Electrical performance test method of halogen-free copper-clad plate and electronic equipment

Abstract

The invention discloses an electrical performance test method of a halogen-free copper-clad plate and electronic equipment, and relates to the technical field of electrical performance test.The electrical performance test method comprises the steps that a test sample set is obtained from a target batch, the surfaces of samples are cleaned and fixed to a tester platform, and platinum electrodes are placed on the surfaces in parallel; obtaining a historical tracking voltage set through data mining, carrying out calibration separation voltage identification, and generating a calibration separation voltage sequence and an incremental step length sequence; under the initial constant voltage, the tracking is observed through a liquid drop circulation test, and the tracking voltage is recorded; if the tracking does not occur, gradually increasing the voltage according to an increasing step length and a calibration sequence, and repeating the test until the tracking occurs; and finally, carrying out data screening on the tracking voltage set to obtain a target sample tracking voltage, and taking the target sample tracking voltage as an electric leakage tracking index of a target batch. The technical problem that the electrical performance of the material cannot be comprehensively evaluated in the prior art is solved, and the technical effects of efficient evaluation and reliability analysis of the electrical performance of the material are achieved.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical performance testing, and in particular to an electrical performance testing method for a halogen-free copper clad laminate and electronic equipment. Background Art

[0002] Halogen-free copper clad laminates are key materials in the manufacture of electronic circuit substrates. Their electrical insulation properties, especially their tracking resistance under high voltage and high humidity environments, are directly related to the reliability and service life of electronic products. With the rapid development of electronic products and the continued growth in demand for circuit substrates, halogen-free copper clad laminates have been widely used in the field of electronic manufacturing due to their environmental protection characteristics and good electrical properties. However, with the complexity of circuit design and the diversification of the use environment, the electrical performance evaluation of halogen-free copper clad laminates, especially the tracking resistance test, faces higher requirements.

[0003] Traditional methods for testing the electrical properties of halogen-free copper clad laminates mostly rely on manual operations, such as sample cutting and cleaning, as well as manual monitoring under fixed test conditions, resulting in low test efficiency and insufficient precision. At the same time, fixed test conditions cannot fully reflect the true performance of the material under different working conditions, and it is especially difficult to capture its anti-tracking characteristics in complex environments. The above problems make it difficult for existing methods to meet the urgent needs of modern electronic manufacturing for efficient, accurate and comprehensive testing. Summary of the invention

[0004] The present application provides a method and electronic equipment for testing the electrical properties of a halogen-free copper clad laminate, which are used to solve the technical problem that the prior art cannot comprehensively evaluate the electrical properties of materials.

[0005] In view of the above problems, the present application provides an electrical performance testing method and electronic equipment for a halogen-free copper clad laminate.

[0006] In a first aspect of the present application, a method for testing the electrical properties of a halogen-free copper clad laminate is provided, the method comprising:

[0007] Samples are cut from the target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; the test sample set is traversed to clean the surface, and the cleaned test sample set is fixed on the tester platform, and two platinum electrodes are placed in parallel on the surface of each test sample in the test sample set; based on the design parameter information of the target batch of halogen-free copper clad laminates, the same type of tracking voltage data is mined to obtain a historical tracking voltage set; the historical tracking voltage set is calibrated to identify the separation voltage, and the voltage increment step of each calibrated separation voltage is determined according to the identification result, to obtain a calibrated separation voltage sequence and a calibrated voltage increment step sequence; the AC power module is called to configure a preset initial constant voltage, and under the initial constant voltage, the voltage increment step of each calibrated separation voltage is determined by the AC power module. Use an automatic dripping device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set, and observe whether the test sample set is tracked. If so, record the sample tracking voltage set; if not, increase the initial constant voltage to the next level according to the preset voltage increment step until it increases to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence, repeat the dripping and observation at each increased voltage, and when the test sample set is tracked, record the sample tracking voltage set; perform aggregate data screening on the sample tracking voltage set to obtain a target sample tracking voltage, and use the target sample tracking voltage as the leakage tracking index of the target batch of halogen-free copper clad laminates.

[0008] The second aspect of the present application provides an electronic device, comprising: a memory for storing executable instructions; a processor for executing the executable instructions stored in the memory to implement an electrical performance testing method for a halogen-free copper clad laminate provided in the present application.

