A method for testing the electrical performance of a halogen-free copper-clad laminate and an electronic device

Abstract

The present invention discloses a method and electronic equipment for testing the electrical properties of halogen-free copper-clad laminates, which relate to the field of electrical performance testing technology. The method comprises the following steps: obtaining a set of test samples from a target batch, cleaning the sample surface and fixing it on a tester platform, and placing a platinum electrode parallel to the surface; obtaining a set of historical tracking voltages through data mining, performing calibration separation voltage identification, and generating a calibration separation voltage sequence and an incremental step sequence; observing tracking and recording the tracking voltage through a droplet circulation test at an initial constant voltage; if tracking does not occur, gradually increasing the voltage according to the incremental step and calibration sequence and repeating the test until tracking occurs; finally, performing data screening on the tracking voltage set to obtain the target sample tracking voltage, which is used as the leakage tracking index of the target batch. The present invention solves the technical problem that the prior art cannot comprehensively evaluate the electrical properties of materials, and achieves the technical effect of efficient evaluation of the electrical properties of materials and reliability analysis.

Description

Technical Field

[0001] The present invention relates to the technical field of electrical performance testing, and in particular to an electrical performance testing method for a halogen-free copper clad laminate and electronic equipment. Background Art

[0002] Halogen-free copper-clad laminates (HCLs) are key materials in the manufacture of electronic circuit substrates. Their electrical insulation properties, particularly their resistance to tracking in high-voltage and high-humidity environments, are directly related to the reliability and service life of electronic products. With the rapid development of electronic products and the continued growth in demand for circuit substrates, HCLs, due to their environmentally friendly nature and excellent electrical performance, have gained widespread application in electronics manufacturing. However, with the increasing complexity of circuit designs and the diversification of operating environments, the electrical performance evaluation of HCLs, particularly their resistance to tracking, faces higher requirements.

[0003] Traditional methods for testing the electrical properties of halogen-free copper-clad laminates (CCLs) rely heavily on manual processes, such as sample cutting and cleaning, as well as manual monitoring under fixed test conditions. This results in low test efficiency and insufficient precision. Furthermore, these fixed test conditions fail to fully reflect the material's true performance under varying operating conditions, particularly its tracking resistance in complex environments. These issues make existing methods unable to meet the urgent demands of modern electronics manufacturing for efficient, accurate, and comprehensive testing. Summary of the Invention

[0004] The present application provides a method and electronic equipment for testing the electrical properties of a halogen-free copper clad laminate, which is used to solve the technical problem that the existing technology cannot comprehensively evaluate the electrical properties of the material.

[0005] In view of the above problems, the present application provides an electrical performance testing method and electronic equipment for a halogen-free copper clad laminate.

[0006] In a first aspect of the present application, a method for testing the electrical properties of a halogen-free copper clad laminate is provided, the method comprising:

[0007] Samples are cut from the target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; the test sample set is traversed to clean the surface, and the cleaned test sample set is fixed on the tester platform, and two platinum electrodes are placed parallel to the surface of each test sample in the test sample set; based on the design parameter information of the target batch of halogen-free copper clad laminates, the same type of tracking voltage data is mined to obtain a historical tracking voltage set; the historical tracking voltage set is calibrated for separation voltage identification, and the voltage increment step of each calibrated separation voltage is determined according to the identification result, to obtain a calibrated separation voltage sequence and a calibrated voltage increment step sequence; the AC power supply module is called to configure a preset initial constant voltage, and under the initial constant voltage, the voltage is used to generate a voltage signal. Use an automatic dripping device to perform a preset number of droplet circulation tests between two platinum electrodes placed on the surface of each test sample in the test sample set at a preset flow rate, and observe whether the test sample set is tracked. If so, record the sample tracking voltage set; if not, increase the initial constant voltage to the next level according to the preset voltage increment step until it is increased to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence. Repeat the dripping and observation at each increased voltage level. When the test sample set is tracked, record the sample tracking voltage set; perform aggregate data screening on the sample tracking voltage set to obtain the target sample tracking voltage, and use the target sample tracking voltage as the leakage tracking index of the target batch of halogen-free copper clad laminates.

[0008] The second aspect of the present application provides an electronic device, comprising: a memory for storing executable instructions; and a processor for implementing a method for testing the electrical properties of a halogen-free copper clad laminate provided in the present application when executing the executable instructions stored in the memory.

