Automatic hanging test method and system, terminal and storage medium

Abstract

The invention discloses an automatic hanging test method and system, a terminal and a storage medium, and the method comprises the steps: obtaining a query instruction, and obtaining a unique identifier of each test device according to the query instruction; obtaining a preset test number and set parameters, when the number of the unique identifiers is the same as the test number, setting local log parameters corresponding to each test device according to the set parameters, carrying out device testing according to the local log parameters, and storing a device testing result each time; and acquiring abnormal test information of each test device according to a stored device test result, summarizing the test devices with the abnormal test information according to the unique identifier, and sending the summarized test devices to a target device. According to the invention, automatic hanging test can be carried out, and a plurality of operations do not need to be carried out manually, so that manpower consumption is eliminated, hanging test can be completed within preset time, and equipment or project test is realized.

Description

Technical Field

[0001] The present invention relates to the technical field of automated hanging test, and in particular to an automated hanging test method, system, terminal and storage medium. Background Art

[0002] At present, in the test of the stability of equipment or projects, in order to ensure the credibility of the data and because more equipment can expose more low-probability problems, more equipment is usually used for testing, so as to obtain more accurate test data to judge the stability of the equipment or project.

[0003] However, during the test process, since each test is usually performed manually, for the test of multiple devices, the operator must operate each device once. When testing a large number of devices, manual operation will undoubtedly be time-consuming and labor-intensive, and there is no guarantee that the test can be performed at any time, making it impossible to complete the test within the scheduled time, affecting the testing of the equipment or project.

[0004] Therefore, the prior art still needs to be improved and developed. Summary of the invention

[0005] The main purpose of the present invention is to provide an automated testing method, system, terminal and computer-readable storage medium, aiming to solve the problem in the prior art that in the testing process, each test is usually performed manually. Therefore, for the testing of multiple devices, the operator must operate each device once. When testing a large number of devices, manual operation will undoubtedly be time-consuming and labor-intensive, and there is no guarantee that the test can be performed at any time, so the test cannot be completed within the scheduled time, affecting the test of the device or project.

[0006] To achieve the above object, the present invention provides an automated hanging test method, the automated hanging test method comprising the following steps:

[0007] Obtain a query instruction, and obtain a unique identifier of each test device according to the query instruction;

[0008] Obtaining a preset number of tests and setting parameters, and when the number of unique identifiers is the same as the number of tests, setting local log parameters corresponding to each test device according to the setting parameters, performing device testing according to the local log parameters, and storing each device test result;

[0009] According to the stored device test results, abnormal test information of each test device is obtained, and the test devices with the abnormal test information are summarized according to the unique identifier and sent to the target device.

[0010] Optionally, the obtaining of the query instruction, obtaining the unique identifier of each test device according to the query instruction, specifically includes:

[0011] When performing automated hang tests, obtain query commands;

[0012] The query command is sent to each test device respectively, and a unique identifier returned by each test device is received, wherein the unique identifier is the SN number of each device.

[0013] Optionally, the obtaining of a preset number of tests and setting parameters, when the number of unique identifiers is the same as the number of tests, setting local log parameters corresponding to each test device according to the setting parameters, specifically includes:

[0014] Obtaining the preset number of tests and setting parameters, and calculating the number of unique identifiers obtained;

[0015] When the number of acquired unique identifiers is the same as the number of tests, local log parameters corresponding to each test device are set according to the set parameters.

[0016] Optionally, setting the local log parameters corresponding to each test device according to the set parameters specifically includes:

[0017] Turn on the disk log switch, where the setting parameters include log size and log running time;

[0018] The size and running time of the log to disk corresponding to each test device are set according to the setting parameters, wherein the local log parameters include the size of the log and the running time of the log to disk.

[0019] Optionally, performing a device test according to the local log parameter and storing each device test result specifically includes:

[0020] Run the corresponding test script according to the running time of the log file, perform multiple device tests, and stop running when the running time is reached;

[0021] After each device test is completed, a storage space is generated according to the unique identifier of each test device, and each device test result of the corresponding device is stored in the storage space.