[0009] One or more technical solutions provided in this application have at least the following technical effects or advantages:

[0010] The present application cuts samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; traverses the test sample set to clean the surface, and fixes the cleaned test sample set on a tester platform, and places two platinum electrodes in parallel on the surface of each test sample in the test sample set; performs data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set; performs calibrated separation voltage identification on the historical tracking voltage set, and determines the voltage increment step of each calibrated separation voltage based on the identification result, to obtain a calibrated separation voltage sequence and a calibrated voltage increment step sequence; calls an AC power supply module to configure a preset initial constant voltage, and at the initial constant voltage , using an automatic dripping device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set, observe whether the test sample set is tracked, and if so, record the sample tracking voltage set; if not, increase the initial constant voltage to the next level according to the preset voltage increment step, until it increases to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence, repeat the dripping and observation at each increased voltage, and when the test sample set is tracked, record the sample tracking voltage set; aggregate data screening is performed on the sample tracking voltage set to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the leakage tracking index of the target batch of halogen-free copper clad laminates. The present invention solves the technical problem that the prior art cannot comprehensively evaluate the electrical properties of materials. Through methods such as sample cutting and cleaning, electrode placement, data mining, calibrated separation voltage identification and voltage increment testing, the tracking voltage of the target sample is accurately obtained. Combined with data screening and optimization, it is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, thereby achieving the technical effect of efficient evaluation of the electrical properties of the material and reliability analysis. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0012] Figure 1 A schematic flow chart of a method for testing the electrical properties of a halogen-free copper clad laminate provided in an embodiment of the present application;

[0013] Figure 2 This is a schematic diagram of the structure of an exemplary electronic device of the present application.

[0014] Description of the reference numerals: bus 300 , receiver 301 , processor 302 , transmitter 303 , memory 304 , bus interface 305 . DETAILED DESCRIPTION

[0015] The present application provides an electrical performance testing method and electronic equipment for halogen-free copper clad laminates, aiming to solve the technical problem that the prior art cannot comprehensively evaluate the electrical performance of materials. Through methods such as sample cutting and cleaning, electrode placement, data mining, calibrated separation voltage identification and voltage increment testing, the tracking voltage of the target sample is accurately obtained. Combined with data screening and optimization, it is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, thereby achieving the technical effect of efficient evaluation of the electrical performance of the material and reliability analysis.

[0016] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of this application.

[0017] It should be noted that any variations of the terms "include" and "have" are intended to cover non-exclusive inclusions. For example, a process, method, electronic device, product or server that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or modules that are not clearly listed or inherent to these processes, methods, products or devices.

[0018] Embodiment 1, as Figure 1 As shown, the present application provides a method for testing the electrical properties of a halogen-free copper clad laminate, the method comprising:

[0019] Step S100: cutting samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set.

[0020] In the embodiment of the present application, the sample cutting method is first planned according to the production information of the target batch and the preset rules established in advance. The preset rules are standards set in advance for the test requirements and the characteristics of the board, including the cutting size, quantity and position of the samples. These rules usually take into account representativeness and uniformity, such as requiring samples to be cut from the center area, edge area and transition area of ​​the board respectively to ensure that the performance differences that may exist in different positions are covered.

[0021] According to the preset rules, the cutting equipment is used to cut samples of the target batch of halogen-free copper clad laminates. During the cutting process, the set sample size and shape requirements are strictly followed, and it is ensured that the cutting process does not damage the surface or internal structure of the sample. After the cutting is completed, each sample is uniquely marked and its corresponding production time is recorded. By associating each sample with its production time, a production time set containing production time information is formed.

[0022] Finally, all the cut samples are aggregated to form a test sample set, which contains samples that meet preset rules, are marked and have production time information.

[0023] Step S200: traverse the test sample set to clean the surface, fix the cleaned test sample set on the tester platform, and place two platinum electrodes in parallel on the surface of each test sample in the test sample set.

[0024] In the embodiment of the present application, each sample in the test sample set is firstly cleaned on the surface one by one. Here, the solvent cleaning method is adopted, and the surface of the sample is carefully wiped with a dust-free cloth soaked with anhydrous ethanol to remove dust, grease and other organic pollutants that may affect the test. During the cleaning process, the cleaning degree of each sample is ensured to be consistent, and after the cleaning is completed, the sample is placed in a dust-free environment to dry naturally to ensure that the surface of the sample is dry and free of residual impurities.

[0025] After cleaning, each sample is fixed on the tester platform one by one, and fixed by vacuum adsorption. By forming a local vacuum area on the test platform surface, the sample is firmly adsorbed on the platform surface to ensure that the sample will not move or deviate during the test.

[0026] Next, two platinum electrodes are placed parallel to the surface of each test sample. The mechanical guide positioning method is used to place the electrodes, and the precise guide equipment ensures that the electrodes are parallel to the sample surface and the spacing is consistent. The platinum electrodes are made of high-purity platinum material, which has excellent conductivity and corrosion resistance and can resist the long-term effects of droplets and electric fields. To further ensure that the electrode is in full contact with the sample surface, a flexible metal clamp is installed at the bottom of the electrode to compensate for possible minor unevenness of the sample surface. After placement, the spacing and contact status of the electrodes are checked using a digital microscope to ensure that they meet the test requirements.