[0009] One or more technical solutions provided in this application have at least the following technical effects or advantages:

[0010] The present application cuts samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; traverses the test sample set to clean the surface, and fixes the cleaned test sample set on the tester platform, and places two platinum electrodes in parallel on the surface of each test sample in the test sample set; performs data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set; performs calibrated separation voltage identification on the historical tracking voltage set, and determines the voltage increment step of each calibrated separation voltage based on the identification result, to obtain a calibrated separation voltage sequence and a calibrated voltage increment step sequence; calls the AC power module to configure a preset initial constant voltage, and at the initial constant voltage , use an automatic dripping device to perform a preset number of droplet circulation tests between two platinum electrodes placed on the surface of each test sample in the test sample set at a preset flow rate, observe whether the test sample set is tracked, and if so, record the sample tracking voltage set; if not, increase the initial constant voltage to the next level according to the preset voltage increment step, until it is increased to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence, repeat the dripping and observation at each increased voltage, and record the sample tracking voltage set when the test sample set is tracked; perform aggregate data screening on the sample tracking voltage set to obtain the target sample tracking voltage, and use the target sample tracking voltage as the leakage tracking index of the target batch of halogen-free copper clad laminates. The present invention solves the technical problem that the existing technology cannot comprehensively evaluate the electrical properties of materials. Through methods such as sample cutting and cleaning, electrode placement, data mining, calibrated separation voltage identification and voltage increment testing, the tracking voltage of the target sample is accurately obtained. Combined with data screening and optimization, it is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, achieving the technical effect of efficient evaluation of the electrical properties of the material and reliability analysis. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0012] Figure 1 A schematic flow chart of a method for testing the electrical properties of a halogen-free copper clad laminate provided in an embodiment of the present application;

[0013] Figure 2 This is a schematic diagram of the structure of an exemplary electronic device of this application.

[0014] Description of reference numerals: bus 300 , receiver 301 , processor 302 , transmitter 303 , memory 304 , bus interface 305 . DETAILED DESCRIPTION

[0015] This application provides an electrical performance testing method and electronic equipment for halogen-free copper clad laminates, aiming to solve the technical problem that the existing technology cannot comprehensively evaluate the electrical performance of materials. Through methods such as sample cutting and cleaning, electrode placement, data mining, calibrated separation voltage identification and voltage increment testing, the tracking voltage of the target sample is accurately obtained. Combined with data screening and optimization, it is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, achieving the technical effect of efficient evaluation of the electrical performance of the material and reliability analysis.

[0016] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only some of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0017] It should be noted that any variations of the terms "include" and "have" are intended to cover non-exclusive inclusions. For example, a process, method, electronic device, product or server that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or modules that are not clearly listed or are inherent to these processes, methods, products or devices.

[0018] Example 1, as Figure 1 As shown, the present application provides a method for testing the electrical properties of a halogen-free copper clad laminate, the method comprising:

[0019] Step S100: cutting samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set.

[0020] In the examples of this application, the sample cutting method is first planned according to pre-defined rules based on the production information of the target batch. Pre-defined rules are standards set in advance based on the test requirements and board characteristics, including the sample cutting size, quantity, and location. These rules generally take into account representativeness and uniformity, for example, requiring samples to be cut from the center, edge, and transition areas of the board to ensure that any performance differences in different locations are covered.

[0021] According to pre-set rules, cutting equipment is used to cut samples from the target batch of halogen-free copper-clad laminates. During the cutting process, the specified sample size and shape are strictly adhered to, while ensuring that the cutting process does not damage the sample surface or internal structure. After cutting, each sample is uniquely labeled and its corresponding production time is recorded. By associating each sample with its production time, a production time set containing production time information is formed.

[0022] Finally, all the cut samples are aggregated to form a test sample set, which contains samples that meet the preset rules, are marked and have production time information.

[0023] Step S200: traverse the test sample set to clean the surface, fix the cleaned test sample set on the tester platform, and place two platinum electrodes in parallel on the surface of each test sample in the test sample set.

[0024] In the examples of this application, each sample in the test sample set was first surface cleaned individually. A solvent cleaning method was used, using a dust-free cloth soaked in anhydrous ethanol to carefully wipe the sample surface to remove dust, grease, and other organic contaminants that could affect the test. The cleaning process ensured that each sample had a consistent level of cleanliness. After cleaning, the samples were placed in a dust-free environment to air dry, ensuring that the sample surface was dry and free of residual impurities.

[0025] After cleaning, each sample is fixed to the tester platform one by one using vacuum adsorption. By creating a local vacuum area on the test platform surface, the sample is firmly adsorbed to the platform surface, ensuring that the sample does not move or deviate during the test.

[0026] Next, two platinum electrodes are placed parallel to the surface of each test sample. Mechanical guide rail positioning is used to position the electrodes, ensuring they are parallel to the sample surface and spaced uniformly apart. The platinum electrodes are made of high-purity platinum, which offers excellent conductivity and corrosion resistance, resisting the effects of droplets and long-term electric fields. To further ensure adequate contact between the electrodes and the sample surface, flexible metal clamps are installed at the bottom of the electrodes to compensate for any minor surface irregularities. After placement, the electrodes are inspected using a digital microscope to ensure they meet test requirements.

[0027] Through the above steps, the surface cleaning, fixation and electrode placement of the test sample are completed using the solvent cleaning method, vacuum adsorption fixation method and mechanical guide rail positioning method.

