Molded line design method and device of non-straight instrument and computer equipment

Abstract

The invention relates to a molded line design method and device for a non-straight instrument and computer device.The molded line design method for the non-straight instrument comprises the steps that all molded line structure parameters of a target instrument are determined, and multiple sets of test schemes corresponding to the molded line structure parameters are generated; determining a plurality of target functions of the target instrument, wherein the target functions comprise deformation and / or local strain generated by the target instrument in the X-axis direction and deformation and / or local strain generated by the target instrument in the Y-axis direction; analyzing each group of test schemes based on the objective function to obtain a corresponding analysis data set; furthermore, each molded line structure parameter is optimized based on the analysis data set, and a target parameter value of each molded line structure parameter is obtained. By means of the method and device, the problems that the good performance of the instrument cannot be guaranteed, and the quality and the operation effect of the instrument are affected are solved, the molded line design of the non-straight instrument is accurately optimized, and the instrument performance is effectively improved.

Description

Technical Field

[0001] The present application relates to the field of medical device technology, and in particular to a method, device and computer equipment for designing the profile of a non-straight device. Background Art

[0002] In order to meet specific clinical needs, medical devices designed with specific shapes with curves, bends or adjustable angles, such as arched acetabular cup inserters, offset acetabular reamer connecting rods and other non-straight instruments, have been developed to improve operational flexibility and maneuverability and facilitate handling of complex clinical situations.

[0003] However, the prior art only focuses on the combination functions of the various components in the above non-straight instruments, and does not study and design the profile structure of the bending part, which is closely related to the performance of the instrument. Therefore, the profile of the bending part of the instrument has unreasonable design problems, which cannot ensure that the instrument has good performance, affecting the quality of the instrument and its operation effect.

[0004] There is currently no effective solution to the problem that related technologies cannot guarantee that the equipment has good performance, which affects the quality of the equipment and its operating results. Summary of the invention

[0005] In this embodiment, a method, device and computer equipment for designing the profile of a non-straight instrument are provided to solve the problem in the related art that the instrument cannot be guaranteed to have good performance, which affects the quality of the instrument and its operating effect.

[0006] In a first aspect, a method for designing a profile of a non-straight instrument is provided in this embodiment, the method comprising:

[0007] Determine various profile structural parameters of the target device, and generate multiple groups of test plans corresponding to the profile structural parameters;

[0008] Determine a plurality of objective functions of the target device, wherein the objective functions include the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction;

[0009] Analyze each group of the test schemes based on the objective function to obtain a corresponding analysis data set;

[0010] Each of the profile line structural parameters is optimized based on the analysis data set to obtain a target parameter value of each of the profile line structural parameters.

[0011] In some embodiments, analyzing each group of the test schemes based on the objective function to obtain a corresponding analysis data set includes:

[0012] Establishing a three-dimensional parameterized model of the target device corresponding to each group of the test schemes;

[0013] The three-dimensional parameterized model of each target device is analyzed and processed based on the objective function to obtain a corresponding analysis data set.

[0014] In some embodiments, the generating of multiple test schemes corresponding to the profile structural parameters includes:

[0015] Obtaining a preset value range of each of the profile structural parameters;

[0016] Based on the preset value range, determining a plurality of test values ​​of the corresponding profile structural parameters;

[0017] According to the test values ​​of the profile structural parameters, a plurality of groups of test plans are generated.

[0018] In some embodiments, the three-dimensional parameterized model of each target device is analyzed and processed based on the objective function to obtain a corresponding analysis data set, including:

[0019] Meshing the three-dimensional parameterized model of each target device;

[0020] Based on the objective function, finite element analysis is performed on the three-dimensional parameterized model after meshing to obtain the objective function value corresponding to each group of the test schemes;

[0021] The analysis data set is generated according to each group of the test schemes and the corresponding objective function values.

[0022] In some embodiments, before optimizing each of the profile structural parameters based on the analysis data set to obtain a target parameter value for each of the profile structural parameters, the method further includes:

[0023] constructing a response surface model corresponding to the analysis data set;

[0024] Based on the response surface model, the sensitivity of each of the profile structural parameters to the objective function is determined.

[0025] In some embodiments, the optimizing each of the profile structural parameters based on the analysis data set to obtain a target parameter value of each of the profile structural parameters includes:

[0026] performing data enhancement on the analysis data set by using the response surface model;

[0027] Based on the analysis data set after data enhancement, a multi-objective optimization algorithm is used to optimize each of the profile line structural parameters to obtain a target parameter value for each of the profile line structural parameters.

[0028] In some embodiments, after optimizing each of the profile structural parameters based on the analysis data set to obtain a target parameter value for each of the profile structural parameters, the method further comprises:

[0029] The target parameter value of each of the profile structural parameters is input into the three-dimensional modeling software to construct the target device model.

[0030] In some of these embodiments, the non-straight instrument comprises an arcuate instrument or an offset instrument;

[0031] The front end and the rear end of the arcuate instrument are co-linear, and the front end and the rear end of the offset instrument are parallel and non-co-linear.

[0032] In a second aspect, in this embodiment, a device for designing the profile of a non-straight instrument is provided, the device comprising: a generation module, an analysis module, a test module and an optimization module;

[0033] The generating module is used to determine various profile structural parameters of the target device and generate multiple groups of test plans corresponding to the profile structural parameters;

[0034] The analysis module is used to determine a plurality of objective functions of the target device, wherein the objective functions include the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction;

[0035] The test module is used to analyze each group of the test schemes based on the objective function to obtain a corresponding analysis data set;

[0036] The optimization module is used to optimize each of the mold line structural parameters based on the analysis data set to obtain a target parameter value for each of the mold line structural parameters.

[0037] In a third aspect, a computer device is provided in this embodiment, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the method for designing a profile of a non-straight instrument as described in the first aspect above is implemented.

