Test method, device and equipment based on HAPS and storage medium

Abstract

The invention relates to a test method, device and equipment based on HAPS and a storage medium, and relates to the technical field of automatic testing, and the technical scheme of the application can test a test system of a chip before chip tape-out. According to the technical scheme, after a tester inputs the to-be-configured information, the to-be-configured information is combined into the mirror image system operating the HAPS to generate the to-be-tested system, the preset test data can be operated in the to-be-tested system, the to-be-tested system can be judged according to the test result, and the test efficiency is improved. According to the method, the mirror image system under the to-be-configured information can be quickly judged, each piece of to-be-configured information of the test system can be quickly verified, accurate test on the test system before tape-out is ensured when the problem of the test system is quickly found, the possibility of finding the abnormity of the test system after tape-out is reduced, and the test efficiency is improved. The number of times of reproducing the tape-out sheet is reduced, the design cost is reduced, the testing speed is increased, and the testing efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of automated testing technology, and in particular to a HAPS-based testing method, device, equipment, storage medium and chip. Background Art

[0002] In the process of FPGA (Field Programmable Gate Arrays) chip design, in order to ensure the normal operation of the chip, it is necessary to test the chip test system, including IP (Intellectual Property), driver or system function, etc. before testing the chip on the tape-out. In the prior art, this test process is often carried out after the UDP (Usual Develop Platform) board is configured, which is close to the chip tape-out process. It is very easy to have the problem of tight simulation platform resources, so that the test system is not fully verified, which makes it easy to have problems when testing the chip prototype later, causing greater losses of manpower and material resources. Summary of the invention

[0003] In view of this, the present application provides a HAPS-based testing method, apparatus, device and storage medium, the main purpose of which is to solve the problem that the testing of the chip prototype test system is often not fully implemented, which will increase the technical problem of design costs.

[0004] In a first aspect, the present application provides a HAPS-based testing method, comprising:

[0005] In response to a signal for acquiring information to be configured, acquiring a mirror system corresponding to the HAPS, wherein the HAPS is a prototype verification board based on FPGA;

[0006] Compiling the information to be configured to generate information to be tested, and generating a system to be tested in the mirror system according to the information to be tested;

[0007] Loading the system to be tested in the HAPS;

[0008] The preset test data is run in the HAPS to obtain the test result.

[0009] Optionally, before loading the system to be tested in the HAPS, the method further includes:

[0010] Using a loading tool to load the system to be tested in the HAPS, and obtaining a loading result during the loading process;

[0011] Verifying whether the system to be tested is valid according to the loading result;

[0012] The step of loading the system to be tested in the HAPS includes:

[0013] The valid system to be tested is loaded into the HAPS.

[0014] Optionally, after verifying the validity of the system to be tested according to the loading result, the method further includes:

[0015] If according to the loading result, it is verified that the system to be tested is invalid;

[0016] Output the display information that the information to be configured is abnormal.

[0017] Optionally, before acquiring the mirror system corresponding to the HAPS in response to the acquisition signal of the information to be configured, the method further includes:

[0018] Determining a target communication port of the HPAS;

[0019] Selecting a working domain for adapting the mirroring system in the HAPS;

[0020] Opening an operation channel in the HAPS to support transmission of the mirror system;

[0021] Using the target communication port, the working domain, and the operating channel as configuration information of the HAPS;

[0022] Verify the preparation information of the configuration information of the HAPS;

[0023] The acquiring of the mirror system corresponding to the HAPS in response to the acquisition signal of the information to be configured includes:

[0024] When the preparation information indicates that all preparations are completed, in response to a signal for obtaining information to be configured, the mirror system corresponding to the HAPS is obtained.

[0025] Optionally, in response to a signal for acquiring information to be configured, acquiring a mirror system corresponding to the HAPS includes:

[0026] In response to a signal for acquiring information to be configured generated by conversion of the communication adapter card, a mirror system corresponding to the HAPS is acquired.

[0027] Optionally, running preset test data in the HAPS to obtain test results includes:

[0028] The control instructions converted by the communication instruction card are used to run the preset test data in the HAPS to obtain the test results.