[0028] Step S300: performing data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set.

[0029] In this embodiment, design parameter information is first extracted from a target batch of halogen-free copper-clad laminates. Design parameters include halogen-free composition, sheet thickness, surface treatment, flame retardancy level, and production process conditions (such as temperature and pressure). These parameters are extracted from a process recording system (such as an MES system) or a production database.

[0030] Next, a multi-parameter search method was used to screen the historical database for CCL test records that met the design parameters of the target batch. The historical records in the database contain test data from multiple batches, each of which includes design parameters, test conditions, and tracking voltage results. By setting search criteria (such as the same halogen-free composition category, board thickness range, and flame retardancy level), irrelevant records were eliminated, retaining historical data that matched the characteristics of the target batch.

[0031] A fuzzy matching algorithm is then applied to the selected historical records to further optimize data selection. By constructing a multidimensional feature vector, the similarity between the target batch design parameters and the historical record design parameters is calculated, using, for example, cosine similarity or Euclidean distance to measure similarity. Only the records that are closest to the target batch parameters are retained.

[0032] For the historical records finally screened out, the tracking voltage data and the corresponding test condition information are extracted, including test temperature, humidity, electrode spacing, incremental rate, etc.

[0033] After extraction, data aggregation technology is used to group tracking voltage data from the same batch or under the same test conditions and store them in a standardized format to form a historical tracking voltage collection. The historical tracking voltage collection mainly includes tracking voltage values, test conditions, plate design parameters, data source, and batch information.

[0034] Step S400: performing calibration separation voltage identification on the historical tracking voltage set, and determining the voltage increment step of each calibration separation voltage according to the identification result, to obtain a calibration separation voltage sequence and a calibration voltage increment step sequence.

[0035] Furthermore, in the method provided in the embodiment of the application, the calibration separation voltage is identified for the historical tracking voltage set, and the voltage increment step of each calibration separation voltage is determined based on the identification result to obtain a calibration separation voltage sequence and a calibration voltage increment step sequence, and further includes:

[0036] The historical tracking voltage set is arranged in ascending order of voltage to obtain a historical tracking voltage sequence; the first historical tracking voltage at the first position in the historical tracking voltage sequence is extracted and used as the first calibrated separation voltage; based on the first calibrated separation voltage and a preset calibrated separation threshold, the calibrated separation voltage is identified on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence; according to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, the voltage increment step of each calibrated separation voltage is determined to obtain the calibrated voltage increment step sequence.

[0037] In this embodiment, all voltage data in the historical tracking voltage set are first arranged in ascending order to form a historical tracking voltage sequence, providing an ordered basic data structure. The first voltage value in the historical tracking voltage sequence is then extracted as the first calibration cutoff voltage. This initial cutoff point provides the starting point for subsequent segmentation processing.

[0038] Then, based on the first calibrated separation voltage and the preset calibrated separation threshold, the historical tracking voltage sequence is gradually identified by calibrated separation voltage. Specifically, the mean of the first calibrated separation voltage and the second historical tracking voltage in the sequence is first calculated, and the difference between this and the first calibrated separation voltage is calculated. If the difference is less than or equal to the preset calibrated separation threshold, the first calibrated separation voltage and subsequent voltage values are similarly calculated by mean and difference. When the difference exceeds the calibrated separation threshold, the current voltage value is used as the new calibrated separation voltage. This process is repeated until the entire historical tracking voltage sequence is traversed, and a set of clearly defined calibrated separation voltage sequences is finally obtained.

[0039] Next, based on the calibrated separation voltage sequence, the number of historical tracking voltages between each calibrated separation voltage and the next is calculated to form a historical tracking voltage sequence. By dividing each value in the historical tracking voltage sequence by the total number of voltages, a step importance coefficient sequence is obtained. This coefficient reflects the relative data density of each interval. Combining the voltage difference between each two adjacent calibrated separation voltages with the step importance coefficient, a voltage increment step analysis is performed to determine the voltage increment step for each interval, ultimately generating a calibrated voltage increment step sequence.

[0040] Furthermore, in the method provided in the embodiment of the application, based on the first calibrated separation voltage and the preset calibrated separation threshold, performing calibrated separation voltage identification on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence further includes:

[0041] Performing mean calculation on the first calibrated separation voltage and the second historical tracking voltage in the historical tracking voltage sequence, performing difference calculation between the calculation result and the first calibrated separation voltage, judging whether the difference calculation result is less than or equal to a preset calibrated separation threshold value, if not, taking the second historical tracking voltage as the second calibrated separation voltage; if so, performing mean calculation on the first calibrated separation voltage, the second historical tracking voltage and the third historical tracking voltage in the historical tracking voltage sequence, performing difference calculation between the calculation result and the first calibrated separation voltage, when the calculation result is greater than the preset calibrated separation threshold value, taking the third historical tracking voltage as the second calibrated separation voltage; and so on, performing calibrated separation voltage identification on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence.