[0038] In a fourth aspect, in this embodiment, a storage medium is provided, on which a computer program is stored, and when the program is executed by a processor, the method for designing a profile of a non-straight instrument described in the first aspect above is implemented.

[0039] Compared with the related art, the line design method, device and computer equipment for non-straight instruments provided in the present embodiment determine various line structure parameters of the target instrument and generate multiple groups of test schemes corresponding to the line structure parameters; determine multiple objective functions of the target instrument, the objective function includes the deformation and / or local strain generated by the target instrument in the X-axis direction, and the deformation and / or local strain generated by the target instrument in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target instrument is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target instrument and the X-axis direction; analyze each group of test schemes based on the objective function to obtain a corresponding analysis data set; further, optimize each line structure parameter based on the analysis data set to obtain a target parameter value for each line structure parameter, thereby solving the problem that the instrument cannot have good performance, affecting the quality of the instrument and its operating effect, and realizing accurate optimization of the line design of non-straight instruments, and effectively improving the performance of the instrument.

[0040] Details of one or more embodiments of the present application are set forth in the following drawings and description to make other features, objects, and advantages of the present application more readily apparent. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] The drawings described herein are used to provide a further understanding of the present application and constitute a part of the present application. The illustrative embodiments of the present application and their descriptions are used to explain the present application and do not constitute an improper limitation on the present application. In the drawings:

[0042] Figure 1 It is a hardware structure block diagram of a terminal device of a method for designing a line of a non-straight instrument provided in an embodiment of the present application;

[0043] Figure 2 It is a flow chart of a method for designing a profile of a non-straight instrument provided in one embodiment of the present application;

[0044] Figure 3 is a schematic diagram of the direction of a non-straight device provided in one embodiment of the present application;

[0045] Figure 4 is a schematic diagram of the structure of an arch-shaped device provided in one embodiment of the present application;

[0046] Figure 5 is a schematic diagram of the structure of an offset-shaped device provided in one embodiment of the present application;

[0047] Figure 6is a schematic diagram of the structure of a non-straight instrument provided in one embodiment of the present application;

[0048] Figure 7 It is a structural schematic diagram of an arched acetabular cup inserter provided in one embodiment of the present application;

[0049] Figure 8 is a bar graph of the sensitivity of the profile structure parameters provided by an embodiment of the present application;

[0050] Fig. 9 It is a flow chart of a method for designing a profile of a non-straight instrument provided in a preferred embodiment of the present application;

[0051] Fig.10 It is a structural block diagram of a profile design device for a non-straight instrument provided in one embodiment of the present application.

[0052] In the figure: 102, processor; 104, memory; 106, transmission device; 108, input and output device; 10, generation module; 20, analysis module; 30, test module; 40, optimization module; 100, installer connecting rod; 200, driver housing; 210, first transmission rod; 220, second transmission rod; 230, third transmission rod; 240, fourth transmission rod; 250, fifth transmission rod; 260, sixth transmission rod; 300, locking handle; 400, driver joint cover; 500, driver transmission head. DETAILED DESCRIPTION

[0053] In order to more clearly understand the purpose, technical solutions and advantages of the present application, the present application is described and illustrated below in conjunction with the accompanying drawings and embodiments.

[0054] Unless otherwise defined, the technical terms or scientific terms involved in this application shall have the general meaning understood by people with ordinary skills in the technical field to which this application belongs. The words "one", "a", "a", "the", "these" and the like in this application do not represent quantitative restrictions, and they can be singular or plural. The terms "include", "comprise", "have" and any variants thereof involved in this application are intended to cover non-exclusive inclusions; for example, a process, method and system, product or device comprising a series of steps or modules (units) is not limited to the listed steps or modules (units), but may include unlisted steps or modules (units), or may include other steps or modules (units) inherent to these processes, methods, products or devices. The words "connect", "connected", "coupled" and the like involved in this application are not limited to physical or mechanical connections, but may include electrical connections, whether directly or indirectly. The "multiple" involved in this application refers to two or more. "And / or" describes the association relationship of associated objects, indicating that there can be three relationships. For example, "A and / or B" can mean: A exists alone, A and B exist at the same time, and B exists alone. Usually, the character " / " indicates that the objects associated with each other are in an "or" relationship. The terms "first", "second", "third", etc. involved in this application are only used to distinguish similar objects and do not represent a specific ordering of the objects.

[0055] The method embodiment provided in this embodiment can be executed in a terminal, a computer or a similar computing device. For example, running on a terminal, Figure 1 FIG. 4 is a hardware structure block diagram of a terminal of the method for designing the profile of a non-straight instrument in this embodiment. Figure 1 As shown, the terminal may include one or more ( Figure 1 Only one is shown in the figure) processor 102 and memory 104 for storing data, wherein processor 102 may include but is not limited to a processing device such as a microprocessor MCU or a programmable logic device FPGA. The above terminal may also include a transmission device 106 and an input and output device 108 for communication functions. It can be understood by those skilled in the art that Figure 1 The structure shown is only for illustration and does not limit the structure of the above terminal. Figure 1 More or fewer components as shown, or with Figure 1 Different configurations shown.

[0056] The memory 104 can be used to store computer programs, for example, software programs and modules of application software, such as the computer program corresponding to the line design method of the non-straight instrument in the present embodiment. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, that is, to implement the above method. The memory 104 may include a high-speed random access memory, and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include a memory remotely arranged relative to the processor 102, and these remote memories may be connected to the terminal via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0057] The transmission device 106 is used to receive or send data via a network. The above network includes a wireless network provided by the communication provider of the terminal. In one example, the transmission device 106 includes a network adapter (Network Interface Controller, referred to as NIC), which can be connected to other network devices through a base station so as to communicate with the Internet. In one example, the transmission device 106 can be a radio frequency (Radio Frequency, referred to as RF) module, which is used to communicate with the Internet wirelessly.