[0029] Optionally, running preset test data in the HAPS to obtain test results includes:

[0030] Controlling the HAPS to run preset test data one by one;

[0031] Obtaining test results of the preset test data one by one;

[0032] Identify a test item corresponding to an abnormal test result, wherein the test item is one or more of the preset test data;

[0033] The test items are displayed.

[0034] In a second aspect, the present application provides a HAPS-based testing device, comprising:

[0035] An acquisition module, configured to acquire a mirror system corresponding to the HAPS in response to an acquisition signal of information to be configured, wherein the HAPS is a prototype verification board based on FPGA;

[0036] A generating module, used for compiling the information to be configured, generating information to be tested, and generating a system to be tested in the mirror system according to the information to be tested;

[0037] A loading module, used for loading the system to be tested in the HAPS;

[0038] The test module is used to run preset test data in the HAPS and obtain test results.

[0039] In a third aspect, the present application provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the HAPS-based testing method described in the first aspect.

[0040] In a fourth aspect, the present application provides an electronic device, including a storage medium, a processor, and a computer program stored on the storage medium and executable on the processor, wherein the processor implements the HAPS-based testing method described in the first aspect when executing the computer program.

[0041] By means of the above technical solution, the present application provides a test method, device, equipment and storage medium based on HAPS, which can solve the problem that the current test system for chips has a large number of test items and the test resources are relatively tight, making it difficult to fully test the test system. The technical solution of the present application can test the test system of the chip before the chip is taped out. Specifically, first respond to the acquisition signal of the information to be configured, obtain the mirror system corresponding to HAPS, which is a prototype verification board based on FPGA; then compile the information to be configured, generate the information to be tested, and generate the system to be tested in the mirror system according to the information to be tested; then load the system to be tested in HAPS; finally, run the preset test data in HAPS to obtain the test results. By adopting the technical solution of the present application, after the tester inputs the information to be configured, the information to be configured can be combined with the mirror system operating HAPS to generate a system to be tested. The preset test data can be run in the system to be tested, and the system to be tested can be judged according to the test results. The mirror system under the configuration information can be quickly judged, and each information to be configured of the test system can be quickly verified. When the problem of the test system is quickly discovered, the accurate testing of the test system before tape-out is guaranteed, the possibility of discovering abnormalities in the test system after tape-out is reduced, the number of re-production of tape-out is reduced, and the design cost is reduced while speeding up the test speed and improving the test efficiency.

[0042] The above description is only an overview of the technical solution of the present application. In order to more clearly understand the technical means of the present application, it can be implemented in accordance with the contents of the specification. In order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0044] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0045] Figure 1 A flow chart of a HAPS-based testing method provided in an embodiment of the present application is shown;

[0046] Figure 2 A control flow chart of a HAPS-based testing method provided in an embodiment of the present application is shown;

[0047] Figure 3 A schematic structural diagram of a HAPS-based testing device provided in an embodiment of the present application is shown. DETAILED DESCRIPTION

[0048] The embodiments of the present application will be described in more detail below with reference to the accompanying drawings. It should be noted that the embodiments and features in the embodiments of the present application can be combined with each other without conflict.

[0049] The test method proposed in the technical content of this embodiment is applied to the test process of the test system, and the test system is used for subsequent automated rapid testing of the tape-out. Tape-out refers to a chip specially produced for trial production and testing before the chip design is completed. In the process of testing the tape-out, in order to ensure the accuracy of the tape-out test results, the test system needs to be tested in advance before the tape-out test is performed. However, because the scale of the test system is relatively large and its test process is relatively cumbersome, and because the hardware resources of the simulation platform are occupied during the test process, it is often impossible to fully test the test system during the test process of the test system, which may cause the possibility of errors in the subsequent tape-out test.

[0050] In order to improve the test efficiency of the test system used to test the tape-out and reduce the probability of errors in subsequent tape-out testing. This embodiment provides a test method based on HAPS, such as Figure 1 As shown, it can be applied to the end side of a data processing device (such as a smart phone, a tablet computer, a drone, a smart robot, and other smart terminals), and the method includes:

[0051] Step 101, in response to a signal for acquiring information to be configured, acquiring a mirror system corresponding to HAPS, where HAPS is a prototype verification board based on FPGA.