[0042] In this embodiment, the first voltage value from the historical tracking voltage sequence is first extracted and determined as the first calibrated cutoff voltage. This first calibrated cutoff voltage serves as the initial reference point for subsequent voltage interval division. Based on this, the first calibrated cutoff voltage is averaged with the second historical tracking voltage in the historical tracking voltage sequence to obtain a preliminary interval center value. The difference between this average and the first calibrated cutoff voltage is then calculated to determine the continuity of the current voltage interval.

[0043] The difference is then compared to a preset calibrated separation threshold. If the difference is greater than the preset calibrated separation threshold, it is considered that the voltage variation between the first calibrated separation voltage and the second historical tracking voltage exceeds the allowable range, and the second historical tracking voltage is used as the second calibrated separation voltage to divide a new voltage interval.

[0044] If the difference is less than or equal to the preset calibration separation threshold, it is considered that the change in the current voltage interval is within a reasonable range, and the next voltage value in the sequence is processed. Specifically, the first calibration separation voltage, the second historical tracking voltage, and the third historical tracking voltage in the historical tracking voltage sequence are averaged, and the difference between the average and the first calibration separation voltage is calculated. If the difference calculation result at this time is greater than the preset calibration separation threshold, it is considered that the third historical tracking voltage marks the beginning of a new interval and is used as the second calibration separation voltage; if the difference calculation result is still less than or equal to the preset calibration separation threshold, the subsequent historical tracking voltages are judged in sequence according to the same calculation method until a voltage value that meets the threshold condition is found as the new calibration separation voltage.

[0045] Through the above recursive iteration method, all voltage values in the historical tracking voltage sequence are calculated and judged in sequence, and finally a set of calibrated separation voltages is formed. These calibrated separation voltages are arranged in the order of the historical tracking voltage sequence to form a complete calibrated separation voltage sequence.

[0046] Furthermore, in the method provided in the embodiment of the application, the voltage increment step of each calibrated separation voltage is determined based on the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, thereby obtaining the calibrated voltage increment step sequence, and further comprising:

[0047] The number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence is counted respectively to obtain a historical tracking voltage number sequence; each historical tracking voltage number sequence in the historical tracking voltage number sequence is divided by the sum of the historical tracking voltage number sequences to obtain a step importance coefficient sequence; and a voltage increment step analysis is performed according to the voltage difference between each calibrated separation voltage and the next calibrated separation voltage and the step importance coefficient of each calibrated separation voltage in the step importance coefficient sequence to obtain the calibrated voltage increment step sequence.

[0048] In this embodiment, the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence is first counted to form a historical tracking voltage sequence. This sequence reflects the historical data density within each voltage interval and is an important basis for calculating the voltage increment step size. For example, if there are a large number of historical tracking voltages between two calibrated separation voltages, it indicates that the data density in this interval is high, and a smaller increment step size is required to ensure test accuracy.

[0049] Next, the ratio of each historical tracking voltage in the historical tracking voltage sequence to the sum of the historical tracking voltage sequences is calculated to obtain a sequence of step importance coefficients. This step importance coefficient reflects the importance of each voltage interval relative to the entire sequence. A larger value indicates a higher data density in that interval, and therefore requires higher resolution for testing.

[0050] The incremental step size analysis is then performed based on the voltage difference. The voltage difference between each calibrated break voltage and the next calibrated break voltage is calculated based on the corresponding step size importance coefficient. Specifically, the incremental step size for that interval is calculated by subtracting the step size importance coefficient from 1 and multiplying it by the voltage difference. This method allows for larger incremental steps in intervals with larger voltage differences but lower step size importance coefficients, improving test efficiency. In contrast, for intervals with smaller voltage differences or higher step size importance coefficients, incremental steps are smaller to ensure test accuracy.

[0051] Finally, the calculation results are organized to form a calibration voltage increment step sequence, which corresponds one-to-one with the calibration separation voltage sequence, providing a clear increment rule for each voltage interval.

[0052] Step S500: Call the AC power supply module to configure a preset initial constant voltage. Under the initial constant voltage, use an automatic dripping device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set to observe whether the test sample set undergoes tracking. If so, record the sample tracking voltage set.

[0053] In the embodiment of the present application, the AC power module is first configured to preset an initial constant voltage. The AC power module is a precision, adjustable voltage source device that provides standardized voltage conditions for testing by setting an initial constant voltage. When configuring the voltage, the set value is entered using the module's digital control panel or computer interface. Typically, a relatively low and safe starting voltage (e.g., 100V or 200V) is selected based on the test standard to avoid premature damage to the sample. After configuration is complete, the module outputs a stable AC voltage to the test platform.