[0058] In this embodiment, a method for designing the profile of a non-straight instrument is provided. Figure 2 FIG. 1 is a flow chart of a method for designing a profile of a non-straight instrument according to the present embodiment. Figure 2 As shown, the process includes the following steps:

[0059] Step S220, determining various profile structural parameters of the target device, and generating multiple groups of test plans corresponding to the profile structural parameters.

[0060] Specifically, according to the structural characteristics of the target device, multiple profile line structural parameters that have a greater impact on the performance of the device are selected, and the preset value range of each profile line structural parameter is obtained from historical experience information. Within the preset value range, multiple test values ​​are selected for each profile line structural parameter, so that each test value can represent a parameter of different levels, and then the test design method is used to perform test design on each test value of the profile line structural parameter to obtain multiple groups of test plans.

[0061] Step S240, determining multiple objective functions of the target device, the objective functions including the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction.

[0062] In this embodiment, multiple objective functions of the target device are selected, and the objective function includes the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction.

[0063] Among them, Figure 3 As shown, the axial direction of the target device refers to the direction of the central axis of the front end structure or the rear end structure of the target device, that is, the Z-axis direction. On this basis, the X-axis direction is the direction perpendicular to the plane where the target device is located, and the Y-axis direction is the direction perpendicular to the axial direction of the target device and the X-axis direction.

[0064] It should be noted that in the actual test analysis process, a single or multiple objective functions can be flexibly selected, and the above objective functions can be selected based on different categories of target devices and device design requirements, and are not limited to the deformation and local strain generated by the target device.

[0065] Step S260, analyzing each group of test schemes based on the objective function to obtain a corresponding analysis data set.

[0066] Specifically, according to the specific values ​​of each profile structure parameter in each test scheme, a three-dimensional parametric model of the target device is established, and the three-dimensional parametric model of each target device is meshed.

[0067] Based on the objective function, finite element analysis is performed on the three-dimensional parametric model after meshing to obtain the objective function value corresponding to each test scheme. The final analysis data set is obtained by recording the specific values ​​of each profile structural parameter in each test scheme and the objective function value obtained by analysis.

[0068] It is important to know that in addition to using modeling for finite element analysis and calculation, a real model of the target device can be made based on the specific values ​​of each profile structure parameter in each test plan. Based on the preset test conditions, actual measurement and analysis are performed to obtain and record the objective function value of the target device in each model to obtain an analysis data set.

[0069] Step S280, optimizing each mold line structural parameter based on the analysis data set to obtain a target parameter value of each mold line structural parameter.

[0070] Specifically, a response surface model corresponding to the analysis data set is constructed, and data enhancement of the analysis data set is achieved through the response surface model. Based on the data-enhanced analysis data set, a multi-objective optimization algorithm is used to optimize each profile structural parameter to obtain the target parameter value of each profile structural parameter, thereby achieving balanced optimization between profile structural parameters.

[0071] In order to meet specific clinical needs and adapt to the complex anatomical structures and channels in the human body, medical devices are usually designed to have specific shapes with curves, bends or adjustable angles, that is, non-straight devices. However, in the prior art, only the combination functions of the various components in non-straight devices are focused on, and the line structure of the bending part is not studied and designed, while the line structure is closely related to the performance of the device. Therefore, if the line of the bending part of the device is arbitrarily formulated, it is impossible to guarantee that the device has good performance, which affects the quality of the device and its operating effect.

[0072] Compared with the prior art, the present application selects various line structure parameters of the target device, generates multiple groups of test plans corresponding to the line structure parameters, and analyzes each group of test plans based on the objective function related to the target device to obtain an analysis data set; further, based on the test data recorded in the analysis data set, the value of each line structure parameter is optimized and analyzed to obtain the optimal solution as the target parameter value of each line structure parameter, so that the target device with the optimal parameters can be constructed based on the target parameter value, reducing the vibration and local strain during the use of the device. Based on this, the problem of not being able to ensure that the device has good performance, affecting the quality of the device and its operating effect, is solved, and the line design of non-straight devices is accurately optimized, effectively improving the performance of the device.

[0073] In some embodiments, analyzing each set of experimental schemes based on the objective function to obtain a corresponding analysis data set includes the following steps:

[0074] Step S261, establishing a three-dimensional parameterized model of the target device corresponding to each set of test plans;

[0075] Step S262: Analyze and process the three-dimensional parameterized model of each target device based on the objective function to obtain a corresponding analysis data set.

[0076] Specifically, in the 3D modeling software, a 3D parametric model of the target device is established according to the specific values ​​of each profile structure parameter in each test scheme. At the same time, except for the above profile structure parameters, other parameters in each 3D parametric model are set to the same value.

[0077] Furthermore, the three-dimensional parameterized model corresponding to each test scheme is meshed, and based on the objective function, the finite element analysis is performed on the meshed three-dimensional parameterized model to obtain the objective function value corresponding to each test scheme. During the test, the specific values ​​of each profile structural parameter in each test scheme and the objective function value obtained by analysis are recorded to form an analysis data set, which includes the number of each test scheme and the corresponding profile structural parameter value and objective function value.

[0078] Through this embodiment, a three-dimensional parametric model of the target device corresponding to each group of test schemes is established, and the three-dimensional parametric model of each target device is analyzed and processed based on the objective function to obtain an accurate analysis data set.

[0079] In some embodiments, generating multiple test schemes corresponding to the profile structure parameters includes the following steps:

[0080] Step S221, obtaining a preset value range of each profile structural parameter;

[0081] Step S222, determining a plurality of test values ​​of corresponding profile structural parameters based on a preset value range;

[0082] Step S223, generating multiple groups of test plans according to various test values ​​of the profile structure parameters.