[0022] Optionally, acquiring abnormal test information of each test device according to the stored device test results, aggregating the test devices having the abnormal test information according to the unique identifier, and sending the aggregating ...

[0023] Obtaining abnormal test information of each test device in the stored device test results;

[0024] A corresponding storage file is created according to each unique identifier, and the abnormal test information corresponding to each test device is stored in the corresponding storage file, and the storage file is sent to the target device.

[0025] Optionally, the abnormal test information of each test device is obtained according to the stored device test results, the test devices having the abnormal test information are summarized according to the unique identifier, and sent to the target device, and then includes:

[0026] When receiving the test case, obtaining a first setting parameter;

[0027] A local test script is configured according to the first setting parameter, and the local test script is stored in a local device.

[0028] In addition, to achieve the above-mentioned purpose, the present invention also provides an automated hanging test system, wherein the automated hanging test system comprises:

[0029] An identifier acquisition module, used to acquire a query instruction, and acquire a unique identifier of each test device according to the query instruction;

[0030] A test module, used to obtain a preset test quantity and setting parameters, and when the number of unique identifiers is the same as the test quantity, set local log parameters corresponding to each test device according to the setting parameters, perform device testing according to the local log parameters, and store each device test result;

[0031] The result generation module is used to obtain abnormal test information of each test device according to the stored device test results, summarize the test devices with the abnormal test information according to the unique identifier, and send the summary to the target device.

[0032] In addition, to achieve the above-mentioned purpose, the present invention also provides a terminal, wherein the terminal includes: a memory, a processor, and an automated hanging test program stored in the memory and executable on the processor, and when the automated hanging test program is executed by the processor, the steps of the automated hanging test method as described above are implemented.

[0033] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, wherein the computer-readable storage medium stores an automated hanging test program, and when the automated hanging test program is executed by a processor, the steps of the automated hanging test method as described above are implemented.

[0034] In the present invention, a query instruction is obtained, and a unique identifier of each test device is obtained according to the query instruction; a preset test quantity and setting parameters are obtained, and when the number of unique identifiers is the same as the test quantity, local log parameters corresponding to each test device are set according to the setting parameters, device testing is performed according to the local log parameters, and each device test result is stored; based on the stored device test results, abnormal test information of each test device is obtained, and the test devices with the abnormal test information are summarized according to the unique identifier and sent to the target device. In the process of testing, the present invention usually performs each test manually. Therefore, for the test of multiple devices, the operator must operate each device once. When testing a large number of devices, manual operation will undoubtedly be time-consuming and labor-intensive. There is no guarantee that the test can be performed at any time, so the test cannot be completed within the scheduled time, affecting the test of the device or project. The present invention obtains the specific unique identifier of the device, performs automatic testing accordingly, and outputs the test results after the test is completed. In the process, since automatic testing can be performed, there is no need to perform multiple operations manually, thereby eliminating manpower consumption, ensuring that the test can be completed within the scheduled time, and realizing the test of the device or project. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 It is a flow chart of a preferred embodiment of the automatic hanging test method of the present invention;

[0036] Figure 2 It is a structural diagram of a preferred embodiment of the automatic hanging test system of the present invention;

[0037] Figure 3 It is a structural diagram of a preferred embodiment of the terminal of the present invention. DETAILED DESCRIPTION

[0038] In order to make the purpose, technical solution and advantages of the present invention clearer and more specific, the present invention is further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0039] At present, in the test of the stability of equipment or projects, in order to ensure the credibility of the data, and because more equipment can expose more low-probability problems, more equipment is usually used for testing, so as to obtain more accurate test data to judge the stability of the equipment or project. However, in the process of hanging test, since each hanging test is usually performed manually, for the hanging test of multiple devices, the operator must operate each device once, and manual operation is prone to introduce errors, which may lead to inconsistency of test results. Secondly, manual operation is difficult to achieve long-term and continuous testing, which is a major limitation for projects that require long-term stability testing. Finally, manual operation is difficult to achieve standardization and normalization of the test process, and there may be differences in operation between different operators, affecting the comparability of the test results. That is, when hanging tests on more equipment, manual operation for hanging tests will undoubtedly be time-consuming and labor-intensive, and there is no guarantee that the hanging test can be performed at any time, so that the hanging test cannot be completed within the scheduled time, affecting the test of the equipment or project.

