Metal alloy resistance detection, dust removal and braiding equipment
Through the design of pre-inspection and full-inspection mechanisms, combined with air blowing and kicking and a suspended structure, the problems of operation integration and front and back side inspection in the production process of metal alloy resistors are solved, and the stability and production efficiency of the equipment are improved.
Patent Information
- Application Number
- CN202510300238.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2025-03-14
- Publication Date
- 2025-10-24
- Estimated Expiration
- 2045-03-14
AI Technical Summary
In the existing technology, the production process of metal alloy resistors requires multiple operations to be integrated, which is difficult to achieve. During the inspection process, it is impossible to complete the front and back inspection without flipping the resistor. Defective products must go through the entire procedure before being eliminated, resulting in redundant equipment inspection.
Pre-inspection and full-inspection mechanisms are designed to perform early pre-inspection and post-inspection comprehensive inspection of metal alloy resistors respectively. Air blowing is used to quickly remove defective products, and a suspended structure and correction device are used to achieve front and back side inspection and correction, avoiding the use of a flipping device.
It realizes the integrated operation of the metal alloy resistor production process, improves the stability of equipment operation and production efficiency, and reduces the redundant detection of defective products.
Smart Images

Figure CN119869956B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of metal alloy resistor production, in particular to a metal alloy resistor detection, dust removal and banding equipment. BACKGROUND
[0002] In the production process of metal alloy resistors, a series of operations such as size measurement, appearance detection, flatness detection, resistance measurement, dust removal, and printing and banding are required.
[0003] To improve the level of mechanical automation, a non-standard mechanical automation equipment needs to be developed to integrate the series of operations involved in the production process of the above metal alloy resistors in one device to realize integrated production. SUMMARY
[0004] The purpose of the present application is to overcome the shortcomings in the prior art and provide a metal alloy resistor detection, dust removal and banding equipment that integrates a series of operations involved in the production process of metal alloy resistors in one device to realize integrated production.
[0005] The purpose of the present application is achieved by the following technical solutions:
[0006] A metal alloy resistor detection, dust removal and banding equipment comprises a feeding mechanism, a pre-detection mechanism, a full-detection mechanism, and a banding mechanism.
[0007] The pre-detection mechanism comprises a sub-turntable, a CCD front detection device, a front ion dust removal device, and a pre-detection defect kicking device; the CCD front detection device, the front ion dust removal device, and the pre-detection defect kicking device are sequentially arranged around the sub-turntable.
[0008] The full-detection mechanism comprises a main turntable, a CCD bottom detection device, a CCD flatness detection device, a resistance measurement device, a bottom ion dust removal device, and a full-detection defect kicking device; the CCD bottom detection device, the CCD flatness detection device, the resistance measurement device, the bottom ion dust removal device, and the full-detection defect kicking device are sequentially arranged around the main turntable.
[0009] The feeding mechanism is used to feed metal alloy resistors to the sub-turntable.
[0010] The main turntable is used to pick up metal alloy resistors from the sub-turntable, sequentially pass through the CCD bottom detection device, the CCD flatness detection device, the resistance measurement device, the bottom ion dust removal device, and the full-detection defect kicking device, and finally reach the banding mechanism.
[0011] In one of the embodiments, the feeding mechanism comprises a vibrating disc and a straight vibrator; the straight vibrator is connected between the vibrating disc and the secondary turntable, and is used to deliver the metal alloy resistor at the discharging port of the vibrating disc into the accommodating groove of the secondary turntable.
[0012] In one of the embodiments, the feeding mechanism further comprises a replenishment bin above the vibrating disc.
[0013] In one of the embodiments, the connection between the straight vibrator and the secondary turntable is provided with a resistor in-place detector.
[0014] In one of the embodiments, the pre-inspection rejection device comprises a pre-inspection rejection blow pipe and a pre-inspection rejection hopper; the pre-inspection rejection blow pipe is used to blow the defective metal alloy resistor on the secondary turntable into the pre-inspection rejection hopper.