[0083] Specifically, according to historical experience information, the preset value range of each line structure parameter is obtained, and multiple test values ​​of the line structure parameter are selected within the preset value range, so that different levels of parameter values ​​can be represented by each test value. For example, when the test analysis object is an arch instrument, the preset value range of its line structure parameter α is [20,60], and the test values ​​of the line structure parameter α can be selected as 20, 40 and 60; the preset value range of the line structure parameter L1 is [15,55], and the test values ​​of the line structure parameter L1 can be selected as 15, 35 and 55; the preset value range of the line structure parameter L2 is [30,60], and the test values ​​of the line structure parameter L2 can be selected as 30, 45 and 60.

[0084] Further, an experimental design method is selected to perform experimental design on each experimental value of the profile structural parameter to obtain multiple groups of experimental schemes. The experimental design method in this embodiment includes but is not limited to central composite design (CCD), Latin hypercube experimental design and orthogonal experimental design.

[0085] It is important to know that, based on actual test requirements, different numbers of test values ​​can be selected. When the test values ​​of each profile structural parameter increase, the number of generated test schemes also increases. Therefore, based on the principle of experimental design, that is, under the condition of covering the range of combinations of various parameter values, a small number of test schemes are designed. By reasonably setting the test values ​​of profile structural parameters, the number of tests can be effectively reduced and the test efficiency can be improved.

[0086] Through this embodiment, a preset value range of each mold line structure parameter is obtained, and based on the preset value range, multiple test values ​​of the corresponding mold line structure parameter are determined, and multiple groups of test schemes are generated according to the various test values ​​of the mold line structure parameters, so that the target device can be tested with different parameter value combinations.

[0087] In some of the embodiments, analyzing and processing the three-dimensional parameterized model of each target device based on the objective function to obtain a corresponding analysis data set includes the following steps:

[0088] Meshing the three-dimensional parametric model of each target device;

[0089] Based on the objective function, the finite element analysis is performed on the three-dimensional parameterized model after meshing to obtain the objective function value corresponding to each test scheme;

[0090] According to each set of experimental schemes and the corresponding objective function value, an analysis data set is generated.

[0091] Specifically, the three-dimensional parameterized model corresponding to each test scheme is meshed. The three-dimensional parameterized model is meshed in the form of hexahedral meshes, and the global mesh size is preferably 1.5 mm, so as to improve the accuracy of model analysis and reduce the amount of analysis calculation.

[0092] After meshing the model, specify appropriate material properties for the target device structure in each 3D parametric model, set the model's constraints, external excitations and other boundary conditions, and add the objective function corresponding to the target device for finite element analysis.

[0093] For example, when the test analysis object is a bow-shaped instrument, its material property is set to structural steel; secondly, the constraints of the specified model include setting a circular constraint at the head end of the target instrument to limit its non-axial displacement, and setting the end of the target instrument as a fixed constraint; further, the external excitation of the model is specified to apply a vertical downward force of 100N at the head end plane position. On this basis, the deformation of the bow-shaped instrument in the X-axis direction and the deformation of the bow-shaped instrument in the Y-axis direction are used as objective functions for finite element calculation; wherein the X-axis direction is perpendicular to the plane where the bow-shaped instrument is located, and the Y-axis direction is perpendicular to the axial direction of the bow-shaped instrument and the X-axis direction.

[0094] It should be noted that if the test analysis object is an offset-shaped instrument, a finite element analysis method similar to the above-mentioned bow-shaped instrument can be used. The difference between the two is that different constraints and external excitations need to be used according to the actual characteristics of the offset-shaped instrument. For example, the constraint condition is to set a fixed constraint at the end of the offset-shaped instrument, and the external excitation is a preset torque value applied to the annular surface at the head end of the instrument.

[0095] Through this embodiment, the three-dimensional parametric model of each target device is meshed, and based on the objective function, the finite element analysis is performed on the meshed three-dimensional parametric model to obtain the objective function value corresponding to each group of test schemes, so that the initial analysis data set can be obtained according to each group of test schemes and the corresponding objective function value as the data basis for subsequent analysis.

[0096] In some of the embodiments, before optimizing each profile structural parameter based on the analysis data set to obtain the target parameter value of each profile structural parameter, the following steps are also included:

[0097] Step S251, constructing a response surface model corresponding to the analysis data set;

[0098] Step S252, based on the response surface model, determine the sensitivity of each profile structural parameter to the objective function.

[0099] Specifically, according to the test data under different test schemes in the analysis data set, that is, the test values ​​of each profile structural parameter in the test scheme and the corresponding objective function value, a response surface model based on the genetic aggregation algorithm is built on the ANSYS Workbench simulation integration platform. Among them, the accuracy of the response surface model can be verified by adding verification points to verify the determination coefficient, root mean square error value and other methods.

[0100] It should be noted that the response surface model is a statistical model for establishing the relationship between input variables and output responses, which predicts and optimizes the target response by performing regression analysis on the test data. The response surface model in this embodiment can be replaced by other forms of models, including but not limited to the standard response surface-full second-order polynomial model, Kriging model and non-parametric regression model.

[0101] Furthermore, according to the results of the response surface model construction, the sensitivity of each profile structural parameter to the objective function is checked to characterize the influence of each profile structural parameter on the objective function.

[0102] Through this embodiment, a response surface model corresponding to the analysis data set is constructed, and based on the response surface model, the sensitivity of each profile structural parameter to the objective function is determined, thereby quickly realizing the analysis of the influence of each parameter on the objective function.

[0103] In some of the embodiments, optimizing each profile structural parameter based on the analysis data set to obtain a target parameter value of each profile structural parameter includes the following steps:

[0104] Data augmentation of analytical datasets through response surface modeling;

[0105] Based on the data-enhanced analysis data set, a multi-objective optimization algorithm is used to optimize each mold line structure parameter to obtain the target parameter value of each mold line structure parameter.