[0040] In response to one or more of the above-mentioned problems, the present invention obtains a query instruction, and obtains a unique identifier for each test device according to the query instruction; obtains a preset test number and setting parameters, and when the number of unique identifiers is the same as the test number, sets the local log parameters corresponding to each test device according to the setting parameters, performs device testing according to the local log parameters, and stores the results of each device test; based on the stored device test results, obtains abnormal test information of each test device, summarizes the test devices that have the abnormal test information according to the unique identifier, and sends them to the target device.

[0041] The automated hanging test method described in the preferred embodiment of the present invention is as follows: Figure 1 As shown, the automated hanging test method comprises the following steps:

[0042] Step S10: Obtain a query instruction, and obtain a unique identifier of each test device according to the query instruction.

[0043] It should be noted that in one embodiment, tester A needs to perform hang tests on 30 devices in a single test cycle. Each hang test needs to execute the test script, turn on the disk log switch, set the disk log parameters, run the memory data collection script, run the automatic record restart and other abnormal scripts, including confirming that all are opened and run successfully; in actual situations, when the staff is tight, the lack of proficiency of the stability tester may also cause a script to fail to run successfully. The cost of filing and locating the cause of the stability problem in the later stage will also increase, and it is necessary to hang the test again to reproduce the problem. For the above problems, this application uses an automated hang test method to achieve fast hang test.

[0044] Further, the obtaining of the query instruction, obtaining the unique identifier of each test device according to the query instruction, specifically includes:

[0045] When performing automated hang tests, obtain query commands;

[0046] The query command is sent to each test device respectively, and a unique identifier returned by each test device is received, wherein the unique identifier is the SN number of each device.

[0047] Specifically, before obtaining the query command, the test device is connected to the local device, for example, via a USB data cable. Among them, the query command is a command that comes with the OpenHarmony system, namely "hdc list targets". This query command can obtain the unique identifiers of all test devices currently connected to the local device, and the corresponding unique identifier is the SN number of each device, which is burned into the development board by the manufacturer when the development board leaves the factory, and cannot be erased or tampered with later. The present application includes the technical features of obtaining a query command, sending the query command to each test device, and accepting the unique identifier returned by each test device. These technical features cooperate with each other to realize the function of obtaining the unique identifier of each test device in the automated hanging test. By obtaining a query command, sending the query command to each test device, and then accepting the unique identifier returned by each device, the unique identifier of each test device can be automatically obtained, thereby solving the problem of time-consuming and labor-intensive manual operation and improving the test efficiency and accuracy.

[0048] In other embodiments of the present application, the unique identifier may also be other identifiers that can distinguish devices, and the identification of devices is achieved through corresponding identifiers; for example, in the present application, the network card MAC address can be used as a unique identifier, and in this case, different devices need to use different MAC addresses; or in the present application, a unique identifier can be generated by a custom algorithm, and a self-made specific algorithm (such as GUID, or a certain number of random numbers) can be used to generate a unique ID, and then written to the registry or device as its unique ID. This method does not rely on any hardware features, and the uniqueness can also be completely controlled by the user. For devices with strong confidentiality requirements, in the present application, a unique identifier provided by an external cryptographic device can be used. For example, a unique key identifier can be provided in a U-shield, and the endorsement key EK in the trusted computing cryptographic chip is uniquely fixed in the secure hardware, and is generated through a good cryptographic algorithm. Uniqueness and differentiation can be guaranteed, and security is also higher.

