Wire harness testing device and method

Abstract

The invention relates to a wire harness testing device and method. The wire harness testing device comprises a controller and a wiring board. The wiring board comprises a plurality of test channels, and each test channel is connected with the controller; the test channel is used for connecting a test wire harness; and the controller is used for testing the test wire harness based on the test information and the test channel. According to the invention, the wire harness can be automatically tested, so that the test efficiency and the test reliability are improved.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a wiring harness testing device and method. Background Art

[0002] With the development of new energy technologies, batteries have become an indispensable energy storage device in people's lives. In the field of electric vehicles, power batteries are usually connected to dozens of wiring harnesses, and each wiring harness needs to complete different types of short-circuit tests, open-circuit tests, etc. At present, wiring harness testing mainly relies on manual operation, which has extremely low test efficiency and poor reliability. Summary of the invention

[0003] Based on the above problems, the present application provides a wire harness testing device and method, which can automatically test the wire harness, thereby improving the testing efficiency and testing reliability.

[0004] In a first aspect, the present application provides a wiring harness testing device. The wiring harness testing device includes a controller and a wiring board; the wiring board includes a plurality of test channels, each of which is connected to the controller; the test channel is used to connect a test harness; and the controller is used to test the test harness based on test information and the test channel.

[0005] In the technical solution of the embodiment of the present application, after the tester connects the test harness to the test channel of the wiring board, the harness testing device can automatically perform multiple tests on the test harness, thereby improving the test efficiency and test reliability.

[0006] In some embodiments, the test channel includes a first switch circuit, an input interface, and an output interface; the first switch circuit is connected to the controller, the input interface, the output interface, and the external device respectively; the input interface is used to connect the test harness; the output interface is used to connect the external load; the first switch circuit is used to connect or disconnect the connection between the test harness and the external load, and connect or disconnect the connection between the test harness and the external device under the control of the controller. In the technical solution of the embodiment of the present application, the controller can automatically test the test harness connected to the input interface by controlling the first switch circuit, thereby improving the test efficiency and test reliability.

[0007] In some embodiments, the test channel further includes a second switch circuit, which is respectively connected to the controller, the first switch circuit and the external device; the second switch circuit is used to connect or disconnect the first switch circuit and the external device under the control of the controller. In the technical solution of the embodiment of the present application, the controller can simulate the connection or disconnection of the test harness with the external device and the connection or disconnection of the test harness with the external load by controlling the first switch circuit and the second switch circuit, thereby automatically performing short circuit testing, open circuit testing, etc. on the test harness, thereby improving test efficiency and test reliability.

[0008] In some embodiments, the first switch circuit includes a first switch and a second switch; the first switch is respectively connected to the controller, the input interface and the second switch circuit, and the second switch is respectively connected to the controller, the input interface and the output interface; the first switch is used to connect or disconnect the test harness and the second switch circuit under the control of the controller; the second switch is used to connect or disconnect the test harness and the external load under the control of the controller. In the technical solution of the embodiment of the present application, the controller can simulate the connection or disconnection of the test harness with the external device by controlling the first switch, and simulate the connection or disconnection of the test harness with the external load by controlling the second switch, thereby automatically performing short circuit testing, open circuit testing, etc. on the test harness, thereby improving the test efficiency and test reliability.

[0009] In some embodiments, the second switch circuit includes a first group of switches and a second group of switches; the first group of switches are respectively connected to the controller, the external device and the second group of switches, and the second group of switches are respectively connected to the controller, the first group of switches and the first switch; the first group of switches is used to turn on or off the connection between the second group of switches and the external device under the control of the controller; the second group of switches is used to turn on or off the connection between the first group of switches and the first switch under the control of the controller. In the technical solution of the embodiment of the present application, the controller can simulate the connection or disconnection of the test harness with the external device by controlling the first switch, the first group of switches and the second group of switches, thereby automatically performing a short circuit test on the test harness, thereby improving the test efficiency and test reliability.

[0010] In some embodiments, the first group of switches includes a third switch and a fourth switch; the second group of switches includes a fifth switch and a sixth switch; the third switch is respectively connected to the controller, the power supply terminal of the external device and the fifth switch; the fourth switch is respectively connected to the controller, the ground terminal of the external device and the sixth switch; the fifth switch is also respectively connected to the controller and the first switch; the sixth switch is also respectively connected to the controller and the first switch. In the technical solution of the embodiment of the present application, the controller controls each switch according to the test type, simulates a variety of test scenarios, realizes a variety of short circuit tests and a variety of open circuit tests, and can automatically test each test harness. Therefore, testing a large number of test harnesses can significantly improve the test efficiency.

[0011] In some embodiments, the terminal block also includes a positive electrode interface and a negative electrode interface; the positive electrode interface is arranged at the common end of the third switch and the fifth switch; the negative electrode interface is arranged at the common end of the fourth switch and the sixth switch; the positive electrode interface is used to connect the positive electrode of the preset power supply; the negative electrode interface is used to connect the negative electrode of the preset power supply.

[0012] In the technical solution of the embodiment of the present application, the wiring harness testing device can be connected to a preset power supply through the positive interface and the negative interface. On the one hand, it can provide power for the wiring harness testing device to perform self-test, and on the other hand, it can also provide power for external devices.

[0013] In some embodiments, each test channel is also provided with an indicator light and a seventh switch; the control contact of the third switch is connected to the positive electrode interface, the first contact of the third switch is connected to the power supply terminal of the external device, and the second contact of the third switch is connected to the seventh switch; the seventh switch is also connected to the controller and the indicator light respectively; the indicator light is also connected to the second contact of the second switch; the control contact of the second switch is connected to the first switch, and the first contact of the second switch is connected to the output interface; the control contact of the fourth switch is connected to the negative electrode interface, and the first contact of the fourth switch is connected to the ground terminal of the external device. In the technical solution of the embodiment of the present application, the controller can control each switch according to the self-check control logic, and detect the switch according to the situation of the indicator light to reduce the situation of test errors caused by switch abnormalities, thereby improving the test reliability.

[0014] In some embodiments, the harness test device further includes an input component; the controller is connected to the input component; and the input component is used to receive input operations for the test harness and test information. In the technical solution of the embodiment of the present application, the input component provides an input interface for the tester, and the tester can set the test harness and test type according to the requirements, thereby realizing customization and personalization of the test.

[0015] In some embodiments, the input component includes a touch screen; the touch screen is used to display the test interface and receive input operations, and the test interface is provided with an interface selection control and a test type setting control. In the technical solution of the embodiment of the present application, the use of the touch screen can not only intuitively display the test interface, but also the way of receiving input operations is relatively simple and easy to implement.