[0106] Specifically, by building a response surface model corresponding to the analysis data set, data enhancement is achieved for the analysis data set, and then a multi-objective optimization algorithm is used to process the data-enhanced analysis data set to optimize each profile line structure parameter and obtain the target parameter value of each profile line structure parameter. The multi-objective optimization algorithm in this embodiment includes but is not limited to a multi-objective genetic algorithm and a particle swarm optimization algorithm.

[0107] It is important to know that when there are multiple objective functions for the target device, the principle of using the algorithm for optimization is to obtain a set of non-inferior solutions, namely the Pareto optimal frontier, through the multi-objective optimization algorithm analysis, where each group of non-inferior solutions achieves the best balance between multiple objective functions. At this time, since it is feasible to select any solution from the Pareto optimal frontier range, the user can select the optimal solution corresponding to a certain objective function as the final target parameter value based on the preference for each objective function.

[0108] In addition, if the target device has only a single objective function, algorithms such as quadratic Lagrangian nonlinear programming and mixed integer sequence quadratic programming can be used as the optimization algorithm of this embodiment.

[0109] Through this embodiment, the analysis data set is enhanced through the response surface model, and based on the data-enhanced analysis data set, a multi-objective optimization algorithm is used to optimize each mold line structure parameter to obtain the target parameter value of each mold line structure parameter, thereby achieving balanced optimization of multiple mold line structure parameters, so that the target device constructed based on the target parameter value can achieve the best overall performance state.

[0110] In some of the embodiments, after optimizing each profile line structural parameter based on the analysis data set and obtaining the target parameter value of each profile line structural parameter, the following steps are included:

[0111] Step S291, input the target parameter value of each profile structural parameter into the three-dimensional modeling software to construct the target instrument model.

[0112] Specifically, after obtaining the target parameter value of each profile line structural parameter, the target parameter value of each profile line structural parameter is imported into a three-dimensional modeling software for modeling to obtain a target device model, thereby completing the profile line design of the target device.

[0113] It should be noted that the target instruments in this embodiment include arcuate instruments, offset instruments and other non-straight instruments. Among them, the front end and the rear end of the arcuate instrument are colinear. For example, the shell structure of a typical arcuate acetabular cup inserter has a simplified structure as shown in FIG. Figure 4 As shown, Figure 4 The median line structure parameter α is the angle between the axis of the second transmission rod 220 and the axis of the first transmission rod 210, the line structure parameter L1 is the distance between the axis of the third transmission rod 230 and the axis of the first transmission rod 210, and the line structure parameter L2 is the axis length of the third transmission rod 230; and the front end and the end axis of the offset instrument are parallel and not colinear, including the offset acetabular rasp connecting rod structure, etc., and its simplified structure is as follows Figure 5 As shown, Figure 5 The midline structural parameter α is the angle between the axis of the fifth transmission rod 250 and the axis of the fourth transmission rod 240 , the parameter L1 is the distance between the axis of the sixth transmission rod 260 and the axis of the fourth transmission rod 240 , and the parameter L2 is the axis length of the sixth transmission rod 260 .

[0114] In addition to the above-mentioned arched instruments and offset instruments, the optimization method of the profile structural parameters is also applicable to other non-straight instruments, and the profile structural parameters to be optimized are selected according to the application requirements of different non-straight instruments. Each profile structural parameter is used to describe the shape or curve characteristics of the instrument, including but not limited to the axial length of each transmission rod and the angle between the axes of the transmission rods. For example, please refer to Figure 6 The length a and length b marked in the figure are the axial lengths of different transmission rods, while the angle c and angle d are the angles between the axes of different transmission rods.

[0115] Through this embodiment, the target parameter value of each profile structural parameter is input into the three-dimensional modeling software to construct a target device with optimal parameters, reduce vibration and local strain during the use of the device, thereby increasing the life of the device and significantly improving the performance of the device.

[0116] The present embodiment is described and illustrated by means of specific examples below.

[0117] Figure 7 Schematic diagram of the structure of the arched acetabular cup inserter of this embodiment. Figure 7As shown, the bow-shaped acetabular cup driver comprises: an installer connecting rod 100, one end of which is connected to a striking handle; a driver housing 200, which is respectively connected to the other end of the installer connecting rod 100 and a driver transmission head 500; a locking handle 300, which is used to prevent the acetabular cup from falling off during operation; a driver joint cover 400, which is used to connect the acetabular cup; and a driver transmission head 500, which is used to transmit the striking force to the acetabular cup.

[0118] It should be noted that the difference between the arcuate acetabular cup driver and the straight acetabular cup driver is that the driver housing 200 of the arcuate acetabular cup driver is set to an arcuate shape, and in order to improve the transmission effect of the striking force, the front end and the rear end of the driver housing 200 are designed to be coaxial, and the arcuate part is symmetrical. Based on this, the driver housing 200 is used as the model line design object in this embodiment.

[0119] First, according to the structural characteristics of the driver housing 200, multiple profile structural parameters that have a significant impact on driver performance are selected, including parameters α, L1, and L2. Figure 4 The profile structure parameter α refers to the angle between the axis of the second transmission rod 220 and the axis of the first transmission rod 210 in the driver housing 200, the profile structure parameter L1 refers to the distance between the axis of the third transmission rod 230 and the axis of the first transmission rod 210, and the profile structure parameter L2 refers to the length of the axis of the third transmission rod 230.

[0120] In order to reduce the strong vibration of the driver housing 200 during operation through profile design, the selected objective function includes the deformation of the driver housing 200 in the X-axis direction and the deformation of the driver housing 200 in the Y-axis direction; wherein, the axial direction of the driver housing 200 refers to the direction of the axis of the first transmission rod 210, the X-axis direction is a direction perpendicular to the plane where the driver housing 200 is located, and the Y-axis direction is a direction perpendicular to the axial direction of the driver housing 200 and the X-axis direction.