[0049] Step S20, obtaining the preset test quantity and setting parameters, when the number of unique identifiers is the same as the test quantity, setting the local log parameters corresponding to each test device according to the setting parameters, performing device testing according to the local log parameters, and storing the results of each device test.

[0050] It should be noted that in this application, the number of tests is pre-set, that is, the number of test devices to be tested this time. In this application, after obtaining the corresponding information, the device test can be started. Since the hang test includes multiple tests, the corresponding test script should be selected according to the pre-set test, such as the sleep wake-up test and the restart test. The corresponding scripts are different when the test is performed, and these scripts are imported by the user.

[0051] Further, the obtaining of the preset test quantity and setting parameters, when the number of unique identifiers is the same as the test quantity, setting the local log parameters corresponding to each test device according to the setting parameters, specifically includes:

[0052] Obtaining the preset number of tests and setting parameters, and calculating the number of unique identifiers obtained;

[0053] When the number of acquired unique identifiers is the same as the number of tests, local log parameters corresponding to each test device are set according to the set parameters.

[0054] Specifically, obtaining the pre-set number of tests and setting parameters means that before the test starts, the system will pre-set the number of devices to be tested and the relevant parameter configurations, such as log size and running time. Calculating the number of unique identifiers obtained means that the system obtains the unique identifier of each test device through a query command and calculates the total number of these unique identifiers. When the number of unique identifiers is the same as the pre-set number of tests, the system will set the corresponding local log parameters for each test device according to the previously set parameters. In the present application, the number of unique identifiers obtained is calculated. In one embodiment of the present application, the current local device is connected to device 1, device 2, and device 3, and the unique identifiers obtained by the tester through the query instruction are 3, i.e., the SN numbers of the three devices. When the number of unique identifiers is the same as the number of tests, the local log parameters corresponding to each test device are set according to the set parameters.

[0055] Further, the local log parameters corresponding to each test device are set according to the set parameters, specifically including:

[0056] Turn on the disk log switch, where the setting parameters include log size and log running time;

[0057] The size and running time of the log to disk corresponding to each test device are set according to the setting parameters, wherein the local log parameters include the size of the log and the running time of the log to disk.

[0058] It should be noted that the role of turning on the disk log switch is to start the log recording function, and the role of setting the parameters of the log size and log running time is to control the capacity and duration of the log record. Through the mutual cooperation of these technical features, the function of setting the local log parameters corresponding to each test device according to the set parameters is realized, thereby effectively solving the technical problem of how to set the local log parameters corresponding to each test device according to the set parameters. The disk log refers to the process or result of writing data from the memory to the disk. This process involves transferring information from volatile memory storage to non-volatile disk storage to ensure the persistence and long-term preservation of the data. Specifically, in the present application, the setting parameters include the log size and the log running time. When setting the local log parameters corresponding to each test device according to the setting parameters, it is necessary to first turn on the disk log switch to save the log for subsequent positioning, and then set the disk log parameters, wherein the corresponding log size and the running time of the disk log are set by setting the log size and log running time of the parameters.

[0059] Further, performing device testing according to the local log parameters and storing each device test result specifically includes:

[0060] Run the corresponding test script according to the running time of the log file, perform multiple device tests, and stop running when the running time is reached;

[0061] After each device test is completed, a storage space is generated according to the unique identifier of each test device, and each device test result of the corresponding device is stored in the storage space.

[0062] Specifically, in this application, the corresponding test scripts will be selected according to the pre-set settings, such as the scripts corresponding to the sleep wake-up test and the restart test. Then, the corresponding test script will be run according to the running time of the disk log, and the script will be stopped after the running time ends. During each run, the corresponding device test results will be stored.

[0063] During each test script run, long random test scripts, memory data collection scripts, and automatic restart recording and other abnormal scripts will be run in sequence; among them, the random test script is used to automatically click on the controls on the test device, the memory data collection script is used to record the trend of memory data during the test time, and the automatic restart or sleep wake-up and other abnormal scripts are used to view the specific time points of problems such as restart and freeze.