[0052] In order to achieve accurate testing of the test system, the content of this embodiment proposes that during the testing process of the test system, the HAPS prototype verification board based on FPGA is relied on to control the HAPS through the PC end. Specifically, the control is to run the control system corresponding to the HAPS in the PC end, so as to achieve control of the HAPS. In the process of testing different components of the HAPS, in order to improve the test efficiency, a mirror system is used to control the HAPS. The mirror system is a mirror system that can accurately control the HAPS. At the same time, the information to be configured is the modification information submitted by the user independently, which can realize the modification of the mirror system to realize the testing of the modified mirror system, so as to verify the accuracy of the test system for different test environments.

[0053] Step 102 , compile the information to be configured to generate information to be tested, and generate a system to be tested in the mirror system according to the information to be tested.

[0054] After obtaining the information to be configured, in order to realize the modification of the mirror system by the information to be configured, the content of this embodiment further proposes to compile the information to be configured. The information to be configured can be in the form of user modification instructions, instruction codes, etc. When the instruction channel recognizes the appearance of the instruction, this embodiment proposes to compile the information to be configured used to represent the instruction, so that the compiled information to be configured can be combined with the mirror system, and the combination with the mirror system is realized to generate the system to be tested. Exemplarily, the compilation method for compiling the information to be configured proposed in this embodiment can be Jenkins compilation, and after the Jenkins compilation of the information to be configured is realized, it is updated to the mirror system to generate the system to be tested. At the same time, the tool for loading the compiled information to be tested into the mirror system can be Synaptics' confprosh tool.

[0055] Step 103: Load the system to be tested in HAPS.

[0056] After the information to be configured is compiled into the mirror system and the system to be tested is generated, the present embodiment proposes loading the system to be tested into HAPS to achieve coordinated operation between the PC and HAPS.

[0057] Step 104: Run the preset test data in HAPS to obtain the test results.

[0058] In the content of this embodiment, in order to implement the test of the system to be tested, the content of this embodiment includes preset test data for verifying the accuracy of the mirror system under different configuration information and obtaining test results, and obtaining the test results of the mirror system based on the test results.

[0059] In the above embodiments, a HAPS-based testing method is proposed. Through the cooperation test between PC and HAPS, the configuration information compiled and generated according to the user's suggestion to modify is combined with the mirror system to generate a system to be tested. The system to be tested is tested in an environment where the PC and HAPS are combined to implement the test of the mirror system under the user's configuration information, and the corresponding test results are output based on the data to be tested. At the same time, the remote connection between the PC and HAPS can realize the rapid verification of the system to be tested based on the HAPS platform according to the configuration information input by the user based on the PC, and realize the rapid testing of the configuration information input by the user, thereby improving the test efficiency.

[0060] In a possible embodiment, before loading the system to be tested in the HAPS, the method further includes:

[0061] Use the loading tool to load the system to be tested in HAPS and obtain the loading results during the loading process; verify whether the system to be tested is valid based on the loading results;

[0062] Load the system to be tested in HAPS, including:

[0063] Load a valid system under test in HAPS.

[0064] In the technical solution of this embodiment, for the loading of the system to be tested on HAPS, the technical content of this embodiment further includes a specific method for loading. When realizing the loading of the system to be tested on HAPS, it is necessary to first control HAPS to enter the download mode. Secondly, a specific loading tool is required to realize the loading function. Specifically, in the content of this embodiment, the loading tool can be XR-Download, which realizes the loading of the system to be tested in HAPS. More specifically, before the loading process, it also includes a process of verifying the system to be tested, that is, confirming whether the system to be tested is valid. Specifically, the verification process can be achieved through the above-mentioned loading tool. By judging whether the system to be tested is successfully loaded on HAPS through the loading tool, it is confirmed whether the configuration information submitted by the user is valid, thereby ensuring the validity of the system to be tested, and further realizing the accuracy of the verification tape-out.

[0065] In a possible embodiment, after verifying the validity of the system to be tested according to the loading result, the method further includes:

[0066] If the verification of the system to be tested is invalid according to the loading results;

[0067] Outputs information about abnormal configuration information.