[0016] In the second aspect, the present application also provides a wiring harness testing method, which is applied to the wiring harness testing device of the first aspect, and the method includes: after the wiring harness testing device is connected to the test harness, obtaining test information of the test harness; and testing the test harness based on the test information and the test channel of the wiring harness testing device.

[0017] In the technical solution of the embodiment of the present application, after the tester connects the test harness to the test channel of the wiring board, the harness testing device can automatically perform multiple tests on the test harness, thereby improving the test efficiency and test reliability.

[0018] In some embodiments, the test harness is tested based on the test information and the test channel of the harness test device, including: determining the state of the external device based on the test information, and controlling the first set of switches of the harness test device according to the state of the external device; determining the state of the external load based on the test information, and controlling the first switch and the second switch of the test channel according to the state of the external load; determining the short-circuit test type based on the test information, and controlling the second set of switches of the harness test device according to the short-circuit test type. In the technical solution of the embodiment of the present application, the harness test device is controlled according to the channel control logic, and can automatically perform a short-circuit test on the test harness, thereby improving the test efficiency and test reliability.

[0019] In some embodiments, testing the test harness based on the test information and the test channel of the harness test device includes: determining the open circuit test type based on the test information; and controlling the second switch of the test channel according to the open circuit test type. In the technical solution of the embodiment of the present application, the harness test device is controlled according to the channel control logic, and can automatically perform an open circuit test on the test harness, thereby improving the test efficiency and test reliability.

[0020] In some embodiments, the method further includes: detecting the first group of switches, the second group of switches and the first switch and the second switch in each test channel in the wiring harness test device according to the self-check control logic, respectively, to obtain a detection result. In the technical solution of the embodiment of the present application, the wiring harness test device can detect each switch according to the self-check control logic, reduce the situation of test errors caused by switch abnormalities, and thus improve the test reliability.

[0021] In a third aspect, the present application further provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and wherein the processor implements the steps of the method described in the second aspect when executing the computer program.

[0022] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the steps of the method described in the second aspect.

[0023] In a fifth aspect, the present application further provides a computer program product, comprising a computer program, characterized in that when the computer program is executed by a processor, the steps of the method described in the second aspect are implemented. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Various other advantages and benefits will become apparent to those of ordinary skill in the art by reading the detailed description of the optional embodiments below. The accompanying drawings are only used for the purpose of illustrating the optional embodiments and are not to be considered as limiting the present application. Moreover, the same reference numerals are used throughout the drawings to represent the same components. In the drawings:

[0025] Figure 1 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0026] Figure 2 This is a schematic diagram of the structure of a test channel according to an embodiment of the present application;

[0027] Figure 3 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0028] Figure 4 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0029] Figure 5 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0030] Figure 6 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0031] Figure 7 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0032] Figure 8 A schematic diagram of the structure of a self-test circuit according to an embodiment of the present application;

[0033] Fig. 9 A schematic diagram of a wiring board according to an embodiment of the present application;

[0034] Fig.10This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0035] Fig.11 This is a structural schematic diagram of a wiring harness testing device according to an embodiment of the present application;

[0036] Fig.12 A schematic diagram of a test interface according to an embodiment of the present application;

[0037] Fig.13 A schematic diagram of a wiring harness testing method according to an embodiment of the present application;

[0038] Fig.14 This is one of the flowchart diagrams of the steps of testing a test harness according to an embodiment of the present application;

[0039] Fig.15a This is one of the schematic diagrams of testing a test harness according to an embodiment of the present application;

[0040] Fig.15b This is a second schematic diagram of testing a test harness according to an embodiment of the present application;

[0041] Fig.15c This is a third schematic diagram of testing a test harness according to an embodiment of the present application;

[0042] Fig.16 The second flowchart of the steps of testing a test harness according to an embodiment of the present application is shown;

[0043] Fig.17 This is a fourth schematic diagram of testing a test harness according to an embodiment of the present application;

[0044] Fig.18 A structural block diagram of an electronic device according to an embodiment of the present application;

[0045] Description of reference numerals:

[0046] Wire harness test equipment 10, external equipment 20, external load 30;

[0047] Controller 11, wiring board 12, input component 13;

[0048] A test channel 120, a first switch circuit 121, and a second switch circuit 122;

[0049] Input interface IO1, output interface IO2, positive interface IO+, negative interface IO-;

[0050] A first switch group 1221, a second switch group 1222, a first switch Km, and a second switch Kn;

[0051] A third switch Ka, a fourth switch Kb, a fifth switch Kc, a sixth switch Kd, and a seventh switch Ke;

[0052] Indicator light Led, current limiting resistor R. DETAILED DESCRIPTION

[0053] The following embodiments of the technical solution of the present application will be described in detail in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solution of the present application, and are therefore only used as examples, and cannot be used to limit the scope of protection of the present application.

[0054] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.

[0055] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.

[0056] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.

[0057] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.

[0058] In the description of the embodiments of the present application, the term "multiple" refers to more than two (including two). Similarly, "multiple groups" refers to more than two groups (including two groups), and "multiple pieces" refers to more than two pieces (including two pieces).

[0059] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.

[0060] With the development of new energy technologies, batteries have become an indispensable energy storage device in people's lives. In the field of electric vehicles, power batteries are usually connected to dozens of wiring harnesses, and each wiring harness needs to complete different types of short-circuit tests, open-circuit tests, etc. For example, there are 8 types of short-circuit tests depending on whether power is supplied, whether the load is connected, and the location of the short-circuit point; there are 2 types of open-circuit tests depending on the number of open-circuit times. At present, for so many wiring harnesses and test types, manual operation is mainly relied on, with extremely low test efficiency and poor reliability.

[0061] The embodiment of the present application provides a wire harness test device, which includes a controller and a wiring board; the wiring board includes multiple test channels, each of which is connected to the controller; the test channel is connected to the test harness, and the controller tests the test harness based on the test information and the test channel. In the technical solution of the embodiment of the present application, after the tester connects the test harness to the test channel of the wiring board, the wire harness test device can automatically perform multiple tests on the test harness, thereby improving the test efficiency and test reliability.

[0062] According to some embodiments of the present application, referring to Figure 1 , provides a wiring harness testing device, the wiring harness testing device 10 includes a controller 11 and a wiring board 12; the wiring board 12 includes a plurality of test channels 120, each test channel 120 is connected to the controller 11; the test channel 120 is used to connect the test wiring harness; the controller 11 is used to test the test wiring harness based on the test information and the test channel 120.

[0063] The test information may include at least one of a test type and a channel identifier; the test type corresponds to the channel control logic of the controller 11, and the test type includes a short circuit test type and an open circuit test type; and the channel identifier corresponds to the test harness.