[0015] In one of the embodiments, the main turntable comprises a turntable body and a driving module for driving the turntable body to perform lifting and rotating movements; the turntable body is provided with a plurality of negative pressure suction nozzles along the circumference thereof.
[0016] In one of the embodiments, the flatness detection device comprises a flatness detection station, a flatness detection CCD and a flatness detection backlight source; the flatness detection CCD and the flatness detection backlight source are respectively located on the two sides of the flatness detection station.
[0017] In one of the embodiments, the braiding mechanism comprises a braiding transmission device, a laser printing device and a plastic sealing device; the braiding transmission device is used to drive the linear transmission of the braiding and sequentially pass through the laser printing device and the plastic sealing device; the laser printing device is used to perform laser printing on the metal alloy resistor in the braiding; and the plastic sealing device is used to package the metal alloy resistor in the braiding.
[0018] In one of the embodiments, the plastic sealing device comprises an unwinding disc, a cover film pressing assembly and a winding disc.
[0019] In one of the embodiments, the braiding mechanism further comprises an incoming material deviation rectifying device.
[0020] The incoming material deviation rectifying device comprises a deviation rectifying guide sleeve, an extension rod and a lifting cylinder; the extension rod is movably sleeved in the deviation rectifying guide sleeve; the lifting cylinder drives the extension rod to reciprocate in the vertical direction in the deviation rectifying guide sleeve; and a guide inclined surface is formed at the opening of the deviation rectifying guide sleeve.
[0021] The turntable body is further provided with a horizontal cylinder for driving the negative pressure suction nozzle to reciprocate in the horizontal direction.
[0022] The negative pressure suction nozzle includes: a suction nozzle body, a return spring, and a displacement detector; the suction nozzle body is movably arranged on the turntable body by the return spring, and the displacement detector is fixed on the turntable body and is used to detect the displacement of the suction nozzle body.
[0023] The metal alloy resistor detection, dust removal and taping equipment of the present invention integrates a series of operations involved in the production process of the metal alloy resistor into one device, thereby realizing integrated production. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments. It should be understood that the following drawings only illustrate certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying any creative work.
[0025] Figure 1 A perspective view of a metal alloy resistance detection, dust removal, and taping device according to an embodiment of the present invention;
[0026] Figure 2 for Figure 1 A top view of the metal alloy resistance detection, dust removal, and taping equipment shown;
[0027] Figure 3 for Figure 1 The structural diagram of the feeding mechanism and pre-inspection mechanism shown;
[0028] Figure 4 for Figure 1 The structural diagram of the full inspection mechanism and the taping mechanism shown;
[0029] Figure 5 for Figure 1 The structural diagram of the pre-inspection mechanism, full inspection mechanism and taping mechanism shown;
[0030] Figure 6 Schematic diagram of the metal alloy resistance shift on the negative pressure nozzle;
[0031] Figure 7 This is a structural diagram of a feed deviation correction device installed on a braiding mechanism;
[0032] Figure 8 for Figure 7 Schematic diagram of the feed deviation correction device for correcting the deviation of the metal alloy resistor (I);
[0033] Figure 9 for Figure 7 Schematic diagram of the feed deviation correction device for correcting the deviation of the metal alloy resistor (II);
[0034] Figure 10 This is the structural diagram of the negative pressure nozzle. DETAILED DESCRIPTION
[0035] To facilitate understanding of the present invention, the present invention will be described more fully below with reference to the accompanying drawings. The accompanying drawings illustrate preferred embodiments of the present invention. However, the present invention may be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and comprehensive understanding of the present disclosure.
[0036] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly attached to the other element or there may be an intermediate element. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only implementation methods.
[0037] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the art to which this invention pertains. The terms used in this specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.