[0121] Secondly, according to historical experience information, the preset value range of each profile structural parameter is obtained, and multiple test values ​​of the profile structural parameter are selected within the preset value range, so that different levels of parameter values ​​are represented by each test value. Among them, the preset value range of the profile structural parameter α is [20,60], and the test values ​​of the profile structural parameter α are selected as 20, 40 and 60; the preset value range of the profile structural parameter L1 is [15,55], and the test values ​​of the profile structural parameter L1 are selected as 15, 35 and 55; the preset value range of the profile structural parameter L2 is [30,60], and the test values ​​of the profile structural parameter L1 are selected as 30, 45 and 60.

[0122] The experimental design method is selected to perform experimental design on each experimental value of the profile structure parameter to obtain multiple groups of experimental schemes. The experimental design method in this embodiment includes but is not limited to central composite design, Latin hypercube experimental design and orthogonal experimental design.

[0123] Here, please refer to Table 1. Taking the central composite design method as an example, the experimental design is performed on the profile structure parameters α, L1 and L2 to generate the final multi-group experimental plan.

[0124] Table 1

[0125] Protocol No. α L1 L2 1 40 35 45 2 20 35 45 3 60 35 45 4 40 15 45 5 40 55 45 6 40 35 30 7 40 35 60 8 20 15 30 9 60 15 30 10 20 55 30 11 60 55 30 12 20 15 60 13 60 15 60 14 20 55 60 15 60 55 60

[0126] Furthermore, a three-dimensional modeling software is used to establish a three-dimensional parametric model of the driver housing 200 according to the specific values ​​of each profile structure parameter in each test scheme. Meanwhile, in addition to the above-mentioned profile structure parameters, other parameters in each three-dimensional parametric model are set to the same value.

[0127] The three-dimensional parametric model corresponding to each test scheme is meshed. The three-dimensional parametric model is meshed in the form of hexahedral meshes, and the global mesh size is preferably 1.5 mm, so as to improve the accuracy of model analysis and reduce the amount of analysis calculation.

[0128] Afterwards, the material properties of the impactor shell 200 in each three-dimensional parametric model were set to structural steel; the constraint condition of the model was specified as a front-end annular constraint to limit its non-axial displacement, and the end was a fixed constraint; the external excitation of the model was specified to apply a vertical downward force of 100N at the front-end plane position; and the deformation of each impactor shell model in the X-axis direction and the deformation of each impactor shell model in the Y-axis direction were used as objective functions for finite element calculation to obtain the objective function value corresponding to each set of test schemes.

[0129] During the test, the specific values ​​of each profile structural parameter in each test scheme and the objective function value obtained by analysis are recorded to form an analysis data set. Please refer to Table 2, which includes the number of each test scheme and the corresponding profile structural parameter value and objective function value.

[0130] Table 2

[0131] Protocol No. α L1 L2 X-axis Y-axis 1 40 35 45 5.00E-08 1.00E-10 2 20 35 45 2.80E-07 6.00E-09 3 60 35 45 1.90E-07 8.30E-08 4 40 15 45 2.30E-07 8.40E-09 5 40 55 45 1.70E-07 8.20E-09 6 40 35 30 1.70E-07 2.00E-09 7 40 35 60 1.80E-07 8.10E-09 8 20 15 30 1.20E-07 7.90E-09 9 60 15 30 2.00E-07 3.00E-09 10 20 55 30 8.00E-08 1.00E-09 11 60 55 30 2.20E-07 8.20E-09 12 20 15 60 1.40E-07 7.80E-09 13 60 15 60 3.30E-07 6.00E-08 14 20 55 60 3.50E-07 1.00E-09 15 60 55 60 4.00E-06 5.00E-09

[0132] Based on the analysis of the data set, the corresponding response surface model is constructed, and according to the results of the response surface model construction, the sensitivity of each profile structure parameter to the objective function is checked to characterize the influence of each profile structure parameter on the objective function. Figure 8As shown in the figure, the parameter α is negatively correlated with the deformation in the X-axis direction, the parameters L1 and L2 are positively correlated with the deformation in the X-axis direction, and the sensitivity of each profile structure parameter to the objective function is similar, that is, the degree of influence is similar; while the parameter L1 is negatively correlated with the deformation in the Y-axis direction, the parameters α and L2 are positively correlated with the deformation in the Y-axis direction, and the profile structure parameter α is more sensitive to the objective function, that is, the degree of influence is greater.

[0133] In addition, by building a response surface model corresponding to the analysis data set, data enhancement of the analysis data set is achieved. A multi-objective genetic algorithm is used to process the data-enhanced analysis data set to optimize each profile structure parameter and obtain the target parameter value of each profile structure parameter, so as to achieve balanced optimization between each profile structure parameter and achieve the best overall performance.

[0134] In this embodiment, the best parameter combination obtained by optimization is that the value of the profile structure parameter α is 37.66, the value of the profile structure parameter L1 is 54.99, and the value of the profile structure parameter L2 is 31.86. The target parameter value of each profile structure parameter is imported into the three-dimensional modeling software for modeling, and the corresponding impactor shell model is obtained, thereby completing the profile design of the impactor shell 200, effectively reducing the vibration intensity generated by the impactor shell 200 during operation.

[0135] The present embodiment is described and illustrated below through preferred embodiments.