[0064] After each device test is completed, a storage space is generated according to the unique identifier of each test device, that is, a corresponding directory is set in the local device and named with the corresponding unique identifier. After the test is completed, the memory data and logs are placed in the corresponding directory, and the logs are updated every time a restart exception or a sleep wake-up exception occurs, and the original logs are stored. Specifically, in the corresponding directory, a folder named after the SN number of each device will be generated. In the folder named after the SN number: the "log" folder is the disk log and fault log, the "test_result" folder is the execution log of the test script, the "hidumper_mem" is the memory file, and the "reboot_result" is the record file of the restart exception, etc.

[0065] Furthermore, in the present invention, after each test is completed, the test script used in the test is stored in the storage space, and the test script is annotated based on the requirements and purposes before the test, and the corresponding annotations are summarized, indexes are added, and the summarized annotations are associated with the corresponding scripts. When the number of scripts stored in the storage space reaches the preset number of scripts, when the same test requirements and purposes are encountered again, the corresponding files with the annotations are searched, the corresponding scripts are obtained, and the scripts are called for testing.

[0066] Step S30: Acquire abnormal test information of each test device according to the stored device test results, aggregate the test devices with the abnormal test information according to the unique identifier, and send the aggregated information to the target device.

[0067] Specifically, in the present application, the abnormal situation corresponding to the obtained test results is obtained and the corresponding user is notified so that the user knows the abnormality at the first time.

[0068] Further, the abnormal test information of each test device is obtained according to the stored device test results, and the test devices having the abnormal test information are summarized according to the unique identifier and sent to the target device, which specifically includes:

[0069] Obtaining abnormal test information of each test device in the stored device test results;

[0070] A corresponding storage file is created according to each unique identifier, and the abnormal test information corresponding to each test device is stored in the corresponding storage file, and the storage file is sent to the target device.

[0071] Specifically, the abnormal test information of each test device is obtained from the stored device test results, that is, the record file of the restart abnormality, etc. is obtained. When there is an abnormal situation in the record file of the restart abnormality, etc. in the corresponding device test result, other files corresponding to the test are obtained accordingly, and these files are stored in a storage file established with a unique identifier, and the file is sent to the corresponding target device. The target device is a device pre-set by the user for receiving the stored file.

[0072] Further, the abnormal test information of each test device is obtained according to the stored device test results, the test devices having the abnormal test information are summarized according to the unique identifier, and sent to the target device, and then includes:

[0073] When receiving the test case, obtaining a first setting parameter;

[0074] A local test script is configured according to the first setting parameter, and the local test script is stored in a local device.

[0075] Specifically, in this application, the hang test includes multiple tests. Since the stability test method is constantly evolving and improving, many new scripts will be born. When receiving the test script input by the user, that is, the test case, the first setting parameter is obtained. The local test script is configured according to the first setting parameter, and the local test script is stored in the local device. The first setting parameter includes the corresponding log size and log running time. When configuring the local test script, it is necessary to turn on the disk log switch and set the disk log parameters, that is, configure the local test script according to the first setting parameter, and configure the memory data collection script and the automatic recording restart and other abnormal scripts for the script.

[0076] In one embodiment of the present invention, after the corresponding test is completed, the abnormal information is summarized, the specific abnormal cause is obtained according to the abnormal information, and the corresponding abnormal cause is sent to other devices to check the corresponding devices to prevent the same abnormality from occurring in other devices.

[0077] In another embodiment of the present application, correspondingly, in the implementation of obtaining a query instruction, a unique identifier of each test device is obtained according to the query instruction; a preset test number and setting parameters are obtained, and when the number of unique identifiers is the same as the test number, the local log parameters corresponding to each test device are set according to the setting parameters, the device test is performed according to the local log parameters, and the test results of each device are stored; according to the stored device test results, abnormal test information of each test device is obtained, and the test devices with the abnormal test information are summarized according to the unique identifier, and the process of sending them to the target device is visualized, that is, when running the method described in the present invention, a window appears, and the window has a "Query Device" button, a table for recording the information of the hanging test device, a "Start Long-Term Random Test" button, a "Start Sleep Wake-up Random Test" button, a "Start Restart Test" button, a "New Script Test" button, a result printing panel, and a "Download Result File" button.