[0038] like Figure 1 and Figure 2 As shown, the present invention discloses a metal alloy resistance detection, dust removal, and tape braiding device 10, which includes: a feeding mechanism 100, a pre-inspection mechanism 200, a full inspection mechanism 300, and a tape braiding mechanism 400.
[0039] like Figure 3 As shown, the pre-inspection mechanism 200 includes: a secondary turntable 210, a CCD front detection device 220, a front ion dust removal device 230, and a pre-inspection defect removal device 240. The CCD front detection device 220, the front ion dust removal device 230, and the pre-inspection defect removal device 240 are sequentially arranged around the secondary turntable 210. The secondary turntable 210 rotates the metal alloy resistor 20 to be inspected. The CCD front detection device 220 is used to inspect the front appearance and dimensions of the metal alloy resistor 20. The front ion dust removal device 230 is used to perform ion blowing to remove dust from the front of the metal alloy resistor 20. The pre-inspection defect removal device 240 is used to remove metal alloy resistors 20 that fail the appearance and dimension inspection.
[0040] like Figure 4 and Figure 5As shown, the full inspection mechanism 300 comprises: a main turntable 310, a CCD bottom surface detection device 320, a CCD flatness detection device 330, a resistance measurement device 340, a bottom surface ion dust removal device 350, and a full inspection defective kicking device 360. The CCD bottom surface detection device 320, the CCD flatness detection device 330, the resistance measurement device 340, the bottom surface ion dust removal device 350, and the full inspection defective kicking device 360 are sequentially arranged around the main turntable 310. The main turntable 310 drives the metal alloy resistor 20 to be detected to move up and down and rotate. The CCD bottom surface detection device 320 is used to detect the appearance and size of the bottom surface of the metal alloy resistor 20. The CCD flatness detection device 330 is used to detect the flatness of the metal alloy resistor 20. The resistance measurement device 340 is used to measure the resistance value of the metal alloy resistor 20. The bottom surface ion dust removal device 350 is used to blow ion air to remove dust from the bottom surface of the metal alloy resistor 20. The full inspection defective kicking device 360 is used to kick out the metal alloy resistor 20 with defective appearance and size.
[0041] As shown in Figure 3 The feeding mechanism 100 is used to feed the metal alloy resistor 20 to the sub-turntable 210.
[0042] As shown in Figure 4 and Figure 5 The main turntable 310 is used to pick up the metal alloy resistor 20 from the sub-turntable 210, and sequentially pass through the CCD bottom surface detection device 320, the CCD flatness detection device 330, the resistance measurement device 340, the bottom surface ion dust removal device 350, and the full inspection defective kicking device 360, and finally reach the braiding mechanism 400.
[0043] On the one hand, considering that the metal alloy resistor 20 has a front surface and a bottom surface, and both the front surface and the bottom surface need to be measured for appearance and size, and related electrical performance detection, if a "turnover device" is provided to turn over the metal alloy resistor 20, it will increase the complexity of the equipment and the probability of error is large; therefore, before the development of the equipment, it needs to be considered how to realize the front and back surface detection of the metal alloy resistor 20 without turning over the metal alloy resistor 20, in order to increase the stability of the equipment operation, which is the technical problem to be solved;
[0044] On the other hand, since the front and back surfaces of the metal alloy resistor 20 need to be detected, if the front surface of the metal alloy resistor 20 is found to be defective in the early stage, the defective product needs to be kicked out in time, and it should not be allowed to go through the entire process before being kicked out, because this will cause redundant detection of the equipment; therefore, how to pre-detect the metal alloy resistor 20, discover defects in time and kick them out, is also a technical problem to be solved.
[0045] The metal alloy resistor detection, dust removal and braiding equipment 10 of the present application is developed in view of the above technical problems.