[0064] In the embodiment of the present application, the wiring harness testing device 10 includes a controller 11 and a wiring board 12, and the wiring board 12 includes a plurality of test channels 120, each of which is connected to the controller 11. One test channel 120 can be connected to one test harness, so the wiring board 12 can be connected to multiple test harnesses through multiple test channels 120.

[0065] After the tester connects the test harness to the wiring board 12, the controller 11 can obtain the test information, determine the test harness to be tested according to the channel identification of the test information, and determine the channel control logic of the controller 11 according to the test type. For example, if the channel identification is channel 1, the test harness is the harness connected to channel 1; if the test type is short circuit test 1, the controller 11 determines how to control the test channel 120 according to short circuit test 1.

[0066] After determining the test harness and the channel control logic, the controller 11 performs a short circuit test and / or an open circuit test on the test harness according to the channel control logic.

[0067] In the above embodiment, the harness test device includes a controller and a wiring board, the test channel is connected to the test harness, and the controller tests the test harness based on the test information and the test channel. In the technical solution of the embodiment of the present application, after the tester connects the test harness to the test channel of the wiring board, the harness test device can automatically perform multiple tests on the test harness, thereby improving the test efficiency and test reliability.

[0068] According to some embodiments of the present application, referring to Figure 2 The test channel 120 includes a first switch circuit 121, an input interface IO1 and an output interface IO2; the first switch circuit 121 is connected to the controller 11, the input interface IO1, the output interface IO2 and the external device 20 respectively; the input interface IO1 is used to connect the test harness; the output interface IO2 is used to connect the external load 30; the first switch circuit 121 is used to connect or disconnect the connection between the test harness and the external load 30, and connect or disconnect the connection between the test harness and the external device 20 under the control of the controller 11. It should be noted that Figure 2 The connection relationship of the controller is not shown.

[0069] In the embodiment of the present application, when testing the test harness, it is usually necessary to combine the external device 20 and the external load 30, simulate the test harness connecting the external device (Device Under Test, DUT) 20 and disconnecting the external device 20, and the test harness connecting the external load 30 and disconnecting the external load 30, and realize various tests such as short circuit test and open circuit test. The tester connects one end of the test harness to the input interface IO1 and the other end to the external device 20; and connects the external load 30 to the output interface IO2.

[0070] A first switch circuit 121, an input interface IO1, and an output interface IO2 are provided in each test channel 120. The first switch circuit 121 is connected to the controller 11, the input interface IO1, the output interface IO2, and the external device 20, respectively. During the test, the controller 11 sends a control signal to the first switch circuit 121 according to the test type, and the first switch circuit 121 conducts the connection between the test harness and the external load 30, or cuts off the connection between the test harness and the external load 30 according to the control signal; the first switch circuit 121 can also conduct the connection between the test harness and the external device 20, or cut off the connection between the test harness and the external device 20 according to the control signal.

[0071] For example, if the test type is open circuit once, the controller 11 controls the first switch circuit 121 to cut off the connection between the test harness and the external load 30 once. If the test type is that the external device 30 works normally, the test harness is short-circuited to the power supply and connected to the load, the controller 11 controls the first switch circuit 121 to conduct the connection between the test harness and the power supply terminal of the external device 20 and the connection between the test harness and the external load 30.

[0072] The external device 20 may include but is not limited to a battery management unit (BMU).

[0073] In the above embodiment, the test channel includes a first switch circuit, an input interface and an output interface; the input interface is connected to the test harness; the output interface is connected to the external load; the first switch circuit, under the control of the controller, switches on or off the connection between the test harness and the external load, and switches on or off the connection between the test harness and the external device. In the technical solution of the embodiment of the present application, the controller can automatically test the test harness connected to the input interface by controlling the first switch circuit, thereby improving the test efficiency and test reliability.

[0074] According to some embodiments of the present application, referring to Figure 3 The test channel 120 further includes a second switch circuit 122, which is a circuit multiplexed by multiple test channels 120. The second switch circuit 122 is connected to the controller 11, the first switch circuit 121 and the external device 20 respectively; the second switch circuit 122 is used to turn on or off the connection between the first switch circuit 121 and the external device 20 under the control of the controller 11. It should be noted that Figure 3 The connection relationship of the controller is not shown

[0075] In the embodiment of the present application, the test channel 120 may further include a second switch circuit 122, which is disposed between the first switch circuit 121 and the external device 20, that is, the second switch circuit 122 is respectively connected to the first switch circuit 121 and the external device 20. The second switch circuit 122 is also connected to the controller 11, and the controller 11 controls the second switch circuit 122 to conduct the connection between the first switch circuit 121 and the external device 20 according to the test type, thereby connecting the test harness to the external device 20 through the first switch circuit 121 and the second switch circuit 122; or, the controller 11 controls the second switch circuit 122 to cut off the connection between the first switch circuit 121 and the external device 20 according to the test type, thereby disconnecting the connection between the test harness and the external device 20 through the first switch circuit 121 and the second switch circuit 122.

[0076] In the above embodiment, the test channel also includes a second switch circuit, which, under the control of the controller, turns on or off the connection between the first switch circuit and the external device. In the technical solution of the embodiment of the present application, the controller can simulate the connection or disconnection of the test harness with the external device and the connection or disconnection of the test harness with the external load by controlling the first switch circuit and the second switch circuit, thereby automatically performing short circuit testing, open circuit testing, etc. on the test harness, thereby improving test efficiency and test reliability.

[0077] According to some embodiments of the present application, referring to Figure 4 The first switch circuit 121 includes a first switch Km and a second switch Kn; the first switch Km is respectively connected to the controller 11, the input interface IO1 and the second switch circuit 122, and the second switch Kn is respectively connected to the controller 11, the input interface IO1 and the output interface IO2; the first switch Km is used to connect or disconnect the connection between the test harness and the second switch circuit 122 under the control of the controller 11; the second switch Kn is used to connect or disconnect the connection between the test harness and the external load 30 under the control of the controller 11. It should be noted that Figure 4 The connection relationship of the controller is not shown.

[0078] In the embodiment of the present application, each test channel 120 includes a first switch circuit 121 , and each first switch circuit 121 includes a first switch Km and a second switch Kn, that is, the wiring board 12 includes multiple first switches Km and multiple second switches Kn.

[0079] The first switch Km is respectively connected to the controller 11, the input interface IO1, and the second switch circuit 122. The controller 11 controls the first switch Km to conduct the connection between the test harness and the second switch circuit 122 according to the test type, thereby connecting the test harness to the external device 20 through the first switch Km and the second switch circuit 122. Alternatively, the controller 11 controls the first switch Km to cut off the connection between the test harness and the second switch circuit 122 according to the test type, thereby disconnecting the test harness from the external device 20 through the first switch Km and the second switch circuit 122.