[0078] After the corresponding personnel clicks the "Query Device" button, the computer sends the "hdc list targets" command to the device to obtain the unique identifier in the present invention, and then clicks the "Start Test" button to see the unique identifier in the table; when the tester determines that the number of SN numbers in the table is equal to the test number, he can click "Start Long Random Test".

[0079] The present invention obtains a query instruction, and obtains a unique identifier for each test device according to the query instruction; obtains a preset test quantity and setting parameters, and when the quantity of unique identifiers is the same as the test quantity, sets local log parameters corresponding to each test device according to the setting parameters, performs device testing according to the local log parameters, and stores each device test result; obtains abnormal test information of each test device according to the stored device test results, summarizes the test devices that have the abnormal test information according to the unique identifier, and sends them to the target device. In the process of testing, the present invention usually performs each test manually. Therefore, for the test of multiple devices, the operator must operate each device once. When testing a large number of devices, manual operation will undoubtedly be time-consuming and labor-intensive. There is no guarantee that the test can be performed at any time, so the test cannot be completed within the scheduled time, affecting the test of the device or project. The present invention obtains the specific unique identifier of the device, performs automatic testing accordingly, and outputs the test results after the test is completed. In the process, since automatic testing can be performed, there is no need to perform multiple operations manually, thereby eliminating manpower consumption, ensuring that the test can be completed within the scheduled time, and realizing the test of the device or project.

[0080] Furthermore, if Figure 2 As shown, based on the above-mentioned automatic hanging test method, the present invention also provides an automatic hanging test system accordingly, wherein the automatic hanging test system comprises:

[0081] The identifier acquisition module 21 is used to acquire a query instruction and acquire a unique identifier of each test device according to the query instruction;

[0082] The test module 22 is used to obtain a preset test quantity and setting parameters, and when the number of unique identifiers is the same as the test quantity, set the local log parameters corresponding to each test device according to the setting parameters, perform device testing according to the local log parameters, and store the test results of each device;

[0083] The result generating module 23 is used to obtain abnormal test information of each test device according to the stored device test results, summarize the test devices with the abnormal test information according to the unique identifier, and send the result to the target device.

[0084] Furthermore, if Figure 3 As shown, based on the above-mentioned automatic hanging test method and system, the present invention also provides a terminal accordingly, and the terminal includes a processor 10, a memory 20 and a display 30. Figure 3 Only some components of the terminal are shown, but it should be understood that it is not required to implement all of the components shown, and more or fewer components may be implemented instead.

[0085] In some embodiments, the memory 20 may be an internal storage unit of the terminal, such as a hard disk or memory of the terminal. In other embodiments, the memory 20 may also be an external storage device of the terminal, such as a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (SecureDigital, SD) card, a flash card (Flash Card), etc. equipped on the terminal. Further, the memory 20 may also include both an internal storage unit of the terminal and an external storage device. The memory 20 is used to store application software and various types of data installed in the terminal, such as the program code of the installation terminal. The memory 20 may also be used to temporarily store data that has been output or is to be output. In one embodiment, an automated hang test program 40 is stored on the memory 20, and the automated hang test program 40 can be executed by the processor 10, thereby realizing the automated hang test method in the present application.

[0086] In some embodiments, the processor 10 may be a central processing unit (CPU), a microprocessor or other data processing chip, used to run the program code or process data stored in the memory 20, such as executing the automated hanging test method.