[0054] Then, under an initial constant voltage, an automatic dripping device is used to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set. The automatic dripping device achieves precise droplet distribution through a built-in micropump and control system. The preset flow rate is set by the control interface of the device, usually in milliliters per minute (for example, 1 mL / min), to ensure that the droplets are stable and continuous during the test. The liquid type is usually a standard test solution (such as ammonium chloride solution with a concentration of 0.1% to 0.5%). The droplets are evenly distributed between the platinum electrodes by the dropper head, and the number of droplet circulation tests is set according to the standard (for example, 10 times or 20 times) to simulate moisture and electric field effects between the electrodes.

[0055] During the test, the test sample assembly is observed for tracking. Tracking is monitored in real time using a microscope or high-resolution camera and manifests as localized ablation, carbonization, or structural damage on the material surface. If tracking occurs, the visual inspection system captures and marks the location of the tracking, while also recording the associated voltage parameters.

[0056] If tracking occurs on any sample within the test sample set, the sample tracking voltage set is immediately recorded. The tracking voltage is the critical voltage at which tracking occurs under specific test conditions. During recording, the AC power module outputs the current constant voltage value to the test recording system via a digital interface and automatically stores it in the sample tracking voltage set, forming a complete data record.

[0057] By calling the AC power supply module to provide a uniform voltage condition, using the automatic droplet device to accurately control the droplet circulation test, combined with tracking observation and data recording, the sample tracking voltage set is finally obtained.

[0058] Step S600: If not, increase the initial constant voltage to the next level according to the preset voltage increment step until it reaches the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence. Repeat the dripping and observation at each increased voltage level. When the test sample set is tracked, record the sample tracking voltage set.

[0059] In the embodiment of the present application, if the test sample set does not undergo tracking at the initial constant voltage, an increasing voltage test is performed according to the following steps until a sample tracking voltage set is obtained.

[0060] Specifically, the initial constant voltage is first increased to the next level according to a preset voltage increment. The preset voltage increment is a fixed increment set in advance according to the test standard, such as 5V or 10V, to ensure a gradual and stable voltage increase. The AC power module precisely adjusts the output voltage through digital control and displays the current voltage value in real time to ensure test accuracy. After each increment, the test sample set is retested.

[0061] When the voltage reaches the first position in the calibrated separation voltage sequence, the voltage is increased according to the calibrated voltage increment sequence. This calibrated voltage increment sequence is a dynamic increment rule preset for different voltage range characteristics. In densely populated data intervals, a smaller step size (e.g., 5V) improves test accuracy; in sparsely populated data intervals, a larger step size (e.g., 20V) improves test efficiency. The AC power module gradually increases the voltage according to the calibrated step size, providing precise voltage conditions for subsequent drip tests.

[0062] Repeat the dripping and observation at each increasing voltage level. An automated dripping device continuously and evenly drips the test liquid (e.g., ammonium chloride solution) between two platinum electrodes placed on each sample surface, at a preset flow rate and number of drips. During this drip cycle, the test sample collection is monitored for tracking. Tracking, a sign of material insulation failure, typically manifests as carbonization, ablation, or structural damage on the material surface. This is observed and recorded using a microscope or real-time image monitoring system.

[0063] When some samples in a test sample set experience tracking under increasing voltage conditions, the sample tracking voltage set is recorded. Tracking voltage is the critical voltage at which a sample experiences tracking and is an important indicator for evaluating a material's electrical properties. The tracking voltage value for each sample is automatically recorded and stored in the sample tracking voltage set.

[0064] Step S700: performing aggregated data screening on the sample tracking voltage set to obtain a target sample tracking voltage, and using the target sample tracking voltage as the leakage tracking index of the target batch of halogen-free copper clad laminates.

[0065] Furthermore, in the method provided in the embodiment of the application, the sample tracking voltage set is subjected to aggregated data screening to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the tracking index of the target batch of halogen-free copper clad laminates, further comprising:

[0066] Calculate the mean of the sample tracking voltage set to obtain the sample tracking voltage mean; use the sample tracking voltage mean as the screening center, perform aggregate data screening on the sample tracking voltage set according to a preset screening bandwidth, and obtain a target sample tracking voltage screening neighborhood; calculate the mean of the target sample tracking voltage screening neighborhood to obtain the target sample tracking voltage.

[0067] In the embodiment of the present application, all data in the sample tracking voltage set are first calculated using the mean statistical method, and the tracking voltage values of all samples in the set are added and divided by the total number of samples to obtain the sample tracking voltage mean.

[0068] Next, the sample tracking voltage set is aggregated and filtered using the mean sample tracking voltage as the screening center and a preset filtering bandwidth. Specifically, the mean sample tracking voltage is first centered, using a preset filtering bandwidth (e.g., 10V) as the screening radius. All tracking voltage values within the set are filtered to form an initial sample tracking voltage screening neighborhood. The initial screening neighborhood is then gradually expanded within the preset filtering bandwidth to form an expanded sample tracking voltage screening neighborhood. When expanding the neighborhood, the screening radius is increased by one filtering bandwidth unit (e.g., from 10V to 20V), and new data points are added to the neighborhood. After each expansion, the number of sample tracking voltages in the expanded neighborhood is counted and divided by the range of the expanded screening neighborhood (i.e., twice the screening radius) to calculate the cluster density of the expanded neighborhood. This cluster density calculation determines whether the newly added data is concentrated in the target area. If the cluster density of the expanded neighborhood is greater than or equal to that of the initial neighborhood, the expansion continues; otherwise, the expansion stops.