[0068] In the previous embodiment, when verifying the validity of the test system through a loading tool or other means, if it is confirmed that the system to be tested is invalid, the loading of the system to be tested to HAPS is stopped. The configuration information input by the user is incorrect. Before the configuration information is updated, the loading of the system to be tested to HAPS is prohibited.

[0069] In the content of this embodiment, in response to the possible situation that the information to be configured input by the user is incorrect, the content of this embodiment further proposes a step of verifying the system to be tested based on the loading results, and confirms the incorrect situation of the information to be configured input by the user based on the verification results, thereby improving the accuracy of the testing process of the test system.

[0070] In a possible embodiment, before acquiring the mirror system corresponding to the HAPS in response to the acquisition signal of the information to be configured, the method further includes:

[0071] Determine the target communication port of HPAS; select the working domain that adapts the mirror system in HAPS; open an operation channel in HAPS to support the transmission of the mirror system; use the target communication port, working domain and operation channel as the configuration information of HAPS; verify the preparation information of the configuration information of HAPS;

[0072] In response to a signal for obtaining information to be configured, obtaining a mirror system corresponding to the HAPS includes:

[0073] When the preparation information indicates that all preparations are completed, in response to a signal for obtaining information to be configured, the mirror system corresponding to the HAPS is obtained.

[0074] In a possible embodiment, before implementing the HAPS-based test method, this embodiment further proposes relevant steps for describing the preparation information. The preparation information described in this embodiment includes: target communication port, working domain and operation channel, wherein the target communication port is the port for HAPS to communicate with the PC, the working domain is the working domain for HAPS to store and run the system to be tested, and the operation channel is the communication channel for HAPS to obtain the system to be tested from the PC, corresponding to the target communication port. The above preparation information is configured between HAPS and the PC to ensure the normal operation of the method embodiment.

[0075] In a possible embodiment, in response to a signal for acquiring information to be configured, acquiring a mirror system corresponding to the HAPS includes:

[0076] In response to an acquisition signal of information to be configured generated by conversion of the communication adapter card, a mirror system corresponding to the HAPS is acquired.

[0077] In the content of this embodiment, in order to achieve normal communication with HAPS, this embodiment proposes to use a communication conversion card to realize the transmission of the system to be tested and other commands to HAPS. Exemplarily, the communication conversion card can be an FT4232 adapter card, a USB daughter card, and the communication adapter card is connected to the EMMC (Embedded Multi Media Card) daughter card, and each daughter card corresponds to a different communication protocol. In order to realize the control of the communication conversion card, the PC is installed with relevant software for controlling the communication conversion card, and the software is named RTCmd. At the same time, it also includes XR-Download software for verifying the reading and writing of the FT4232 adapter card serial port, USB and EMMC daughter card, and at the same time connects the CI tool (executes the above-mentioned Jenkins compilation function) to realize the update of the system to be tested in HAPS.

[0078] In a possible embodiment, running preset test data in HAPS to obtain test results includes:

[0079] Through the control instructions converted by the communication instruction card, the preset test data is run in HAPS to obtain the test results.

[0080] On the basis of using the communication instruction card to convert and transmit the system to be tested, this embodiment further discloses the relevant contents of the conversion and transmission of the control instructions implemented by the system to be tested.

[0081] With respect to the control process of the above software, this embodiment includes a specific control method in the process of executing the test method, including:

[0082] 1. Path configuration

[0083] (1) Configure the environment for running the control software on the PC.

[0084] (2) Configure the Python script on the PC connected to HAPS

[0085] a. Configure the script for loading the image system (make sure it is loaded into the HAPS work domain)

[0086] b. Use the RTCmd tool to scan the SPI (Seriel Peripheral Interface) port number to determine the port that controls the GPIO.

[0087] c. Configure the target communication port used to load the HAPS image system.

[0088] d. Determine the mirror system operation channel to be used.

[0089] e. Determine the port number used for HAPS startup.

[0090] 2. Control instruction configuration

[0091] (1) Pin configuration for communication adapter card and HAPS

[0092] By controlling the pin level of the FT4232 adapter board connected to HAPS100 (GPIO port of HAPS) through the RTCmd software, the pin level can be pulled up or down (0 is low, 1 is high), thereby realizing function control.