[0136] Fig. 9 FIG. 1 is a flow chart of a method for designing a profile of a non-straight instrument according to a preferred embodiment of the present invention. Fig. 9 As shown, the profile design method of the non-straight instrument includes the following steps:

[0137] Step S910, determining various line structure parameters of the target device, and generating multiple groups of test plans corresponding to the line structure parameters;

[0138] Step S920, determining multiple objective functions of the target device, the objective functions including the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction;

[0139] Step S930, establishing a three-dimensional parametric model of the target device corresponding to each group of test schemes, meshing the three-dimensional parametric model of each target device, and performing finite element analysis on the meshed three-dimensional parametric model based on the objective function to obtain the objective function value corresponding to each group of test schemes;

[0140] Step S940, generating an analysis data set according to each set of test schemes and the corresponding objective function value;

[0141] Step S950, enhancing the analysis data set by using a response surface model, and optimizing each profile structural parameter by using a multi-objective optimization algorithm based on the enhanced analysis data set to obtain a target parameter value for each profile structural parameter;

[0142] Step S960, inputting the target parameter value of each profile structural parameter into the three-dimensional modeling software to construct the target instrument model.

[0143] Through this embodiment, various line structure parameters of the target device are selected, and multiple test values ​​of the line structure parameters are determined within the preset value range of each line structure parameter; multiple groups of test schemes are generated according to the test values ​​of the line structure parameters, and then a three-dimensional parametric model of the target device corresponding to each group of test schemes is established; the three-dimensional parametric model of each target device is meshed, and the finite element analysis is performed on the meshed three-dimensional parametric model to obtain the objective function value corresponding to each group of test schemes, so that according to each group of test schemes and the corresponding objective function value, an initial analysis data set can be obtained as the data basis for subsequent analysis.

[0144] Furthermore, the response surface model was used to enhance the analysis data set. Based on the enhanced analysis data set, a multi-objective optimization algorithm was used to optimize each line structure parameter to obtain the target parameter value of each line structure parameter, and to achieve balanced optimization between each line structure parameter. Based on this, the target parameter value of each line structure parameter was input into the 3D modeling software to construct a target instrument model with the best overall performance, which solved the problem of not being able to ensure the good performance of the instrument, affecting the quality of the instrument and its operating effect, and achieved accurate optimization of the line design of non-straight instruments, effectively improving the performance of the instrument.

[0145] It should be noted that the steps shown in the above process or the flowchart in the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0146] In this embodiment, a device for designing the line of a non-straight instrument is also provided, which is used to implement the above-mentioned embodiments and preferred implementation modes, and the descriptions that have been made will not be repeated. The terms "module", "unit", "subunit", etc. used below can implement a combination of software and / or hardware for a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, the implementation of hardware, or a combination of software and hardware, is also possible and conceivable.

[0147] Fig.10 : is a structural block diagram of the profile design device for non-straight instruments of this embodiment, such as Fig.10 As shown, the device includes: a generation module 10, an analysis module 20, a test module 30 and an optimization module 40;

[0148] A generating module 10, for determining various profile structural parameters of the target device, and generating a plurality of test schemes corresponding to the profile structural parameters;

[0149] The analysis module 20 is used to determine multiple objective functions of the target device, the objective functions including the deformation and / or local strain of the target device in the X-axis direction, and the deformation and / or local strain of the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction;

[0150] The test module 30 is used to analyze each set of test schemes based on the objective function to obtain a corresponding analysis data set;

[0151] The optimization module 40 is used to optimize each profile structural parameter based on the analysis data set to obtain a target parameter value for each profile structural parameter.

[0152] Through the device provided in this embodiment, various line structure parameters of the target instrument are determined, and multiple groups of test schemes corresponding to the line structure parameters are generated; multiple objective functions of the target instrument are determined, and the objective function includes the deformation and / or local strain generated by the target instrument in the X-axis direction, and the deformation and / or local strain generated by the target instrument in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target instrument is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target instrument and the X-axis direction; each group of test schemes is analyzed based on the objective function to obtain a corresponding analysis data set; further, each line structure parameter is optimized based on the analysis data set to obtain a target parameter value for each line structure parameter, which solves the problem that the instrument cannot be guaranteed to have good performance, affecting the quality of the instrument and its operating effect, and realizes accurate optimization of the line design of non-straight instruments, effectively improving the performance of the instrument.

[0153] In some of these embodiments, Fig.10 On the basis of, the device also includes an establishment module for establishing a three-dimensional parametric model of the target device corresponding to each group of test schemes; based on the objective function, the three-dimensional parametric model of each target device is analyzed and processed to obtain a corresponding analysis data set.

[0154] In some of these embodiments, Fig.10On the basis of, the device also includes a design module, which is used to obtain a preset value range of each mold line structure parameter; based on the preset value range, determine multiple test values ​​of the corresponding mold line structure parameter; and generate multiple groups of test schemes according to each test value of the mold line structure parameter.

[0155] In some of these embodiments, Fig.10 On the basis of, the device also includes a finite element analysis module, which is used to mesh the three-dimensional parametric model of each target device; based on the objective function, finite element analysis is performed on the meshed three-dimensional parametric model to obtain the objective function value corresponding to each group of test schemes; according to each group of test schemes and the corresponding objective function value, an analysis data set is generated.

[0156] In some of these embodiments, Fig.10 On the basis of, the device also includes an evaluation module for constructing a response surface model corresponding to the analysis data set; based on the response surface model, the sensitivity of each profile structure parameter to the objective function is determined.

[0157] In some of these embodiments, Fig.10 On the basis of, the device also includes an optimization module for performing data enhancement on the analysis data set through a response surface model; based on the analysis data set after data enhancement, a multi-objective optimization algorithm is used to optimize each mold line structure parameter to obtain a target parameter value of each mold line structure parameter.

[0158] In some of these embodiments, Fig.10 On the basis of this, the device also includes a construction module for inputting the target parameter value of each profile structure parameter into the three-dimensional modeling software to construct a target device model.

[0159] It should be noted that the above modules can be functional modules or program modules, and can be implemented by software or hardware. For modules implemented by hardware, the above modules can be located in the same processor; or the above modules can be located in different processors in any combination.