[0046] As shown in Figure 4 and Figure 5 , in view of the above technical problems, the present application designs a pre-checking mechanism 200 and a full-checking mechanism 300, the pre-checking mechanism 200 is used to pre-check the metal alloy resistor 20, and the problem is found in time, the defective product is kicked out in time, and then the full-checking mechanism 300 is used to check the metal alloy resistor 20, and the front and back surfaces of the metal alloy resistor 20 are detected without using a turnover device.
[0047] As shown in Figure 4 and Figure 5 , when the pre-checking mechanism 200 is used to pre-check the metal alloy resistor 20, only the front surface appearance and size of the metal alloy resistor 20 are pre-checked, in order to improve the stability of transmission, the sub-turntable 210 adopts a support structure, the metal alloy resistor 20 is accommodated in the accommodation groove of the sub-turntable 210, and the metal alloy resistor 20 becomes very stable and is not easy to deviate or fall off during transmission.
[0048] As shown in Figure 4 and Figure 5 , when the full-checking mechanism 300 is used to check the bottom surface appearance and size of the metal alloy resistor 20, the electrical performance detection is also needed, the main turntable 310 adopts a suspension structure, the metal alloy resistor 20 is hung on the main turntable 310, and the main turntable 310 drives the metal alloy resistor 20 to pass through each detection device in turn.
[0049] It should be noted that since the metal alloy resistor 20 is hung on the main turntable 310, when passing through the bottom ion dust removal device 350, the bottom ion dust removal device 350 blows ion air to remove dust from the bottom surface of the metal alloy resistor 20 (as shown in Figure 4 ), the metal alloy resistor 20 is slightly deviated under the influence of the air flow, which will affect the subsequent braiding process, so that the metal alloy resistor 20 cannot accurately fall into the braiding groove. Therefore, a corresponding deviation correcting device (as shown in Figure 7 ) is arranged at the braiding mechanism 400, and the deviated metal alloy resistor 20 is corrected to make the metal alloy resistor 20 fall into the braiding groove in the correct posture.
[0050] Next, the specific structure of the feeding mechanism 100 will be described.
[0051] As shown in Figure 3As shown, the feeding mechanism 100 comprises a vibrating disc 110 and a straight vibrator 120. The straight vibrator 120 is connected between the vibrating disc 110 and the secondary turntable 210, and is used to deliver the metal alloy resistor 20 at the discharging port of the vibrating disc 110 into the accommodating groove 211 of the secondary turntable 210. As shown Figure 3 As shown, further, the feeding mechanism 100 further comprises a replenishment bin 130 above the vibrating disc 110, which is used to replenish the metal alloy resistor 20 in the vibrating disc 110 in time, so as to prevent the vibrating disc 110 from running out of material.
[0052] As shown Figure 3 In the present application, the straight vibrator 120 is provided with a resistor in-place detector 140 at the connection position with the secondary turntable 210. The resistor in-place detector 140 is used to detect whether the metal alloy resistor 20 in the accommodating groove 211 of the secondary turntable 210 is accurately in place. If no metal alloy resistor 20 is detected in the accommodating groove 211, the resistor in-place detector 140 sends a lack-of-material signal to the control center, and the control center issues an alarm.
[0053] Next, the specific structure of the pre-inspection rejection device 240 will be described.
[0054] As shown Figure 3 As shown, the pre-inspection rejection device 240 comprises a pre-inspection rejection air blowing pipe 241 and a pre-inspection rejection hopper 242. The pre-inspection rejection air blowing pipe 241 blows air to blow the defective metal alloy resistors 20 on the secondary turntable 210 into the pre-inspection rejection hopper 242. In the present application, the air blowing mode is mainly used to reject the defective products. Compared with the traditional mechanical gripper clamping mode, this mode can quickly and effectively reject the defective products.
[0055] Next, the specific structure of the main turntable 310 will be described. As shown Figure 5 As shown, the main turntable 310 comprises a turntable body 311 and a driving module for driving the turntable body 311 to move up and down and rotate. The turntable body 311 is provided with a plurality of negative pressure suction nozzles 312 along the circumference thereof. Under the driving of the driving module, the turntable body 311 moves up and down and rotates, so that the metal alloy resistors 20 on the negative pressure suction nozzles 312 can accurately reach each work station.