[0027] Through the above steps, the surface cleaning, fixation and electrode placement of the test sample are completed by using the solvent cleaning method, vacuum adsorption fixation method and mechanical guide rail positioning method.

[0028] Step S300: performing data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set.

[0029] In the embodiment of the present application, the design parameter information is first extracted from the target batch of halogen-free copper clad laminates. The design parameters include halogen-free composition, sheet thickness, surface treatment method, flame retardant performance level, and production process conditions (such as temperature and pressure). These parameters are extracted through a process recording system (such as an MES system) or a production database.

[0030] Next, the multi-parameter retrieval method is used to screen the copper clad laminate test records that meet the design parameters of the target batch in the historical database. The historical records in the database contain test data for multiple batches, and each record includes design parameters, test conditions, and tracking voltage results. By setting retrieval conditions (such as the same halogen-free component category, board thickness range, and flame retardant performance level), irrelevant records are excluded and historical data that matches the characteristics of the target batch is retained.

[0031] Then, a fuzzy matching algorithm is applied to the selected historical records to further optimize the data selection. By constructing a multidimensional feature vector, the similarity between the target batch design parameters and the historical record design parameters is calculated, for example, the cosine similarity or Euclidean distance is used to measure the similarity, and only the records closest to the target batch parameters are retained.

[0032] For the historical records finally screened out, the tracking voltage data and the corresponding test condition information are extracted, including the test temperature, humidity, electrode spacing, incremental rate, etc.

[0033] After the extraction is completed, the tracking voltage data of the same batch or under the same test conditions are grouped using data aggregation technology and stored in a standardized format to form a historical tracking voltage set. The historical tracking voltage set mainly includes tracking voltage values, test conditions, plate design parameters, data sources, and batch information.

[0034] Step S400: performing calibration separation voltage identification on the historical tracking voltage set, and determining the voltage increment step of each calibration separation voltage according to the identification result, to obtain a calibration separation voltage sequence and a calibration voltage increment step sequence.

[0035] Furthermore, in the method provided in the embodiment of the application, the calibration separation voltage is identified for the historical tracking voltage set, and the voltage increment step of each calibration separation voltage is determined according to the identification result to obtain the calibration separation voltage sequence and the calibration voltage increment step sequence, and further includes:

[0036] The historical tracking voltage set is arranged in ascending order of voltage to obtain a historical tracking voltage sequence; the first historical tracking voltage at the first position in the historical tracking voltage sequence is extracted and used as the first calibrated separation voltage; based on the first calibrated separation voltage and a preset calibrated separation threshold, the calibrated separation voltage of the historical tracking voltage sequence is identified to obtain the calibrated separation voltage sequence; according to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, the voltage increment step of each calibrated separation voltage is determined to obtain the calibrated voltage increment step sequence.

[0037] In the embodiment of the present application, all voltage data in the historical tracking voltage set are first arranged in ascending order to form a historical tracking voltage sequence to provide an ordered basic data structure. Then, the first voltage value is extracted from the historical tracking voltage sequence as the first calibrated separation voltage. This initial separation point provides a starting point for subsequent segmentation processing.

[0038] Then, based on the first calibrated separation voltage and the preset calibrated separation threshold, the calibrated separation voltage identification is performed step by step on the historical tracking voltage sequence. Specifically, the mean of the first calibrated separation voltage and the second historical tracking voltage in the sequence is first calculated, and the difference between it and the first calibrated separation voltage is calculated. If the difference is less than or equal to the preset calibrated separation threshold, the first calibrated separation voltage and subsequent voltage values ​​are continued to be similarly calculated in terms of mean and difference; when the difference exceeds the calibrated separation threshold, the current voltage value is used as the new calibrated separation voltage. This process is repeated until the entire historical tracking voltage sequence is traversed, and finally a set of clearly divided calibrated separation voltage sequences is obtained.

[0039] Next, based on the calibrated separation voltage sequence, the number of historical tracking voltages between each calibrated separation voltage and its next calibrated separation voltage is calculated to form a historical tracking voltage number sequence. By dividing each value in the historical tracking voltage number sequence by the total voltage number, a step importance coefficient sequence is obtained, which reflects the relative data density of each interval. Combined with the voltage difference between each two adjacent calibrated separation voltages, the step importance coefficient is integrated to perform voltage increment step analysis, determine the voltage increment step for each interval, and finally generate a calibrated voltage increment step sequence.