[0160] In this embodiment, a computer device is further provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.

[0161] Optionally, the computer device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.

[0162] It should be noted that the specific examples in this embodiment can refer to the examples described in the above embodiments and optional implementation modes, and will not be repeated in this embodiment.

[0163] In addition, in combination with the non-straight instrument type line design method provided in the above embodiments, a storage medium can also be provided in this embodiment to implement the method. The storage medium stores a computer program; when the computer program is executed by a processor, any non-straight instrument type line design method in the above embodiments is implemented.

[0164] It should be understood that the specific embodiments described herein are only used to explain the application, rather than to limit it. Based on the embodiments provided in this application, all other embodiments obtained by ordinary technicians in this field without creative work are within the protection scope of this application.

[0165] Obviously, the drawings are only some examples or embodiments of the present application. For ordinary technicians in the field, the present application can also be applied to other similar situations based on these drawings without creative work. In addition, it is understandable that although the work done in this development process may be complicated and lengthy, for ordinary technicians in the field, certain changes in design, manufacturing or production based on the technical content disclosed in this application are only conventional technical means and should not be regarded as insufficient content disclosed in this application.

[0166] The term "embodiment" in this application refers to a specific feature, structure or characteristic described in conjunction with the embodiment that can be included in at least one embodiment of the present application. The appearance of this phrase in various locations in the specification does not necessarily mean the same embodiment, nor does it mean that it is mutually exclusive with other embodiments and is independent or optional. It is clearly or implicitly understood by those of ordinary skill in the art that the embodiments described in this application can be combined with other embodiments without conflict.

[0167] The above-mentioned embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of patent protection. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the scope of protection of the present application. Therefore, the scope of protection of the present application shall be subject to the attached claims.

Claims

1. A method for designing a profile of a non-straight instrument, characterized in that: The method comprises: Determine various profile structural parameters of the target device, and generate multiple groups of test plans corresponding to the profile structural parameters; Determine a plurality of objective functions of the target device, wherein the objective functions include the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction; Analyze each group of the test schemes based on the objective function to obtain a corresponding analysis data set; Each of the profile line structural parameters is optimized based on the analysis data set to obtain a target parameter value of each of the profile line structural parameters.

2. The method for designing a profile of a non-straight instrument according to claim 1, characterized in that: The step of analyzing each group of the test schemes based on the objective function to obtain a corresponding analysis data set includes: Establishing a three-dimensional parameterized model of the target device corresponding to each group of the test schemes; The three-dimensional parameterized model of each target device is analyzed and processed based on the objective function to obtain a corresponding analysis data set.

3. The method for designing a profile of a non-straight instrument according to claim 1, characterized in that: The generating of multiple test schemes corresponding to the profile structure parameters comprises: Obtaining a preset value range of each of the profile structural parameters; Based on the preset value range, determining a plurality of test values ​​of the corresponding profile structural parameters; According to the test values ​​of the profile structural parameters, a plurality of groups of test plans are generated.

4. The method for designing a profile of a non-straight instrument according to claim 2, characterized in that: The three-dimensional parameterized model of each target device is analyzed and processed based on the objective function to obtain a corresponding analysis data set, including: Meshing the three-dimensional parameterized model of each target device; Based on the objective function, finite element analysis is performed on the three-dimensional parameterized model after meshing to obtain the objective function value corresponding to each group of the test schemes; The analysis data set is generated according to each group of the test schemes and the corresponding objective function values.

5. The method for designing a profile of a non-straight instrument according to claim 1, characterized in that: Before optimizing each of the profile structural parameters based on the analysis data set to obtain a target parameter value of each profile structural parameter, the method further includes: constructing a response surface model corresponding to the analysis data set; Based on the response surface model, the sensitivity of each of the profile structural parameters to the objective function is determined.

6. The method for designing a profile of a non-straight instrument according to claim 5, characterized in that: The step of optimizing each of the profile structure parameters based on the analysis data set to obtain a target parameter value of each profile structure parameter includes: performing data enhancement on the analysis data set by using the response surface model; Based on the analysis data set after data enhancement, a multi-objective optimization algorithm is used to optimize each of the profile line structural parameters to obtain a target parameter value for each of the profile line structural parameters.

7. The method for designing a profile of a non-straight instrument according to claim 1, characterized in that: After optimizing each of the profile line structural parameters based on the analysis data set to obtain a target parameter value of each profile line structural parameter, the method includes: The target parameter value of each of the profile structural parameters is input into the three-dimensional modeling software to construct the target device model.

8. The method for designing a profile of a non-straight instrument according to claim 1, characterized in that: The non-straight instruments include arched instruments or offset instruments; The front end and the rear end of the arcuate instrument are co-linear, and the front end and the rear end of the offset instrument are parallel and non-co-linear.

9. A device for designing the profile of a non-straight instrument, characterized in that: The device comprises: a generation module, an analysis module, a test module and an optimization module; The generating module is used to determine various profile structural parameters of the target device and generate multiple groups of test plans corresponding to the profile structural parameters; The analysis module is used to determine a plurality of objective functions of the target device, wherein the objective functions include the deformation and / or local strain generated by the target device in the X-axis direction, and the deformation and / or local strain generated by the target device in the Y-axis direction; wherein the X-axis direction is a direction perpendicular to the plane where the target device is located, and the Y-axis direction is a direction perpendicular to the axial direction of the target device and the X-axis direction; The test module is used to analyze each group of the test schemes based on the objective function to obtain a corresponding analysis data set; The optimization module is used to optimize each of the mold line structural parameters based on the analysis data set to obtain a target parameter value for each of the mold line structural parameters.

10. A computer device comprising a memory and a processor, characterized in that: A computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps of the method for designing a profile of a non-straight instrument according to any one of claims 1 to 8.

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