[0069] When the number of expansions reaches a preset limit (e.g., 3 expansions) or the clustering density of the expanded neighborhood is lower than that of the initial neighborhood, the expansion ends, and the expanded neighborhood at this time is the tracking voltage screening neighborhood of the target sample.

[0070] Next, the mean of all data in the tracking voltage screening neighborhood of the target sample is calculated, and the tracking voltage of the target sample is obtained using the same statistical method as the first step.

[0071] Finally, the tracking voltage of the target sample is used as the leakage tracking index of the target batch of halogen-free copper clad laminates to comprehensively evaluate the insulation performance of this batch of materials.

[0072] Furthermore, in the method provided in the embodiment of the application, the mean value of the sample tracking voltage is used as the screening center, and the set of sample tracking voltages is aggregated and screened according to a preset screening bandwidth to obtain a target sample tracking voltage screening neighborhood, further comprising:

[0073] An initial sample tracking voltage screening neighborhood is constructed with the mean of the sample tracking voltage as the screening center and a preset screening bandwidth as the screening radius; the neighborhood edge of the initial sample tracking voltage screening neighborhood is expanded according to the preset screening bandwidth to obtain an expanded sample tracking voltage screening neighborhood; it is determined whether the aggregation density of the expanded sample tracking voltage screening neighborhood is greater than or equal to the aggregation density of the initial sample tracking voltage screening neighborhood. If so, the neighborhood edge expansion of the expanded sample tracking voltage screening neighborhood continues according to the preset screening bandwidth until the preset number of expansions is met to obtain the target sample tracking voltage screening neighborhood.

[0074] In an embodiment of the present application, the mean value of the sample tracking voltage is first taken as the center, and a preset screening bandwidth (for example, 10V) is combined as the screening radius to screen all voltage values within the range of "mean value of the sample tracking voltage ± screening radius" in the sample tracking voltage set to form an initial sample tracking voltage screening neighborhood.

[0075] After constructing the initial neighborhood, the neighborhood edge of the initial sample tracking voltage screening neighborhood is expanded according to the preset screening bandwidth. Specifically, a preset screening bandwidth unit is added to the initial screening radius (for example, from 10V to 20V), and the data points in the sample tracking voltage set that meet the newly expanded range are re-screened. These new data points are then merged with the initial neighborhood data to form the expanded sample tracking voltage screening neighborhood.

[0076] After expansion, calculate the cluster density of the expanded tracking voltage screening neighborhood, which is the number of data points in the expanded neighborhood divided by the width of the screening range (twice the screening radius). Next, compare the cluster density of the expanded tracking voltage screening neighborhood with the cluster density of the initial neighborhood. If the cluster density of the expanded tracking voltage screening neighborhood is greater than or equal to that of the initial tracking voltage screening neighborhood, continue expanding the screening range by adding one more screening bandwidth unit and repeating the above steps. If the cluster density of the expanded tracking voltage screening neighborhood is less than that of the initial tracking voltage screening neighborhood, or if the number of expansions has reached a preset limit (e.g., three expansions), stop expanding.

[0077] After the expansion is completed, the final expanded neighborhood is the tracking voltage screening neighborhood of the target sample.

[0078] Furthermore, the method provided in the application embodiment also includes:

[0079] The number of sample tracking voltages within the expanded sample tracking voltage screening neighborhood is counted, and the statistical result is divided by twice the preset screening bandwidth to obtain the aggregation density of the expanded sample tracking voltage screening neighborhood.

[0080] In the present embodiment, to determine the cluster density of the expanded sample tracking voltage screening neighborhood, the number of sample tracking voltages within the expanded sample tracking voltage screening neighborhood is first counted. All sample tracking voltage data points within the expanded sample tracking voltage screening neighborhood are counted using a counting method to obtain the total number. The statistical result is then divided by twice the preset screening bandwidth to calculate and obtain the cluster density of the expanded sample tracking voltage screening neighborhood.