[0080] The second switch Kn is respectively connected to the controller 11, the input interface IO1 and the output interface IO2, the input interface IO1 is connected to the test harness, and the output interface IO2 is connected to the external load 30. The controller 11 controls the second switch Kn to conduct the connection between the test harness and the external load 30 according to the test type, or the controller 11 controls the second switch Kn to cut off the connection between the test harness and the external load 30 according to the test type.

[0081] In the above embodiment, the first switch circuit includes a first switch and a second switch; the first switch, under the control of the controller, turns on or off the connection between the test harness and the second switch circuit; the second switch, under the control of the controller, turns on or off the connection between the test harness and the external load. In the technical solution of the embodiment of the present application, the controller can simulate the connection or disconnection of the test harness with the external device by controlling the first switch, and simulate the connection or disconnection of the test harness with the external load by controlling the second switch, thereby automatically performing short circuit testing, open circuit testing, etc. on the test harness, thereby improving test efficiency and test reliability.

[0082] According to some embodiments of the present application, referring to Figure 5 The second switch circuit 122 includes a first set of switches 1221 and a second set of switches 1222; the first set of switches 1221 are connected to the controller 11, the external device 20, and the second set of switches 1222, respectively; the second set of switches 1222 are connected to the controller 11, the first set of switches 1221, and the first switch Km, respectively; the first set of switches 1221 are used to turn on or off the connection between the second set of switches 1222 and the external device 20 under the control of the controller 11; the second set of switches 1222 are used to turn on or off the connection between the first set of switches 1221 and the first switch Km under the control of the controller 11. It should be noted that Figure 5 The connection relationship of the controller 11 is not shown.

[0083] In the embodiment of the present application, the second switch circuit 122 includes two groups of switches. The first group of switches 1221 are connected to the controller 11, the external device 20, and the second group of switches 1222, respectively. The controller 11 controls the first group of switches 1221 to conduct the connection between the external device 20 and the second group of switches 1222 according to the test type, or the controller 11 controls the first group of switches 1221 to cut off the connection between the external device 20 and the second group of switches 1222 according to the test type.

[0084] The second switch group 1222 is connected to the controller 11, the first switch group 1221, and the first switch Km, respectively. The controller 11 controls the second switch group 1222 to conduct the connection between the first switch group 1221 and the first switch Km according to the test type, thereby connecting the test harness to the external device 20 through the first switch Km, the first switch group 1221, and the second switch group 1222. Alternatively, the controller 11 controls the second switch group 1222 to cut off the connection between the first switch group 1221 and the first switch Km according to the test type, thereby disconnecting the test harness from the external device 20 through the first switch Km, the first switch group 1221, and the second switch group 1222.

[0085] In the above embodiment, the second switch circuit includes a first group of switches and a second group of switches; the first group of switches, under the control of the controller, turns on or off the connection between the second group of switches and the external device; the second group of switches, under the control of the controller, turns on or off the connection between the first group of switches and the first switch. In the technical solution of the embodiment of the present application, the controller can simulate the connection or disconnection of the test harness with the external device by controlling the first switch, the first group of switches, and the second group of switches, thereby automatically performing a short circuit test on the test harness, thereby improving the test efficiency and test reliability.

[0086] According to some embodiments of the present application, referring to Figure 6 , the first switch group 1221 includes a third switch Ka and a fourth switch Kb; the second switch group 1222 includes a fifth switch Kc and a sixth switch Kd; the third switch Ka is connected to the controller 11, the power supply end of the external device 20 and the fifth switch Kc respectively; the fourth switch Kb is connected to the controller 11, the ground end of the external device 20 and the sixth switch Kd respectively; the fifth switch Kc is also connected to the controller 11 and the first switch Km respectively; the sixth switch Kd is also connected to the controller 11 and the first switch Km respectively. It should be noted that, Figure 6 The connection relationship of the controller 11 is not shown, and only one test harness is shown.

[0087] In the embodiment of the present application, the first switch group 1221 includes a third switch Ka and a fourth switch Kb, and the second switch group 1222 includes a fifth switch Kc and a sixth switch Kd. The third switch Ka is connected to the power supply terminal of the external device 20 and the fifth switch Kc respectively; the fourth switch Kb is connected to the ground terminal of the external device 20 and the sixth switch Kd respectively; the fifth switch Kc is connected to the third switch Ka and the first switch Km respectively; and the sixth switch Kd is connected to the fourth switch Kb and the first switch Km respectively.

[0088] The test types are shown in Table 1. Based on Table 1, the control of each switch by the controller 11 is described in detail below.

[0089] Table 1

[0090]

[0091]

[0092] In some embodiments, the second switch Kn, the third switch Ka, and the fourth switch Kb are all relays. Each relay includes a coil, a control contact, a first contact, and a second contact. The controller 11 is connected to the coil of the relay, and controls the contact through the coil to make the control contact contact with the first contact, or to make the control contact contact with the second contact.

[0093] Actually, n harnesses need to be tested. For the i-th test harness:

[0094] 1) The test type j1 is open circuit once, the controller 11 controls the second switch Kn to be opened once, and the other switches remain in the original state.

[0095] 2) Test type j2 is open circuit 3 times, the controller 11 controls the second switch Kn to be opened three times, and the other switches remain in the original state.

[0096] 3) Test type j3 means that the external device 20 works normally, the wiring harness is short-circuited to the power supply and the load is activated, then the controller 11 controls the third switch Ka and the fourth switch Kb to maintain the original state, and then controls the second switch Kn to close (Kn=1), and then controls the first switch Km to close, and finally controls the fifth switch Kc to close and the sixth switch Kd to open, and after the preset time, controls each switch in the reverse order of the above sequence to restore.

[0097] 4) Test type j4 means that the external device 20 works normally, the wiring harness is short-circuited to the power supply and the load is not activated, then the controller 11 controls the third switch Ka and the fourth switch Kb to maintain the original state, and then controls the second switch Kn to be disconnected (Kn=2), and then controls the first switch Km to be closed, and finally controls the fifth switch Kc to be closed and the sixth switch Kd to be disconnected, and after the preset time, controls each switch in reverse order to restore.

[0098] 5) Test type j5 means that the external device 20 works normally, the wiring harness is short-circuited to the ground and the load is activated, then the controller 11 controls the third switch Ka and the fourth switch Kb to maintain the original state, and then controls the second switch Kn to close (Kn=1), and then controls the first switch Km to close, and finally controls the fifth switch Kc to open and the sixth switch Kd to close, and after the preset time, controls each switch to be restored in the reverse order of the above sequence.

[0099] 6) Test type j6 means that the external device 20 works normally, the wiring harness is short-circuited to the ground and the load is not activated, then the controller 11 controls the third switch Ka and the fourth switch Kb to maintain the original state, and then controls the second switch Kn to open (Kn=2), and then controls the first switch Km to close, and finally controls the fifth switch Kc to open and the sixth switch Kd to close, and after the preset time, controls each switch to be restored in the reverse order of the above sequence.

