Discrete device test system resource adaptive extension device and method

Abstract

The invention belongs to the field of discrete device testing, and particularly discloses a discrete device testing system resource self-adaptive extension device and method. According to the application, the number of channel gating is set according to the tested device, so that the test system resource is matched with the circuit of the tested device; the gating state of the test channel and the resource switching sequence are judged by controlling the switching unit, and the switching unit is linked with the test system to automatically switch the channel, so that the time division multiplexing of the resources of the discrete device test system is realized; and then the test system resources are connected to the pins of the tested device in a customized manner through the resource expansion interface, so that the resource expansion of the discrete device test system can be realized. The method has a good application prospect under the problems of insufficient discrete device test system resources and low test efficiency. Experiments do not need to frequently replace testing system programs and clamps, and testing system resources are effectively expanded.

Description

Technical Field

[0001] The present application belongs to the field of discrete device testing, and more specifically, to a discrete device testing system resource adaptive expansion device and method. Background Art

[0002] Discrete devices refer to devices that are manufactured on semiconductor materials and have a single electronic function. They work based on the movement of carriers (electrons and holes) in semiconductor materials and use the interface characteristics between P-type and N-type regions to achieve current control. They can be divided into many types according to different working characteristics and application requirements, the most common of which include diodes, transistors, field effect transistors and bipolar transistors.

[0003] The existing discrete device test requires the device under test to be connected to the test system through a test fixture. The experimenter installs the device under test on the test fixture, connects the test fixture to the test system, and connects the test resources of the machine to the pins of the device under test. The test resources of the machine include but are not limited to power boards, digital boards, and analog boards. Write a test program on the test system and set the judgment conditions for the device to pass the test. After the test starts, the experimenter manually clicks a button to trigger the test process and records the test results. After the test is completed, replace the test fixture and reconnect the test system for testing to complete the test of the discrete device.

[0004] The above method is a common method in the industry and is universal, but the discrete device test system is expensive and resources are scarce. There are many types of test fixtures used in the testing process, and it takes a long time to replace the fixtures. In addition, the manual triggering of the test process is inefficient and is not suitable for the current situation of large-scale and rapid discrete device testing. Summary of the invention

[0005] In view of the defects of the prior art, the purpose of this application is to provide a discrete device test system resource adaptive expansion device and method, aiming to solve the problems of insufficient resources in the existing discrete device test system, expensive test system, slow manual testing speed, low test efficiency, and unsuitability for rapid and large-scale discrete device testing.

[0006] The first aspect of the present application relates to a resource adaptive expansion device for a discrete device test system, comprising: a resource input interface, which is used to connect one by one with the output pins of the test system to receive the test resources of the test system; a channel selection unit, which is used to select one or several channels according to test needs, and the other channels remain closed; a control switching unit, whose input end is connected to the resource input interface and the channel selection unit, and whose output end is connected to the resource expansion interface, and is used to obtain the channel selection state from the channel selection unit, and switch the test resources to the selected channel in a time-sharing manner according to the channel selection state and the channel switching sequence; and a resource expansion interface, which is used to connect the pins of the discrete device to be tested to establish a connection between the test system and the selected channel of the discrete device to be tested.

[0007] In some implementations, the control switching unit uses a programmable logic circuit as a main control circuit, and works in conjunction with a test system to achieve automatic switching of test channels.

[0008] In some implementations, after the test system completes the test of the current channel, it sends an identification signal to the main control circuit through the resource input interface to achieve linkage.

[0009] In some implementations, the channel selection unit is composed of a plurality of dip switches, and each dip switch corresponds to a test channel.

[0010] In some implementations, the resource expansion interface is composed of a plurality of groups of pin headers, each group of pin headers corresponds to a test channel, and the number of pins in each group of pin headers is the same as the number of output pins of the test system.

[0011] In some implementations, the discrete device to be tested is connected to the resource expansion interface via a locking socket and / or pin insertion pins.

[0012] A second aspect of the present application relates to an expansion method based on a discrete device test system resource adaptive expansion device, comprising: After the resource input interface of the resource adaptive expansion device is connected to the test system and the resource expansion interface is connected to each pin of the discrete device to be tested, the gating state of the channel selection unit is set according to the test requirements of the discrete device to be tested; According to the channel selection status and channel switching sequence, the test resources are switched to the selected channel in a time-sharing manner.

