the smallest total loss as the first optimal annealing temperature of the soft magnetic material.

[0112] In some embodiments, the candidate annealing temperature covers the crystallization temperature range and the Curie temperature.

[0113] In some embodiments, the hysteresis loss is determined by calculating the magnetic field intensity corresponding to the static hysteresis loss of the nanocrystalline magnetic ring at the candidate annealing temperature using the Preisach model.

[0114] In some embodiments, the abnormal loss is derived from the magnetic domain theory; wherein the abnormal loss derived from the magnetic domain theory is:

[0115]

[0116] In the formula, The annealing temperature is Abnormal loss, is the electrical conductivity of the material, is the cross-sectional area of ​​the material, is the abnormal loss statistical parameter, is the excitation frequency, is the annealing temperature, is the dimensionless coefficient, is a constant, To find the derivative symbol, is the magnetic field intensity, is time; among them,

[0117]

[0118] In the formula, , , , , , , , , , , , All are fitting coefficients.

[0119] In some embodiments, eddy current losses are calculated by a piecewise linear method as:

[0120]

[0121] In the formula, is the eddy current loss, is the proportional coefficient under segment i, is the amplitude of the external alternating magnetic field intensity in segment i, is the output hysteresis angle, is the angular frequency, is the total number of segments, is the segment index, is the magnetic field strength at the upper and lower surfaces of the material, is a constant, is the magnetic field intensity at time t, is the magnetic field intensity, is the proportional coefficient under segment n, is the amplitude of the external alternating magnetic field intensity under segment n, is the output hysteresis angle under segment n.

[0122] In some embodiments, the system further comprises:

[0123] The loss proportion module is used to determine the hysteresis loss proportion, eddy current loss proportion and abnormal loss proportion according to the hysteresis loss, eddy current loss, abnormal loss and total loss;

[0124] The annealing temperature optimization module is used to determine the second optimal annealing temperature from multiple candidate annealing temperatures according to the hysteresis loss ratio, the eddy current loss ratio or the abnormal loss ratio.

[0125] like Figure 8 As shown, an embodiment of the present application also provides an electronic device, the electronic device 10 includes a memory 20 and a processor 30, the memory 20 stores a computer program, and when the computer program is executed by the processor 30, the processor 30 executes the steps of the method for selecting the optimal annealing temperature of the soft magnetic material in any of the above embodiments.

[0126] An embodiment of the present application also provides a computer-readable storage medium having a computer program stored thereon. When the computer program is executed, the steps of the method for selecting the optimal annealing temperature of the soft magnetic material in any of the above embodiments are implemented.

[0127] An embodiment of the present application also provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions, wherein when the program instructions are executed by a computer, the computer executes the steps of the method for selecting the optimal annealing temperature for soft magnetic materials in any of the above embodiments.

[0128] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the above-described systems, electronic devices, computer storage media and computer program products can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0129] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0130] In several embodiments provided by the present invention, it is understood that each box in the flow chart or block diagram can represent a module, a program segment or a part of a code, and a part of a module, a program segment or a code includes one or more executable instructions for realizing the specified logical function. It should also be noted that in some alternative implementations, the functions marked in the box can also occur in a different order from that marked in the accompanying drawings. For example, two consecutive boxes can actually be executed substantially in parallel, and they can sometimes be executed in the opposite order, depending on the functions involved.

[0131] In the several embodiments provided by the present invention, it should be understood that the disclosed systems, electronic devices, computer storage media, computer program products and methods can be implemented in other ways. For example, the device embodiments described above are only schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0132] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0133] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0134] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium, including several instructions for executing all or part of the steps of the method described in each embodiment of the present invention through a computer device (which can be a personal computer, server, or network device, etc.). The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (full name in English: Read-Only Memory, English abbreviation: ROM), random access memory (full name in English: Random Access Memory, English abbreviation: RAM), disk or optical disk and other media that can store program codes.