[0093] Specific implementation principle: After the FT4232 adapter board is connected to the PC, the USB port will be enumerated on the PC; after connecting to HAPS, it can communicate in SPI mode. The RTCmd software uses the USB port enumerated by the FT4232 adapter board to configure the SPI connection mode and send control instructions to HAPS100, thereby realizing GPIO level control on HAPS100.

[0094] Among them, the FT4232 adapter board and HAPS100 pin control instructions are shown in the following table:

[0095]

[0096] Table 1 FT4232 adapter board and HAPS100 pin control instruction correspondence table

[0097] By controlling the pin levels of GPIO_1, GPIO_2, GPIO_3 and Soft_rst, HAPS100 can be adjusted to control HAPS to enter download mode or normal boot mode, and boot from different storage media. For example, if the port number is 123, pull the level high to set Bit0 to 1, and GPIO_1, GPIO_2, GPIO_3 and Soft_rst correspond to the low 4-bit pin level state. The corresponding address of these pins is 0xff, that is, the low four bits need to be set to binary 1111, and the high four bits default to 1111, corresponding to hexadecimal 0xff.

[0098] (2) Download the PAC format file of the image system. Use the USB port enumerated by the USB daughter card on the PC to communicate with HAPS100 to complete the system image download. For example, if the port number of the target communication port is 456 and the system file to be tested is example.pac, the corresponding instructions are used to complete the communication handshake and data transmission with HAPS100.

[0099] (3) Verify whether the system under test is successfully powered on in HAPS. Communicate with HAPS through the port number and retrieve the power-on log keywords and flags.

[0100] In a possible embodiment, running preset test data in the HAPS to obtain test results includes:

[0101] Control HAPS to run preset test data one by one; obtain test results of preset test data one by one; identify test items corresponding to abnormal test results, where the test items are one or more of the preset test data; and display the test items.

[0102] In the content of this embodiment, further relevant explanations are given for the content of running preset test data in HAPS. It should be noted that the preset test data in the technical content of this implementation is a test set corresponding to the system to be tested, which can realize all-round testing of the performance related to the system operation when the system to be tested is running in HAPS. At the same time, the preset test data is at least one test item, and each item is run in HAPS, and the corresponding operation results are generated as test results. For each test result, as a basis for judging the system to be tested, according to at least one judgment result, it is confirmed whether the user's information to be configured is reasonable. If it is reasonable, the content of the information to be configured input by the user is recognized. If it is unreasonable, the information to be configured input this time is marked, and the test items corresponding to the abnormal results are displayed to help users quickly modify the wrong information to be configured.

[0103] Based on the above method embodiment, combined with the control software in the above specific embodiment, the control flow chart of the HAPS-based test method is as follows: Figure 2 As shown, including:

[0104] 1. Use the RTCmd software to control the GPIO level of the HAPS100 pin connected to the FT4232 adapter board to be pulled high, and HAPS enters the download mode.

[0105] 2. Loading of the image system (Bitfile).

[0106] 3. Download the system to be tested (PAC format) to HAPS.

[0107] 4. The GPIO level of the HAPS100 pin is pulled low, and HAPS enters the power-on mode

[0108] 5. Loading of the system to be tested (Bitfile) in HAPS.

[0109] 6. Power on the system to be tested to verify and obtain the loading results.

[0110] 7. Run the preset test data case.

[0111] At the same time, the embodiments of the present application further include the normal execution of the HAPS-based test method by adjusting the connection relationship between multiple HAPSs and multiple PC terminals to meet the needs of multiple users when the HAPS is occupied.

[0112] Based on the above-mentioned HAPS-based test method, the present application further discloses a HAPS-based test device, the structure diagram of which is shown in FIG. Figure 3 As shown, it includes: an acquisition module 31, a generation module 32, a loading module 33 and a testing module.

[0113] An acquisition module 31, configured to acquire a mirror system corresponding to the HAPS in response to an acquisition signal of information to be configured, wherein the HAPS is a prototype verification board based on FPGA;

[0114] A generating module 32, used for compiling the information to be configured, generating information to be tested, and generating a system to be tested in the mirror system according to the information to be tested;

[0115] A loading module 33, used for loading the system to be tested in the HAPS;

[0116] The testing module 34 is used to run preset test data in the HAPS and obtain test results.