[0100] 7) Test type j7 is that the power supply of the external device 20 is missing, the wiring harness is short-circuited to the power supply and the load is activated, then the controller 11 controls the third switch Ka to be disconnected (Ka=2), the fourth switch Kb to remain in the original state, and then controls the second switch Kn to be closed (Kn=1), and then controls the first switch Km to be closed, and finally controls the fifth switch Kc to be closed and the sixth switch Kd to be disconnected. After the preset time, each switch is controlled to be restored in the reverse order of the above sequence.

[0101] 8) Test type j8 means that the external device 20 loses power, the wiring harness is short-circuited to the power supply and the load is not activated. The controller 11 controls the third switch Ka to disconnect (Ka=2), the fourth switch Kb to maintain the original state, and then controls the second switch Kn to disconnect (Kn=2), and then controls the first switch Km to close, and finally controls the fifth switch Kc to close and the sixth switch Kd to disconnect. After the preset time, the switches are controlled in reverse order to restore.

[0102] 9) Test type j9 is that the external device 20 is missing, the wiring harness is short-circuited to the ground and the load is activated, then the controller 11 controls the third switch Ka to maintain the original state, the fourth switch Kb to be disconnected (Kb=2), and then controls the second switch Kn to be closed (Kn=1), and then controls the first switch Km to be closed, and finally controls the fifth switch Kc to be disconnected and the sixth switch Kd to be closed. After the preset time, each switch is controlled to be restored in the reverse order of the above sequence.

[0103] 10) Test type j10 is that the external device 20 is missing, the wiring harness is short-circuited to the ground, and the load is not activated, then the controller 11 controls the third switch Ka to maintain the original state, the fourth switch Kb to be disconnected (Kb=2), and then controls the second switch Kn to be disconnected (Kn=2), and then controls the first switch Km to be closed, and finally controls the fifth switch Kc to be disconnected and the sixth switch Kd to be closed. After the preset time, each switch is controlled to be restored in the reverse order of the above sequence.

[0104] The activated load is connected to the external load, and the inactivated load is disconnected from the external load.

[0105] In the above embodiment, the first group of switches includes a third switch and a fourth switch; the second group of switches includes a fifth switch and a sixth switch; the third switch is respectively connected to the controller, the power supply terminal of the external device and the fifth switch; the fourth switch is respectively connected to the controller, the ground terminal of the external device and the sixth switch; the fifth switch is also respectively connected to the controller and the first switch; the sixth switch is also respectively connected to the controller and the first switch. In the technical solution of the embodiment of the present application, the controller controls each switch according to the test type, simulates a variety of test scenarios, realizes a variety of short circuit tests and a variety of open circuit tests, and can automatically test each test harness. Therefore, testing a large number of test harnesses can significantly improve the test efficiency.

[0106] According to some embodiments of the present application, referring to Figure 7 The wiring board 12 also includes a positive electrode interface IO+ and a negative electrode interface IO-; the positive electrode interface IO+ is set at the common end of the third switch Ka and the fifth switch Kc; the negative electrode interface IO- is set at the common end of the fourth switch Kb and the sixth switch Kd; the positive electrode interface IO+ is used to connect the positive electrode of the preset power supply; the negative electrode interface IO- is used to connect the negative electrode of the preset power supply.

[0107] In the embodiment of the present application, the third switch Ka is connected to the fifth switch Kc, and the positive electrode interface IO+ is set at the common end of the third switch Ka and the fifth switch Kc; the fourth switch Kb is connected to the sixth switch Kd, and the negative electrode interface IO- is set at the common end of the fourth switch Kb and the sixth switch Kd. The positive electrode interface IO+ can be connected to the positive electrode of the preset power supply, and the negative electrode interface IO- can be connected to the negative electrode of the preset power supply. By connecting the preset power supply through the positive electrode interface IO+ and the negative electrode interface IO-, power can be provided for the self-test of the wiring harness test device 10.

[0108] The above-mentioned preset power supply may include but is not limited to a 12V DC power supply.

[0109] In the above embodiment, the wiring board also includes a positive interface and a negative interface; the positive interface is connected to the positive electrode of the preset power supply; the negative interface is connected to the negative electrode of the preset power supply. In the technical solution of the embodiment of the present application, the wiring harness test device can be connected to the preset power supply through the positive interface and the negative interface, which can provide power for the wiring harness test device to perform self-test on the one hand, and can also provide power for external devices on the other hand.

[0110] According to some embodiments of the present application, referring to Figure 8 , each test channel 120 is also provided with an indicator light Led and a seventh switch Ke; the control contact of the third switch Ka is connected to the positive electrode interface IO+, the first contact of the third switch Ka is connected to the power supply end of the external device 20, and the second contact of the third switch Ka is connected to the seventh switch Ke; the seventh switch Ke is also connected to the controller 11 and the indicator light Led respectively; the indicator light Led is also connected to the second contact of the second switch Kn; the control contact of the second switch Kn is connected to the first switch Km, and the first contact of the second switch Kn is connected to the output interface IO2; the control contact of the fourth switch Kb is connected to the negative electrode interface IO-, and the first contact of the fourth switch Kb is connected to the ground terminal of the external device 20. It should be noted that, Figure 8 The connection relationship of the controller 11 is not shown.

[0111] In the embodiment of the present application, an indicator light Led and a seventh switch Ke may be provided in each test channel 120, and the indicator light Led and the seventh switch Ke are connected to each other. Fig. 9 The indicator light Led, the input interface IO1 and the output interface IO2 are arranged on the wiring board 12 .

[0112] The control contact of the second switch Kn is connected to the first switch Km, the first contact of the second switch Kn is connected to the input interface IO1, and the second contact of the second switch Kn is connected to the indicator light Led. The controller 11 can control the control contact of the second switch Kn to contact the first contact (Kn=1), or control the control contact of the second switch Kn to contact the second contact (Kn=2).

[0113] The control contact of the third switch Ka is connected to the positive electrode interface IO+, the first contact of the third switch Ka is connected to the power supply terminal of the external device 20, and the second contact of the third switch Ka is connected to one end of the seventh switch Ke. The controller 11 can control the control contact of the third switch Ka to contact the first contact (Ka=1), or control the control contact of the third switch Ka to contact the second contact (Ka=2).

[0114] The control contact of the fourth switch Kb is connected to the negative electrode interface IO-, and the first contact of the fourth switch Ka is connected to the ground terminal of the external device 20. The controller 11 can control the control contact of the fourth switch Kb to contact the first contact (Kb=1), or control the control contact of the fourth switch Kb to contact the second contact (Kb=2).