[0040] Furthermore, in the method provided in the embodiment of the application, based on the first calibrated separation voltage and the preset calibrated separation threshold, the calibrated separation voltage is identified on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence, and further includes:

[0041] Performing mean calculation on the first calibrated separation voltage and the second historical tracking voltage in the historical tracking voltage sequence, performing difference calculation between the calculation result and the first calibrated separation voltage, judging whether the difference calculation result is less than or equal to a preset calibrated separation threshold value, if not, taking the second historical tracking voltage as the second calibrated separation voltage; if so, performing mean calculation on the first calibrated separation voltage, the second historical tracking voltage and the third historical tracking voltage in the historical tracking voltage sequence, performing difference calculation between the calculation result and the first calibrated separation voltage, when the calculation result is greater than the preset calibrated separation threshold value, taking the third historical tracking voltage as the second calibrated separation voltage; and so on, performing calibrated separation voltage identification on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence.

[0042] In the embodiment of the present application, the first voltage value is first extracted from the historical tracking voltage sequence and determined as the first calibrated separation voltage. The first calibrated separation voltage is used as the initial reference point for the subsequent division of the voltage interval. On this basis, the first calibrated separation voltage and the second historical tracking voltage in the historical tracking voltage sequence are averaged to obtain a preliminary interval center value. Subsequently, the difference between the mean and the first calibrated separation voltage is calculated to determine the continuity of the current voltage interval.

[0043] The difference is then compared with a preset calibrated separation threshold. If the difference is greater than the preset calibrated separation threshold, it is considered that the voltage change between the first calibrated separation voltage and the second historical tracking voltage exceeds the allowable range, and the second historical tracking voltage is used as the second calibrated separation voltage to divide a new voltage interval.

[0044] If the difference is less than or equal to the preset calibration separation threshold, it is considered that the change in the current voltage interval is within a reasonable range, and the next voltage value in the sequence is processed. Specifically, the first calibration separation voltage, the second historical tracking voltage, and the third historical tracking voltage in the historical tracking voltage sequence are averaged, and the difference between the average and the first calibration separation voltage is calculated. If the difference calculation result at this time is greater than the preset calibration separation threshold, it is considered that the third historical tracking voltage marks the beginning of a new interval, and it is used as the second calibration separation voltage; if the difference calculation result is still less than or equal to the preset calibration separation threshold, the subsequent historical tracking voltages are judged in turn according to the same calculation method until a voltage value that meets the threshold condition is found as the new calibration separation voltage.

[0045] Through the above recursive iteration method, all voltage values ​​in the historical tracking voltage sequence are calculated and judged in turn, and finally a set of calibrated separation voltages is formed. These calibrated separation voltages are arranged in the order of the historical tracking voltage sequence to form a complete calibrated separation voltage sequence.

[0046] Furthermore, in the method provided in the embodiment of the application, according to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, the voltage increment step of each calibrated separation voltage is determined to obtain the calibrated voltage increment step sequence, and further includes:

[0047] The number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence is counted respectively to obtain a historical tracking voltage number sequence; each historical tracking voltage number sequence in the historical tracking voltage number sequence is divided by the sum of the historical tracking voltage number sequences to obtain a step importance coefficient sequence; a voltage increment step analysis is performed according to the voltage difference between each calibrated separation voltage and the next calibrated separation voltage and the step importance coefficient of each calibrated separation voltage in the step importance coefficient sequence to obtain the calibrated voltage increment step sequence.

[0048] In the embodiment of the present application, the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence is first counted to form a historical tracking voltage number sequence. This sequence reflects the density of historical data in each voltage interval and is an important basis for calculating the voltage increment step. For example, between two calibrated separation voltages, if the number of historical tracking voltages is large, it means that the data density of the interval is high, and a smaller increment step is required to ensure the accuracy of the test.

[0049] Then, the ratio of each historical tracking voltage number in the historical tracking voltage number sequence to the sum of the historical tracking voltage number sequence is calculated to obtain the step importance coefficient sequence. The step importance coefficient reflects the importance of each voltage interval relative to the entire sequence. The larger the value, the higher the data density of the interval, and the higher the resolution required in the test.

[0050] Then, the incremental step analysis is performed in combination with the voltage difference. The voltage difference between each calibrated separation voltage and its next calibrated separation voltage is calculated in combination with the corresponding step importance coefficient. Specifically, the incremental step value of the interval is obtained by subtracting the difference of the step importance coefficient from 1 and multiplying it by the voltage difference. In this way, the interval with a large voltage difference but a low step importance coefficient has a large incremental step, which helps to improve test efficiency; while the interval with a small voltage difference or a high step importance coefficient has a small incremental step to ensure test accuracy.

[0051] Finally, the calculation results are sorted to form a calibration voltage increment step sequence, which corresponds one-to-one to the calibration separation voltage sequence, providing a clear increment rule for each voltage interval.

[0052] Step S500: Call the AC power supply module to configure a preset initial constant voltage. Under the initial constant voltage, use an automatic dripping device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set to observe whether the test sample set is tracked. If so, record the sample tracking voltage set.