[0117] In a possible embodiment, the loading module 33 is further used for:

[0118] Using a loading tool to load the system to be tested in the HAPS, and obtaining a loading result during the loading process;

[0119] Verifying whether the system to be tested is valid according to the loading result;

[0120] Loading module 33, used for:

[0121] The valid system to be tested is loaded into the HAPS.

[0122] In a possible embodiment, the loading module 33 is used to:

[0123] If according to the loading result, it is verified that the system to be tested is invalid;

[0124] Output the display information that the information to be configured is abnormal.

[0125] In a possible embodiment, the apparatus further includes: a configuration module 35, configured to:

[0126] Determining a target communication port of the HPAS;

[0127] Selecting a working domain for adapting the mirroring system in the HAPS;

[0128] Opening an operation channel in the HAPS to support transmission of the mirror system;

[0129] Using the target communication port, the working domain, and the operating channel as configuration information of the HAPS;

[0130] Verify the preparation information of the configuration information of the HAPS;

[0131] The acquisition module 31 is used to:

[0132] When the preparation information indicates that all preparations are completed, in response to a signal for obtaining information to be configured, the mirror system corresponding to the HAPS is obtained.

[0133] In a possible embodiment, the acquisition module 31 is used to:

[0134] In response to a signal for acquiring information to be configured generated by conversion of the communication adapter card, a mirror system corresponding to the HAPS is acquired.

[0135] In a possible embodiment, the testing module 34 is used to:

[0136] The control instructions converted by the communication instruction card are used to run the preset test data in the HAPS to obtain the test results.

[0137] In a possible embodiment, the test module 34 is used to: control the HAPS to run preset test data one by one;

[0138] Obtaining test results of the preset test data one by one;

[0139] Identify a test item corresponding to an abnormal test result, wherein the test item is one or more of the preset test data;

[0140] The test items are displayed.

[0141] It should be noted that for other corresponding descriptions of the functional units involved in the image processing device provided in this embodiment, reference can be made to Figure 1 The corresponding description will not be repeated here.

[0142] Based on the above Figure 1 The method shown in the embodiment also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the above-mentioned Figure 1 The method shown.

[0143] Based on this understanding, the technical solution of the present application can be embodied in the form of a software product, which can be stored in a non-volatile storage medium (which can be a CD-ROM, USB flash drive, mobile hard disk, etc.), including a number of instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute the methods of various implementation scenarios of the present application.

[0144] Based on the above Figure 1 The method shown, and Figure 3In order to achieve the above-mentioned purpose, the embodiment of the present application also provides an electronic device, such as a smart phone, a tablet computer, a drone, a smart robot and other smart terminals, which includes a storage medium and a processor; the storage medium is used to store a computer program; the processor is used to execute the computer program to achieve the above-mentioned Figure 1 The method shown.

[0145] Optionally, the above-mentioned physical device may also include a user interface, a network interface, a camera, a radio frequency (RF) circuit, a sensor, an audio circuit, a WI-FI module, etc. The user interface may include a display, an input unit such as a keyboard, etc., and the optional user interface may also include a USB interface, a card reader interface, etc. The network interface may optionally include a standard wired interface, a wireless interface (such as a WI-FI interface), etc.

[0146] Those skilled in the art will appreciate that the above-mentioned physical device structure provided in this embodiment does not constitute a limitation on the physical device, and may include more or fewer components, or a combination of certain components, or different arrangements of components.

[0147] The storage medium may also include an operating system and a network communication module. The operating system is a program that manages the hardware and software resources of the above-mentioned physical device, and supports the operation of the information processing program and other software and / or programs. The network communication module is used to realize the communication between the components inside the storage medium, and the communication with other hardware and software in the information processing physical device.