[0081] In the embodiments of the present application, in summary, the embodiments of the present application have at least the following technical effects:

[0082] The present application cuts samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; traverses the test sample set to clean the surface, and fixes the cleaned test sample set on the tester platform, and places two platinum electrodes in parallel on the surface of each test sample in the test sample set; performs data mining of the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set; performs calibrated separation voltage identification on the historical tracking voltage set, and determines the voltage increment step of each calibrated separation voltage based on the identification result, to obtain a calibrated separation voltage sequence and a calibrated voltage increment step sequence; calls the AC power module to configure a preset initial constant voltage, and at the initial constant voltage , use an automatic dripping device to perform a preset number of droplet circulation tests between two platinum electrodes placed on the surface of each test sample in the test sample set at a preset flow rate, observe whether the test sample set is tracked, and if so, record the sample tracking voltage set; if not, increase the initial constant voltage to the next level according to the preset voltage increment step, until it is increased to the first position of the calibrated separation voltage sequence, and then increase the voltage according to the calibrated voltage increment step sequence, repeat the dripping and observation at each increased voltage, and record the sample tracking voltage set when the test sample set is tracked; perform aggregate data screening on the sample tracking voltage set to obtain the target sample tracking voltage, and use the target sample tracking voltage as the leakage tracking index of the target batch of halogen-free copper clad laminates. The present invention solves the technical problem that the existing technology cannot comprehensively evaluate the electrical properties of materials. Through methods such as sample cutting and cleaning, electrode placement, data mining, calibrated separation voltage identification and voltage increment testing, the tracking voltage of the target sample is accurately obtained. Combined with data screening and optimization, it is used as the leakage tracking index of the target batch of halogen-free copper clad laminates, achieving the technical effect of efficient evaluation of the electrical properties of the material and reliability analysis.

[0083] Embodiment 2. Based on the inventive concept of a method for testing the electrical properties of a halogen-free copper clad laminate in the aforementioned embodiment, the present application also provides an electronic device, comprising: at least one processor; a memory communicatively connected to the at least one processor; wherein the memory stores instructions that can be executed by the at least one processor, and the instructions are executed by the at least one processor so that the at least one processor can perform the steps of any one of the methods described in the aforementioned embodiment 1.

[0084] Figure 2 This is a schematic diagram of the structure of an exemplary electronic device of this application. Figure 2 In the figure, the bus architecture is represented by bus 300, which can include any number of interconnected buses and bridges. Bus 300 connects various circuits including one or more processors represented by processor 302 and memory represented by memory 304. Bus 300 can also connect various other circuits such as peripheral devices, voltage regulators, and power management circuits, which are all well known in the art and therefore will not be described further herein. Bus interface 305 provides an interface between bus 300 and receiver 301 and transmitter 303. Receiver 301 and transmitter 303 can be the same component, namely a transceiver, which provides a unit for communicating with various other devices over a transmission medium. Processor 302 is responsible for managing bus 300 and general processing, while memory 304 can be used to store data used by processor 302 when performing operations.

[0085] It should be noted that the order in which the embodiments of the present application are presented is for illustrative purposes only and does not necessarily represent the superiority or inferiority of the embodiments. Furthermore, the foregoing descriptions of specific embodiments of this specification are provided. The processes depicted in the accompanying drawings do not necessarily require the specific order or sequential sequence shown to achieve the desired results. In certain embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0086] The above description is only a preferred embodiment of the present application and is not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application shall be included in the scope of protection of the present application.

[0087] This specification and drawings are merely illustrative of the present application and are intended to cover any and all modifications, variations, combinations, or equivalents within the scope of this application. Obviously, those skilled in the art may make various modifications and variations to this application without departing from the scope of this application. Thus, this application is intended to include such modifications and variations as fall within the scope of this application and its equivalents.

Claims

1. A method for testing the electrical properties of a halogen-free copper clad laminate, characterized in that: The method comprises: Cutting samples from a target batch of halogen-free copper clad laminates according to preset rules to obtain a test sample set, wherein the test sample set includes a production time set; Traversing the test sample set to clean the surface, fixing the cleaned test sample set on the tester platform, and placing two platinum electrodes in parallel on the surface of each test sample in the test sample set; Performing data mining on the same type of tracking voltage based on the design parameter information of the target batch of halogen-free copper clad laminates to obtain a historical tracking voltage set; Performing calibration separation voltage identification on the historical tracking voltage set, and determining a voltage increment step length of each calibration separation voltage according to the identification result, to obtain a calibration separation voltage sequence and a calibration voltage increment step length sequence; Invoke an AC power supply module to configure a preset initial constant voltage. Under the initial constant voltage, use an automatic droplet device to perform a preset number of droplet circulation tests at a preset flow rate between two platinum electrodes placed on the surface of each test sample in the test sample set to observe whether the test sample set undergoes tracking. If so, record the sample tracking voltage set. If not, the initial constant voltage is increased to the next level according to the preset voltage increment step until it reaches the first position of the calibrated separation voltage sequence, and the voltage is increased according to the calibrated voltage increment step sequence. The dripping and observation are repeated at each increased voltage level. When the test sample set is tracked, the sample tracking voltage set is recorded. Aggregate data screening is performed on the sample tracking voltage set to obtain a target sample tracking voltage, and the target sample tracking voltage is used as the leakage tracking index of the target batch of halogen-free copper clad laminates.