[0087] In some embodiments, the display 30 may be an LED display, a liquid crystal display, a touch-sensitive liquid crystal display, an OLED (Organic Light-Emitting Diode) touch device, etc. The display 30 is used to display information on the terminal and to display a visual user interface. The components 10-30 of the terminal communicate with each other via a system bus.

[0088] In one embodiment, when the processor 10 executes the automated hang test program 40 in the memory 20 , the steps in the automated hang test method described above are implemented.

[0089] The present invention also provides a computer-readable storage medium, wherein the computer-readable storage medium stores an automated hang test program, and when the automated hang test program is executed by a processor, the following steps of the automated hang test method are implemented:

[0090] Obtain a query instruction, and obtain a unique identifier of each test device according to the query instruction;

[0091] Obtaining a preset number of tests and setting parameters, and when the number of unique identifiers is the same as the number of tests, setting local log parameters corresponding to each test device according to the setting parameters, performing device testing according to the local log parameters, and storing each device test result;

[0092] According to the stored device test results, abnormal test information of each test device is obtained, and the test devices with the abnormal test information are summarized according to the unique identifier and sent to the target device.

[0093] The obtaining of the query instruction, and obtaining the unique identifier of each test device according to the query instruction, specifically includes:

[0094] When performing automated hang tests, obtain query commands;

[0095] The query command is sent to each test device respectively, and a unique identifier returned by each test device is received, wherein the unique identifier is the SN number of each device.

[0096] The step of obtaining the preset number of tests and setting parameters, and setting the local log parameters corresponding to each test device according to the setting parameters when the number of unique identifiers is the same as the number of tests, specifically includes:

[0097] Obtaining the preset number of tests and setting parameters, and calculating the number of unique identifiers obtained;

[0098] When the number of acquired unique identifiers is the same as the number of tests, local log parameters corresponding to each test device are set according to the set parameters.

[0099] The step of setting the local log parameters corresponding to each test device according to the set parameters specifically includes:

[0100] Turn on the disk log switch, where the setting parameters include log size and log running time;

[0101] The size and running time of the log to disk corresponding to each test device are set according to the setting parameters, wherein the local log parameters include the size of the log and the running time of the log to disk.

[0102] The performing of device testing according to the local log parameters and storing each device test result specifically includes:

[0103] Run the corresponding test script according to the running time of the log file, perform multiple device tests, and stop running when the running time is reached;

[0104] After each device test is completed, a storage space is generated according to the unique identifier of each test device, and each device test result of the corresponding device is stored in the storage space.

[0105] The method of acquiring abnormal test information of each test device according to the stored device test results, aggregating the test devices having the abnormal test information according to the unique identifier, and sending the aggregating the aggregating test devices to the target device specifically includes:

[0106] Obtaining abnormal test information of each test device in the stored device test results;

[0107] A corresponding storage file is created according to each unique identifier, and the abnormal test information corresponding to each test device is stored in the corresponding storage file, and the storage file is sent to the target device.

[0108] The method of acquiring abnormal test information of each test device according to the stored device test results, aggregating the test devices having the abnormal test information according to the unique identifier, and sending the aggregating the aggregating test devices to the target device, further comprises:

[0109] When receiving the test case, obtaining a first setting parameter;

[0110] A local test script is configured according to the first setting parameter, and the local test script is stored in a local device.

[0111] It should be noted that, in this article, the terms "include", "comprises" or any other variations thereof are intended to cover non-exclusive inclusion, so that a process, method, article or terminal including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or terminal. In the absence of further restrictions, an element defined by the sentence "includes a ..." does not exclude the existence of other identical elements in the process, method, article or terminal including the element.

[0112] Of course, those skilled in the art can understand that all or part of the processes in the above-mentioned embodiments can be implemented by instructing related hardware (such as a processor, a controller, etc.) through a computer program, and the program can be stored in a computer-readable storage medium that can be read by a computer, and the program can include the processes of the above-mentioned method embodiments when executed. The computer-readable storage medium can be a memory, a disk, an optical disk, etc.