[0053] In the embodiment of the present application, the AC power module is first called to configure a preset initial constant voltage. The AC power module is a precision adjustable voltage source device that provides standardized voltage conditions for testing by setting an initial constant voltage. When configuring the voltage, the set value is entered using the module's digital control panel or computer interface. Usually, a relatively low and safe starting voltage (e.g., 100V or 200V) is selected according to the test standard to avoid premature damage to the sample. After the configuration is completed, the module outputs a stable AC voltage to the test platform.

[0054] Then, under the initial constant voltage, an automatic dripping device is used to perform a preset number of droplet circulation tests between two platinum electrodes placed on the surface of each test sample in the test sample set at a preset flow rate. The automatic dripping device achieves precise droplet distribution through a built-in micropump and control system. The preset flow rate is set by the control interface of the device, usually in milliliters per minute (for example, 1mL / min), to ensure that the droplets are stable and continuous during the test. The liquid type is usually a standard test solution (such as ammonium chloride solution, with a concentration of 0.1% to 0.5%). The droplets are evenly distributed between the platinum electrodes by the dropper head, and the number of droplet circulation tests is set according to the standard (for example, 10 times or 20 times) to simulate moisture and electric field effects between the electrodes.

[0055] During the test, observe whether the test sample set has any tracking. The tracking phenomenon is monitored in real time by a microscope or a high-resolution camera, and manifests as local ablation, carbonization or structural damage on the material surface. If tracking occurs, the tracking location is captured and marked by the visual inspection system, and the relevant voltage parameters are recorded at the same time.

[0056] If some samples in the test sample set are subject to tracking, the sample tracking voltage set is recorded immediately. The tracking voltage is the critical voltage value at which the sample is subject to tracking under specific test conditions. When recording, the AC power module outputs the current constant voltage value to the test recording system through the digital interface and automatically stores it in the sample tracking voltage set to form a complete data record.

[0057] By calling the AC power supply module to provide uniform voltage conditions, using the automatic dripping device to accurately control the droplet cycle test, combining electrical tracking observation and data recording, the sample tracking voltage set is finally obtained.

[0058] Step S600: If not, increase the initial constant voltage to the next level according to the preset voltage increment step until it increases to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence. Repeat the dripping and observation at each increased voltage level. When the test sample set is tracked, record the sample tracking voltage set.

[0059] In the embodiment of the present application, if the test sample set does not undergo tracking under the initial constant voltage, an incremental voltage test is performed according to the following steps until a sample tracking voltage set is obtained.

[0060] Specifically, the initial constant voltage is first increased to the next level according to the preset voltage increment step. The preset voltage increment step is a fixed increment size set in advance according to the test standard, such as 5V or 10V, to ensure that the voltage is gradually and steadily increased. The AC power module accurately adjusts the output voltage through digital control and displays the current voltage value in real time to ensure the accuracy of the test. After each increment, the droplet test is re-performed on the test sample set.

[0061] When the voltage increases to the first position of the calibrated separation voltage sequence, it switches to increase the voltage according to the calibrated voltage increment step sequence. The calibrated voltage increment step sequence is a dynamic increment rule preset for different voltage interval characteristics. In intervals with dense data distribution, the step size is small (for example, 5V) to improve test accuracy; in intervals with sparse data, the step size is large (for example, 20V) to improve test efficiency. The AC power module gradually increases the voltage according to the calibrated step size to provide accurate voltage conditions for subsequent drip tests.

[0062] Repeat the dripping and observation at each increasing voltage. The automatic dripping device continuously drips the test liquid (e.g., ammonium chloride solution) evenly between two platinum electrodes placed on the surface of each sample at a preset flow rate and number of drops. During the droplet cycle, monitor the test sample collection for tracking. Tracking is a sign of failure of the material's insulation properties, usually manifested as carbonization, ablation, or structural damage on the material surface, and is observed and recorded using a microscope or real-time image monitoring system.

[0063] When some samples in the test sample set are subjected to tracking under increasing voltage conditions, the sample tracking voltage set is recorded. The tracking voltage is the critical voltage value for the sample to be tracked and is an important indicator for evaluating the electrical properties of the material. The tracking voltage value of each sample is automatically recorded and stored in the sample tracking voltage set.

[0064] Step S700: performing aggregate data screening on the sample tracking voltage set to obtain a target sample tracking voltage, and using the target sample tracking voltage as the leakage tracking index of the target batch of halogen-free copper clad laminates.

[0065] Furthermore, in the method provided in the embodiment of the application, the sample tracking voltage set is subjected to aggregate data screening to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, and further includes:

[0066] Calculate the mean of the sample tracking voltage set to obtain the sample tracking voltage mean; take the sample tracking voltage mean as the screening center, perform clustered data screening on the sample tracking voltage set according to a preset screening bandwidth, and obtain a target sample tracking voltage screening neighborhood; calculate the mean of the target sample tracking voltage screening neighborhood to obtain the target sample tracking voltage.