[0115] When performing self-test on each switch, the positive interface IO+ and the negative interface IO- of the wiring harness testing device 10 are connected to the preset power supply, and the controller 11 can control each switch according to the self-test control logic, and determine whether each switch is normal according to whether the indicator light Led is on and whether the power supply is overcurrent.

[0116] The self-check control logic may include: 1) the controller 11 controls the seventh switch Ke to close, the control contact of the third switch Ka to contact the second contact (Ka=2), the first switch Km to close, the control contact of the second switch Kn to contact the second contact (Kn=2), and the fifth switch Kc and the sixth switch Kd to close. If the indicator light Led is on, it indicates that the third switch Ka and the second switch Kn are normal. 2) In the state of the above switches, the first switch Km is controlled to be disconnected. If the indicator light Led is off, it indicates that the first switch Km is normal. 3) The fifth switch Kc is controlled to close and the sixth switch Kd is controlled to be turned off. If the preset power supply does not have an overcurrent condition, it indicates that the fifth switch Kc is working normally. 4) The fifth switch Kc is controlled to be turned off and the sixth switch Kd is controlled to be closed. If the preset power supply does not have an overcurrent condition, it indicates that the sixth switch Kd is working normally. 5) The control contact of the fourth switch Kb is controlled to contact the second contact (Kb=2). If the external device 20 is abnormal, it indicates that the fourth switch Kb is normal.

[0117] In some embodiments, reference Fig.10 A current limiting resistor R is arranged between the seventh switch Ke and the indicator light Led, and the current limiting resistor R can reduce the current flowing through the indicator light Led, thereby protecting the indicator light Led.

[0118] In the above embodiment, each test channel is also provided with an indicator light and a seventh switch. In the technical solution of the embodiment of the present application, the controller can control each switch according to the self-check control logic, and detect the switch according to the condition of the indicator light to reduce the situation of test errors caused by switch abnormalities, thereby improving the test reliability.

[0119] According to some embodiments of the present application, referring to Fig.11 The wiring harness testing device 10 further includes an input component 13; the controller 11 is connected to the input component 13; the input component 13 is used to receive input operations for testing the wiring harness and testing information.

[0120] In the embodiment of the present application, the wire harness test device 10 further includes an input component 13, and the controller 11 is connected to the input component 13. When performing a wire harness test, the wire harness test device 10 can input which test wire harness to test and which test to perform on the test wire harness through the input component 13, and the controller 11 determines the wire harness to be tested and the test information according to the input operation of the tester.

[0121] It can be understood that the input component provides an input interface for the tester, and the tester can set the test harness and test type according to the requirements, thereby realizing the customization and personalization of the test.

[0122] In some embodiments, the input component 13 includes a touch screen; the touch screen is used to display a test interface and receive input operations, and the test interface is provided with an interface selection control and a test type setting control.

[0123] The touch screen can display the test interface, which is equipped with interface selection controls and test type setting controls. Fig.12 The interface selection control may include boxes corresponding to multiple selection channels, and the test type setting control may include boxes corresponding to general controls such as short circuit enable, open circuit enable, and open circuit three times, as well as boxes corresponding to individual controls such as open circuit, open circuit once, open circuit three times, short circuit to power supply, short circuit to ground, power supply missing, ground missing, activated test, and unactivated test.

[0124] In actual application, the tester can touch the touch screen 130, and the touch screen 130 obtains the input operation of the tester and sends the selection information to the controller 11 according to the input operation. After that, the controller 11 can determine the wiring harness to be tested according to whether the box corresponding to the selection channel in the selection information is checked; and determine the test information according to whether the boxes of the general control and the individual control in the selection information are checked.

[0125] The test interface may also be used to set a test start control, a total remaining test time, a single line remaining time, etc. In practical applications, the content displayed on the test interface is not limited to the description of the embodiments of the present application.

[0126] In the above embodiment, the input component includes a touch screen; the touch screen displays the test interface and receives input operations. In the technical solution of the embodiment of the present application, the use of a touch screen can not only intuitively display the test interface, but also the way of receiving input operations is relatively simple and easy to implement.

[0127] According to some embodiments of the present application, referring to Fig.13 , provides a wire harness testing method, which is applied to the wire harness testing device in the above embodiment and may include the following steps:

[0128] Step 401 : After the harness testing device is connected to the test harness, test information of the test harness is obtained.

[0129] When conducting a harness test, the tester connects the harness to be tested to the harness test device. Afterwards, the harness test device obtains the test harness and test information through the tester's input operation. For example, the harness test device obtains which harness is being tested and the test type of the harness.

[0130] Step 402 : Testing the test harness based on the test information and the test channel of the harness testing device.

[0131] After acquiring the test information, the wiring harness testing device can control the test channel corresponding to the test wiring harness, thereby performing a short circuit test and / or an open circuit test on the test wiring harness.

[0132] In the above embodiment, after the harness test device is connected to the test harness, the test information of the test harness is obtained; and the test harness is tested based on the test information and the test channel of the harness test device. In the technical solution of the embodiment of the present application, after the tester connects the test harness to the test channel of the wiring board, the harness test device can automatically perform multiple tests on the test harness, thereby improving the test efficiency and test reliability.

[0133] According to some embodiments of the present application, referring to Fig.14 The step of testing the test harness based on the test information and the test channel of the harness testing device may include the following:

[0134] Step 501 : determining the state of an external device based on test information, and controlling a first set of switches of a wiring harness testing device according to the state of the external device.

[0135] The state of the external device is used to indicate that the external device is operating normally, power is missing, or ground is missing.

[0136] The harness tester can determine whether the external device is operating normally, or whether power is missing, or ground is missing based on the test information.

[0137] When the external device is in normal working state, the harness testing device controls the control contact of the third switch in the first switch group to contact the first contact (Ka=1), and controls the control contact of the fourth switch in the first switch group to contact the first contact (Kb=1).

[0138] When the external device is in power failure state, the harness testing device controls the control contact of the third switch in the first switch group to contact the second contact (Ka=2), and controls the control contact of the fourth switch in the first switch group to contact the first contact (Kb=1).

[0139] When the state of the external device is ground missing, the harness testing device controls the control contact of the third switch in the first group of switches to contact the first contact (Ka=1), and controls the control contact of the fourth switch in the first group of switches to contact the second contact (Kb=2).

[0140] Step 502: determine the state of the external load based on the test information, and control the first switch and the second switch of the test channel according to the state of the external load.

[0141] The state of the external load is used to indicate whether the external load is activated. An activated load is connected to the external load, and an inactivated load is disconnected from the external load.

[0142] After controlling the first set of switches, the harness test device determines whether to activate the load according to the test information. When the external load is activated, the harness test device controls the control contact of the second switch to contact the first contact (Kn=1). When the external load is not activated, the harness test device controls the control contact of the second switch to contact the second contact (Kn=2).