2. The electrical performance testing method of a halogen-free copper clad laminate according to claim 1, wherein: Performing calibration separation voltage identification on the historical tracking voltage set, and determining the voltage increment step of each calibration separation voltage according to the identification result, to obtain a calibration separation voltage sequence and a calibration voltage increment step sequence, including: Arranging the historical tracking voltage set in ascending order of voltage to obtain a historical tracking voltage sequence; Extracting a first historical tracking voltage at the top of the historical tracking voltage sequence and using it as a first calibration separation voltage; performing calibration separation voltage identification on the historical tracking voltage sequence based on the first calibration separation voltage and a preset calibration separation threshold value to obtain the calibration separation voltage sequence; The voltage increment step length of each calibrated separation voltage is determined according to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and the voltage difference between each calibrated separation voltage and the next calibrated separation voltage, thereby obtaining the calibrated voltage increment step length sequence.

3. The electrical performance testing method of a halogen-free copper clad laminate according to claim 2, wherein: Based on the first calibrated separation voltage and a preset calibrated separation threshold, performing calibrated separation voltage identification on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence, comprising: performing a mean calculation on the first calibrated separation voltage and a second historical tracking voltage in the historical tracking voltage sequence, performing a difference calculation between the calculated result and the first calibrated separation voltage, determining whether the difference calculation result is less than or equal to a preset calibrated separation threshold, and if not, using the second historical tracking voltage as the second calibrated separation voltage; If so, calculating the mean of the first calibrated separation voltage, the second historical tracking voltage, and the third historical tracking voltage in the historical tracking voltage sequence, and performing a difference calculation between the calculated result and the first calibrated separation voltage; when the calculated result is greater than a preset calibrated separation threshold, using the third historical tracking voltage as the second calibrated separation voltage; By analogy, the calibrated separation voltage is identified on the historical tracking voltage sequence to obtain the calibrated separation voltage sequence.

4. The electrical performance testing method of a halogen-free copper clad laminate according to claim 3, wherein: Determining a voltage increment step of each calibrated separation voltage according to the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence and a voltage difference between each calibrated separation voltage and the next calibrated separation voltage, and obtaining the calibrated voltage increment step sequence, comprising: Counting the number of historical tracking voltages between each calibrated separation voltage and the next calibrated separation voltage in the calibrated separation voltage sequence to obtain a historical tracking voltage number sequence; Comparing each historical tracking voltage quantity sequence in the historical tracking voltage quantity sequence with the sum of the historical tracking voltage quantity sequences to obtain a step importance coefficient sequence; The voltage increment step length sequence is obtained by performing voltage increment step length analysis based on the voltage difference between each calibrated separation voltage and the next calibrated separation voltage and the step importance coefficient of each calibrated separation voltage in the step importance coefficient sequence.

5. The electrical performance testing method of a halogen-free copper clad laminate according to claim 1, wherein: Performing aggregate data screening on the sample tracking voltage set to obtain a target sample tracking voltage, and using the target sample tracking voltage as the tracking index of the target batch of halogen-free copper clad laminates, including: Calculating the mean of the tracking voltage set of the samples to obtain the mean tracking voltage of the samples; Taking the mean tracking voltage of the samples as the screening center, performing aggregate data screening on the tracking voltage set of the samples according to a preset screening bandwidth to obtain a screening neighborhood of the tracking voltage of the target samples; The mean of the tracking voltage screening neighborhood of the target sample is calculated to obtain the tracking voltage of the target sample.

6. The electrical performance testing method of a halogen-free copper clad laminate according to claim 5, wherein: Taking the mean of the sample tracking voltage as the screening center, the sample tracking voltage set is aggregated and screened according to a preset screening bandwidth to obtain a target sample tracking voltage screening neighborhood, including: Taking the mean tracking voltage of the samples as the screening center and the preset screening bandwidth as the screening radius, an initial sample tracking voltage screening neighborhood is constructed; Expanding the neighborhood edge of the initial sample tracking voltage screening neighborhood according to a preset screening bandwidth to obtain an expanded sample tracking voltage screening neighborhood; Determine whether the aggregation density of the expanded sample tracking voltage screening neighborhood is greater than or equal to the aggregation density of the initial sample tracking voltage screening neighborhood. If so, continue to expand the neighborhood edge of the expanded sample tracking voltage screening neighborhood according to the preset screening bandwidth until the preset number of expansions is met to obtain the target sample tracking voltage screening neighborhood.

7. The electrical performance testing method of a halogen-free copper clad laminate according to claim 6, wherein: The number of sample tracking voltages within the expanded sample tracking voltage screening neighborhood is counted, and the statistical result is divided by twice the preset screening bandwidth to obtain the aggregation density of the expanded sample tracking voltage screening neighborhood.

8. An electronic device, characterized in that: The electronic device comprises: a memory for storing executable instructions; The processor is configured to implement the electrical performance testing method for a halogen-free copper clad laminate according to any one of claims 1 to 7 when executing the executable instructions stored in the memory.

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