[0067] In the embodiment of the present application, all data in the sample tracking voltage set are first calculated using the mean statistical method, and the tracking voltage values ​​of all samples in the set are added and divided by the total number of samples to obtain the mean value of the sample tracking voltage.

[0068] Then, the sample tracking voltage mean is taken as the screening center, and the sample tracking voltage set is aggregated and screened according to the preset screening bandwidth. Specifically, first, the sample tracking voltage mean is taken as the center, and the preset screening bandwidth (for example, 10V) is combined as the screening radius to screen out all the tracking voltage values ​​in the set within the range to form the initial sample tracking voltage screening neighborhood. Then, the screening range of the initial screening neighborhood is gradually expanded according to the preset screening bandwidth to form an expanded sample tracking voltage screening neighborhood. When expanding the neighborhood, the screening radius is increased by one screening bandwidth unit (for example, from 10V to 20V), and new data points are screened and added to the neighborhood. After each expansion, the number of sample tracking voltages in the expanded neighborhood is counted, and the number is divided by the range of the expanded screening neighborhood (that is, 2 times the screening radius) to calculate the clustering density of the expanded neighborhood. By calculating the clustering density, it is determined whether the newly added data is concentrated in the target area. If the clustering density of the expanded neighborhood is greater than or equal to the clustering density of the initial neighborhood, the expansion continues; otherwise, the expansion stops.

[0069] When the number of expansions reaches a preset limit (for example, 3 expansions) or the clustering density of the expanded neighborhood is lower than the clustering density of the initial neighborhood, the expansion ends, and the expanded neighborhood at this time is the tracking voltage screening neighborhood of the target sample.

[0070] Next, the mean of all data in the target sample tracking voltage screening neighborhood is calculated, and the target sample tracking voltage is obtained using the same statistical method as the first step.

[0071] Finally, the tracking voltage of the target sample is used as the leakage tracking index of the target batch of halogen-free copper clad laminates to comprehensively evaluate the insulation performance of this batch of materials.

[0072] Furthermore, in the method provided in the embodiment of the application, the mean value of the sample tracking voltage is used as the screening center, and the set of sample tracking voltages is aggregated and screened according to a preset screening bandwidth to obtain a target sample tracking voltage screening neighborhood, and further includes:

[0073] An initial sample tracking voltage screening neighborhood is constructed with the mean of the sample tracking voltage as the screening center and a preset screening bandwidth as the screening radius; the neighborhood edge of the initial sample tracking voltage screening neighborhood is expanded according to the preset screening bandwidth to obtain an expanded sample tracking voltage screening neighborhood; it is determined whether the aggregation density of the expanded sample tracking voltage screening neighborhood is greater than or equal to the aggregation density of the initial sample tracking voltage screening neighborhood, and if so, the neighborhood edge expansion of the expanded sample tracking voltage screening neighborhood continues according to the preset screening bandwidth until the preset number of expansions is met to obtain a target sample tracking voltage screening neighborhood.

[0074] In an embodiment of the present application, the mean value of the sample tracking voltage is first taken as the center and combined with a preset screening bandwidth (for example, 10V) as the screening radius, and all voltage values ​​within the range of "mean value of the sample tracking voltage ± screening radius" are screened in the sample tracking voltage set to form an initial sample tracking voltage screening neighborhood.

[0075] After the initial neighborhood is constructed, the neighborhood edge of the initial sample tracking voltage screening neighborhood is expanded according to the preset screening bandwidth. Specifically, a preset screening bandwidth unit is added on the basis of the initial screening radius (for example, from 10V to 20V), and the data points in the sample tracking voltage set that meet the new extended range are rescreened, and these new data points are merged with the initial neighborhood data to form an expanded sample tracking voltage screening neighborhood.

[0076] After expansion, calculate the cluster density of the expanded sample tracking voltage screening neighborhood, that is, the number of data points in the expanded neighborhood divided by the width of the screening range (twice the screening radius). Then compare the cluster density of the expanded sample tracking voltage screening neighborhood with the cluster density of the initial neighborhood. If the cluster density of the expanded sample tracking voltage screening neighborhood is greater than or equal to the cluster density of the initial sample tracking voltage screening neighborhood, continue to expand the screening range, add another screening bandwidth unit and repeat the above steps; if the cluster density of the expanded sample tracking voltage screening neighborhood is less than the cluster density of the initial sample tracking voltage screening neighborhood, or the number of expansions has reached the preset limit (for example, 3 expansions), stop expanding.

[0077] After the expansion is completed, the final expanded neighborhood is the tracking voltage screening neighborhood of the target sample.