[0143] Afterwards, the wiring harness testing device controls the first switch to be closed.

[0144] Step 503 : controlling a second set of switches of the wiring harness testing device according to the short circuit test type.

[0145] Among them, the short circuit test type is used to indicate a short circuit to power supply or a short circuit to ground.

[0146] After controlling the first switch, the harness test device determines whether it is a short circuit to the power supply or a short circuit to the ground according to the test information. In the case of a short circuit to the power supply, the fifth switch is controlled to be closed and the sixth switch is controlled to be opened; in the case of a short circuit to the ground, the fifth switch is controlled to be opened and the sixth switch is controlled to be closed.

[0147] After controlling the second set of switches, the first preset time is continued, and then the switches are controlled in reverse order of the above sequence to restore the switches. Fig.15a (normal operation), 15b (power loss) and 15c (ground loss). Optionally, the first preset time length may be 60s.

[0148] In the above embodiment, the state of the external device is determined based on the test information, and the first set of switches of the harness test device is controlled according to the state of the external device; the state of the external load is determined based on the test information, and the first switch and the second switch of the test channel are controlled according to the state of the external load; the short-circuit test type is determined based on the test information, and the second set of switches of the harness test device is controlled according to the short-circuit test type. In the technical solution of the embodiment of the present application, the harness test device is controlled according to the channel control logic, and the short-circuit test of the test harness can be automatically performed, thereby improving the test efficiency and test reliability.

[0149] According to some embodiments of the present application, referring to Fig.16 The step of testing the test harness based on the test information and the test channel of the harness testing device may include the following:

[0150] Step 601, determine the open circuit test type based on the test information.

[0151] The open circuit test type is used to indicate an open circuit once or an open circuit three times.

[0152] After the wiring harness test device obtains the test information, it can determine whether to perform an open circuit test based on the test information, and whether to perform the open circuit test once or three times.

[0153] Step 602: Control the second switch of the test channel according to the open circuit test type.

[0154] When the open circuit test type is open circuit 1 time, the control contact of the second switch is controlled to contact the second contact (Kn=2), and after the second preset time period, the control contact of the second switch is controlled to contact the first contact (Kn=1).

[0155] When the open circuit test type is open circuit 3 times, the control contact of the second switch is controlled to contact the second contact (Kn=2), and after the second preset time, the control contact of the second switch is controlled to contact the first contact (Kn=1). Then, repeat the above steps twice, referring to Fig.17 .

[0156] In the above embodiment, the open circuit test type is determined based on the test information; and the second switch of the test channel is controlled according to the open circuit test type. In the technical solution of the embodiment of the present application, the harness test device is controlled according to the channel control logic, and can automatically perform an open circuit test on the test harness, thereby improving the test efficiency and test reliability.

[0157] According to some embodiments of the present application, the embodiments of the present application may also include: detecting the first group of switches, the second group of switches and the first and second switches in each test channel in the wiring harness testing device according to the self-test control logic to obtain the test results.

[0158] The wiring harness test device may also be provided with a self-test structure, which may include an indicator light, a seventh switch, a current limiting resistor, etc. During the self-test process, the wiring harness test device controls the first group of switches, the second group of switches, and the first switch and the second switch in each test channel according to a preset self-test control logic, and then determines whether each switch is normal according to the indicator light and whether the power supply is overcurrent, and obtains the test result.

[0159] The self-check control logic may include: 1) the controller 11 controls the seventh switch Ke to close, the control contact of the third switch Ka to contact the second contact (Ka=2), the first switch Km to close, the control contact of the second switch Kn to contact the second contact (Kn=2), and the fifth switch Kc and the sixth switch Kd to close. If the indicator light Led is on, it indicates that the third switch Ka and the second switch Kn are normal. 2) In the state of the above switches, the first switch Km is controlled to be disconnected. If the indicator light Led is off, it indicates that the first switch Km is normal. 3) The fifth switch Kc is controlled to close and the sixth switch Kd is controlled to be turned off. If the preset power supply does not have an overcurrent condition, it indicates that the fifth switch Kc is working normally. 4) The fifth switch Kc is controlled to be turned off and the sixth switch Kd is controlled to be closed. If the preset power supply does not have an overcurrent condition, it indicates that the sixth switch Kd is working normally. 5) The control contact of the fourth switch Kb is controlled to contact the second contact (Kb=2). If the external device 20 is abnormal, it indicates that the fourth switch Kb is normal.

[0160] In the above embodiment, the first group of switches, the second group of switches and the first switch and the second switch in each test channel in the wiring harness test device are respectively detected according to the self-test control logic to obtain the test results. In the technical solution of the embodiment of the present application, the wiring harness test device can detect each switch according to the self-test control logic to reduce the situation of test errors caused by switch abnormalities, thereby improving the test reliability.

[0161] According to some embodiments of the present application, a wire harness testing method is provided. The method is applied to the wire harness testing device of the above embodiment and may include the following steps:

[0162] Step 1, after the harness test device is connected to the test harness, obtaining test information of the test harness;

[0163] Step 2: According to the self-test control logic, the first group of switches, the second group of switches in the wiring harness test device and the first switch and the second switch in each test channel are tested respectively to obtain the test results.

[0164] Step 3, determining the state of the external device based on the test information, and controlling the first set of switches of the wiring harness test device according to the state of the external device;

[0165] Step 4, determining the state of the external load based on the test information, and controlling the first switch and the second switch of the test channel according to the state of the external load;

[0166] Step 5: determining the short circuit test type based on the test information, and controlling the second set of switches of the wiring harness test device according to the short circuit test type.

[0167] Step 6, determining the open circuit test type based on the test information;

[0168] Step 7: Control the second switch of the test channel according to the open circuit test type.

[0169] In an embodiment of the present application, after the harness test device is connected to the test harness, the harness test device first obtains the test information of the test harness; then, the harness test device can detect each switch according to the self-test control logic to obtain the test result. If the test result shows that each switch is normal, a short circuit test and an open circuit test are performed according to the test information. Among them, the short circuit test executes steps 3-5, and the open circuit test executes steps 6-7. In the technical scheme of the embodiment of the present application, after the tester connects the test harness to the harness test device, the harness test device can automatically perform a self-test and perform a short circuit test and an open circuit test on the test harness, which not only improves the test efficiency, but also improves the test reliability.