[0113] It should be understood that the application of the present invention is not limited to the above examples. For ordinary technicians in this field, improvements or changes can be made based on the above description. All these improvements and changes should fall within the scope of protection of the claims attached to the present invention.

Claims

1. An automated hanging test method, characterized in that: The automated hanging test method comprises: Obtain a query instruction, and obtain a unique identifier of each test device according to the query instruction; Obtaining a preset number of tests and setting parameters, and when the number of unique identifiers is the same as the number of tests, setting local log parameters corresponding to each test device according to the setting parameters, performing device testing according to the local log parameters, and storing each device test result; According to the stored device test results, abnormal test information of each test device is obtained, and the test devices with the abnormal test information are summarized according to the unique identifier and sent to the target device.

2. The automated hanging test method according to claim 1, characterized in that: The obtaining of the query instruction, obtaining the unique identifier of each test device according to the query instruction, specifically includes: When performing automated hang tests, obtain query commands; The query command is sent to each test device respectively, and a unique identifier returned by each test device is received, wherein the unique identifier is the SN number of each device.

3. The automated hanging test method according to claim 1, characterized in that: The step of obtaining the preset number of tests and setting parameters, and setting the local log parameters corresponding to each test device according to the setting parameters when the number of unique identifiers is the same as the number of tests, specifically includes: Obtaining the preset number of tests and setting parameters, and calculating the number of unique identifiers obtained; When the number of acquired unique identifiers is the same as the number of tests, local log parameters corresponding to each test device are set according to the set parameters.

4. The automated hanging test method according to claim 3, characterized in that: The step of setting the local log parameters corresponding to each test device according to the set parameters specifically includes: Turn on the disk log switch, where the setting parameters include log size and log running time; The size and running time of the log to disk corresponding to each test device are set according to the setting parameters, wherein the local log parameters include the size of the log and the running time of the log to disk.

5. The automated hanging test method according to claim 4, characterized in that: The performing of device testing according to the local log parameters and storing each device test result specifically includes: Run the corresponding test script according to the running time of the log file, perform multiple device tests, and stop running when the running time is reached; After each device test is completed, a storage space is generated according to the unique identifier of each test device, and each device test result of the corresponding device is stored in the storage space.

6. The automated hanging test method according to claim 1, characterized in that: The method of acquiring abnormal test information of each test device according to the stored device test results, aggregating the test devices having the abnormal test information according to the unique identifier, and sending the aggregating the aggregating test devices having the abnormal test information to the target device specifically includes: Obtaining abnormal test information of each test device in the stored device test results; A corresponding storage file is created according to each unique identifier, and the abnormal test information corresponding to each test device is stored in the corresponding storage file, and the storage file is sent to the target device.

7. The automated hanging test method according to claim 1, characterized in that: The method further comprises: obtaining abnormal test information of each test device according to the stored device test results, aggregating the test devices having the abnormal test information according to the unique identifier, and sending the aggregating the aggregating test information to the target device, and then comprising: When receiving the test case, obtaining a first setting parameter; A local test script is configured according to the first setting parameter, and the local test script is stored in a local device.

8. An automated hanging test system, characterized in that: The automated hanging test system comprises: An identifier acquisition module, used to acquire a query instruction, and acquire a unique identifier of each test device according to the query instruction; A test module, used to obtain a preset test quantity and setting parameters, and when the number of unique identifiers is the same as the test quantity, set local log parameters corresponding to each test device according to the setting parameters, perform device testing according to the local log parameters, and store each device test result; The result generation module is used to obtain abnormal test information of each test device according to the stored device test results, summarize the test devices with the abnormal test information according to the unique identifier, and send the result to the target device.

9. A terminal, characterized in that: The terminal includes: a memory, a processor, and an automated test program stored in the memory and executable on the processor. When the automated test program is executed by the processor, the steps of the automated test method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores an automated hang-test program, and when the automated hang-test program is executed by a processor, the steps of the automated hang-test method according to any one of claims 1 to 7 are implemented.

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