[0078] Furthermore, the method provided in the application embodiment also includes:

[0079] The number of sample tracking voltages within the expanded sample tracking voltage screening neighborhood is counted, and the statistical result is divided by twice the preset screening bandwidth to obtain the aggregation density of the expanded sample tracking voltage screening neighborhood.

[0080] In the embodiment of the present application, in order to determine the cluster density of the expanded sample tracking voltage screening neighborhood, the number of sample tracking voltages in the expanded sample tracking voltage screening neighborhood is first counted, and all sample tracking voltage data points in the expanded sample tracking voltage screening neighborhood are counted by a counting method to obtain the total number. Next, the statistical result is divided by 2 times the preset screening bandwidth to calculate and obtain the cluster density of the expanded sample tracking voltage screening neighborhood.

[0081] In the embodiments of the present application, in summary, the embodiments of the present application have at least the following technical effects:

[0082] The present application cuts samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; traverses the test sample set to clean the surface, and fixes the cleaned test sample set on a tester platform, and places two platinum electrodes in parallel on the surface of each test sample in the test sample set; performs data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set; performs calibrated separation voltage identification on the historical tracking voltage set, and determines the voltage increment step of each calibrated separation voltage based on the identification result, to obtain a calibrated separation voltage sequence and a calibrated voltage increment step sequence; calls an AC power supply module to configure a preset initial constant voltage, and at the initial constant voltage , using an automatic dripping device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set, observe whether the test sample set is tracked, and if so, record the sample tracking voltage set; if not, increase the initial constant voltage to the next level according to the preset voltage increment step, until it increases to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence, repeat the dripping and observation at each increased voltage, and when the test sample set is tracked, record the sample tracking voltage set; aggregate data screening is performed on the sample tracking voltage set to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the leakage tracking index of the target batch of halogen-free copper clad laminates. The present invention solves the technical problem that the prior art cannot comprehensively evaluate the electrical properties of materials. Through methods such as sample cutting and cleaning, electrode placement, data mining, calibrated separation voltage identification and voltage increment testing, the tracking voltage of the target sample is accurately obtained. Combined with data screening and optimization, it is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, thereby achieving the technical effect of efficient evaluation of the electrical properties of the material and reliability analysis.

[0083] Embodiment 2. Based on the inventive concept of a method for testing the electrical properties of a halogen-free copper clad laminate in the aforementioned embodiment, the present application also provides an electronic device, comprising: at least one processor; a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can execute the steps of any one of the methods described in the aforementioned embodiment 1.

[0084] Figure 2 This is a schematic diagram of the structure of an exemplary electronic device of this application. Figure 2 In the embodiment, the bus architecture is represented by bus 300, which may include any number of interconnected buses and bridges, and bus 300 connects various circuits including one or more processors represented by processor 302 and memory represented by memory 304. Bus 300 may also connect various other circuits such as peripherals, voltage regulators, and power management circuits, which are well known in the art and are therefore not further described herein. Bus interface 305 provides an interface between bus 300 and receiver 301 and transmitter 303. Receiver 301 and transmitter 303 may be the same element, namely a transceiver, providing a unit for communicating with various other devices over a transmission medium. Processor 302 is responsible for managing bus 300 and general processing, while memory 304 may be used to store data used by processor 302 when performing operations.

[0085] It should be noted that the above-mentioned sequence of the embodiments of the present application is only for description and does not represent the advantages and disadvantages of the embodiments. And the above-mentioned specific embodiments of this specification are described. The processes depicted in the accompanying drawings do not necessarily require the specific order and continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0086] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present application shall be included in the protection scope of the present application.

[0087] This specification and drawings are merely exemplary illustrations of the present application and are deemed to cover any and all modifications, variations, combinations or equivalents within the scope of the present application. Obviously, a person skilled in the art may make various modifications and variations to the present application without departing from the scope of the present application. Thus, if these modifications and variations of the present application fall within the scope of the present application and its equivalents, the present application intends to include these modifications and variations.

Claims

1. A method for testing the electrical properties of a halogen-free copper clad laminate, characterized in that: The method comprises: Cutting samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; Traversing the test sample set to clean the surface, fixing the cleaned test sample set on the tester platform, and placing two platinum electrodes in parallel on the surface of each test sample in the test sample set; Performing data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set; Performing calibration separation voltage identification on the historical tracking voltage set, and determining the voltage increment step of each calibration separation voltage according to the identification result, to obtain a calibration separation voltage sequence and a calibration voltage increment step sequence; Calling the AC power supply module to configure a preset initial constant voltage, under the initial constant voltage, using an automatic dripping device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set, observing whether the test sample set is tracked, and if so, recording the sample tracking voltage set; If not, the initial constant voltage is increased to the next level according to the preset voltage increment step until it reaches the first position of the calibrated separation voltage sequence, and the voltage is increased according to the calibrated voltage increment step sequence, and the dripping and observation are repeated at each increased voltage. When the test sample set is tracked, the sample tracking voltage set is recorded; Aggregate data screening is performed on the sample tracking voltage set to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the leakage tracking index of the target batch of halogen-free copper clad laminates.