[0013] In general, the above technical solutions conceived by this application have the following beneficial effects compared with the prior art: The present application proposes a discrete device test system resource adaptive expansion device and method, which sets the number of channel gating according to the device under test, so that the test system resources match the circuit of the device under test; then determines the gating state of the test channel and the order of resource switching by controlling the switching unit, and automatically switches channels with the test system to achieve time-sharing multiplexing of discrete device test system resources; then customizes the test system resources to the pins of the device under test through the resource expansion interface, so as to achieve resource expansion of the discrete device test system. The present invention has good application prospects under the problems of insufficient resources and low test efficiency of discrete device test systems. It does not require experimenters to frequently change test system programs and fixtures, and effectively expands test system resources. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the structure of a discrete device test system resource adaptive expansion device provided in an embodiment of the present application.

[0015] Figure 2 It is a schematic diagram of a panel provided in an embodiment of the present application. DETAILED DESCRIPTION

[0016] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0017] The embodiments of the present application are described below in conjunction with the drawings in the embodiments of the present application.

[0018] First, as Figure 1 As shown, the present application discloses a discrete device test system resource adaptive expansion device, including: a resource input interface, which is used to connect to the output pins of the test system one by one to receive the test resources of the test system; a channel selection unit, which is used to select one or several channels according to the test needs, and the other channels remain closed; a control switching unit, the input end of which is connected to the resource input interface and the channel selection unit, and the output end is connected to the resource expansion interface, which is used to obtain the channel selection state from the channel selection unit, and according to the channel selection state and the channel switching sequence, the test resources are switched to the selected channel in a time-sharing manner; the resource expansion interface is used to connect the pins of the discrete device to be tested to establish a connection between the test system and the selected channel of the discrete device to be tested.

[0019] In some implementations, the control switching unit uses a programmable logic circuit as a main control circuit, and is linked with a test system to achieve automatic switching of test channels, thereby simplifying the operation of the experimenter.

[0020] Preferably, the programmable logic circuit controls the switching unit, and the state of the switching unit is different at different times, which can be compared to a switch, which is turned on when needed and closed when not needed, thereby realizing time-division multiplexing between different channels.

[0021] In some implementations, after the test system completes the test of the current channel, it sends an identification signal to the main control circuit through the resource input interface to achieve linkage.

[0022] In some implementations, the channel selection unit is composed of a plurality of dip switches, and each dip switch corresponds to a test channel.

[0023] In some implementations, the resource expansion interface is composed of a plurality of groups of pin headers, each group of pin headers corresponds to a test channel, and the number of pins in each group of pin headers is the same as the number of output pins of the test system.

[0024] Preferably, the resource extension interface can customize the connection mode and connection interface according to the type of device under test, is applicable to different types of discrete devices, and meets the testing requirements of various types of discrete devices.

[0025] In some implementations, the discrete device to be tested is connected to the resource expansion interface via a locking socket and / or pin insertion pins.

[0026] Preferably, if Figure 2 As shown, the channel labels CH1, CH2...CH6 on both sides include a display function. After the channel is selected, the label lights up to reflect the channel selection status and the order of resource switching.

[0027] In a second aspect, the present application discloses an expansion method based on a discrete device test system resource adaptive expansion device, comprising: After the resource input interface of the resource adaptive expansion device is connected to the test system and the resource expansion interface is connected to each pin of the discrete device to be tested, the gating state of the channel selection unit is set according to the test requirements of the discrete device to be tested; According to the channel selection status and channel switching sequence, the test resources are switched to the selected channel in a time-sharing manner.

[0028] Example In this embodiment, the device to be tested is a four-channel optocoupler. At present, the measurement process requires manual connection of the machine resources to the first channel for testing. After the first channel test is completed, the resources are manually connected to the second channel, and so on to complete the test of the four channels. Using the device of the present application, the manual switching operation can be realized by the circuit. Before the test starts, the channel selection unit is selected for four channels, and the device automatically completes the four-channel resource switching operation, completing the four-channel test process at one time.

[0029] It should be understood that the above-mentioned device is used to execute the method in the above-mentioned embodiment. The implementation principle and technical effect of the corresponding program module in the device are similar to those described in the above-mentioned method. The working process of the device can refer to the corresponding process in the above-mentioned method, which will not be repeated here.

[0030] Based on the method in the above embodiment, an embodiment of the present application provides a computer-readable storage medium, which stores a computer program. When the computer program runs on a processor, the processor executes the method in the above embodiment.

[0031] Based on the method in the above embodiment, an embodiment of the present application provides a computer program product. When the computer program product runs on a processor, the processor executes the method in the above embodiment.

[0032] It is understandable that the processor in the embodiment of the present application may be a central processing unit (CPU), or other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field programmable gate arrays (FPGA) or other programmable logic devices, transistor logic devices, hardware components or any combination thereof. The general-purpose processor may be a microprocessor or any conventional processor.