[0170] According to some embodiments of the present application, an electronic device is provided. The electronic device may be a controller of a wiring harness testing device, and its internal structure diagram may be as follows: Fig.18 As shown. The electronic device includes a processor, a memory, an input / output interface, a communication interface, a display unit and an input device. The processor, the memory and the input / output interface are connected via a system bus, and the communication interface is connected to the system bus via the input / output interface. The processor of the electronic device is used to provide computing and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the electronic device is used to exchange information between the processor and an external device. The communication interface of the electronic device is used to communicate with an external terminal in a wired or wireless manner, and the wireless manner can be implemented through WIFI, a mobile cellular network, NFC (near field communication) or other technologies. When the computer program is executed by the processor, a wiring harness testing method is implemented.

[0171] Those skilled in the art will understand that Fig.18The structure shown in the figure is merely a block diagram of a partial structure related to the scheme of the present application, and does not constitute a limitation on the electronic device to which the scheme of the present application is applied. The specific electronic device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0172] According to some embodiments of the present application, there is also provided a non-transitory computer-readable storage medium including instructions, such as a memory including instructions, and the instructions can be executed by a processor of an electronic device to complete the above method. For example, the non-transitory computer-readable storage medium can be a ROM, a random access memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, etc.

[0173] According to some embodiments of the present application, a computer program product is also provided, and when the computer program is executed by a processor, the above method can be implemented. The computer program product includes one or more computer instructions. When these computer instructions are loaded and executed on an electronic device, part or all of the above method can be implemented in whole or in part according to the process or function described in the embodiment of the present application.

[0174] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0175] The above-described embodiments only express several implementation methods of the present application, which is convenient for understanding the technical solutions of the present application in detail, but cannot be understood as limiting the scope of protection of the invention patent. It should be pointed out that for ordinary technicians in this field, without departing from the concept of the present application, several modifications and improvements can be made, which all belong to the protection scope of the present application. It should be understood that the technical solutions obtained by those skilled in the art through logical analysis, reasoning or limited experiments on the basis of the technical solutions provided in the present application are all within the protection scope of the attached claims described in the present application. Therefore, the protection scope of the patent of this application shall be based on the contents of the attached claims, and the description and drawings can be used to explain the contents of the claims.

Claims

1. A wiring harness testing device, characterized in that: The wiring harness testing device comprises a controller and a wiring board; the wiring board comprises a plurality of testing channels, each of which is connected to the controller; The test channel is used to connect the test harness; The controller is used to test the test harness based on the test information and the test channel.

2. The wire harness testing device according to claim 1, characterized in that: The test channel includes a first switch circuit, an input interface and an output interface; the first switch circuit is connected to the controller, the input interface, the output interface and an external device respectively; The input interface is used to connect the test harness; The output interface is used to connect an external load; The first switch circuit is used to, under the control of the controller, switch on or off the connection between the test harness and the external load, and switch on or off the connection between the test harness and the external device.

3. The wire harness testing device according to claim 2, characterized in that: The test channel further includes a second switch circuit, which is connected to the controller, the first switch circuit and the external device respectively; The second switch circuit is used to switch on or off the connection between the first switch circuit and the external device under the control of the controller.

4. The wire harness testing device according to claim 3, characterized in that: The first switch circuit includes a first switch and a second switch; the first switch is connected to the controller, the input interface and the second switch circuit respectively, and the second switch is connected to the controller, the input interface and the output interface respectively; The first switch is used to connect or disconnect the connection between the test harness and the second switch circuit under the control of the controller; The second switch is used to connect or disconnect the connection between the test harness and the external load under the control of the controller.

5. The wire harness testing device according to claim 4, characterized in that: The second switch circuit includes a first set of switches and a second set of switches; The first group of switches are respectively connected to the controller, the external device and the second group of switches, and the second group of switches are respectively connected to the controller, the first group of switches and the first switch; The first set of switches is used to switch on or off the connection between the second set of switches and the external device under the control of the controller; The second group of switches is used to switch on or off the connection between the first group of switches and the first switch under the control of the controller.

6. The wire harness testing device according to claim 5, characterized in that: The first switch group includes a third switch and a fourth switch; the second switch group includes a fifth switch and a sixth switch; The third switch is connected to the controller, the power supply terminal of the external device and the fifth switch respectively; the fourth switch is connected to the controller, the ground terminal of the external device and the sixth switch respectively; The fifth switch is also connected to the controller and the first switch respectively; The sixth switch is also connected to the controller and the first switch respectively.

7. The wire harness testing device according to claim 6, characterized in that: The wiring board further includes a positive electrode interface and a negative electrode interface; the positive electrode interface is arranged at the common end of the third switch and the fifth switch; the negative electrode interface is arranged at the common end of the fourth switch and the sixth switch; The positive electrode interface is used to connect the positive electrode of a preset power source; The negative electrode interface is used to connect the negative electrode of the preset power supply.

8. The wire harness testing device according to claim 7, characterized in that: Each of the test channels is also provided with an indicator light and a seventh switch; The control contact of the third switch is connected to the positive electrode interface, the first contact of the third switch is connected to the power supply terminal of the external device, and the second contact of the third switch is connected to the seventh switch; The seventh switch is also connected to the controller and the indicator light respectively; The indicator light is also connected to the second contact of the second switch; The control contact of the second switch is connected to the first switch, and the first contact of the second switch is connected to the output interface; The control contact of the fourth switch is connected to the negative electrode interface, and the first contact of the fourth switch is connected to the ground terminal of the external device.

9. The wire harness testing device according to any one of claims 1 to 8, characterized in that: The wiring harness testing device further comprises an input component; the controller is connected to the input component; The input component is used to receive input operations for the test harness and the test information.

10. The wire harness testing device according to claim 9, characterized in that: The input component includes a touch screen; The touch screen is used to display a test interface and receive the input operation. The test interface is provided with an interface selection control and a test type setting control.

11. A wiring harness testing method, characterized in that: Applied to the wire harness testing device according to any one of claims 1 to 10, the method comprising: After the wiring harness testing device is connected to the test wiring harness, acquiring test information of the test wiring harness; The test harness is tested based on the test information and a test channel of the harness testing device.

12. The method according to claim 11, characterized in that The testing the test harness based on the test information and the test channel of the harness testing device includes: determining a state of an external device based on the test information, and controlling a first set of switches of the wiring harness testing device according to the state of the external device; determining a state of an external load based on the test information, and controlling a first switch and a second switch of the test channel according to the state of the external load; A short circuit test type is determined based on the test information, and a second set of switches of the wiring harness testing device is controlled according to the short circuit test type.

13. The method according to claim 11, characterized in that The testing the test harness based on the test information and the test channel of the harness testing device includes: determining an open circuit test type based on the test information; The second switch of the test channel is controlled according to the open circuit test type.

14. The method according to any one of claims 11 to 13, characterized in that: The method further comprises: According to the self-test control logic, the first group of switches, the second group of switches in the wiring harness test device and the first switch and the second switch in each test channel are tested respectively to obtain a test result.

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