2. The electrical performance testing method of a halogen-free copper clad laminate according to claim 1, characterized in that: The historical tracking voltage set is subjected to calibration separation voltage identification, and the voltage increment step of each calibration separation voltage is determined according to the identification result, so as to obtain a calibration separation voltage sequence and a calibration voltage increment step sequence, including: Arrange the historical tracking voltage set in ascending order of voltage to obtain a historical tracking voltage sequence; Extracting a first historical tracking voltage at the first position in the historical tracking voltage sequence and using it as a first calibrated separation voltage; Based on the first calibrated separation voltage and a preset calibrated separation threshold, performing calibrated separation voltage identification on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence; According to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, the voltage increment step of each calibrated separation voltage is determined to obtain the calibrated voltage increment step sequence.

3. The electrical performance testing method of a halogen-free copper clad laminate according to claim 2, characterized in that: Based on the first calibrated separation voltage and a preset calibrated separation threshold, performing calibrated separation voltage identification on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence includes: Calculate the mean of the first calibrated separation voltage and the second historical tracking voltage in the historical tracking voltage sequence, and perform difference calculation between the calculated result and the first calibrated separation voltage, and determine whether the difference calculation result is less than or equal to a preset calibrated separation threshold value, and if not, use the second historical tracking voltage as the second calibrated separation voltage; If yes, then average the first calibrated separation voltage, the second historical tracking voltage and the third historical tracking voltage in the historical tracking voltage sequence, and perform difference calculation between the calculated result and the first calibrated separation voltage. When the calculated result is greater than a preset calibrated separation threshold, the third historical tracking voltage is used as the second calibrated separation voltage; By analogy, the calibrated separation voltage is identified on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence.

4. The electrical performance testing method of a halogen-free copper clad laminate according to claim 3, characterized in that: Determining the voltage increment step of each calibrated separation voltage according to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, and obtaining the calibrated voltage increment step sequence, including: Respectively counting the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence to obtain a historical tracking voltage number sequence; Dividing each historical tracking voltage quantity sequence in the historical tracking voltage quantity sequence by the sum of the historical tracking voltage quantity sequences, to obtain a step importance coefficient sequence; The voltage increment step length analysis is performed according to the voltage difference between each calibrated separation voltage and the next calibrated separation voltage and the step importance coefficient of each calibrated separation voltage in the step importance coefficient sequence to obtain the calibrated voltage increment step length sequence.

5. The electrical performance testing method of a halogen-free copper clad laminate according to claim 1, characterized in that: Aggregate data screening is performed on the sample tracking voltage set to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, including: Calculating the mean of the tracking voltage set of the samples to obtain the mean tracking voltage of the samples; Taking the mean value of the sample tracking voltage as the screening center, performing aggregate data screening on the sample tracking voltage set according to a preset screening bandwidth to obtain a target sample tracking voltage screening neighborhood; The mean of the tracking voltage screening neighborhood of the target sample is calculated to obtain the tracking voltage of the target sample.

6. The electrical performance testing method of a halogen-free copper clad laminate according to claim 5, characterized in that: Taking the mean value of the sample tracking voltage as the screening center, the set of sample tracking voltages is aggregated and screened according to a preset screening bandwidth to obtain a target sample tracking voltage screening neighborhood, including: Taking the mean value of the sample tracking voltage as the screening center and taking the preset screening bandwidth as the screening radius to construct an initial sample tracking voltage screening neighborhood; Expanding the neighborhood edge of the initial sample tracking voltage screening neighborhood according to a preset screening bandwidth to obtain an expanded sample tracking voltage screening neighborhood; Determine whether the clustering density of the expanded sample tracking voltage screening neighborhood is greater than or equal to the clustering density of the initial sample tracking voltage screening neighborhood. If so, continue to expand the neighborhood edge of the expanded sample tracking voltage screening neighborhood according to the preset screening bandwidth until the preset expansion times are met to obtain the target sample tracking voltage screening neighborhood.

7. A method for testing electrical properties of a halogen-free copper clad laminate as claimed in claim 6, characterized in that: The number of sample tracking voltages within the expanded sample tracking voltage screening neighborhood is counted, and the statistical result is divided by twice the preset screening bandwidth to obtain the aggregation density of the expanded sample tracking voltage screening neighborhood.

8. An electronic device, characterized in that: The electronic device comprises: A memory for storing executable instructions; The processor is used to implement the electrical performance testing method of a halogen-free copper clad laminate according to any one of claims 1 to 7 when executing the executable instructions stored in the memory.

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