[0056] Next, the specific structure of the CCD flatness detection device 330 will be described.
[0057] As shown Figure 5As shown, the CCD flatness detection device 330 includes a flatness detection station 331, a flatness detection CCD 332, and a flatness detection backlight 333. The flatness detection CCD 332 and the flatness detection backlight 333 are located on either side of the flatness detection station 331. When a metal alloy resistor 20 is placed on the flatness detection station 331, light from the flatness detection backlight 333 shines on the metal alloy resistor 20, leaving a shadow on the flatness detection station 331. The flatness detection CCD 332 photographs and analyzes the shadow. If the shadow is a straight line, the metal alloy resistor 20 is considered qualified. If the shadow is a curved line, the metal alloy resistor 20 is considered defective.
[0058] Next, the specific structure of the braiding mechanism 400 is described:
[0059] like Figure 1 As shown, the braiding mechanism 400 includes: a braiding transmission device 410, a laser printing device 420, and a plastic sealing device 430. The braiding transmission device 410 is used to drive the braid 30 (such as Figure 7 The metal alloy resistor 20 in the braid 30 is transmitted in a straight line and passes through the laser printing device 420 and the plastic sealing device 430 in sequence. The laser printing device 420 is used to laser print the metal alloy resistor 20 in the braid 30, and the plastic sealing device 430 is used to encapsulate the metal alloy resistor 20 in the braid 30.
[0060] Further, if Figure 1 As shown, the laminating device 430 includes an unwinding reel 431, a cover film pressing assembly 432, and a rewinding reel 433. The unwinding reel 431 is used to unwind the laminating film, the cover film pressing assembly 432 is used to press the laminating film onto the braid 30 to seal the metal alloy resistor 20, and the rewinding reel 433 is used to rewind the laminating braid 30. After a reel of braid is wound, the cutting device 440 located at the end of the braid conveying device 410 cuts the braid 30.
[0061] As can be seen from the above, since the metal alloy resistor 20 is placed on the main turntable 310 in a hanging manner, when passing through the bottom ion dust removal device 350 (such as Figure 4 As shown in FIG), the bottom ion dust removal device 350 performs ion blowing to remove dust from the bottom surface of the metal alloy resistor 20. The metal alloy resistor 20 is affected by the airflow and may be slightly offset (as shown in FIG). Figure 6 As shown), this will affect the subsequent braiding process, so that the metal alloy resistor 20 cannot fall into the braiding groove accurately.
[0062] In order to solve this technical problem, the braiding mechanism 400 further includes a feed deviation correction device 450 (such as Figure 7 shown).
[0063] likeFigure 8 and Figure 9 As shown, the feed correction device 450 includes: a correction guide sleeve 451, a telescopic rod 452, and a lifting cylinder 453. The telescopic rod 452 is movably sleeved in the correction guide sleeve 451, and the lifting cylinder 453 drives the telescopic rod 452 to reciprocate in the vertical direction in the correction guide sleeve 451. The opening of the correction guide sleeve 451 forms a guiding inclined surface 454 (as shown in FIG. Figure 9 shown).
[0064] like Figure 8 and Figure 9 As shown, the turntable body 311 is further provided with a horizontal cylinder 313 for driving the negative pressure suction nozzle 312 to move back and forth in the horizontal direction.
[0065] like Figure 10 As shown, the negative pressure nozzle 312 includes a nozzle body 3121, a return spring 3122, and a displacement detector 3123. The nozzle body 3121 is movable and movable on the turntable body 311 via the return spring 3122. The displacement detector 3123 is fixed to the turntable body 311 and is used to detect the displacement of the nozzle body 3121.