[0135] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A method for selecting the optimal annealing temperature of a soft magnetic material, characterized in that: include: Determine multiple candidate annealing temperatures according to the crystallization temperature range and Curie temperature of the soft magnetic material; Separating the loss generated by the soft magnetic material at each candidate annealing temperature to obtain hysteresis loss, eddy current loss and abnormal loss; Obtaining a total loss at each candidate annealing temperature using the hysteresis loss, the eddy current loss and the abnormal loss; The total loss of each candidate annealing temperature is compared, and the candidate annealing temperature with the smallest total loss is selected as the first optimal annealing temperature of the soft magnetic material.

2. The method for selecting the optimal annealing temperature of soft magnetic materials according to claim 1, characterized in that: The candidate annealing temperature covers the crystallization temperature interval and the Curie temperature.

3. The method for selecting the optimal annealing temperature of soft magnetic materials according to claim 1, characterized in that: The hysteresis loss is determined by calculating the magnetic field intensity corresponding to the static hysteresis loss of the nanocrystalline magnetic ring at the candidate annealing temperature using the Preisach model.

4. The method for selecting the optimal annealing temperature of soft magnetic materials according to claim 1, characterized in that: The abnormal loss is derived from the magnetic domain theory; wherein the abnormal loss derived from the magnetic domain theory is: In the formula, The annealing temperature is Abnormal loss, is the electrical conductivity of the material, is the cross-sectional area of ​​the material, is the abnormal loss statistical parameter, is the excitation frequency, is the annealing temperature, is the dimensionless coefficient, is a constant, To find the derivative symbol, is the magnetic field intensity, is time; among them, In the formula, , , , , , , , , , , , All are fitting coefficients.

5. The method for selecting the optimal annealing temperature of soft magnetic materials according to claim 1, characterized in that: The eddy current loss is calculated by the piecewise linear method as: In the formula, is the eddy current loss, is the proportional coefficient under segment i, is the amplitude of the external alternating magnetic field intensity in segment i, is the output hysteresis angle, is the angular frequency, is the total number of segments, is the segment index, is the magnetic field strength at the upper and lower surfaces of the material, is a constant, is the magnetic field intensity at time t, is the magnetic field intensity, is the proportional coefficient under segment n, is the amplitude of the external alternating magnetic field intensity under segment n, is the output hysteresis angle under segment n.

6. The method for selecting the optimal annealing temperature of soft magnetic materials according to claim 1, characterized in that: Also includes: Determine the proportion of hysteresis loss, the proportion of eddy current loss and the proportion of abnormal loss according to the hysteresis loss, the eddy current loss, the abnormal loss and the total loss; A second optimal annealing temperature is determined from the plurality of candidate annealing temperatures according to the hysteresis loss ratio, the eddy current loss ratio or the abnormal loss ratio.

7. A system for selecting the optimal annealing temperature of soft magnetic materials, characterized in that: include: A candidate temperature determination module, used to determine a plurality of candidate annealing temperatures according to the crystallization temperature range and Curie temperature of the soft magnetic material; A loss separation module, used for separating the loss generated by the soft magnetic material at each candidate annealing temperature to obtain hysteresis loss, eddy current loss and abnormal loss; a total loss determination module, configured to obtain a total loss for each candidate annealing temperature by using the hysteresis loss, the eddy current loss and the abnormal loss; The annealing temperature selection module is used to compare the total loss of each candidate annealing temperature and select the candidate annealing temperature with the smallest total loss as the first optimal annealing temperature of the soft magnetic material.

8. An electronic device, characterized in that: The electronic device includes a memory and a processor, wherein a computer program is stored in the memory, and when the computer program is executed by the processor, the processor executes the steps of the method for selecting the optimal annealing temperature of the soft magnetic material as described in any one of claims 1-6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed, the steps of the method for selecting the optimal annealing temperature of the soft magnetic material as described in any one of claims 1 to 6 are implemented.

10. A computer program product, characterized in that The computer program product comprises a computer program stored on a non-transitory computer-readable storage medium, wherein the computer program comprises program instructions, wherein when the program instructions are executed by a computer, the computer is caused to execute the steps of the method for selecting the optimal annealing temperature of a soft magnetic material as described in any one of claims 1 to 6.

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