[0148] Through the description of the above implementation methods, those skilled in the art can clearly understand that the present application can be implemented by means of software plus a necessary general hardware platform, or by hardware. By applying the solution of this embodiment, the technical solution of the present application can test the chip test system before the chip is taped out. Specifically, first respond to the acquisition signal of the information to be configured, obtain the mirror system corresponding to HAPS, HAPS is a prototype verification board based on FPGA; then compile the information to be configured, generate the information to be tested, and generate the system to be tested in the mirror system according to the information to be tested; then load the system to be tested in HAPS; finally, run the preset test data in HAPS to obtain the test results. By adopting the technical solution of the present application, after the tester inputs the information to be configured, the information to be configured can be combined with the mirror system operating HAPS to generate a system to be tested. The system to be tested can be judged by running the preset test data in the system to be tested based on the test results. The mirror system under the configuration information can be quickly judged, and each piece of information to be configured in the test system can be quickly verified. When the problem of the test system is quickly discovered, the accurate testing of the test system before tape-out is guaranteed, the possibility of discovering abnormalities in the test system after tape-out is reduced, the number of re-production of tape-out is reduced, and the design cost is reduced while speeding up the test speed and improving the test efficiency.

[0149] It should be noted that, in this article, relational terms such as "first" and "second" are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0150] The above is only a specific implementation of the present application, so that those skilled in the art can understand or implement the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to the embodiments described herein, but will conform to the widest scope consistent with the principles and novel features applied for herein.

Claims

1. A HAPS-based testing method, characterized in that: include: In response to a signal for acquiring information to be configured, acquiring a mirror system corresponding to the HAPS, wherein the HAPS is a prototype verification board based on FPGA; Compiling the information to be configured to generate information to be tested, and generating a system to be tested in the mirror system according to the information to be tested; Loading the system to be tested in the HAPS; The preset test data is run in the HAPS to obtain the test result.

2. The method according to claim 1, characterized in that: Before loading the system to be tested in the HAPS, the method further includes: Using a loading tool to load the system to be tested in the HAPS, and obtaining a loading result during the loading process; Verifying whether the system to be tested is valid according to the loading result; The step of loading the system to be tested in the HAPS includes: The valid system to be tested is loaded into the HAPS.

3. The method according to claim 2, characterized in that After verifying the validity of the system to be tested according to the loading result, the method further includes: If according to the loading result, it is verified that the system to be tested is invalid; Output the display information that the information to be configured is abnormal.

4. The method according to claim 1, characterized in that: Before acquiring the mirror system corresponding to the HAPS in response to the acquisition signal of the information to be configured, the method further includes: Determining a target communication port of the HPAS; Selecting a working domain for adapting the mirroring system in the HAPS; Opening an operation channel in the HAPS to support transmission of the mirror system; Using the target communication port, the working domain, and the operating channel as configuration information of the HAPS; Verify the preparation information of the configuration information of the HAPS; The acquiring of the mirror system corresponding to the HAPS in response to the acquisition signal of the information to be configured includes: When the preparation information indicates that all preparations are completed, in response to a signal for obtaining information to be configured, the mirror system corresponding to the HAPS is obtained.

5. The method according to claim 1, characterized in that The acquiring of the mirror system corresponding to the HAPS in response to the acquisition signal of the information to be configured includes: In response to a signal for acquiring information to be configured generated by conversion of the communication adapter card, a mirror system corresponding to the HAPS is acquired.

6. The method according to claim 5, characterized in that The step of running the preset test data in the HAPS and obtaining the test result includes: The control instructions converted by the communication instruction card are used to run the preset test data in the HAPS to obtain the test results.

7. The method according to claim 2, characterized in that The step of running the preset test data in the HAPS and obtaining the test result includes: Controlling the HAPS to run preset test data one by one; Obtaining test results of the preset test data one by one; Identify a test item corresponding to an abnormal test result, wherein the test item is one or more of the preset test data; The test items are displayed.

8. A HAPS-based testing device, characterized in that: include: An acquisition module, configured to acquire a mirror system corresponding to the HAPS in response to an acquisition signal of information to be configured, wherein the HAPS is a prototype verification board based on FPGA; A generating module, used for compiling the information to be configured, generating information to be tested, and generating a system to be tested in the mirror system according to the information to be tested; A loading module, used for loading the system to be tested in the HAPS; The test module is used to run preset test data in the HAPS and obtain test results.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method according to any one of claims 1 to 7 is implemented.

10. An electronic device comprising a storage medium, a processor, and a computer program stored in the storage medium and executable on the processor, characterized in that: When the processor executes the computer program, the method according to any one of claims 1 to 7 is implemented.

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