[0033] The method steps in the embodiments of the present application can be implemented by hardware or by a processor executing software instructions. The software instructions can be composed of corresponding software modules, and the software modules can be stored in random access memory (RAM), flash memory, read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), registers, hard disks, mobile hard disks, CD-ROMs, or any other form of storage medium known in the art. An exemplary storage medium is coupled to the processor so that the processor can read information from the storage medium and write information to the storage medium. Of course, the storage medium can also be a component of the processor. The processor and the storage medium can be located in an ASIC.

[0034] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented by software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, the process or function described in the embodiment of the present application is generated in whole or in part. The computer may be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions may be stored in a computer-readable storage medium or transmitted through the computer-readable storage medium. The computer instructions may be transmitted from a website site, computer, server or data center to another website site, computer, server or data center by wired (e.g., coaxial cable, optical fiber, digital subscriber line (DSL)) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium may be any available medium that a computer can access or a data storage device such as a server or data center that includes one or more available media integrated. The available medium may be a magnetic medium (e.g., a floppy disk, a hard disk, a tape), an optical medium (e.g., a DVD), or a semiconductor medium (e.g., a solid-state drive (SSD)), etc.

[0035] The term "and / or" in this application is a description of the association relationship of associated objects, indicating that there can be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. The symbol " / " in this application indicates that the associated objects are in an or relationship, for example, A / B means A or B.

[0036] The terms "first" and "second" in the specification and claims of this application are used to distinguish different objects rather than to describe a specific order of objects. For example, a first response message and a second response message are used to distinguish different response messages rather than to describe a specific order of response messages.

[0037] In the embodiments of the present application, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of the present application should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0038] In the description of the embodiments of the present application, unless otherwise specified, "multiple" means two or more than two. For example, multiple processing units refer to two or more processing units, etc.; multiple elements refer to two or more elements, etc.

[0039] Expressions such as "include" and "may include" used in this application indicate the existence of the disclosed functions, operations or constituent elements, and do not limit one or more additional functions, operations and constituent elements. In this application, terms such as "include" and / or "have" may be interpreted as indicating specific characteristics, numbers, operations, constituent elements, components or combinations thereof, but may not be interpreted as excluding the existence or possibility of adding one or more other characteristics, numbers, operations, constituent elements, components or combinations thereof.

[0040] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art who is familiar with the present technical field can easily think of changes or substitutions within the technical scope disclosed in the present application, which should be included in the protection scope of the present application. Therefore, the protection scope of the present application should be based on the protection scope of the claims.

Claims

1. A discrete device test system resource adaptive expansion device, characterized in that: include: A resource input interface, used to connect one by one with the output pins of the test system to receive the test resources of the test system; The channel selection unit is used to select one or several channels according to the test needs, and the other channels remain closed; A control switching unit, the input end of which is connected to the resource input interface and the channel selection unit, and the output end of which is connected to the resource expansion interface, is used to obtain the channel gating state from the channel selection unit, and according to the channel gating state and the channel switching sequence, the test resource is switched to the selected channel in a time-sharing manner; The resource expansion interface is used to connect the pins of the discrete device to be tested to establish a connection between the test system and the selected channel of the discrete device to be tested.

2. The resource adaptive expansion device according to claim 1, characterized in that: The control switching unit uses a programmable logic circuit as a main control circuit, and is linked with the test system to realize automatic switching of the test channels.

3. The resource adaptive expansion device according to claim 2, characterized in that: After the test system completes the test of the current channel, it sends an identification signal to the main control circuit through the resource input interface to achieve linkage.

4. The resource adaptive expansion device according to claim 1, characterized in that: The channel selection unit is composed of a plurality of dip switches, and each dip switch corresponds to a test channel.

5. The resource adaptive expansion device according to claim 1, characterized in that: The resource expansion interface is composed of multiple groups of pin headers, each group of pin headers corresponds to a test channel, and the number of pins in each group of pin headers is the same as the number of output pins of the test system.

6. The resource adaptive expansion device according to claim 5, characterized in that: The discrete device to be tested is connected to the resource expansion interface through a locking seat and / or pin plugs.

7. An expansion method based on the discrete device test system resource adaptive expansion device according to any one of claims 1 to 6, characterized in that: include: After the resource input interface of the resource adaptive expansion device is connected to the test system and the resource expansion interface is connected to each pin of the discrete device to be tested, the gating state of the channel selection unit is set according to the test requirements of the discrete device to be tested; According to the channel selection status and channel switching sequence, the test resources are switched to the selected channel in a time-sharing manner.

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