[0066] Next, the working principle of the above-mentioned feeding deviation correction device 450 is described:
[0067] Considering that the deviation of the metal alloy resistor 20 is only a small probability event, if every metal alloy resistor 20 is corrected, it will seriously affect the production efficiency. It is understandable that not every metal alloy resistor 20 needs to be corrected. Therefore, the feed correction device 450 is set on one side of the braiding transmission device 410 and is only started when necessary;
[0068] The nozzle body 3121 picks up the metal alloy resistor 20 and lowers it into the groove of the braid 30. At this point, the nozzle body 3121 cannot release the metal alloy resistor 20. As the metal alloy resistor 20 approaches the groove of the braid 30, if the metal alloy resistor 20 does not shift, it will not get stuck at the edge of the groove. The nozzle body 3121 will not retract, and the displacement detector 3123 will not generate a sensing signal. This indicates that the metal alloy resistor 20 is now properly positioned to fit into the groove, and the nozzle body 3121 releases the metal alloy resistor 20, allowing it to fall into the groove.
[0069] If the metal alloy resistor 20 deviates during the previous processing, it may become stuck when approaching the groove of the braid 30, and the nozzle body 3121 may be blocked and shrink. The displacement detector 3123 generates a sensing signal and sends it to the control center, initiating the deviation correction process.
[0070] First, the rotating disc body 311 rises, the metal alloy resistor 20 is reset by the suction nozzle body 3121, then the horizontal cylinder 313 drives the suction nozzle body 3121 to displace to the upper side of the deviation rectifying guide sleeve 451, the suction nozzle body 3121 releases the metal alloy resistor 20 to make it fall into the deviation rectifying guide sleeve 451, and the metal alloy resistor 20 is rectified by the guide inclined surface 454 of the opening;
[0071] It is emphasized that for some metal alloy resistors 20 with large deviation angles, it is difficult to rectify them once by the guide inclined surface 454, therefore, the lifting cylinder 453 and the telescopic rod 452 are specially set, the lifting cylinder 453 drives the telescopic rod 452 to do telescopic motion in the deviation rectifying guide sleeve 451, thereby driving the metal alloy resistor 20 to move back and forth on the guide inclined surface 454, through multiple rectifications, the correct posture of the metal alloy resistor 20 is adjusted, then it is sucked by the suction nozzle body 3121 and is transferred to the upper side of the groove of the braided wire 30 again, thus, the metal alloy resistor 20 can fall into the groove with the correct posture.
[0072] The above-mentioned embodiments only express several embodiments of the present application, the description is more specific and detailed, but it cannot be understood as the limitation of the patent scope of the present application. It should be pointed out that for ordinary skilled in the art, without departing from the concept of the present application, several modifications and improvements can be made, which belong to the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.
Claims
1. A metal alloy resistance detection, dust removal, and braiding device, characterized in that, The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device.
2. The metal alloy resistance detection, dedusting, and braiding device according to claim 1, characterized in that, The application relates to a metal alloy resistor production device.
3. The metal alloy resistance detection, dedusting, and braiding device according to claim 2, characterized in that, The application relates to a metal alloy resistor production device.
4. The metal alloy resistance detection, dedusting, and braiding device of claim 2, wherein, The application relates to a metal alloy resistor production device.
5. The metal alloy resistance detection, dedusting, and braiding apparatus of claim 1, wherein, The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application relates to a metal alloy resistor production device. The application 6. The metal alloy resistance detection, dedusting, and strapping apparatus of claim 1, wherein, The CCD flatness detection device comprises a flatness detection station, a flatness detection CCD and a flatness detection backlight source.
7. The metal alloy resistance detection, dedusting, and strapping apparatus of claim 1, wherein, The plastic sealing device comprises an unwinding disc, a cover film pressing assembly and a winding disc.
Citation Information
Patent Citations
Rechecking device capable of realizing functions of rejection and label supplement of abnormal RFIDs
CN108126916A
Inspection handler apparatus and method
US6293408B1